CN205450145U - Electronic equipment's testing arrangement - Google Patents

Electronic equipment's testing arrangement Download PDF

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Publication number
CN205450145U
CN205450145U CN201620009203.1U CN201620009203U CN205450145U CN 205450145 U CN205450145 U CN 205450145U CN 201620009203 U CN201620009203 U CN 201620009203U CN 205450145 U CN205450145 U CN 205450145U
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CN
China
Prior art keywords
electronic equipment
test
operation panel
adaptor
test device
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
CN201620009203.1U
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Chinese (zh)
Inventor
岑忠孝
陈�胜
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Shenzhen Skyworth Digital Technology Co Ltd
Original Assignee
Shenzhen Skyworth Digital Technology Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
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Priority to CN201620009203.1U priority Critical patent/CN205450145U/en
Application granted granted Critical
Publication of CN205450145U publication Critical patent/CN205450145U/en
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

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Abstract

The utility model provides an electronic equipment's testing arrangement, electronic equipment's testing arrangement includes test jig, power supply box and data logger, the test jig is equipped with a plurality of test portions, test portion is equipped with the adaptor, data logger is equipped with memory, data processing module, display screen and a plurality of connection port, each in the test portion one one end interface connection of adaptor awaits measuring and tries electronic equipment, and the other end is connected one of data logger connection port, the electronic equipment that awaits measuring pass through the adaptor with the data logger electrical property switches on, await measuring electronic equipment by the power supply box power supply, show that screen display shows the test result after data processing module handles, memory storage test data.

