CN212904991U - High-frequency transformer's test fixture - Google Patents
High-frequency transformer's test fixture Download PDFInfo
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- CN212904991U CN212904991U CN202020960374.9U CN202020960374U CN212904991U CN 212904991 U CN212904991 U CN 212904991U CN 202020960374 U CN202020960374 U CN 202020960374U CN 212904991 U CN212904991 U CN 212904991U
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Abstract
The application discloses a high-frequency transformer test fixture, which comprises a test bracket; the electric cylinder is fixed on the upper part of the test bracket; a test probe secured to the connecting device; the connecting device comprises an upper limiting column, a lower limiting column and a graduated scale, the upper limiting column and the graduated scale are fixed on the connecting device, the lower limiting column is detachably mounted on the test support, the connecting device is mechanically connected to the electric cylinder, the connecting device drives the test probe to slide up and down along the test support through the electric cylinder, and the descending distance of the test probe is marked through the descending distance measured by the upper limiting column on the graduated scale; the feeding table is fixed on the test support and located below the test probes (300). By the high-frequency transformer test fixture, high-frequency transformers with different pin lengths can be tested, the measurement precision is high, and the requirement of mass production can be met.
Description
Technical Field
The application relates to the technical field of test fixtures, in particular to a test fixture of a high-frequency transformer.
Background
The high-frequency transformer is a power transformer with the working frequency exceeding the intermediate frequency (10kHz), is mainly used as a high-frequency switching power transformer in a high-frequency switching power supply, and is also used as a high-frequency inverter power transformer in a high-frequency inverter power supply and a high-frequency inverter welding machine. Generally, the high-frequency transformer is packaged in a box body, and the box body is provided with a wiring pin. The packaged transformer needs to be tested, the conventional test jig is provided with a through hole for inserting a pin on a jig plate, a test probe is arranged in the through hole, the test probe is externally connected with test equipment, and after the pin is contacted with the test probe, whether relevant parameters of the transformer are qualified or not is tested.
However, the length of the existing test probe is relatively fixed, and the pin lengths of different transformers are different. If the test probe is too long, the length of the transformer pin extending into the through hole is reduced, so that the transformer is unstable in fixation, the test result is influenced, and if the test probe is too short, the transformer pin possibly cannot be in contact with the test probe, so that the test cannot be carried out. In a general detection method, measurement is performed manually through a quantitative thickness detection instrument, the precision, stability and detection efficiency of manual measurement are low, defective products are not detected easily, customer complaints are caused, and the requirement of mass production is difficult to meet.
SUMMERY OF THE UTILITY MODEL
The utility model aims to solve one of the technical problem that exists among the prior art at least, provide a high frequency transformer's test fixture, can test the high frequency transformer of different pin length, measurement accuracy is high, can satisfy mass production's requirement.
According to the utility model discloses the embodiment that the first aspect provided provides a high frequency transformer, include:
testing the bracket;
the electric cylinder is fixed on the upper part of the test bracket;
a test probe secured to the connecting device;
the connecting device comprises an upper limiting column, a lower limiting column and a graduated scale, the upper limiting column and the graduated scale are fixed on the connecting device, the lower limiting column is detachably mounted on the test support, the connecting device is mechanically connected to the electric cylinder, and the connecting device drives the test probe to slide up and down along the test support through the electric cylinder;
and the feeding table is fixed on the test support and positioned below the test probe.
The test fixture for the high-frequency transformer has the following beneficial effects at least: the electric cylinder drives the test probe to move up and down along the test support through the connecting device, when the test probe moves down, the test probe is in contact with pins of a high-frequency transformer so as to test the electrical performance of the high-frequency transformer, the electric cylinder is externally connected with a control device, the distance of the test probe moving down can be accurately set through the control device which presets the lifting parameters of the electric cylinder, further, the high-frequency transformers with pins of different lengths can be tested, the measurement precision is improved, in addition, a certain distance is reserved for the upper limit column and the lower limit column according to the test requirement, the lower limit column is replaced and installed according to the length requirement of the test pin, the distance reserved between the upper limit column and the lower limit column is marked through a graduated scale, the bottom of the upper limit column corresponds to the initial position of the graduated scale, the bottom of the lower limit column corresponds to the end position of the graduated scale, when the test probe moves downwards, the upper limiting column fixed on the connecting device moves downwards at the same time, the downward movement distance of the test probe can be accurately measured and monitored through the position of the scale corresponding to the descending of the upper limiting column, and meanwhile, the reserved distance between the upper limiting column and the lower limiting column is a safe distance, so that the damage to the test probe or a pin of the high-frequency transformer caused by the unexpected conditions of too much descending distance and the like due to the reasons of setting errors and the like can be avoided.
