CN217879539U - Silicon carbide switch device testing device - Google Patents
Silicon carbide switch device testing device Download PDFInfo
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- CN217879539U CN217879539U CN202221669082.5U CN202221669082U CN217879539U CN 217879539 U CN217879539 U CN 217879539U CN 202221669082 U CN202221669082 U CN 202221669082U CN 217879539 U CN217879539 U CN 217879539U
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- copper bar
- silicon carbide
- connecting copper
- pressing plate
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Abstract
The application relates to a silicon carbide switch device testing device, which comprises a connecting copper bar and a pressure bar; one end of the connecting copper bar is electrically connected with a terminal of the testing capacitor, the other end of the connecting copper bar is fixedly connected to the middle part of the pressure lever, and one end of the connecting copper bar is a crimping end to be crimped and electrically connected with a terminal of the silicon carbide switch device; the contained angle of connecting between copper bar place plane and the depression bar place straight line is in setting for the angle within range, and the distance value of connecting the copper bar apart from the terminal of carborundum switching device is in presetting apart from the within range, and this application has the effect that makes the miscellaneous sense in the test circuit reach minimum and satisfy the test requirement of carborundum switching device.
Description
Technical Field
The application relates to the field of testing of silicon carbide switching devices, in particular to a silicon carbide switching device testing device.
Background
The silicon carbide switching device is a wide bandgap technology, and compared with a classical silicon switching device, the silicon carbide switching device has the characteristics of low on-state resistance and high thermal conductivity, and the characteristics are beneficial to improving the energy efficiency and the working temperature of a final application circuit. Therefore, the development technology of the silicon carbide switching device is gradually developed, and in the process of designing the silicon carbide switching device, a designed product needs to be tested, so that a test platform specially aiming at the silicon carbide switching device is used.
For a silicon carbide switch device test platform, the main loop impurity sense of the test platform is an important index for measuring the performance of the test platform. The rising speed and the falling speed of the current in the switching characteristic of the silicon carbide switching device are both fast, so that the main loop impurity sense of the test platform is required to be small enough, and the silicon carbide switching device can be accurately tested in a full-range during testing. With the increasing requirement of testing efficiency, testers need more automatic testing platforms, so that an automatic mechanical structure for placing silicon carbide switching devices is added on the basis of the original manually operated testing platform. An additional automatic mechanical structure is connected in series in the main loop, so that the sense of complexity of the main loop is increased, and the test performance of the automatic test platform is linearly reduced.
At present, the main loop impurity of the test platform with an automatic structure is generally 40nH and is far lower than the test condition requirement of the silicon carbide switch device, so that the automatic test platform with the main loop impurity meeting the test requirement of the silicon carbide switch device is needed.
SUMMERY OF THE UTILITY MODEL
In order to automatically test a silicon carbide switch device under the condition of meeting the test requirement of the silicon carbide switch device, the application provides a silicon carbide switch device testing device.
The application provides a carborundum switching element testing arrangement adopts following technical scheme:
a testing device for a silicon carbide switch device comprises a connecting copper bar and a pressure bar;
one end of the connecting copper bar is electrically connected with a terminal of the testing capacitor, the other end of the connecting copper bar is fixedly connected to the middle part of the pressure lever, and one end of the connecting copper bar is a crimping end to be crimped and electrically connected with the terminal of the silicon carbide switch device;
the included angle between the plane where the connecting copper bar is located and the straight line where the pressing rod is located is within a set angle range, and the distance value between the connecting copper bar and the terminal of the silicon carbide switch device is within a preset distance range.
By adopting the technical scheme, the connecting copper bar is connected in the middle of the pressure bar, on the basis, the gesture and the position between the connecting copper bar and the pressure bar can influence the sense of impurities in the test loop, and the sense of impurities in the test loop is minimized by adjusting the gesture relation between the connecting copper bar and the pressure bar to the set angle range and adjusting the position relation between the connecting copper bar and the pressure bar to the preset distance range, so that the test requirement of the silicon carbide switch device is met.
Preferably, the part of the connecting copper bar fixedly connected with the compression bar surrounds the compression bar.
