CN218158213U - Aging cabinet test fixture - Google Patents
Aging cabinet test fixture Download PDFInfo
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- CN218158213U CN218158213U CN202221337766.5U CN202221337766U CN218158213U CN 218158213 U CN218158213 U CN 218158213U CN 202221337766 U CN202221337766 U CN 202221337766U CN 218158213 U CN218158213 U CN 218158213U
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Abstract
The utility model discloses an ageing rack test fixture, include: the testing cabinet is detachably connected with the machine cabinet, a plurality of through holes are formed in the contact surface of the testing cabinet and the machine cabinet, a base is arranged in the testing cabinet, a PCB is arranged on the base, and a DC signal connecting device is arranged on the PCB of the base; a testing frame is arranged on the base, a circuit board and an air cylinder are arranged on the testing frame, a needle plate is arranged on the circuit board, a testing probe is arranged on the needle plate, and the testing probe is connected with the cabinet through a through hole; the needle plate is fixedly connected with the air cylinder, the air cylinder controls the needle plate to move relative to the cabinet, and the DC signal connecting device is connected with the needle plate.
Description
Technical Field
The utility model relates to an electronic test field especially relates to an ageing rack test fixture.
Background
Cabinets (cabinets) are generally cold rolled steel or alloy articles used to store computers and associated control equipment, and provide protection for the equipment, shielding electromagnetic interference, orderly and orderly arrangement of equipment, and facilitating later maintenance of the equipment. Cabinets are commonly used between network wiring, floor wiring, central offices, data offices, control centers, and the like. The cabinets are generally classified into a server cabinet, a network cabinet, a console cabinet, and the like. The cabinet can be divided into two basic structures of section bars and thin plates according to different bearing, materials and manufacturing processes of components.
The cabinet can involve ageing problem in the use, in order to improve the ageing problem that detects the cabinet, need carry out aging testing to the cabinet. In the prior art, when an aging test is carried out on an electronic product, a single electric connection test is carried out on the electronic product, but the single product test mode has low efficiency; on the other hand, during aging testing of electronic products, aging testing of multiple items such as illumination aging and damp-heat aging is often required, so that interfaces of the electronic products need to be electrically connected with different testing devices, and when the testing items are changed, the interfaces of the electronic products need to be plugged and pulled for many times, so that the abrasion of the interfaces is large, and the service life of the electronic products is influenced.
Disclosure of Invention
The utility model overcomes prior art's is not enough, provides an ageing rack test fixture.
In order to achieve the above purpose, the utility model adopts the technical scheme that: an aging cabinet test fixture comprises: a cabinet and a test cabinet arranged in the cabinet, which is characterized in that,
the test cabinet is detachably connected with the cabinet, a plurality of through holes are formed in the contact surface of the test cabinet and the cabinet, a base is arranged in the test cabinet, a PCB connecting wire is arranged on the base, and a DC signal connecting device is arranged on the base;
the testing device comprises a base, a needle plate, a testing frame, a testing probe and a testing device, wherein the base is provided with the testing frame, the testing frame is provided with a circuit board and an air cylinder, the circuit board is provided with the needle plate, and the needle plate is provided with the testing probe which is connected with the cabinet through a through hole;
the needle plate is fixedly connected with the air cylinder, the air cylinder controls the needle plate to move relative to the cabinet, and the DC signal connecting device is connected with the needle plate.
In a preferred embodiment of the present invention, a protection plate is further disposed in the test cabinet, and the protection plate is disposed on the outer surface of the test cabinet.
In a preferred embodiment of the present invention, the testing frame is further provided with a guide pillar, the needle plate is movably connected with the guide pillar, and the needle plate can move up and down along the guide pillar.
In a preferred embodiment of the present invention, the base is further provided with a switch button.
In a preferred embodiment of the present invention, a tray device is further disposed on the base, and the test probe sites are disposed on the tray device.
The utility model discloses a preferred embodiment, be provided with first loading board and second loading board in the test cabinet, be equipped with the test space in the rack, first loading board sets up in the test space, first loading board with the second loading board is connected.
