CN218331845U

CN218331845U - PCB testing arrangement

Info

Publication number: CN218331845U
Application number: CN202221920004.8U
Authority: CN
Inventors: 常圆
Original assignee: Jinan Huaguan Intelligent Electric Appliance Co ltd
Current assignee: Jinan Huaguan Intelligent Electric Appliance Co ltd
Priority date: 2022-07-25
Filing date: 2022-07-25
Publication date: 2023-01-17
Anticipated expiration: 2032-07-25

Abstract

The utility model provides a PCB testing arrangement relates to test fixture technical field, which comprises a bracket, one side fixedly connected with location section of thick bamboo of support, the inside sliding connection of a location section of thick bamboo has the sleeve pipe, the inside sliding connection of sheathed tube has the slide bar, the bottom fixedly connected with of slide bar goes up the pick-up plate, sheathed tube external surface fixed connection has the spacing ring. The utility model has the advantages that: the test probe stretches out from the yielding through hole on the lower detection plate and is in contact with a point to be tested on the circuit board, when the sleeve is pressed down again, the first spring can be compressed, the upper detection plate cannot continuously descend, the problem that the circuit board is crushed by the upper detection plate is avoided, the test efficiency is improved, the support block supports the bottom of the circuit board, the circuit board and the lower detection plate are kept at a certain distance, the contact between a convex contact on the circuit board and the lower detection plate is avoided, the problem that the contact is damaged when the upper detection plate is pressed down is solved, and the practicability is improved.

Description

PCB testing arrangement

Technical Field

The utility model relates to a test fixture technical field, in particular to PCB testing arrangement.

Background

The PCB is also called a printed circuit board, and is a provider of electrical connection of electronic components, and testing the circuit board is one of important production links of the circuit board, which determines the quality reliability of circuit board production.

The circuit board testing device disclosed in chinese patent CN216595400U, the circuit board testing device, set up locating pin and stopper in the four corners separately of the lower pick-up plate, the locating pin connects the locating hole of the circuit board fast, and limit the horizontal movement of the circuit board through the stopper, when the upper pick-up plate pushes down and fixes the circuit board, the circuit board is spacing reliable, will not displace, and with the downward movement of the lower pick-up plate, the test probe stretches out from the hole of stepping down, and contact with waiting for measuring point of the circuit board, improve the butt joint precision of test probe and circuit board, improve the test quality, however, this circuit board testing device, while solving the problem, have the following disadvantages:

when last pick-up plate pushed down the circuit board, the test probe stretches out from stepping down the through-hole and contacts with the circuit board, and the back of contact continues to push down, then probably leads to the damage of circuit board or test probe to go up the pick-up plate and push down the in-process and will notice constantly whether the test probe contacts with the circuit board, when wanting the contact, need slow down speed, avoid damaging the circuit board, thereby influenced the efficiency of test.

SUMMERY OF THE UTILITY MODEL

The purpose of the present invention is to solve at least one of the technical drawbacks.

Therefore, an object of the present invention is to provide a PCB testing apparatus to solve the problems mentioned in the background art and overcome the disadvantages existing in the prior art.

In order to achieve the above object, an embodiment of an aspect of the present invention provides a PCB testing device, which comprises a bracket, one side fixedly connected with location section of thick bamboo of support, the inside sliding connection of a location section of thick bamboo has the sleeve pipe, sheathed tube inside sliding connection has the slide bar, the bottom fixedly connected with of slide bar goes up the pick-up plate, sheathed tube surface fixed connection has the spacing ring, be provided with first spring between spacing ring and the last pick-up plate.

Preferably, according to any one of the above schemes, the bottom of the support is fixedly connected with a base, the top of the base is fixedly connected with a plurality of telescopic rods, the top ends of the telescopic rods are fixedly connected with a lower detection plate, and the telescopic rods are contracted to enable the lower detection plate to be lowered.

Preferably, the edge of the top of the lower detection plate is fixedly connected with a support block, the top of the support block is fixedly connected with a positioning rod, the support block can enable the circuit board to have a certain distance with the lower detection plate, a protruding contact on the circuit board is prevented from contacting with the lower detection plate, and the positioning rod positions the circuit board.

