CN212845767U - Combined type fine-tuning test frame - Google Patents
Combined type fine-tuning test frame Download PDFInfo
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- CN212845767U CN212845767U CN202021409107.9U CN202021409107U CN212845767U CN 212845767 U CN212845767 U CN 212845767U CN 202021409107 U CN202021409107 U CN 202021409107U CN 212845767 U CN212845767 U CN 212845767U
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- plywood
- fine tuning
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- circuit board
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Abstract
The utility model relates to a circuit board test technical field, in particular to combined type fine setting test jig, the probe needle bed includes first plywood down, lower probe needle sets up in first plywood upper surface, first plywood below is provided with the second plywood, second plywood bilateral symmetry is provided with two fine setting platforms, the second plywood support is fixed in on two fine setting platforms, the adjustable second plywood of fine setting platform is controlled around in the horizontal plane, be provided with many reference columns on the second plywood, be provided with a plurality of locating holes on the first plywood, many reference columns are worn out from a plurality of locating holes by down up respectively, the circuit board location is placed on many reference columns. Compared with the prior art, the utility model discloses a fine setting platform is adjusted to combined type fine setting test jig accessible makes the second plywood remove in the horizontal plane, and many reference columns drive the circuit board small-amplitude displacement in the horizontal plane, and probe and lower probe are gone up to test point position alignment, can effectively reduce the manual work that consumes in the testing process, improve efficiency of software testing.
Description
[ technical field ] A method for producing a semiconductor device
The utility model relates to a circuit board test technical field, in particular to combined type fine setting test jig.
[ background of the invention ]
In the circuit board industry, coil testing is a very important process flow. The high-precision circuit board inevitably produces test point position offset in mass production, often can be because many false open short circuits appear in test point offset when using same test machine test same batch of same type circuit board this moment, generally use sticky tape pulling circuit board among the prior art to make circuit board test point position aim at the probe position of test jig, or use the probe retest of flying, but this all is suitable for under the less circumstances of circuit board quantity of test, in case the circuit board quantity of test is more, will consume a large amount of manual works and influence efficiency of software testing.
[ Utility model ] content
In order to overcome the above problems, the utility model provides a combined type fine setting test jig that can effectively solve above-mentioned problem.
The utility model provides a technical scheme who above-mentioned technical problem provided is: the composite fine-tuning test frame is used for testing a circuit board by a testing machine and comprises an upper die and a lower die, wherein the upper die and the lower die are respectively arranged on the testing machine in an up-down corresponding manner, the upper die and the lower die are respectively connected to a testing system of the testing machine, and the circuit board is positioned between the upper die and the lower die; the upper die is provided with an upper probe bed, the upper probe bed is provided with an upper probe, the lower die is provided with a lower probe bed, the lower probe bed is provided with a lower probe, and the positions of the upper probes correspond to the positions of the lower probes respectively; the lower probe needle bed further comprises a first layer plate, the lower probe is arranged on the upper surface of the first layer plate, a second layer plate is arranged below the first layer plate, two fine adjustment platforms are symmetrically arranged on two sides of the second layer plate, the second layer plate is supported and fixed on the two fine adjustment platforms, and the fine adjustment platforms can adjust the second layer plate to move back and forth and left and right in a horizontal plane; the circuit board is characterized in that a plurality of positioning columns are arranged on the second layer board, a plurality of positioning holes are formed in the first layer board, the positioning columns penetrate out of the positioning holes from bottom to top respectively, and the circuit board is placed on the positioning columns in a positioning mode.
Preferably, the size of the positioning hole is larger than that of the positioning column.
Preferably, the bilateral symmetry of second plywood is provided with two and supports the fixed plate, two support fixed plates are fixed in respectively on two fine setting platforms.
Preferably, a platform supporting block is arranged below the fine adjustment platform.
Preferably, the lower die comprises a lower die base plate, and the platform supporting block is fixed on the surface of the lower die base plate.
Preferably, the lower die further comprises a lower row of insertion plates, a plurality of lower row of insertion plates are arranged on the lower row of insertion plates, the lower probe is electrically connected with the lower row of insertion plates through a lead, and the lower row of insertion plates are electrically connected with the tester.
Preferably, the upper die comprises an upper socket, the upper probe is electrically connected to the upper socket through a wire, and the upper socket is electrically connected to the tester.
Preferably, needle bed support columns are arranged at four corners below the lower probing needle bed, the upper ends of the needle bed support columns are fixed at the bottom of the lower probing needle bed, and the upper ends of the needle bed support columns are fixed on the surface of the lower die base plate.