Description

A kind of test device of electronic equipment
Technical field
This utility model relates to a kind of test device, particularly to the test device of a kind of electronic equipment.
Background technology
During the generation of electronic product, for guaranteeing product quality, need to carry out test verification.Existing test process is by arranging test station.And can often problem occur in that 1 in whole test process) it mostly is the test for single product, change product needed and change test fixture, bring inconvenience;2) test is by probe contact measurement, and probe is the most aging loose contact occurs to use overlong time to test, and false failure rate is higher;3) test process is complex, causes test process to need to consume the long period, and testing efficiency is low, the easy test leakage of operator;4) test data are without canonical record, bring inconvenience maintenance and test data mining.So that a test device is to solve the problems referred to above.
Utility model content
Technical problem to be solved in the utility model is, it is provided that the test device of a kind of electronic equipment, to increase the versatility of test device, improves testing efficiency and reduces cost.
To achieve these goals, the following technical scheme of this utility model offer:
This utility model provides the test device of a kind of electronic equipment, the test device of described electronic equipment includes testing jig, power supply box and data logger, described testing jig is provided with some test departments, described test department is provided with adaptor, described data logger is provided with memorizer, data processing module, display screen and some connectivity ports, one end interface of the described adaptor on each described test department connects an electronic equipment to be tested, the other end connects a described connectivity port of described data logger, electronic equipment to be measured is electrically conducted with described data logger by adaptor, electronic equipment to be measured is powered by described power supply box, the storage of described memorizer is via the test data after data processing module process, described display screen shows the test result after data processing module processes.
Wherein, described testing jig includes the two side be arrangeding in parallel and is held in n-layer operation panel between described two side, n is the integer more than 2, the stepped arrangement of n-layer operation panel, and described test department is located at described in adjacent two-layer between operation panel and is supported with operation panel described in two-layer.
Wherein, the ground floor operation panel of described n-layer operation panel is provided with some through installing holes, and described testing jig is fixed on ground or workbench by described installing hole.
Wherein, described test department includes relative two ends, every one end projection cylindrical projection and the location hole adjacent with described cylindrical projection, operation panel described in adjacent two-layer is provided with parallel relative rotation hole, and described cylindrical projection is inserted in described rotation hole and makes described test department axle centered by the axle of described cylindrical projection place rotate.
Wherein, it is close to described rotation hole on the described operation panel of each layer and is provided with regulating tank, hole, described location can be moved in described regulating tank along with the rotation of described test department, and described test department lock onto hole, described location by bolt and makes bolt head be fastened on described operation panel to be fixed.
Wherein, described test department forms a line along the bearing of trend of described operation panel on described operation panel.
Wherein, described test department is provided with sliding tray along the bearing of trend of described cylindrical projection, and described adaptor is located on described sliding tray and freely slidable and positioned by bolt.
Wherein, the number of the described adaptor on each described test department is one or more, and when the described adaptor on described test department is multiple, described adaptors different on described test department has different described interfaces.
Wherein, described data logger is connected described connectivity port with electronic equipment to be measured by one end of patchcord, and the other end connects described adaptor and realizes electrically conducting.
Wherein, the described two side of described testing jig is provided with the conveying hole being oppositely arranged.
The test device of a kind of electronic equipment that this utility model provides, by arranging multiple test department, and test department is adjustable to mate different types of electronic equipment, and the data of test can be preserved by data logger.Add the versatility of test device, improve testing efficiency and reduce the cost of test process.
Accompanying drawing explanation
In order to be illustrated more clearly that the technical solution of the utility model, the accompanying drawing used required in embodiment will be briefly described below, apparently, accompanying drawing in describing below is only embodiments more of the present utility model, for those of ordinary skill in the art, on the premise of not paying creative work, it is also possible to obtain other accompanying drawing according to these accompanying drawings.
Fig. 1 is the schematic diagram of the test device of the electronic equipment that this utility model embodiment provides;
Fig. 2 is the schematic diagram of the testing jig of the test device of the electronic equipment described in Fig. 1;
Fig. 3 is the enlarged diagram of the II part of the testing jig described in Fig. 2;
The schematic diagram of the test department of the testing jig described in Fig. 4 Fig. 2.
The side view of the test department of the testing jig described in Fig. 5 Fig. 2.
Detailed description of the invention
Below in conjunction with the accompanying drawing in this utility model embodiment, the technical scheme in this utility model embodiment is clearly and completely described, it is clear that described embodiment is only a part of embodiment of this utility model rather than whole embodiments.Based on the embodiment in this utility model, the every other embodiment that those of ordinary skill in the art are obtained under not making creative work premise, broadly fall into the scope of this utility model protection.
Seeing also Fig. 1 and Fig. 2, this utility model embodiment provides the test device 100 of a kind of electronic equipment, and the test device 100 of described electronic equipment includes testing jig 30, power supply box 50 and data logger 70.Described testing jig 30 includes the two side 31 be arrangeding in parallel, be held between described two side 31 and the stepped n-layer operation panel 32 be arrangeding in parallel and some test departments 33, and n is the integer more than 2.In the present embodiment, n is 3.Described operation panel 32 is rectangular slab and selects the thick bakelite with good insulating properties and thermostability.Described operation panel 32 includes ground floor operation panel 321, second layer operation panel 322 and third layer operation panel 323 successively.Described ground floor operation panel 321 is provided with some through installing holes 324.In the present embodiment, described installing hole 324 is four.Described installing hole 324 is distributed in four right angle of described ground floor operation panel 321.Described testing jig 30 is fixed on ground or workbench by described installing hole 324.Operation panel 32 described in adjacent two-layer is provided with some parallel relative rotation hole (not shown), and described rotation hole forms a line at equal intervals along the bearing of trend of described operation panel 32.Being close to described rotation hole on the described operation panel of each layer 32 and be provided with through described operation panel 32 and the regulating tank in circular arc 325, the nock direction of described regulating tank is towards its immediate described rotation hole.In the present embodiment, each layer operation plate 32 is provided with eight described rotation holes and eight described regulating tanks 325, and the radian corresponding to described regulating tank 325 is pi/2.Described two side 31 is for stepped plate and selects thick bakelite.Described two side 31 is arranged at the relative two edges of described ground floor operation panel 321 and by screw or gluing fixing.The conveying hole 311 being oppositely arranged that described two side 31 uses when being provided with mobile described testing jig.Staff, when carrying described testing jig 30, moves described testing jig 30 by the most described conveying hole 311 and can avoid encountering the electrical connection component on described testing jig 30 by mistake, it is to avoid the electronic equipment loose contact being likely to result in moving process.
