CN217739396U

CN217739396U - Automatic test signal connecting device for electronic fuse control chip

Info

Publication number: CN217739396U
Application number: CN202221455717.1U
Authority: CN
Inventors: 刘若智
Original assignee: Shanghai Simat Microelectronics Technology Co ltd
Current assignee: Shanghai Simat Microelectronics Technology Co ltd
Priority date: 2022-06-10
Filing date: 2022-06-10
Publication date: 2022-11-04
Anticipated expiration: 2032-06-10

Abstract

The utility model discloses an automatic test signal connecting device of an electronic fuse control chip, which comprises a circuit board, wherein the front side of the circuit board is connected with a capacitor, and the back side of the circuit board is connected with a connector; and the circuit board is also provided with a fixing hole; the golden finger clamping sleeve is provided with a pre-groove A, and the golden finger clamping sleeve with the pre-groove is arranged at a position corresponding to the circuit board according to the corresponding jack; the golden finger is provided with a pre-opened groove B, and the golden finger is matched with the clamping sleeve and mutually buckled according to the corresponding jack; and the tested product is in lap joint with the metal pins of the golden fingers. The golden finger with the pre-slotting B is arranged on the front face of the circuit board when the golden finger is arranged on the circuit board, and after the capacitor is connected with the connecting piece and the corresponding pin of the tested device, the distance is reduced, and the effect is obvious. The device to be tested can be normally closer to the peripheral matching elements, and the measured value in automatic test is ensured to meet the design and application requirements.

Description

Automatic test signal connecting device for electronic fuse control chip

Technical Field

The utility model relates to a test signal connecting device, concretely relates to ZTC4168 (SOP 8L appearance encapsulation) electronic fuze control chip automatic test signal connecting device.

Background

At present, the design requirements of products of home and abroad semiconductor design companies are reduced in appearance, the working energy consumption is reduced, the sensitivity is improved, the performance is more perfect, and the manufacturing cost is reduced, so that the manufacturing process is continuously reduced, the wafer DI E area which has small area and can meet the requirements of customers is selected under the condition that all factors are comprehensively considered during the design of chips, the distance of peripheral matching elements in a test production link is increased, and the interference of a test environment or the driving capability of a tested device is insufficient.

SUMMERY OF THE UTILITY MODEL

Problem (A)

An object of the utility model is to provide an automatic test signal connecting device of electron fuze control chip has solved current general SOP8L connecting piece among the prior art and can't be close with supporting connection conversion accessory, leads to test environment's interference or the problem that driving force itself is not enough by the device under test.

(II) technical scheme

In order to achieve the above purpose, the utility model provides a following technical scheme:

an automatic test signal connection device for electronic fuse control chip comprises

The front side of the circuit board is connected with a capacitor, and the back side of the circuit board is connected with a connector; and the circuit board is also provided with a fixing hole;

the golden finger clamping sleeve is provided with a pre-groove A, and the golden finger clamping sleeve with the pre-groove is arranged at a position corresponding to the circuit board according to a corresponding jack;

the golden finger is provided with a pre-opened groove B, and the golden finger is matched with the clamping sleeve and mutually buckled according to the corresponding jack; the capacitor respectively penetrates through the golden finger clamping sleeve and the pre-opened groove A and the pre-opened groove B on the golden finger

And the tested product is in lap joint with the metal pins of the golden fingers.

Furthermore, the front side and the back side of the circuit board are provided with copper foil circuits preset according to the test requirements.

Specifically, the tested product is a ZTC4168 electronic lead control chip.

Furthermore, the 1VDD pin and the 7VDD5V pin of the ZTC4168 of the chip are respectively externally connected with a ceramic capacitor about 2.2F, and the two ceramic capacitors are close to the ZTC4168 chip.

Furthermore, a 1VDD PIN of the chip ZTC4168 is connected with a voltage signal tester V1, and whether the specification of the output voltage signal of the PIN PIN of the chip meets the expectation is detected; the PIN 7VDD5V of the chip ZTC4168 is connected with a voltage signal tester V2, and whether the specification of the PIN output voltage signal of the chip meets the expectation is detected.

