CN217506010U - Power-on test device - Google Patents

Abstract

The application provides an electrification testing device which comprises a first die holder, a second die holder, a probe and a pressure head, wherein the first die holder comprises a metal supporting piece, the first die holder bears a product, and the metal supporting piece bears a needle body of the product; the second die holder is opposite to the first die holder; the probe is connected to the second die holder and is arranged corresponding to the needle body; the pressure head is connected to the second die holder and is arranged opposite to the product; when the first die holder and/or the second die holder are/is driven, the pressure head abuts against and drives the product to be attached to the first die holder until the probe abuts against the needle body, so that the testing efficiency can be improved, and the locking position of the product is accurate and unchanged in the testing process, so that the accuracy of the probe abutting against the needle body can be ensured.

Description

Power-on test device

Technical Field

The application relates to the technical field of jigs, in particular to a power-on testing device.

Background

With the rapid development of electronic technology, various household and electronic devices are in endless, and power-on tests need to be performed on the electronic devices to ensure the use performance. In the prior art, when a product to be tested is subjected to an energization test, the product to be tested needs to be fixed on a die holder in advance, then the die holder and the product to be tested positioned on the die holder are transmitted to a test station, and a test needle is adapted to a charging needle on the product to be tested, so that the energization test is performed. However, the above test method requires a pressing process and a testing process, and after the product to be tested is pre-fixed by using the pressing device, the testing device is used for conducting the power-on test, thereby reducing the efficiency of the power-on test.

SUMMERY OF THE UTILITY MODEL

The application provides an electrifying test device to solve the technical problem that the combination of a pressing process and a test process causes the low electrifying test efficiency.

The application provides an electrifying testing device, which comprises a first die holder, a second die holder, a probe and a pressure head, wherein the first die holder comprises a metal supporting piece, the first die holder is used for bearing a product, and the metal supporting piece is used for bearing a needle body of the product; the second die holder is opposite to the first die holder; the probe is connected to the second die holder and is arranged corresponding to the needle body; the pressure head is connected to the second die holder and is arranged opposite to the product; when the first die holder and/or the second die holder are/is driven, the pressure head abuts against and drives the product to be attached to the first die holder until the probe abuts against the needle body.

Optionally, the pressure head is connected with the second die holder through an elastic telescopic structure.

Optionally, the pressing head includes a first pressing part and a second pressing part, the first pressing part is connected to the second die holder, and the first pressing part includes an accommodating cavity; the second pressing part is connected to the second die holder through the elastic telescopic structure; the elastic telescopic structure is located in the containing cavity, and the second pressing part extends out of the containing cavity and drives the product to be attached to the first die holder.

Optionally, the pressure head further comprises an accommodating groove, and the accommodating groove penetrates through the upper end face and the lower end face of the pressure head; wherein, one end of the probe is connected to the second die holder, and the other end of the probe passes through the accommodating groove.

Optionally, the power-on testing device further includes at least one first limiting column and at least one first limiting hole, and the first limiting column is connected to the second die holder; the first limiting hole is arranged on the end surface of the first die holder in a concave mode; each first limiting column can be correspondingly inserted into one first limiting hole.

Optionally, the power-on testing device further includes at least one second limiting column and at least one second limiting hole, and the second limiting column is connected to the first die holder; the second limiting hole is arranged on the end surface of the second die holder in a concave mode; each second limiting column can be correspondingly inserted into one second limiting hole.

Optionally, a distance between an end of each first limiting column and a bottom wall of the corresponding first limiting hole is L1, and a distance between the probe and an opposite end of the needle body is L2, wherein L1 is L2; the distance between the end of each second limiting column and the bottom wall of the corresponding second limiting hole is L3, wherein L3 is L2.

Optionally, the first die holder is provided with a yielding groove, and part of the product is inserted into the yielding groove.

Optionally, the power-on testing device further comprises a workbench and a rack, and the workbench comprises a table top; the first die holder is arranged on the table-board; a frame connected to the table top; a driving part is arranged on the rack, and the second die holder is connected to the rack through the driving part; the second die holder is pushed by the driving piece and is adapted to the first die holder.

