CN211697979U - Test apparatus and test system - Google Patents
Test apparatus and test system Download PDFInfo
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- CN211697979U CN211697979U CN201922233357.5U CN201922233357U CN211697979U CN 211697979 U CN211697979 U CN 211697979U CN 201922233357 U CN201922233357 U CN 201922233357U CN 211697979 U CN211697979 U CN 211697979U
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Abstract
The utility model provides a testing device and a testing system, wherein the testing device comprises a plurality of first relays, a plurality of second relays, a first interface, a second interface and a third interface; the second interface comprises a plurality of connecting terminals; the first ends of the first relays are connected with the first interfaces; the second ends of the first relays are connected with the connecting terminals of the second interface in a one-to-one correspondence manner; the first ends of the second relays are connected with the third interfaces; the second ends of the second relays are connected with the connecting terminals of the second interface in a one-to-one correspondence manner; the plurality of connecting terminals of the second interface are used for connecting a plurality of pins to be tested of the product to be tested; by controlling the on or off of the first relays and the second relays, the impedance between any two pins of the product to be tested can be tested, and therefore the functional safety of the product to be tested is improved.
Description
Technical Field
The utility model belongs to the technical field of the test technique and specifically relates to a testing arrangement and test system are related to.
Background
In the related art, for a product to be tested which includes a plurality of pins and has a relatively complex circuit, when testing the impedance between any pins of the product to be tested, a plurality of test harnesses are required to be connected, and for two adjacent pins which are very close to each other, after the test harnesses are welded, short circuit may occur due to the too close distance, so that the impedance between some special pins is usually tested, if short circuit occurs between any two pins which are not tested, the product to be tested may be burnt out after the product to be tested is electrified, and thus, the functional safety of the product to be tested is difficult to ensure.
SUMMERY OF THE UTILITY MODEL
An object of the utility model is to provide a testing arrangement and test system to improve the functional security of the product that awaits measuring.
The utility model provides a testing device, which comprises a plurality of first relays, a plurality of second relays, a first interface, a second interface and a third interface; the second interface includes a plurality of connection terminals; the first ends of the first relays are connected with the first interfaces; second ends of the first relays are connected with the connecting terminals of the second interface in a one-to-one corresponding mode; the first ends of the second relays are connected with the third interface; second ends of the second relays are connected with the connecting terminals of the second interface in a one-to-one correspondence manner; the plurality of connecting terminals of the second interface are used for connecting a plurality of pins to be tested of a product to be tested; the first relays and the second relays are used for switching circuit paths so as to connect two appointed pins in the pins to be tested; the first interface and the third interface are used for being respectively connected with two ends of external impedance testing equipment so as to test the impedance between the two appointed pins through the external impedance testing equipment.
Further, the device also comprises a plurality of third relays and a fourth interface; the fourth interface includes a plurality of connection terminals; the first ends of the plurality of third relays are connected with the plurality of connecting terminals at the first end of the fourth interface in a one-to-one correspondence manner; second ends of the third relays are connected with the connecting terminals of the second interface in a one-to-one correspondence manner; a plurality of connecting terminals at the second end of the fourth interface are connected with an external instrument; the plurality of third relays are used for switching circuit paths to connect with a designated pin in the pins to be tested; and the plurality of connecting terminals of the fourth interface are used for providing a communication interface for the designated pin and the external instrument.
Further, the device also comprises a fifth relay, a sixth relay, a seventh relay and an eighth relay; the first end of the fifth relay is connected with the first end of the seventh relay; the second end of the fifth relay is connected with the positive pole of an external power supply; the third end of the fifth relay is connected with the negative electrode of the external power supply; the first end of the sixth relay is connected with the first end of the eighth relay, the second end of the sixth relay is connected with the negative electrode of the external power supply, and the third end of the sixth relay is connected with the positive electrode of the external power supply; the second end of the seventh relay is connected with the power supply anode of the product to be tested; the second end of the eighth relay is connected with the negative electrode of the power supply of the product to be detected; the fifth relay and the sixth relay are used for switching a path of the external power supply to provide forward voltage or reverse voltage for the product to be tested; the seventh relay is used for switching on or off the path of the power supply anode of the product to be tested; and the eighth relay is used for switching on or off the passage of the negative electrode of the power supply of the product to be tested.
