CN217544541U - Mass spectrum analysis device and ion source illumination imaging system thereof - Google Patents

Abstract

The utility model relates to a mass spectrometry instrumentation technical field discloses an ion source illumination imaging system, including the ion source unit, lighting unit and imaging unit, the ion source unit includes the ion source cavity, electric field device and target plate accelerate, the inside of ion source cavity is located to the electric field device with higher speed, the target plate is located the below of ion source cavity, the target plate is used for placing the sample, lighting unit and imaging unit are connected with the ion source cavity, lighting unit is used for sending the illumination light of shining on the surface of sample, imaging unit is used for receiving the illumination light of sample reflection in order to be used for the sample formation of image, light path between the sample on lighting unit and the target plate does not pass through electric field device with higher speed, can make imaging unit only catch the image of the sample on the target plate, can make final formation of image clear, the background is not mixed and disorderly, it is effectual to form image. Additionally, the utility model provides a mass spectrometry device, including mobile unit and above-mentioned ion source illumination imaging system, the mobile unit is used for driving the target plate and removes.

Description

Mass spectrum analysis device and ion source illumination imaging system thereof

Technical Field

The utility model relates to a mass spectrometry detecting instrument technical field especially relates to a mass spectrometry device and ion source illumination imaging system thereof.

Background

Mass spectrometry devices, also known as mass spectrometers. The matrix-assisted laser desorption time-of-flight mass spectrometer is a novel soft ionization organic mass spectrometer developed in recent years. The matrix-assisted laser desorption time-of-flight mass spectrometer, MALDI-TOFMS for short, is a widely used biological mass spectrometer. The matrix-assisted laser desorption time-of-flight mass spectrometer combines a matrix-assisted laser desorption (MALDI) ion source with a time-of-flight mass spectrometry (TOFMS) detection technology, and gradually becomes an important means for analyzing biomacromolecules such as protein, polypeptide, nucleic acid and the like. The aim of identifying the microorganisms can be achieved by drawing a protein ion peak map of the microorganisms by using MALDI-TOFMS and then comparing mass spectrum data of clinical microorganisms with a standard protein fingerprint map database.

In analysis, a sample to be analyzed is mixed with a matrix to form a co-crystal, and when the co-crystal is irradiated by laser of MALDI-TOFMS, the energy of the laser is absorbed by the matrix and then transferred to molecules of the sample, so that desorption and ionization processes are generated in the sample, and thus, the molecules of the sample are ionized. Particles produced by ionization of the sample are accelerated under the influence of the electric field and eventually reach the time-of-flight mass spectrometer detector. The different species will arrive at the mass spectrometer detector at different times, so that the molecular weight of the ions can be accurately calculated from the arrival times of the different ions.

The existing mass spectrometer generally comprises a laser unit, an ion source unit, an illumination unit and an imaging unit, wherein a sample mixed with a matrix to form a cocrystal is placed on a target plate, the target plate is then placed below the ion source unit, laser emitted by the laser unit passes through the ion source unit and irradiates on the sample on the target plate, the sample absorbs energy of the laser to generate desorption and ionization, and ions generated by ionization of the sample reach a time-of-flight mass spectrometer detector through acceleration of the ion source unit. In order to be able to see the state of the sample being ionized at different target positions, it is therefore necessary for the imaging unit to capture an image of the sample, and in order to ensure the field of view, it is therefore necessary for the illumination unit to provide illumination. However, the current illumination unit is disposed above the ion source unit, the illumination light emitted by the illumination unit is irradiated onto the sample through the optical reflection mechanism, and the target plate on which the sample is disposed below the accelerating electric field device, so the illumination light emitted by the illumination unit can be irradiated onto the sample through the accelerating electric field device. The accelerating electric field device is composed of two electrode plates which are arranged up and down, and the middle parts of the electrode plates are of a grid structure. The illumination light irradiates the sample through the electrode plate, the grid structure on the electrode is captured by the imaging unit together with the sample, and the imaging image is as shown in fig. 10, so that the picture taken by the imaging unit is interfered by the electrode plate, and the imaging effect is poor.

