CN218003469U

CN218003469U - Multi-end test fixture

Info

Publication number: CN218003469U
Application number: CN202221396769.6U
Authority: CN
Inventors: 张小燕
Original assignee: Shanghai Wingtech Electronic Technology Co Ltd
Current assignee: Shanghai Wingtech Electronic Technology Co Ltd
Priority date: 2022-05-30
Filing date: 2022-05-30
Publication date: 2022-12-09
Anticipated expiration: 2032-05-30

Abstract

The present disclosure relates to a multi-end test fixture, comprising: the device comprises a USB interface, a test probe interface and an output interface; the test probe interface comprises a first probe and a second probe; the USB interface and the test probe interface are electrically connected with the output interface; the USB interface and the test probe interface are used for connecting equipment to be tested; the output interface is used for connecting test equipment. This openly can test the signal that comes from multiple input interface, need not to test through walking the external standard USB interface of line, avoids damaging the mainboard, reduces and walks line length, avoids the unsafe problem of test result.

Description

Multi-end test fixture

Technical Field

The present disclosure relates to the field of test technologies, and in particular, to a multi-terminal test fixture.

Background

The USB interfaces of electronic products are various, and different products have interfaces with different speeds. We used a completely different fixture during the test. And if the test needs to be completed, various clamps need to be replaced, so that the test cost and the test time are obviously increased. Part of the USB signals are transmitted on the mainboard instead of the interface, or the signal interface cannot be connected with the standard interface of the test fixture.

For the USB signal to be measured, a coaxial wire welding mode is usually used to lead out the signal, and then a standard USB interface is externally connected. The whole welding process is not only complicated, but also the main board may be damaged.

SUMMERY OF THE UTILITY MODEL

In order to solve the above-mentioned technical problem or solve above-mentioned technical problem at least partially, this disclosure provides a multi-end test fixture, can test the signal that comes from multiple input interface, need not to test through walking the external standard USB interface of line, avoids damaging the mainboard, reduces and walks line length, avoids the unsafe problem of test result.

In a first aspect, the present disclosure provides a multi-terminal test fixture, comprising:

the device comprises a USB interface, a test probe interface and an output interface;

the test probe interface comprises a first probe and a second probe;

the USB interface and the test probe interface are electrically connected with the output interface; the USB interface and the test probe interface are used for connecting equipment to be tested; the output interface is used for connecting test equipment.

In some embodiments, the test probe interface further comprises a needle cap;

the needle cap is electrically connected with the output interface; the first probe and the second probe are inserted on the needle cap; the first probe and the second probe are both detachable from the needle cap.

In some embodiments, the first and second probes comprise rotatable curved needles.

In some embodiments, the distance between the first probe and the second probe is 2-3mm.

In some embodiments, further comprising: a switch assembly;

the input end of the switch component is electrically connected with the USB interface and the test probe interface respectively; the output end of the switch component is electrically connected with the output interface.

In some embodiments, the switch assembly includes a removable resistor;

the input end of the detachable resistor is electrically connected with the input end of the switch assembly; the output end of the detachable resistor is electrically connected with the output end of the switch assembly.

In some embodiments, the USB interface is electrically connected to the output interface through a plurality of sets of first signal lines; the test probe interface is electrically connected with the output interface through a plurality of groups of second signal wires;

wherein the signal transmission rates of different groups of signal lines are different.

In some embodiments, the USB interface is a USB3.2TYPE-A interface.

In some embodiments, the output interface is an SMA interface.

In some embodiments, further comprising: a PCB board; the USB interface, the test probe interface and the output interface are all arranged on the PCB.

The multi-terminal test fixture provided by the present disclosure includes a USB interface, a test probe interface, and an output interface, the test probe interface including a first probe and a second probe. The USB interface and the test probe interface are electrically connected with the output interface, the USB interface and the test probe interface are used for connecting equipment to be tested, and the output interface is used for connecting the test equipment. The test probe is provided with a plurality of interfaces, different interfaces are used for connecting different input interfaces, the type of the input interface is a USB interface, and the input interface can be selectively connected with the USB interface, and the type of the input interface does not belong to the USB interface and can be selectively connected with the test probe interface. The test device can test signals from various input interfaces, does not need to test through wiring an external standard USB interface, avoids damaging a mainboard, reduces wiring length and avoids the problem of inaccurate test results.

