CN218272450U

CN218272450U - Circuit board testing device

Info

Publication number: CN218272450U
Application number: CN202222708997.9U
Authority: CN
Inventors: 陈伟军; 陈燕峰
Original assignee: Alfred Suzhou Testing Technology Co ltd
Current assignee: Alfred Suzhou Testing Technology Co ltd
Priority date: 2022-10-14
Filing date: 2022-10-14
Publication date: 2023-01-10
Anticipated expiration: 2032-10-14

Abstract

The utility model relates to a circuit board testing arrangement down includes carrier roof and the carrier faller that interconnect set up in proper order from last, and the border position on the roof base plate is provided with a plurality of quick change locker, installs a plurality of adapter probe along one side in Y axle positive direction on the roof base plate, and in the quick change guide sleeve of below can be inserted to the quick change locker, the test probe extended to the bottom of faller base plate, and the adapter probe can insert in the adapter needle file of below. The utility model discloses a testing arrangement suitability scope is wider, and carrier roof fixed mounting is on the manipulator, and carrier faller accessible quick change locker and quick change guide pin bushing realize with the quick replacement of carrier roof, and the test probe on the carrier faller can be changed according to the test demand of different model products, and then improves testing arrangement's flexibility, can be applicable to the test of multiple product, saves the cost.

Description

Circuit board testing device

Technical Field

The utility model relates to a circuit board test is related to technical field, especially relates to a circuit board testing arrangement.

Background

With the increasing development of science and technology, a large number of electronic products are continuously generated, the quality of the printed circuit board, which is an indispensable core part of the electronic products, determines whether the product can be successfully applied, and electrical testing is a very general and effective means for finding the quality of the circuit board.

The electrical characteristic test system of the present circuit board is mostly composed of 4 main components of a PC/test instrument machine/test fixture/circuit board under test:

the PC is a control unit of the test system, and the test program is generated and stored by the PC;

the test instrument machine is a collection for testing related instruments;

the test fixture is a bridge for connecting the tested circuit board and the test instrument, and a test probe is arranged on the test fixture and is used for contacting a test point of the tested circuit board;

the circuit board to be tested is a circuit board tested in the production process.

In the test process, the PC sends a designated logic signal through the test instrument and meter and sends the logic signal to the tested circuit board through the test fixture, then the circuit board feeds a feedback signal back to the test instrument and meter through the test fixture, and the PC analyzes the collected signal and judges the correctness of the result.

In actual production, the test fixture is used as a matching device with a tested circuit board, and is in a one-to-one relationship, that is, a tested board should have one test fixture, generally, the size of one test fixture is mostly 500mm (length) × 400mm (width) × 500mm (height), the cost is several ten thousand yuan, and the time for changing the product at a user end to change the test fixture is 10-20 minutes. Therefore, the storage of the material of the clamp and the clamp body is very high in cost, and the switching efficiency is not high.

In view of the above-mentioned drawbacks, the present designer is actively making research and innovation to create a circuit board testing device, which has industrial application value.

SUMMERY OF THE UTILITY MODEL

In order to solve the technical problem, the utility model aims at providing a circuit board testing device.

In order to achieve the above purpose, the utility model adopts the following technical scheme:

a circuit board testing device comprises a carrier top plate and a carrier needle plate which are connected from top to bottom, wherein the carrier top plate comprises a top plate base plate, a plurality of quick-change lockers are arranged at the edge position of the top plate base plate, and a plurality of switching probes are arranged on one side of the top plate base plate along the positive direction of a Y axis; the carrier faller includes the faller base plate, is provided with the quick change guide pin bushing on the faller base plate under the quick change locker, and in the quick change guide pin bushing of below can be pegged graft into to the quick change locker, a plurality of test probe was installed to the intermediate position on the faller base plate, and test probe extends to the bottom of faller base plate, is provided with the adapter needle file on the faller base plate under the adapter probe, and the adapter probe can be pegged graft in the adapter needle file of below.

As a further improvement, the quick change locker includes the locker body, the top of locker body is provided with the locker base, be provided with the air vent that can be linked together with this internal cavity of locker on the locker base, be provided with the axle in the cavity of the locker body of locker base bottom, the axle can remove in the cavity of locker body along the Z axle direction, the cavity of locker body is close to position one side of bottom and is seted up jaggedly, be provided with the ball in the breach, the position that is close to the top in the quick change uide bushing is provided with the draw-in groove.

