CN218350558U - Optical device electric connecting device - Google Patents

Abstract

The application provides a light device electric connection device, includes: the base is used for supporting the optical device, a flexible circuit board is arranged on the optical device, and a first electric connection pad is arranged on the flexible circuit board; the probe mechanism is arranged on the base and comprises a probe fixing seat and a probe, the probe is embedded on the probe fixing seat, two ends of the probe are positioned outside the probe fixing seat, and one end of the probe is used for being in contact connection with the first electric connection pad; the circuit switching mechanism is arranged above the probe mechanism and comprises a switching circuit board, a second electric connection pad is arranged on the bottom surface of the switching circuit board, and the circuit board is electrically connected with the other end of the probe through the second electric connection pad; and the fixing mechanism is connected with the base and is used for fixing the optical device, the probe fixing seat and the switching circuit board. The power supply connection of the optical device is facilitated, and the experimental test in the production process of the optical device is further facilitated.

Description

Optical device electric connecting device

Technical Field

The application relates to the technical field of optical fiber communication, in particular to an optical device electric connection device.

Background

The application markets of big data, block chains, cloud computing, internet of things, artificial intelligence and the like are rapidly developed, explosive growth is brought to data traffic, and the optical communication technology has gradually replaced traditional electrical signal communication in various industry fields due to the advantages of high unique speed, high bandwidth, low erection cost and the like. In the optical communication technology, an optical module is a tool for realizing the interconversion of optical signals and is one of key devices in optical communication equipment, and the transmission rate of the optical module is continuously increased along with the development requirement of the optical communication technology.

In some optical modules, the optical transceiver module includes a light receiving device and a light emitting device, and the light receiving device and the light emitting device are electrically connected to the circuit board through a flexible circuit board. In the production process of the optical module, after the optical receiver and the optical transmitter are assembled, certain tests, such as a circuit stability test, an optical coupling test and the like, are generally required to be performed, and then the optical receiver and the optical transmitter are assembled with a circuit board and the like. Therefore, in the optical device testing engineering, the connection and conduction of the bonding pads of the flexible circuit board are more and more important.

SUMMERY OF THE UTILITY MODEL

The embodiment of the application provides an optical device electric connection device for make things convenient for the power supply of optical device to connect, in order to conveniently carry out the experimental test in the optical device production process.

The application provides a light device electricity connecting device for light device electricity connection testing arrangement includes:

the base is used for supporting the optical device, a flexible circuit board is arranged on the optical device, and a first electric connection pad is arranged on the flexible circuit board;

the probe mechanism is arranged on the base and comprises a probe fixing seat and a probe, the probe is embedded on the probe fixing seat, two ends of the probe are positioned outside the probe fixing seat, and one end of the probe is used for being in contact connection with the first electric connection bonding pad;

the circuit switching mechanism is arranged above the probe mechanism and comprises a switching circuit board, a second electric connection pad is arranged on the bottom surface of the switching circuit board, and the circuit board is electrically connected with the other end of the probe through the second electric connection pad;

and the fixing mechanism is connected with the base and is used for fixing the optical device, the probe fixing seat and the switching circuit board.

The application provides an among the optical device electricity connecting device, set up probe mechanism, circuit switching mechanism and fixed establishment on the base, set up the probe in the probe mechanism, circuit switching mechanism sets up in probe mechanism, can realize through the probe and optical device on the crimping of flexible circuit board that flexible circuit board is connected with circuit switching mechanism's electricity on the optical device, and then realize the electric switching of flexible circuit board through circuit switching mechanism. Thus, in experimental testing of optical devices: the optical device is arranged on the base, and the probe mechanism is arranged on a flexible circuit board of the optical device in a compression joint mode, so that one end of a probe on the probe mechanism is in compression joint with a first electric connection pad on the flexible circuit board; the circuit switching mechanism is arranged above the probe mechanism, so that the second electric connection bonding pad is connected with the other end of the probe in a pressing mode; and then the electric connection of the flexible circuit board and the circuit switching mechanism is realized through the probe, so that the stable power supply of the optical device is realized through the circuit switching mechanism. The optical device electric connection device provided by the application facilitates power supply connection of the optical device, and further facilitates experimental testing in the production process of the optical device.