Through adopting above-mentioned technical scheme, connect the copper bar and surround the depression bar, can let the electric charge of gathering at the connection position between connecting copper bar and the depression bar obtain the dispersion, do benefit to and reduce the miscellaneous sense.
Preferably, the crimp terminal is provided with a pressing tip for pressing a terminal of the silicon carbide switching device.
Through adopting above-mentioned technical scheme, compress tightly the terminal that the pointed end can exert higher pressure to carborundum switching device, the crimping effect is better.
Preferably, the pressing rods are provided with a plurality of pressing rods, are connected to the same connecting copper bar and are electrically connected in parallel.
By adopting the technical scheme, the terminal of the silicon carbide switch device can be more tightly pressed after the plurality of compression bars are connected in parallel, and the additional sense of impurities brought by the compression bars arranged in the device can be reduced.
Preferably, a plurality of the pressing rods are arranged in parallel with each other.
Through adopting above-mentioned technical scheme, the mutual parallel arrangement of depression bar can exert even pressure to the terminal of carborundum switching device under the same condition of depression bar length, lets the structure of depression bar end and carborundum switching device's terminal contact simultaneously keep unanimous to it is more even to let the miscellaneous sense of the distribution of a plurality of depression bars, is favorable to improving the parallelly connected effect that reduces miscellaneous sense of depression bar.
Preferably, the pressing rod is matched with a first insulating pressing plate in an inserted manner, a first via hole is formed in the first insulating pressing plate, the pressing rod is connected in the first via hole in an interference manner, the first insulating pressing plate is arranged on the pressing rod and located between the connecting copper bar and the crimping end, and the connecting copper bar is crimped on the first insulating pressing plate.
Through adopting above-mentioned technical scheme, first insulation clamp plate can be at fixed depression bar and be connected the relative position between the copper bar, and first insulation clamp plate adopts the metal sheet can also alleviate the depression bar and be connected the most advanced electric charge gathering degree on the copper bar, does benefit to and reduces the miscellaneous sense.
Preferably, the first insulation pressing plate is provided with a first accommodating groove for accommodating the connecting copper bar.
Through adopting above-mentioned technical scheme, first holding tank holds can surround two at least sides of connecting the copper bar behind the connecting copper bar, can the relative gesture between fixed connection copper bar and the depression bar, does benefit to the fixed connection between connecting copper bar and the depression bar.
Preferably, the first insulating pressing plate is matched with a second insulating pressing plate, a second through hole is formed in the second insulating pressing plate, one end, far away from the crimping end, of the pressing rod is inserted into the second through hole, and the second insulating pressing plate and the first insulating pressing plate clamp the connecting copper bar in the middle or tightly.
Through adopting above-mentioned technical scheme, can press from both sides tight connection copper bar on the depression bar after first insulating clamp plate and the cooperation of second insulating clamp plate, can also surround the connection copper bar simultaneously, do benefit to the position of fixed connection copper bar on the depression bar.
Preferably, the second insulation pressing plate is provided with a second accommodating groove for accommodating the connecting copper bar.
Through adopting above-mentioned technical scheme, the second holding tank holds can surround two at least sides of connecting the copper bar behind the connecting copper bar, does benefit to the relative gesture between fixed connection copper bar and the depression bar.
Preferably, the connecting copper bar is provided with a plurality of first accommodating grooves and a plurality of second accommodating grooves which are arranged in a staggered manner.
Through adopting above-mentioned technical scheme, the different terminals of test electric capacity can be connected to a plurality of connection copper bars, can also let a set of device test a plurality of carborundum switching elements.
In summary, the present application at least includes the following beneficial technical effects: the connecting copper bar and the pressure bar which accord with the set posture relation and the preset position relation are used, so that the sense of impurities of the test loop is reduced, and the test requirement of the silicon carbide switch device is met. The first insulating pressing plate with the first accommodating groove and the second insulating pressing plate with the second accommodating groove are utilized, gesture and position forming between the connecting copper bar and the pressing bar are facilitated, meanwhile, the reduction of miscellaneous feelings in a test loop is facilitated, and therefore the test result of the silicon carbide switch device is more accurate.