According to some embodiments of the application, the test support includes first connecting plate, second connecting plate, third connecting plate and pillar, the electric cylinder is fixed in on the first connecting plate, be provided with on the second connecting plate and pass through the through-hole of test probe, the material loading platform is fixed on the third connecting plate. The electric cylinder is fixed on the first connecting plate and is externally connected with a control device, the control device is preset with descending height parameters according to the length of the pin of the high-frequency transformer to be tested, the electric cylinder drives the connecting device to move up and down under the driving of the control device, so as to drive the test probe fixed on the connecting device to move up and down, the test probe is in contact with the pin of the high-frequency transformer through the through hole on the second connecting plate in the downward moving process, and the through hole fixes the test probe and the pin of the transformer, so that the contact is better, and the test accuracy is higher.
According to some embodiments of this application, still include the conveyer belt, the conveyer belt lay in material loading bench, the conveyer belt be located the action wheel and from between the driving wheel and with the action wheel with from the driving wheel contact, the action wheel is parallel relation setting from top to bottom with following the driving wheel, be provided with material loading constant head tank on the conveyer belt, material loading constant head tank is used for fixed measured object material. The high-frequency transformer loading device is characterized in that the driving wheel and the driven wheel are fixed together through a support, the driving wheel is connected with a driving motor, under the driving of the driving motor, the driving wheel, the driven wheel and a conveyor belt located between the driving wheel and the driven wheel start directional conveying movement, the loading table is fixed on the third connecting plate and located below the test probes and used for supporting the conveyor belt, one face, provided with pins, of the high-frequency transformer is upwards placed in the loading positioning groove, the high-frequency transformer is continuously conveyed along with the conveyor belt after the test probes are tested, the pins are upwards fixed, accurate and rapid measurement of the test probes is facilitated, and the test efficiency is improved.
According to some embodiments of the application, the electric cylinder with connecting device passes through threaded connection, the connecting device below is fixed with the test probe, connecting device accessible screw thread with the connection is dismantled to the electric cylinder, when testing the high frequency transformer of different pin quantity, can dismantle the other connecting device who changes the test probe that have different quantity to satisfy more test demands, improve test fixture's utilization ratio.
According to some embodiments of the present application, the test probe is electrically connected to an external test device. The test probe is used for measuring the electrical performance of the high-frequency transformer, one end of the test probe is in contact with the tested pin, the other end of the test probe is electrically connected with external test equipment, different external test equipment is replaced, different electrical parameters such as resistance, capacitance, inductance and voltage of the high-frequency transformer can be tested, the test probe does not need to be replaced, and the utilization efficiency of the test fixture is improved.
Additional aspects and advantages of the present application will be set forth in part in the description which follows and, in part, will be obvious from the description, or may be learned by practice of the invention.
Drawings
The present invention will be further described with reference to the accompanying drawings and examples;
fig. 1 is a structural diagram of a high-frequency transformer testing fixture according to an embodiment of the present application;
fig. 2 is a schematic connection diagram of a high-frequency transformer testing fixture according to another embodiment of the present application, the high-frequency transformer testing fixture being related to an electric cylinder and a connection device;
fig. 3 is a schematic view illustrating a positional relationship between a limit post and a scale of a high-frequency transformer testing fixture according to another embodiment of the present disclosure.
Reference numerals:
the test device comprises a test support 100, a first connecting plate 110, a second connecting plate 120, a third connecting plate 130, a support column 140, an electric cylinder 200, a test probe 300, a connecting device 400, an upper limiting column 410, a lower limiting column 420, a graduated scale 430, a feeding table 500, a conveying belt 510, a feeding positioning groove 511, a driving wheel 610 and a driven wheel 620
Detailed Description
This section will describe in detail the embodiments of the present invention, preferred embodiments of the present invention are shown in the attached drawings, which are used to supplement the description of the text part of the specification with figures, so that one can intuitively and vividly understand each technical feature and the whole technical solution of the present invention, but they cannot be understood as the limitation of the protection scope of the present invention.
In the description of the application, it is to be understood that the positional descriptions, such as the directions or positional relationships indicated above, below, front, rear, left, right, etc., are based on the directions or positional relationships shown in the drawings, and are only for convenience of description and simplification of description, but do not indicate or imply that the device or element referred to must have a specific direction, be constructed and operated in a specific direction, and therefore, should not be construed as limiting the present invention.
In the description of the application, the meaning of a plurality is one or more, the meaning of a plurality is two or more, and larger, smaller, larger, etc. are understood as excluding the present number, and larger, smaller, inner, etc. are understood as including the present number. If the first and second are described for the purpose of distinguishing technical features, they are not to be understood as indicating or implying relative importance or implicitly indicating the number of technical features indicated or implicitly indicating the precedence of the technical features indicated.
In the description of the present application, unless explicitly defined otherwise, terms such as setting, installing, connecting and the like should be understood in a broad sense, and those skilled in the art can reasonably determine the specific meanings of the above terms in the present invention by combining the specific contents of the technical solutions.