Specifically, a 6TEST PIN of the chip ZTC4168 is connected with a time parameter tester V3, and whether a rate signal of corner of the eye output work by a PIN PIN of the chip reaches an expectation is detected;

and a square wave signal generator V4 is connected between the 2VIN1 pin and the 2VIN2 pin of the chip ZTC4168, and provides signals to be applied.

Furthermore, the 4VSS pin of the chip ZTC4168 is grounded.

(III) advantageous effects

1. The device to be tested can be normally closer to peripheral matching elements, and the measured value in automatic test is ensured to meet the design and application requirements;

2. the existing golden fingers are not provided with pre-grooves, and are flat structures right below the golden fingers, when the golden fingers are installed on a circuit board, capacitors cannot be welded on the front side of the circuit board and can only be welded on the back side of the circuit board, after the capacitors are connected with corresponding pins of a connecting piece and a tested device, the distance can be increased by 3-5 mm, the equivalent capacitance is increased, and the test effect is influenced; but the golden finger with the pre-slotting in this application when installing with the circuit board, the electric capacity is installed at the circuit board openly, and the electric capacity is connected the back with the corresponding pin of connecting piece and device under test, and the distance reduces, and the effect is obvious.

Drawings

FIG. 1 is a schematic view of the overall structure of the present invention;

FIG. 2 is another angle structure diagram of FIG. 1;

FIG. 3 is a schematic view of a golden finger with a pre-grooved structure;

fig. 4 is a circuit diagram of the ZTC4168 electronic lead control chip.

In fig. 1 to 4, the correspondence between the part names or lines and the reference numbers is:

the device comprises a circuit board 1, a connector 2, a capacitor 3, a golden finger sleeve 4, a golden finger 5, a tested device 6 and a pre-groove B7.

Detailed Description

The technical solutions in the embodiments of the present invention will be described clearly and completely with reference to the accompanying drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only some embodiments of the present invention, not all embodiments.

An automatic test signal connecting device of an electronic fuse control chip comprises a circuit board 1, wherein the front side of the circuit board 1 is connected with a capacitor 3, and the back side of the circuit board 1 is connected with a connector 2; and the circuit board 1 is also provided with a fixing hole; the golden finger cutting sleeve 4 is provided with a pre-slotting A, and the golden finger cutting sleeve 4 with a pre-slotting B7 is arranged at a corresponding position of the circuit board 1 according to a corresponding jack; the golden finger 5 is provided with a pre-opened groove B7, and the golden finger 5 is matched with the cutting sleeve and mutually buckled according to corresponding jacks; the capacitor 3 penetrates through the golden finger clamping sleeve 4, the pre-opened groove A and the pre-opened groove B7 on the golden finger 5 to be tested, and the tested product is in lap joint with the metal pin of the golden finger 5.

During the assembly, connector 2 installs in the 1 opposite both sides in back of circuit board, and electric capacity 3 installs at the positive middle part of circuit board 1, will take the golden finger cutting ferrule 4 of fluting A in advance to install on circuit board 1, and electric capacity 3 wears out through fluting A in advance, overlaps the supporting cover of golden finger 5 on golden finger cutting ferrule 4 again, and electric capacity 3 rethread fluting B7 in advance will be surveyed the device 6 connection on golden finger 5's pin at last. Because the capacitor 3 is arranged on the front surface of the circuit board 1, after the capacitor 3 is connected with the corresponding pins of the connecting piece and the tested device 6, the distance is reduced, and the effect is obvious. The tested device 6 can be normally closer to the peripheral matching element, and the measured value in the automatic test can be ensured to meet the design and application requirements. The SOP8L connecting piece is closer to the matched connecting conversion fitting, so that the testing environment is not disturbed or the tested device 6 has enough driving capability.

