CN217846422U - Probe station and electronic component detection equipment - Google Patents

Probe station and electronic component detection equipment Download PDF

Info

Publication number
CN217846422U
CN217846422U CN202221779060.4U CN202221779060U CN217846422U CN 217846422 U CN217846422 U CN 217846422U CN 202221779060 U CN202221779060 U CN 202221779060U CN 217846422 U CN217846422 U CN 217846422U
Authority
CN
China
Prior art keywords
bearing
probe station
bearing platform
platform
supporting
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
CN202221779060.4U
Other languages
Chinese (zh)
Inventor
陈夏薇
徐开涛
姚建强
吴文龙
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hangzhou Changchuan Technology Co Ltd
Original Assignee
Hangzhou Changchuan Technology Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hangzhou Changchuan Technology Co Ltd filed Critical Hangzhou Changchuan Technology Co Ltd
Priority to CN202221779060.4U priority Critical patent/CN217846422U/en
Application granted granted Critical
Publication of CN217846422U publication Critical patent/CN217846422U/en
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Images

Landscapes

  • Measuring Leads Or Probes (AREA)

Abstract

The utility model provides a probe station and electronic component check out test set relates to detection device technical field. The probe station comprises a bearing part and a supporting part, wherein the bearing part is provided with a bearing surface for bearing the XY workbench, and the supporting part is positioned on one side of the bearing part, which deviates from the bearing surface, and is of an integrally formed structure with the bearing part. The utility model provides a probe platform has solved the technical problem that the probe platform precision that exists is low in the technique.