Preferably, the top end of the positioning rod is provided with a chamfer, so that the positioning hole in the circuit board is conveniently sleeved on the surface of the positioning rod.

Preferably, in any one of the above schemes, the top end of the sleeve is movably connected with a push-pull rod, one end of the push-pull rod, which is far away from the sleeve, is movably connected with an L-shaped rod, one side of the top of the support is fixedly connected with a positioning sleeve, one end of the L-shaped rod is movably connected in the positioning sleeve, the L-shaped rod is pressed downwards, and the sleeve can be pressed downwards through the push-pull rod.

Preferably, according to any one of the above schemes, a guide cylinder is fixedly connected to one side of the support, a guide rod is slidably connected in the guide cylinder, the bottom end of the guide rod is fixedly connected with the top of the upper detection plate, and the sleeve and the sliding rod are used for supporting the upper detection plate.

Preferably, by any one of the above schemes, the telescopic rod comprises a sleeve, the inside of the sleeve is slidably connected with a supporting rod, a second spring is arranged in the sleeve, the supporting rod is pressed downwards, the second spring is compressed, and therefore the supporting rod can slide into the sleeve.

By any of the above schemes, preferably, the bottom end of the supporting rod is fixedly connected with a sliding block, and the top of the inner wall of the sleeve is fixedly connected with a circular ring to prevent the supporting rod from being separated from the sleeve.

Preferably, the elastic force of the first spring is greater than the sum of the elastic forces of all the second springs, and the first spring is compressed when the second springs are compressed to the limit or the circuit board is in contact with the test probe.

Compared with the prior art, the utility model has the advantages and beneficial effects of do:

1. when the upper detection plate descends to enable the support column to press the circuit board downwards, the telescopic rod contracts, the test probes on the base extend out of the abdicating through holes in the lower detection plate and are in contact with a point to be tested on the circuit board, when the sleeve is pressed downwards again, the first spring is compressed, the upper detection plate cannot descend continuously, the problem that the circuit board is damaged by the upper detection plate is avoided, the test can be carried out quickly, and the test efficiency is improved.

2. Through setting up the tray in the bottom of locating lever, back on the locating lever is overlapped to the locating hole on the circuit board, the tray supports the bottom of circuit board to make circuit board and lower pick-up plate keep certain distance, avoid convex contact and lower pick-up plate contact on the circuit board, lead to the destroyed problem of contact when going up the pick-up plate and pushing down, improved the practicality.

Additional aspects and advantages of the invention will be set forth in part in the description which follows and, in part, will be obvious from the description, or may be learned by practice of the invention.

Drawings

The above and/or additional aspects and advantages of the present invention will become apparent and readily appreciated from the following description of the embodiments, taken in conjunction with the accompanying drawings of which:

fig. 1 is a schematic structural diagram according to an embodiment of the present invention;

fig. 2 is an enlarged schematic view of a structure at a in fig. 1 according to an embodiment of the present invention;

fig. 3 is a schematic structural view of a telescopic rod according to the embodiment of the present invention.

Wherein: 1. the device comprises a support, 2, a positioning barrel, 3, a sleeve, 4, a sliding rod, 5, an upper detection plate, 6, a limiting ring, 7, a first spring, 8, a base, 9, a telescopic rod, 901, a sleeve, 902, a supporting rod, 903, a second spring, 904, a sliding block, 905, a circular ring, 10, a lower detection plate, 11, a supporting block, 12, a positioning rod, 13, a push-pull rod, 14, an L rod, 15, an L rod, 16, a guide barrel, 17, a guide rod, 18 and a supporting column.

Detailed Description

Reference will now be made in detail to embodiments of the present invention, examples of which are illustrated in the accompanying drawings, wherein like reference numerals refer to the same or similar elements or elements having the same or similar function throughout. The embodiments described below with reference to the drawings are exemplary and intended to be used for explaining the present invention, and should not be construed as limiting the present invention.

