CN217278537U - Quick-replacement probe for testing mobile phone chip - Google Patents

Abstract

The utility model discloses a test cell-phone chip quick replacement formula probe, including last syringe needle, spring, inner tube and tail PIN, it sets up in the inner tube top to go up the syringe needle, tail PIN sets up at the inner tube lower extreme, the intraductal spring that is provided with, the one end and the contact of tail PIN of spring, the other end and the lower terminal surface contact of last syringe needle, the lower terminal surface of going up the syringe needle sets up to the inclined plane, and the terminal surface and the inclined plane of spring set up to the face contact, and the spring gives the thrust of a side of last syringe needle when the syringe needle is flexible in outside promotion. The utility model provides a pair of test mobile phone chip quick replacement formula probe, the structure of going up the syringe needle has the contact on inclined plane, enables the product and makes the spring have side thrust to the syringe needle in the course of the work, makes syringe needle and the better contact of inner tube, upgrades to the face-to-face contact by point-to-face contact, and the conductivity can be better than conventional product, great promotion the performance of product itself for the resistance reduces.

Description

Quick-replaceable probe for testing mobile phone chip

Technical Field

The utility model relates to a mobile phone chip tests technical field, specifically is a test mobile phone chip quick replacement formula probe.

Background

In the prior art, a conventional test probe (as shown in fig. 2) is assembled by 3 parts including a needle bar, a needle tube and a spring, when the conventional test probe is tested, a needle head and the needle tube are in contact with each other through a point surface to conduct an electrical signal, the needle head is in contact with the needle tube by the precompression force of the spring, and because the needle head is vertically pressed down, the contact surface between the needle head and an inner tube is less, the conduction effect is general, and the contact resistance is larger, so the conventional test probe is not suitable for testing a mobile phone chip.

With the increasing demand for resistance in the field of circuit testing equipment, from the initial conventional aging test and ICT test of 200m Ω, to the current demand for 60m Ω resistance test (functional test), the structure of the conventional probe can not meet the current market demand, because the structure of the conventional test probe (as shown in fig. 2) supports the compression test of the needle head inside the tube by the spring, and because the needle head is pressed down vertically, the contact surface between the needle head and the inner tube is less, the conduction effect is general, and the contact resistance is larger, in the prior art, the conventional test probe can not realize the field of mobile phone chip testing equipment.

And because the mobile phone chip testing field is precise and high, the requirement is high, the product is small, the corresponding assembly cost of the product is increased, if the conventional mode before the use is continued, the probe can be replaced after all upper and lower carrier plates and all parts of the whole block are disassembled, and the mode of replacing the probe is not suitable for the mobile phone chip testing field, so the prior art has defects and needs to be upgraded and improved.

SUMMERY OF THE UTILITY MODEL

An object of the utility model is to provide a test cell-phone chip quick replacement formula probe to solve the problem that proposes in the above-mentioned background art.

In order to achieve the above object, the utility model provides a following technical scheme: the utility model provides a test cell-phone chip quick replacement formula probe, includes syringe needle, spring, inner tube and tail PIN, it sets up in the inner tube top to go up the syringe needle, tail PIN sets up at the inner tube lower extreme, be provided with the spring in the inner tube, the one end and the contact of tail PIN of spring, the other end and the lower terminal surface contact of last syringe needle, the lower terminal surface of going up the syringe needle sets up to the inclined plane, and the terminal surface and the inclined plane of spring set up to surface contact, and the spring gives the thrust of a side of last syringe needle when outwards promoting the syringe needle is flexible.

As a further optimization, the sealing position of the inner tube and the upper needle head is set to be a punching bag opening structure.

As a further optimization, one end of the tail PIN close to the spring is provided with a clamping groove and a ring groove.

As further optimization, a dotting structure matched with the clamping groove and the ring groove is arranged on the inner pipe.

As further optimization, the connecting end of the tail PIN is welded with a PCB.

As a further optimization, the contact end of the upper needle head is provided with various structures which are abutted on the test gold points.

Advantageous effects

The utility model provides a test cell-phone chip quick replacement formula probe, the structure of going up the syringe needle has the contact of inclined plane, can make the product impel the spring to have side thrust to the syringe needle in the course of the work, makes the syringe needle and inner tube better contact, upgrades to the face-to-face contact by point-to-face contact, and the conductivity can be better than conventional product, has greatly promoted the performance of product itself, makes the resistance reduce;

the sealing structure of the upper needle head and the inner tube of the utility model is upgraded from the conventional blade locking mode to the punching bag-opening mode, so that the internal productivity and efficiency can be greatly improved, and the original 600pcs/H is upgraded to 1200pcs/H, therefore, the production efficiency is greatly improved on the structural improvement, and the labor cost is saved;

the utility model is used for cell-phone chip test field, because of the product requirement is accurate, the size is little, changes inconveniently, just can realize changing the probe after will unpacing apart all upper and lower support plates of monoblock and all parts in conventional mode relatively, and the cost is very high, the utility model discloses the tail PIN of probe designs with the inner tube structure of beating points according to, after the PCB soldering tin of tail PIN and customer end, when the probe was changed, only need pull out the probe can, continue to insert during the new needle and go up the tail and continue to use on the tail PIN, convenient to use has so reduced use cost.