Description

Probe station and electronic component detection equipment
Technical Field
The utility model belongs to the technical field of the detection device technique and specifically relates to a probe platform and electronic component check out test set are related to.
Background
The probe station is an important electronic component testing apparatus, and is used for aligning the probes with contacts on the electronic component, so that circuits on the electronic component are conducted with a testing machine, and the electronic component is tested.
The conventional probe station comprises a machine frame, a movable platform, a probe clamping platform and an electronic component carrying platform, wherein the electronic component carrying platform is used for adsorbing an electronic component and is responsible for positioning the electronic component in the vertical direction, the probe clamping platform is used for fixing a probe card, the machine frame is used as a base of the whole machine and is used for supporting other parts and accommodating the electronic component, and the movable platform is responsible for positioning the electronic component in the horizontal direction. The moving platform of the probe station is erected on the machine frame, and the assembly precision has certain influence on the precision of the moving platform.
SUMMERY OF THE UTILITY MODEL
An object of the utility model is to provide a probe platform and electronic component check out test set to alleviate the technical problem that the probe platform precision that exists is low among the prior art.
In order to solve the technical problem, the utility model provides a technical scheme lies in:
in a first aspect, the utility model provides a probe station includes supporting part and supporting part, the supporting part has the loading end that is used for bearing the XY workstation, the supporting part is located the supporting part deviates from one side of loading end, and with the supporting part is the integrated into one piece structure.
Optionally, the support portion has an accommodation space; the probe station also comprises a drawing part, wherein the drawing part is provided with a cavity for accommodating an electric element and is movably connected with the supporting part, so that the drawing part can enter or extend out of the accommodating space.
Optionally, the bearing part includes a bearing platform, an upper surface of the bearing platform is the bearing surface, and the supporting part is connected with a lower surface of the bearing platform.
Optionally, a reinforcing component is arranged on one side of the bearing platform facing the supporting part.
Optionally, the reinforcing component comprises a longitudinal reinforcing rib and/or a transverse reinforcing rib, and the bearing platform is rectangular;
the longitudinal reinforcing ribs are arranged on the lower surface of the bearing platform and are arranged along the length direction of the bearing platform;
the transverse reinforcing ribs are arranged on the lower surface of the bearing platform and arranged along the width direction of the bearing platform.
Optionally, the reinforcing assembly further includes a reinforcing plate, the reinforcing plate is vertically installed on the lower surface of the bearing platform and provided with lightening holes, and a plane of the reinforcing plate is perpendicular to the length direction of the bearing platform.
Optionally, the supporting portion includes at least two supporting plates, and a plurality of the supporting plates are all mounted on the lower surface of the bearing platform.
Optionally, the number of the support plates is two, the two support plates are arranged in parallel and spaced apart from each other, and an accommodating space for accommodating the electrical component is formed between the two support plates.
Optionally, the probe station further comprises a plurality of adjusting plates, and each adjusting plate is adjustably mounted on one side of the supporting plate away from the bearing platform;
the plurality of adjusting plates are arranged at intervals along the length direction of the supporting plate.
In a second aspect, the present invention provides an electronic component testing apparatus comprising a probe station as described in any one of the above.
Synthesize above-mentioned technical scheme, the utility model discloses the technological effect analysis that can realize as follows:
the utility model provides a probe platform includes supporting part and supporting part, and the supporting part has the loading end that is used for bearing the XY workstation, and the supporting part is located one side that the supporting part deviates from the loading end to be the integrated into one piece structure with the supporting part. The bearing part and the supporting part are integrally formed, so that the assembly precision of the bearing part and the supporting part is improved, and the positioning precision of the XY workbench is prevented from being influenced by the dislocation between the bearing part and the supporting part.
Drawings
In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the drawings used in the embodiments or the prior art descriptions will be briefly described below, it is obvious that the drawings in the following descriptions are some embodiments of the present invention, and for those skilled in the art, other drawings can be obtained according to the drawings without creative efforts.
Fig. 1 is a schematic structural view of a probe station according to an embodiment of the present invention at a first viewing angle when a drawer is not installed;
fig. 2 is a schematic structural view of the probe station according to the embodiment of the present invention at a second viewing angle when the drawer is not installed;
fig. 3 is a schematic structural view of a probe station according to an embodiment of the present invention at a first viewing angle when a drawer is installed;
fig. 4 is a schematic structural view of the probe station according to the embodiment of the present invention at a second view angle when the drawer is installed.
Icon:
100-a load-bearing platform; 200-a support; 210-a support plate; 211-mounting holes; 300-a reinforcement component; 310-longitudinal reinforcing ribs; 320-transverse reinforcing ribs; 330-reinforcing plates; 331-lightening holes; 400-a drawer; 500-adjusting plate; 600-transfer wheel; 700-a pincard support; 710-a pincard platform; 711-a through hole; 720-side plate; a 900-XY stage; 910-a first guide rail; 920-a second guide rail; 930 — a first moving plate; 940-second moving plate.
Detailed Description
In order to make the objects, technical solutions and advantages of the embodiments of the present invention clearer, the embodiments of the present invention will be clearly and completely described below with reference to the accompanying drawings in the embodiments of the present invention, and it is obvious that the described embodiments are some, but not all, embodiments of the present invention. The components of the embodiments of the present invention generally described and illustrated in the figures herein may be arranged and designed in a wide variety of different configurations.
Thus, the following detailed description of the embodiments of the present invention, presented in the accompanying drawings, is not intended to limit the scope of the invention, as claimed, but is merely representative of selected embodiments of the invention. Based on the embodiments in the present invention, all other embodiments obtained by a person skilled in the art without creative efforts belong to the protection scope of the present invention.
It should be noted that: like reference numbers and letters refer to like items in the following figures, and thus, once an item is defined in one figure, it need not be further defined and explained in subsequent figures.
In the description of the present invention, it should be noted that the terms "center", "upper", "lower", "left", "right", "vertical", "horizontal", "inner", "outer", and the like indicate the position or positional relationship based on the position or positional relationship shown in the drawings, or the position or positional relationship which is usually placed when the product of the present invention is used, and are only for convenience of description and simplification of the description, but do not indicate or imply that the device or element referred to must have a specific position, be constructed and operated in a specific orientation, and thus, should not be construed as limiting the present invention. Furthermore, the terms "first," "second," "third," and the like are used solely to distinguish one from another and are not to be construed as indicating or implying relative importance.