In the present invention, unless otherwise expressly specified or limited, the terms "mounted," "connected," and "fixed" are to be construed broadly and may, for example, be fixedly connected, detachably connected, or integrally connected; can be mechanically or electrically connected; they may be connected directly or indirectly through intervening media, or they may be interconnected between two elements. The specific meaning of the above terms in the present invention can be understood according to specific situations by those skilled in the art.

The first embodiment is as follows:

as shown in fig. 1-3, the PCB testing apparatus of this embodiment includes a support 1, a positioning cylinder 2 is fixedly connected to one side of the support 1, a sleeve 3 is slidably connected inside the positioning cylinder 2, a push-pull rod 13 is movably connected to a top end of the sleeve 3, an L rod 14 is movably connected to one end of the push-pull rod 13 away from the sleeve 3, a positioning sleeve 15 is fixedly connected to one side of the top of the support 1, one end of the L rod 14 is movably connected inside the positioning sleeve 15, the L rod 14 is pressed downward to move the sleeve 3 downward, the L rod 14 is lifted upward, the sleeve 3 can be lifted up, a sliding rod 4 is slidably connected inside the sleeve 3, an upper detection plate 5 is fixedly connected to a bottom end of the sliding rod 4, a plurality of support columns 18 are fixedly connected below the upper detection plate 5, a limit ring 6 is fixedly connected to an outer surface of the sleeve 3, and a first spring 7 is disposed between the limit ring 6 and the upper detection plate 5.

The bottom fixedly connected with base 8 of support 1, a plurality of telescopic links 9 of the top fixedly connected with of base 8, telescopic link 9 includes sleeve 901, the inside sliding connection of sleeve 901 has bracing piece 902, be provided with second spring 903 in the sleeve 901, the bottom fixedly connected with slider 904 of bracing piece 902, the top fixedly connected with ring 905 of sleeve 901 inner wall, the top fixedly connected with lower pick-up plate 10 of telescopic link 9.

Edge fixedly connected with tray 11 at lower pick-up plate 10 top, tray 11's top fixedly connected with locating lever 12, the chamfer has been seted up on the top of locating lever 12, make things convenient for the circuit board cover on locating lever 12, locating hole cover on the circuit board is behind the surface of locating lever 12, tray 11 supports the bottom of circuit board, makes circuit board and lower pick-up plate 10 keep certain distance, avoids the convex contact on the circuit board by the problem of crushing when testing.

One side of the support 1 is fixedly connected with a guide cylinder 16, a guide rod 17 is slidably connected in the guide cylinder 16, the bottom end of the guide rod 17 is fixedly connected with the top of the upper detection plate 5, and the guide rod 17 assists the sleeve 3 and the slide rod 4 to support the upper detection plate 5.

The elastic force of the first spring 7 is larger than the sum of the elastic forces of all the second springs 903, and when the upper detection plate 5 descends and the supporting columns 18 below the upper detection plate 5 press the circuit board downwards, the second springs 903 are compressed first, so that the test probes can be ensured to extend out of the yielding through holes in the lower detection plate 10.

The PCB testing device of the embodiment has the following working principle:

the positioning hole in the circuit board is sleeved on the positioning rod 12 to position the positioning rod, the L rod 14 is pressed downwards, the upper detection plate 5 is descended, the supporting column 18 below the upper detection plate 5 is in contact with the upper part of the circuit board, the circuit board is pressed downwards, the lower detection plate 10 is forced to press the telescopic rod 9 downwards, the second spring 903 is compressed, therefore, the test probe extends out of the yielding through hole in the lower detection plate 10 and is in contact with a point to be tested on the circuit board, if the force for pressing the L rod 14 downwards is too large, the first spring 7 is forced to be compressed after the test probe is in contact with the circuit board, and the problem that the circuit board is damaged by pressing is avoided.

Compared with the prior art, the utility model discloses for prior art have following beneficial effect:

1. when the upper detection plate 5 descends to enable the support column 18 to press the circuit board downwards, the telescopic rod 9 contracts, the test probes on the base 8 extend out of the abdicating through holes in the lower detection plate 10 and are in contact with points to be tested on the circuit board, at the moment, when the sleeve 3 is pressed downwards again, the first spring 7 is compressed, the upper detection plate 5 cannot continuously descend, the problem that the circuit board is damaged by the upper detection plate 5 is avoided, the test can be rapidly carried out, and the test efficiency is improved.