As the utility model discloses a further improvement, the cavity of locker body is from last shoulder hole that down diameter diminishes in proper order, the shoulder hole is the setting of four sections structure, the axle is from last shoulder shaft that down diameter diminishes in proper order, the shoulder shaft is the setting of three-section structure, the locker pedestal mounting is downthehole at the first shoulder at top, the first section at axle top can be downthehole along Z axle direction removal at the second shoulder, the second section at axle middle part and the third section of bottom all can remove along Z axle direction in third shoulder hole and fourth shoulder hole.

As a further improvement, the third step hole is provided with a spring, and the spring sleeve is arranged on the second section at the middle part of the shaft.

As a further improvement, the third section of axle bottom is the voussoir, is provided with voussoir inclination theta between voussoir and the fourth shoulder hole.

As a further improvement of the utility model, the middle position on the top plate base plate is provided with a position avoiding hole for avoiding the position treatment of the test probe.

As a further improvement, the quantity of the quick-change locker and the quick-change guide sleeve is 2-4.

As a further improvement, the number of the quick-change locker and the quick-change guide sleeve is 3.

Borrow by above-mentioned scheme, the utility model discloses at least, have following advantage:

the testing device of the utility model can be matched with the mechanical arm and the CCD optical module on the basis of the testing system of the prior art, and the testing device can be positioned and operated more conveniently;

the utility model discloses a testing arrangement suitability scope is wider, and carrier roof fixed mounting is on the manipulator, and the carrier faller accessible quick change locker and quick change guide pin bushing realize with the quick replacement of carrier roof, and the test probe on the carrier faller can be changed according to the test demand of different model products, and then improves testing arrangement's flexibility, can be applicable to the test of multiple product, saves the cost;

the utility model discloses a carrier faller accessible quick change locker and quick change guide pin bushing realize with the quick replacement of carrier roof, can improve switching efficiency, save a large amount of time for the user and then improve the output.

The above description is only an overview of the technical solution of the present invention, and in order to make the technical means of the present invention clearer and can be implemented according to the content of the description, the following detailed description is made with reference to the preferred embodiments of the present invention and accompanying drawings.

Drawings

In order to more clearly illustrate the technical solutions of the embodiments of the present invention, the drawings that are required to be used in the embodiments will be briefly described below, it should be understood that the following drawings only illustrate some embodiments of the present invention, and therefore should not be considered as limiting the scope, and for those skilled in the art, other related drawings can be obtained according to the drawings without inventive efforts.

Fig. 1 is a schematic structural diagram of a circuit board testing apparatus according to the present invention;

FIG. 2 is a schematic view of the top plate of the carrier of FIG. 1;

FIG. 3 is a schematic view of the construction of the carrier needle board of FIG. 1;

fig. 4 is a schematic view of the quick-change locker and the quick-change guide sleeve of the present invention during locking;

FIG. 5 is an enlarged partial view of FIG. 4 at A;

fig. 6 is a schematic view of the quick-change locker when the quick-change locker and the quick-change guide sleeve are loosened according to the present invention;

fig. 7 is the schematic view of the quick-change guide sleeve when the quick-change locker and the quick-change guide sleeve are loosened.

In the drawings, the meanings of the reference numerals are as follows.

Carrier top plate 1 and carrier needle plate 2

3 quick-change locker for top plate substrate 4

5 adapting probe 6 avoiding hole

7 needle plate base plate 8 quick-change guide sleeve

9 test probe 10 adapter needle stand

11 locker body 12 locker base

13 air vent 14 shaft

15 spring 16 gap

17 ball 18 neck

19 wedge θ wedge inclination angle

Detailed Description

The following detailed description of the embodiments of the present invention is provided with reference to the accompanying drawings and examples. The following examples are intended to illustrate the invention, but are not intended to limit the scope of the invention.

In order to make the technical solution of the present invention better understood, the technical solution in the embodiments of the present invention will be clearly and completely described below with reference to the drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only some embodiments of the present invention, not all embodiments. The components of embodiments of the present invention, as generally described and illustrated in the figures herein, may be arranged and designed in a wide variety of different configurations. Thus, the following detailed description of the embodiments of the present invention, presented in the accompanying drawings, is not intended to limit the scope of the invention, as claimed, but is merely representative of selected embodiments of the invention. Based on the embodiment of the present invention, all other embodiments obtained by the person skilled in the art without creative work belong to the protection scope of the present invention.