The prior art discloses a light path and high-voltage electric field applying device for MALDI, which comprises a main body, wherein a main cavity and an ion extraction accelerating region located at the bottom end of the main cavity are arranged in the main body, a laser device, an imaging device and a combination device are also arranged in the main cavity, the laser device, the imaging device and the combination device are respectively provided with an extension channel extending from the surface of the main body to the ion extraction accelerating region, the laser device and the imaging device are respectively located at two sides of the combination device, and a predetermined included angle is formed between a channel of the combination device and a channel of the laser device and a channel of the imaging device; an ion lens assembly for focusing ions is arranged in the combined device; a focusing lens group for focusing laser is arranged in the laser device, and a lens group is arranged in the imaging device; and the ion leading-out accelerating area is also internally provided with a plate electrode for generating a pulse electric field, the plate electrode is positioned below the laser device, the imaging device and the combination device, and the plate electrode is provided with an opening corresponding to the light path and the ion path. Still be equipped with lighting device in the main part of this patent, lighting device includes first lighting component and second lighting component, first lighting component and second lighting component are all including setting up sealed chamber and the leaded light optic fibre on the main part surface, the sealed intracavity is equipped with the light, the one end of leaded light optic fibre stretches into sealed intracavity, the other end stretches into the ion and draws with higher speed regional, then the illumination of light is conducted to the ion through this leaded light optic fibre and is drawn with higher speed regional, see through the plate electrode and provide the illumination to the sample. Therefore, the illumination of the light of this patent can shine the sample through the electrode plate on, leads to the grid of electrode plate can be shot by image device with the sample together, leads to having the grid structure of electrode plate on the picture of shooing, can cause the sheltering from, blurring etc. to the sample, has the interference to the formation of image of sample, and the imaging effect is not good.

SUMMERY OF THE UTILITY MODEL

The utility model aims at providing an effectual mass spectrometry device of formation of image and ion source illumination imaging system thereof.

In order to realize the above object, the utility model provides an ion source illumination imaging system, including ion source unit, lighting unit and formation of image unit, the ion source unit includes ion source cavity, acceleration electric field device and target plate, acceleration electric field device locates the inside of ion source cavity, the target plate is located the below of ion source cavity, the target plate is used for placing the sample, lighting unit with the formation of image unit with the ion source cavity is connected, lighting unit is used for sending and shines the illumination light on the surface of sample, the formation of image unit is used for receiving the illumination light of sample reflection is in order to be used for the sample formation of image, lighting unit with light path between the sample on the target plate does not pass through acceleration electric field device.

As a preferred scheme, the accelerating electric field device includes a first pole piece and a second pole piece, the first pole piece and the second pole piece are arranged in parallel at an interval, the first pole piece is located above the second pole piece, and a light path between the illumination unit and the sample on the target plate does not pass through the first pole piece and the second pole piece.

Preferably, the exit point of the illumination unit emitting the illumination light is closer to the target plate than the second pole piece.

Preferably, the lighting unit comprises a connecting plate and a light-emitting assembly, one end of the connecting plate is connected with the ion source cavity, and the light-emitting assembly is connected to the connecting plate.

Preferably, the light emitting assembly comprises a light source, a first sleeve and a second sleeve, the first sleeve is rotatably connected with the connecting plate, the second sleeve is detachably connected with the first sleeve, and the light source is located in a cylinder formed by connecting the second sleeve and the first sleeve.

Preferably, the imaging unit includes a camera, a lens and a planar window, the lens and the camera are sequentially arranged from an object side to an image side along an optical axis, the lens can adjust a magnification and a focal length, the ion source cavity is provided with a mounting hole communicated with the inside of the ion source cavity, and the planar window is arranged in the mounting hole.

Preferably, the imaging unit further includes a filter device, and the filter device is disposed between the camera and the lens.

Preferably, the ion source unit further comprises a focusing barrel, the focusing barrel is vertically connected with the ion source cavity, one end of the focusing barrel extends into the ion source cavity, the accelerating electric field device and the focusing barrel are located on the same straight line, and a certain included angle is formed between the axis of the imaging unit and the focusing barrel.

The utility model also provides a mass spectrometry device, including mobile unit and above-mentioned ion source illumination imaging system, the target plate set up in on the mobile unit, the mobile unit is used for driving the target plate removes along X axle and Y axle direction.

As the preferred scheme, the mobile unit includes X axle moving mechanism, Y axle moving mechanism and loads the seat, load the seat X axle moving mechanism with Y axle moving mechanism sets gradually from top to bottom, X axle moving mechanism drives load the seat and remove along X axle direction, Y axle moving mechanism drives X axle moving mechanism removes along Y axle direction.