Drawings

In order to more clearly illustrate the technical solutions in the present disclosure, the drawings needed to be used in some embodiments of the present disclosure will be briefly described below, and it is apparent that the drawings in the following description are only drawings of some embodiments of the present disclosure, and other drawings can be obtained by those skilled in the art according to the drawings. Furthermore, the drawings in the following description may be regarded as schematic diagrams, and do not limit the actual size of products, the actual flow of methods, the actual timing of signals, and the like, involved in the embodiments of the present disclosure.

FIG. 1 is a schematic diagram of an optical device;

FIG. 2 is a schematic diagram of an electrical connection arrangement for an optical device according to some embodiments;

FIG. 3 illustrates a first use state diagram of a base according to some embodiments;

FIG. 4 is a second state diagram illustrating the use of a base according to some embodiments;

FIG. 5 is a schematic diagram of a light device on a submount according to some embodiments;

FIG. 6 is a partial enlarged view of the portion A in FIG. 5;

FIG. 7 is a first schematic diagram of a circuit transition mechanism according to some embodiments;

FIG. 8 is a second schematic structural diagram of a circuit transition mechanism according to some embodiments;

FIG. 9 is an enlarged view of a portion of FIG. 8 at B;

FIG. 10 is a first schematic structural view of a probe mechanism according to some embodiments;

FIG. 11 is an enlarged view of a portion of FIG. 10 at C;

FIG. 12 is a second schematic structural view of a probe mechanism according to some embodiments;

FIG. 13 is a schematic view of a probe mechanism and flexible circuit board assembly provided in accordance with some embodiments;

FIG. 14 is an enlarged view of a portion of FIG. 13 at D;

FIG. 15 is an assembled cross-sectional view of a probe mechanism, a circuit interface mechanism and a flexible circuit board provided in accordance with some embodiments;

FIG. 16 illustrates a first state of use of an electrical connection apparatus for an optical device according to some embodiments;

fig. 17 is a second usage state diagram of an optical device electrical connection apparatus according to some embodiments.

Detailed Description

Technical solutions in some embodiments of the present disclosure will be clearly and completely described below with reference to the accompanying drawings, and it is obvious that the described embodiments are only a part of the embodiments of the present disclosure, and not all of the embodiments. All other embodiments obtained by a person of ordinary skill in the art based on the embodiments provided by the present disclosure belong to the protection scope of the present disclosure.

In an optical communication system, an optical signal is used to carry information to be transmitted, and the optical signal carrying the information is transmitted to information processing equipment such as a computer through information transmission equipment such as an optical fiber or an optical waveguide, so as to complete information transmission. Since light has a passive transmission characteristic when transmitted through an optical fiber or an optical waveguide, low-cost, low-loss information transmission can be realized. Further, since a signal transmitted by an information transmission device such as an optical fiber or an optical waveguide is an optical signal and a signal that can be recognized and processed by an information processing device such as a computer is an electrical signal, it is necessary to perform interconversion between the electrical signal and the optical signal in order to establish an information connection between the information transmission device such as an optical fiber or an optical waveguide and the information processing device such as a computer.

The optical module realizes the function of interconversion between the optical signal and the electrical signal in the technical field of optical communication. The optical module comprises an optical port and an electrical port, the optical module realizes optical communication with information transmission equipment such as optical fibers or optical waveguides and the like through the optical port, realizes electrical connection with an optical network terminal (such as an optical modem) through the electrical port, and the electrical connection is mainly used for power supply, I2C signal transmission, data information transmission, grounding and the like; the optical network terminal transmits the electric signal to the computer and other information processing equipment through a network cable or a wireless fidelity (Wi-Fi). The optical module comprises an optical device inside, and the optical device is used for realizing light emission, light reception or light transceiving.

Fig. 1 is a schematic structural diagram of an optical device. As shown in fig. 1, the optical device 100 includes an optical engine 110 and a flexible circuit board 120, the optical engine 110 is connected to the flexible circuit board 120, and a pad for soldering the circuit board in the optical module or the optical engine 110 is disposed on the flexible circuit board 120. Illustratively, an end of the flexible circuit board 120 remote from the light engine 110 is provided with a first electrical connection pad 121. During the manufacturing process of the optical device 100, tests such as experimental optical coupling of the optical engine 110 need to be performed, and the optical engine 110 needs to be powered by the flexible circuit board 120.

