CN218272077U - Device for measuring bending performance of narrow surface of high-temperature superconducting tape - Google Patents

Device for measuring bending performance of narrow surface of high-temperature superconducting tape Download PDF

Info

Publication number
CN218272077U
CN218272077U CN202221686217.9U CN202221686217U CN218272077U CN 218272077 U CN218272077 U CN 218272077U CN 202221686217 U CN202221686217 U CN 202221686217U CN 218272077 U CN218272077 U CN 218272077U
Authority
CN
China
Prior art keywords
temperature superconducting
cover plate
arch structure
plate
superconducting tape
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
CN202221686217.9U
Other languages
Chinese (zh)
Inventor
王娟
徐庆金
陈新
冯傲
王莹哲
石金瑞
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Institute of High Energy Physics of CAS
Original Assignee
Institute of High Energy Physics of CAS
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Institute of High Energy Physics of CAS filed Critical Institute of High Energy Physics of CAS
Priority to CN202221686217.9U priority Critical patent/CN218272077U/en
Application granted granted Critical
Publication of CN218272077U publication Critical patent/CN218272077U/en
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Images

Landscapes

  • Investigating Or Analyzing Materials By The Use Of Electric Means (AREA)

Abstract

The utility model discloses a device for measuring the narrow-face bending property of a high-temperature superconducting strip, which is characterized by comprising an insulating cover plate, a metal pressing plate, a metal terminal and an insulating bottom plate; the metal terminal is provided with a plurality of first through holes used for being connected with the insulating bottom plate; through holes matched with the first through holes are respectively formed in the two opposite ends of the insulating bottom plate; a row of first threaded holes are formed in the metal pressing plate; the insulating cover plate is arranged between the two opposite ends of the insulating bottom plate; the top of the insulating cover plate is of an arch structure protruding upwards; the arch structure is provided with a second threaded hole matched with the row of first threaded holes in position and used for fixing a high-temperature superconducting strip to be tested placed between the metal pressing plate and the insulating cover plate, so that the high-temperature superconducting strip to be tested is tightly attached to the upper surface of the arch structure along the bending direction of the arch structure; and the metal terminal is used for electrically connecting the high-temperature superconducting strip to be detected with the current lead. The method and the device can accurately test the current carrying capacity of the superconducting tape at different lateral bending radii.

