CN217786229U

CN217786229U - Semiconductor photosensitive element testing device

Info

Publication number: CN217786229U
Application number: CN202221242353.9U
Authority: CN
Inventors: 蒲春森; 杨显洪
Original assignee: Chongqing Xi Pang Electronic Technology Co ltd
Current assignee: Chongqing Xi Pang Electronic Technology Co ltd
Priority date: 2022-05-23
Filing date: 2022-05-23
Publication date: 2022-11-11
Anticipated expiration: 2032-05-23

Abstract

The utility model provides a semiconductor photosensitive element testing device, which belongs to the technical field of sensor testing equipment and aims to solve the problem that the detection result of the existing detection equipment is not accurate enough due to the fact that a plurality of glass cover plates for receiving light rays have improved photosensitive elements; a lamplight placing component is arranged on the base positioned in the output area; be provided with signal collector on the base that is located the induction zone, the last electric connection of signal collector has the photoelectric sensor towards the output area, is provided with the light screen between output area and the induction zone, and it is provided with the loading board to slide in the spout, and the light screen is placed on the loading board, lies in one side array distribution of output area on the loading board and has a plurality of printing opacity test grooves, has seted up the light trap of size, density diverse in a plurality of printing opacity test grooves.

Description

Semiconductor photosensitive element testing device

Technical Field

The utility model belongs to the technical field of sensor test equipment, more specifically say, in particular to semiconductor photosensitive element testing arrangement.

Background

The sensor is a detection device, and can convert a sensed detected signal into an electric signal or other required information and output the electric signal or the information so as to meet the requirements of information transmission, processing, storage, display, recording, control and the like.

The photoelectric sensor is a photosensitive element and converts an optical signal into an electric signal by utilizing the photoelectric effect; the photoelectric sensor generally has the advantages of high precision, fast response and the like, and particularly relates to a semiconductor photosensitive element which has sensitivity, detectivity, light rate, light characteristic, volt-ampere characteristic, spectral characteristic, time and frequency response characteristic, temperature characteristic and the like, which are mainly determined by materials, structures and processes, so that the performance of the semiconductor photosensitive element needs to be detected when the semiconductor photosensitive element is used for producing primary products, the required materials and processes are changed according to requirements, the conventional semiconductor photosensitive element is directly used for detecting and irradiating, the incident angle and the quantity of light rays cannot be changed, and the detection result of the improved photosensitive element for a glass cover plate receiving the light rays is not accurate enough.

Therefore, in view of the above, the present invention provides a semiconductor photosensor testing apparatus, which is improved in view of the conventional structure and defects, so as to achieve the purpose of higher practical value.

SUMMERY OF THE UTILITY MODEL

The utility model provides a semiconductor photosensitive element testing arrangement to the solution has improvement photosensitive element to some glass cover plate to accepting light, the not accurate enough problem of testing result of present check out test set.

The utility model relates to a purpose and efficiency of semiconductor photosensitive element testing arrangement is reached by following concrete technical means:

a semiconductor photosensitive element testing device comprises a base, wherein a sliding groove is formed in the middle of the base and is perpendicular to the length direction, and an output area and an induction area are respectively arranged on two sides of the sliding groove on the base;

a lamplight placing component is arranged on the base positioned in the output area;

be provided with signal collector on the base that is located the induction zone, the last electric connection of signal collector has the photoelectric sensor towards the output area, is provided with the light screen between output area and the induction zone, it is provided with the loading board to slide in the spout, the light screen is placed on the loading board, it has a plurality of printing opacity test grooves to lie in one side array distribution of output area on the loading board, has seted up the light trap of size, density diverse in a plurality of printing opacity test grooves.

Furthermore, the light placing assembly comprises a light placing ring, a fixing seat and a lock catch are respectively arranged on two sides of the light placing ring, a binding band capable of surrounding the light placing ring is arranged above the light placing ring, one end of the binding band is wound on the fixing seat, and the other end of the binding band is clamped in the lock catch.

Furthermore, the front end of the signal collector is provided with a circular connecting socket, the photoelectric sensor is inserted into the connecting socket, the connecting socket and the photoelectric sensor are sleeved with a light guide cylinder, one end of the light guide cylinder is abutted to the light screen, and the other end of the light guide cylinder is internally in threaded connection with the periphery of the connecting socket.

Furthermore, the top surface of the bearing plate is provided with a limiting strip, and the bottom end of the light screen is provided with a clamping groove corresponding to the limiting strip.