Optionally, the rack further comprises a connecting plate, one surface of the connecting plate is connected to the second die holder, and the other surface of the connecting plate is connected to the driving piece; the connecting plate is provided with a first transverse groove, so that the second die holder can be adjusted along the direction of the first transverse groove; the first die holder is provided with a second transverse groove, so that the first die holder can be adjusted along the direction of the second transverse groove; the extending direction of the first transverse groove is perpendicular to the extending direction of the second transverse groove.

The application provides an electrifying testing device, when a first die holder and/or a second die holder are/is driven, the first die holder and the second die holder are close to each other, so that a pressure head can be abutted to the surface of a product, and the pressure head applies thrust to the product along with the continuous reduction of the distance between the first die holder and the second die holder, so that the product is attached to the first die holder; in the process that first die holder and second die holder are close to each other, the interval that is located between the probe on the second die holder and the needle body that is located the product also constantly reduces, and when first die holder and second die holder were driven to predetermined adaptation position, the tip of probe and the tip butt of the needle body that corresponds to carry out the circular telegram test to the product. Utilize the pressure head drive product and first die holder relatively fixed earlier, then utilize probe and needle body butt to realize the electric test, can enough improve efficiency of software testing, the latched position of the in-process product of test is accurate unchangeable simultaneously, therefore accuracy when can guarantee probe and needle body butt.

Drawings

In order to more clearly illustrate the technical solutions in the embodiments of the present application, the drawings needed to be used in the description of the embodiments are briefly introduced below, and it is obvious that the drawings in the following description are only some embodiments of the present application, and it is obvious for those skilled in the art to obtain other drawings based on these drawings without creative efforts.

FIG. 1 is a schematic structural diagram of a power-on test apparatus provided herein;

FIG. 2 is a schematic structural diagram of a first mold holder of the power-on test apparatus provided in the present application;

FIG. 3 is a schematic structural diagram of a second die holder in the power-on testing apparatus provided by the present application;

fig. 4 is a partially exploded schematic view of a power-on test device provided herein.

Description of reference numerals:

100. a work table; 110. a table top; 200. a first die holder; 210. a metal support; 220. a first limit hole; 230. a second limit post; 240. a second transverse groove; 250. a yielding groove; 300. a frame; 310. a drive member; 400. a connecting plate; 410. a first transverse slot; 500. a second die holder; 510. a pressure head; 511. a spring; 512. accommodating grooves; 513. a first press fit portion; 514. a second press fit portion; 515. a connecting rod; 516. an accommodating chamber; 520. a probe; 530. a first limit post; 540. a second limiting hole; 600. producing a product; 610. a needle body.

Detailed Description

The technical solutions in the embodiments of the present application will be clearly and completely described below with reference to the drawings in the embodiments of the present application, and it is obvious that the described embodiments are only a part of the embodiments of the present application, and not all of the embodiments. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present application. Furthermore, it should be understood that the detailed description and specific examples, while indicating exemplary embodiments of the invention, are given by way of illustration and explanation only, and are not intended to limit the scope of the invention. In the present application, unless otherwise specified, the use of directional terms such as "upper", "lower", "left" and "right" generally refer to upper, lower, left and right in the actual use or operation of the device, and specifically to the orientation of the drawing figures.

The present application provides an energization testing apparatus, which will be described in detail below. It should be noted that the following description of the embodiments is not intended to limit the preferred order of the embodiments of the present application. In the following embodiments, the descriptions of the respective embodiments have respective emphasis, and reference may be made to related descriptions of other embodiments for parts that are not described in detail in a certain embodiment.

Referring to fig. 1-4, the present application provides a power-on testing apparatus for detecting a performance of a related product 600, such as an electronic device. The power-on testing device includes a first die holder 200 and a second die holder 500, wherein the first die holder 200 carries a product 600 to be tested, and the metal supporting member 210 carries a pin 610 of the product 600. The second die holder 500 is disposed opposite to the first die holder 200; and the first die holder 200 and/or the second die holder 500 can be driven so that the first die holder 200 and the second die holder 500 come close to each other up to the fitting.