Further, the device also comprises a ninth relay, a tenth relay, an eleventh relay and a twelfth relay; the first end of the ninth relay is connected with the first end of the tenth relay, and the second end of the ninth relay is connected with the positive electrode of the sensor of the external power supply; the third end of the ninth relay is connected with the negative electrode of the sensor of the external power supply; a first end of the eleventh relay is connected with a first end of the twelfth relay, a second end of the eleventh relay is connected with a negative electrode of a sensor of the external power supply, and a third end of the eleventh relay is connected with a positive electrode of the sensor of the external power supply; a second end of the tenth relay is connected with a first end of the seventh relay; the second end of the twelfth relay is connected with the first end of the eighth relay; the ninth relay and the eleventh relay are used for switching a sensor access of the external power supply so as to feed back the forward voltage or the reverse voltage of the product to be tested to the external power supply; the tenth relay is used for switching on or off a feedback path of the power supply anode of the product to be tested; and the twelfth relay is used for switching on or off a feedback path of the negative electrode of the power supply of the product to be tested.
Further, the apparatus further comprises: a thirteenth relay and a fourteenth relay; the first end of the thirteenth relay is connected with the second end of the seventh relay; the second end of the thirteenth relay is connected with the negative electrode of an external current testing instrument; a first end of the fourteenth relay is connected with a first end of the seventh relay; a second end of the fourteenth relay is connected with the positive electrode of the external current testing instrument; the thirteenth relay is used for switching on or off a negative pole access of the external current testing instrument; the fourteenth relay is used for switching on or off a positive electrode passage of the external current testing instrument.
Further, the second interface and the fourth interface are aviation plugs.
Further, the device also comprises a power amplification module; the output end of the power amplification module is respectively connected with the control coils of the plurality of first relays, the control coils of the plurality of second relays and the control coils of the plurality of third relays so as to drive the corresponding relays to act through the control coils; and the power amplification module is used for providing matched driving signals for the corresponding relays through the control coils.
Further, the device also comprises a controller; the output end of the controller is connected with the input end of the power amplification module; the controller is used for providing a matched driving signal for the power amplification module.
Further, the device also comprises a CAN card module; the output end of the CAN card module is connected with the input end of the controller; the CAN card module is used for providing CAN communication signals for the controller.
The utility model provides a test system, which comprises an upper computer and any one of the test devices; the upper computer is connected with the input end of a CAN card module in the testing device; the upper computer is used for sending CAN communication signals through the CAN card module, wherein the CAN communication signals comprise control instructions; and the testing device drives a corresponding relay in the testing device according to the control instruction so as to complete the test of a corresponding function.
The utility model provides a testing device and test system, testing device include a plurality of first relays, a plurality of second relays, first interface, second interface and third interface; the second interface comprises a plurality of connecting terminals; the first ends of the first relays are connected with the first interfaces; the second ends of the first relays are connected with the connecting terminals of the second interface in a one-to-one correspondence manner; the first ends of the second relays are connected with the third interfaces; the second ends of the second relays are connected with the connecting terminals of the second interface in a one-to-one correspondence manner; the plurality of connecting terminals of the second interface are used for connecting a plurality of pins to be tested of the product to be tested; by controlling the on or off of the first relays and the second relays, the impedance between any two pins of the product to be tested can be tested, and therefore the functional safety of the product to be tested is improved.
Drawings
In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the drawings used in the embodiments or the technical solutions in the prior art will be briefly described below, and it is obvious that the drawings in the following description are some embodiments of the present invention, and for those skilled in the art, other drawings can be obtained according to these drawings without creative efforts.
Fig. 1 is a schematic structural diagram of a testing apparatus according to an embodiment of the present invention;
fig. 2 is a schematic diagram of an impedance test provided by an embodiment of the present invention;
fig. 3 is a schematic diagram of a test that introduces an external instrument according to an embodiment of the present invention;
fig. 4 is a schematic diagram of a power supply test of a product according to an embodiment of the present invention;
fig. 5 is a schematic structural diagram of a test system according to an embodiment of the present invention.
Icon: 10-a first relay; 11-a second relay; 12-a first interface; 13-a second interface; 14-a third interface; 30-a third relay; 31-a fourth interface; 40-a fifth relay; 41-sixth relay; 42-a seventh relay; 43-eighth relay; 44-ninth relay; 45-tenth relay; 46-eleventh relay; 47-twelfth relay; 48-a thirteenth relay; 49-a fourteenth relay; 50-an upper computer; 51-test set-up.