Drawings

The accompanying drawings, which are incorporated in and constitute a part of this specification, illustrate embodiments consistent with the present disclosure and, together with the description, serve to explain the principles of the disclosure.

In order to more clearly illustrate the embodiments or technical solutions in the prior art of the present disclosure, the drawings used in the embodiments or technical solutions in the prior art description will be briefly described below, and it is obvious for those skilled in the art that other drawings can be obtained according to these drawings without inventive labor.

Fig. 1 is a schematic structural diagram of a multi-terminal test fixture according to an embodiment of the present disclosure;

fig. 2 is a schematic structural diagram of a needle cap provided in an embodiment of the present disclosure;

FIG. 3 is a schematic view of a rotatable curved needle provided in an embodiment of the present disclosure;

FIG. 4 is a schematic structural diagram of another multi-end test fixture provided in an embodiment of the present disclosure;

FIG. 5 is a schematic circuit diagram of a multi-terminal test fixture according to an embodiment of the present disclosure;

FIG. 6 is a schematic circuit diagram of another multi-terminal test fixture according to an embodiment of the present disclosure;

fig. 7 is a schematic structural diagram of a PCB provided in an embodiment of the present disclosure.

Detailed Description

In order that the above objects, features and advantages of the present disclosure may be more clearly understood, aspects of the present disclosure will be further described below. It should be noted that the embodiments and features of the embodiments of the present disclosure may be combined with each other without conflict.

In the following description, numerous specific details are set forth in order to provide a thorough understanding of the present disclosure, but the present disclosure may be practiced in other ways than those described herein; it is to be understood that the embodiments disclosed in the specification are only a few embodiments of the present disclosure, and not all embodiments.

Fig. 1 is a schematic structural diagram of a multi-terminal test fixture provided in an embodiment of the present disclosure, and as shown in fig. 1, the embodiment of the present disclosure provides a multi-terminal test fixture, which includes: a USB interface 11, a test probe interface 12 and an output interface 13. The test probe interface 12 comprises a first probe 121 and a second probe 122, the USB interface 11 and the test probe interface 12 are electrically connected to the output interface 13, the USB interface 11 and the test probe interface 12 are used for connecting a device to be tested, and the output interface 13 is used for connecting a test device.

Specifically, the multi-terminal test fixture is provided with a USB interface 11, the USB interface 11 is electrically connected to an output interface 13, and when the signal to be tested comes from a conventional interface, the USB interface 11 can be used to transmit the signal to be tested to the output interface 13 through the USB interface 11. The multi-end test fixture is further provided with a test probe interface 12, and the test probe interface 12 is electrically connected with an output interface 13. The test probe interface 12 includes two probes, namely a first probe 121 and a second probe 122, and when a signal to be tested comes from an irregular interface, the first probe 121 and the second probe 122 of the test probe interface 12 are directly placed on a signal point to be tested, and a needle head is directly connected to the signal point to be tested, so that the signal is directly transmitted from the signal point to be tested to the output interface 13 through the first probe 121 and the second probe 122.

Wherein, the signal from the unconventional interface can refer to a signal which is not transmitted through the USB interface; or there is no interface, only one signal point to be tested, and for the signal point to be tested, the external lead and the USB interface are usually connected to the signal point to be tested separately, but the length of signal transmission is increased, which affects the accuracy of signal transmission. And when the device is externally connected, the device to be tested may be physically damaged by welding and other methods. The use of the test probe interface 12 can reduce the length of the wiring, does not damage the signal points, and can save time and simplify the operation. It is understood that if the signal to be tested comes from a conventional interface, the test probe interface 12 can also be used for transmission, and the transmission of the signal can also be completed by pointing the first probe 121 and the second probe 122 of the test probe interface 12 on the signal point to be tested of the conventional interface.

According to the test probe interface, the plurality of interfaces are arranged, different interfaces are used for being connected with different input interfaces, the type of the input interface is a USB interface, the input interface can be selectively connected with the USB interface, the type of the input interface does not belong to the USB interface, and the input interface can be selectively connected with the test probe interface. The test device can test signals from various input interfaces, does not need to test through wiring an external standard USB interface, avoids damaging a mainboard, reduces wiring length and avoids the problem of inaccurate test results.