The power-on testing device further comprises a probe 520 and a pressure head 510, wherein the probe 520 is connected to the second mold holder 500 and is arranged corresponding to the needle 610; when the probe 520 abuts against the probe body 610 of the product 600, the probe 520 and the probe body 610 can be electrically connected to each other, so that the product 600 can be electrically tested by the probe 520. The ram 510 is coupled to the second die holder 500 and is disposed opposite the product 600. When the first die holder 200 and/or the second die holder 500 are driven, so that the first die holder 200 and the second die holder 500 approach each other to a fitting position, the press head 510 abuts and drives the product 600 to be attached to the first die holder 200 until the probe 520 abuts against the needle 610.

When the first die holder 200 and/or the second die holder 500 are driven, the first die holder 200 and the second die holder 500 are brought close to each other, the ram 510 on the second die holder 500 is disposed opposite to the product 600, so that the ram 510 can abut against the surface of the product 600, and as the distance between the first die holder 200 and the second die holder 500 continues to decrease, the ram 510 applies a pushing force to the product 600, so that the product 600 is fitted into the first die holder 200. In the process that the first die holder 200 and the second die holder 500 approach each other, the distance between the probe 520 on the second die holder 500 and the needle 610 on the product 600 is also continuously reduced, and when the first die holder 200 and the second die holder 500 are driven to the preset adapting position, the end of the probe 520 abuts against the end of the corresponding needle 610. Since the metal support 210 supports the probe body 610, when the probe 520 abuts against the probe body 610, the probe 520 and the probe body 610 can be electrically conducted, so as to perform a power-on test on the product 600. In the process that the first die holder 200 and the second die holder 500 approach each other, the press head 510 first abuts against the product 600, and drives the product 600 to be attached to the first die holder 200, so that the product 600 and the first die holder 200 are relatively fixed. Then, as the first die holder 200 and the second die holder 500 are continuously close to each other, the probe 520 is abutted to the needle body 610, so that the power-on test is realized, and the test efficiency is improved.

Compared with the scheme that in the prior art, the product 600 and the die are fixed relatively by using the pressing device, and then the die is transferred to the detection device for electrical detection, the fixing of the product 600 can be realized by using the cooperation of the first die holder 200 and the second die holder 500, and meanwhile, the product 600 can be electrically tested by using the probe 520. In addition, the press head 510 is used for driving the product 600 to be relatively fixed with the first die holder 200, and then the probe 520 is used for abutting against the needle body 610 to realize the electrical test, so that the locking position of the product 600 is accurate and unchanged in the electrical test process, and the accuracy of the probe 520 in abutting against the needle body 610 can be ensured.

Further, pressure head 510 passes through elastic telescopic structure with second die holder 500 and is connected, and this elastic telescopic structure is the spring in this application, and above-mentioned spring can reduce the impact force that produces when pressure head 510 acts on product 600 surface, all has certain guard action to product 600 and pressure head 510. Meanwhile, the pressure head 510 and the second die holder 500 have certain elastic quantity, so that the requirement on the precision of the probe 520 is reduced, and the rigid butt joint of the probe 520 and the needle body 610 is avoided, so that the probe 520 is not easy to damage when being butted with the needle body 610.

Further, the press head 510 includes a first pressing portion 513 and a second pressing portion 514, wherein the first pressing portion 513 is connected to the second die holder 500, and the first pressing portion 513 includes an accommodating cavity. The second press 514 is connected to the second die holder 500 by a spring 511; the spring 511 is located inside the accommodating cavity 516, and the second pressing portion 514 extends out of the accommodating cavity 516 and drives the product 600 to be attached to the first die holder 200. The second pressing portion 514 is connected to the second die holder 500 through a connecting rod 515, the spring 511 is sleeved outside the connecting rod 515, and one end of the spring 511 abuts against the second die holder 500, and the other end abuts against the second pressing portion 514. The receiving chamber 516 is disposed through a middle portion of the first press fit portion 513 such that the second press fit portion 514 can protrude from an interior of the receiving chamber 516 for abutting against the product 600.

