CN220603517U - Module dynamic test fixture - Google Patents

Module dynamic test fixture Download PDF

Info

Publication number
CN220603517U
CN220603517U CN202321831329.3U CN202321831329U CN220603517U CN 220603517 U CN220603517 U CN 220603517U CN 202321831329 U CN202321831329 U CN 202321831329U CN 220603517 U CN220603517 U CN 220603517U
Authority
CN
China
Prior art keywords
module
tested
main body
pcb
dynamic test
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
CN202321831329.3U
Other languages
Chinese (zh)
Inventor
丁志龙
周志强
王伟群
董冰萧
黄广龙
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Shenzhen Yuanlichuang Technology Co ltd
Original Assignee
Shenzhen Yuanlichuang Technology Co ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Shenzhen Yuanlichuang Technology Co ltd filed Critical Shenzhen Yuanlichuang Technology Co ltd
Priority to CN202321831329.3U priority Critical patent/CN220603517U/en
Application granted granted Critical
Publication of CN220603517U publication Critical patent/CN220603517U/en
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Landscapes

  • Measuring Leads Or Probes (AREA)

Abstract

本实用新型公开了一种模块动态测试夹具,包括治具主体、PCB板以及被测模块;所述治具主体中央通过手动夹具,模块固定放置槽,模块接触探针,所述PCB板设置于治具主体底部,且PCB板上方设置有接触针,且接触针穿过治具主体并与被测模块的被测通道对应;本实用新型将模块放置夹具内在没有手动压下去之前,可以避免模块与探针出现对应不上有偏移、接触不良现象,提高对模块的利用性与寿命。

The utility model discloses a module dynamic test fixture, which includes a fixture body, a PCB board and a module to be tested; a manual fixture is passed through the center of the fixture body, a module is fixed in a slot, and the module contacts a probe; the PCB board is arranged on There is a contact pin at the bottom of the jig body and above the PCB board, and the contact pin passes through the jig body and corresponds to the measured channel of the module under test; the utility model can avoid placing the module in the fixture without manually pressing it down. There may be misalignment or poor contact with the probe, thereby improving the module's utilization and lifespan.

Description

Module dynamic test fixture
Technical Field
The utility model relates to a test fixture, in particular to a module dynamic test fixture.
Background
For IGBT test, the dynamic test fixture used in the market at present is aimed at chips, and the module type IGBT channel is diversified, so that the time spent in the test process is long, and the working efficiency is greatly reduced.
Disclosure of Invention
The utility model aims to solve the technical problem of providing the module dynamic test fixture, which extends the directivity of dynamic test, so that the output data is more visual, thereby being easier to find out problem points and more convenient to debug.
The module dynamic test fixture is realized by the following technical scheme: the device comprises a jig main body, a PCB and a tested module;
the center of the jig main body is provided with an installation seat in a floating way through a spring structure, and the tested module is arranged on the installation seat; the PCB is arranged at the bottom of the jig main body, contact pins are arranged above the PCB, pass through the jig main body and correspond to the tested channels of the tested modules; the jig main body is provided with a clamping structure, and the tested module is fixed on the mounting seat through the clamping structure.
As the preferable technical scheme, press from both sides tight structure including setting up in manual device and the anchor clamps at mount pad both ends, anchor clamps are located the mount pad top, and manual device's tight end of clamp contacts with the anchor clamps top, promotes anchor clamps downwardly moving through pressing manual device, and then drives spring structure and makes contact pin on the PCB board contact with the measured passageway of module.
As the preferable technical scheme, the PCB board consists of six driving power supplies and a jig board.
The beneficial effects of the utility model are as follows: the utility model separates high voltage from low voltage, thereby avoiding the mutual interference of the two voltages and avoiding damaging the service life of the components in the test process.
Drawings
In order to more clearly illustrate the embodiments of the utility model or the technical solutions in the prior art, the drawings that are required in the embodiments or the description of the prior art will be briefly described, it being obvious that the drawings in the following description are only some embodiments of the utility model, and that other drawings may be obtained according to these drawings without inventive effort for a person skilled in the art.
FIG. 1 is a schematic structural view of the present utility model;
FIG. 2 is a schematic top view of the present utility model;
FIG. 3 is a schematic view of the bottom structure of the present utility model;
FIG. 4 is a schematic view of the structure of the contact pin of the present utility model;
FIG. 5 is a schematic diagram of a structure of a tested channel according to the present utility model.
Detailed Description
All of the features disclosed in this specification, or all of the steps in a method or process disclosed, may be combined in any combination, except for mutually exclusive features and/or steps.
As shown in fig. 1 to 5, the module dynamic test fixture of the present utility model comprises a fixture main body 1, a PCB board 2 and a tested module 3;
the center of the jig main body 1 is provided with an installation seat 4 in a floating manner through a spring structure, and a tested module 3 is arranged on the installation seat 4; the PCB 2 is arranged at the bottom of the jig main body 1, the contact pins 5 are arranged above the PCB 2, and the contact pins 5 penetrate through the jig main body 1 and correspond to the tested channels 6 of the tested module 3; the jig main body 1 is provided with a clamping structure, and the tested module is fixed on the mounting seat 4 through the clamping structure.
In this embodiment, the clamping structure includes a manual device 8 and a clamp 9 disposed at two ends of the mounting seat 4, the clamp 9 is disposed above the mounting seat 4, and the clamping end of the manual device 8 contacts with the upper portion of the clamp 9, and the clamp 9 is pushed to move downward by pressing the manual device 8, so as to drive the spring structure to make the contact pins 5 on the PCB board 2 contact with the tested channels 6 of the tested module 3, so that each contact pin can contact with the tested channels, and there are no phenomena such as deformation and missing test.
In addition, the PCB board 2 is composed of six driving power sources and a jig board.
The working principle is as follows:
the jig main body is used for placing the tested module, the tested pins of the module are not contacted with the tested probe at the moment, the phenomenon that the probes are not offset and poor in contact with the pins of the tested module is avoided, the manual fixture is covered and manually fixed, the module is pressed at the moment, the tested pins are connected with the contact points, the module can be perfectly attached to the contact surfaces of the probes at the moment, the phenomenon that the pipe teaching is inclined, disordered and misplaced is avoided, and the tested module is communicated with the lowered tested circuit in the mode to conduct module testing.
The foregoing is merely illustrative of specific embodiments of the present utility model, and the scope of the utility model is not limited thereto, but any changes or substitutions that do not undergo the inventive effort should be construed as falling within the scope of the present utility model. Therefore, the protection scope of the present utility model should be subject to the protection scope defined by the claims.