Drawings
Fig. 1 is a schematic view of the overall structure of a silicon carbide switching device testing apparatus;
FIG. 2 is an enlarged schematic view showing the connecting copper bar, the pressing bar and the first insulating pressing plate;
fig. 3 is an enlarged schematic view of a portion a in fig. 1.
Reference numerals: 10. testing the capacitance; 11. a first electrode; 12. a second electrode; 20. an automated jig; 30. connecting the copper bars; 40. a pressure lever; 41. crimping ends; 50. a first insulating platen; 51. a first via hole; 52. a first accommodating groove; 60. a second insulating pressing plate; 61. a second via hole; 62. and a second accommodating groove.
Detailed Description
The present application is described in further detail below with reference to figures 1-3.
In the prior art, the test loop of the silicon carbide switching device includes a test capacitor 10, an automated clamp 20 and the silicon carbide switching device to be tested, and the automated clamp 20 includes a first portion, a second portion, the test capacitor 10, the automated clamp 20 and the silicon carbide switching device to be tested. The traditional manual test loop consists of a test capacitor 10 and a silicon carbide switch device to be tested, the existing automatic test loop consists of the test capacitor 10, a first part, the silicon carbide switch device to be tested and a second part, and compared with the manual test loop, the first part and the second part bring more miscellaneous feelings to the test loop.
The embodiment of the application discloses carborundum switching element testing arrangement can reduce more miscellaneous feelings that automatic anchor clamps 20 brought for the test loop. Referring to fig. 1 and 2, a testing apparatus for a silicon carbide switching device includes a connecting copper bar 30, a plurality of pressing bars 40, a first insulating pressing plate 50, and a second insulating pressing plate 60. The test capacitor 10 has two flaky and staggered electrodes as a first electrode 11 and a second electrode 12, the two electrodes are arranged in parallel, and the connecting copper bar 30 is pressed tightly on the electrodes by bolts. Connect copper bar 30 and electrode and be equipped with the hole that link up, the bolt passes hole and fixed connection copper bar 30 and electrode to and the realization is connected the electricity between copper bar 30 and the electrode and is connected. In other embodiments, the connecting copper bar 30 can be welded on the electrode to realize fixing and electrical connection.
The pressing rod 40 is welded at one end, far away from the electrode, of the connecting copper bar 30, the connecting copper bar 30 is located in the middle of the pressing rod 40, soldering can be adopted for welding, and the pressing rod 40 is surrounded by the welding position of the connecting copper bar 30 and the pressing rod 40. The end of the connecting copper bar 30 used for compressing the terminal of the silicon carbide switch device is a crimping end 41, the crimping end 41 is provided with a crimping tip, and the crimping tip can be directly formed on the crimping end 41 or an assembly body detachably connected or fixedly connected to the crimping end 41. The crimping tip is used for pressing a terminal of the silicon carbide switch device, the pressing tip can be a cone with a tapered end part, and can also be a tip body or a tubular body with a plurality of sawtooth tips, and the pressing tip has higher pressure after pressing the terminal of the silicon carbide switch device, so that the crimping is more tight.
Through simulation and actual measurement, a plurality of compression bars 40 are arranged in parallel and are electrically connected to the same connecting copper bar 30 in parallel, the compression effect of the compression bars 40 on the terminal of the silicon carbide switch device can be improved, the sense of mixture can also be reduced, and in the case of actual measurement, the test loop formed by connecting the plurality of compression bars 40 in parallel is 2nH lower than that of a single compression bar 40. The distances between the connecting copper bar 30 and the crimping end 41 are different, and the sense of impurities in the test loop is different. The farther the connecting copper bar 30 is from the crimp end 41, the greater the level of clutter in the test circuit in which it is located. In the actually measured case, the distance between the connecting copper bar 30 and the crimping end 41 is increased by 14mm, and then the noise in the test loop is increased by 8nH. The distance between the connecting copper bar 30 and the crimping end 41 can be 0-14mm or larger. Through simulation and actual measurement, the postures of the connecting copper bar 30 and the crimping end 41 are different, and the sense of impurities in the test loop is also different. The closer the posture between the connecting copper bar 30 and the crimping end 41 is to the vertical, the less the noise in the test circuit in which it is located. The closer the two electrodes of the two connecting copper bars 30 or the test capacitor are, the less the stray inductance in the test loop.