Referring to fig. 1 to 3, an embodiment of the present application provides a test fixture for a high-frequency transformer, including: a test rack 100; the electric cylinder 200 is fixed on the upper part of the test bracket 100; the test probe 300 is fixed to the connection device 400; the connecting device 400 comprises an upper limiting column 410, a lower limiting column 420 and a graduated scale 430, the upper limiting column 410 and the graduated scale 430 are fixed on the connecting device 400, the lower limiting column 420 is detachably mounted on the test support, the connecting device 400 is mechanically connected to the electric cylinder 200, and the connecting device 400 drives the test probe 300 to slide up and down along the test support 100 through the electric cylinder 200; the loading table 500 is fixed on the test rack 100 and located below the test probe 300.
It can be understood that the electric cylinder 200 drives the test probe 300 to move up and down along the test support 100 through the connection device 400, when moving down, the test probe 300 contacts with the pins of the high-frequency transformer, thereby testing the electrical performance of the high-frequency transformer, the electric cylinder 200 is externally connected with a control device, the distance that the test probe 300 moves down can be accurately set through the preset lifting parameters of the electric cylinder by the control device, further, the high-frequency transformers with pins of different lengths can be tested, the measurement precision is improved, in addition, a certain distance is reserved between the upper limit column 410 and the lower limit column 420 according to the test requirement, the lower limit column 420 is replaced according to the test pin length requirement, the distance reserved between the upper limit column 410 and the lower limit column 420 is marked through the scale 430, the bottom of the upper limit column 410 corresponds to the starting position of the scale 430, the bottom of the lower limiting column 420 corresponds to the end position of the scale 430, when the test probe 300 moves downwards, the upper limiting column 410 fixed on the connecting device 400 moves downwards at the same time, the distance of the downward movement of the test probe 300 can be accurately measured and monitored through the position of the scale corresponding to the descending of the upper limiting column 410, and the reserved distance between the upper limiting column 410 and the lower limiting column 420 is a safe distance, so that the damage of the test probe or the pin of the high-frequency transformer caused by accidents such as too much descending distance due to setting errors and the like can be avoided.
In some embodiments of the present application, the test rack 100 includes a first connection plate 110, a second connection plate 120, a third connection plate 130, and a support column 140, the electric cylinder 200 is fixed to the first connection plate 110, the second connection plate 120 is provided with a through hole through which the test probe 300 can pass, and the loading table 500 is fixed to the third connection plate 130.
It can be understood that the electric cylinder 200 is fixed on the first connecting plate 110, the electric cylinder is externally connected with a control device, the control device presets a descending height parameter according to the length of the pin of the high-frequency transformer to be tested, the electric cylinder 200 drives the connecting device 400 to move up and down under the driving of the control device, and then drives the test probe 300 fixed on the connecting device 400 to move up and down, the test probe 300 contacts with the pin of the high-frequency transformer through the through hole positioned on the second connecting plate 120 in the downward moving process, and the through hole fixes the test probe 300 and the pin of the transformer, so that the contact is better, and the test accuracy is higher.
In some embodiments of the present application, the material loading device further includes a conveyor belt 510, the conveyor belt 510 is laid on the material loading platform 500, the conveyor belt 510 is located between the driving wheel 610 and the driven wheel 620 and is in contact with the driving wheel 610 and the driven wheel 620, the driving wheel 610 and the driven wheel 620 are arranged in a vertical parallel relationship, a material loading positioning groove 511 is arranged on the conveyor belt 510, and the material loading positioning groove 511 is used for fixing a material to be tested.
It can be understood that the driving wheel 610 and the driven wheel 620 are fixed together by a bracket, the driving wheel 610 is connected with a driving motor, the driving wheel 610 and the driven wheel 620 rotate under the driving of the driving motor and the conveyor belt 510 located between the driving wheel 610 and the driven wheel 620 starts to perform a directional conveying motion, the feeding table 500 is fixed on the third connecting plate 130 and located below the test probe 300 and is used for supporting the conveyor belt 510, the side of the high-frequency transformer having the pins is placed upwards in the feeding positioning groove 511, and after the test by the test probe 300 is completed, the high-frequency transformer is continuously conveyed along with the conveyor belt 510 to perform the next process, the pins are fixed upwards, so that the test probe 300 can accurately and quickly measure, and the test efficiency is improved.
In some embodiments of the present application, the electric cylinder 200 is connected to the connection device 400 by a screw, the test probe 300 is fixed below the connection device 400, the connection device 400 can be detached from the electric cylinder 200 by a screw, and when testing high frequency transformers with different pin numbers, other connection devices 400 with different numbers of test probes 300 can be detached and replaced, so as to meet more test requirements and improve the utilization rate of the test fixture.
