CN217360626U - Testing device for control equipment - Google Patents
Testing device for control equipment Download PDFInfo
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- CN217360626U CN217360626U CN202221175752.8U CN202221175752U CN217360626U CN 217360626 U CN217360626 U CN 217360626U CN 202221175752 U CN202221175752 U CN 202221175752U CN 217360626 U CN217360626 U CN 217360626U
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- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02P—CLIMATE CHANGE MITIGATION TECHNOLOGIES IN THE PRODUCTION OR PROCESSING OF GOODS
- Y02P90/00—Enabling technologies with a potential contribution to greenhouse gas [GHG] emissions mitigation
- Y02P90/02—Total factory control, e.g. smart factories, flexible manufacturing systems [FMS] or integrated manufacturing systems [IMS]
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Abstract
The utility model discloses a testing arrangement for controlgear, include: the system comprises a first power supply, a positive relay, a negative relay, a plurality of short circuit test relays, a plurality of open circuit test relays, a control unit, a load interface and an I/O interface; a plurality of I/O signal circuits are arranged between the load interface and the I/O interface, and a circuit breaking test relay is connected in series in one I/O signal circuit; the positive pole of the first power supply is connected with each short circuit test relay through a positive pole relay, and one short circuit test relay is connected with one I/O signal line; the negative electrode of the first power supply is connected with each short circuit test relay through a negative electrode relay; the control unit is respectively connected with the positive relay, the negative relay, the short circuit test relay and the open circuit test relay.
Description
Technical Field
The embodiment of the utility model provides a relate to the test technology, especially relate to a testing arrangement for controlgear.
Background
In the conventional automobile part-level electrical load test, when test items such as signal open (single line), signal open (multiple lines), signal short, quiescent current, ground offset, and power offset are performed, the short or open test is frequently performed by using a banana head or a wiring harness lap joint, and the above operation method has the following problems:
the banana head and the wiring harness are in lap joint to form virtual joint risk; the multiple lines are in lap joint with the banana heads and the wire harnesses, so that the risk of short circuit exists between signals; when the manual test is carried out, when the equipment to be tested has a large number of I/O signal interfaces, if the I/O interface identification is not clear, the risk of misconnection and missed connection exists in the test process; when the banana head contact and separation device is tested manually, a large number of banana heads need to be plugged and pulled manually, the consistency of the contact and separation processes is difficult to control, and more uncontrollable factors are increased for the test.
SUMMERY OF THE UTILITY MODEL
The utility model provides a testing arrangement for controlgear to reach the purpose that improves testing arrangement efficiency of software testing, guarantees the uniformity of testing process.
An embodiment of the utility model provides a testing arrangement for controlgear, include: the system comprises a first power supply, a positive relay, a negative relay, a plurality of short circuit test relays, a plurality of open circuit test relays, a control unit, a load interface and an I/O interface;
the load interface and the I/O interface comprise a plurality of I/O signal lines, and one open circuit test relay is connected in series in one I/O signal line;
the positive pole of the first power supply is connected with each short-circuit test relay through the positive pole relay, and one short-circuit test relay is connected with one I/O signal line;
the negative electrode of the first power supply is connected with each short circuit test relay through the negative electrode relay;
and the control unit is respectively connected with the positive relay, the negative relay, the short circuit test relay and the open circuit test relay.
Optionally, the system further comprises a data acquisition unit;
the first power supply is connected with the data acquisition unit, and the data acquisition unit is used for acquiring the I/O signals on the I/O signal line.
Optionally, the system further comprises a power interface and a power supply control relay;
the positive pole of the first power supply is connected with the positive end of the power supply interface through the power supply control relay, and the negative pole of the first power supply is connected with the negative end of the power supply interface.
Optionally, the power supply further comprises a second power supply, a first relay and a second relay;
the first end of the second power supply is connected with the positive electrode of the first power supply through the first relay, and the second end of the second power supply end is connected with the positive end of the power supply interface.
Optionally, the system further comprises a third relay and a fourth relay;
the first end of the second power supply is connected with the negative electrode of the first power supply through the third relay, and the second end of the second power supply is connected with the negative end of the power supply interface through the fourth relay.
Optionally, the system further comprises a first intermediate relay and a second intermediate relay;
the positive relay is connected with each short circuit test relay through the first intermediate relay, and the negative relay is connected with each short circuit test relay through the second intermediate relay;
the control unit is also connected with the first intermediate relay and the second intermediate relay.
