CN217637684U

CN217637684U - Refrigeration type infrared detector imaging test system

Info

Publication number: CN217637684U
Application number: CN202220838587.3U
Authority: CN
Inventors: 邱国臣; 段于波
Original assignee: Hebei Tianyi Infrared Technology Co ltd
Current assignee: Hebei Tianyi Infrared Technology Co ltd
Priority date: 2022-04-12
Filing date: 2022-04-12
Publication date: 2022-10-21
Anticipated expiration: 2032-04-12

Abstract

The utility model discloses a refrigeration type infrared detector imaging test system, include: the system comprises a circuit board, a core processor FPGA, an analog-to-digital conversion module, a power conversion module, a detector interface and a video conversion chip, wherein the core processor FPGA, the analog-to-digital conversion module, the power conversion module, the detector interface and the video conversion chip are welded on the circuit board; a signal output interface of the detector interface is connected to a core processor FPGA through an analog-to-digital conversion module, the core processor FPGA is connected with a control signal input interface of the detector interface, the core processor FPGA is connected with a video conversion chip, and the video conversion chip is connected with an image output interface; the detector interface is connected with the interface corresponding to the refrigeration type infrared detector. The utility model discloses on integrated circuit board with test circuit, low in manufacturing cost, the function is comparatively comprehensive, and is compatible good, is applicable to the detector of the different grade type different states.

Description

Refrigeration type infrared detector imaging test system

Technical Field

The utility model relates to a refrigeration type infrared detector tests technical field, especially relates to a refrigeration type infrared detector imaging test system.

Background

In recent years, with the development of infrared imaging technology, the imaging scale of infrared detectors is from 320 × 265 to 640 × 512, and further to 1280 × 1024, and the types, specifications, and sizes of infrared detectors are continuously developed and updated and iterated. The manufacture of the infrared detector not only involves various complex process flows, but also needs to perform related tests (also called middle test) when the detector is initially manufactured, and perform tests again when the detector assembly is finally manufactured. The relevant test platform is required for different types of detectors in different states.

The existing special test equipment for the refrigeration type infrared detector is expensive and only aims at a specific detector, and the compatibility is poor. Meanwhile, the cost for developing a special infrared imaging processing circuit is high, the design difficulty is high, the infrared imaging processing circuit cannot be compatible with various detectors, the flexibility is poor, and an imaging test scheme with low cost, comprehensive functions and good compatibility needs to be designed urgently.

SUMMERY OF THE UTILITY MODEL

The utility model aims at providing a refrigeration type infrared detector imaging test system, with test circuit integrated to a circuit board on, low in manufacturing cost, the function is comparatively comprehensive, and is compatible good, is applicable to the detector of the different grade type different states.

In order to achieve the above object, the utility model provides a following scheme:

a refrigerated infrared detector imaging test system comprising: the system comprises a circuit board, and a core processor FPGA, an analog-to-digital conversion module, a power conversion module, a detector interface and a video conversion chip which are welded on the circuit board, wherein the power conversion module is connected with an external power supply and used for supplying power to a system, the power conversion module is connected with an LDO chip, the LDO chip is connected with a power supply interface of the detector interface and used for providing a low-noise power supply for a refrigeration type infrared detector, a signal output interface of the detector interface is connected to the core processor FPGA through the analog-to-digital conversion module, the core processor FPGA is connected with a control signal input interface of the detector interface, the core processor FPGA is connected with the video conversion chip, the video conversion chip is connected with an image output interface, and the image output interface is connected with a display through a cable; the detector interface is connected with an interface corresponding to the refrigeration type infrared detector.

Furthermore, a key switch is welded on the circuit board and electrically connected with the core processor FPGA.

Furthermore, a DDR data storage module is welded on the circuit board and electrically connected to the SRAM interface of the FPGA.

Further, a FLASH chip is welded on the circuit board and electrically connected to a FLASH interface of the core processor FPGA.

According to the utility model provides a concrete embodiment, the utility model discloses a following technological effect: the utility model provides a refrigeration type infrared detector imaging test system, weld dress core processor FPGA, analog-to-digital conversion module, power conversion module and video conversion chip on the circuit board in a concentrated way, realize the integration of hardware circuit, simple structure to set up each interface, it is convenient to connect; refrigeration type infrared detector passes through the lead wire and links to each other with the circuit board to FPGA is processing core, accomplishes survey in the detector and subassembly test, can be used for conventional tests such as the heterogeneity of detector, blind pixel rate, imaging effect, can compatible multiple detector type and interface simultaneously, and development cost is lower, is convenient for utilize this test system large-scale development test work.

Drawings

In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the drawings required to be used in the embodiments will be briefly described below, and it is obvious that the drawings in the following description are only some embodiments of the present invention, and for those skilled in the art, other drawings can be obtained according to these drawings without inventive labor.

Fig. 1 is a schematic structural diagram of an imaging test system of a refrigeration-type infrared detector according to an embodiment of the present invention;

fig. 2 is the embodiment of the utility model provides a refrigeration type infrared detector imaging test system's working principle diagram.

Detailed Description

The technical solutions in the embodiments of the present invention will be described clearly and completely with reference to the drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only some embodiments of the present invention, not all embodiments. Based on the embodiments in the present invention, all other embodiments obtained by a person skilled in the art without creative work belong to the protection scope of the present invention.