Detailed Description
The technical solution of the present invention will be described clearly and completely with reference to the following embodiments, and it should be understood that the described embodiments are some, but not all embodiments of the present invention. Based on the embodiments in the present invention, all other embodiments obtained by a person skilled in the art without creative work belong to the protection scope of the present invention.
In the batch production process of electronic products, due to various possible factors of equipment and operators, it is difficult to ensure that all produced electronic products are qualified products; this requires that multiple tests be performed during and at the end of production to ensure that all the actual-mounted circuit boards leaving the factory are completely consistent with various designed specifications and parameters; the test equipment or test tools required to perform multiple tests typically include: peripheral equipment such as a power supply, a universal meter, an oscilloscope, a signal generator, an analog quantity acquisition card or a digital quantity acquisition card and the like; the test items typically include: the impedance, working voltage, working current, sleep current, peripheral driving current or digital quantity input and output among pins of the product, and the like.
When a product is tested by using traditional test equipment, a wire harness of the product is usually connected to peripheral equipment, and then the upper computer software is used for driving so as to control or test the product; the conventional test equipment has the following disadvantages:
1. before the product is electrified, the impedance among pins of the product is usually tested, and if the impedance is not tested and the pins are short-circuited, a circuit board can be burnt out after the product is electrified; for a complex circuit, dozens of hundreds of wiring pins are needed, when the impedance between any pins of a product is tested, a plurality of wire harnesses are needed to be connected, for two adjacent pins which are very close to each other, after the wire harnesses are welded, short circuit may occur due to the too close distance, so that the impedance test between some special pins, such as the impedance between a power supply and the ground, the impedance between CAN communication lines and the like, is generally simply carried out, the test of the whole impedance cannot be covered, and the risk of short circuit is high.
2. When a traditional test needs an external instrument, instrument or communication equipment, the external instrument, instrument or communication equipment can be connected to product pins only one to one, if the product has a plurality of test pins of the same type, a plurality of same instruments, instruments or communication equipment are needed, so that the use efficiency of the instruments, instruments or communication equipment is low, and the whole test system is huge.
3. The tested products are changeable, even the same product is possibly changed before and after the design, so that the matched test equipment is required to be continuously changed along with the change, even the product is required to be completely redesigned, the requirement of product test is seriously influenced, and the development progress and the delivery progress of the product are influenced.
Based on this, the embodiment of the utility model provides a testing arrangement and test system, this technique can be applied to the test to electronic product, especially in the test to complicated circuit board.
Referring to fig. 1, a schematic structural diagram of a testing apparatus includes a plurality of first relays 10, a plurality of second relays 11, a first interface 12, a second interface 13, and a third interface 14; the second interface 13 includes a plurality of connection terminals.
In practical implementation, the number of the first relays 10 and the second relays 11 can be set according to test requirements, for example, if a product to be tested is complex and the number of pins is large, a large number of the first relays 10 and the second relays 11 can be correspondingly set; considering that a plurality of first relays 10 and a plurality of second relays 11 are generally used to measure the same product to be measured at the same time, the number of the first relays 10 and the number of the second relays 11 may be the same; when the types of the first relays 10 and the second relays 11 are selected, the testing requirements of all products to be tested need to be covered, for example, the allowed maximum current can be selected to be 30A or more, so that the requirements of all products to be tested can be basically met; for the control, the first relay 10 and the second relay 11 may be selected to be the same model, but may be selected to be different models.
The first ends of the first relays 10 are connected with the first interface 12; second ends of the first relays 10 are connected with the connection terminals of the second interface 13 in a one-to-one correspondence manner; first ends of the plurality of second relays 11 are connected to the third interface 14; second ends of the plurality of second relays 11 are connected to the plurality of connection terminals of the second interface 13 in a one-to-one correspondence. A plurality of connecting terminals of the second interface 13 are used for connecting a plurality of pins to be tested of a product to be tested; the first relays 10 and the second relays 11 are used for switching circuit paths to connect two designated pins among the pins to be tested; the first interface 12 and the third interface 14 are used to connect two ends of an external impedance testing device, respectively, so as to test the impedance between two designated pins through the external impedance testing device.