In some embodiments, fig. 2 is a schematic structural diagram of a needle cap provided in an embodiment of the present disclosure, and as shown in fig. 2, the test probe interface further includes a needle cap 123. The needle cap 123 is electrically connected with the output interface, the first probe 121 and the second probe 122 are inserted on the needle cap 123, and both the first probe 121 and the second probe 123 are detachable from the needle cap 123.

Specifically, the test probe interface further includes a needle cap 123, two holes are disposed on the needle cap 123, and the two holes are respectively used for placing the first probe 121 and the second probe 122, because the first probe 121 and the second probe 122 are both detachable from the needle cap, the first probe 121 and the second probe 122 can be directly inserted onto the needle cap 123, when the probes are damaged, the probes can be directly pulled down to be replaced, if the first probe 121 is damaged, the first probe 121 can be replaced, the second probe 122 does not need to be replaced, and the operation is more flexible. The needle cap 123 can prevent the probe from moving in the detection process, so that the accuracy and the integrity of the signal to be tested are influenced. If the position of the signal point to be detected is difficult to detect, the probes with different lengths can be replaced. The needle cap 123 is electrically connected to the output interface, and a conductive material may be disposed inside the needle cap 123, so that the signal is transmitted to the output interface through a probe, the conductive material, and the like, for example, a carbon rod is used for the conductive connection. The needle cap 123 is made of an insulating material to prevent electrical conduction. Through needle cap and detachable probe connection, can test the signal of different signal points that await measuring to be convenient for change the probe, increased the live time of multiterminal test fixture.

It should be noted that, instead of using a conductive material, the conductive material may be directly transmitted through the probe, and the structure of the test probe interface may be set according to actual requirements.

In some embodiments, fig. 3 is a schematic structural diagram of a needle cap provided in an embodiment of the present disclosure, and as shown in fig. 3, the first probe 121 and the second probe 122 include a rotatable curved needle head.

Specifically, the needle heads of the first probe 121 and the second probe 122 may be set to be bent needle heads capable of rotating 360 °, the needle heads of the first probe 121 and the second probe 122 have radians, and when the bent needle heads are rotated, the distance between the two needle heads of the first probe 121 and the second probe 122 may be changed, so that signal points to be detected at different intervals can be detected. When the distance between the signal points to be measured is short, the distance between the two needle heads is reduced by rotating the bent needle heads, and then the point is measured; when the distance between the signal points to be measured is far, the bent needle head is rotated, and the point is measured after the distance between the two needle heads is increased. For example, the farthest distance between the needle heads of the first probe 121 and the second probe 122 is 7mm, and the closest distance between the needle heads of the first probe 121 and the second probe 122 is 1mm, the distance can be adjusted by rotating the needle heads, and the signal points to be tested with the distance satisfying the range of 1mm to 7mm are detected, so as to reach different measuring distances and satisfy the test of multiple signal points to be tested.

Specifically, when the signal to be tested is a differential signal, the distance between the first probe and the second probe is set to be 2-3mm. During differential signal transmission, signals are transmitted on two transmission lines, the amplitudes of the two signals are equal, the phases of the two signals are different by 180 degrees, and the polarities of the two signals are opposite. The differential signal transmits a level difference between two signals. The differential signal wiring needs coupling processing, two signal wires are required to be close to each other in design, and the wiring is not allowed to be separated, so that the distance between signal points to be tested of the differential signal is short, usually 2-3mm, when a test probe interface is arranged, the distance between a first probe and a second probe can be directly set to be 2-3mm, and the differential signal can be conveniently measured.

In some embodiments, fig. 4 is a schematic structural diagram of another multi-terminal test fixture provided in the embodiments of the present disclosure, and as shown in fig. 4, the multi-terminal test fixture further includes: the input end of the switch component 14 is respectively and electrically connected with the USB interface 11 and the test probe interface 12, and the output end of the switch component 14 is electrically connected with the output interface 13.

