CN218122044U

CN218122044U - Laser light-emitting head conduction testing device

Info

Publication number: CN218122044U
Application number: CN202222009462.2U
Authority: CN
Inventors: 雷建赛; 丁和瀚
Original assignee: Shenzhen Topfa Automation Equipment Co ltd
Current assignee: Shenzhen Topfa Automation Equipment Co ltd
Priority date: 2022-07-29
Filing date: 2022-07-29
Publication date: 2022-12-23
Anticipated expiration: 2032-07-29

Abstract

The application discloses a laser light-emitting head conduction testing device which comprises a clamping component for mounting a laser light-emitting head, a testing component for testing the laser light-emitting head, and a lifting driving component for driving the testing component to lift; the test component comprises an installation block, a probe for testing the laser light-emitting head is installed on the installation block, and the installation block is installed at the driving end of the lifting driving component; the clamping assembly is located above the testing assembly and comprises a fixed plate and a movable plate, the fixed plate is used for clamping the laser light-emitting head, one end of the movable plate is connected with a driving mechanism used for driving the movable plate to move, and the other end of the movable plate is connected with an elastic piece. The technical scheme of the application solves the problems of complex structure, high cost and low efficiency of the existing conductive testing device.

Description

Conductive testing device for laser light-emitting head

Technical Field

The application relates to the technical field of test fixtures, in particular to a laser light-emitting head conduction test fixture.

Background

At present, in actual production, a final product needs to go through a plurality of processes, and a conductive testing link of a laser light emitting head is often one of the most important processes in the plurality of processes, and plays a role in testing whether the laser light emitting head can be lighted and a brightness value which can be reached by the lighted laser light emitting head. The existing device can replace manual operation, and can take and place a product to a position and clamp the product for conducting test by matching with an automatic element. Although the functionality can be realized, the test flow is too complicated, the manufacturing cost is high, the later maintenance working cost is high, the efficiency is low, and certain potential safety hazards exist.

SUMMERY OF THE UTILITY MODEL

The application provides a laser light-emitting head conductive testing device, solves the problem that current conductive testing device structure is complicated, and is with high costs, inefficiency.

The embodiment of the application provides a laser light-emitting head conduction testing device which comprises a clamping component, a testing component and a lifting driving component, wherein the clamping component is used for mounting a laser light-emitting head;

the test component comprises an installation block, a probe for testing the laser light-emitting head is installed on the installation block, and the installation block is installed at the driving end of the lifting driving component;

the clamping assembly is located above the testing assembly and comprises a fixed plate and a movable plate, the fixed plate is used for clamping the laser light-emitting head, one end of the movable plate is connected with a driving mechanism used for driving the movable plate to move, and the other end of the movable plate is connected with an elastic piece.

In some embodiments, the clamping assembly includes a bottom plate, the movable plate is slidably mounted on the bottom plate, and the bottom plate is provided with through holes for the pins of the laser light emitting head to pass through and be in butt joint with the probes; the movable plate is provided with a slot, the fixed plate is installed in the slot, and the fixed plate and the movable plate are both provided with a profiling slot for clamping the laser light-emitting head.

In some embodiments, the elastic positioning element is a spring, a limiting plate for installing one end of the spring is installed on the bottom plate, and the other end of the spring is connected with the movable plate.

In some embodiments, the limiting plate is further provided with a limiting screw for limiting the movement of the movable plate.

In some embodiments, the lifting driving assembly comprises a driving cylinder, and the testing assembly is mounted at the driving end of the driving cylinder.

In some embodiments, the lifting drive assembly further comprises a rail slider mechanism for guiding the lifting of the test assembly, the test assembly being coupled to the rail slider mechanism.

In some embodiments, the lifting device further comprises a mounting bracket, and the clamping assembly and the lifting driving assembly are mounted on the mounting bracket.

In some embodiments, the mounting rack comprises an upright plate for mounting the clamping assembly and the lifting driving assembly, and a fixed bottom plate for mounting the upright plate, wherein a reinforcing rib plate is mounted between the upright plate and the fixed bottom plate.

In some embodiments, a limit adjusting screw for limiting the movement of the lifting driving assembly is mounted on the vertical plate.