As shown in fig. 2 and 3, the first insulating pressing plate 50 and the second insulating pressing plate 60 are disposed in a mutually-matched manner, a plurality of first via holes 51 for the pressing rods 40 to pass through are formed in the first insulating pressing plate 50, the pressing rods 40 are connected in the first via holes 51 in an interference manner, second via holes 61 for the pressing rods 40 to pass through are formed in the second insulating pressing plate 60, the positions of the first via holes 51 and the second via holes 61 correspond, and the same pressing rod 40 passes through the first via holes 51 and the second via holes 61 corresponding to each other. The second insulating pressing plate 60 is fixedly connected to the automated clamp 20 by gluing, heat-melting welding or bolts, and the first insulating pressing plate 50 may also be fixedly connected to the second insulating pressing plate 60 by gluing, heat-melting welding or bolts.
The process of assembling the first insulating pressing plate 50 and the second insulating pressing plate 60 is as follows: the end of the pressure bar 40 far away from the pressure connection end 41 passes through the first through hole 51, so that the pressure bar 40 is connected to the first insulating pressure plate 50 in an interference manner, a hole for the pressure bar 40 to pass through is formed in the connecting copper bar 30, and the end of the connecting copper bar 30 far away from the pressure connection end 41 from the pressure bar 40 passes through the pressure bar 40. The first insulation pressing plate 50 is provided with a first accommodating groove 52 for accommodating the connecting copper bar 30, an opening of the first accommodating groove 52 deviates from the crimping end 41, the connecting copper bar 30 is pressed in the first accommodating groove 52, and one side of the connecting copper bar 30, which is far away from the first insulation pressing plate 50, is welded with the connecting copper bar 30 and the pressing rod 40 through tin soldering. The pressing bar 40 connected to the first electrode 11 passes through the first receiving groove 52, while the pressing bar 40 connected to the second electrode 12 does not pass through the first receiving groove 52, and the connecting copper bar 30 connected to the pressing bar 40 which does not pass through the first receiving groove 52 is attached to the surface of the first insulating pressing plate 50. The second insulating pressing plate 60 is inserted on the pressing rod 40 from the end of the pressing rod 40 far away from the pressing end 41 and tightly presses the connecting copper bar 30, a second accommodating groove 62 is formed in the second insulating pressing plate 60, and the position of the second accommodating groove 62 corresponds to the connecting copper bar 30 connected with the second electrode 12 and accommodates the connecting copper bar 30. There are a plurality of connecting copper bars 30 on automated jig 20, and simultaneously, the position between first holding tank 52 and the second holding tank 62 can be corresponding or the dislocation, and second holding tank 62 also can be located first holding tank 52 and will connect copper bar 30 and surround, or first holding tank 52 also can be located second holding tank 62 and will connect copper bar 30 and surround. Finally, the relative position between the first insulating pressing plate 50 and the second insulating pressing plate 60 is fixed.
The application principle of the testing device for the silicon carbide switch device in the embodiment of the application is as follows: the compression bars 40 are connected in parallel and are arranged in parallel, so that the mixed sense distribution on the compression bars 40 is more uniform, and the total mixed sense of the test loop is favorably reduced. The connecting copper bar 30 surrounds the pressing rod 40, the welding path also surrounds the pressing rod 40, the electric charges gathered at the connecting part between the connecting copper bar 30 and the pressing rod 40 can be dispersed, the electric charge gathering degree of the tip of the connecting point between the pressing rod 40 and the connecting copper bar 30 is relieved, and the total sense of impurities of the test loop is favorably reduced. The connecting copper bar 30 and the pressure lever 40 which accord with the set posture relation and the preset position relation are used, so that the impurity sense of the test loop is reduced, and the test requirement of the silicon carbide switch device is met. First insulating pressing plate 50 and second insulating pressing plate 60 will be connected the copper bar 30 and compress tightly the back, not only do benefit to and keep connecting the gesture relation and the position relation between copper bar 30 and the depression bar 40, can also improve the effect of alleviating the depression bar 40 and connecting the most advanced electric charge gathering degree on the copper bar 30 to make carborundum switching device's test result more accurate.