Specifically, the multi-terminal test fixture further includes a switch assembly 14, an input end of the switch assembly 14 is electrically connected to the USB interface 11 and the test probe interface 12, respectively, and an output end of the switch assembly 14 is electrically connected to the output interface 13, and when the USB interface 11 is used, the switch assembly 14 is controlled to connect the line of the USB interface 11 and the output interface 13, and disconnect the connection relationship between the test probe interface 12 and the output interface 13. When the test probe interface 12 is used, the control switch assembly 14 turns on the line of the test probe interface 12 and the output interface 13, and disconnects the connection relationship between the test probe USB interface 11 and the output interface 13. Only the route corresponding to the used interface is conducted, and the problem that the integrity of a transmission signal is lost due to the existence of branch wiring in the transmission process of the signal is avoided, so that the final test result is influenced is avoided.

In some embodiments, as shown in FIG. 4, the switch assembly 14 includes a removable resistor having an input electrically connected to the input of the switch assembly 14 and an output electrically connected to the output of the switch assembly 14.

In particular, the switch assembly 14 comprises a removable resistor, the output of which is electrically connected to the output of the switch assembly 14 for transmitting the signal to be tested to the output interface 13. The input end of the detachable resistor is electrically connected with the input end of the switch assembly 14, the detachable resistor is a 0 omega resistor, if a USB interface is selected, the input end of the detachable resistor is controlled to be electrically connected with the USB interface 11, and if a test probe interface 12 is selected, the input end of the detachable resistor is controlled to be electrically connected with the test probe interface 12. Because the detachable resistor is 0 omega, the signal transmission is not influenced, an unused interface can be disconnected, the connector can be conveniently used for many times, and the cost is low.

It should be noted that, other structures may also be disposed in the switch assembly to control the on/off of the signal transmission line, which is not limited in this disclosure, and the foregoing embodiments are only illustrated by way of example.

In some embodiments, fig. 5 is a schematic circuit diagram of a multi-terminal test fixture provided by an embodiment of the disclosure, as shown in fig. 5, the USB interface 11 is electrically connected to the output interface 13 through multiple sets of first signal lines 21, and the test probe interface 12 is electrically connected to the output interface 13 through multiple sets of second signal lines 22. Wherein the signal transmission rates of different groups of signal lines are different.

Specifically, the USB interface 11 is electrically connected to the output interface 13 via the first signal line group 21 to transmit the signal to be tested, and the test probe interface 12 is electrically connected to the output interface 13 via the second signal line group 22 to transmit the signal to be tested. The corresponding rates of the signals to be tested are different, so that the signal wires for transmission are different, and a plurality of groups of different signal wires are arranged for reducing the cost of replacing the test fixture. Exemplarily as in fig. 5, three sets of first signal lines 21 and three sets of second signal lines 22 are provided, respectively. The different signal lines USB interface 11 is connected to the switch module 14 through a plurality of sets of first signal lines 21, one set including two signal lines. The first group of signal lines are used for transmitting USB2.0 signals, the second group of signal lines are used for transmitting signals with the USB3.2 rate of 5Gbps, and the third group of signal lines are used for transmitting signals with the USB3.2 rate of 10 Gbps. When the USB2.0 signal is connected, only the transmission USB signal line works, and other signal lines are in a state to be connected; when the signal with the USB3.2 rate of 5Gbps is connected, only the signal line with the USB3.2 rate of 5Gbps is transmitted to work, and other signal lines are in a state to be connected; when the signal with the USB3.2 rate of 10Gbps is connected, only the signal line with the USB3.2 rate of 10Gbps is transmitted to work, and other signal lines are in a state of waiting to be connected. By dividing the first signal line and the second signal line and dividing the first signal line and the second signal line into a plurality of groups of signal lines with different rates, the signals are prevented from interfering with each other and being disordered in the transmission process.

In some embodiments, fig. 6 is a circuit diagram of another multi-terminal test fixture provided by the embodiment of the disclosure, and as shown in fig. 6, the USB interface 11 is electrically connected to the input terminal of the switch assembly 14 through a plurality of sets of first signal lines 21, and the test probe interface 12 is electrically connected to the input terminal of the switch assembly 14 through a plurality of sets of second signal lines 22. Wherein, the signal transmission rates of different groups of signal lines are different. And the signals between the switch assembly 14 and the output interface 13 only need to be connected through the first signal line 21 or the second signal line 22, so that the length of the signal line is saved. The switch component 14 selects whether the output interface 13 is electrically connected with the USB interface 11 or the output interface 13 is electrically connected with the test probe interface 12.

In some embodiments, the USB interface is a USB3.2TYPE-A interface.