Compared with the prior art, the beneficial effects of the utility model reside in that:

the utility model discloses a sample on the target board is shot for the imaging unit to the lighting unit provides illumination, because the light path between the sample on lighting unit and the target board is not through accelerating the electric field device, can prevent to block out the sample with higher speed the electric field device, and prevent to accelerate the electric field device and form the projection on the target board, reflect light etc. and lead to the fuzzy problem of sample formation of image, make the imaging unit only catch the image of the sample on the target board, can make final formation of image clear, do not have ambient noise, it is effectual to form an image.

Drawings

Fig. 1 is a schematic view illustrating a first view angle structure of an ion source illumination imaging system according to an embodiment of the present invention.

Fig. 2 is a schematic diagram of a second view angle structure of an ion source illumination imaging system according to an embodiment of the present invention.

Fig. 3 isbase:Sub>A sectional view taken along the linebase:Sub>A-base:Sub>A in fig. 2.

Fig. 4 is an exploded view of a first view angle of an ion source illumination imaging system according to an embodiment of the present invention.

Fig. 5 is an exploded view of a second viewing angle of an ion source illumination imaging system according to an embodiment of the present invention.

Fig. 6 is a sectional view taken along the direction of fig. 5B-B.

Fig. 7 is an optical path diagram of an ion source illumination imaging system according to an embodiment of the present invention.

Fig. 8 is a schematic structural diagram of a mass spectrometer according to an embodiment of the present invention.

Fig. 9 is a cross-sectional view of a mass spectrometer apparatus according to an embodiment of the present invention.

FIG. 10 is a schematic representation of prior art sample target imaging.

Fig. 11 is a schematic diagram of sample target imaging according to an embodiment of the present invention.

In the figure, 100-ion source unit; 110-an ion source chamber; 111-mounting holes; 120-target plate; 130-a first pole piece; 140-a second pole piece; 150-a focusing barrel; 200-a lighting unit; 210-a connecting plate; 211-a first connection; 212-a second connection; 220-a light source; 230-a first sleeve; 240-a second sleeve; 300-an imaging unit; 310-a camera; 320-lens; 330-a planar window; 340-filtering means; 350-window sealing ring; 360-fixing block; 370-a lens mount; 400-a mobile unit; 410-X axis movement mechanism; 420-Y axis moving mechanism; 430-load seat.

Detailed Description

The following detailed description of the embodiments of the present invention is provided with reference to the accompanying drawings and examples. The following examples are intended to illustrate the invention, but are not intended to limit the scope of the invention.

In the description of the present invention, it should be noted that the terms "center", "longitudinal", "lateral", "up", "down", "front", "back", "left", "right", "vertical", "horizontal", "top", "bottom", "inner", "outer", and the like indicate the orientation or positional relationship based on the orientation or positional relationship shown in the drawings, and are only for convenience of description and simplification of the description, but do not indicate or imply that the device or element referred to must have a specific orientation, be constructed and operated in a specific orientation, and thus, should not be construed as limiting the present invention. Furthermore, the terms "first," "second," and "third" are used for descriptive purposes only and are not to be construed as indicating or implying relative importance.

In the description of the present invention, it is to be noted that, unless otherwise explicitly specified or limited, the terms "mounted," "connected," and "connected" are to be construed broadly, and may be, for example, fixedly connected, detachably connected, or integrally connected; can be mechanically or electrically connected; they may be connected directly or indirectly through intervening media, or they may be interconnected between two elements. The specific meaning of the above terms in the present invention can be understood in specific cases to those skilled in the art.

Example one

As shown in fig. 1 to 7, the present invention provides an ion source illumination imaging system, including an ion source unit 100, an illumination unit 200 and an imaging unit 300, the ion source unit 100 includes an ion source cavity 110, an accelerating electric field device and a target plate 120, the accelerating electric field device is disposed inside the ion source cavity 110, the target plate 120 is disposed below the ion source cavity 110, the illumination unit 200 and the imaging unit 300 are connected to the ion source cavity 110, the target plate 120 is used for placing a sample, the illumination unit 200 is used for emitting illumination light irradiated on the surface of the sample, the imaging unit 300 is used for receiving illumination light reflected by the sample for imaging the sample, and a light path between the illumination unit 200 and the sample on the target plate 120 does not pass through the accelerating electric field device. The illumination unit 200 of this embodiment provides illumination for the imaging unit 300 shoots the sample on the target plate 120, because the light path between the sample on illumination unit 200 and the target plate 120 does not pass through accelerating electric field device, can prevent accelerating electric field device and shelter from the sample, and prevent accelerating electric field device and form the projection on the target plate 120, the reflection of light etc. and lead to the blurred problem of sample formation, make imaging unit 300 only catch the image of the sample on the target plate 120, can make final formation of image clear, no ambient noise, it is effectual to form images.

