CN218181014U

CN218181014U - Insulated voltage withstand test clamp for IGBT

Info

Publication number: CN218181014U
Application number: CN202221871556.4U
Authority: CN
Inventors: 郝文煊; 陆均尧; 张鹏
Original assignee: Shandong Sli Microelectronics Co ltd
Current assignee: Shandong Sli Microelectronics Co ltd
Priority date: 2022-07-20
Filing date: 2022-07-20
Publication date: 2022-12-30
Anticipated expiration: 2032-07-20

Abstract

The utility model provides a IGBT insulation and voltage resistance test anchor clamps, including testing machine base, the mounting groove has been seted up at the middle part at test machine base top, is provided with the copper billet on the mounting groove inner wall, and the both sides at test machine base top all are provided with a plurality of dead lever, the top of a plurality of dead lever all with mounting panel fixed connection, the top of mounting panel is equipped with the subassembly that compresses tightly, and the module under test is installed at the top of copper billet. The utility model discloses a button control cylinder cooperation movable rod drives the movable plate and removes, and the pressure of cooperation atmospheric pressure regulating valve adjust the cylinder output maintains output pressure in the elastic force within range of probe, and the first through-hole of movable plate cooperation is at dead lever surface slip to make probe and electrode contact, thereby detect detection module, stability when promoting the movable plate gliding through four dead levers that set up.

Description

Insulated voltage withstand test clamp for IGBT

Technical Field

The utility model belongs to the technical field of test fixture, concretely relates to IGBT voltage insulation test fixture.

Background

The IGBT is a device formed by matching an MOSFET and a bipolar transistor, and in the production process of the IGBT module, the insulation and voltage resistance test of the IGBT module is one of main test items.

The ceramic-coated copper block insulation and voltage resistance test fixture disclosed by the application number of CN202022740788.3 is an increasingly mature technology, and comprises a supporting seat, a pressing device and a power-on device, wherein the supporting seat comprises a bottom plate and a vertical plate, and a placing groove is formed in the middle of the bottom plate; a fixed block is embedded in the placing groove, a fixed groove is formed in the center of the fixed block, a spacer block is arranged in the fixed groove and used for separating the fixed groove into at least two fixed areas, and the fixed areas are used for placing ceramic copper-clad blocks; the vertical plate is vertically fixed on the bottom plate, and the downward pressing device comprises a pressing device and a guide rail; the pressing device is fixed on the vertical plate and is connected with the electrifying device; the guide rail is vertically and fixedly arranged on the bottom plate, the guide rail penetrates through the electrifying device, the electrifying device comprises a movable plate, a guide rail hole for penetrating through the guide rail is formed in the movable plate, an installation notch is further formed in the movable plate, a probe plate is embedded in the installation notch, a probe corresponding to the fixed area is embedded in the probe plate, and a probe sleeve connected with an ammeter is arranged at the top end of the probe; the upper surface of the moving plate is also fixed with a cover plate ", but the test fixture has the following defects:

this test fixture controls electrifying device's removal through setting up collet and guide rail when doing insulating withstand voltage test, and the stability of this structure is not enough, leads to the detection data error to appear easily, can't be with the accurate control of the power of exerting in the elastic force scope of probe.

SUMMERY OF THE UTILITY MODEL

An object of the utility model is to provide a withstand voltage test fixture of IGBT aims at solving among the prior art stability of current withstand voltage test fixture intermediate pressure structure not enough, leads to the detection data error to appear easily, can't be with the problem of the accurate control of the power of exerting at the elastic force within range of probe.

In order to achieve the above object, the utility model provides a following technical scheme: the IGBT insulation and voltage resistance test fixture comprises a test machine base, wherein a mounting groove is formed in the middle of the top of the test machine base, a copper block is arranged on the inner wall of the mounting groove, a plurality of fixing rods are arranged on two sides of the top of the test machine base, the tops of the fixing rods are fixedly connected with a mounting plate, a pressing assembly is arranged on the top of the mounting plate, and a module to be tested is mounted on the top of the copper block;

compress tightly the subassembly including installing the collet at the mounting panel top, the bottom of collet extends to the bottom of mounting panel, and with the top fixed connection of movable plate, first through-hole has all been seted up to four edges of movable plate, the inner wall and the dead lever sliding connection of first through-hole, one side at movable plate top is provided with anodal interface, the bottom fixed mounting of movable plate has a plurality of groups test probe and single test probe.

As a preferred technical scheme, one side of test machine base is provided with the negative pole interface, anodal interface and negative pole interface all with external electrode interface electric connection.

As a preferred technical scheme, threaded hole is seted up at the top of mounting groove inner wall, threaded connection has the screw on the inner wall of screw hole, the third through-hole has been seted up at the middle part at copper billet top, the inner wall and the screw thread connection of third through-hole.