Referring to FIG. 2, an impedance testing schematic is shown; the schematic diagram comprises 96A groups of relays and 96B groups of relays, namely, a product to be tested with 96 pins at most can be tested; the first ends of the 96A group relays are short-circuited with each other and are simultaneously connected to the first interface 12, which is denoted by the symbol DMMH in the schematic diagram; the first ends of the 96B group relays are short-circuited with each other and are simultaneously connected to a third interface 14, and the third interface is represented by a symbol DMML in the schematic diagram; the second ends of the 96A group relays and the second ends of the 96B group relays are respectively connected with a plurality of connecting terminals of the second interface 13 in a one-to-one correspondence manner, and for convenience of control, a first A _1 relay in the A group relays and a first B _1 relay in the B group relays are connected to the same terminal of the second interface, namely, the same Pin, such as a Pin _1 Pin, of a product to be tested is connected; and so on until the 96 th A _96 relay and the 96 th B _96 relay are connected with the same Pin of the product to be tested, such as a Pin _96 Pin; the third ends of the 96A group relays and the 96B group relays are vacant, and when the relays are connected to the third ends, the relays are in a disconnected state; in actual test, a product port line is introduced from Pin _ n, wherein the same network identification refers to the same Pin of the product; the first interface 12 and the third interface 14 are respectively connected to the positive and negative electrodes of the impedance testing device, for example, the positive and negative electrodes of a multimeter, the two sets of relays are used in cooperation, and the impedance test between any two pins can be realized by closing any two relays except for the same pin in the two sets of relays; for example, the A _1 relay is switched to the second end, the B _2 relay is switched to the second end, and other relays are switched to corresponding third ends, so that the impedance between the Pin _1 and the Pin _2 of the product to be tested can be tested.
The embodiment of the utility model provides a testing device, including a plurality of first relays, a plurality of second relays, first interface, second interface and third interface; the second interface comprises a plurality of connecting terminals; the first ends of the first relays are connected with the first interfaces; the second ends of the first relays are connected with the connecting terminals of the second interface in a one-to-one correspondence manner; the first ends of the second relays are connected with the third interfaces; the second ends of the second relays are connected with the connecting terminals of the second interface in a one-to-one correspondence manner; the plurality of connecting terminals of the second interface are used for connecting a plurality of pins to be tested of a product to be tested; by controlling the on or off of the first relays and the second relays, the impedance between any two pins of the product to be tested can be tested, and therefore the functional safety of the product to be tested is improved.
Further, the apparatus further includes a plurality of third relays 30 and a fourth interface 31; the fourth interface 31 includes a plurality of connection terminals;
in practical implementation, the number of the third relays 30 may also be set according to test requirements, and considering that the plurality of third relays 30 are generally used for measuring the same product to be tested as the plurality of first relays 10 and the plurality of second relays 11, the number of the third relays 30 may be the same as the number of the first relays 10 or the number of the second relays 11, and generally, for convenience of control, the third relays 30 may be the same as the first relays 10 and the second relays 11, and of course, different models may also be selected.
First ends of the plurality of third relays 30 are connected to the plurality of connection terminals of the first end of the fourth interface 31 in a one-to-one correspondence; second ends of the plurality of third relays 30 are connected to the plurality of connection terminals of the second interface 13 in a one-to-one correspondence; a plurality of connection terminals at a second end of the fourth interface 31 are connected to an external instrument; the plurality of third relays 30 are used for switching circuit paths to connect designated pins among the pins to be tested; a plurality of connection terminals of the fourth interface 31 are used to provide a communication interface for the designated pins and the external instrument.