Drawings

Fig. 1 is a schematic diagram of the structure of the probe of the present invention;

FIG. 2 is a schematic view of the shape of the head of the upper needle-engaging end of the present invention;

fig. 3 is a schematic view of the probe according to the present invention.

Reference numerals

Upper needle 10, spring 11, inner tube 12, tail PIN13, PCB board 14.

Detailed Description

The following are specific embodiments of the present invention and the accompanying drawings are used to further describe the technical solution of the present invention, but the present invention is not limited to these embodiments.

Examples

Finally, it should be noted that: although the present invention has been described in detail with reference to the foregoing embodiments, it will be apparent to those skilled in the art that modifications may be made to the embodiments described above, or equivalents may be substituted for elements thereof. Any modification, equivalent replacement, or improvement made within the spirit and principle of the present invention should be included in the content of the present invention within the protection scope of the present invention.

The utility model provides a test cell-phone chip quick replacement formula probe, including last syringe needle 10, spring 11, inner tube 12 and tail PIN13, it sets up in inner tube 12 top to go up syringe needle 10, tail PIN13 sets up at inner tube 12 lower extreme, be provided with spring 11 in the inner tube 12, spring 11's one end and tail PIN13 contact, the other end contacts with the lower terminal surface of last syringe needle 10, wherein last syringe needle contacts with test gold point, tail PIN and PCB board welding, the realization switches on, syringe needle afterbody "V2Q structure", the lower terminal surface of going up syringe needle 10 sets up to the inclined plane, spring 11's terminal surface sets up to surface contact with the inclined plane, spring 11 gives the thrust of 10 a side of syringe needle when outwards promoting last syringe needle 10 to stretch out and draw back, let the syringe needle contact closely with the pipe wall of inner tube, keep a good contact, can realize the low resistance.

In this embodiment, PCB board 14 is connected to tail PIN13, can directly realize switching on after the welding, and tail PIN is fixed to the recess result and the inner tube adoption of tail PIN13 other end are beaten the technology to material characteristic ductility according to inner tube phosphor bronze can realize plug many times, can realize the demand of client like this, the convenient demand of change probe.

In this embodiment, the improved sealing mode (bag mouth) of the mobile phone chip test probe can greatly improve the internal performance and reduce the internal cost.

In the embodiment, all the parts are formed by one-step machining and are stable in process, and the spring 11 adopts a piano steel crystal wire and can provide stable elasticity; the whole surface of the probe is plated with gold to prevent oxidation, so that the resistance value service life stability of the product is improved.

In this embodiment, the shape of the probe contact end head can be selected from a C-head type, an F-head type, and an H-head type, or can be set to any other structure, which is only matched with the tested product, and a part of the structure of the probe contact end head is shown in fig. 2.

The working principle is as follows: the utility model discloses the probe is used for installing in test instrument tool, and syringe needle and test gold point puncture contact on the probe, and the welded mode that tail PIN end adopted connects the PCB board, can make it guarantee better conductivity, and the synapsis portion of the product under test can produce a reaction force to the probe this moment, leads to the compression of probe spring part to produce elasticity, and the inner structure of probe guarantees that syringe needle inside is in perfect contact with interior pipe wall, and the probe is in stable contact with the product under test; simultaneously according to the on-the-spot actual change probe in customer's condition of use, choose for use to change suitable probe, probe tail PIN adopts the technology of dotting, realizes plug-in probe, when the customer need change the probe, only need to extract the probe can, adopt same mode to insert when changing the probe can used repeatedly, can realize like this that measured product and test equipment pass through the probe and switch on, electric signal passes through probe transmission to measured product, forms the return circuit, refers to fig. 3.

Claims (6)

1. The utility model provides a test cell-phone chip quick replacement formula probe, includes syringe needle (10), spring (11), inner tube (12) and tail PIN (13), it sets up in inner tube (12) top to go up syringe needle (10), tail PIN (13) set up at inner tube (12) lower extreme, be provided with spring (11) in inner tube (12), the one end and the contact of tail PIN (13) of spring (11), the other end and the lower terminal surface contact of last syringe needle (10), its characterized in that: the lower end face of the upper needle head (10) is arranged to be an inclined face, the end face of the spring (11) is in surface contact with the inclined face, and the spring (11) pushes the upper needle head (10) outwards to stretch and give thrust to one side edge of the upper needle head (10).

2. The quick-change probe for testing chips of mobile phones of claim 1, wherein: the sealing positions of the inner tube (12) and the upper needle head (10) are set to be of a punching bag opening structure.

3. The quick-change probe for testing chips of mobile phones of claim 1, wherein: and a clamping groove and a ring groove are formed in one end, close to the spring (11), of the tail PIN (13).

4. The quick-change probe for testing chips of mobile phones of claim 3, wherein: and a dotting structure matched with the clamping groove and the ring groove for use is arranged on the inner pipe (12).

5. The quick-change probe for testing chips of mobile phones of claim 4, wherein: and a PCB is welded at the connecting end of the tail PIN (13).

6. The quick-change probe for testing chips of mobile phones of claim 4, wherein: the contact end of the upper needle head (10) is provided with various structures and is abutted against the test gold point.

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