Description

Device for measuring bending performance of narrow surface of high-temperature superconducting tape
Technical Field
The utility model relates to a narrow face bending performance of high temperature superconducting tape measures belongs to material physical properties measurement field, relates to a narrow face bending performance measuring device of high temperature superconducting tape for measure the narrow face bending (hereinafter collectively called: lateral bending) performance of high temperature superconducting tape.
Background
In the field of high-energy accelerators, the generation of magnetic field strength of 15T or even higher is a difficult problem which must be overcome by next-generation large scientific devices. The practical low-temperature superconducting materials such as niobium-titanium and niobium-tin can not meet the requirements of the application field with higher field intensity due to lower upper critical field. The high temperature superconducting material has the unique advantages of high critical temperature, high critical magnetic field, high current carrying capacity and the like, and has become a necessary choice for the development of high field superconducting magnets.
Nevertheless, the current carrying capacity of a single high temperature superconducting tape is limited, and the use of multiple tapes in parallel is inevitable. The common low-temperature superconducting material is easy to realize twisting and transposition due to the round wire structure, but the commercialized high-temperature superconducting material, such as REBCO, has the characteristics of large width-thickness ratio, low mechanical strength of a superconducting film and the like, so that transposition in the conventional cabling process becomes very difficult. When the side bend radius in the transposition process is smaller than the minimum side bend radius which can be borne by the high-temperature superconducting strip, the performance of the high-temperature superconducting strip is weakened, and even the superconducting property of the high-temperature superconducting strip is lost. Therefore, in order to solve this technical problem, it is necessary to study the lateral bending property of the high temperature superconducting tape.
SUMMERY OF THE UTILITY MODEL
To the practical application demand of high temperature superconducting tape, the utility model aims to design a high temperature superconducting tape narrow face bending property measuring device. The prepared high-temperature superconducting strip sample is assembled in the device, so that the current carrying capacity of the high-temperature superconducting strip at different lateral bending radii can be accurately tested, and the lateral bending characteristic curve of the high-temperature superconducting strip is obtained.
The technical scheme of the utility model is that:
a device for measuring the narrow-face bending performance of a high-temperature superconducting strip is characterized by comprising an insulating cover plate, a metal pressing plate, a metal terminal and an insulating bottom plate; wherein, the first and the second end of the pipe are connected with each other,
the metal terminal is provided with a plurality of first through holes used for being connected with the insulating bottom plate;
through holes matched with the first through holes are respectively formed in the two opposite ends of the insulating bottom plate and used for connecting and fixing the metal terminal;
a row of first threaded holes are formed in the metal pressing plate;
the insulating cover plate is arranged between the two opposite ends of the insulating bottom plate; the top of the insulating cover plate is of an arch structure protruding upwards; the arched structure is provided with a second threaded hole matched with the row of first threaded holes in position, and when the insulating cover plate is connected with the metal pressing plate through the screws, the first threaded hole and the second threaded hole, the high-temperature superconducting strip to be detected is fixedly placed between the metal pressing plate and the insulating cover plate, so that the high-temperature superconducting strip to be detected is tightly attached to the upper surface of the arched structure along the bending direction of the arched structure;
and the metal terminal is used for electrically connecting the high-temperature superconducting strip to be detected with the current lead.
Furthermore, the bending radius of the arch structure is correspondingly consistent with the testing side bending radius of the high-temperature superconducting strip to be tested.
Furthermore, a second threaded hole is formed in the top of the arch structure and is called a central through hole; a plurality of second threaded holes are symmetrically formed in the two sides of the central through hole along the bending direction of the arch structure.
Furthermore, the central line of the metal pressing plate is provided with the row of first threaded holes.
Furthermore, the high-temperature superconducting tapes are a plurality of high-temperature superconducting tapes wrapped by copper strips.
Furthermore, a second through hole for connecting a current lead is formed in the metal terminal; each metal terminal is connected with one end of the high-temperature superconducting strip to be detected, and the second through hole is connected with a current lead.
Furthermore, the insulating cover plate is a transparent organic glass cover plate; the metal pressing plate is a metal pressing plate with high heat conductivity; the metal terminal is a copper terminal; the insulating bottom plate is an epoxy resin bottom plate.
As shown in fig. 1, the apparatus includes: the device comprises a transparent organic glass cover plate 1 with an arch structure, a copper pressing plate 2, two copper terminals 3 and an epoxy resin bottom plate 4;
an arch structure with the height of 1mm is arranged in the middle of the transparent organic glass cover plate 1, and the radius of the arch structure is the lateral bending radius to be tested. Five through holes (shown in figure 2) are distributed on the transparent organic glass cover plate 1 along the arch structure, meanwhile, five threaded holes (shown in figure 3) are formed in the copper pressing plate 2, and the through holes in the transparent organic glass cover plate 1 correspond to the threaded holes in the copper pressing plate 2 one by one and are used for fixing the transparent organic glass cover plate 1 and the copper pressing plate 2 together.
Firstly, a test sample is fixed between a transparent organic glass cover plate 1 and a copper pressing plate 2 along an arch structure on the transparent organic glass cover plate 1, and then the fixed transparent organic glass cover plate 1 and the fixed copper pressing plate 2 are placed on an epoxy resin bottom plate 4. The copper terminal 3 has three through holes (as shown in fig. 4), two of which are symmetrical for fixing the copper terminal 3 to the epoxy base plate 4, and a single through hole is left for connecting a current lead.