Optionally, the second power supply is a voltage-adjustable voltage source.
Optionally, the system further comprises an enabling end;
and the positive electrode of the first power supply is connected with the enabling end through the power supply control relay.
Optionally, the device further comprises a test box;
the first power supply, the positive relay, the negative relay, the short circuit testing relays, the open circuit testing relays and the control unit are arranged in the testing box;
the load interface and the I/O interface are configured on the test box.
Optionally, the system further comprises an upper computer, and the upper computer is connected with the control unit.
Compared with the prior art, the beneficial effects of the utility model reside in that: the utility model provides a testing arrangement, it includes the control unit, short circuit test relay, opens circuit test relay, can realize treating the automatic short circuit of equipment of examining, the test of opening circuit based on the control unit, short circuit test relay and the test relay that opens circuit, can avoid because the problem of the uncontrollable factor appears in the manual operation error leads to in the testing process, utilizes testing arrangement, can improve efficiency of software testing, guarantees the uniformity of testing process.
Drawings
FIG. 1 is a schematic structural diagram of a test apparatus in an embodiment;
FIG. 2 is a schematic structural diagram of another test apparatus in the embodiment;
Detailed Description
The present invention will be described in further detail with reference to the accompanying drawings and examples. It is to be understood that the specific embodiments described herein are merely illustrative of the invention and are not limiting of the invention. It should be further noted that, for the convenience of description, only some of the structures related to the present invention are shown in the drawings, not all of the structures.
Example one
Fig. 1 is a schematic structural diagram of a testing apparatus in an embodiment, and referring to fig. 1, the testing apparatus includes a first power supply 100, a positive relay 200, a negative relay 300, a plurality of short-circuit testing relays KMD, a plurality of open-circuit testing relays KMS, a control unit 600, a load interface 400, and an I/O interface 500.
The load interface 400 is used for being connected with a test load U2, the I/O interface 500 is used for being connected with a device to be tested U1, and a plurality of I/O signal lines are arranged between the load interface 400 and the I/O interface 500.
For example, in the present embodiment, the number of I/O signal terminals configured in the I/O interface 500 is not limited, that is, the number of configured I/O signal lines is not limited, and the number of the short-circuit test relays KMD and the open-circuit test relays KMS is set to be the same as the number of the I/O signal lines.
For example, in fig. 1, three I/O signal lines are arranged, three short-circuit test relays KMD1, KMD2, and KMD3 are arranged, and three open-circuit test relays KMS1, KMS2, and KMS3 are arranged.
In the embodiment, one open circuit test relay is connected in series in one I/O signal line, for example, in the scheme shown in fig. 1, the open circuit test relays KMS1, KMS2 and KMS3 are connected in series in one I/O signal line respectively.
The positive pole of the first power supply 100 is connected with each short circuit test relay through a positive pole relay 200, and one short circuit test relay is connected with one I/O signal line;
for example, the positive electrode of the first power source 100 is connected to a short circuit test relay KMD1 through a positive electrode relay 200, and the short circuit test relay KMD1 is connected to an I/O signal line.
The negative pole of the first power supply 100 is connected to each short circuit test relay through a negative pole relay 300, and one short circuit test relay is connected to one I/O signal line;
for example, the negative electrode of the first power source 100 is connected to a short circuit test relay KMD2 through a negative electrode relay 300, and the short circuit test relay KMD2 is connected to an I/O signal line.
The control unit 600 is connected to the positive relay 200, the negative relay 300, the short circuit test relay, and the open circuit test relay, respectively.
For example, in this embodiment, the first power supply 100 may be used as a power supply for the device under test U1 or other electrical loads, the control unit 600 is configured with a test program, and the operation process of the test apparatus includes:
the first power supply 100 supplies power to the device under test U1, the device under test U1 establishes communication connection with the test load U2, and normal data interaction is performed between the device under test U1 and the test load U2.
When the short circuit test is carried out on the device to be tested U1, the open circuit test relay is controlled to be attracted, and the appointed short circuit test relay is controlled to be attracted.
