CN217156594U

CN217156594U - Tunable test probe with miniaturized stable structure

Info

Publication number: CN217156594U
Application number: CN202220914438.0U
Authority: CN
Inventors: 刘好; 唐锡辉; 左达恒
Original assignee: Shenzhen Heyi Testing Technology Co ltd
Current assignee: Shenzhen Heyi Testing Technology Co ltd
Priority date: 2022-04-20
Filing date: 2022-04-20
Publication date: 2022-08-09
Anticipated expiration: 2032-04-20

Abstract

The utility model provides a tunable test probe with a miniaturized and stable structure, which comprises a packaging shell, wherein a circuit board is arranged in the packaging shell, one end of the packaging shell is connected with a test cable joint, and the test cable joint is electrically connected with the circuit board; the other end of the packaging shell is gradually contracted to form a contraction end; the diameter of the contraction end is gradually reduced, so that the volume of one end of the probe, which is close to the test board, is reduced, the structural design is more compact, a certain reserved space on the test board can be kept, and components on the test board cannot be touched and damaged; furthermore, inserting a signal probe into the contraction end to be electrically connected with the circuit board, and partially extending out of the contraction end to be connected with an external radio frequency test point to be tested; the signal needle can be well fixed on the contraction end, and the circuit board is clamped in the packaging shell, so that the structural design is ingenious, and the overall shielding performance is good; more preferably, the package housing is a metal housing and is connected to the ground terminal of the circuit board, so as to form excellent shielding and grounding properties.

Description

Tunable test probe with miniaturized stable structure

Technical Field

The utility model relates to a radio frequency test probe technical field especially relates to miniaturized stable structure's tunable test probe.

Background

In recent years, along with the continuous development of communication technology, the popularity of wireless products is higher and higher, the number of wireless products produced globally every year is also increasing, and the production and the life of people are more and more convenient. The wireless products (represented by mobile phones) mainly refer to communication signals with a frequency range of 300 kHz-300 GHz, and the communication signals in the frequency range are also called radio frequency signals. In order to ensure the quality of the radio frequency signal on the main board of the wireless product so as to meet a series of most basic wireless communication requirements of the wireless product, a board-level radio frequency test is usually performed on a radio frequency chip on the main board.

In the prior art, the most original radio frequency testing technology is that a radio frequency spring plate corresponds to a radio frequency testing probe with fixed impedance; on this basis the inventors have developed various solutions to improve, cited documents having application numbers 202010838777.0; 202011185920.7 and 202011182049.5; the three schemes are summarized in that the tuning component is arranged to match the impedance of various board-level radio frequency loops, and the distance between the tuning component and a board-level elastic sheet is shortened, so that the influence of external impedance is further reduced; the formed radio frequency test probe is shown as a structure disclosed in 202011185920.7, and is specifically an embedded tuning circuit board probe based on a radio frequency test base for testing radio frequency signals; a circuit board of a tuning assembly is embedded in an encapsulation shell, and then a grounding pin and a signal pin extend out of the encapsulation shell to be connected to a plate to be tested; however, in practice, the distance between the grounding pin and the test pin is too large, and the structural design is not compact enough; the volume of one end close to the test board is too large, and the electronic components are easily touched when the test board level elastic sheet is contacted, so the structure needs to be improved to avoid touching the electronic components.

SUMMERY OF THE UTILITY MODEL

Aiming at the problems that the whole volume is overlarge, the design of a tip part is not compact enough and an electronic component on a tested circuit board is easy to touch in the prior art; provides a technical scheme for solving the problem.

In order to achieve the above object, the present invention provides a tunable test probe with a miniaturized stable structure, including:

the test device comprises a packaging shell, a test cable connector and a test signal processing circuit, wherein a circuit board is arranged in the packaging shell, one end of the packaging shell is connected with the test cable connector, and the test cable connector is electrically connected with the circuit board; the other end of the packaging shell is gradually contracted to form a contraction end;

and the signal probe is inserted into the contraction end and is electrically connected with the circuit board, and part of the signal probe extends out of the contraction end and is connected with an external radio frequency test point to be tested.