Furthermore, the limiting strip array is distributed with a plurality of limiting strips.

Furthermore, a display screen is arranged on the signal collector.

Compared with the prior art, the utility model discloses following beneficial effect has:

1. divide into output area and induction zone about on the base, the subassembly is placed to light on the output area and the lamp is placed, light shines on the light screen to the induction zone, can shine on photoelectric sensor with light transmission through the printing opacity test groove on the light screen, can detect photoelectric sensor through the signal collector, and the loading board can be followed to the light screen and slided, can remove the printing opacity test groove of difference to photoelectric sensor the place ahead, thereby usable different incident light detects photoelectric sensor, the best suited photoelectric sensor that is used for glass cover plate to improve detects.

2. Through the setting of an optical guide cylinder, the optical guide cylinder can contact with the light screen, so that light rays emitted from the light-transmitting test slot irradiate on the photoelectric sensor through the optical guide cylinder, and the influence of ambient light on the photoelectric sensor is avoided.

Drawings

Fig. 1 is a perspective view of the semiconductor photosensor testing apparatus of the present invention.

Fig. 2 is an exploded view of the semiconductor photosensor testing apparatus of the present invention.

Fig. 3 is a schematic structural diagram of the sun visor of the present invention.

In the drawings, the corresponding relationship between the component names and the reference numbers is as follows:

1. a base; 2. a signal collector; 3. a display screen; 4. a visor; 5. a fixed seat; 6. binding a belt; 7. placing a light ring; 8. locking; 9. a connection socket; 10. a light-guiding barrel; 11. a photoelectric sensor; 12. a chute; 13. carrying a plate; 14. a limiting strip; 16. a light transmissive test slot; 17. a clamping groove.

Detailed Description

The following describes embodiments of the present invention in further detail with reference to the drawings and examples. The following examples are intended to illustrate the invention, but are not intended to limit the scope of the invention.

In the description of the present invention, "a plurality" means two or more unless otherwise specified; the terms "upper", "lower", "left", "right", "inner", "outer", "front", "rear", "head", "tail", and the like indicate orientations or positional relationships based on the orientations or positional relationships shown in the drawings, and are merely for convenience of description and simplicity of description, and do not indicate or imply that the device or element being referred to must have a particular orientation, be constructed and operated in a particular orientation, and thus, should not be construed as limiting the present invention. Furthermore, the terms "first," "second," "third," and the like are used for descriptive purposes only and are not to be construed as indicating or implying relative importance.

In the description of the present invention, it should be noted that, unless otherwise explicitly specified or limited, the terms "connected" and "connected" should be interpreted broadly, and may be, for example, fixedly connected, detachably connected, or integrally connected; can be mechanically or electrically connected; may be directly connected or indirectly connected through an intermediate. The specific meaning of the above terms in the present invention can be understood in specific cases to those skilled in the art.

Example (b):

as shown in figures 1 to 3:

the utility model provides a semiconductor photosensitive element testing device, which comprises a base 1, wherein a chute 12 is arranged in the middle of the base 1 and is vertical to the length direction, an output area and a sensing area are respectively arranged on the base 1 and positioned at two sides of the chute 12, the output area is used for providing required characteristic light, and the sensing area is used for installing and detecting a photosensitive element;

be provided with light on the base 1 that is located the output area and place the subassembly, in this embodiment, light is placed the subassembly and is included the ring of putting light 7, the ring of putting light 7 semicircular in shape, and there are a plurality of settings side by side, be used for placing some cylinder lamps, electric tube lamp etc., 7 both sides of putting light are provided with fixing base 5 and hasp 8 respectively, it is provided with bandage 6 that can surround the ring of putting light 7 to put light 7 top, bandage 6 can fix the light source position with the ring of putting light 7 mutually supporting, make the light source can penetrate the induction zone directly, and the dismouting light source of being convenient for, in this embodiment, 6 one end of bandage is around establishing on fixing base 5, the other end card is established in hasp 8, can establish the elasticity of adjustment bandage 6 like knapsack tape card.