Examples

As shown in figures 1 to 7 of the drawings,

a circuit board testing device sequentially comprises a carrier top plate 1 and a carrier needle plate 2 which can be connected with each other from top to bottom, wherein the carrier top plate 1 comprises a top plate base plate 3, a plurality of quick-change lockers 4 are arranged at the edge position on the top plate base plate 3, and a plurality of adapter probes 5 are arranged on one side of the top plate base plate 3 along the positive direction of a Y axis; carrier faller 2 includes faller base plate 7, be provided with quick change guide pin bushing 8 on the faller base plate 7 under quick change locker 4, quick change locker 4 can be inserted in the quick change guide pin bushing 8 of below, a plurality of test probe 9 is installed to the intermediate position on the faller base plate 7, the intermediate position on the roof base plate 3 is provided with and is used for keeping away a position hole 6 of handling to test probe 9, test probe 9 extends to the bottom of faller base plate 7, be provided with adapter needle file 10 on the faller base plate 7 under adapter probe 5, adapter probe 5 can be inserted in adapter needle file 10 of below.

Wherein, the structure and the theory of operation of quick change locker 4 and quick change guide pin bushing 8:

the quick-change locker 4 comprises a locker body 11, a locker base 12 is arranged at the top of the locker body 11, a vent hole 13 communicated with a cavity in the locker body 11 is formed in the locker base 12, a shaft 14 is arranged in the cavity of the locker body 11 at the bottom of the locker base 12, the shaft 14 can move in the cavity of the locker body 11 along the Z-axis direction, a notch 16 is formed in one side of the position, close to the bottom, of the cavity of the locker body 11, a ball 17 is arranged in the notch 16, and a clamping groove 18 is formed in the position, close to the top, of the quick-change guide sleeve 8.

The cavity of locker body 11 is for following the shoulder hole that down the diameter diminishes in proper order, the shoulder hole is the setting of four sections structure, axle 14 is the shoulder shaft that down the diameter diminishes in proper order from the follow, the shoulder shaft is the setting of three-section structure, locker base 12 is installed in the first shoulder hole at top, the first section at axle 14 top can remove along the Z axle direction in the second shoulder hole, the second section at axle 14 middle part and the third section of bottom all can remove along the Z axle direction in third shoulder hole and fourth shoulder hole. The third section at the bottom of the shaft 14 is a wedge 19, and a wedge inclination angle theta is arranged between the wedge 19 and the fourth stepped hole. A spring 15 is arranged in the third step hole, and the spring 15 is sleeved on the second section in the middle of the shaft 14.

Wherein, the number of the quick-change locker 4 and the quick-change guide sleeve 8 is 2-4.

The utility model relates to a circuit board testing arrangement's first embodiment:

the utility model discloses a testing arrangement mainly uses in following application scene, and whole test system comprises 6 main parts of PC test instrument board/manipulator testing arrangement quick change auxiliary module/circuit board by test:

the test instrument and meter machine is a collection of relevant instruments and meters for testing;

the manipulator is controlled by a PC system, automatically picks the quick-change carrier at a specified position according to the model of the tested circuit board, and automatically butt-joints a circuit signal on the quick-change carrier with the test instrument;

the circuit board testing device is a bridge for connecting a tested circuit board and a testing instrument, and a testing probe is arranged on the circuit board testing device and is used for contacting a testing point of the tested circuit board;

a CCD optical module for calibrating the position between the quick-change carrier and the object to be measured, thereby avoiding the object to be measured from being damaged due to inaccurate binding points;

the circuit board to be tested is a circuit board which is tested in the production process.

The utility model relates to a circuit board testing arrangement's principle is introduced:

mainly comprises two parts, namely a carrier top plate 1 and a carrier needle plate 2. The carrier top plate 1 is a fixed device locked on the manipulator and does not need to be replaced. The carrier pin plate 2 is customized for different circuit boards under test, wherein only the positions of the test probes 9 are different depending on the positions of the test points of the board under test.

Wherein the carrier top plate 1 comprises the following components:

during testing, a test signal is transmitted to the adapter pin seat 10 on the carrier needle plate 2 from the adapter probe 5 of the carrier top plate 1 and then transmitted to the test probe 9 from the adapter pin seat 10. It can be seen that the fitting structure is very simple, and the difficulty of manufacturing the carrier needle plate 2 and the threshold for guiding a user are both extremely low.

The quick switching mechanism of the testing device is realized by mutually matching the quick-change guide sleeve 8 and the quick-change locker 4:

when locking is needed, compressed air enters the cavity of the locker body 11 to push the shaft 14 inside to jack upwards, the ball 17 is pushed out by the shaft, the quick-change guide sleeve 8 is locked, and the top plate base plate 3 and the needle plate base plate 7 are tensioned;

when the carrier top plate 1 and the carrier needle plate 2 need to be released, compressed air in the cavity of the locker body 11 is pumped out, the shaft 14 is pushed by the spring 15 to slide downwards, the ball 17 can retract, and the top plate base plate 3 and the needle plate base plate 7 can be freely separated under the action of external force.