Claims (3)

1. A module dynamic test fixture is characterized in that: comprises a jig main body (1), a PCB (2) and a tested module (3);
the center of the jig main body (1) is provided with an installation seat (4) in a floating mode through a spring structure, and a tested module (3) is arranged on the installation seat (4); the PCB (2) is arranged at the bottom of the jig main body (1), a contact pin (5) is arranged above the PCB (2), and the contact pin (5) passes through the jig main body (1) and corresponds to a tested channel (6) of the tested module (3); the jig is characterized in that a clamping structure is arranged on the jig main body (1), and the tested module is fixed on the mounting seat (4) through the clamping structure.
2. The modular dynamic test fixture of claim 1, wherein: the clamping structure comprises a manual device (8) and a clamp (9) which are arranged at two ends of the mounting seat (4), the clamp (9) is located above the mounting seat (4), the clamping end of the manual device (8) is contacted with the upper side of the clamp (9), the clamp (9) is pushed to move downwards by pressing the manual device (8), and then the spring structure is driven to enable a contact pin (5) on the PCB (2) to be contacted with a tested channel (6) of the tested module (3).
3. The modular dynamic test fixture of claim 1, wherein: the PCB (2) consists of six driving power supplies and a jig plate.
CN202321831329.3U 2023-07-12 2023-07-12 Module dynamic test fixture Active CN220603517U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN202321831329.3U CN220603517U (en) 2023-07-12 2023-07-12 Module dynamic test fixture

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN202321831329.3U CN220603517U (en) 2023-07-12 2023-07-12 Module dynamic test fixture

Publications (1)

Publication Number Publication Date
CN220603517U true CN220603517U (en) 2024-03-15

Family

ID=90176635

Family Applications (1)

Application Number Title Priority Date Filing Date
CN202321831329.3U Active CN220603517U (en) 2023-07-12 2023-07-12 Module dynamic test fixture

Country Status (1)

Country Link
CN (1) CN220603517U (en)

Similar Documents

Publication Publication Date Title
CN113253100B (en) A testing device and a detection system
CN210514381U (en) Circuit board programming test fixture
CN201867426U (en) Electrical testing device
CN101231964A (en) Semiconductor element voltage stabilization test method and voltage stabilization test fixture
CN220207672U (en) Mold clamping and pressing components for chip testing
CN219320425U (en) Power semiconductor module test equipment
CN113049933A (en) Semiconductor laser aging clamp and aging method thereof
CN220509077U (en) Withstand voltage detection device
CN218036996U (en) Kelvin test seat for large-current chip
CN218974413U (en) Test fixture for microstrip ring isolator
CN114895199B (en) A testing device and a testing method for battery core processing
CN106291190B (en) ZIF connector lower needle test structure
CN201327520Y (en) Test tool for connector
CN219657808U (en) Test machine conversion jig
CN212568867U (en) A spacing fixing device for PCB board detects
CN206270455U (en) A kind of power semiconductor modular measurement jig
CN103246151B (en) Camera module proving installation
CN223320452U (en) Electrical inspection fixture
CN221765538U (en) A hidden needle block fixture for PCB inspection
CN223597705U (en) A test socket for a 4644-point load power supply module
CN219266360U (en) Clamp for rapidly measuring voltage and internal resistance of battery
CN223051456U (en) Full-automatic chip test seat
CN222050370U (en) Reverse-buckling module pressure-resistant detection equipment
CN201945669U (en) Circuit board testing device
CN214097705U (en) A press-fit semiconductor chip test platform

Legal Events

Date Code Title Description
GR01 Patent grant
GR01 Patent grant