Illustratively, the open circuit test relays KMS1, KMS2 and KMS3 are controlled to be attracted, the positive relay 200 is controlled to be attracted, when the short circuit test relays KMD1, KMD2 and KMD3 are controlled to be attracted simultaneously, three I/O signal lines are short-circuited with the positive electrode of the first power supply 100, and when the short circuit test relays KMD1, KMD2 or KMD3 are controlled to be attracted, the corresponding I/O signal lines are short-circuited with the positive electrode of the first power supply 100.
Illustratively, the open circuit test relays KMS1, KMS2 and KMS3 are controlled to be attracted, the negative relay 300 is controlled to be attracted, when the short circuit test relays KMD1, KMD2 and KMD3 are controlled to be attracted at the same time, the three I/O signal lines are short-circuited with the negative electrode of the first power supply 100, and when the short circuit test relays KMD1, KMD2 or KMD3 are controlled to be attracted, the corresponding I/O signal lines are short-circuited with the negative electrode of the first power supply 100.
Illustratively, when the device under test U1 is subjected to the short circuit test, the control unit 600 controls the short circuit test relay to be attracted for a specified duration, and when the short circuit test relay is attracted, if the normal communication can be maintained between the device under test U1 and the test load U2 or the fault reaction is the same as the set reaction, the short circuit test is passed.
When the device to be tested U1 is subjected to open circuit test, the short circuit test relay is controlled to be disconnected, and the appointed open circuit test relay is controlled to be attracted.
Illustratively, when the control open circuit test relay KMS1, KMS2 or KMS3 is open, the corresponding I/O signal line is open.
For example, when the to-be-tested device U1 is subjected to the open circuit test, the control unit 600 controls the open circuit test relay to be turned off for a specified time, and when the open circuit test relay KMS1, KMS2 or KMS3 is controlled to be turned off, the corresponding I/O signal line is turned off.
When the disconnection test relay is disconnected, if the fault reaction of the device under test U1 and the test load U2 is the same as the set reaction, the disconnection test is passed.
This embodiment provides a testing arrangement, and it includes the control unit, short circuit test relay, opens circuit test relay, can realize treating the automatic short circuit of equipment, the test of opening circuit based on the control unit, short circuit test relay and the test relay that opens circuit, can avoid leading to the problem of the uncontrollable factor to appear in the testing process because manual operation is wrong, utilizes testing arrangement, can improve efficiency of software testing, guarantees the uniformity of testing process.
Fig. 2 is a schematic structural diagram of another testing apparatus in an embodiment, and referring to fig. 2, as an implementation scheme, on the basis of the scheme shown in fig. 1, the testing apparatus further includes a power interface 900 and a power supply control relay 800.
The positive pole of the first power supply 100 is connected with the power supply control relay 800 through the positive pole relay 200, the power supply control relay 800 is connected with the positive end of the power interface 900, and the negative pole of the first power supply 100 is connected with the negative end of the power interface 900 through the negative pole relay 300;
the power supply control relay 800 is also connected to the control unit 600.
Referring to fig. 2, the first power supply 100 is connected to the device under test U1 through the power interface 900, and the first power supply 100 is used as a power supply of the device under test U1.
Illustratively, when the testing device works, the control unit 600 controls the power supply control relay 800, the positive relay 200 and the negative relay 300 to be attracted, and when the relay 800 is attracted, the first power supply 100 supplies power to the device under test U1.
Referring to fig. 2, when the positive electrode of the first power source 100 is connected to the power supply control relay 800 through the positive electrode relay 200 and the negative electrode of the first power source 100 is connected to the negative terminal of the power interface 900 through the negative electrode relay 300, the testing apparatus further includes a first intermediate relay 11 and a second intermediate relay 12.
The positive relay 200 is connected with each short-circuit test relay KMD through a first intermediate relay 11, and the negative relay is connected with each short-circuit test relay KMD through a second intermediate relay 12;
the control unit 600 is also connected to the first intermediate relay 11 and the second intermediate relay 12.
Illustratively, when a short circuit test is performed on the device to be tested U1, the positive relay 200, the negative relay 300 and the open circuit test relay are controlled to be attracted;
when the first intermediate relay 11 is controlled to be closed and the second intermediate relay 12 is controlled to be opened, the appointed short-circuit test relay is controlled to be closed so that the appointed I/O signal circuit is in short circuit with the positive electrode of the first power supply 100;
when the first intermediate relay 11 is controlled to be switched off and the second intermediate relay 12 is controlled to be switched on, the appointed short-circuit test relay is controlled to be switched on so that the appointed I/O signal circuit is in short circuit with the negative electrode of the first power supply 100.
