CN217738289U

CN217738289U - Testing device of incremental encoder

Info

Publication number: CN217738289U
Application number: CN202123024495.6U
Authority: CN
Inventors: 冀军科; 杨芙云
Original assignee: Hebei Hanguang Heavy Industry Ltd
Current assignee: Hebei Hanguang Heavy Industry Ltd
Priority date: 2021-12-06
Filing date: 2021-12-06
Publication date: 2022-11-04
Anticipated expiration: 2031-12-06

Abstract

The utility model relates to a testing device of an incremental encoder, which comprises a pulse processing system, a counter and a display circuit, wherein the pulse processing system consists of a singlechip, an edge trigger, a differential circuit, a decoder and a memory and is used for counting the number of pulses of the encoder and calculating the pulse width; the display circuit comprises a decoder, an OR gate, a rising edge latch and a nixie tube and is used for displaying the pulse number and the pulse width of the encoder. The encoder is coaxial with the revolving stage, can detect the pulse number of encoder through detecting the pulse, can detect rotatory direction according to the AB phase difference, watches the speed and the angle that the encoder exported for the system through the complete machine software of product before comparing, and this testing arrangement adds the electric test for the encoder alone, can effectual judgement encoder self function, accomplishes the location accurate.

Description

Testing device of incremental encoder

The technical field is as follows:

the application belongs to the technical field of measurement and control, and particularly relates to a testing device of an incremental encoder.

The background art comprises the following steps:

in the test and after-sales service of factory frontier defense revolving stage, need can the device of the slewing mechanism position and the speed of check-out equipment, incremental encoder can detect slewing mechanism position and speed, by a large amount of applications with digit control machine tool, SMT chip mounter, servo revolving stage on, however have the inaccurate and not high problem of debugging precision of detection in the above-mentioned detection, therefore need design a device that can carry out the test based on pulse number and pulse width.

The utility model has the following contents:

the testing device comprises a testing device body, a testing device body and a testing device body, wherein the testing device body is provided with a plurality of pulse width measuring devices, the testing device body is provided with a plurality of digital tubes, the digital tubes are arranged on the testing device body, and the testing device body is provided with a plurality of pulse width measuring devices.

In order to solve the technical problem, the testing device of the incremental encoder comprises a pulse processing system, a counter and a display circuit, wherein the pulse processing system comprises a single chip microcomputer, an edge trigger, a differential circuit, a decoder, a memory and the like and is used for counting the number of pulses of the encoder and calculating the pulse width; the display circuit comprises a decoder, an OR gate, a rising edge latch and a nixie tube and is used for displaying the pulse number and the pulse width of the encoder.

Furthermore, the model of the single chip microcomputer is 80C196KC16 bits, the model of the differential circuit is 75175, and the model of the edge trigger is a rising edge latch.

Further, the counter is a single chip microcomputer T2 counter, the counter is 16-bit, and the highest count is 63335.

Further, the display circuit has a decoder model of 74LS138, or gate model of 74LS32, and rising edge latch model of 74LS374, and the rising edge latch 74LS32 couples the write signal to the 74LS138 decoder or generates a rising edge for latching the display data.

The beneficial effect that testing arrangement of this application produced does: the encoder is coaxial with the rotary table, the number of pulses represents an angle, the number of pulses of the encoder can be detected by detecting the pulses, the speed is further calculated by the pulse width, and the wider the pulse is, the slower the speed is, the narrower the pulse is, and the higher the speed is; can detect rotatory direction according to the AB phase difference, clockwise or anticlockwise, watch the speed and the angle that the encoder exported for the system through the complete machine software of product before comparing, this testing arrangement adds the electric test for the encoder alone, can effectual judgement encoder self function, accomplishes the location accuracy.

Description of the drawings: FIG. 1 is a circuit diagram of a single-chip microcomputer processing circuit;

FIG. 2 is a circuit diagram of a display circuit;

FIG. 3 is a flow chart of pulse display.

The specific implementation mode is as follows:

in order to make the utility model discloses technical means, innovation characteristic, achievement purpose and efficiency that realize are easily understood and are known, and following embodiment combines the attached drawing to be right the utility model provides a testing arrangement of incremental encoder does specifically exposition.