Referring to FIG. 3, a schematic of a test incorporating an external instrument is shown; the group C relays correspond to the third relay 30, the fourth interface 31 can be an aerial plug, the schematic diagram includes 96 group C relays, the number of corresponding connecting terminals of the aerial plug is also 96, and the first ends of the 96 group C relays are connected with the Ch _ n ends of the aerial plug in a one-to-one correspondence manner; the second ends of the 96C group relays are respectively connected with the plurality of connecting terminals of the second interface in a one-to-one correspondence mode, the third ends of the 96C group relays are vacant, and when the relays are connected to the third ends, the relays are in a disconnected state; in actual test, a product port line is introduced from Pin _ n, and 96 connecting terminals at the other end of the aerial plug can be connected with external instruments, such as an oscilloscope, communication equipment, an analog acquisition card, a digital acquisition card and the like or a signal generator and the like, so that digital input and output test, analog test or Pulse Width Modulation (PWM) input and output test and the like are realized; for the same type of pins, the pins at the test equipment end can be manually connected together, so that instrument equipment can be saved; it can be understood that the external instrument can realize the test of all pins of the product to be tested by only inputting one path of digital quantity, PWM, analog quantity, electronic load, multimeter, oscilloscope or signal generator and the like and closing one relay each time; through the switching of the group C relays, the channel of the to-be-tested pin of the to-be-tested product can be changed, so that only one external instrument with the same function is needed, the signal can be connected to different to-be-tested pins, the testing of all the to-be-tested pins is realized, and instrument equipment is saved.
Further, the device further comprises a fifth relay 40, a sixth relay 41, a seventh relay 42, and an eighth relay 43; a first end of the fifth relay 40 is connected to a first end of a seventh relay 42; a second end of the fifth relay 40 is connected with the positive pole of the external power supply; the third end of the fifth relay 40 is connected with the negative pole of the external power supply; a first end of the sixth relay 41 is connected with a first end of the eighth relay 43, a second end of the sixth relay 41 is connected with a negative electrode of the external power supply, and a third end of the sixth relay 41 is connected with a positive electrode of the external power supply; the second end of the seventh relay 42 is connected with the positive electrode of the power supply of the product to be detected; the second end of the eighth relay 43 is connected with the negative electrode of the power supply of the product to be tested;
the fifth relay 40 and the sixth relay 41 are used for switching the path of an external power supply to provide forward voltage or reverse voltage for a product to be tested; the seventh relay 42 is used for switching on or off the path of the positive electrode of the power supply of the product to be tested; the eighth relay 43 is used to turn on or off the path of the negative electrode of the power supply of the product to be tested.
Referring to FIG. 4, a schematic diagram of a product power supply test is shown; under the condition that the switch of the seventh relay 42 is switched to the second end and the switch of the eighth relay 43 is switched to the second end, when the switch of the fifth relay 40 is switched to the second end and the switch of the sixth relay 41 is switched to the second end, the external power supply provides forward voltage for the product to be tested; when the switch of the fifth relay 40 is switched to the third terminal and the switch of the sixth relay 41 is switched to the third terminal, the external power supply provides a reverse voltage for the product to be tested; the third end of the seventh relay 42 and the third end of the eighth relay 43 are both vacant, and when the switch of the seventh relay 42 is switched to the third end, the passage of the power supply anode of the product to be tested is disconnected; when the switch of the eighth relay 43 is switched to the third terminal, the path of the negative electrode of the power supply of the product to be tested is disconnected.
Further, the apparatus further includes a ninth relay 44, a tenth relay 45, an eleventh relay 46, a twelfth relay 47; a first end of the ninth relay 44 is connected with a first end of the tenth relay 45, and a second end of the ninth relay 44 is connected with a sensor anode of the external power supply; the third end of the ninth relay 44 is connected with the negative electrode of the sensor of the external power supply; a first end of the eleventh relay 46 is connected with a first end of the twelfth relay 47, a second end of the eleventh relay 46 is connected with a negative electrode of a sensor of an external power supply, and a third end of the eleventh relay 46 is connected with a positive electrode of the sensor of the external power supply; a second end of the tenth relay 45 is connected to a first end of the seventh relay 42; a second end of the twelfth relay 47 is connected to a first end of the eighth relay 43.
The ninth relay 44 and the eleventh relay 46 are used for switching a sensor path of the external power supply to feed back a forward voltage or a reverse voltage of the product to be tested to the external power supply; the tenth relay 45 is used for switching on or off a feedback path of the power supply anode of the product to be tested; the twelfth relay 47 is used to turn on or off the feedback path of the negative electrode of the power supply of the product to be tested.