In one possible embodiment, the testing apparatus further comprises a data acquisition unit configured with a quiescent current detection terminal connected in series to the positive power supply branch between the first power supply 100 and the power interface 900.
For example, when the testing apparatus is configured with the power control relay 800 and the data acquisition unit, the testing apparatus may further be configured to detect a quiescent current of the device under test U1, and the process includes:
the control unit 600 controls the power supply control relay 800 to pull in, so that the device under test U1 enters a normal working state.
After the device to be tested U1 operates stably for the set time, the control unit 600 controls the power supply control relay 800 to be turned off, and after the device to be tested U1 enters the sleep state for the set time, the data acquisition unit records the quiescent current of the device to be tested U1.
For example, in one possible embodiment, the data acquisition unit may further include an I/O signal acquisition terminal, and the data acquisition unit may further be configured to acquire an I/O signal on the I/O signal line.
Referring to fig. 2, in one possible embodiment, the testing apparatus further includes an enable terminal 1000, and the positive electrode of the first power source 100 is connected to the enable terminal 1000 through a power supply control relay 800.
For example, when the dut U1 needs a wake-up signal, the wake-up terminal of the dut U1 is connected to the enable terminal 1000, and at this time, the positive signal of the first power source 100 is simultaneously used as the wake-up signal of the dut U1.
Referring to fig. 2, on the basis that the positive pole of the first power source 100 is connected to the power supply control relay 800 through the positive pole relay 200, and the negative pole of the first power source 100 is connected to the negative terminal of the power interface 900 through the negative pole relay 300, in an embodiment, the testing apparatus further includes a second power source 700, a first relay KM1, and a second relay KM 2.
A first terminal of the second power source 700 is connected to the positive terminal of the first power source 100 through the first relay KM1, and a second terminal of the second power source 700 is connected to the positive terminal of the power source interface 900 through the second relay KM 2.
Illustratively, the second power supply 700 is a voltage-adjustable voltage source, and the output voltages of the first terminal and the second terminal of the second power supply 700 are positive, negative and adjustable in value.
For example, when the first relay KM1 and the second relay KM2 are configured, the testing apparatus may also be used for a power supply positive line voltage offset test of the device under test U1, and the process includes:
the positive relay 200 is controlled to be disconnected, the negative relay 300, the first relay KM1 and the second relay KM2 are attracted, the first end of the second power supply 700 is manually adjusted to be used as a negative electrode, and the second end of the second power supply 700 is used as a positive electrode;
and adjusting the voltage value of the second end of the second power supply 700, and when the voltage value of the second end of the second power supply 700 changes, the forward voltage of the device under test U1 deviates, and at this time, observing whether the device under test U1 can still normally communicate with the test load U2.
Referring to fig. 2, in an embodiment, the testing apparatus may further include a third relay KM3 and a fourth relay KM 4.
A first end of the second power source 700 is connected to the negative terminal of the first power source through a third relay KM3, and a second end of the second power source 700 is connected to the negative terminal of the power source interface 900 through a fourth relay KM 4.
For example, when the testing apparatus is configured with the third relay KM3 and the fourth relay KM4, the testing apparatus may also be used for a voltage offset test of a power supply negative line of the device under test U1, and the process includes:
the negative relay 300 is controlled to be switched off, the positive relay 200, the third relay KM3 and the fourth relay KM4 are attracted, the first end of the second power supply 700 is manually adjusted to be used as a positive electrode, and the second end of the second power supply 700 is used as a negative electrode;
and adjusting the voltage value of the second end of the second power supply 700, and when the voltage value of the second end of the second power supply 700 changes, enabling the negative voltage of the device under test U1 to deviate, and observing whether the device under test U1 can still normally communicate with the test load U2.
For example, on the basis of the scheme shown in fig. 2, if the first relay KM1, the second relay KM2, the third relay KM3 and the fourth relay KM4 are configured at the same time, then:
when the first relay KM1 and the second relay KM2 were engaged, the third relay KM3 and the fourth relay KM4 were turned off;
when the first relay KM1 and the second relay KM2 are turned off, the third relay KM3 and the fourth relay KM4 are engaged.