Furthermore, the terms "horizontal", "vertical", "suspended" and the like do not imply that the components are absolutely horizontal or suspended, but may be slightly inclined. For example, "horizontal" merely means that the direction is more horizontal than "vertical" and does not mean that the structure must be perfectly horizontal, but may be slightly inclined.
In the description of the present invention, it should also be noted that, unless otherwise explicitly specified or limited, the terms "disposed," "mounted," "connected," and "connected" are to be construed broadly, e.g., as meaning either a fixed connection, a removable connection, or an integral connection; can be mechanically or electrically connected; they may be connected directly or indirectly through intervening media, or they may be interconnected between two elements. The specific meaning of the above terms in the present invention can be understood in specific cases to those skilled in the art.
Some embodiments of the present invention will be described in detail below with reference to the accompanying drawings. The embodiments described below and the features of the embodiments can be combined with each other without conflict.
Example one
The embodiment of the utility model provides a probe platform includes supporting part and supporting part 200, and the supporting part has the loading end that is used for bearing XY workstation 900, and supporting part 200 is located one side that the supporting part deviates from the loading end to be the integrated into one piece structure with the supporting part. The bearing part and the supporting part 200 are integrally formed, so that the assembly precision of the bearing part and the supporting part 200 is improved, and the positioning precision of the XY-stage 900 is prevented from being influenced by the dislocation between the bearing part and the supporting part 200.
The structure and shape of the probe station are explained in detail as follows:
in one embodiment, the supporting part includes a bearing frame, an upper surface of the bearing frame is a bearing surface, and the supporting part 200 is connected to a lower surface of the bearing frame.
Specifically, the bearing frame comprises a plurality of bearing beams which are arranged at intervals in parallel along the X direction or the Y direction. The bearing frame comprises a plurality of bearing beams, so that the weight of the bearing frame is reduced, and the weight of the bearing part is further reduced.
As another embodiment, the supporting portion includes a supporting platform 100, an upper surface of the supporting platform 100 is a supporting surface, and the supporting portion 200 is connected to a lower surface of the supporting platform 100.
Specifically, referring to fig. 1, the supporting platform 100 is configured as a flat plate, and the length direction is along the X direction. Further, the load-bearing platform 100 and the support portion 200 are cast as a unitary structure.
The bearing platform 100 is configured to be a flat plate, which ensures the flatness of the bearing surface and has a better supporting function for the XY table 900.
The side of the loading platform 100 facing the supporting portion 200 is provided with a reinforcing member 300.
Specifically, the reinforcing element 300 is disposed on the lower surface of the supporting platform 100, and is integrally formed with the supporting platform 100.
The stiffening assembly 300 enhances the stability of the load-bearing platform 100.
As an embodiment, the reinforcing member 300 includes a tilted rib, one end of the tilted rib is connected to the lower surface of the supporting platform 100, and the other end of the tilted rib is connected to the supporting portion 200 and forms an included angle with the supporting platform 100.
As another embodiment, the reinforcing assembly 300 includes longitudinal reinforcing ribs 310 and/or transverse reinforcing ribs 320, and the loading platform 100 has a rectangular shape; the longitudinal reinforcing rib 310 is arranged on the lower surface of the bearing platform 100 and arranged along the length direction of the bearing platform 100; the transverse reinforcing rib 320 is disposed on the lower surface of the loading platform 100 and is disposed along the width direction of the loading platform 100.
Specifically, the reinforcement assembly 300 includes longitudinal reinforcing ribs 310; alternatively, the reinforcement assembly 300 includes transverse stiffeners 320; alternatively, the reinforcing assembly 300 includes longitudinal reinforcing beads 310 and transverse reinforcing beads 320; in this embodiment, referring to fig. 2, the reinforcing member 300 includes a longitudinal reinforcing rib 310 and a transverse reinforcing rib 320, and the loading platform 100 is rectangular.
Specifically, only a plurality of longitudinal reinforcing ribs 310 are provided, and the plurality of longitudinal reinforcing ribs 310 are arranged in parallel at intervals along the width direction of the loading platform 100 and extend along the length direction of the loading platform 100; or, only a plurality of transverse reinforcing ribs 320 are provided, and the plurality of transverse reinforcing ribs 320 are arranged in parallel along the length direction of the bearing platform 100 at intervals and all extend along the width direction of the bearing platform 100; alternatively, a plurality of longitudinal beads 310 and transverse beads 320 may be provided. In this embodiment, a plurality of longitudinal reinforcing ribs 310 and a plurality of transverse reinforcing ribs 320 are provided, the plurality of transverse reinforcing ribs 320 are arranged in parallel and at intervals along the length direction of the loading platform 100, and the length of each transverse reinforcing rib 320 is approximately equal to the width of the loading platform 100. Every two adjacent horizontal strengthening ribs 320 are provided with a vertical strengthening rib 310, every vertical strengthening rib 310 is connected with the horizontal strengthening ribs 320 at two ends in an integrated forming mode, and the plurality of vertical strengthening ribs 310 are positioned on the same straight line and positioned in the middle of the bearing platform 100 in the width direction.
The reinforcing assembly 300 includes longitudinal reinforcing ribs 310 and transverse reinforcing ribs 320, which reinforce the length direction and the width direction of the load-bearing platform 100, and enhance the stability of the load-bearing platform 100.
It is within the scope of the present invention to provide the carrying platform 100 with other shapes, such as a square, etc., and to provide the reinforcing component 300 with other forms, such as a diagonal rib, etc., and the combination of these two forms can also play a role of reinforcing the carrying platform 100.
The reinforcement assembly 300 further includes a reinforcement plate 330, the reinforcement plate 330 is vertically installed on the lower surface of the load-bearing platform 100, and is provided with lightening holes 331, and a plane of the reinforcement plate 330 is perpendicular to the length direction of the load-bearing platform 100.
Specifically, the reinforcing plate 330 is rectangular, and the length direction is along the width direction of the loading platform 100 and the height is approximately equal to the height of the supporting plate 210. The lightening holes 331 are formed in a rectangular shape and penetrate the reinforcing plate 330 in the thickness direction of the reinforcing plate 330. In this embodiment, the reinforcing plate 330 is installed in the middle of the lower surface of the bearing platform 100, so as to prevent uneven stress on the left and right sides of the bearing platform 100.
The reinforcing plate 330 is installed on the lower surface of the load-bearing platform 100, so that the stability of the load-bearing platform 100 is further enhanced; the reinforcing plate 330 is provided with lightening holes 331, so that the weight of the reinforcing plate 330 is reduced, and the weight of the load-bearing platform 100 is further reduced.