Preferably, the packaging shell is a metal piece and is communicated with the grounding end of the circuit board; wherein an insulating part is arranged between the signal probe and the contraction end.

Preferably, the contraction end is provided with a grounding pin, and the grounding pin is electrically connected with the packaging shell.

Preferably, when there are at least two grounding pins; the grounding pin is arranged around the signal probe.

Preferably, the package housing includes an upper cover and a lower cover, and the circuit board is sandwiched between the upper cover and the lower cover; the upper cover and the lower cover are both metal pieces so as to form a shielding structure; the contraction end of the upper cover or the lower cover is connected with the signal probe.

Preferably, a connecting seat is arranged at one end, far away from the signal probe, of the upper cover, and the connecting seat is connected with the test cable connector.

Preferably, the test cable connector is one of SMA and SMPM standard connector.

Preferably, the lower cover is provided with a through hole, the circuit board is provided with a pin header corresponding to the through hole, and the pin header is exposed out of the through hole and is used for being connected with an external regulation and control assembly.

Preferably, the grounding metal area of the circuit board is arranged around the edge of the circuit board, and the connecting holes of the upper cover, the circuit board and the lower cover are positioned in the grounding metal area; the upper cover, the circuit board and the lower cover are connected by screws to form close contact.

The utility model has the advantages that: the utility model provides a tunable test probe with a miniaturized and stable structure, which comprises a packaging shell, wherein a circuit board is arranged in the packaging shell, one end of the packaging shell is connected with a test cable joint, and the test cable joint is electrically connected with the circuit board; the other end of the packaging shell is gradually contracted to form a contraction end; the diameter of the contraction end is gradually reduced, so that the volume of one end of the probe, which is close to the test board, is reduced, the structural design is more compact, a certain reserved space on the test board can be kept, and components on the test board cannot be touched and damaged; furthermore, inserting a signal probe into the contraction end to be electrically connected with the circuit board, and partially extending out of the contraction end to be connected with an external radio frequency test point to be tested; the signal pin can be well fixed on the contraction end, and the circuit board is clamped in the packaging shell, so that impedance tuning can be realized, the circuit board and the test probe can be stably fixed, the structural design is ingenious, and the overall shielding performance is good; more preferably, the package housing is a metal housing and is connected to the ground terminal of the circuit board, so as to form excellent shielding and grounding properties.

Drawings

Fig. 1 is a perspective view of the present invention;

FIG. 2 is an exploded view of the present invention;

FIG. 3 is a structural view of the present invention with the upper cover omitted;

fig. 4 is a drawing of the structure of the contraction end of the present invention.

The main element symbols are as follows:

1. a package housing; 11. testing the cable joint; 12. a contracting end; 13. an upper cover; 131. a connecting seat; 14. a lower cover; 141. a through hole;

2. a circuit board; 21. a ground metal region;

3. a signal probe; 31. an insulating member;

4. and a grounding pin.

Detailed Description

In order to make the present invention clearer, the present invention will be further described with reference to the accompanying drawings.

In the following description, details of the preferred examples are given to provide a more thorough understanding of the invention. It is to be understood that the disclosed embodiments are merely exemplary of the invention, and are not intended to limit the invention to the precise embodiments disclosed. It should be understood that the detailed description and specific examples, while indicating the invention, are intended for purposes of illustration only and are not intended to limit the scope of the invention.

It will be understood that the terms "comprises" and/or "comprising," when used in this specification, specify the presence of stated features, integers, steps, operations, elements, or components, but do not preclude the presence or addition of one or more other features, integers, steps, operations, elements, components, or groups thereof.

The rf tuning technique incorporated in this scheme is described in application No. 202010838777.0; 202011185920.7 and 202011182049.5, which are already part of the prior art, are not described in detail herein, and the circuit formed by the tuning elements is designed on the circuit board, so that the structural design premise of the present application is met.