Specifically, the tested product is an electronic lead control ZTC4168 chip, and a 1VDD pin and a 7VDD5V pin of the ZTC4168 of the chip are respectively externally connected with a ceramic capacitor of about 2.2F so as to stabilize the power supply of an internal working circuit; according to the test, two ceramic capacitors were located close to the ZTC4168 chip. A 1VDD pin of the chip ZTC4168 is connected with a voltage signal tester V1; a 7VDD5V pin of the chip ZTC4168 is connected with a voltage signal tester V2; the 6TEST pin of the chip ZTC4168 is connected with a time parameter tester V3. The front side and the back side of the circuit board 1 are provided with copper foil circuits preset according to test requirements, and the connectors 2 on the V1, V2, V3 and V4 signal transmission and acquisition universal connecting plates are connected with a tester. A square wave signal generator V4 is connected between a pin 2VIN1 and a pin 2VIN2 of the chip ZTC 4168; the 4VSS pin of the chip ZTC4168 is grounded. During testing, when a square wave with a voltage difference of 12V between the pin 2VIN1 and the pin 2VIN2 measured by the square wave signal generator V4 and a cycle of 50KHZ is input, the V1 voltage signal tester is required to test that the pin 1VDD of the ZTC4168 chip has a voltage of 12V +/-0.5V, the V2 voltage signal tester is required to test that the pin 7VDD5V of the ZTC4168 chip has a voltage of 5V +/-0.2V, and meanwhile, the V3 time parameter tester can test that the square wave with a voltage difference of about 5V and a cycle of 50KHZ, so that the ZTC4168 chip is good.

It is obvious to a person skilled in the art that the invention is not restricted to details of the above-described exemplary embodiments, but that it can be implemented in other specific forms without departing from the spirit or essential characteristics of the invention. The present embodiments are therefore to be considered in all respects as illustrative and not restrictive, the scope of the invention being indicated by the appended claims rather than by the foregoing description, and all changes which come within the meaning and range of equivalency of the claims are therefore intended to be embraced therein. Any reference sign in a claim should not be construed as limiting the claim concerned.

Claims

1. The utility model provides an automatic test signal connecting device of electron fuze control chip which characterized in that: comprises that

The circuit board (1), the obverse side of the circuit board (1) is connected with a capacitor (3), and the reverse side of the circuit board is connected with a connector (2); and the circuit board (1) is also provided with a fixing hole;

the golden finger clamping sleeve (4) is provided with a pre-opened groove A, and the pre-opened groove A golden finger clamping sleeve (4) is arranged at a position corresponding to the circuit board (1) according to a corresponding jack;

the golden finger (5), the golden finger (5) is provided with a pre-slotting B (7), the golden finger (5) is matched with the cutting sleeve thereof, and the golden finger and the cutting sleeve are buckled with each other according to the corresponding jacks; the capacitor (3) respectively penetrates through the golden finger clamping sleeve (4) and the pre-opened groove A and the pre-opened groove B (7) on the golden finger (5)

And the tested product is in lap joint with the metal pins of the golden fingers (5).

2. The electronic fuze control chip automatic test signal connection device of claim 1, wherein:

the front side and the back side of the circuit board (1) are provided with copper foil circuits preset according to test requirements.

3. The automatic test signal connection device of an electronic fuze control chip of claim 1, wherein:

the tested product is a ZTC4168 electronic fuze control chip.

4. The automatic test signal connection device of an electronic fuze control chip according to claim 3, wherein:

the 1VDD pin and the 7VDD5V pin of the chip ZTC4168 are respectively externally connected with a ceramic capacitor about 2.2F, and the positions of the two ceramic capacitors are close to the chip ZTC 4168.

5. The automatic test signal connection device of an electronic fuze control chip according to claim 3, wherein:

a 1VDD PIN of the chip ZTC4168 is connected with a voltage signal tester V1, and whether the specification of the output voltage of the PIN PIN reaches the expectation is detected;

a PIN 7VDD5V of the chip ZTC4168 is connected with a voltage signal tester V2, and whether the specification of the PIN output voltage of the chip meets the expectation is detected.

6. The automatic test signal connection device of an electronic fuze control chip according to claim 4, wherein:

a 6TEST PIN of the chip ZTC4168 is connected with a time parameter tester V3, and whether a PIN output working frequency signal of the chip reaches an expected value is detected;

a square wave signal generator V4 is connected between the 2VIN1 pin and the 2VIN2 pin of the chip ZTC4168, and provides signals to be applied.

7. The automatic test signal connection device of an electronic fuze control chip according to claim 5, wherein:

the 4VSS pin of the chip ZTC4168 is grounded.