2. Through setting up tray 11 in the bottom of locating lever 12, after locating hole cover on the circuit board was on locating lever 12, tray 11 supported the bottom of circuit board to make circuit board and lower pick-up plate 10 keep certain distance, avoid convex contact on the circuit board and contact with lower pick-up plate 10, lead to the destroyed problem of contact when going up pick-up plate 5 and pushing down, improved the practicality.

In the description of the present specification, reference to the description of "one embodiment," "some embodiments," "an example," "a specific example," or "some examples" or the like means that a particular feature, structure, material, or characteristic described in connection with the embodiment or example is included in at least one embodiment or example of the present invention. In this specification, the schematic representations of the terms used above do not necessarily refer to the same embodiment or example. Furthermore, the particular features, structures, materials, or characteristics described may be combined in any suitable manner in any one or more embodiments or examples.

It will be understood by those skilled in the art that the invention, including any combination of the elements of the above description and the detailed description and illustrated in the accompanying drawings, is not limited to the details and should not be construed as limited to the embodiments set forth herein for the sake of brevity. Any modification, equivalent replacement, or improvement made within the spirit and principle of the present invention should be included in the protection scope of the present invention.

Although embodiments of the present invention have been shown and described, it is understood that the above embodiments are exemplary and should not be construed as limiting the invention, and that those skilled in the art may make variations, modifications, substitutions and alterations herein without departing from the spirit and scope of the invention. The scope of the invention is defined by the appended claims and equivalents thereof.

Claims

1. The PCB testing device is characterized by comprising a support (1), wherein one side of the support (1) is fixedly connected with a positioning barrel (2), the inside of the positioning barrel (2) is connected with a sleeve (3) in a sliding manner, the inside of the sleeve (3) is connected with a sliding rod (4) in a sliding manner, the bottom end of the sliding rod (4) is fixedly connected with an upper testing plate (5), the outer surface of the sleeve (3) is fixedly connected with a limiting ring (6), and a first spring (7) is arranged between the limiting ring (6) and the upper testing plate (5).

2. A PCB testing device as claimed in claim 1, wherein a base (8) is fixedly connected to the bottom of the supporting frame (1), a plurality of telescopic rods (9) are fixedly connected to the top of the base (8), and a lower detecting plate (10) is fixedly connected to the top ends of the telescopic rods (9).

3. A PCB testing device according to claim 2, wherein a supporting block (11) is fixedly connected to the edge of the top of the lower detecting plate (10), and a positioning rod (12) is fixedly connected to the top of the supporting block (11).

4. The PCB testing device of claim 3, wherein the top end of the positioning rod (12) is chamfered.

5. The PCB testing device of claim 1, wherein a push-pull rod (13) is movably connected to the top end of the sleeve (3), an L-shaped rod (14) is movably connected to one end, away from the sleeve (3), of the push-pull rod (13), a positioning sleeve (15) is fixedly connected to one side of the top of the support (1), and one end of the L-shaped rod (14) is movably connected to the inside of the positioning sleeve (15).

6. The PCB testing device of claim 1, wherein a guide cylinder (16) is fixedly connected to one side of the bracket (1), a guide rod (17) is slidably connected in the guide cylinder (16), and the bottom end of the guide rod (17) is fixedly connected with the top of the upper testing board (5).

7. A PCB testing device according to claim 2, wherein the telescopic rod (9) comprises a sleeve (901), a supporting rod (902) is slidably connected inside the sleeve (901), and a second spring (903) is arranged inside the sleeve (901).

8. The PCB testing device of claim 7, wherein a slider (904) is fixedly connected to a bottom end of the supporting rod (902), and a ring (905) is fixedly connected to a top portion of an inner wall of the sleeve (901).

9. A PCB test device as claimed in claim 7, characterized in that the spring force of the first spring (7) is larger than the sum of the spring forces of all the second springs (903).