CN218445591U - 一种用于芯片晶圆测试台的固定机构 - Google Patents
一种用于芯片晶圆测试台的固定机构 Download PDFInfo
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CN116430087A (zh) * | 2023-06-12 | 2023-07-14 | 南京银茂微电子制造有限公司 | 一种用于芯片晶圆测试台的固定机构 |
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CN116430087A (zh) * | 2023-06-12 | 2023-07-14 | 南京银茂微电子制造有限公司 | 一种用于芯片晶圆测试台的固定机构 |
CN116430087B (zh) * | 2023-06-12 | 2023-09-01 | 南京银茂微电子制造有限公司 | 一种用于芯片晶圆测试台的固定机构 |
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Effective date of registration: 20240218 Address after: No. 18, Huanggaihu Dawan Team, Chibi City, Xianning City, Hubei Province, China Patentee after: Long Haiyang Country or region after: China Address before: 224000 intelligent terminal Industrial Park Phase 3 N-5, Yandu District, Yancheng City, Jiangsu Province Patentee before: Fuhan Haizhi (Jiangsu) Technology Co.,Ltd. Country or region before: China |
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Effective date of registration: 20240329 Address after: 201100 2nd floor, No. 450, Husong Road, Minhang District, Shanghai Patentee after: Shanghai Sibi Semiconductor Technology Co.,Ltd. Country or region after: China Address before: No. 18, Huanggaihu Dawan Team, Chibi City, Xianning City, Hubei Province, China Patentee before: Long Haiyang Country or region before: China |
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