The supporting portion 200 includes at least two supporting plates 210, and the supporting plates 210 are all mounted on the lower surface of the loading platform 100.
Specifically, the support plates 210 are arranged in a rectangular shape, and the number thereof is two; the two supporting plates 210 are disposed in parallel and spaced from each other, and are respectively connected to the edges of the two long sides of the supporting platform 100, and cooperate with the supporting platform 100 to form a receiving space for receiving an electrical component.
The two supporting plates 210 are both mounted on the lower surface of the bearing platform 100, so as to support the bearing platform 100.
In the alternative of the embodiment of the present invention, the probe station further includes a drawer 400, the drawer 400 has a cavity for accommodating the electrical component, and the drawer 400 is movably connected to the supporting portion 200, so that the drawer 400 can enter or extend out of the accommodating space.
Specifically, referring to fig. 3 and 4, two supporting plates 210 are disposed in parallel at intervals along the width direction of the supporting platform 100, and cooperate with the supporting platform 100 to form a receiving cavity; the two reinforcing plates 330 are arranged, the two reinforcing plates 330 are arranged in parallel along the length direction of the bearing platform 100 at intervals, and the containing cavity is divided into three chambers; a first chamber is arranged between the two reinforcing plates 330, and the other two chambers are respectively a second chamber and a third chamber; the two drawing pieces 400 are respectively inserted into the second cavity and the third cavity, and the two drawing pieces 400 are both connected with the supporting plate 210 in a sliding manner, so that the two drawing pieces 400 can correspondingly extend out of or retract into the open ends of the second cavity or the third cavity.
The drawer 400 has a cavity for accommodating the electrical component, so as to receive the electrical component; the drawer 400 is movably installed in the accommodating space, so that the electric elements can be conveniently stored or taken.
The probe station further comprises a plurality of adjusting plates 500, and the plurality of adjusting plates 500 can be adjustably mounted on one side of the supporting plate 210 away from the carrying platform 100; a plurality of adjustment plates 500 are provided at intervals along the length direction of the support plate 210.
Adjusting plate 500 is connected with supporting plate 210 through the bolt, specifically, the position that supporting plate 210 is close to the lower limb is provided with mounting hole 211, and the nut of bolt and adjusting plate 500's upper surface fixed connection, screw rod and first nut threaded connection back follow the lower limb of supporting plate 210 and pass the diapire of mounting hole 211 to stretch into in the mounting hole 211, again with second nut threaded connection. The adjustment of the distance between the supporting plate 210 and the adjusting plate 500 is achieved by adjusting the position where the first nut and the screw are engaged. Further, the adjusting plate 500 is configured to be square, and of course, other shapes of the adjusting plate 500, such as rectangle or circle, should be within the scope of the embodiments of the present invention.
The distance between the adjusting plate 500 and the supporting plate 210 is adjusted by bolts, first nuts and second nuts, so that the adjusting plate 500 is adjustably mounted on the supporting plate 210; the supporting plate 210 is provided with a mounting hole 211, so that the second nut is convenient to mount and adjust, and the weight of the supporting plate 210 is reduced; when all can adjust the formula and install in the backup pad 210 for a plurality of regulating plates 500, through the regulation to a plurality of regulating plates 500, can realize the regulation to the levelness of backup pad 210, and then realize the regulation to the levelness of load-bearing platform 100.
In the alternative of the embodiment of the present invention, the probe station further includes a plurality of transfer wheels 600, and the plurality of transfer wheels 600 are all installed on one side of the supporting plate 210 away from the bearing platform 100; a plurality of transfer wheels 600 are provided at intervals along the length direction of the support plate 210.
Specifically, referring to fig. 2, the transfer wheel 600 includes a universal wheel, and one transfer wheel 600 is installed between two adjacent adjusting plates 500. When the distances between the plurality of adjustment plates 500 and the support plate 210 are all adjusted to be minimum, the transfer wheel 600 may contact the ground, thereby facilitating the transfer of the probe station.
The probe station further includes an XY table 900, and the XY table 900 is mounted on the carrying surface of the carrying platform 100.
Specifically, the XY table 900 includes a first guide rail 910, a second guide rail 920, a first moving plate 930, and a second moving plate 940, the first guide rail 910 is mounted on the bearing surface, the first guide rail 910 is disposed along the X direction, the first moving plate 930 is provided with a first slider, and the first slider is in sliding fit with the first guide rail 910; the second guide rail 920 is mounted on the upper surface of the first moving plate 930, the second guide rail 920 is disposed along the Y direction, and the second moving plate 940 is provided with a second slider slidably engaged with the second guide rail 920.
The first guide rail 910 is mounted on the bearing surface, the first guide rail 910 is arranged along the X direction, and the first slider of the first moving plate 930 is in sliding fit with the first guide rail 910, so that the first moving plate 930 can linearly reciprocate along the X direction; the second guide rail 920 is installed on the upper surface of the first moving plate 930, the second guide rail 920 is arranged along the Y direction, and the second slider of the second moving plate 940 is in sliding fit with the second guide rail 920, so that the second moving plate 940 can linearly reciprocate along the X direction and the Y direction, and further the X direction and the Y direction of the electronic component can be positioned by the XY table 900.
The prober further includes a prober holder 700, and the prober holder 700 is mounted on the carrying surface of the carrying platform 100 and is provided with a space for accommodating the XY table 900.
Specifically, the pincard support 700 includes a pincard platform 710 and two side plates 720, the side plates 720 are vertically installed on the lower surface of the pincard platform 710, and the two side plates 720 are spaced apart in the width direction of the loading platform 100 to form a space for accommodating the XY table 900. The pin card stage 710 is used to fix a probe card and is provided with a through hole 711.
The pin card holder 700 realizes fixing of the probe card.
The probe station further includes a stage mounted on the upper surface of the second moving plate 940 for adsorbing the electronic component.
Specifically, the working surface of the stage is configured to be circular, and when the probe station works, the electronic components on the stage are exposed through the through holes 711 on the probe card platform 710.
The carrier is used for adsorbing the electronic element, positioning the electronic element in the Z direction and driving the electronic element to move in the X direction and the Y direction so as to enable the electronic element to be located at a proper position.
Example two
The embodiment of the utility model provides an electronic component check out test set, probe platform including mentioning in embodiment one, consequently, also possessed all beneficial effects in embodiment one, no longer repeated here.
Finally, it should be noted that: the above embodiments are only used to illustrate the technical solution of the present invention, and not to limit the same; although the present invention has been described in detail with reference to the foregoing embodiments, it should be understood by those skilled in the art that: the technical solutions described in the foregoing embodiments may still be modified, or some or all of the technical features may be equivalently replaced; such modifications or substitutions do not depart from the scope of the invention in its corresponding aspects.

