CN218497205U - Optical device coupling clamp - Google Patents

Abstract

The application provides a light device coupling anchor clamps includes: the top surface fixing device is provided with a first probe connecting part; the bottom surface fixing device is provided with a second probe connecting part and is arranged opposite to the first probe connecting part, and the bottom surface fixing device is connected with the top surface fixing device in a supporting way; the first probe matrix comprises a plurality of probes, the probes are embedded and connected with the first probe connecting parts, and the end parts of the probes in the first probe matrix extend out of the first probe connecting parts and face the second probe connecting parts; the second probe matrix comprises a plurality of probes, the probes are embedded and connected with the second probe connecting parts, and the end parts of the probes in the second probe matrix extend out of the second probe connecting parts and face the first probe connecting parts. The application provides an optical device coupling anchor clamps realizes the two sides of electric connector and adds electric simultaneously on the optical device through first probe matrix and second probe matrix, makes things convenient for adding electric to the optical device among the optical device test process to conveniently carry out the experimental test in the optical device production process.

Description

Optical device coupling clamp

Technical Field

The application relates to the technical field of optical fiber communication, in particular to an optical device coupling clamp.

Background

The application markets of big data, block chains, cloud computing, internet of things, artificial intelligence and the like are rapidly developed, explosive growth is brought to data traffic, and the optical communication technology has gradually replaced traditional electrical signal communication in various industry fields due to the advantages of high unique speed, high bandwidth, low erection cost and the like. In the optical communication technology, an optical module is a tool for realizing the interconversion of optical signals and is one of key devices in optical communication equipment, and the transmission rate of the optical module is continuously increased along with the development requirement of the optical communication technology.

In some optical modules, an optical transceiver module is included, which includes a light receiving device and a light emitting device electrically connected to a circuit board through a flexible circuit board. In the production process of the optical module, after the optical receiver and the optical transmitter are assembled, certain tests, such as a circuit stability test, an optical coupling test and the like, are generally required to be performed, and then the optical receiver and the optical transmitter are assembled with a circuit board and the like. Electrical connections to the light receiving and light emitting devices are often required to complete various tests.

SUMMERY OF THE UTILITY MODEL

The embodiment of the application provides an optical device coupling clamp which is used for facilitating electric connection of an optical device in a test process and facilitating experimental test in an optical device production process.

The application provides a light device coupling anchor clamps for light device electricity connection testing arrangement includes:

the top surface fixing device is provided with a first probe connecting part;

the bottom surface fixing device is provided with a second probe connecting part and is arranged opposite to the first probe connecting part, and the bottom surface fixing device is connected with the top surface fixing device in a supporting manner;

the first probe matrix comprises a plurality of probes which are embedded and connected with the first probe connecting parts, and the end parts of the probes in the first probe matrix extend out of the first probe connecting parts and face the second probe connecting parts;

the second probe matrix comprises a plurality of probes, the probes are embedded and connected with the second probe connecting parts, and the end parts of the probes in the second probe matrix extend out of the second probe connecting parts and face the first probe connecting parts.

In the optical device coupling clamp provided by the application, a first probe connecting part on the top surface fixing device is connected with a first probe matrix, a second probe connecting part on the bottom surface fixing device is connected with a second probe matrix, the first probe matrix and the second probe matrix respectively comprise a plurality of probes, and the end parts of the probes in the first probe matrix and the second probe matrix are oppositely arranged. When the optical device is assembled on the optical device coupling clamp, the electric connector on the optical device is positioned between the end parts of the first probe matrix and the second probe matrix, and the probes in the first probe matrix and the probes in the second probe matrix are correspondingly contacted with the bonding pads on the electric connector. So the application provides an optical device coupling anchor clamps, the two sides of going up the electric connector through first probe matrix and second probe matrix realization optical device add power simultaneously, make things convenient for adding power to optical device among the optical device test process to conveniently carry out the experimental test in the optical device production process.

Drawings

In order to more clearly illustrate the technical solutions in the present disclosure, the drawings needed to be used in some embodiments of the present disclosure will be briefly described below, and it is apparent that the drawings in the following description are only drawings of some embodiments of the present disclosure, and other drawings can be obtained by those skilled in the art according to the drawings. Furthermore, the drawings in the following description may be considered as schematic diagrams, and do not limit the actual size of products, the actual flow of methods, the actual timing of signals, and the like, involved in the embodiments of the present disclosure.