Compared with the prior art, the utility model discloses an actively the effect does:
the utility model discloses after the device is installed, once cool off alright accurate, conveniently test the current-carrying capacity of high temperature superconducting tape when specific side bend radius in low temperature environment. The external force applied during the preparation of the sample can lead the high-temperature superconducting tape to generate specific deformation, thereby effectively avoiding the problem of inaccurate test result caused by the wavy high-temperature superconducting tape in the lateral bending process. Meanwhile, before the high-temperature superconducting tape is tested, the copper belt is used for wrapping the high-temperature superconducting tape, so that the high-temperature superconducting tape can be effectively prevented from being damaged due to external factors in the lateral bending process, and the external copper belt can play a shunting role when the high-temperature superconducting tape loses time.
Aiming at the device, the transparent organic glass cover plate 1 is adopted, so that the change of the sample in the lateral bending process can be conveniently observed, and the sample is ensured to be perfectly attached to the arched structure on the transparent organic glass cover plate 1; the copper pressing plate 2 is used for increasing the heat conductivity of the testing device and ensuring that the heat of the superconducting strip loses over time and is dissipated in time in the testing process; the fixed transparent organic glass cover plate 1 and the fixed copper pressing plate 2 are placed on the epoxy resin base plate 4 instead of being fixed on the epoxy resin base plate 4, so that the problem that the performance of the superconducting tape is stressed and damaged in the testing process due to large thermal contraction of the epoxy cover plate can be effectively solved.
Drawings
Fig. 1 is a schematic diagram of the assembled device of the present invention.
Fig. 2 is a schematic view of the transparent organic glass cover plate with an arch structure of the present invention.
Fig. 3 is a schematic view of the middle copper pressing plate of the present invention.
Fig. 4 is a schematic view of the copper terminal of the present invention.
Fig. 5 is a schematic view of the epoxy resin bottom plate of the present invention.
Fig. 6 is a schematic structural diagram of a sample after the copper tape (or aluminum tape) is wrapped in the present invention.
The plastic-metal composite plastic plate comprises a transparent organic glass cover plate 1, a copper pressing plate 2, a copper terminal 3 and an epoxy resin bottom plate 4.
Detailed Description
The present invention will be described in further detail with reference to fig. 1 to 6.
Before preparing a lateral bending sample, a plurality of high-temperature superconducting tapes are wrapped by copper tapes (or aluminum tapes) to form a test whole, and the structure of the test whole is shown in fig. 6. Because the high-temperature superconducting tapes are not very high in mechanical strength and large in width and thickness, a plurality of high-temperature superconducting tapes are wrapped into a whole, so that the mechanical strength of a test sample can be increased (the high-temperature superconducting tapes are prevented from being damaged in the lateral bending process), and the copper belts (or aluminum belts) wrapped outside can play a role in shunting and transferring heat in the test process, so that double-layer protection is formed on the high-temperature superconducting tapes.
The transparent plexiglas cover plate 1 and the copper press plate 2 are fixed together using screws which are not tightened. And (3) placing the test sample prepared in the previous step between the transparent organic glass cover plate 1 and the copper pressing plate 2, ensuring that the center of the sample is tangent to the highest point of the arch structure, adjusting the sample to ensure that the two ends are symmetrical, and tightening the middle screw to fix the sample. And applying equal force to the left and right symmetrical positions of the central point to ensure that the sample is attached to the arch structure on the transparent organic glass cover plate 1, sequentially fixing the screws on the left and right sides, and repeating the operation to ensure that the test sample is completely attached to the arch structure on the transparent organic glass cover plate 1. In the whole process, the high-temperature superconducting tape generates plastic deformation for fitting the arch structure, the plastic deformation of the tape is increased along with the reduction of the lateral bending radius, and when the plastic deformation exceeds the maximum deformation which can be borne by the superconducting tape, the current-carrying performance of the superconducting tape is attenuated.
The copper terminal 3 is fixed on the epoxy resin bottom plate 4 by using a screw, then the assembled transparent organic glass cover plate 1 and the assembled copper pressing plate 2 are placed on the epoxy resin bottom plate 4, the copper terminal 3 is heated by using an electric iron, and the high-temperature superconducting strip is welded on the copper terminal 3 by using soldering tin. Before welding, the high-temperature superconducting tapes at two ends of the sample need to be cut into a step shape with a short lower part and a long upper part, so that enough contact area is ensured between each superconducting tape and the copper terminal 3 during welding, and the current is ensured to be uniformly distributed in each superconducting tape as much as possible. Then, a voltage lead is welded on the high-temperature superconducting tape between the copper terminal 3 and the transparent organic glass cover plate for monitoring the voltage change of the sample in the whole testing process.
Fixing a current lead on a copper terminal 3, cooling a prepared sample to a superconducting state, electrifying the sample for measurement, recording the voltage of the sample in the whole electrifying process by using a data acquisition instrument, and fitting according to the obtained V-I curve to obtain the critical current of the high-temperature superconducting tape under different side bending radiuses. And (3) replacing the transparent organic glass cover plate, adopting an arch structure with different radiuses, repeating the operation, and sequentially testing the critical current of the sample at different lateral bending radiuses to obtain the lateral bending characteristic curve of the high-temperature superconducting tape.
The above description is only a conceptual diagram of an embodiment of the present invention, but the scope of the present invention is not limited thereto, and any modifications, equivalent substitutions, improvements and the like, which can be easily conceived by those skilled in the art within the technical scope of the present invention, within the spirit and principle of the present invention, are included in the scope of the present invention.