Further, seeing also Fig. 3 to Fig. 5, described test department 33 is cylinder.Described test department 33 is located at described in adjacent two-layer between operation panel 32 and is supported with operation panel 32 described in adjacent two-layer.Described test department 33 32 forms a line along the bearing of trend of described operation panel 32 on described operation panel.In the present embodiment, the number of described test department 33 is 16.Described test department 33 is equidistantly arrangement eight between described ground floor test board 321 and described second layer test board 322, and described test department 33 is equidistantly arrangement eight between described second layer test board 322 and described third layer test board 323.Described test department 33 includes relative two ends, every one end projection cylindrical projection 331 and the location hole 332 adjacent with described cylindrical projection 331.Described cylindrical projection 331 is inserted in described rotation hole corresponding on operation panel 32 described in adjacent two-layer, and described test department 33 axle centered by two opposing described cylindrical projection 331 place axles can be made to rotate.Hole, described location 332 is screwed hole, described test department 33 rotate time, the motion track in hole, described location 332 is circular arc, and hole, described location 332 be limited to the described regulating tank 325 being disposed adjacent with described rotation hole in move.In the present embodiment, owing to the radian of described regulating tank 325 correspondence is pi/2, thus maximum rotatable 90 degree of described test department 33, to mate the electronic equipment of different model.It is understood that the most described rotatable angle of test department 33 can be bigger angle.Increase the size of the radian of described regulating tank 325 correspondence, the described rotatable angle of test department 33 can be increased.Described test department 33 lock onto hole, described location 332 by bolt and makes bolt head be fastened in described operation panel 32 to be positioned on the surface outside described regulating tank 325 and be fixed.
Further, described test department 33 is additionally provided with the sliding tray 333 arranged along described cylindrical projection 331 bearing of trend and can pass through the adaptor 334 of slidable adjustment position on described sliding tray 333.The through described test department 33 of described sliding tray 333.Described sliding tray 333 can be made up of the multistage being arranged in series or connect into one section.In the present embodiment, described sliding tray 333 is formed by two sections.Described adaptor 334 includes interface 3341 and the connection end 3342 electrically conducted with described interface 3341.Described interface 3341 connects electronic equipment 80 to be tested.Described connection end 3342 can connect patchcord 90 thus electrically conduct with external equipment.The most described adaptor 334 can be one or more, and when described adaptor 334 is multiple, on each described test department 33, different described adaptors 334 has different interfaces, to mate the connectivity port of different types of electronic equipment.In the present embodiment, it is provided with a described adaptor 334 in each section of described sliding tray 333, and the described interface 3341 of two described adaptors 334 is different.Similar with the fixed form of described test department 33, described adaptor 334 is provided with screwed hole, and by bolt through described sliding tray 333 insert screwed hole, and fastening bolt makes bolt head be fastened in described test department 33 to be positioned on the surface outside described sliding tray 333.
Further, referring to Fig. 1.Described power supply box 50 is 220V alternating current power supply.It can be that multiple electronic equipment to be tested 80 is powered simultaneously that described power supply box 50 is provided with multiple jack.
Further, referring to Fig. 1.Described data logger 70 includes memorizer (not shown), data processing module (not shown), display screen 71 and some connectivity ports 72.Described data logger 70 is connected described connectivity port 72 with electronic equipment 80 to be tested by one end of patchcord 90, and the other end connects described adaptor 334 and realizes electrically conducting.The setting of some described connectivity ports 72 can make the test that described data logger 70 processes multiple electronic equipment simultaneously.In the present embodiment, the number of described connectivity port 72 is 16.Described display screen 71 can be one or more, when described display screen 71 is one, the test result of each electronic equipment shows on same described display screen 71. described display screen 71 is for time multiple, and the test result of each electronic equipment shows on the most corresponding described display screen 71.In the present embodiment, the number of described display screen 71 is 16, and the test result of each electronic equipment shows on the most corresponding described display screen 71.Described data processing module built-in testing software, for processing the test data of electronic equipment 80 to be tested.The display of described display screen 71 needs the indices of test, and can show that test index is the most qualified.Described memory storage test data, facilitate subsequent maintenance and the analysis and arrangement of staff.
Actual mechanical process is as follows: 1) device location is put: staff puts described testing jig 30, power supply box 50 and data logger 70;2) electrically connect between equipment: the described test department 33 that electronic equipment 80 to be tested to or multiple stage is positioned on described operation panel 32 correspondence is other, regulate the angle of described test department 33 and the position of described switching 334 and position, electronic equipment 80 to be tested is made to connect described interface 3341, described connection end 3342 connects patchcord 90, described patchcord 90 is connected with described connectivity port 72, electronic equipment 80 to be tested and described power supply box 50 electrical communication;3) test is started: switch on power, run electronic equipment and described data logger 70, staff observes the display result of described display screen 71, check that indices is the most qualified, if qualified, carry out the test of next electronic equipment, if defective, feeding back to maintainer, the data that maintainer can call in described memorizer are keeped in repair.
The test device of the electronic equipment that this utility model provides, by arranging multiple described test department 33 and having the data logger 70 of multiple described connectivity port 72, can realize multiple electronic equipment and test simultaneously, simplify test process, improve production efficiency.
The above is preferred implementation of the present utility model; it should be pointed out that, for those skilled in the art, on the premise of without departing from this utility model principle; can also make some improvements and modifications, these improvements and modifications are also considered as protection domain of the present utility model.