In the present embodiment, the electric field acceleration device includes a first pole piece 130 and a second pole piece 140, the first pole piece 130 and the second pole piece 140 are disposed in parallel and spaced apart, the first pole piece 130 is located above the second pole piece 140, and the optical path between the illumination unit 200 and the sample on the target plate 120 does not pass through the first pole piece 130 and the second pole piece 140. The first and second pole pieces 130 and 140 are used to form an accelerating electric field. The first pole piece 130 of the present embodiment is used for loading an exponential pulse voltage, and the second pole piece 140 is used for loading a square pulse voltage, wherein the frequency of the exponential pulse voltage is the same as that of the square pulse voltage, and the ions generated by ionizing the sample are accelerated under the exponential pulse voltage and the square pulse voltage, so that the ions with the same mass number reach the detector at the same time.

The ion source illumination imaging system of the present embodiment further includes an optical reflection mechanism, and the illumination light emitted from the illumination unit 200 is reflected by the optical reflection mechanism and irradiated onto the sample on the target plate 120. The accelerating electric field device is not located on the optical path between the illumination unit 200 and the optical reflection mechanism, nor is the accelerating electric field device located on the optical path of the illumination light reflected by the optical reflection mechanism. It should be noted that there is, and only the target plate 120 in the optical path of the illumination light reflected by the optical reflection mechanism.

Example two

The difference between the present embodiment and the first embodiment is that, on the basis of the first embodiment, the present embodiment further describes the lighting unit 200.

In the present embodiment, the exit point of the illumination light from the illumination unit 200 is closer to the target board 120 than the second diode 140. That is, the exit point of the illumination unit 200 of the present embodiment emitting the illumination light is lower than the second pole piece 140, so that the illumination unit 200 emitting the illumination light can be ensured not to pass through the first pole piece 130 and the second pole piece 140. In addition, the illumination unit 200 is close to the target plate 120, so that more sufficient illumination can be provided and the brightness of the image can be improved.

Further, the illumination unit 200 of the present embodiment emits illumination light to be directed onto the target board 120, and the illumination light emitted from the illumination unit 200 does not pass through the optical reflection mechanism. Therefore, there is no optical reflection mechanism between the illumination unit 200 and the target plate 120 of the embodiment, so that the ion source illumination imaging system has fewer components, is simpler and more convenient to install, reduces the cost, and has a compact structure, a small volume, and a higher imaging definition, thereby simplifying the structure of the mass spectrometer, facilitating the control of the cost, and having a small volume.

The illumination unit 200 of the present embodiment includes a connection plate 210 and a light emitting module, wherein one end of the connection plate 210 is connected to the ion source cavity 110, and the light emitting module is connected to the connection plate 210. The light emitting assembly can be mounted in the ion source cavity 110 through the connecting plate 210, so that the exit point of the illumination unit 200 emitting the illumination light is lower than the second diode 140. The connecting plate 210 includes a first connecting portion 211 and a second connecting portion 212, the first connecting portion 211 is parallel to the inner wall of the ion source cavity 110, the first connecting portion 211 is connected to the inner wall of the ion source cavity 110, one end of the second connecting portion 212 is connected to the first connecting portion 211, the second connecting portion 212 is inclined and downwardly disposed from one end connected to the first connecting portion 211 to one end far away from the first connecting portion 211, one end far away from the first connecting portion 211 of the second connecting portion 212 is closer to the second pole piece 140 relative to one end connected to the first connecting portion 211, the distance between the light-emitting assembly and the target plate 120 can be shortened, the provided illumination is more sufficient, the imaging is clearer, and the installation is convenient.