In practical implementation, the external power supply can purchase the existing power supply product, but needs to be provided with a sensor terminal and can automatically adjust the voltage of the external power supply according to a feedback signal acquired by a sensor; the external power supply generally having this function has four outgoing lines, two of which are power lines and ground lines, and the other two of which are sensor signal lines, as shown in fig. 4, when the switch of the tenth relay 45 is switched to the second end, and the switch of the twelfth relay 47 is switched to the second end, when the switch of the fifth relay 40 is switched to the second end, and the switch of the sixth relay 41 is switched to the second end, the switch of the ninth relay 44 is normally switched to the second end correspondingly, and the switch of the eleventh relay 46 is normally switched to the second end correspondingly, at this time, the actual forward voltage of the product to be measured is fed back to the external power supply, so that the external power supply automatically adjusts the voltage of the external power supply according to the fed-back actual forward voltage, and the actual forward voltage of the product to be measured is ensured to meet the preset requirement.
When the switch of the fifth relay 40 is switched to the third terminal, and the switch of the sixth relay 41 is switched to the third terminal, the switch of the ninth relay 44 is normally correspondingly switched to the third terminal, and the switch of the eleventh relay 46 is normally correspondingly switched to the third terminal, at this time, the actual reverse voltage of the product to be measured can be fed back to the external power supply, so that the external power supply can automatically adjust the voltage of the external power supply according to the fed-back actual reverse voltage, the actual reverse voltage of the product to be measured can meet the preset requirement, and the power compensation of the product to be measured can be realized.
For example, the product to be tested can normally work only with 12V voltage, and when a 12V external power supply is adopted, the voltage of the actual product to be tested can be reduced due to the loss on the wire harness, for example, 11.5V, which cannot meet the power supply requirement of the product to be tested; at this time, the voltage of the product to be measured can be detected in real time through a feedback circuit composed of the ninth relay 44, the tenth relay 45, the eleventh relay 46 and the twelfth relay 47, and the voltage of the external power supply is automatically increased, so that the voltage of the actual product to be measured is stabilized at 12V.
The third end of the tenth relay 45 and the third end of the twelfth relay 47 are both vacant, and when the switch of the tenth relay 45 is switched to the third end, the feedback path of the power supply anode of the product to be tested is disconnected; when the switch of the twelfth relay 47 is switched to the third terminal, the feedback path of the negative electrode of the power supply of the product to be tested is disconnected.
Further, the apparatus further comprises: thirteenth relay 48, fourteenth relay 49; a first end of the thirteenth relay 48 is connected with a second end of the seventh relay 42; a second end of the thirteenth relay 48 is connected with the negative electrode of the external current testing instrument; a first end of the fourteenth relay 49 is connected to a first end of the seventh relay 42; a second terminal of the fourteenth relay 49 is connected to the positive electrode of the external current testing instrument.
The thirteenth relay 48 is used for switching on or off a negative pole passage of the external current testing instrument; the fourteenth relay 49 is used to turn on or off the positive path of the external current testing apparatus.
As shown in fig. 4, in the case that the external power supply is a forward or reverse voltage of the product to be tested, the switch of the thirteenth relay 48 is switched to the second terminal and connected to the negative electrode of the external current testing apparatus, and the switch of the fourteenth relay 49 is switched to the second terminal and connected to the positive electrode of the external current testing apparatus, for example, the switches can be connected to two current testing terminals of a multimeter, so that the forward or reverse current of the overall loop of the product to be tested can be tested; in addition, the sleep current of the product to be tested can be tested; the third terminal of the thirteenth relay 48 and the third terminal of the fourteenth relay 49 are both vacant, and when the switch of the thirteenth relay 48 is switched to the third terminal, the negative pole passage of the external current testing instrument is disconnected; when the switch of the fourteenth relay 49 is switched to the third terminal, the positive passage of the external current test instrument is opened.
Further, the second interface 13 and the fourth interface 31 are aviation plugs. In practical implementation, the second interface 13 connected to the pins to be tested of the product to be tested and the fourth interface 31 connected to the external device may be an aviation plug, which may be used to purchase the existing product or customized according to the product test requirements or user requirements.
Further, the device also comprises a power amplification module; the output end of the power amplification module is respectively connected with the control coils of the first relays 10, the second relays 11 and the third relays 30 so as to drive the corresponding relays to act through the control coils; the power amplification module is used for providing matched driving signals for the corresponding relays through the control coils.
The power amplification module is generally used to output a large power to ensure sufficient load capacity, such as ULN 2003; in practical implementation, the plurality of first relays 10, the plurality of second relays 11, and the plurality of third relays 30 usually include control coils, and when the corresponding control coils are powered on or powered off through the power amplification module, the relays corresponding to the control coils can be controlled to be switched on or off.