Claims (7)

1. A device for measuring the narrow-face bending performance of a high-temperature superconducting strip is characterized by comprising an insulating cover plate, a metal pressing plate, a metal terminal and an insulating bottom plate; wherein, the first and the second end of the pipe are connected with each other,
the metal terminal is provided with a plurality of first through holes used for being connected with the insulating bottom plate;
through holes matched with the first through holes are respectively formed in the two opposite ends of the insulating bottom plate and used for connecting and fixing the metal terminal;
a row of first threaded holes are formed in the metal pressing plate;
the insulating cover plate is arranged between the two opposite ends of the insulating bottom plate; the top of the insulating cover plate is of an arch structure protruding upwards; the arch structure is provided with a second threaded hole matched with the row of first threaded holes in position, and the high-temperature superconducting tape to be tested is fixedly placed between the metal pressing plate and the insulating cover plate when the insulating cover plate is connected with the metal pressing plate through the screw, the first threaded hole and the second threaded hole, so that the high-temperature superconducting tape to be tested is tightly attached to the upper surface of the arch structure along the bending direction of the arch structure;
and the metal terminal is used for electrically connecting the high-temperature superconducting strip to be detected with the current lead.
2. The apparatus as claimed in claim 1, wherein the curvature radius of the arch structure is corresponding to the test side curvature radius of the high temperature superconducting tape to be tested.
3. The narrow-face bending property measuring device of the high-temperature superconducting tape as claimed in claim 1 or 2, wherein a second threaded hole, namely a central through hole, is formed in the top of the arch structure; a plurality of second threaded holes are symmetrically formed in the two sides of the central through hole along the bending direction of the arch structure.
4. The narrow-face bending property measurement device of a high-temperature superconducting tape as claimed in claim 3, wherein the first threaded holes of the row are arranged on a center line of the metal pressure plate.
5. The device for measuring the narrow-side bending property of the high-temperature superconducting tape according to claim 1, wherein the high-temperature superconducting tape is a plurality of high-temperature superconducting tapes wrapped by copper tapes.
6. The apparatus of claim 1, wherein the metal terminal has a second through hole for connecting a current lead; each metal terminal is connected with one end of the high-temperature superconducting strip to be detected, and the second through hole is connected with a current lead.
7. The device for measuring the narrow-face bending property of the high-temperature superconducting tape as claimed in claim 1, wherein the insulating cover plate is a transparent organic glass cover plate; the metal pressing plate is a metal pressing plate with high heat conductivity; the metal terminal is a copper terminal; the insulating bottom plate is an epoxy resin bottom plate.
CN202221686217.9U 2022-07-01 2022-07-01 Device for measuring bending performance of narrow surface of high-temperature superconducting tape Active CN218272077U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN202221686217.9U CN218272077U (en) 2022-07-01 2022-07-01 Device for measuring bending performance of narrow surface of high-temperature superconducting tape

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN202221686217.9U CN218272077U (en) 2022-07-01 2022-07-01 Device for measuring bending performance of narrow surface of high-temperature superconducting tape

Publications (1)

Publication Number Publication Date
CN218272077U true CN218272077U (en) 2023-01-10

Family

ID=84760882

Family Applications (1)

Application Number Title Priority Date Filing Date
CN202221686217.9U Active CN218272077U (en) 2022-07-01 2022-07-01 Device for measuring bending performance of narrow surface of high-temperature superconducting tape

Country Status (1)

Country Link
CN (1) CN218272077U (en)

Similar Documents

Publication Publication Date Title
KR100805284B1 (en) Holder for measurement of bending strain effect on critical current in hts superconducting tapes and accelerated test apparatus adopting the holder
CN102735964B (en) High-temperature-superconductivity strip material multi-field characteristic measuring device
JP5911127B2 (en) Output measuring apparatus and measuring method for solar cell
WO2021093381A1 (en) Simulation device for poor contact of gis internal contact and infrared calibration method
Granieri et al. Heat transfer in an enhanced cable insulation scheme for the superconducting magnets of the LHC luminosity upgrade
JP2016188813A (en) Gripper for tension test of superconductive wire material and tension testing device
CN218272077U (en) Device for measuring bending performance of narrow surface of high-temperature superconducting tape
Chang et al. An experimental study on the joint methods between double pancake coils using YBCO coated conductors
CN113433001A (en) High-temperature superconducting tape bending characteristic test tool
CN203773017U (en) Apparatus for testing thermal resistance of TO-39 packaging power semiconductor device
CN203773016U (en) Apparatus for testing thermal resistance of SMD-0.5 packaging power semiconductor device
CN108982950B (en) Sensor for testing YBCO film superconducting loop voltage signal and manufacturing method thereof
Voran et al. Design and testing of terminals for REBCO coils of 32 T all superconducting magnet
CN217405274U (en) Dry capacitor for thermal stability test
CN111398370A (en) Dielectric test system and method for micro-nano-sized patterned film array
CN216387146U (en) Clamp for COS test
CN112729618B (en) High-temperature-resistant metal flat heat flowmeter and heat flux density measuring method
CN214310666U (en) Insulation material magnetization conductance current testing arrangement
CN220019848U (en) Superconducting tape critical current testing device
CN214585838U (en) Structure capable of realizing aging test of maximum rated power of MOSFET device
CN107131960B (en) low-temperature measuring device and method
CN112782215A (en) Novel thermal resistance test fixture for electronic element
CN219871542U (en) Wire conductor resistance measurement system
CN219759747U (en) Battery temperature adjusting device and performance testing equipment
CN218036951U (en) Pressing and holding type test tool

Legal Events

Date Code Title Description
GR01 Patent grant
GR01 Patent grant