Compared with the prior art, the beneficial effects of this application are: the structure of the existing conductive testing device is improved, the clamping assembly clamps a product by utilizing the elastic potential energy of the spring, and the device is ingenious, so that the manufacturing cost, the maintenance cost and the use cost of the device are greatly reduced, and the debugging and installation difficulty is reduced. Meanwhile, under the condition that a test product is conducted, the driving cylinder is adopted to drive the probe to move upwards so as to contact the pin of the product, and the product and an operator can be protected to a certain extent by matching with the adjusting screw.

Drawings

In order to more clearly illustrate the embodiments of the present application or the technical solutions in the prior art, the drawings used in the description of the embodiments or the prior art will be briefly described below, it is obvious that the drawings in the following description are only some embodiments of the present application, and for those skilled in the art, other drawings can be obtained according to the structures shown in the drawings without creative efforts.

FIG. 1 is a schematic view of the overall structure of the electrical conductivity testing apparatus of the present application;

FIG. 2 is a schematic structural diagram of a test assembly of the present application;

FIG. 3 is a schematic view of a clamp assembly according to the present application;

FIG. 4 is a schematic view of the lift drive assembly of the present application;

the implementation, functional features and advantages of the objectives of the present application will be further explained with reference to the accompanying drawings.

Detailed Description

The technical solutions in the embodiments of the present application will be clearly and completely described below with reference to the drawings in the embodiments of the present application, and it is obvious that the described embodiments are some, but not all, embodiments of the present application.

Unless defined otherwise, all technical and scientific terms used herein have the same meaning as commonly understood by one of ordinary skill in the art to which this application belongs. The terminology used in the description of the present application is for the purpose of describing particular embodiments only and is not intended to be limiting of the application.

Referring to fig. 1, the device for testing the conductivity of a laser light emitting head 1 provided by this embodiment includes a clamping assembly 2 for mounting the laser light emitting head 1, a testing assembly 3 for testing the laser light emitting head 1, and a lifting driving assembly 4 for driving the testing assembly 3 to lift;

referring to fig. 2, the testing assembly 3 includes a mounting block 31, a probe 32 for testing the laser emitting head 1 is mounted on the mounting block 31, and the mounting block 31 is mounted at a driving end of the lifting driving assembly 4;

referring to fig. 3, the clamping assembly 2 is located above the testing assembly 3, the clamping assembly 2 includes a fixed plate 21 and a movable plate 22 for clamping the laser emitting head 1, one end of the movable plate 22 is connected to a driving mechanism for driving the movable plate to move, and the other end of the movable plate 22 is connected to an elastic member 23.

In the embodiment, the structure of the conduction testing device for the laser light emitting head 1 is simplified, for the clamping assembly 2, the movable plate 22 is pushed to the fixed plate 21 by the elastic force of the elastic member 23 to the movable plate 22, so that the laser light emitting head 1 is clamped between the movable plate 22 and the fixed plate 21, if the laser light emitting head 1 needs to be taken out or installed, the movable plate 22 can be pushed away from the fixed plate 21 by an external driving mechanism, namely, the movable plate and the fixed plate can be separated, in the process of pushing the movable plate 22 away from the fixed plate 21, the elastic member 23 is compressed, and after the driving force of the external driving mechanism is cancelled, the movable plate 22 can be moved to the fixed plate 21 under the elastic restoring force of the elastic member 23, so that the clamping state is maintained. In this embodiment, the elastic member 23 is a spring, which has low cost, simple structure and convenient installation and replacement.

Further, the clamping assembly 2 includes a bottom plate 24, the movable plate 22 is slidably mounted on the bottom plate 24, and the bottom plate 24 is provided with a via hole for the pin of the laser light emitting head 1 to pass through and be in butt joint with the probe 32; the movable plate 22 is provided with a slot 25, the fixed plate 21 is installed in the slot 25, and both the fixed plate 21 and the movable plate 22 are provided with a profiling slot for clamping the laser light emitting head 1. The bottom plate 24 is provided with a side plate for guiding and limiting the sliding of the movable plate 22, so that the sliding stability of the movable plate 22 is ensured, the movable plate 22 and the fixed plate 21 are both provided with contour grooves, the laser light emitting head 1 can be completely attached between the movable plate 22 and the fixed plate 21, and the stability of clamping force is ensured.