In a preferred embodiment of the present invention, the inner surface of the cabinet is provided with a first fixing seat, the first fixing seat is provided with a hinge, the inner surface of the base is provided with a second fixing seat, the second fixing seat is provided with a through hole, and the hinge is disposed through the through hole.
In a preferred embodiment of the present invention, the positioning groove of the PCB is made of rubber.
The utility model provides a defect that exists among the background art, the utility model discloses possess following beneficial effect:
(1) The utility model discloses simple structure is provided with the PCB board constant head tank in the test cabinet, can directly place a plurality of PCB boards simultaneously in the constant head tank, then connects a plurality of supply sockets, can carry out the aging testing of a plurality of PCB boards simultaneously, and its commonality is strong, and efficiency of software testing is high.
(2) The testing cabinet is arranged in the placement cabinet, the testing probe is connected with the machine through the through hole, the connecting end is electrically connected with the DC signal interface and is electrically connected with the DC signal connecting device through the base PCB, so that the DC connecting end of the electrons in the cabinet is electrically connected with the DC signal connecting device, and the testing of the electronic product can be completed only by electrically connecting the DC signal connecting device and the AC signal connecting device with the testing equipment in sequence. The aging test device is simple in structure and simple and quick in whole operation, and greatly improves the aging test efficiency of electronic products, thereby improving the production efficiency.
Drawings
The present invention will be further explained with reference to the drawings and examples;
FIG. 1 is a perspective view of a test cabinet according to a preferred embodiment of the present invention;
fig. 2 is an internal structure diagram of the test cabinet according to the preferred embodiment of the present invention.
In the figure: 1. a test cabinet; 11. a through hole; 2. a base; 3. a needle plate; 31. and (6) testing the probe.
Detailed Description
The invention will now be described in further detail with reference to the accompanying drawings, which are simplified schematic drawings and illustrate, by way of illustration only, the basic structure of the invention, and which therefore show only the constituents relevant to the invention.
As shown in fig. 1-2, a test fixture for a burn-in apparatus includes: the testing device comprises a machine cabinet and a testing cabinet 1 arranged in the machine cabinet, wherein the testing cabinet 1 is detachably connected with the machine cabinet, a plurality of through holes are formed in the contact surface of the testing cabinet 1 and the machine cabinet, a base 2 is arranged in the testing cabinet 1, a PCB connecting wire is arranged on the base 2, and a DC signal connecting device is arranged on the base 2; a testing frame is arranged on the base 2, a circuit board and an air cylinder are arranged on the testing frame, a needle plate 3 is arranged on the circuit board, a testing probe 31 is arranged on the needle plate 3, and the testing probe 31 is connected with the cabinet through a through hole 11; the needle plate 3 is fixedly connected with the air cylinder, the air cylinder controls the needle plate 3 and the cabinet to move relatively, and the DC signal connecting device is connected with the needle plate 3.
The testing cabinet 1 is installed in a placing cabinet, the testing probe 31 is connected with a machine through the through hole 11, the connecting end is electrically connected with the DC signal interface and is electrically connected with the DC signal connecting device through the base 2PCB, so that the DC connecting end of the electrons in the cabinet is electrically connected with the DC signal connecting device, and the testing of electronic products can be completed only by electrically connecting the DC signal connecting device and the AC signal connecting device with testing equipment in sequence. The aging test device is simple in structure and simple and quick in whole operation, and greatly improves the aging test efficiency of electronic products, thereby improving the production efficiency.
In a preferred embodiment of the present invention, a protection plate is further disposed inside the test cabinet 1, and the protection plate is disposed on the outer surface of the test cabinet 1.
In a preferred embodiment of the present invention, the test frame is further provided with guide pillars, the needle plate 3 is movably connected to the guide pillars, and the needle plate 3 can move up and down along the guide pillars.
In a preferred embodiment of the present invention, the base 2 is further provided with a switch button.
In a preferred embodiment of the present invention, a tray device is further disposed on the base 2, and the test probes 31 are disposed on the tray device.
The utility model discloses a preferred embodiment, be provided with first loading board and second loading board in the test cabinet 1, be equipped with the test space in the rack, first loading board sets up in the test space, first loading board with the second loading board is connected.