Further, the indenter 510 further includes an accommodating groove 512, and the accommodating groove 512 is formed in the upper and lower end surfaces of the indenter 510 in a penetrating manner. The probe 520 is disposed at the bottom of the accommodating groove 512, a minimum distance between the probe 520 and the opening of the accommodating groove 512 is H1, a maximum height between the product 600 corresponding to the accommodating groove 512 and the needle 610 is H2, and H1 is greater than H2.

The probes 520 are disposed inside the accommodating groove 512, so that when the pressing head 510 abuts against the product 600, the probes 520 do not contact the product 600, and the probes 520 are protected. When the press head 510 abuts and pushes the product 600 to fit the first mold holder 200, the opening of the receiving groove 512 opened at the end of the press head 510 abuts against the surface of the product 600, the maximum height between the position of the product 600 and the end of the needle 610 is defined as H2, while the minimum distance between the end of the probe 520 and the opening of the receiving groove 512 is defined as H1, and H1 > H2. Since the probe 520 is disposed inside the receiving groove 512 and the probe 520 is disposed opposite to the needle body 610, the end of the needle body 610 is partially inserted into the receiving groove 512. Meanwhile, since H1 > H2, when the receiving groove 512 abuts to the surface of the product 600, the probe 520 is disposed opposite to the needle 610 inserted into the receiving groove 512, and a certain gap exists between the end of the probe 520 and the end of the needle 610, the gap having a distance of the difference between H1 and H2.

When the press head 510 abuts against the surface of the product 600, a certain gap exists between the probe 520 and the needle 610, and then the press head 510 applies a pushing force to the product 600, so that the product 600 is attached to the first die holder 200, thereby fixing the product 600. And in the process that the indenter 510 pushes the product 600, since the indenter 510 is elastically connected to the second die holder 500, the distance between the first probe 520 and the needle 610 is gradually reduced. Therefore, by limiting H1 to H2, the probe 520 can be ensured to abut against the needle body 610 after the product 600 is fitted with the first die holder 200, so that stability and accuracy in the detection process can be ensured, and damage caused by collision of the probe 520 and the needle body 610 when the product 600 is driven by the pressure head 510 to be fitted with the first die holder 200 is avoided, so that the probe 520 and the needle body 610 are protected to a certain extent. In addition, in the process of using the pressing head 510 to drive the product 600 to be attached to the first mold base 200, the probe 520 and the needle 610 are both located inside the accommodating groove 512, so that the probe 520 and the needle 610 can be protected, and the fitting accuracy of the probe 520 and the needle 610 can be improved.

Further, when the pressing head 510 abuts and drives the product 600 to be attached to the first die holder 200, the probe 520 abuts against the needle 610. When the needle 610 is completely matched with the product 600 in assembly, when the product 600 is attached to the first die holder 200 through the pressure head 510, the needle 610 is correspondingly attached to the metal support 210, and the probe 520 is abutted to the needle 610 at the moment, so that the power-on test of the product 600 is realized.

The application also comprises another scheme that when the pressure head 510 abuts and drives the product 600 to be attached to the first die holder 200, a gap exists between the probe 520 and the needle body 610.

Because the product 600 and the needle 610 are in an interference fit, there may be a situation in which the needle 610 and the product 600 are already fixed, but the position of the needle 610 in the product 600 is not completely installed in place during the installation process. When the product 600 is attached to the first die holder 200 by the pressing head 510, the pins 610 are correspondingly attached to the metal support 210, and at this time, a gap exists between the probe 520 and the pins 610. As the ram 510 continues to act on the product 600 such that the needle 610 is in close proximity to the probe 520, the metal support 210 can react against the needle 610 and drive the needle 610 to move relative to the product 600 such that the needle 610 is properly mated with the product 600. While the probe 520 continues to approach the needle body 610 by external forces and abuts the needle body 610. Utilize the drive power of pressure head 510 in this application, can realize the laminating of product 600 and first die holder 200 to and the needle body 610 and the matching of product 600, can also realize probe 520 and the butt of needle body 610 simultaneously.