Claims (10)

1. A probe station, comprising: the supporting part (200) is positioned on one side of the bearing part, which is deviated from the bearing surface, and the supporting part and the bearing part are of an integrally formed structure.
2. The probe station according to claim 1, characterized in that the support (200) has a receiving space;
the probe station further comprises a drawing piece (400), wherein the drawing piece (400) is provided with a cavity for accommodating an electric element, and the drawing piece (400) is movably connected with the supporting part (200) so that the drawing piece (400) can enter or extend out of the accommodating space.
3. The probe station according to claim 2, characterized in that the bearing part comprises a bearing platform (100), the upper surface of the bearing platform (100) is the bearing surface, and the supporting part (200) is connected with the lower surface of the bearing platform (100).
4. The probe station according to claim 3, characterized in that the carrying platform (100) is provided with a stiffening assembly (300) on the side facing the support (200).
5. The probe station according to claim 4, characterized in that said reinforcement assembly (300) comprises longitudinal stiffeners (310) and/or transverse stiffeners (320), said load-bearing platform (100) being rectangular;
the longitudinal reinforcing ribs (310) are arranged on the lower surface of the bearing platform (100) and are arranged along the length direction of the bearing platform (100);
the transverse reinforcing ribs (320) are arranged on the lower surface of the bearing platform (100) and arranged along the width direction of the bearing platform (100).
6. The probe station as claimed in claim 5, wherein the reinforcing assembly (300) further comprises a reinforcing plate (330), the reinforcing plate (330) is vertically installed on the lower surface of the bearing platform (100) and is provided with a lightening hole (331), and the plane of the reinforcing plate (330) is perpendicular to the length direction of the bearing platform (100).
7. The probe station according to any of the claims 3 to 6, characterized in that the support (200) comprises at least two support plates (210), a plurality of the support plates (210) each being mounted to a lower surface of the load-bearing platform (100).
8. The probe station as recited in claim 7, wherein the number of the supporting plates (210) is set to two, and the two supporting plates (210) are spaced apart from each other in parallel to form the receiving space therebetween.
9. The probe station according to claim 7, characterized in that it further comprises a plurality of adjustment plates (500), each adjustment plate (500) being adjustably mounted to a side of the support plate (210) facing away from the load-bearing platform (100);
the adjusting plates (500) are arranged at intervals along the length direction of the supporting plate (210).
10. An electronic component inspection apparatus comprising a probe station according to any one of claims 1 to 9.
CN202221779060.4U 2022-07-08 2022-07-08 Probe station and electronic component detection equipment Active CN217846422U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN202221779060.4U CN217846422U (en) 2022-07-08 2022-07-08 Probe station and electronic component detection equipment