FIG. 1 is a first schematic diagram illustrating a structure of an optical device according to some embodiments;

FIG. 2 is a schematic diagram of a second embodiment of an optical device;

FIG. 3 is a schematic diagram of an optical device coupling fixture according to some embodiments;

FIG. 4 is an exploded view of a first optical device coupling fixture provided in accordance with some embodiments;

FIG. 5 is a second exploded schematic view of an optical device coupling fixture according to some embodiments;

FIG. 6 is a first schematic view of an assembly of a top fixture and a first probe matrix according to some embodiments;

FIG. 7 is a second schematic view of an assembly of a top fixture and a first probe matrix according to some embodiments;

FIG. 8 is an exploded view of a top fixture and a first probe matrix according to some embodiments;

FIG. 9 is an enlarged view of a portion of FIG. 8 at A;

FIG. 10 is a first schematic view of an assembly of a first bottom fixture and a second probe matrix according to some embodiments;

FIG. 11 is a second assembly diagram of a second array of probes with a bottom fixture according to some embodiments;

FIG. 12 is an enlarged view of a portion of FIG. 10 at B;

FIG. 13 is an exploded view of a bottom fixture and a second probe matrix according to some embodiments;

FIG. 14 is an enlarged view of a portion of FIG. 13 at C;

FIG. 15 illustrates a first state of use of an optical device coupling fixture according to some embodiments;

fig. 16 is a second state diagram illustrating the use of an optical device coupling fixture according to some embodiments.

Detailed Description

Technical solutions in some embodiments of the present disclosure will be clearly and completely described below with reference to the accompanying drawings, and it is obvious that the described embodiments are only a part of the embodiments of the present disclosure, and not all of the embodiments. All other embodiments obtained by a person of ordinary skill in the art based on the embodiments provided by the present disclosure belong to the protection scope of the present disclosure.

In an optical communication system, an optical signal is used to carry information to be transmitted, and the optical signal carrying the information is transmitted to information processing equipment such as a computer through information transmission equipment such as an optical fiber or an optical waveguide, so as to complete information transmission. Since light has a passive transmission characteristic when transmitted through an optical fiber or an optical waveguide, low-cost and low-loss information transmission can be realized. Since a signal transmitted by an information transmission device such as an optical fiber or an optical waveguide is an optical signal and a signal that can be recognized and processed by an information processing device such as a computer is an electrical signal, it is necessary to perform interconversion between the electrical signal and the optical signal in order to establish information connection between the information transmission device such as an optical fiber or an optical waveguide and the information processing device such as a computer.

The optical module realizes the function of interconversion between the optical signal and the electrical signal in the technical field of optical communication. The optical module comprises an optical port and an electric port, the optical module realizes optical communication with information transmission equipment such as optical fibers or optical waveguides and the like through the optical port, realizes electric connection with an optical network terminal (such as an optical modem) through the electric port, and the electric connection is mainly used for power supply, I2C signal transmission, data information transmission, grounding and the like; the optical network terminal transmits the electric signal to the computer and other information processing equipment through a network cable or a wireless fidelity (Wi-Fi).

The optical transceiver module is an important component in an optical module and may include an optical receiver and an optical transmitter. Fig. 1 is a schematic diagram of an optical device 100 according to some embodiments, in which a receiving device is a light emitting device, or a light receiving and light emitting integrated device.

As shown in fig. 1, the optical device 100 includes a cavity 110 and an electrical connector 120; the cavity 110 is provided with an electrical device and the like for generating or emitting optical signals; the electrical connector 120 is embedded in one end of the connection cavity 110, such that one end of the electrical connector 120 extends into the cavity 110 and the other end is located outside the cavity 110. The two ends of the electrical connector 120 are respectively provided with a pad, the pad located in the cavity 110 is used for electrically connecting a device in the cavity 110, the pad located outside the cavity 110 is used for electrically connecting an optical module circuit board outside the cavity 110, and the pads at the two ends of the electrical connector 120 are correspondingly connected, so that the electrical connection between the device in the cavity 110 and the optical module circuit board outside the cavity 110 is realized.