To facilitate supplying power to the light engine 110 through the flexible circuit board 120, the embodiment of the present application provides an optical device electrical connection device, which is used to crimp and electrically connect an end of the flexible circuit board 120 away from the light engine 110. Illustratively, the optical device electrical connection means crimps and electrically connects the first electrical connection pads 121.

Fig. 2 is a schematic structural diagram of an optical device electrical connection apparatus according to some embodiments. As shown in fig. 2, the optical device electrical connection apparatus 200 provided by the embodiment of the present application includes a base 210, a probe mechanism 220, a circuit switching mechanism 230, and a fixing mechanism 240.

The base 210 is used for supporting and fixing the probe mechanism 220, the circuit switching mechanism 230 and the fixing mechanism 240, and supporting the optical device 100 during the testing process of the optical device 100, and is used for facilitating the setting of the optical device electrical connection apparatus 200, for example, facilitating the setting of the optical device electrical connection apparatus 200 on an experimental testing table or experimental testing equipment. The base 210 includes a base body 211, and the base body 211 is a main structure of the base 210 for carrying and fixing the probe mechanism 220, the circuit switching mechanism 230 and the fixing mechanism 240.

The probe mechanism 220 is disposed on the base 210, the probe mechanism 220 includes a probe fixing seat 221, a probe is disposed on the probe fixing seat 221, and the probe is embedded in the probe fixing seat 221 and connected to the probe fixing seat 221. Generally, a plurality of probes are disposed on the probe fixing base 221 in a concentrated manner, and the arrangement of the plurality of probes is mainly based on the arrangement of the first electrical connection pads 121. The probes are made of conductive materials and are in shapes of pins, pins and the like.

The circuit transfer mechanism 230 is disposed above the probe mechanism 220, such as the circuit transfer mechanism 230 is disposed above the probe mechanism 220 in a stacked manner. The circuit switching mechanism 230 includes a switching circuit board 231, and a circuit pattern for electrically connecting the circuit on the flexible circuit board 120 is disposed on the switching circuit board 231. The relay circuit board 231 is provided with a second electrical connection pad which is press-connected to the other end of the connection probe. Usually, a plurality of second electrical connection pads are disposed on the interposer pcb 231 in a concentrated manner, and the arrangement of the plurality of second electrical connection pads is mainly based on the arrangement of the first electrical connection pads 121.

The fixing mechanism 240 is used for fixing the optical device 100, the probe mechanism 220 and the circuit switching mechanism 230, so as to ensure that the optical device 100, the probe mechanism 220 and the circuit switching mechanism 230 are not loosened during the use of the optical device electrical connection apparatus 200, and ensure the stability of electrical connection of the optical device 100. Illustratively, the securing mechanism 240 includes a crimp assembly for crimping the probe mechanism 220 and the circuit relay mechanism 230, and an optical device crimping structure for securing the optical device 100.

When the optical device electrical connection device 200 provided in the embodiment of the present application is used for experimental testing of the optical device 100, the optical device 100 is placed on the base 210, and the fixing mechanism 240 fixes the optical device 100 on the base 210; arranging the probe mechanism 220 on the base 210, wherein the probe mechanism 220 covers one end of the flexible circuit board 120, which is provided with the first electric connection pad 121, in a pressing manner, so that one end of a probe of the probe mechanism 220 is connected with the first electric connection pad 121 in a pressing manner; the circuit switching mechanism 230 is disposed above the probe mechanism 220, and makes the second electrical connection pad on the switching circuit board 231 press-contact the other end of the connection probe; fixing mechanism 240 crimping switching circuit board 231, probe mechanism 220 crimping flexible circuit board 120 make first electric connection pad 121 of probe crimping connection and second electric connection pad, realize switching circuit board 231 to the electric connection of light engine 110, make things convenient for the power supply of optical device 100 to connect, and then make things convenient for the experimental test in the optical device 100 production process.