In one possible embodiment, the test apparatus further comprises a test chamber in which the device of the embodiment of fig. 1 or fig. 2 can be arranged.
For example, in addition to the scheme shown in fig. 1, the first power supply 100, the positive relay 200, the negative relay 300, the short-circuit test relay KMD, the open-circuit test relay KMS, and the control unit 600 are disposed in a test box;
the load interface 400 and the I/O interface 500 are disposed on the test box.
In an embodiment, the testing device may further include an upper computer, and the upper computer is connected to the control unit 600.
For example, the upper computer may be used to configure the control unit 600, monitor the operating state of the control unit 600, and the like.
Illustratively, when the test device is configured with the test box, the upper computer is disposed outside the test box.
It should be noted that the foregoing is only a preferred embodiment of the present invention and the technical principles applied. It will be understood by those skilled in the art that the present invention is not limited to the particular embodiments described herein, but is capable of various obvious changes, rearrangements and substitutions as will now become apparent to those skilled in the art without departing from the scope of the invention. Therefore, although the present invention has been described in greater detail with reference to the above embodiments, the present invention is not limited to the above embodiments, and may include other equivalent embodiments without departing from the scope of the present invention.
Claims (10)
1. A test apparatus for controlling a device, comprising: the system comprises a first power supply, a positive relay, a negative relay, a plurality of short circuit test relays, a plurality of open circuit test relays, a control unit, a load interface and an I/O interface;
the load interface and the I/O interface comprise a plurality of I/O signal lines, and one open circuit test relay is connected in series in one I/O signal line;
the positive pole of the first power supply is connected with each short-circuit test relay through the positive pole relay, and one short-circuit test relay is connected with one I/O signal line;
the negative electrode of the first power supply is connected with each short circuit test relay through the negative electrode relay;
and the control unit is respectively connected with the positive relay, the negative relay, the short circuit test relay and the open circuit test relay.
2. The test device for control equipment according to claim 1, further comprising a data acquisition unit;
the first power supply is connected with the data acquisition unit, and the data acquisition unit is used for acquiring the I/O signals on the I/O signal circuit.
3. The test device for the control apparatus according to claim 1, further comprising a power interface, a power supply control relay;
the positive pole of the first power supply is connected with the positive end of the power supply interface through the power supply control relay, and the negative pole of the first power supply is connected with the negative end of the power supply interface.
4. The test device for controlling an apparatus according to claim 3, further comprising a first intermediate relay, a second intermediate relay;
the positive relay is connected with each short-circuit test relay through the first intermediate relay, and the negative relay is connected with each short-circuit test relay through the second intermediate relay;
the control unit is also connected with the first intermediate relay and the second intermediate relay.
5. The test device for controlling equipment of claim 4, further comprising a second power source, a first relay, a second relay;
the first end of the second power supply is connected with the positive electrode of the first power supply through the first relay, and the second end of the second power supply is connected with the positive end of the power supply interface through the second relay.
6. The test device for control equipment of claim 5, further comprising a third relay, a fourth relay;
the first end of the second power supply is connected with the negative electrode of the first power supply through the third relay, and the second end of the second power supply is connected with the negative end of the power supply interface through the fourth relay.
7. The test apparatus for controlling a device of claim 5, wherein the second power supply is a voltage adjustable voltage source.
8. The test apparatus for a control device of claim 3, further comprising an enable terminal;
and the positive electrode of the first power supply is connected with the enabling end through the power supply control relay.
9. The test device for a control apparatus according to claim 1, further comprising a test box;
the first power supply, the positive relay, the negative relay, the short circuit testing relays, the open circuit testing relays and the control unit are arranged in the testing box;
the load interface and the I/O interface are configured on the test box.
10. The test device for a control apparatus according to claim 1, further comprising an upper computer;
the upper computer is connected with the control unit.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202221175752.8U CN217360626U (en) | 2022-05-07 | 2022-05-07 | Testing device for control equipment |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202221175752.8U CN217360626U (en) | 2022-05-07 | 2022-05-07 | Testing device for control equipment |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN217360626U true CN217360626U (en) | 2022-09-02 |
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| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202221175752.8U Active CN217360626U (en) | 2022-05-07 | 2022-05-07 | Testing device for control equipment |
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|---|---|
| CN (1) | CN217360626U (en) |
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- 2022-05-07 CN CN202221175752.8U patent/CN217360626U/en active Active
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