With the increasing speed of the optical device 100, the density of the devices in the cavity 110 is increasing, so the density of the transmission signals on the electrical connector 120 is increasing, and further the density of the pads on the electrical connector 120 is increasing, and the pads are required to be arranged on two sides of the other end of the electrical connector 120. Fig. 2 is a schematic diagram of a second structure of an optical device according to some embodiments. As shown in fig. 1 and 2, the other end of the electrical connector 120 is provided with a plurality of pads on both sides. In some optical devices 100, the layout of a single layer Direct Current (DC) signal on the electrical connector 120 is not satisfactory, and a layout design of a dual layer DC signal is required, which increases the difficulty of testing and powering up in the production process of the optical device 100.

In order to facilitate the implementation of test powering-up in the production process of the optical device 100, the embodiment of the present application provides an optical device coupling fixture; the optical device coupling jig is used to directly crimp the electrical connector 120 and electrically connect pads on the electrical connector 120.

Fig. 3 is a first schematic diagram of an optical device coupling fixture according to some embodiments. As shown in fig. 3, the optical device coupling jig 200 provided in the embodiment of the present application includes a top surface fixture 210 and a bottom surface fixture 220; a first probe matrix 230 is disposed on the top surface fixture 210, and the first probe matrix 230 is used for contacting and connecting pads on the top surface of the other end of the electrical connector 120; a second matrix of probes 240 is disposed on the bottom fixture 220, the second matrix of probes 240 being adapted to contact pads on the bottom surface of the other end of the electrical connector 120. It should be noted that the top and bottom of the two sides of the other end of the electrical connector 120 are opposite concepts.

The top fixture 210 and the bottom fixture 220 are stacked one on top of the other. Illustratively, as shown in FIG. 3, the top surface fixture 210 is disposed above the bottom surface fixture 220, and the bottom surface fixture 220 is supported by the top surface fixture 210.

The first probe matrix 230 is embedded in the top fixture 210, and one end of the first probe matrix 230 for contacting the connection pads faces the bottom fixture 220, and the top fixture 210 is used to support the first probe matrix 230. The second probe matrix 240 is embedded with the bottom fixture 220, and one end of the second probe matrix 240 for contacting the connection pads faces the top fixture 210, and the bottom fixture 220 is used for supporting the second probe matrix 240. The first probe matrix 230 and the second probe matrix 240 respectively comprise a plurality of probes; illustratively, the first and second probe matrices 230 and 240 each include a plurality of probes. In some embodiments of the present application, the probes of the first probe matrix 230 and the probes of the second probe matrix 240 are not used to contact the other ends of the pads of the electrical connector 120 for connecting test connection lines, through which test equipment is connected.

The probes in the first probe matrix 230 and the probes in the second probe matrix 240 are made of conductive material, and in order to ensure the insulation effect between each probe and the top surface fixture 210 and the bottom surface fixture 220, in some embodiments, the top surface fixture 210 and the bottom surface fixture 220 may be made of insulating material.

Fig. 4 is a first exploded view of an optical device coupling jig according to some embodiments, and fig. 5 is a second exploded view of an optical device coupling jig according to some embodiments. As shown in fig. 4 and 5, the top surface fixture 210 is provided with a first probe connection portion 211, the bottom surface fixture 220 is provided with a second probe connection portion 221, and the first probe connection portion 211 is located above the second probe connection portion 221. The first probe matrix 230 is embedded and connected with the first probe connection part 211, and the end part of the probe in the first probe matrix 230 extends out of the first probe connection part 211 and faces the second probe connection part 221; the second probe matrix 240 is embedded and connected with the second probe connection part 221, and the end parts of the probes in the second probe matrix 240 extend out of the second probe connection part 221 and face the first probe connection part 211; the first probe connection part 211 and the second probe connection part 221 are for facilitating the arrangement of probes. Illustratively, the thickness of the first probe connector 211 is smaller than the thickness of the other position on the top surface fixture 210, and the thickness of the second probe connector 221 is smaller than the thickness of the other position on the bottom surface fixture 220, so as to further facilitate the probe arrangement.

Fig. 6 is a first schematic view of an assembly of a top surface fixture and a first probe matrix according to some embodiments, and fig. 7 is a second schematic view of an assembly of a top surface fixture and a first probe matrix according to some embodiments. As shown in fig. 6 and 7, in some embodiments, the top fixture 210 is provided with a notch 212, and the notch 212 is located at a side of the first probe matrix 230; the notch 212 extends to a lower portion of the first probe connecting portion 211, and a first opening 213 is formed below the first probe connecting portion 211, such that the first opening 213 is communicated with the notch 212. The notch 212 is used for limiting the optical device 100, so that the optical device 100 can be assembled and fixed on the top surface fixing device 210; the first opening 213 is used to extend the electrical connector 120 from the indentation 212 to allow pads on the top surface of the electrical connector 120 to contact the ends of the probes in the second probe matrix 230.