Claims (10)

1. the test device of an electronic equipment, it is characterized in that, the test device of described electronic equipment includes testing jig, power supply box and data logger, described testing jig is provided with some test departments, described test department is provided with adaptor, described data logger is provided with memorizer, data processing module, display screen and some connectivity ports, one end interface of the described adaptor on each described test department connects an electronic equipment to be tested, the other end connects a described connectivity port of described data logger, electronic equipment to be measured is electrically conducted with described data logger by adaptor, electronic equipment to be measured is powered by described power supply box, the storage of described memorizer is via the test data after data processing module process, described display screen shows the test result after data processing module processes.
2. the test device of electronic equipment as claimed in claim 1, it is characterized in that, described testing jig includes the two side be arrangeding in parallel and is held in n-layer operation panel between described two side, n is the integer more than 2, the stepped arrangement of n-layer operation panel, described test department is located at described in adjacent two-layer between operation panel and is supported with operation panel described in two-layer.
3. the test device of electronic equipment as claimed in claim 2, it is characterised in that the ground floor operation panel of described n-layer operation panel is provided with some through installing holes, and described testing jig is fixed on ground or workbench by described installing hole.
4. the test device of electronic equipment as claimed in claim 2, it is characterized in that, described test department includes relative two ends, every one end projection cylindrical projection and the location hole adjacent with described cylindrical projection, operation panel described in adjacent two-layer is provided with parallel relative rotation hole, and described cylindrical projection is inserted in described rotation hole and makes described test department axle centered by the axle of described cylindrical projection place rotate.
5. the test device of electronic equipment as claimed in claim 4, it is characterized in that, it is close to described rotation hole on the described operation panel of each layer and is provided with regulating tank, hole, described location can be moved in described regulating tank along with the rotation of described test department, and described test department lock onto hole, described location by bolt and makes bolt head be fastened on described operation panel to be fixed.
6. the test device of electronic equipment as claimed in claim 2, it is characterised in that described test department forms a line along the bearing of trend of described operation panel on described operation panel.
7. the test device of the electronic equipment as described in any one of claim 4 to 6, it is characterised in that described test department is provided with sliding tray along the bearing of trend of described cylindrical projection, described adaptor is located on described sliding tray and freely slidable and positioned by bolt.
8. the test device of electronic equipment as claimed in claim 1, it is characterized in that, the number of the described adaptor on each described test department is one or more, and when the described adaptor on described test department is multiple, described adaptors different on described test department has different described interfaces.
9. the test device of electronic equipment as claimed in claim 1, it is characterised in that described data logger is connected described connectivity port with electronic equipment to be measured by one end of patchcord, the other end connects described adaptor and realizes electrically conducting.
10. the test device of electronic equipment as claimed in claim 1, it is characterised in that the described two side of described testing jig is provided with the conveying hole being oppositely arranged.
CN201620009203.1U 2016-01-06 2016-01-06 Electronic equipment's testing arrangement Expired - Fee Related CN205450145U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN201620009203.1U CN205450145U (en) 2016-01-06 2016-01-06 Electronic equipment's testing arrangement

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN201620009203.1U CN205450145U (en) 2016-01-06 2016-01-06 Electronic equipment's testing arrangement

Publications (1)

Publication Number Publication Date
CN205450145U true CN205450145U (en) 2016-08-10

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Application Number Title Priority Date Filing Date
CN201620009203.1U Expired - Fee Related CN205450145U (en) 2016-01-06 2016-01-06 Electronic equipment's testing arrangement

Country Status (1)

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Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN107181536A (en) * 2017-07-06 2017-09-19 无锡基隆电子有限公司 A kind of bluetooth test platform
CN108318753A (en) * 2017-01-16 2018-07-24 研华股份有限公司 Detecting system

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN108318753A (en) * 2017-01-16 2018-07-24 研华股份有限公司 Detecting system
CN107181536A (en) * 2017-07-06 2017-09-19 无锡基隆电子有限公司 A kind of bluetooth test platform

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Legal Events

Date Code Title Description
C14 Grant of patent or utility model
GR01 Patent grant
CF01 Termination of patent right due to non-payment of annual fee

Granted publication date: 20160810

Termination date: 20210106

CF01 Termination of patent right due to non-payment of annual fee