Fig. 3 is a first state diagram illustrating the use of a base according to some embodiments, and fig. 4 is a second state diagram illustrating the use of a base according to some embodiments. As shown in fig. 3 and 4, one end of the base body 211 is provided with a groove 212, a supporting block 213 is supported in the groove 212, and the supporting block 213 is provided with a slot 214, wherein the slot 214 is used for being matched with and connected with the optical port end of the optical device 100; illustratively, the supporting blocks 213 are screwed to the base body 211. Generally, the optical port of the optical device includes a fiber connector, etc., and the card slot 214 is used to facilitate the connection between the optical port of the optical device 100 and the optical fiber. In some embodiments of the present application, the optical device electrical connection apparatus 200 can be used for optical devices 100 with different specifications and shapes by replacing the supporting block 213 and the card slot 214, so that the supporting block 213 and the card slot 214 are cooperatively disposed to facilitate the optical device electrical connection apparatus 200 to be suitable for use with a plurality of optical devices 100.

In some embodiments, the fixing mechanism 240 fixes the optical device 100, the probe mechanism 220, and the circuit switching mechanism 230 by pressing, so as to facilitate the assembly and disassembly of the optical device 100, the probe mechanism 220, and the circuit switching mechanism 230 on the base 210, thereby facilitating the replacement of the optical device 100 during the testing process. Illustratively, the securing mechanism 240 includes a first crimp assembly 241, a second crimp assembly 242, and a photonic crimp structure 243; the first crimp member 241 and the second crimp member 242 are used to crimp the relay circuit board 231, and the optical device crimp structure 243 is used to crimp the optical device 100. The first crimping assembly 241, the second crimping assembly 242 and the optical device crimping structure 243 may be any of various commercially available structures that can be opened and closed by a wrench.

In some embodiments, the first crimping assembly 241 and the second crimping assembly 242 are symmetrically disposed on the base body 211, so that the first crimping assembly 241 and the second crimping assembly 242 can symmetrically apply force to the adapter circuit board 231, and the adapter circuit board 231 can be uniformly applied to the inside of the probe in a crimping manner, thereby facilitating to ensure the service life of the probe. In some embodiments, the optical device crimping structure 243 is disposed at a location of the base body 211 proximate to the groove.

In some embodiments, the first crimping assembly 241 includes a first connection plate 2411 and a first crimping structure 2412, and the second crimping assembly 242 includes a second connection plate 2421 and a second crimping structure 2422; the first pressing structure 2412 and the second pressing structure 2422 are used for pressing and fixing the adapter circuit board 231; the first connection plate 2411 is used for connecting the base body 211 and the first pressing structure 2412, the second connection plate 2421 is used for connecting the base body 211 and the first pressing structure 2422, and the first connection plate 2411 and the second connection plate 2421 are used for facilitating installation of the first pressing structure 2412 and the second pressing structure 2422 and controlling installation height of the first pressing structure 2412 and the second pressing structure 2422 on the base body 211. The first connection plate 2411 is disposed at one side of the base body 211, and the second connection plate 2421 is disposed at the other side of the base body 211.

Illustratively, the first connecting plate 2411 is a T-shaped mounting plate, and the side edge of the bottom of the first connecting plate 2411 is connected with the side edge of the base body 211; the bottom surface of the top of the first connecting plate 2411 is connected with the top surface of the base body 211, and the top surface of the top of the first connecting plate 2411 is connected with the first crimping structure 2412 in a supporting manner; the first pressing structure 2412 is an openable and closable clip-shaped structure, one end of the first pressing structure 2412 is located above the first connection plate 2411, and the other end of the first pressing structure 2412 is located outside the first connection plate 2411 and is used for pressing and connecting the adapter circuit board 231. The second connection plate 2421 and the second crimping structure 2422 may be structurally referenced to the first connection plate 2411 and the first crimping structure 2412.

In some embodiments, the first and second position-limiting columns 215 and 216 are disposed on the top of the base body 211, and the first and second position-limiting columns 215 and 216 are used for positioning and installing the probe mechanism 220 and the circuit adapter mechanism 230, so as to ensure the accuracy of the pressure connection between the probe and the first and second electrical connection pads 121 and 230.

In some embodiments, the first mounting hole 217 is disposed at the top of the base body 211, and the insulating support 2171 is disposed in the first mounting hole 217, and the insulating support 2171 is used to support one end of the flexible circuit board 120 at which the first electrical connection pad 121 is disposed. Generally, the base body 211 is made of stainless steel, etc. and has a conductive capability, so that when the probe is connected to the first electrical connection pad 121 by pressure welding, the insulation of the probe from the base body 211 can be effectively achieved by using the insulating support 2171.