In some embodiments, the top surface fixture 210 includes a first body 214, the first probe connecting portion 211 is located at a side of the first body 214, and the first probe connecting portion 211 is connected to a top of the first body 214, such that a first gap 215 is formed between a lower portion of the first probe connecting portion 211 and the first body 214, and the first opening 213 communicates with the first gap 215, i.e., the gap 212 extends to the first gap 215. A first notch 215 is formed between the lower portion of the first probe connecting portion 211 and the first body 214, so that the thickness of the first probe connecting portion 211 is smaller than that of the first body 214, thereby facilitating the fixing of the first probe matrix 230 on the first probe connecting portion 211.

Further, in some embodiments of the present application, the top surface of the first opening 213 is lower than the bottom surface of the first probe connector 211, such that the first probe connector 211 forms a first dam mechanism 2111 at the end of the notch 212; the end surfaces of the probes in the first probe matrix 230 are lower than the top surfaces of the first openings 213, i.e., the probes in the first probe matrix 230 extend to the first openings 213. The first blocking mechanism 2111 is used for limiting the position of the optical device 100 in the direction in which the electrical connector 120 extends into the first opening 213 in the optical device 100, that is, the sidewall of the first probe connection portion 211 is used for blocking the optical device 100 in the direction in which the optical device 100 extends into the first opening 213, so as to control the assembly position of the optical device 100 in the direction in which the optical device extends into the first opening 213, so as to ensure the connection accuracy between the pads on the electrical connector 120 and the probes in the first probe matrix 230. At the same time, the first shutter mechanism 2111 is also effective to prevent the optical device 100 from being over-assembled in the direction in which the optical device 100 protrudes into the first opening 213 to cause damage to the probes in the first probe matrix 230.

In some embodiments of the present application, the first body 214 includes a first supporting portion 2141 and a second supporting portion 2142, and the first supporting portion 2141 and the second supporting portion 2142 are used to facilitate the bottom surface fixture 220 to support the top surface fixture 210. The first supporting portion 2141 has a first connecting hole 2143, the second supporting portion 2142 has a second connecting hole 2144, the first connecting hole 2143 is used for the first supporting portion 2141 to connect to the bottom surface fixing device 220, and the second connecting hole 2144 is used for the second supporting portion 2142 to connect to the bottom surface fixing device 220. As such, the first connection hole 2143 and the second connection hole 2144 are used to facilitate the positioning of the top surface fixture 210 in connection with the bottom surface fixture 220.

In some embodiments of the present application, a step surface 2121 is provided on a sidewall of the notch 212, and the step surface 2121 is used for fixing a sidewall of the cavity 110 of the optical device 100 by a stopper, so as to ensure an assembling accuracy of the optical device 100 and the top surface fixture 210, and further ensure a contact connection accuracy between the probes in the first probe matrix 230 and the pads on the electrical connector 120.

In the embodiment of the present application, the arrangement density of the pads on the electrical connector 120 is relatively high, so the arrangement density of the probes in the first probe matrix 230 is relatively high, and the arrangement of the probes in the first probe matrix 230 not only needs to ensure that the probes can be correspondingly connected with the pads in the electrical connector 120, but also needs to ensure the insulation requirement between adjacent probes. Therefore, in the embodiment of the present application, the probes in the first probe matrix 230 are arranged in a staggered manner, i.e., the probes in the first probe matrix 230 are not on the same straight line.

Fig. 8 is an exploded view of a top fixture and a first probe matrix according to some embodiments, and fig. 9 is a partial enlarged view of a portion a of fig. 8. As shown in fig. 8 and 9, a first probe hole matrix 216 is disposed on the first probe connection portion 211, and the first probe hole matrix 216 is used for embedding and connecting the first probe connection portion 211 with a first probe matrix 230. First row of probe holes 2161 and second row of probe holes 2162 are included on first probe hole matrix 216, first row of probe holes 2161 and second row of probe holes 2162 include a plurality of probe holes respectively, first row of probe holes 2161 and second row of probe holes 2162 are not on same straight line to probe holes in first row of probe holes 2161 and probe holes in second row of probe holes 2162 staggered arrangement is realized, and then the staggered arrangement of probes in first probe matrix 230 is realized. Illustratively, the probe holes in the first row of probe holes 2161 are collinear, the probe holes in the second row of probe holes 2162 are collinear, the line along which the first row of probe holes 2161 is located is parallel to but not coincident with the line along which the second row of probe holes 2162 is located, and the probe holes in the first row of probe holes 2161 and the second row of probe holes 2162 are staggered.