Further, the elastic positioning element is a spring, a limiting plate 27 for installing one end of the spring is installed on the bottom plate 5224, and the other end of the spring is connected with the movable plate 22.

Further, a limiting screw 28 for limiting the movement of the movable plate 22 is further mounted on the limiting plate 27. By screwing the limit screw 28, the moving stroke of the movable plate 22 can be adjusted, thereby adjusting the magnitude of the clamping force.

Further, the lifting driving assembly 4 comprises a driving cylinder 41, and the testing assembly 3 is mounted at a driving end of the driving cylinder 41. The lifting driving assembly 4 further comprises a guide rail sliding block mechanism 42 mechanism for guiding the lifting of the testing assembly 3, and the testing assembly 3 is connected with the guide rail sliding block mechanism 42. Carry out elevating movement along guide rail slider mechanism 42 through driving actuating cylinder 41 drive test component 3, thereby the pin that drives probe 32 on the test component 3 and laser emitting head 1 switches on or separates, specifically, during the test, it will test component 3 jack-up to drive actuating cylinder 41, probe 32 switches on with the pin contact of laser emitting head 1, conveniently test, after the test is accomplished, it withdraws to drive actuating cylinder 41 drive test component 3 decline, probe 32 and laser emitting head 1's pin separation, the test is over, whole process operation is simple and convenient, rapidly, high efficiency.

Further, the lifting device also comprises a mounting frame, and the clamping component 2 and the lifting driving component 4 are mounted on the mounting frame. The mounting frame comprises a vertical plate 51 for mounting the clamping assembly 2 and the lifting driving assembly 4 and a fixed bottom plate 52 for mounting the vertical plate 51, a reinforcing rib plate 53 is mounted between the vertical plate 51 and the fixed bottom plate 52, and the overall structure is high in stability.

Furthermore, the vertical plate 51 is provided with a limit adjusting screw 54 for limiting the movement of the lifting driving assembly 4, and the stroke of the driving cylinder 41 can be limited by adjusting the position of the limit adjusting screw 54, so that the lifting height of the probe 32 is limited, and different test requirements are met.

The above description is only a preferred embodiment of the present application, and not intended to limit the scope of the present application, and all the equivalent structures or equivalent processes that can be directly or indirectly applied to other related technical fields by using the contents of the specification and the drawings of the present application are also included in the scope of the present application.

Claims

1. A laser light-emitting head conduction testing device is characterized by comprising a clamping component for mounting a laser light-emitting head, a testing component for testing the laser light-emitting head, and a lifting driving component for driving the testing component to lift;

2. The apparatus according to claim 1, wherein the clamping assembly comprises a base plate, the movable plate is slidably mounted on the base plate, and the base plate is provided with a through hole for the pin of the laser emitter to pass through and abut against the probe; the movable plate is provided with a slot, the fixed plate is installed in the slot, and the fixed plate and the movable plate are both provided with a profiling slot for clamping the laser light-emitting head.

3. The apparatus according to claim 2, wherein the elastic positioning member is a spring, the bottom plate is provided with a limiting plate for mounting one end of the spring, and the other end of the spring is connected to the movable plate.

4. The apparatus according to claim 3, wherein the position-limiting plate is further provided with a position-limiting screw for limiting the movement of the movable plate.

5. The apparatus of claim 1, wherein the elevating drive assembly comprises a drive cylinder, and the testing assembly is mounted to a drive end of the drive cylinder.

6. The apparatus of claim 5, wherein the elevation driving assembly further comprises a rail slider mechanism for guiding elevation of the testing assembly, the testing assembly being connected to the rail slider mechanism.

7. The apparatus of claim 1, further comprising a mounting bracket, wherein the clamping assembly and the elevation drive assembly are mounted to the mounting bracket.

8. The laser emitter head electrical conductivity testing apparatus of claim 7, wherein the mounting bracket comprises a vertical plate for mounting the clamping assembly and the lifting driving assembly, and a fixing bottom plate for mounting the vertical plate, and a reinforcing rib plate is mounted between the vertical plate and the fixing bottom plate.

9. The apparatus according to claim 8, wherein a limit adjusting screw for limiting the movement of the elevating driving assembly is mounted on the vertical plate.