In the description of the present invention, it is to be understood that the terms "center", "longitudinal", "lateral", "up", "down", "front", "back", "left", "right", "vertical", "horizontal", "top", "bottom", "inner", "outer", etc. indicate orientations or positional relationships based on the orientations or positional relationships shown in the drawings, and are only for convenience of description and simplicity of description, but do not indicate or imply that the device or element referred to must have a particular orientation, be constructed and operated in a particular orientation, and therefore, are not to be construed as limiting the present invention. Furthermore, the terms "first," "second," and the like are used for descriptive purposes only and are not to be construed as indicating or implying relative importance or implicitly referring to the number of technical features being grined. Thus, a feature defined as "first," "second," etc. may explicitly or implicitly include one or more of that feature. In the description of the present invention, "a plurality" means two or more unless otherwise specified.

In the description of the present invention, it is to be noted that, unless otherwise explicitly specified or limited, the terms "mounted", "connected" and "connected" are to be interpreted broadly, and may be, for example, fixedly connected, detachably connected, or integrally connected: either mechanically or electrically: the terms may be directly connected or indirectly connected through an intermediate member, or may be a communication between two elements.

The above description is only a preferred embodiment of the present invention, and is not intended to limit the present invention, and it should be noted that, for those skilled in the art, a plurality of modifications and variations can be made without departing from the technical principle of the present invention, and these modifications and variations should also be regarded as the protection scope of the present invention.

Claims

1. A circuit board testing device sequentially comprises a carrier top plate (1) and a carrier needle plate (2) which can be connected with each other from top to bottom, and is characterized in that the carrier top plate (1) comprises a top plate base plate (3), a plurality of quick-change lockers (4) are arranged at the edge position of the top plate base plate (3), and a plurality of adapter probes (5) are arranged on one side of the top plate base plate (3) along the positive direction of a Y axis; carrier faller (2) is including faller base plate (7), be provided with quick change guide pin bushing (8) on faller base plate (7) under quick change locker (4), but quick change locker (4) plug-in is in quick change guide pin bushing (8) of below, intermediate position on faller base plate (7) installs a plurality of test probe (9), test probe (9) extend to the bottom of faller base plate (7), be provided with switching needle file (10) on faller base plate (7) under switching probe (5), but switching probe (5) plug-in is in switching needle file (10) of below.

2. The circuit board testing device according to claim 1, wherein the quick-change locker (4) comprises a locker body (11), a locker base (12) is arranged at the top of the locker body (11), a vent hole (13) which can be communicated with a cavity in the locker body (11) is arranged on the locker base (12), a shaft (14) is arranged in the cavity of the locker body (11) at the bottom of the locker base (12), the shaft (14) can move in the cavity of the locker body (11) along the Z-axis direction, a notch (16) is formed in one side of the cavity of the locker body (11) close to the bottom, a ball (17) is arranged in the notch (16), and a clamping groove (18) is formed in the quick-change guide sleeve (8) close to the top.

3. The circuit board testing device according to claim 2, wherein the cavity of the locking device body (11) is a stepped hole with a diameter gradually decreasing from top to bottom, the stepped hole is of a four-section structure, the shaft (14) is a stepped shaft with a diameter gradually decreasing from top to bottom, the stepped shaft is of a three-section structure, the locking device base (12) is installed in the first stepped hole at the top, the first section at the top of the shaft (14) can move in the second stepped hole along the Z-axis direction, and the second section at the middle of the shaft (14) and the third section at the bottom can move in the Z-axis direction in the third stepped hole and the fourth stepped hole.

4. A circuit board testing device according to claim 3, characterized in that a spring (15) is installed in the third stepped hole, and the spring (15) is sleeved on the second section of the middle part of the shaft (14).

5. A circuit board testing device according to claim 3, characterized in that the third section of the bottom of the shaft (14) is a wedge (19), and a wedge inclination angle (θ) is provided between the wedge (19) and the fourth stepped hole.

6. A circuit board testing device according to claim 1, wherein a position-avoiding hole (6) for avoiding the position of the testing probe (9) is formed in the middle of the top board substrate (3).

7. The circuit board testing device according to claim 1, wherein the number of the quick-change locker (4) and the quick-change guide sleeve (8) is 2-4.

8. A circuit board testing device according to claim 7, characterized in that the number of quick-change lockers (4) and quick-change guide sleeves (8) is 3.