Preferably, the bottom of the lower-row inserting plate is provided with a row-inserting supporting column, the upper end of the row-inserting supporting column is fixed at the bottom of the lower-row inserting plate, and the upper end of the row-inserting supporting column is fixed on the surface of the lower die bottom plate.
Preferably, the fine tuning platform comprises a first base, and the bottom of the first base is fixed on the upper surface of the platform supporting block.
Compared with the prior art, the utility model discloses a combined type fine setting test jig when the same batch of same type circuit board has the test point position error to appear, the accessible is adjusted the fine setting platform and is made the second plywood remove in the horizontal plane, many reference columns drive the circuit board small amplitude displacement in the horizontal plane, go up probe and lower probe up to test point position alignment, can effectively reduce the manual work that consumes in the testing process, improve efficiency of software testing, and can reduce the update frequency of test jig and test machine, only change the test jig and go up arranging of probe and can satisfy the test demand of different circuit boards, the saving equipment cost.
[ description of the drawings ]
FIG. 1 is a lower mold three-dimensional structure diagram of the composite fine tuning test jig of the present invention;
FIG. 2 is a top view of the lower mold of the composite fine tuning test jig of the present invention;
FIG. 3 is a first layer board structure diagram of the composite fine tuning test jig of the present invention;
FIG. 4 is a diagram of a second layer board structure of the composite fine tuning test jig of the present invention;
fig. 5 is a fine-tuning platform structure diagram of the composite fine-tuning testing jig of the present invention.
[ detailed description ] embodiments
In order to make the objects, technical solutions and advantages of the present invention more clearly understood, the present invention will be further described in detail with reference to the accompanying drawings and the following embodiments. It should be understood that the specific embodiments described herein are for purposes of illustration only and are not intended to limit the invention.
It should be noted that all directional indications (such as up, down, left, right, front, and back … …) in the embodiments of the present invention are limited to relative positions on a given view, not absolute positions.
In addition, descriptions in the present application as to "first", "second", and the like are for descriptive purposes only and are not to be construed as indicating or implying relative importance or implicit to the number of technical features indicated. Thus, a feature defined as "first" or "second" may explicitly or implicitly include at least one such feature. In the description of the present invention, "a plurality" means at least two, e.g., two, three, etc., unless specifically limited otherwise.
Please refer to fig. 1 to 5, the utility model discloses a combined type fine setting test jig for the test machine tests the circuit board, including last mould and lower mould 100, it sets up on the test machine to go up mould and lower mould 100 correspondence from top to bottom respectively, goes up mould and lower mould 100 and connects respectively in the test system of test machine, and the circuit board is located between mould and lower mould 100, pushes down through last mould and realizes the electric conductance and lead to testing. The upper die is provided with an upper probe bed, the upper probe bed is provided with an upper probe, the lower die 100 is provided with a lower probe bed 20, the lower probe bed 20 is provided with a lower probe 23, and the positions of the upper probe and the lower probe 23 correspond to each other respectively. The lower probe bed 20 further comprises a first layer plate 21, and the lower probe 23 is arranged on the upper surface of the first layer plate 21. The second layer plate 22 is arranged below the first layer plate 21, two fine tuning platforms 50 are symmetrically arranged on two sides of the second layer plate 22, the second layer plate 22 is supported and fixed on the two fine tuning platforms 50, and the fine tuning platforms 50 can adjust the second layer plate 22 to move back and forth and left and right in the horizontal plane.
A plurality of positioning columns 24 are arranged on the second layer plate 22, a plurality of positioning holes 211 are arranged on the first layer plate 21, the positioning columns 24 penetrate out of the positioning holes 211 from bottom to top respectively, and the circuit board is positioned on the positioning columns 24. When the same batch of circuit boards of the same type have errors of test point positions, the fine tuning platform 50 can be adjusted to enable the second layer board 22 to move in the horizontal plane, the positioning columns 24 drive the circuit boards to move in the horizontal plane in a small range until the test point positions are aligned with the upper probe and the lower probe 23, the labor consumed in the test process can be effectively reduced, the test efficiency is improved, the updating frequency of the test frame and the test machine can be reduced, the test requirements of different circuit boards can be met only by replacing the arrangement of the probes on the test frame, and the equipment cost is saved.
The size of positioning hole 211 is larger than that of positioning column 24, so as to provide a space for movement of positioning column 24, so as to satisfy that positioning column 24 moves horizontally.