Further, the power-on testing device further includes at least one first position-limiting pillar 530 and at least one first position-limiting hole 220, wherein the first position-limiting pillar 530 is connected to the second die holder 500; the first limiting hole 220 is arranged on the end surface of the first die holder 200 in a concave manner; and each of the first position-limiting posts 530 can be correspondingly inserted into a first position-limiting hole 220.

By using the first position-limiting pillar 530 and the corresponding first position-limiting hole 220, the accuracy of the first die holder 200 and the second die holder 500 can be improved. In the present application, the second die holder 500 is provided with four first limiting posts 530, and the four first limiting posts are respectively arranged at four corners; the first die holder 200 is provided with four first limiting holes 220 at four corners thereof. Meanwhile, when the first die holder 200 and the second die holder 500 are driven to the fitting positions, the ends of the first position-limiting posts 530 just abut against the bottoms of the first position-limiting holes 220. Therefore, the abutting of the probe 520 and the probe body 610 can be limited by the adaptation of the first limiting column 530 and the first limiting hole 220, so that the testing efficiency can be improved, and the testing precision can be ensured.

The distance between the end of each first position-limiting pillar 530 and the bottom wall of the corresponding first position-limiting hole 220 is L1, and the distance between the probe 520 and the opposite end of the needle body 610 is L2, so that L1 is L2; when the first die holder 200 and the second die holder 500 are driven to the fitting positions, the ends of the first position-limiting posts 530 just abut against the bottoms of the first position-limiting holes 220.

Further, the power-on testing device further includes at least one second position-limiting post 230 and at least one second position-limiting hole 540, wherein the second position-limiting post 230 is connected to the first die holder 200; the second limiting hole 540 is arranged on the end surface of the second die holder 500 in a concave manner; meanwhile, each of the second position-limiting columns 230 can be correspondingly inserted into a second position-limiting hole 540.

The distance between the end of each second position-limiting pillar 230 and the bottom wall of the corresponding second position-limiting hole 540 is L3, and the distance between the probe 520 and the opposite end of the needle body 610 is L2, so that L3 is L2. When the first die holder 200 and the second die holder 500 are driven to the fitting position, the end of the second position-limiting post 230 abuts against the bottom of the second position-limiting hole 540.

In the present application, the first die holder 200 is provided with four second limiting posts 230, and the four second limiting posts are respectively arranged at four corners; the second die holder 500 has four second limiting holes 540 at four corners thereof. By using the second position-limiting columns 230 and the corresponding second position-limiting holes 540, the accuracy of the first die holder 200 and the second die holder 500 during fitting can be improved. Meanwhile, when the first die holder 200 and the second die holder 500 are driven to the fitting positions, the ends of the second position-limiting columns 230 just abut against the bottoms of the second position-limiting holes 540. Therefore, the abutting of the probe 520 and the needle body 610 can be limited by the adaptation of the second limit column 230 and the second limit hole 540, so that the test efficiency can be improved, and the test precision can be ensured.

Further, the first die holder 200 is provided with a yielding groove 250, and a part of the product 600 is inserted into the yielding groove 250. The avoiding groove 250 formed in the first die holder 200 can accommodate a portion of the product 600 and facilitate the separation of the product 600 from the first die holder 200 by an operator.

Further, the power-on testing device further includes a worktable 100 and a rack 300, the worktable 100 includes a table 110, and the first mold base 200 is disposed on the table 110. The frame 300 is connected to the table 110; the frame 300 is provided with a driving member 310, and the second die holder 500 is connected to the frame 300 through the driving member 310. The second die holder 500 is pushed by the driver 310 and is fitted to the first die holder 200.

The frame 300 is disposed on the table 110 of the worktable 100, and the first die holder 200 is disposed on the table 110, and the second die holder 500 is connected to the frame 300 through the driving member 310, so that the first die holder 200 is a lower die holder, the second die holder 500 is an upper die holder, and the driving member 310 is an air cylinder. The product 600 is placed above the first die holder 200, and then the driving member 310 drives the second die holder 500 to move downward, so that the pressing head 510 presses against the surface of the product 600, and pushes the product 600 to be attached to the first die holder 200.