Specifically, the light emitting assembly includes a light source 220, a first sleeve 230 and a second sleeve 249, the first sleeve 230 is rotatably connected to the connecting plate 210, the second sleeve 240 is detachably connected to the first sleeve 230, and the light source 220 is located in a barrel formed by connecting the second sleeve 240 and the first sleeve 230. The light source 220 is located in the barrel formed by connecting the second sleeve 240 and the first sleeve 230, so that the light source 220 can be protected, and the light source 220 can be conveniently installed. The second sleeve 240 is detachably connected with the first sleeve 230, so that the second sleeve 240 can be detached, and the light source 220 can be replaced conveniently. In this embodiment, the second sleeve 240 is threadedly coupled to the first sleeve 230. The first sleeve 230 is rotatably connected to the connection plate 210, so as to adjust the optical path of the illumination light emitted from the light source 220, and ensure that the illumination light irradiates the surface of the sample on the target plate 120.

Optionally, the light source 220 of the present embodiment employs an LED lamp, and the light emitting assembly further includes a PWM control circuit, and the brightness of the light source 220 is adjusted by the PWM control circuit.

Other structures of this embodiment are the same as those of the first embodiment, and are not described herein again.

EXAMPLE III

The present embodiment is different from the second embodiment in that, on the basis of the second embodiment, the present embodiment further describes the imaging unit 300.

In this embodiment, the imaging unit 300 includes a camera 310, a lens 320 and a plane window 330, the lens 320 and the camera 310 are sequentially arranged from an object side to an image side along an optical axis, the lens 320 can adjust a magnification and a focal length, the ion source chamber 110 has a mounting hole 111 communicating with an inside thereof, and the plane window 330 is disposed in the mounting hole 111. The lens 320 can move along the optical axis, and by rotating the lens 320, the imaging definition can be adjusted, and the imaging quality can be adjusted to the clearest image quality.

Further, the imaging unit 300 of the present embodiment further includes a filter device 340, and the filter device 340 is disposed between the camera 310 and the lens 320. The filter device 340 can filter most of the laser with the wavelength of 400nm, thereby greatly reducing the problem of imaging overexposure and facilitating the accurate finding of the spot focus when the light path is debugged. Reducing damage to the camera 310 from ultraviolet light.

In this embodiment, the imaging unit 300 further includes two window sealing rings 350, two fixing blocks 360 and a lens fixing member 370, the two window sealing rings 350 are disposed, the planar window 330 is disposed between the two window sealing rings 350, the planar window 330 and the two window sealing rings 350 are disposed in the mounting hole 111, and the fixing block 360 is connected to the ion source cavity 110. The lens 320 is connected with the lens fixing member 370 and the fixing block 360, an inner wall of a lower end of the lens 320 is provided with an internal thread, an outer wall of the lower end is provided with an external thread, an outer wall of the fixing block 360 is provided with an external thread, an inner wall of the lens fixing member 370 is provided with an internal thread, the internal thread of the lens 320 is connected with the external thread of the fixing block 360, and the external thread of the lens 320 is connected with the internal thread of the lens fixing member 370. By rotating the lens 320, the lens 320 moves relative to the fixed block 360, so that the image definition is adjusted. In this embodiment, the fixing block 360 is a quartz plane window, the camera 310 is an industrial camera, and the filter device 340 is in threaded connection with the lens 320.

During installation, one window sealing ring 350 is placed in the installation hole 111, the plane window 330 is placed in the installation hole, the other window sealing ring 350 is placed in the installation hole, the fixing block 360 is connected with the ion source cavity 110 through bolts, the fixing block 360 is located outside the ion source cavity 110, and the fixing block 360 enables the window sealing ring 350 and the fixing block 360 to be limited on the ion source cavity 110. Then, the internal thread of the lens fixing member 370 is screwed to the external thread of the lower end of the lens 320, and then the internal thread of the lower end of the lens 320 is screwed to the external thread of the fixing block 360. Then, the external thread of the filter 340 is screwed on the internal thread of the lens 320, and the camera 310 is mounted on the filter 340 after the rotation angle is adjusted. Finally, the internal thread of the lens holder 370 is screwed on the external thread of the fixing block 360.