The bilateral symmetry of second plywood 22 is provided with two and supports fixed plate 60, two support fixed plate 60 are fixed in respectively on two fine setting platforms 50, and fine setting platform 50 adjustment drives support fixed plate 60 and removes to it removes to drive second plywood 22.
A platform supporting block 70 is disposed below the fine adjustment platform 50, and is used for supporting the fine adjustment platform 50 so that the fine adjustment platform 50 reaches a height required for assembling with the supporting and fixing plate 60.
The lower mold 100 includes a lower mold base plate 10, and the platform support block 70 is fixed on the surface of the lower mold base plate 10.
Needle bed support columns 25 are arranged at four corners below the lower probing needle bed 20, the upper ends of the needle bed support columns 25 are fixed at the bottom of the lower probing needle bed 20, and the upper ends of the needle bed support columns 25 are fixed on the surface of the lower die base plate 10.
The lower die 100 further comprises a lower row of inserting plates 30, a plurality of lower row of inserting plates 32 are arranged on the lower row of inserting plates 30, the lower probes 23 are electrically connected with the lower row of inserting plates 32 through conducting wires, and the lower row of inserting plates 32 are electrically connected with a testing machine. Similarly, the upper die also comprises an upper row of plugs, the upper probes are electrically connected with the upper row of plugs through wires, and the upper row of plugs are electrically connected with the tester. The upper row of inserting and the lower row of inserting 32 play the switching and collect effect, do benefit to the wire and arrange orderly not chaotic, improve equipment site space and use the rationality.
The bottom of the lower-row inserting plate 30 is provided with an inserting support column 31, the upper end of the inserting support column 31 is fixed at the bottom of the lower-row inserting plate 30, and the upper end of the inserting support column 31 is fixed on the surface of the lower die bottom plate 10.
The fine tuning platform 50 includes a first base 51, and the bottom of the first base 51 is fixed on the upper surface of the platform supporting block 70. A first slider 53 is slidably connected to the first base 51, and the first slider 53 can linearly slide on the first base 51. The first sliding block 53 is fixed with a second base 54, the second base 54 is connected with a second sliding block 56 in a sliding manner, and the second sliding block 56 can slide on the second base 54 along a straight line. The support fixing plate 60 is fixed to the second slider 56. The sliding direction of the first sliding block 53 is perpendicular to the sliding direction of the second sliding block 56, when the position needs to be adjusted, the first sliding block 53 slides to drive the second base 54 to move, the second base 54 moves to drive the second sliding block 56 to move, meanwhile, the second sliding block 56 slides on the second base 54 to drive the supporting and fixing plate 60 to move, and the supporting and fixing plate 60 moves to drive the whole second layer plate 22 to move.
A first fine adjustment screw 52 is arranged on one side of the first base 51, one end of the first fine adjustment screw 52 is connected with a first push rod, and the direction of the first push rod is consistent with the sliding direction of the first slide block 53. The first fine adjustment screw 52 is rotated to extend and retract the first push rod along the sliding direction of the first slide block 53, so as to push the first slide block 53 to slide. A return spring is arranged between the first slider 53 and the first base 51, and when the first push rod does not apply acting force on the first slider 53, the first slider 53 returns to the initial position of the first base 51 under the action of the restoring force of the return spring. The first sliding block 53 is provided with a first arc protrusion 531, the position of the first arc protrusion 531 corresponds to the position of the first ejector rod, and the first ejector rod pushes the first arc protrusion 531 to push the first sliding block 53 to slide, so that the contact sensitivity is more accurate, and more accurate and fine adjustment can be realized. Similarly, a second fine tuning screw 55 is disposed on one side of the second base 54, one end of the second fine tuning screw 55 is connected to a second push rod, and the direction of the second push rod is parallel to the sliding direction of the second slide block 56. The second fine adjustment screw 55 is rotated so that the second jack rod is extended and contracted in a direction parallel to the sliding direction of the second slider 56. A pushing plate 57 is arranged on one side of the second sliding block 56, a second arc bulge 571 is arranged on the pushing plate 57, the position of the second arc bulge 571 corresponds to the position of the second ejector rod, the second ejector rod pushes the second arc bulge 571 to push the pushing plate 57 to move, and the pushing plate 57 drives the second sliding block 56 to slide.
Compared with the prior art, the utility model discloses a combined type fine setting test jig when the same batch of same type circuit board has the test point position error to appear, the accessible is adjusted fine setting platform 50 and is made second plywood 22 remove in the horizontal plane, many reference columns 24 drive the circuit board small-amplitude displacement in the horizontal plane, probe and lower probe 23 are gone up to test point position alignment, can effectively reduce the manual work that consumes in the test procedure, improve the efficiency of software testing, and can reduce the update frequency of test jig and test machine, only change the test jig and go up arranging of probe and can satisfy the test demand of different circuit boards, practice thrift equipment cost.