Specifically, the USB interface is the USB3.2TYPE-A interface, can be compatible USB2.0 signal, USB3.2 Gbps's signal and USB3.2 Gbps's signal, and the signal of different transmission rates can all be measured, need not to change test fixture, and the integrated level is higher. USB TYPE-A may also be referred to as USB-A. The TYPE-A interface is applied to various electronic equipment terminals such as computers, mobile phone chargers, projectors and the like, and is a USB interface with higher popularity and utilization rate at present. The USB interface is set to be a USB3.2TYPE-A interface, the number of times for replacing the test fixture can be reduced, the cost is saved, meanwhile, the requirements of various TYPEs of equipment to be tested can be met, and the application range is wider.

In some embodiments, the output interface is an SMA interface.

Specifically, the output interface is an SMA (Sub-Miniature-a) antenna interface, the test fixture is connected with the test equipment through an SMA cable, and the signal is output to the test equipment end for testing. A plurality of SMA interfaces integrated with different signal transmission rates are arranged, for example, at least 2 pairs of SMA interfaces integrated with USB3.2 Gbps or 10Gbps signals and USB2.0 signals are designed, and the selectivity of the interfaces in testing is improved. The SMA has high use frequency, small size, stable connection, wide application range and convenient installation, and can be applied to amplifiers, attenuators, filters, mixers, crystal oscillators, switches and the like, thereby improving the usability of the test fixture.

In some embodiments, fig. 7 is a schematic structural diagram of a PCB provided in an embodiment of the present disclosure, and as shown in fig. 7, the multi-terminal test fixture further includes: the PCB 15, the USB interface 11, the test probe interface 12 and the output interface 13 are all disposed on the PCB 15. Set up a plurality of interfaces on PCB board 15, the integrated effect of multiterminal test fixture is more excellent, and overall structure reduces, and portable is no matter when what scene uses, and all comparison is convenient, improves the rate of utilization.

It is noted that, in this document, relational terms such as "first" and "second," and the like, are used solely to distinguish one entity or action from another entity or action without necessarily requiring or implying any actual such relationship or order between such entities or actions. Also, the terms "comprises," "comprising," or any other variation thereof, are intended to cover a non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements does not include only those elements but may include other elements not expressly listed or inherent to such process, method, article, or apparatus. Without further limitation, an element defined by the phrases "comprising one of 8230; \8230;" 8230; "does not exclude the presence of additional like elements in a process, method, article, or apparatus that comprises the element.

The foregoing are merely exemplary embodiments of the present disclosure, which enable those skilled in the art to understand or practice the present disclosure. Various modifications to these embodiments will be readily apparent to those skilled in the art, and the generic principles defined herein may be applied to other embodiments without departing from the spirit or scope of the disclosure. Thus, the present disclosure is not intended to be limited to the embodiments shown herein but is to be accorded the widest scope consistent with the principles and novel features disclosed herein.

Claims

1. A multi-end test fixture, comprising:

the test probe interface comprises a first probe and a second probe;

2. The multi-ended test fixture of claim 1, wherein said test probe interface further comprises a needle cap;

3. The multi-ended test fixture of claim 2, wherein the first probe and the second probe comprise rotatable bent tips.

4. The multi-ended test fixture of claim 2, wherein a distance between the first probe and the second probe is 2-3mm.

5. The multi-ended test fixture of claim 1, further comprising: a switch assembly;

6. The multi-terminal test fixture of claim 5, wherein the switch assembly comprises a removable resistor;

the input end of the detachable resistor is electrically connected with the input end of the switch assembly; and the output end of the detachable resistor is electrically connected with the output end of the switch component.

7. The multi-terminal test fixture of claim 1, wherein the USB interface is electrically connected to the output interface via a plurality of sets of first signal lines; the test probe interface is electrically connected with the output interface through a plurality of groups of second signal wires;

wherein, the signal transmission rates of different groups of signal lines are different.

8. The multi-terminal test fixture of claim 1, wherein the USB interface is a USB3.2TYPE-a interface.

9. The multi-ended test fixture of claim 1, wherein the output interface is an SMA interface.

10. The multi-ended test fixture of claim 1, further comprising: a PCB board; the USB interface, the test probe interface and the output interface are all arranged on the PCB.