Fig. 10 is a first schematic view of an assembly of a bottom surface fixture and a second probe matrix according to some embodiments, and fig. 11 is a second schematic view of an assembly of a bottom surface fixture and a second probe matrix according to some embodiments. As shown in fig. 10 and 11, in some embodiments, the bottom fixture 220 is provided with a support groove 222, and the support groove 222 is located at one side of the second probe matrix 240; the support groove 222 is disposed below the notch 212. The support grooves 222 are used for accommodating and supporting the optical device 100. In some embodiments, one end of the supporting groove 222 extends to the second probe connecting portion 221, and the other end extends to a side surface of the bottom surface fixture 220; when the optical device 100 is assembled in the supporting groove 222, the optical device 100 is pushed into the supporting groove 222 from the other end of the supporting groove 222, and the side wall of the supporting groove 222 can be limited in the width direction of the optical device 100, so that the optical device 100 can be accurately assembled on the bottom surface fixing device 220.

In some embodiments of the present invention, the bottom surface fixture 220 includes a second body 223, the second probe connecting portion 221 is located at a side of the second body 223, a second notch 224 is disposed at a side of the second body 223, and the second notch 224 is located below the second probe connecting portion 221. The second unfilled corner 224 makes the thickness of the second probe connection part 221 smaller than that of the second body 223, thereby facilitating the fixed arrangement of the second probe matrix 240 on the second probe connection part 221.

The second body 223 is provided with a third connection hole 2231 and a fourth connection hole 2232, the third connection hole 2231 is disposed corresponding to the first connection hole 2143, and the fourth connection hole 2232 is disposed corresponding to the second connection hole 2144. Illustratively, when the top surface fixture 210 and the bottom surface fixture 220 are assembled and fixed, the first coupling hole 2143 and the third coupling hole 2231 are sequentially passed through, and the second coupling hole 2144 and the fourth coupling hole 2232 are sequentially passed through, respectively, screws or the like. Of course, in the embodiment of the present application, the top surface fixing device 210 and the bottom surface fixing device 220 may be assembled and fixed by other methods, such as a snap, etc.

A third supporting portion 226 and a fourth supporting portion 227 are disposed below the second body 223, and the third supporting portion 226 and the fourth supporting portion 227 are used for connecting the bottom surface fixing device 220 to the testing apparatus, thereby facilitating the assembly of the optical device coupling fixture 200 on the testing apparatus. In some embodiments, along the length direction of the second body 223, the third support 226 is disposed at one end under the second body 223, and the fourth support 227 is disposed at the other end under the second body 223; a space 228 is formed between the third supporting portion 226 and the fourth supporting portion 227, and a projection of the space 228 on a side where the second probe connecting portion 221 is disposed on the second body 223 covers the second unfilled corner 224, so as to provide a sufficient space for the probe connection test connecting lines in the second probe matrix 240.

In some embodiments of the present disclosure, a third unfilled corner 225 is further disposed on a side of the second body 223, and the third unfilled corner 225 is located above the second probe connecting part 221. Illustratively, the third unfilled corner 225 extends to both ends of the second body 223 in the length direction.

The third unfilled corner 225 serves to further reduce the thickness of the second probe connection part 221 to some extent.