As an optimal technical scheme, the top of being surveyed the module is equipped with a plurality of IGBT electrode, one side fixed mounting at being surveyed the module top has the IGBT stitch.

As an optimized technical scheme of the utility model, a plurality of groups the bottom of test probe all contacts mutually with the top of a plurality of IGBT electrode, the bottom of single test probe contacts mutually with the top of IGBT stitch.

As a preferred technical scheme, the middle part fixed mounting of mounting panel bottom has the cylinder, the inside of cylinder is equipped with the movable rod, the bottom of movable rod and the top fixed connection of movable plate, be provided with the air pressure regulating valve on the cylinder.

As an optimal technical scheme of the utility model, a corner department at test machine base top is provided with the button, the bottom and the internal control ware electric connection of button, electric connection between internal control ware and the cylinder.

Compared with the prior art, the beneficial effects of the utility model are that:

1) The moving plate is driven to move downwards by the arranged compactor, so that the output pressure is maintained within the elastic force range of the probe conveniently, the moving plate is matched with the plurality of first through holes on the moving plate to slide downwards on the surfaces of the plurality of fixed rods, the probe is contacted with the electrode, the detection module is detected, and the stability of the moving plate in sliding downwards is improved by the four fixed rods;

2) The movable plate is driven to move downwards by the aid of the button control cylinder which is arranged to be matched with the movable rod, the air pressure regulating valve which is arranged in a matched mode regulates the output pressure of the air cylinder, the movable plate is matched with a plurality of first through holes on the movable plate to slide downwards on the surfaces of a plurality of fixed rods, so that the probes are in contact with the electrodes, and detection modules are detected.

Drawings

Fig. 1 is a schematic structural diagram of embodiment 1 of the present invention;

fig. 2 is a schematic structural view of a testing machine base in embodiment 1 of the present invention;

fig. 3 is a schematic structural view of a pressing assembly in embodiment 1 of the present invention;

fig. 4 is a schematic structural diagram of embodiment 2 of the present invention.

In the figure: 1. testing a machine base; 11. mounting grooves; 111. a threaded hole; 112. a screw; 12. a copper block; 121. a third through hole; 13. a fixing rod; 14. mounting a plate; 15. a negative electrode interface; 16. a button; 2. a compression assembly; 21. a compactor; 22. moving the plate; 23. a first through hole; 24. a positive electrode interface; 25. testing the probe; 26. a single test probe; 3. a module to be tested; 31. an IGBT electrode; 32. IGBT pins; 4. a cylinder; 41. a movable rod.

Detailed Description

Embodiments of the present invention are further described below with reference to the accompanying drawings:

example 1

Referring to fig. 1-3, the present invention provides the following technical solutions: the IGBT insulation and voltage resistance test fixture comprises a test machine base 1, wherein a mounting groove 11 is formed in the middle of the top of the test machine base 1, a copper block 12 is arranged on the inner wall of the mounting groove 11, a plurality of fixing rods 13 are arranged on two sides of the top of the test machine base 1, the tops of the fixing rods 13 are fixedly connected with a mounting plate 14, a pressing assembly 2 is arranged on the top of the mounting plate 14, and a tested module 3 is arranged on the top of the copper block 12;

compress tightly subassembly 2 including installing the presser 21 at mounting panel 14 top, the bottom of presser 21 extends to the bottom of mounting panel 14, and with the top fixed connection of moving plate 22, first through-hole 23 has all been seted up to four edges of moving plate 22, the inner wall and the dead lever 13 sliding connection of first through-hole 23, and one side at moving plate 22 top is provided with anodal interface 24, and moving plate 22's bottom fixed mounting has a plurality of groups test probe 25 and single test probe 26.

When the device is used specifically, the moving plate 22 is driven by the presser 21 to move downwards, the moving plate 22 is matched with the first through holes 23 to slide on the surfaces of the fixing rods 13, the groups of test probes 25 and the IGBT electrodes 31 are mutually contacted, and the single test probe 26 and the IGBT pin 32 are mutually contacted, so that the tested module 3 is detected.

In this embodiment, a negative electrode interface 15 is disposed on one side of the testing machine base 1, and the positive electrode interface 24 and the negative electrode interface 15 are both electrically connected to the external electrode interface.

When the movable plate 22 is used specifically, the negative electrode interface 15 and the positive electrode interface 24 are respectively electrically connected to the external electrode interface, so that the structure on the movable plate 22 can be conveniently electrified, and the module 3 to be detected can be detected.

In this embodiment, a threaded hole 111 is formed at the top of the inner wall of the mounting groove 11, a screw 112 is connected to the inner wall of the threaded hole 111 in a threaded manner, a third through hole 121 is formed in the middle of the top of the copper block 12, and the inner wall of the third through hole 121 is connected to the screw 112 in a threaded manner.

When the copper block installation device is used specifically, the copper block 12 is installed and fixed inside the installation groove 11 by utilizing the threaded hole 111 and the third through hole 121 to match with the screw 112.