In addition, the ion source unit 100 of the present embodiment further includes a focusing barrel 150, the focusing barrel 150 is vertically connected to the ion source cavity 110, one end of the focusing barrel 150 extends into the ion source cavity 110, the accelerating electric field device and the focusing barrel 150 are located on the same straight line, and the axis of the imaging unit 300 forms a certain included angle with the focusing barrel 150. The ion source illumination imaging system of the embodiment is used in cooperation with the laser unit of the mass spectrometer, the mass spectrometer further comprises the laser unit, the laser unit is used for emitting laser, the laser is emitted into the ion source cavity 110 through the gathering cylinder 150, and irradiates the surface of the sample on the target plate 120 through the ion source cavity 110. The axis of the imaging unit 300 and the focusing barrel 150 form a certain included angle, which can prevent the mutual interference between the light path of the laser and the light path of the illumination light reflected by the sample, and the illumination light reflected by the sample can directly enter the imaging unit 300 without passing through an optical reflection mechanism, thereby reducing the components of the ion source illumination imaging system and the mass spectrometry device thereof, simplifying the structure, simplifying the installation, reducing the cost, and enabling the structure of the ion source illumination imaging system and the mass spectrometry device thereof to be compact and small, and simultaneously enabling the imaging to be clearer. The optical path of the illumination light emitted by the illumination unit 200 of the present embodiment and the optical path of the illumination light reflected by the sample are shown in fig. 7.

Other structures of this embodiment are the same as those of the embodiment, and are not described herein again.

Example four

As shown in fig. 8 and 9, a mass spectrometry apparatus according to a preferred embodiment of the present invention includes the ion source illumination imaging system according to the first embodiment, the second embodiment, or the third embodiment.

In this embodiment, the mass spectrometer further includes a moving unit 400, the target plate 120 is disposed on the moving unit 400, and the moving unit 400 is configured to drive the target plate 120 to move along the X-axis and the Y-axis directions. The moving unit 400 can drive the target plate 120 to move, so that the illumination light emitted by the illumination unit 200 is always focused on the sample target point on the target plate 120, and a sufficient light-entering amount is provided for the imaging of the sample target point.

Specifically, the moving unit 400 of the present embodiment includes an X-axis moving mechanism 410, a Y-axis moving mechanism 420, and a loading base 430, where the loading base 430, the X-axis moving mechanism 410, and the Y-axis moving mechanism 420 are sequentially disposed from top to bottom, the X-axis moving mechanism 410 drives the loading base 430 to move along the X-axis direction, and the Y-axis moving mechanism 420 drives the X-axis moving mechanism 410 to move along the Y-axis direction. The target plate 120 is placed on the loading seat 430, and the adjustment of the target point of the sample can be realized by the movement of the loading seat 430 and the X-axis moving mechanism 410.

Optionally, the X-axis moving mechanism 410 of this embodiment is provided with a first motor and a first lead screw slider mechanism, the first motor is in transmission connection with the first lead screw slider mechanism, the Y-axis moving mechanism 420 is provided with a second motor and a second lead screw slider mechanism, and the second motor is in transmission connection with the second lead screw slider mechanism. The X-axis moving mechanism 410 is connected to the slider of the second lead screw slider mechanism, and the loading base 430 is connected to the slider of the first lead screw slider mechanism.

Other structures of this embodiment are the same as those of this embodiment, and are not described herein again.

To sum up, the embodiment of the utility model provides an ion source illumination imaging system, its lighting unit 200 provides illumination for the imaging unit 300 shoots the sample on the target plate 120, because the light path between the sample on lighting unit 200 and the target plate 120 does not pass through with higher speed electric field device, can prevent to block out the sample with higher speed electric field device, and prevent to form the projection with higher speed electric field device on the target plate 120, the reflection of light etc. and lead to the blurred problem of sample formation, make imaging unit 300 only catch the image of the sample on the target plate 120, can make final formation of image clear, no ambient noise, it is effectual to form images. And, the exit point that lighting unit 200 sent the illumination light is less than the second pole piece 140 of the acceleration electric field device of ion source unit 100, can guarantee that the illumination light that lighting unit 200 sent does not pass through first pole piece 130 and second pole piece 140, lets lighting unit 200 be nearer apart from target plate 120, makes the illuminance of the illumination light that provides sufficient, moreover the utility model discloses between lighting unit 200 and the target plate 120, all there is not optical reflection mechanism between target plate 120 and the imaging element 300, simplified structure makes the instrument simple installation, reduce cost, and makes ion source illumination imaging system and mass spectrometry device's compact structure, small. In addition, a filter device 340 is disposed between the camera 310 and the lens 320 of the imaging unit 300. The filter device 340 can filter out the laser with specific wavelength, greatly reducing the problem of imaging overexposure, and facilitating the accurate finding of the spot focus when debugging the light path. Reducing damage to the camera 310 from ultraviolet light. Furthermore, the embodiment of the present invention further provides a mass spectrometry device, which includes a moving unit 400 and the above-mentioned ion source illumination imaging system, wherein the moving unit 400 can drive the target plate 120 to move, so that the illumination light emitted by the illumination unit 200 is always focused on the sample target point on the target plate 120.