The above embodiments are preferred embodiments of the present application, and the protection scope of the present application is not limited by the above embodiments, so: all equivalent changes made according to the structure, shape and principle of the present application shall be covered by the protection scope of the present application.
Claims (10)
1. The utility model provides a carborundum switching device testing arrangement which characterized in that: comprises a connecting copper bar (30) and a pressure bar (40);
one end of the connecting copper bar (30) is electrically connected with a terminal of the testing capacitor (10), the other end of the connecting copper bar (30) is fixedly connected to the middle part of the pressure lever (40), and one end of the connecting copper bar (30) is a crimping end (41) for crimping and electrically connecting the terminal of the silicon carbide switch device;
the included angle between the plane where the connecting copper bar (30) is located and the straight line where the pressing bar (40) is located is within a set angle range, and the distance value between the connecting copper bar (30) and the terminal of the silicon carbide switch device is within a preset distance range.
2. A silicon carbide switching device testing apparatus according to claim 1, wherein: the part of the connecting copper bar (30) fixedly connected with the pressure lever (40) surrounds the pressure lever (40).
3. A silicon carbide switching device testing apparatus according to claim 1, wherein: the crimp terminal (41) is provided with a pressing tip for pressing a terminal of a silicon carbide switching device.
4. A silicon carbide switching device testing apparatus according to claim 1, wherein: the pressing rods (40) are arranged in a plurality, connected to the same connecting copper bar (30) and electrically connected in parallel.
5. The silicon carbide switching device testing apparatus of claim 4, wherein: the plurality of pressing rods (40) are arranged in parallel.
6. A silicon carbide switching device testing apparatus according to claim 1, wherein: the utility model discloses a copper bar pressing device, including depression bar (40), first insulating pressing plate (50) have been gone up to the grafting cooperation, first via hole (51) have been seted up on first insulating pressing plate (50), depression bar (40) interference connection is in first via hole (51), first insulating pressing plate (50) are in lie in on depression bar (40) connect copper bar (30) with position between crimping end (41), connect copper bar (30) crimping and be in on first insulating pressing plate (50).
7. The silicon carbide switching device testing apparatus of claim 6, wherein: and a first accommodating groove (52) for accommodating the connecting copper bar (30) is formed in the first insulating pressing plate (50).
8. A silicon carbide switching device testing apparatus according to claim 7, wherein: the first insulation pressing plate (50) is matched with a second insulation pressing plate (60), a second through hole (61) is formed in the second insulation pressing plate (60), one end, far away from the crimping end (41), of the pressing rod (40) is inserted into the second through hole (61), and the second insulation pressing plate (60) and the first insulation pressing plate (50) clamp the connecting copper bar (30) in the middle or clamp the connecting copper bar.
9. A silicon carbide switching device testing apparatus according to claim 8, wherein: and a second accommodating groove (62) for accommodating the connecting copper bar (30) is formed in the second insulating pressing plate (60).
10. A silicon carbide switching device testing apparatus according to claim 9, wherein: the connecting copper bar (30) is provided with a plurality of first accommodating grooves (52) and a plurality of second accommodating grooves (62) which are arranged in a staggered mode.
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN2021233386361 | 2021-12-27 | ||
| CN202123338636 | 2021-12-27 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN217879539U true CN217879539U (en) | 2022-11-22 |
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Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202221669082.5U Active CN217879539U (en) | 2021-12-27 | 2022-06-30 | Silicon carbide switch device testing device |
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|---|---|
| CN (1) | CN217879539U (en) |
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2022
- 2022-06-30 CN CN202221669082.5U patent/CN217879539U/en active Active
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