The above description is only for the preferred embodiment of the present invention, and not intended to limit the scope of the present invention, and all modifications made within the spirit of the present invention, equivalent replacements and improvements should be included in the scope of the present invention.
Claims (10)
1. The combined fine tuning test frame is used for testing a circuit board by a testing machine and is characterized by comprising an upper die and a lower die, wherein the upper die and the lower die are respectively arranged on the testing machine in an up-down corresponding manner, the upper die and the lower die are respectively connected to a testing system of the testing machine, and the circuit board is positioned between the upper die and the lower die;
the upper die is provided with an upper probe bed, the upper probe bed is provided with an upper probe, the lower die is provided with a lower probe bed, the lower probe bed is provided with a lower probe, and the positions of the upper probes correspond to the positions of the lower probes respectively;
the lower probe needle bed further comprises a first layer plate, the lower probe is arranged on the upper surface of the first layer plate, a second layer plate is arranged below the first layer plate, two fine adjustment platforms are symmetrically arranged on two sides of the second layer plate, the second layer plate is supported and fixed on the two fine adjustment platforms, and the fine adjustment platforms can adjust the second layer plate to move back and forth and left and right in a horizontal plane;
the circuit board is characterized in that a plurality of positioning columns are arranged on the second layer board, a plurality of positioning holes are formed in the first layer board, the positioning columns penetrate out of the positioning holes from bottom to top respectively, and the circuit board is placed on the positioning columns in a positioning mode.
2. The composite trim test rack of claim 1, wherein the positioning holes have a size greater than the positioning posts.
3. The composite fine tuning test frame of claim 1, wherein two supporting and fixing plates are symmetrically disposed on two sides of the second layer plate, and the two supporting and fixing plates are respectively fixed on the two fine tuning platforms.
4. The composite fine tuning test fixture of claim 1, wherein a platform support block is disposed below the fine tuning platform.
5. The composite trim test fixture of claim 4, wherein the lower mold includes a lower mold bottom plate, and the platform support block is secured to a surface of the lower mold bottom plate.
6. The composite fine tuning test jig of claim 5, wherein the lower mold further comprises a lower row of insert plates, the lower row of insert plates is provided with a plurality of lower row of inserts, the lower probes are electrically connected with the lower row of inserts through wires, and the lower row of inserts are electrically connected with the tester.
7. The composite trim test fixture of claim 1, wherein the upper mold comprises an upper socket, the upper probe is electrically connected to the upper socket via a wire, and the upper socket is electrically connected to the tester.
8. The composite fine tuning test jig of claim 5, wherein needle bed supporting columns are arranged at four corners below the lower probe needle bed, the upper ends of the needle bed supporting columns are fixed at the bottom of the lower probe needle bed, and the upper ends of the needle bed supporting columns are fixed on the surface of the lower die base plate.
9. The composite fine tuning test jig of claim 6, wherein the bottom of the lower row of insert plates is provided with the insert support columns, the upper ends of the insert support columns are fixed at the bottom of the lower row of insert plates, and the upper ends of the insert support columns are fixed on the surface of the lower die base plate.
10. The composite fine tuning test fixture of claim 4, wherein the fine tuning platform comprises a first base, and the bottom of the first base is fixed on the upper surface of the platform support block.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202021409107.9U CN212845767U (en) | 2020-07-15 | 2020-07-15 | Combined type fine-tuning test frame |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202021409107.9U CN212845767U (en) | 2020-07-15 | 2020-07-15 | Combined type fine-tuning test frame |
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| Publication Number | Publication Date |
|---|---|
| CN212845767U true CN212845767U (en) | 2021-03-30 |
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| Application Number | Title | Priority Date | Filing Date |
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| CN202021409107.9U Active CN212845767U (en) | 2020-07-15 | 2020-07-15 | Combined type fine-tuning test frame |
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Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN116367437A (en) * | 2023-04-24 | 2023-06-30 | 苏州光斯奥光电科技有限公司 | PCB leveling device |
-
2020
- 2020-07-15 CN CN202021409107.9U patent/CN212845767U/en active Active
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN116367437A (en) * | 2023-04-24 | 2023-06-30 | 苏州光斯奥光电科技有限公司 | PCB leveling device |
| CN116367437B (en) * | 2023-04-24 | 2023-12-05 | 苏州光斯奥光电科技有限公司 | PCB leveling device |
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