The foregoing is only a preferred embodiment of the present invention, and it should be noted that, for those skilled in the art, a plurality of modifications and replacements can be made without departing from the technical principle of the present invention, and these modifications and replacements should also be regarded as the protection scope of the present invention.

Claims (10)

1. An ion source illumination imaging system is characterized by comprising an ion source unit (100), an illumination unit (200) and an imaging unit (300), wherein the ion source unit (100) comprises an ion source cavity (110), an acceleration electric field device and a target plate (120), the acceleration electric field device is arranged inside the ion source cavity (110), the target plate (120) is positioned below the ion source cavity (110), the target plate (120) is used for placing a sample, the illumination unit (200) and the imaging unit (300) are connected with the ion source cavity (110), the illumination unit (200) is used for emitting illumination light irradiating the surface of the sample, the imaging unit (300) is used for receiving the illumination light reflected by the sample for sample imaging, and the light path between the illumination unit (200) and the sample on the target plate (120) does not pass through the acceleration electric field device.

2. The ion source illumination imaging system of claim 1, wherein the accelerating electric field device comprises a first pole piece (130) and a second pole piece (140), the first pole piece (130) and the second pole piece (140) are arranged in parallel and spaced apart, and the first pole piece (130) is located above the second pole piece (140), and an optical path between the illumination unit (200) and a sample on the target plate (120) does not pass through the first pole piece (130) and the second pole piece (140).

3. The ion source illumination imaging system of claim 2, wherein the exit point of the illumination unit (200) emitting illumination light is closer to the target plate (120) than the second pole piece (140).

4. The ion source illumination imaging system of claim 3, wherein the illumination unit (200) comprises a connection plate (210) and a light emitting assembly, one end of the connection plate (210) is connected with the ion source cavity (110), and the light emitting assembly is connected on the connection plate (210).

5. The ion source illumination imaging system of claim 4, wherein the light emitting assembly comprises a light source (220), a first sleeve (230) and a second sleeve (240), the first sleeve (230) is rotatably connected to the connecting plate (210), the second sleeve (240) is detachably connected to the first sleeve (230), and the light source (220) is located in a cylinder formed by the second sleeve (240) and the first sleeve (230) in a connected manner.

6. The ion source illumination imaging system of claim 1, wherein the imaging unit (300) comprises a camera (310), a lens (320) and a plane window (330), the lens (320) and the camera (310) are arranged in sequence from an object side to an image side along an optical axis, the lens (320) can adjust a magnification and a focal length, the ion source cavity (110) is provided with a mounting hole (111) communicated with the inside thereof, and the plane window (330) is arranged in the mounting hole (111).

7. The ion source illumination imaging system of claim 6, wherein the imaging unit (300) further comprises a filter device (340), the filter device (340) being disposed between the camera (310) and the lens (320).

8. The ion source illumination imaging system of claim 1, wherein the ion source unit (100) further comprises a focusing barrel (150), the focusing barrel (150) is vertically connected with the ion source cavity (110), one end of the focusing barrel (150) extends into the ion source cavity (110), the accelerating electric field device and the focusing barrel (150) are located on the same straight line, and the axis of the imaging unit (300) forms an included angle with the focusing barrel (150).

9. A mass spectrometry apparatus comprising a moving unit (400) and the ion source illumination imaging system according to any one of claims 1 to 8, wherein the target plate (120) is disposed on the moving unit (400), and the moving unit (400) is configured to move the target plate (120) along X-axis and Y-axis directions.

10. The mass spectrometry apparatus according to claim 9, wherein the moving unit (400) comprises an X-axis moving mechanism (410), a Y-axis moving mechanism (420) and a loading base (430), the X-axis moving mechanism (410) and the Y-axis moving mechanism (420) are sequentially arranged from top to bottom, the X-axis moving mechanism (410) drives the loading base (430) to move along the X-axis direction, and the Y-axis moving mechanism (420) drives the X-axis moving mechanism (410) to move along the Y-axis direction.

Images