Further, the apparatus also includes a controller; the output end of the controller is connected with the input end of the power amplification module; the controller is used for providing a matched driving signal for the power amplification module.
In practical implementation, the controller is a main key component in drive control of the plurality of first relays 10, the plurality of second relays 11, and the plurality of third relays 30.
Further, the device also includes a CAN (Controller Area Network) card module; the output end of the CAN card module is connected with the input end of the controller; the CAN card module is used for providing CAN communication signals for the controller.
The CAN card module CAN be understood as CAN card equipment, and in actual implementation, the CAN card equipment is usually adopted for communication, the CAN card equipment sends a received communication signal to the controller, and the controller provides a matched driving signal for the power amplification module according to the communication signal.
The testing device can be switched to any pin of a product to be tested at will, so that the impedance test between any two pins of the product to be tested, the current test of any output loop and the test of any I/O (In/Out); peripheral instruments can be fully utilized, the multiplexing of the instruments can be realized by testing the same type of pins of the product to be tested, multiple same devices are avoided, and the hardware cost is saved; in addition, the test device has universality, and the internal structure of the test device does not need to be changed along with the change of the definition of the pins of the product to be tested; aiming at different products, the test device can change the test content only by changing the switching channel of the internal relay.
Referring to fig. 5, a schematic structural diagram of a test system is shown, the test system includes an upper computer 50 and the test device 51; the upper computer 50 is connected with the input end of a CAN card module in the testing device 51; the upper computer 50 is used for sending CAN communication signals through the CAN card module, wherein the CAN communication signals comprise control instructions; the testing device 51 drives the corresponding relay in the testing device according to the control instruction to complete the testing of the corresponding function.
The upper computer 50 may be a computer capable of directly sending out a control instruction, and may be implemented by installing corresponding upper computer software in the computer, where Labview or Visual Studio may be used to write a related control instruction; in actual implementation, the upper computer 50 communicates with the testing device through the CAN card module, and sends a relay control instruction to the testing device through the CAN card module, and the testing device drives the corresponding first relay 10, the second relay 11 or the third relay 30 through an internal controller, a power amplification module and the like to complete testing of corresponding functions.
According to the test system, the corresponding control instruction is compiled in the upper computer software, so that the channel direction of the relay can be automatically tested through a software program, the lead wires of the wiring terminals corresponding to the pins to be tested of the product to be tested are connected to different peripheral equipment, and the measurement or input of the pins to be tested is realized.
Finally, it should be noted that: the above embodiments are only used to illustrate the technical solution of the present invention, and not to limit the same; although the present invention has been described in detail with reference to the foregoing embodiments, it should be understood by those skilled in the art that: the technical solutions described in the foregoing embodiments may still be modified, or some or all of the technical features may be equivalently replaced; such modifications and substitutions do not depart from the spirit and scope of the present invention.
Claims (10)
1. A testing device is characterized by comprising a plurality of first relays, a plurality of second relays, a first interface, a second interface and a third interface; the second interface includes a plurality of connection terminals;
the first ends of the first relays are connected with the first interfaces; second ends of the first relays are connected with the connecting terminals of the second interface in a one-to-one corresponding mode; the first ends of the second relays are connected with the third interface; second ends of the second relays are connected with the connecting terminals of the second interface in a one-to-one correspondence manner;
the plurality of connecting terminals of the second interface are used for connecting a plurality of pins to be tested of a product to be tested; the first relays and the second relays are used for switching circuit paths so as to connect two appointed pins in the pins to be tested; the first interface and the third interface are used for being respectively connected with two ends of external impedance testing equipment so as to test the impedance between the two appointed pins through the external impedance testing equipment.
2. The apparatus of claim 1, further comprising a plurality of third relays and a fourth interface; the fourth interface includes a plurality of connection terminals;
the first ends of the plurality of third relays are connected with the plurality of connecting terminals at the first end of the fourth interface in a one-to-one correspondence manner; second ends of the third relays are connected with the connecting terminals of the second interface in a one-to-one correspondence manner; a plurality of connecting terminals at the second end of the fourth interface are connected with an external instrument;
the plurality of third relays are used for switching circuit paths to connect with a designated pin in the pins to be tested; and the plurality of connecting terminals of the fourth interface are used for providing a communication interface for the designated pin and the external instrument.