In some embodiments, the first positioning column 218 and the second positioning column 219 are disposed on the top of the base body 211, and the first positioning column 218 and the second positioning column 219 are used for positioning the flexible circuit board 120, so as to facilitate positioning and mounting of the flexible circuit board 120 on the base body 211, and further ensure the accuracy of the pressure welding between the probe and the first electrical connection pad 121 and the second electrical connection pad.

Fig. 5 is a schematic structural diagram of an optical device on a base according to some embodiments, fig. 6 is a partially enlarged view of a point a in fig. 5, and fig. 5 and 6 show an assembled state of the optical device 100 on the base body 211 and an assembled state of the flexible circuit board 120 on the base body 211. As shown in fig. 5 and 6, in the embodiment of the present application, the optical device 100 is disposed on the base body 211, the optical port of the optical device 100 is located at one end of the base body 211 and located in the card slot 214, the flexible circuit board 120 extends toward the direction of the first mounting hole 217 on the base body 211 and extends to the position of the first mounting hole 217, and the first electrical connection pad 121 is located on the insulating support 2171; the insulating support 2171 supports the flexible circuit board 120 and the lower ends of the probes 222 are press-connected to the first electrical connection pads 121.

As shown in fig. 5 and 6, the first positioning column 218 and the second positioning column 219 are positioned and connected to the flexible circuit board 120 for ensuring that the flexible circuit board 120 is accurately disposed at the assembling position of the end of the first electrical connection pad 121 above the insulating support 2171, so that the probe can be precisely connected to the corresponding first electrical connection pad 121 by pressure welding.

Fig. 7 is a first structural schematic diagram of a circuit transfer mechanism provided according to some embodiments, and fig. 7 illustrates a top surface structure of the circuit transfer mechanism. As shown in fig. 7, the circuit switching mechanism 230 includes a switching circuit board 231, and a third limiting hole 232 and a fourth limiting hole 233 disposed on the switching circuit board 231, wherein the third limiting hole 232 and the fourth limiting hole 233 are used for matching and connecting the first limiting column 215 and the second limiting column 216 to ensure the assembly accuracy of the switching circuit board 231. Illustratively, the first position-limiting post 215 is connected to the third position-limiting hole 232, and the second position-limiting post 216 is connected to the fourth position-limiting hole 233.

Fig. 8 is a second schematic structural diagram of a circuit transfer mechanism according to some embodiments, fig. 9 is a partial enlarged view of a portion B in fig. 8, and fig. 8 and 9 illustrate a bottom structure of a transfer circuit board. As shown in fig. 8 and 9, a plurality of second electrical connection pads 234 are provided on the bottom surface of the relay circuit board 231, and the arrangement combination form of the plurality of second electrical connection pads 234 refers to the arrangement combination form of the first electrical connection pads 121. Illustratively, probe connection holes 2341 are provided on the second electrical connection pads 234, and the probe connection holes 2341 are used to facilitate the second electrical connection pads 234 to be connected with corresponding probes in a pressure welding manner; the width of the probe connection hole 2341 is greater than the width of the probe connection hole at other positions on the second electrical connection pad 234, so that the reliability of the pressure conduction between the probe and the second electrical connection pad 234 is ensured.

In some embodiments, the end of the probe contacting the second electrical connection pad 234 is relatively thin, the end forms a step with the middle of the probe, and the end of the probe extends into the probe connection hole 2341, that is, the end of the probe is embedded in the connection probe connection hole 2341, and the step fits the second electrical connection pad 234. Illustratively, the probe connection hole 2341 is a via.

Fig. 10 is a first structural schematic diagram of a probe mechanism provided according to some embodiments, fig. 11 is a partially enlarged view at C in fig. 10, and fig. 10 and 11 illustrate a top surface structure of the probe mechanism. As shown in fig. 10 and 11, the probe mechanism 220 includes a probe holder 221, a probe mounting groove 223 is provided on a top surface of the probe holder 221, a probe 222 is disposed in the probe mounting groove 223, the probe 222 penetrates through a bottom of the probe mounting groove 223, and a top end of the probe 222 is located outside the probe mounting groove 223. The probe mounting groove 223 facilitates the arrangement of the probe 222 on the probe holder 221. Illustratively, the top end of the probe 222 is thinner than the middle of the probe, so that the probe 222 is conveniently matched and connected with the probe connection hole 2341, and the probe 222 is enabled to be connected with the probe connection hole 2341

The probe fixing seat 221 is further provided with a first limiting hole 224 and a second limiting hole 225, and the first limiting hole 224 and the second limiting hole 225 are used for being matched with and connected with the first limiting column 215 and the second limiting column 216 to ensure the assembly precision of the probe fixing seat 221. Illustratively, the first position-limiting post 215 is coupled to the first position-limiting hole 224, and the second position-limiting post 216 is coupled to the second position-limiting hole 225.