Fig. 12 is a partial enlarged view of fig. 10 at B. As shown in fig. 12, the third notch 225 forms a second stopper mechanism 2251 at one end of the support groove 222, a top surface of the second stopper mechanism 2251 is higher than a top surface of the second probe connection 221 and a top surface of the second stopper mechanism 2251 is lower than a top surface of the second body 223, thereby forming a second opening 2252 at the top of the second stopper mechanism 2251. The end surfaces of the probes in the second probe matrix 240 are higher than the top surface of the second openings 2252, i.e., the probes in the second probe matrix 240 extend to the second openings 2252. The second baffle mechanism 2251 is used for limiting the position of the optical device 100 in the direction in which the electrical connector 120 protrudes into the second opening 2252 in the optical device 100, i.e. the second baffle mechanism 2251 is used for stopping the optical device 100 in the direction in which the optical device 100 protrudes into the second opening 2252, so as to control the position of the optical device 100 in the direction in which the optical device 100 protrudes into the second opening 2252, thereby ensuring the connection accuracy between the pads on the electrical connector 120 and the probes in the second probe matrix 240. At the same time, the second shutter mechanism 2251 also effectively prevents damage to the probes in the second probe matrix 240 caused by over-assembly of the optical device 100 in the direction in which the optical device 100 extends into the second openings 2252.

In some embodiments, the second openings 2252 form through holes with the first openings 213 through which the ends of the electrical connectors 120 pass when assembled with the optical device 100, such that the pads on both sides of the electrical connectors 120 are in contact connection with the probes in the first matrix of probes 230 and the probes in the second matrix of probes 240.

In some embodiments of the present application, in order to ensure that the probes in the second probe matrix 240 can be connected to the corresponding pads in the electrical connector 120 and the probes are insulated from each other, the probes in the second probe matrix 240 are arranged in a staggered manner, i.e., the probes in the second probe matrix 240 are not on the same straight line.

Fig. 13 is an exploded view of a bottom fixture and a second probe matrix according to some embodiments, and fig. 14 is a partial enlarged view at C of fig. 13. As shown in fig. 13 and 14, a second probe hole matrix 229 is disposed on the second probe connection portion 221, and the second probe hole matrix 229 is used for the second probe matrix 240 to be embedded and connected with the second probe connection portion 221. Second probe hole matrix 229 includes third row of probe holes 2291 and fourth row of probe holes 2292, and third row of probe holes 2291 and fourth row of probe holes 2292 include a plurality of probe holes respectively, and third row of probe holes 2291 and fourth row of probe holes 2292 are not on same straight line to realize probe holes staggered arrangement in third row of probe holes 2291 and probe holes staggered arrangement in fourth row of probe holes 2292, and then realize the staggered arrangement of probes in second probe matrix 240. Illustratively, the probe holes in the third row of probe holes 2291 are collinear, the probe holes in the fourth row of probe holes 2292 are collinear, the straight line of the third row of probe holes 2291 is parallel to but not coincident with the straight line of the fourth row of probe holes 2292, and the probe holes in the third row of probe holes 2291 are staggered with the probe holes in the fourth row of probe holes 2292.

Fig. 15 is a first usage state diagram of an optical device coupling jig according to some embodiments, fig. 16 is a second usage state diagram of an optical device coupling jig according to some embodiments, and fig. 15 and 16 show an optical device and optical device coupling jig assembly configuration. In some embodiments of the present application, when the optical device 100 needs to be tested, the optical device 100 is first assembled into the supporting groove 222, the bottom of the electrical connector 120 is disposed in the cavity 110 to abut against the second baffle mechanism 2251, and the pads on the bottom surface of the electrical connector 120 are correspondingly contacted with the probes in the second probe matrix 240; then, the top surface fixture 210 is assembled to the bottom surface fixture 220, so that the optical devices in the notches 212 are matched and the probes in the first probe matrix 230 are correspondingly contacted with the pads on the top surface of the electrical connector 120; finally, top fixture 210 and bottom fixture 220 are fixedly attached.

In some embodiments of the present application, when testing of the optical device 100 is required, the top fixture 210 and the bottom fixture 220 are first fixedly connected, the optical device 100 is assembled to the optical device coupling fixture 200 from the supporting slot 222 and the notch 212, and the end of the cavity 110 where the electrical connector 120 is disposed is pushed against the second shutter mechanism 2251 and the first shutter mechanism 2111, so that the electrical connector 120 is embedded in the through hole formed by the first opening 213 and the second opening 2252, and the pads on the top surface and the bottom surface of the electrical connector 120 are correspondingly contacted with the probes in the first probe matrix 230 and the probes in the second probe matrix 240.

The optical device coupling fixture 200 provided in the embodiment of the present application implements simultaneous energization of both sides of the electrical connector 120 on the optical device through the first probe matrix 230 and the second probe matrix 240, so as to facilitate energization of the optical device 100 in the test process of the optical device 100, and to facilitate the experimental test in the production process of the optical device.