Further, the frame 300 further includes a connecting plate 400, one surface of the connecting plate 400 is connected to the second die holder 500, and the other surface thereof is connected to the driving member 310; the connecting plate 400 is provided with a first transverse groove 410, so that the second die holder 500 can be adjusted along the direction of the first transverse groove 410. The first die holder 200 is provided with a second transverse groove 240, so that the first die holder 200 can be adjusted along the direction of the second transverse groove 240. The second die holder 500 is adjusted by using the first transverse groove 410, and the first die holder 200 is adjusted by using the second transverse groove 240, so that the adaptation precision of the first die holder 200 and the second die holder 500 is improved.

In addition, the extending direction of the first transverse groove 410 is perpendicular to the extending direction of the second transverse groove 240, so that the adjusting direction of the second die holder 500 is perpendicular to the adjusting direction of the first die holder 200, thereby realizing the adjustment of the first die holder 200 and the second die holder 500 in the horizontal plane, and improving the matching precision of the first die holder 200 and the second die holder 500.

The above provides a detailed description of the power-on test device, and the principle and the implementation of the present application are explained by applying specific examples, and the above description of the embodiments is only used to help understanding the method and the core idea of the present application; meanwhile, for a person skilled in the art, according to the idea of the present application, there may be variations in the specific embodiments and the application scope, and in summary, the content of the present specification should not be construed as a limitation to the present application.

Claims (10)

1. A power-on test apparatus, comprising:

a first die holder comprising a metal support for carrying a product, the metal support for carrying a needle of the product;

the second die holder is arranged opposite to the first die holder;

the probe is connected to the second die holder and corresponds to the needle body; and

the pressure head is connected to the second die holder and is arranged opposite to the product;

when the first die holder and/or the second die holder are/is driven, the pressure head abuts against and drives the product to be attached to the first die holder until the probe abuts against the needle body.

2. The power-on testing device according to claim 1, wherein the ram is connected to the second die holder by an elastic telescopic structure.

3. The power-on test device according to claim 2, wherein the ram includes:

the first pressing part is connected to the second die holder and comprises an accommodating cavity; and

the second pressing part is connected to the second die holder through the elastic telescopic structure;

the elastic telescopic structure is located in the containing cavity, and the second pressing part extends out of the containing cavity and drives the product to be attached to the first die holder.

4. The power-on test device of claim 3, wherein the ram further comprises:

the accommodating groove penetrates through the upper end face and the lower end face of the pressure head;

wherein, one end of the probe is connected to the second die holder, and the other end of the probe passes through the accommodating groove.

5. The power-on test device according to claim 1, further comprising:

at least one first limiting column connected to the second die holder; and

the first limiting hole is concavely formed in the end face of the first die holder;

each first limiting column can be correspondingly inserted into one first limiting hole.

6. The power-on test device according to claim 5, further comprising:

at least one second limiting column connected to the first die holder; and

the second limiting hole is concavely formed in the end face of the second die holder;

each second limiting column can be correspondingly inserted into one second limiting hole.

7. The power-on test device according to claim 6,

the distance between the end of each first limiting column and the bottom wall of the corresponding first limiting hole is L1, the distance between the probe and the opposite end of the needle body is L2, wherein L1 is L2;

the distance between the end of each second limiting column and the bottom wall of the corresponding second limiting hole is L3, wherein L3 is L2.

8. The energization testing device according to claim 1, wherein the first die holder is provided with a recess, and a portion of the product is inserted into the recess.

9. The power-on test device according to claim 1, further comprising:

a table comprising a table top; the first die holder is arranged on the table-board; and

a frame connected to the table top; a driving part is arranged on the rack, and the second die holder is connected to the rack through the driving part;

wherein the second die holder is pushed by the driving member and is adapted to the first die holder.

10. The power-on testing device of claim 9, wherein the rack further comprises:

a connecting plate, one surface of which is connected to the second die holder and the other surface of which is connected to the driving member;

the connecting plate is provided with a first transverse groove, so that the second die holder can be adjusted along the direction of the first transverse groove;

the first die holder is provided with a second transverse groove, so that the first die holder can be adjusted along the direction of the second transverse groove;

the extending direction of the first transverse groove is perpendicular to the extending direction of the second transverse groove.

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