Fig. 12 is a second schematic structural diagram of a probe mechanism according to some embodiments. As shown in fig. 12, the lower end of the probe 222 passes through the bottom surface of the probe holder 221; a first protrusion 226 and a second protrusion 227 are arranged on two sides of the bottom of the probe fixing seat 221, and the first protrusion 226 and the second protrusion 227 are connected with the base body 211 in a matching manner; when the probe holders 221 are pressed with excessive force, the first protrusions 226 and the second protrusions 227 are used to support the probe holders 221 to prevent damage to the probes 222. Illustratively, the first protrusion 226 and the second protrusion 227 respectively extend from one end of the probe holder 221 to the other end of the probe holder 221; a first mounting groove 2111 and a second mounting groove 2112 are arranged on the base body 211, the first mounting groove 2111 is used for being matched and connected with the first protrusion 226, and the second mounting groove 2112 is used for being matched and connected with the second protrusion 227; when the probe fixing seat 221 is pressed with excessive force, the first installation groove 2111 supports the first protrusion 226, and the second installation groove 2112 supports the second protrusion 227, so as to control the relative position of the probe fixing seat 221 on the base body 211, and avoid damage to the probe 222 caused by excessive approach of the probe fixing seat 221 and the base body 211.

Fig. 13 is a schematic view of an assembly of a probe mechanism and a flexible circuit board according to some embodiments, and fig. 14 is a partial enlarged view of a portion D in fig. 13. As shown in fig. 13 and 14, the bottom ends of the probes 222 are provided with penetrating ends, and the penetrating ends make the bottom ends of the probes 222 relatively thin, and can penetrate through the vias on the first electrical connection pads 121, so as to ensure the electrical connection stability of the probes 222 and the corresponding first electrical connection pads 121.

Fig. 15 is an assembled cross-sectional view of a probe mechanism, a circuit adapter mechanism and a flexible circuit board according to some embodiments, and fig. 15 shows an assembled relationship of the probe holder 221, the adapter circuit board 231 and the flexible circuit board 120. As shown in fig. 15, the probe holder 221 is mounted on the flexible circuit board 120, the adapting circuit board 231 is mounted on the probe holder 221, one end of the probe 222 is connected to the first electrical connection pad 121 by pressure, the other end of the probe 222 is connected to the second electrical connection pad 234 by pressure, and the first electrical connection pad 121 and the second electrical connection pad 234 are electrically connected through the probe 222.

Fig. 16 is a first usage state diagram of an electrical connection apparatus for optical devices according to some embodiments, and fig. 17 is a second usage state diagram of an electrical connection apparatus for optical devices according to some embodiments. As shown in fig. 16 and 17, the optical device 100 is fixedly provided on the mount body 211. The optical device pressing structure 243 presses and fixes the optical engine 110, and the first pressing component 241 and the second pressing component 242 press and connect the adapting circuit board 231, so that the adapting circuit board 231 presses and connects the probe holder 221, the probe holder 221 presses and connects one end of the flexible circuit board 120, where the first electrical connection pad 121 is disposed, to ensure that one end of the probe 222 is in close contact with the first electrical connection pad 121, and the other end of the probe 222 is in close contact with the second electrical connection pad 234.

In some embodiments of the present application, as shown in fig. 17, the fixing mechanism 240 further includes an FPC pressing block 244, one end of the FPC pressing block 244 is connected to the base body 211, and the other end of the FPC pressing block 244 is used for pressing against the middle portion of the flexible circuit board 120 for fixing the flexible circuit board 120, so as to prevent the flexible circuit board 120 from shaking and affecting the stability of the electrical connection between the first electrical connection pad 121 and the probe 222. Illustratively, one end of the FPC crimping block 244 is attached to the base body 211 by screws.