Finally, it should be noted that: the above embodiments are only used to illustrate the technical solutions of the present application, and not to limit the same; although the present application has been described in detail with reference to the foregoing embodiments, it should be understood by those of ordinary skill in the art that: the technical solutions described in the foregoing embodiments may still be modified, or some technical features may be equivalently replaced; and such modifications or substitutions do not depart from the spirit and scope of the corresponding technical solutions in the embodiments of the present application.

Claims (10)

1. An optical device coupling jig for an optical device electrical connection testing apparatus, comprising:

the top surface fixing device is provided with a first probe connecting part;

the bottom surface fixing device is provided with a second probe connecting part and is arranged opposite to the first probe connecting part, and the bottom surface fixing device is connected with the top surface fixing device in a supporting manner;

the first probe matrix comprises a plurality of probes which are embedded and connected with the first probe connecting parts, and the end parts of the probes in the first probe matrix extend out of the first probe connecting parts and face the second probe connecting parts;

the second probe matrix comprises a plurality of probes, the probes are embedded and connected with the second probe connecting parts, and the end parts of the probes in the second probe matrix extend out of the second probe connecting parts and face towards the first probe connecting parts.

2. The optical device coupling jig of claim 1, wherein the bottom surface fixture is provided with a support groove for supporting the optical device;

the top surface fixing device is provided with a notch, the notch is located above the supporting groove, the side edge of the notch is used for being matched with a limiting optical device, one end of the notch extends to the first probe connecting part and forms a first opening at the bottom of the first probe connecting part, and the first opening is communicated with the notch.

3. The optical device coupling fixture of claim 2, wherein the top fixture comprises a first body, the first probe connector is located at a side of the first body, the first probe connector is connected to a top of the first body to form a first unfilled corner at a bottom of the first body, and the first unfilled corner is communicated with the first opening;

set up first supporting part and second supporting part on the first body, set up first connecting hole on the first supporting part, the second supports and mends and set up the second connecting hole, first supporting part passes through first connecting hole is connected bottom surface fixing device, the second supporting part passes through the second connecting hole is connected bottom surface fixing device.

4. The optical device coupling fixture of claim 1, wherein the bottom fixture comprises a second body, and a side of the second body is provided with a second unfilled corner, and the second unfilled corner is located below the second probe connection part;

and a third supporting part and a fourth supporting part are arranged below the second body and used for supporting and connecting the test equipment by the bottom surface fixing device.

5. The optical device coupling fixture of claim 1, wherein a first probe hole matrix is disposed on the first probe connection portion, the first probe hole matrix connecting the first probe matrix;

first probe hole matrix includes first row of probe hole and second row probe hole, first row of probe hole with the second row of probe hole includes a plurality of probe holes respectively, first row of probe hole with probe hole parallel arrangement is arranged to the second and not be located same straight line, the probe hole position in the probe hole is arranged to the second probe hole crisscross setting in the first row of probe hole.

6. The optical device coupling jig of claim 1, wherein a second probe hole matrix is disposed on the second probe connection portion, the second probe hole matrix connecting the second probe matrix;

the second probe hole matrix includes that the third arranges the probe hole and the fourth row probe hole, the third arrange the probe hole with the fourth row probe hole includes a plurality of probe holes respectively, the third arrange the probe hole with the fourth row probe hole parallel arrangement just is not located same straight line, the probe hole in the fourth row probe hole is located probe hole staggered arrangement in the third row probe hole.

7. The optical device coupling jig of claim 3, wherein the top surface of the first opening is lower than the bottom surface of the first probe connection portion, so that the first probe connection portion forms a first blocking mechanism at the end of the notch, and the first blocking mechanism is used for limiting the optical device.

8. The optical device coupling jig of claim 2, wherein one end of the supporting groove extends to the second probe connection part, and the other end extends to a side of the bottom surface fixture.

9. The optical device coupling fixture of claim 8, wherein a second baffle mechanism is disposed at one end of the supporting groove, a top surface of the second baffle mechanism is higher than a top surface of the second probe connecting portion and a top surface of the second baffle mechanism is higher than a bottom surface of the supporting groove, and the second baffle mechanism is used for limiting the optical device.

10. The optical device coupling jig of claim 4, wherein the third support portion is disposed at one end under the second body, the fourth support portion is disposed at the other end under the second body, and a space is formed between the third support portion and the fourth support portion.

Images