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN202221779060.4U CN217846422U (en) 2022-07-08 2022-07-08 Probe station and electronic component detection equipment

Publications (1)

Publication Number Publication Date
CN217846422U true CN217846422U (en) 2022-11-18

Family

ID=84036712

Family Applications (1)

Application Number Title Priority Date Filing Date
CN202221779060.4U Active CN217846422U (en) 2022-07-08 2022-07-08 Probe station and electronic component detection equipment

Country Status (1)

Country Link
CN (1) CN217846422U (en)

Similar Documents

Publication Publication Date Title
CN217846422U (en) Probe station and electronic component detection equipment
CN211684744U (en) Positioning mechanism for battery changing mobile device
CN217520373U (en) Lithium battery module installation hole site position degree detection device
CN213238680U (en) Automobile crossbeam detection device
CN212845767U (en) Combined type fine-tuning test frame
CN210953596U (en) Mechanical property test support for aluminum alloy template
CN220610473U (en) Multi-sample and multi-layer positioning device
CN215525882U (en) Integrated circuit test mounting rack
CN220367335U (en) Comprehensive test fixture
CN216460924U (en) Sizing device and reinforcing steel bar processing system
CN217332104U (en) Auxiliary support for salt spray testing machine
CN108845255A (en) A kind of support device for vehicular electric machine test
CN211976336U (en) Desktop type electric drive system load installation and centering device
CN215575257U (en) Functional circuit leakage protection detection platform
CN220368928U (en) Tooling plate for assembling chassis
CN220320901U (en) Mechanism suitable for four-door detection and realizing multidirectional adjustment and positioning
CN110208581A (en) A kind of coaxiality adjustment tool for electromechanical testing
CN212989580U (en) Universal circuit board detection device
CN211890922U (en) Test platform
CN211991813U (en) Three-axis platform equipment suitable for multi-axis machining
CN219644489U (en) Clamping device
CN213336005U (en) Plane detector
CN219319242U (en) Automobile battery box detection device
CN220252097U (en) Automatic production line alignment device of semiconductor test equipment
CN218382002U (en) Automotive interior door plant atress detection device

Legal Events

Date Code Title Description
GR01 Patent grant
GR01 Patent grant