In some embodiments of the present application, the test probe 300 is fixed on the connecting device 400, and is electrically connected to an external test device, the test probe 300 is used to measure the electrical performance of the high-frequency transformer, one end of the test probe 300 is in contact with the tested pin, and the other end of the test probe is electrically connected to the external test device, so that different external test devices can be replaced, different electrical parameters such as resistance, capacitance, inductance, and voltage of the high-frequency transformer can be tested, the test probe does not need to be replaced, and the utilization efficiency of the test fixture is improved.
The embodiments of the present invention have been described in detail with reference to the accompanying drawings, but the present invention is not limited to the above embodiments, and various changes can be made without departing from the spirit of the present invention within the knowledge of those skilled in the art.
Claims (5)
1. The utility model provides a test fixture of high frequency transformer which characterized in that includes:
testing the bracket;
the electric cylinder is fixed on the upper part of the test bracket;
a test probe secured to the connecting device;
the connecting device comprises an upper limiting column, a lower limiting column and a graduated scale, the upper limiting column and the graduated scale are fixed on the connecting device, the lower limiting column is detachably mounted on the test support, the connecting device is mechanically connected to the electric cylinder, and the connecting device drives the test probe to slide up and down along the test support through the electric cylinder;
and the feeding table is fixed on the test support and positioned below the test probe.
2. The testing fixture of a high-frequency transformer as claimed in claim 1, wherein the testing bracket comprises a first connecting plate, a second connecting plate, a third connecting plate and a pillar, the electric cylinder is fixed on the first connecting plate, the second connecting plate is provided with a through hole through which the testing probe can pass, and the loading platform is fixed on the third connecting plate.
3. The test fixture for the high-frequency transformer according to claim 1, further comprising a conveyor belt, wherein the conveyor belt is flatly laid on the feeding table, the conveyor belt is located between the driving wheel and the driven wheel and is in contact with the driving wheel and the driven wheel, the driving wheel and the driven wheel are arranged in a vertical parallel relationship, a feeding positioning groove is formed in the conveyor belt, and the feeding positioning groove is used for fixing a material to be tested.
4. The testing fixture of a high-frequency transformer as claimed in claim 1, wherein the electric cylinder is connected to the connecting device by a screw thread.
5. The testing fixture of a high-frequency transformer as claimed in claim 1, wherein the testing probe is electrically connected to an external testing device.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202020960374.9U CN212904991U (en) | 2020-05-28 | 2020-05-28 | High-frequency transformer's test fixture |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202020960374.9U CN212904991U (en) | 2020-05-28 | 2020-05-28 | High-frequency transformer's test fixture |
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| Publication Number | Publication Date |
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| CN212904991U true CN212904991U (en) | 2021-04-06 |
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| Application Number | Title | Priority Date | Filing Date |
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| CN202020960374.9U Active CN212904991U (en) | 2020-05-28 | 2020-05-28 | High-frequency transformer's test fixture |
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Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN113945868A (en) * | 2021-10-28 | 2022-01-18 | 深圳研朗自动化设备有限公司 | Transformer testing device |
| CN114578127A (en) * | 2022-05-06 | 2022-06-03 | 鲁特电工股份有限公司 | Testing device for input and output power of power transformer |
| CN116500424A (en) * | 2023-06-27 | 2023-07-28 | 深圳市克洛诺斯科技有限公司 | PCB detection device |
-
2020
- 2020-05-28 CN CN202020960374.9U patent/CN212904991U/en active Active
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN113945868A (en) * | 2021-10-28 | 2022-01-18 | 深圳研朗自动化设备有限公司 | Transformer testing device |
| CN114578127A (en) * | 2022-05-06 | 2022-06-03 | 鲁特电工股份有限公司 | Testing device for input and output power of power transformer |
| CN116500424A (en) * | 2023-06-27 | 2023-07-28 | 深圳市克洛诺斯科技有限公司 | PCB detection device |
| CN116500424B (en) * | 2023-06-27 | 2024-03-29 | 深圳市克洛诺斯科技有限公司 | PCB detection device |
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Legal Events
| Date | Code | Title | Description |
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| GR01 | Patent grant | ||
| GR01 | Patent grant | ||
| TR01 | Transfer of patent right |
Effective date of registration: 20210624 Address after: 519000 factory building 3 / F, building 4, zaobei Dongshan Industrial Zone, Baiyun Road, Qianshan, Zhuhai City, Guangdong Province Patentee after: ZHUHAI RUNGU ELECTRONIC Co.,Ltd. Address before: 519000 room 105-46073, No.6 Baohua Road, Hengqin New District, Zhuhai City, Guangdong Province (centralized office area) Patentee before: Zhuhai Hengqin Jiahao Intelligent Technology Co.,Ltd. |
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| TR01 | Transfer of patent right |