Finally, it should be noted that: the above embodiments are only used to illustrate the technical solutions of the present application, and not to limit the same; although the present application has been described in detail with reference to the foregoing embodiments, it should be understood by those of ordinary skill in the art that: the technical solutions described in the foregoing embodiments may still be modified, or some technical features may be equivalently replaced; and such modifications or substitutions do not depart from the spirit and scope of the corresponding technical solutions in the embodiments of the present application.

Claims (10)

1. An optical device electrical connection device, for an optical device electrical connection test apparatus, comprising:

the base is used for supporting the optical device, a flexible circuit board is arranged on the optical device, and a first electric connection pad is arranged on the flexible circuit board;

the probe mechanism is arranged on the base and comprises a probe fixing seat and a probe, the probe is embedded on the probe fixing seat, two ends of the probe are positioned outside the probe fixing seat, and one end of the probe is used for being in contact connection with the first electric connection pad;

the circuit switching mechanism is arranged above the probe mechanism and comprises a switching circuit board, a second electric connection pad is arranged on the bottom surface of the switching circuit board, and the circuit board is electrically connected with the other end of the probe through the second electric connection pad;

and the fixing mechanism is connected with the base and is used for fixing the optical device, the probe fixing seat and the switching circuit board.

2. The optical device electrical connection apparatus of claim 1, wherein a probe mounting groove is disposed on the probe holder, the probe is disposed in the probe mounting groove and the probe penetrates a bottom of the probe mounting groove;

set up the via hole on the first electricity connection pad, set up the probe connecting hole on the second electricity connection pad, the one end of probe is inlayed and is established the connection the via hole, the other end of probe is inlayed and is established the connection the probe connecting hole.

3. The electrical connection apparatus for an optical device as claimed in claim 1, wherein the base includes a base body, the base body defines a first mounting hole, an insulating support member is disposed in the first mounting hole, and the insulating support member is configured to support an end of the flexible circuit board where the first electrical connection pad is disposed.

4. The electrical connection apparatus for optical devices as claimed in claim 3, wherein a first positioning post and a second positioning post are disposed on the top of the base body, and the first positioning post and the second positioning post are disposed on the side of the first mounting hole for positioning and connecting the flexible circuit board.

5. The electrical connection apparatus for optical devices as claimed in claim 1, wherein a groove is formed at one end of the base, a supporting block is disposed in the groove, and a slot is disposed on the supporting block and used for limiting and connecting the optical port end of the optical device.

6. The optical device electrical connection apparatus of claim 5, wherein the securing mechanism comprises a first crimp assembly, a second crimp assembly, and an optical device crimp structure; the first crimping component and the second crimping component are crimped on the adapter circuit board, and the optical device crimping structure is arranged on the base and used for crimping and fixing the optical device.

7. The optical device electrical connection apparatus of claim 6, wherein the fixing mechanism further comprises an FPC pressing block, one end of the FPC pressing block is connected to the base, and the other end of the FPC pressing block is used for pressing and fixing the flexible circuit board.

8. The electrical connection apparatus for an optical device as claimed in claim 3, wherein the top of the base body is provided with a first position-limiting pillar and a second position-limiting pillar; the probe fixing seat is provided with a first limiting hole and a second limiting hole, the switching circuit board is provided with a third limiting hole and a fourth limiting hole, the first limiting column is in limiting connection with the first limiting hole and the third limiting hole, and the second limiting column is in limiting connection with the second limiting hole and the fourth limiting hole.

9. The optical device electrical connection apparatus of claim 6, wherein the first crimp assembly comprises a first connection plate and a first crimp structure, and the second crimp assembly comprises a second connection plate and a second crimp structure; the bottom of the first connecting plate is connected with one side of the base, and the top of the first connecting plate is connected with the first compression joint structure; the bottom of the second connecting plate is connected with the other side of the base, and the top of the second connecting plate is connected with the second compression joint structure; the first crimping structure and the second crimping structure are crimped with the adapter circuit board.

10. The optical device electrical connection apparatus of claim 3, wherein a first protrusion and a second protrusion are disposed at a bottom of the probe holder, and a first device slot and a second device slot are disposed on the base body, the first protrusion is connected to the first device slot in a matching manner, and the second protrusion is connected to the second device slot in a matching manner.

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