In this embodiment, the top of the module under test 3 is provided with a plurality of IGBT electrodes 31, and one side of the top of the module under test 3 is fixedly provided with IGBT pins 32.

In the present embodiment, the bottoms of several groups of test probes 25 are all in contact with the tops of several IGBT electrodes 31, and the bottom of a single test probe 26 is in contact with the top of an IGBT pin 32.

When the device is used specifically, the plurality of IGBT electrodes 31 are respectively in contact connection with the plurality of groups of test probes 25, and the IGBT pins 32 are in contact connection with the single test probe 26, so that the module 3 to be tested is detected.

The working principle is as follows: when the device is used, the device is connected with an external electrode interface, firstly, a module 3 to be tested is placed at the top of a copper block 12 in a mounting groove 11, then a pressing device 21 drives a moving plate 22 to move downwards, the moving plate 22 is matched with a plurality of first through holes 23 to slide downwards on the surfaces of a plurality of fixing rods 13, a plurality of groups of test probes 25 and IGBT electrodes 31 are mutually contacted, a single test probe 26 and an IGBT pin 32 are mutually contacted, and therefore the module 3 to be tested is detected.

Example 2

Referring to fig. 4, in order to avoid damage to the product caused by the applied force, the present embodiment is characterized by the following features: in this embodiment, an air cylinder 4 is fixedly installed in the middle of the bottom of the installation plate 14, a movable rod 41 is installed inside the air cylinder 4, the bottom of the movable rod 41 is fixedly connected with the top of the movable plate 22, an air pressure adjusting valve is installed on the air cylinder 4, a button 16 is installed at one corner of the top of the tester base 1, the bottom of the button 16 is electrically connected with an internal controller, and the internal controller is electrically connected with the air cylinder 4.

When the probe is used specifically, the button 16 is opened, the pressure output by the air cylinder 4 is adjusted by the air pressure adjusting valve and is maintained within the elastic force range of the probe, the air cylinder 4 drives the movable rod 41 to move downwards, and the movable rod 41 drives the movable plate 22 to move downwards, so that the uncertainty of manual force application of an operator is reduced.

Claims

IGBT insulation and voltage resistance test fixture, including test machine base (1), its characterized in that: the middle of the top of the testing machine base (1) is provided with a mounting groove (11), the inner wall of the mounting groove (11) is provided with a copper block (12), two sides of the top of the testing machine base (1) are respectively provided with a plurality of fixing rods (13), the tops of the fixing rods (13) are respectively fixedly connected with a mounting plate (14), the top of the mounting plate (14) is provided with a pressing assembly (2), and the top of the copper block (12) is provided with a tested module (3);

compress tightly subassembly (2) including installing compressor (21) at mounting panel (14) top, the bottom of compressor (21) extends to the bottom of mounting panel (14), and with the top fixed connection of moving plate (22), first through-hole (23) have all been seted up to four edges of moving plate (22), the inner wall and dead lever (13) sliding connection of first through-hole (23), one side at moving plate (22) top is provided with anodal interface (24), the bottom fixed mounting of moving plate (22) has a plurality of groups test probe (25) and single test probe (26).
2. The IGBT withstand voltage test jig according to claim 1, characterized in that: one side of the testing machine base (1) is provided with a negative electrode interface (15), and the positive electrode interface (24) and the negative electrode interface (15) are electrically connected with an external electrode interface.
3. The IGBT withstand voltage test jig according to claim 1, characterized in that: the top of the inner wall of the mounting groove (11) is provided with a threaded hole (111), the inner wall of the threaded hole (111) is connected with a screw (112) in a threaded mode, the middle of the top of the copper block (12) is provided with a third through hole (121), and the inner wall of the third through hole (121) is connected with the screw (112) in a threaded mode.
4. The IGBT withstand voltage test jig according to claim 1, characterized in that: the top of the module to be tested (3) is provided with a plurality of IGBT electrodes (31), and one side of the top of the module to be tested (3) is fixedly provided with IGBT pins (32).
5. The IGBT withstand voltage test jig according to claim 1, characterized in that: the bottoms of a plurality of groups of the test probes (25) are mutually contacted with the tops of a plurality of IGBT electrodes (31), and the bottom of the single test probe (26) is mutually contacted with the top of an IGBT pin (32).
6. The IGBT withstand voltage test jig according to claim 1, characterized in that: the middle part fixed mounting of mounting panel (14) bottom has cylinder (4), the inside of cylinder (4) is equipped with movable rod (41), the top fixed connection of the bottom of movable rod (41) and movable plate (22), be provided with the air pressure regulating valve on cylinder (4).
7. The IGBT withstand voltage test jig according to claim 1, characterized in that: a corner at the top of the testing machine base (1) is provided with a button (16), the bottom of the button (16) is electrically connected with an internal controller, and the internal controller is electrically connected with the cylinder (4).