3. The apparatus of claim 1, further comprising a fifth relay, a sixth relay, a seventh relay, and an eighth relay;
the first end of the fifth relay is connected with the first end of the seventh relay; the second end of the fifth relay is connected with the positive pole of an external power supply; the third end of the fifth relay is connected with the negative electrode of the external power supply;
the first end of the sixth relay is connected with the first end of the eighth relay, the second end of the sixth relay is connected with the negative electrode of the external power supply, and the third end of the sixth relay is connected with the positive electrode of the external power supply;
the second end of the seventh relay is connected with the power supply anode of the product to be tested; the second end of the eighth relay is connected with the negative electrode of the power supply of the product to be detected;
the fifth relay and the sixth relay are used for switching a path of the external power supply to provide forward voltage or reverse voltage for the product to be tested; the seventh relay is used for switching on or off the path of the power supply anode of the product to be tested; and the eighth relay is used for switching on or off the passage of the negative electrode of the power supply of the product to be tested.
4. The apparatus of claim 3, further comprising a ninth relay, a tenth relay, an eleventh relay, and a twelfth relay;
the first end of the ninth relay is connected with the first end of the tenth relay, and the second end of the ninth relay is connected with the positive electrode of the sensor of the external power supply; the third end of the ninth relay is connected with the negative electrode of the sensor of the external power supply;
a first end of the eleventh relay is connected with a first end of the twelfth relay, a second end of the eleventh relay is connected with a negative electrode of a sensor of the external power supply, and a third end of the eleventh relay is connected with a positive electrode of the sensor of the external power supply;
a second end of the tenth relay is connected with a first end of the seventh relay; the second end of the twelfth relay is connected with the first end of the eighth relay;
the ninth relay and the eleventh relay are used for switching a sensor access of the external power supply so as to feed back the forward voltage or the reverse voltage of the product to be tested to the external power supply; the tenth relay is used for switching on or off a feedback path of the power supply anode of the product to be tested; and the twelfth relay is used for switching on or off a feedback path of the negative electrode of the power supply of the product to be tested.
5. The apparatus of claim 3, further comprising: a thirteenth relay and a fourteenth relay;
the first end of the thirteenth relay is connected with the second end of the seventh relay; the second end of the thirteenth relay is connected with the negative electrode of an external current testing instrument;
a first end of the fourteenth relay is connected with a first end of the seventh relay; a second end of the fourteenth relay is connected with the positive electrode of the external current testing instrument;
the thirteenth relay is used for switching on or off a negative pole access of the external current testing instrument; the fourteenth relay is used for switching on or off a positive electrode passage of the external current testing instrument.
6. The apparatus of claim 2, wherein the second interface and the fourth interface are aircraft plugs.
7. The apparatus of claim 2, further comprising a power amplification module;
the output end of the power amplification module is respectively connected with the control coils of the plurality of first relays, the control coils of the plurality of second relays and the control coils of the plurality of third relays so as to drive the corresponding relays to act through the control coils;
and the power amplification module is used for providing matched driving signals for the corresponding relays through the control coils.
8. The apparatus of claim 7, further comprising a controller;
the output end of the controller is connected with the input end of the power amplification module;
the controller is used for providing a matched driving signal for the power amplification module.
9. The apparatus of claim 8, further comprising a CAN card module;
the output end of the CAN card module is connected with the input end of the controller;
the CAN card module is used for providing CAN communication signals for the controller.
10. A test system comprising an upper computer and a test apparatus according to any one of claims 1 to 9;
the upper computer is connected with the input end of a CAN card module in the testing device;
the upper computer is used for sending CAN communication signals through the CAN card module, wherein the CAN communication signals comprise control instructions;
and the testing device drives a corresponding relay in the testing device according to the control instruction so as to complete the test of a corresponding function.
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| CN201922233357.5U CN211697979U (en) | 2019-12-12 | 2019-12-12 | Test apparatus and test system |
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Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
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| CN113325823A (en) * | 2021-05-31 | 2021-08-31 | 重庆川仪速达机电有限公司 | Automatic testing system and method for diesel engine monitor |
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Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN113325823A (en) * | 2021-05-31 | 2021-08-31 | 重庆川仪速达机电有限公司 | Automatic testing system and method for diesel engine monitor |
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