In order to make the above objects, features and advantages of the present invention more comprehensible, the present invention is described in detail with reference to the accompanying drawings and the detailed description.

As shown in fig. 1, the embodiment of the utility model provides a refrigeration type infrared detector imaging test system, include: the circuit board comprises a circuit board, and a core processor FPGA, an analog-to-digital conversion module, a power conversion module, a detector interface and a video conversion chip which are welded on the circuit board, wherein the power conversion module is connected with an external power supply and used for supplying power to a system, the power conversion module is connected with an LDO chip, the LDO chip is connected with a power supply interface of the detector interface and used for providing a low-noise power supply for the refrigeration type infrared detector, a signal output interface of the detector interface is connected to the core processor FPGA through the analog-to-digital conversion module, the core processor FPGA is connected with a control signal input interface of the detector interface, the core processor FPGA is connected with the video conversion chip, and the video conversion chip is connected with an image output interface; the image output interface is connected with the display through a cable; the detector interface is connected with an interface corresponding to the refrigeration type infrared detector.

And the circuit board is also welded with a key switch, and the key switch is electrically connected with the core processor FPGA. And a DDR data storage module is welded on the circuit board and is electrically connected to the SRAM interface of the core processor FPGA. And a FLASH chip is welded on the circuit board and is electrically connected to a FLASH interface of the core processor FPGA.

Wherein, DDR data memory module: adopting 16 bit 32M DDR2;

a FLASH chip: 16M × 8;

the power supply conversion module: the DCDC power supply conversion module outputs 20W of power consumption to the maximum;

a video conversion chip: ADV7123.

The system takes the FPGA as a processing core to complete the functions of digital driving, analog-to-digital conversion control, signal processing, image output and the like of the detector; the circuit provides a low-noise power supply for the refrigeration type infrared detector through the LDO chip; converting an analog signal output by the refrigeration type infrared detector into a digital signal through an analog-to-digital conversion module; outputting the image through a special video conversion chip; the key switch on the power-on circuit adjusts the hardware state, the digital signal frequency, the image output content and the like.

As shown in fig. 2, the main working principle of the imaging test system of the refrigeration-type infrared detector is as follows: collecting and controlling an analog signal; outputting a detector digital driving signal; the functions of non-uniformity correction, blind pixel filling, nonlinear histogram, image enhancement, electronic amplification and the like of the infrared image are completed; the original and processed image output is completed, and the related software program part can be realized by referring to the existing testing technology in the field.

The Dewar or the detector component in the detector is connected with the imaging test system according to the instruction of a relevant manual, the test circuit is electrified and connected with the display, the working state of the detector is adjusted through a circuit key switch or a processor according to the test requirement, and various performance indexes of the detector image are tested through video image or acquisition calculation.

The utility model provides a refrigeration type infrared detector imaging test system, weld dress core processor FPGA, analog-to-digital conversion module, power conversion module and video conversion chip on the circuit board in a concentrated way, realize the integration of hardware circuit, simple structure to set up each interface, it is convenient to connect; refrigeration type infrared detector passes through the lead wire and links to each other with the circuit board to FPGA is processing core, accomplishes survey in the detector and subassembly test, can be used for conventional tests such as the heterogeneity of detector, blind pixel rate, imaging effect, can compatible multiple detector type and interface simultaneously, and development cost is lower, only need change core processor FPGA's relevant procedure, utilizes the large-scale test work that develops of this test system.

The principle and the implementation of the present invention are explained herein by using specific examples, and the above description of the embodiments is only used to help understand the method and the core idea of the present invention; meanwhile, for the general technical personnel in the field, according to the idea of the present invention, there are changes in the concrete implementation and the application scope. In summary, the content of the present specification should not be construed as a limitation of the present invention.

Claims

1. A refrigerated infrared detector imaging test system, comprising: the system comprises a circuit board, and a core processor FPGA, an analog-to-digital conversion module, a power conversion module, a detector interface and a video conversion chip which are welded on the circuit board, wherein the power conversion module is connected with an external power supply and used for supplying power to a system, the power conversion module is connected with an LDO chip, the LDO chip is connected with a power supply interface of the detector interface and used for providing a low-noise power supply for a refrigeration type infrared detector, a signal output interface of the detector interface is connected to the core processor FPGA through the analog-to-digital conversion module, the core processor FPGA is connected with a control signal input interface of the detector interface, the core processor FPGA is connected with the video conversion chip, the video conversion chip is connected with an image output interface, and the image output interface is connected with a display through a cable; the detector interface is connected with an interface corresponding to the refrigeration type infrared detector.

2. The imaging test system of the refrigeration type infrared detector as claimed in claim 1, wherein a key switch is further soldered on the circuit board, and the key switch is electrically connected with the core processor FPGA.

3. The imaging test system of the refrigeration-type infrared detector as claimed in claim 1, wherein a DDR data storage module is further soldered on the circuit board, and the DDR data storage module is electrically connected to the SRAM interface of the FPGA core processor.

4. The imaging test system of the infrared detector of claim 1, wherein a FLASH chip is further soldered to the circuit board, and the FLASH chip is electrically connected to a FLASH interface of the FPGA core processor.