A signal collector 2 is arranged on the base 1 positioned in the induction area, the signal collector 2 is electrically connected with a photoelectric sensor 11 facing the output area, the photoelectric sensor 11 converts collected optical signals into electric signals and provides the electric signals for the signal collector 2, so that the photoelectric sensor 11 can be detected, and a display screen 3 is arranged on the signal collector 2, so that the detection effect of the photoelectric sensor 11 can be judged through numerical values;

a light screen 4 is arranged between the output area and the sensing area, and the light screen 4 is used for shielding the light rays of the output area, so that the light rays required by the test can be adjusted;

sliding in chute 12 and being provided with loading board 13, light screen 4 places on

loading board

13, 4 accessible loading boards 13 of light screen slide in

chute

12, 4 positions of accessible manual regulation light screen, it has a plurality of printing opacity test slots 16 to lie in an output area one side array distribution on loading board 13, the size has been seted up in a plurality of printing opacity test slots 16, the light trap of density diverse, printing opacity test slot 16 through the difference can be with the light source with different forms incident on photoelectric sensor 11, make signal collector 2 present different data, thereby judge photoelectric sensor 11's precision.

Wherein, 2 front ends of signal collector are provided with circular shape connection socket 9, photoelectric sensor 11 is inserted and is established in connection socket 9, be convenient for change installation photoelectric sensor 11, connection socket 9 is equipped with a light guide section of thick bamboo 10 with 11 overcoat of photoelectric sensor, light guide section of thick bamboo 10 one end butt is on the light screen 4, the other end is inside and connection socket 9 week side threaded connection, it is more convenient to make the installation of light guide section of thick bamboo 10, light guide section of thick bamboo 10 can contact with light screen 4, make the light that jets into from printing opacity test groove 16 shine on photoelectric sensor 10 through light guide section of thick bamboo 10, the test of having avoided ambient light to photoelectric sensor 11 has caused the influence.

Wherein, loading board 13 top surface array distributes has a plurality of spacing 14, and draw-in groove 17 corresponding with spacing 14 is seted up to 4 bottoms of light screen, and the setting up of spacing 14 has restricted light screen 4 and the horizontal relative motion of loading board 13, avoids light screen 4 landing on loading board 13, leads to the printing opacity to examine 16 position reductions of groove and influences incident light position.

The embodiments of the present invention have been presented for purposes of illustration and description, and are not intended to be exhaustive or limited to the invention in the form disclosed. Many modifications and variations will be apparent to those of ordinary skill in the art. The embodiment was chosen and described in order to best explain the principles of the invention and the practical application, and to enable others of ordinary skill in the art to understand the invention for various embodiments with various modifications as are suited to the particular use contemplated.

Claims

1. A semiconductor photosensitive element testing device is characterized in that: the device comprises a base (1), wherein a sliding groove (12) is formed in the middle of the base (1) and is perpendicular to the length direction, and an output area and an induction area are respectively arranged on two sides of the sliding groove (12) on the base (1);

a lamplight placing component is arranged on the base (1) positioned in the output area;

be located and be provided with signal collector (2) on base (1) of induction zone, the electric connection has photoelectric sensor (11) towards the output area on signal collector (2), is provided with light screen (4) between output area and the induction zone, it is provided with loading board (13) to slide in spout (12), light screen (4) are placed on loading board (13), it has a plurality of printing opacity test grooves (16) to lie in output area one side array distribution on loading board (13), has seted up the light trap of size, density diverse in a plurality of printing opacity test grooves (16).

2. A semiconductor photosensor testing apparatus according to claim 1, wherein: the lamplight placing assembly comprises a light placing ring (7), wherein a fixing seat (5) and a lock catch (8) are respectively arranged on two sides of the light placing ring (7), a binding band (6) capable of surrounding the light placing ring (7) is arranged above the light placing ring (7), one end of the binding band (6) is wound on the fixing seat (5), and the other end of the binding band is clamped in the lock catch (8).

3. A semiconductor photosensor testing apparatus according to claim 1, wherein: the utility model discloses a signal collector (2) front end is provided with circular shape connection socket (9), photoelectric sensor (11) are inserted and are established in connection socket (9), connection socket (9) with photoelectric sensor (11) overcoat is equipped with a light section of thick bamboo (10), a light section of thick bamboo (10) one end butt is on light screen (4), the other end inside and connection socket (9) week side threaded connection.

4. A semiconductor photosensor testing apparatus according to claim 1, wherein: the top surface of the bearing plate (13) is provided with a limiting strip (14), and the bottom end of the light screen plate (4) is provided with a clamping groove (17) corresponding to the limiting strip (14).

5. A semiconductor photosensor testing apparatus according to claim 4, wherein: the limiting strips (14) are distributed in a plurality of arrays.

6. A semiconductor photosensor testing apparatus according to claim 1, wherein: and a display screen (3) is arranged on the signal collector (2).