In a preferred embodiment of the present invention, the inner surface of the cabinet is provided with a first fixing seat, the first fixing seat is provided with a hinge, the inner surface of the base 2 is provided with a second fixing seat, the second fixing seat has a through hole, and the hinge is disposed through the through hole.
In a preferred embodiment of the present invention, the positioning groove of the PCB is made of rubber.
The utility model discloses simple structure is provided with the PCB board constant head tank in the test cabinet 1, can directly place a plurality of PCB boards simultaneously in the constant head tank, then connects a plurality of supply sockets, can carry out the aging testing of a plurality of PCB boards simultaneously, and its commonality is strong, and efficiency of software testing is high.
When the aging test cabinet is used, the test cabinet 1 is arranged in the cabinet, the power line enters the interior of the test cabinet 1 from the through hole 11 and is connected with all power sockets in parallel, the test probe 31 with the through hole 11 is inserted into the cabinet, the power sockets and the interfaces on the PCB are connected through the power adapter, and the aging test is started. After the test is finished, the indicator light on the PCB is turned on, which indicates that the quality of the cabinet is not problematic, and if the indicator light is turned off, the quality of the cabinet is problematic.
In light of the foregoing, it will be apparent to those skilled in the art from this disclosure that various changes and modifications can be made without departing from the spirit and scope of the invention. The technical scope of the present invention is not limited to the content of the description, and must be determined according to the scope of the claims.
Claims (8)
1. An aging cabinet test fixture comprises: a cabinet and a test cabinet arranged in the cabinet, which is characterized in that,
the test cabinet is detachably connected with the cabinet, a plurality of through holes are formed in the contact surface of the test cabinet and the cabinet, a base is arranged in the test cabinet, a PCB connecting wire is arranged on the base, and a DC signal connecting device is arranged on the base;
the testing device comprises a base, a testing frame, a circuit board, a cylinder, a needle plate, a testing probe and a testing probe, wherein the testing frame is arranged on the base, the circuit board and the cylinder are arranged on the testing frame, the needle plate is provided with the testing probe, and the testing probe is connected with the cabinet through a through hole;
the needle plate is fixedly connected with the air cylinder, the air cylinder controls the needle plate to move relative to the cabinet, and the DC signal connecting device is connected with the needle plate.
2. The aging rack test fixture of claim 1, wherein: still be provided with the guard plate in the test cabinet, the guard plate sets up the test cabinet surface.
3. The aging cabinet testing jig of claim 1, wherein: the test jig is characterized in that a guide post is further arranged in the test jig, the needle plate is movably connected with the guide post, and the needle plate can move up and down along the guide post.
4. The aging cabinet testing jig of claim 1, wherein: and the base is also provided with a switch button.
5. The aging rack test fixture of claim 1, wherein: the base is further provided with a tray device, and the test probe point positions are arranged on the tray device.
6. The aging rack test fixture of claim 1, wherein: the test cabinet is internally provided with a first bearing plate and a second bearing plate, a test space is arranged in the test cabinet, the first bearing plate is arranged in the test space, and the first bearing plate is connected with the second bearing plate.
7. The aging rack test fixture of claim 1, wherein: the cabinet internal surface is provided with first fixing base, first fixing base is provided with the hinge, the internal surface of base is provided with the second fixing base, the perforation has been seted up to the second fixing base, the hinge is worn to locate the perforation.
8. The aging rack test fixture of claim 1, wherein: the PCB positioning groove is made of rubber.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202221337766.5U CN218158213U (en) | 2022-05-31 | 2022-05-31 | Aging cabinet test fixture |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202221337766.5U CN218158213U (en) | 2022-05-31 | 2022-05-31 | Aging cabinet test fixture |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN218158213U true CN218158213U (en) | 2022-12-27 |
Family
ID=84575280
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202221337766.5U Active CN218158213U (en) | 2022-05-31 | 2022-05-31 | Aging cabinet test fixture |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN218158213U (en) |
-
2022
- 2022-05-31 CN CN202221337766.5U patent/CN218158213U/en active Active
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