Specifically, the testing device of the incremental encoder comprises a pulse processing system, a counter and a display circuit, wherein the pulse processing system comprises a single chip microcomputer, an edge trigger, a differential circuit, a decoder, a memory and the like, and is used for counting the number of pulses of the encoder and calculating the pulse width; the display circuit comprises a decoder, an OR gate, a rising edge latch and a nixie tube and is used for displaying the pulse number and the pulse width of the encoder.

The main chip devices used in the application are shown in table 2, a single chip microcomputer T2 counter is used, the highest count is 65535, the pulse width is calculated by a high-speed input port HIS.1 of the single chip microcomputer while counting, the pulse width time is 1 millisecond-65535 microsecond, and the conversion speed is as follows: 0.1907 °/s to 12500 °/s.

The processing system also includes a program storage chip and program, the 74LS138 decoder decodes and distributes display digital tube addresses, the rising edge latch 74LS32 phase the write signal with the 74LS138 decoder or generates rising edges to latch display data, the rising edge latch 74LS374 edge flip-flops send the display data to the digital tube driving circuit 74LS48 for digital tube display.

The specific working process comprises the following steps: signals of the encoder A and A \ passing through a differential circuit 75175 are respectively sent to a data end (D) of a rising edge latch 74LS74, a T2CLK pin and a HIS.1 pin of an 80C196KC singlechip; B. the B \ signal is sent to the CLK end of the rising edge latch 74LS74 through a differential circuit 75175, thus when the A phase leads the B phase, the A phase is always high level when the B phase is in the rising edge, the output end (Q) of the rising edge latch 74LS74 outputs high level, when the A phase lags the B phase, the A phase is always low level when the B phase is in the rising edge, the output end (Q) of the 74 outputs low level, the Q signal is connected to the T2UPGN end of the single chip 80C196KC, the high level is added with the count, the low level is subtracted with the count, the T2CLK end counts the number of pulses, the HIS.1 counts the pulse width, the photoelectric switch in-place signal is sent to the P1.1 port, when the turntable rotates, the program can judge that the level of the P1.1 port is 0, but not in-place, the T2 count is 1, proves that the T2 is in-place, the T2 is cleared, the recounting, then the number and the width of the pulses are decimal, and the hexadecimal conversion system is displayed in real time through a nixie tube.

Through the test device of the incremental encoder formed by matching the chip and the device, the pulse number and the pulse width of the incremental encoder can be effectively detected, and the test accuracy and the detection accuracy are improved. The number of pulses of the encoder can be detected by detecting the pulses, the encoder is coaxial with the turntable, and the number of pulses represents the angle, for example: the encoder makes one 3600 pulses, and those 10 numbers represent 1 degree. The speed is calculated by the pulse width, the slower the pulse is wider, the narrower the pulse, the faster the speed. The direction of rotation can be detected, whether clockwise or anticlockwise, and the judgment is made according to the AB phase difference. Four signals, A \ B and B \ of the encoder can be detected and solved through a differential circuit. The speed and the angle of encoder output for the system are watched through the complete machine software of product before comparing, because of the system data is numerous, be difficult for judging whether the trouble of encoder, this testing arrangement adds the electric test for the encoder alone, can effectual judgement encoder self function, accomplish the location accuracy.

The above are only preferred embodiments of the present invention, and not intended to limit the scope and embodiments of the present invention, and those skilled in the art should understand that the equivalent substitutions and obvious changes made by the present invention and the contents shown in the drawings should be included in the scope of the present invention.

Claims

1. A testing device of an incremental encoder is characterized in that: the pulse processing system consists of a singlechip, an edge trigger, a differential circuit, a decoder and a memory and is used for counting the number of pulses of the encoder and calculating the pulse width; the display circuit comprises a decoder, an OR gate, a rising edge latch and a nixie tube and is used for displaying the pulse number and the pulse width of the encoder.

2. The apparatus for testing an incremental encoder as recited in claim 1, wherein: the model of the single chip microcomputer is 80C196KC16 bits, the model of the differential circuit is 75175, and the model of the edge trigger is a rising edge latch.

3. The apparatus for testing an incremental encoder as defined in claim 1, wherein: the counter is a singlechip T2 counter, the counter has 16 bits, and the highest count is 63335.

4. The apparatus for testing an incremental encoder as defined in claim 1, wherein: the decoder model of the display circuit is 74LS138, the OR gate model is 74LS32, the rising edge latch model is 74LS374, and the rising edge latch 74LS32 phase the write signal with the 74LS138 decoder or generates the rising edge to latch the display data.