The utility model discloses a tunable test probe with a miniaturized and stable structure, please refer to fig. 1-3; the method comprises the following steps:

the testing device comprises a packaging shell 1, wherein a circuit board 2 is arranged in the packaging shell 1, one end of the packaging shell 1 is connected with a testing cable connector 11, and the testing cable connector 11 is electrically connected with the circuit board 2; the other end of the packaging shell 1 is gradually contracted to form a contraction end 12; the test cable joint is used for connecting a test instrument, and the circuit board has the function of tuning impedances on different test board levels so as to achieve the effect of convenient adaptation; because the assembly of the circuit board is added on the premise of the scheme, the volume is increased compared with a constant value impedance probe commonly used in the market; therefore, in order to prevent the phenomenon that the electronic components of the test board are damaged by error touch, one end of the probe close to the test board is set to be a tapered structure so as to reduce the volume which is possibly contacted with the test board;

the signal probe 3 is inserted into the contraction end 12 and electrically connected with the circuit board 2, and part of the signal probe extends out of the contraction end to be connected with an external radio frequency test point to be tested; the external radio frequency test point to be tested can be a metal elastic sheet on a circuit board to be tested or a copper exposing point to be tested on a radio frequency circuit to be tested; the signal probe is inserted into one side of the contraction end, so that the possible interference volume between the whole test probe and the circuit board to be tested can be reduced; thereby improving the application range of the tunable test probe; meanwhile, the circuit board is packaged in the packaging shell, the structure is more stable, the stress is more uniform and symmetrical, and the service life can be ensured under the high-frequency contact.

In this embodiment, the package housing 1 is a metal member and is communicated with the ground terminal of the circuit board 2; wherein, an insulating part 31 is arranged between the signal probe 3 and the contraction end 12; the packaging shell is set as a metal piece, and the circuit board is embedded in the packaging shell, so that the packaging shell can provide a good omnibearing shielding effect, and the measurement process is more accurate and stable; and the addition of the dielectric can form a coaxial rf line structure to form a 50 ohm impedance.

In the embodiment, the contraction end 12 is provided with a grounding pin 4, and the grounding pin 4 is electrically connected with the package housing. The test device can provide a good grounding terminal environment when contacting a board level to be tested, so that the test process is more stable, the data interference is less, and the fluctuation is small.

In the present embodiment, please refer to fig. 4; when at least two grounding pins 4 are provided; the grounding pin 4 is arranged around the signal probe; because the distance between the grounding pin and the signal probe has different requirements on different radio frequency test points to be tested, a plurality of grounding pins with different distances from the signal probe may be needed to ensure good grounding performance; in a more preferable scheme, the grounding needles are arranged on a central symmetry axis of the integral test probe, the integral structure is designed in a symmetrical mode, and the grounding needles are arranged in a mode of gradually enlarging the radius at the circumferential position by taking the grounding needles as the circle center; the symmetrical structure can ensure the stability when the signal probe is used for contact, and ensure the stable structure without deviation in the long-term operation of the assembly line, and has stable structure and long service life.

In the present embodiment, the package housing 1 includes an upper cover 13 and a lower cover 14, and the circuit board 2 is clamped between the upper cover 13 and the lower cover 14; the upper cover 13 and the lower cover 14 are both metal pieces to form a shielding structure; the contraction end of the upper cover or the lower cover is connected with a signal probe. Forming a detachable structure can facilitate adjustment and maintenance.

In this embodiment, a connection seat 131 is disposed at an end of the upper cover 13 away from the signal probe 3, and the connection seat 131 is connected to the test cable connector 11. So that the external tool clamp can be clamped and fixed.

In the embodiment, the test cable connector is one of SMA and SMPM standard connectors or other radio frequency standard connectors.

In this embodiment, the lower cover 14 is provided with a through hole 141, and the circuit board is provided with a pin header corresponding to the through hole, and the pin header exposes the through hole for connecting with an external regulation and control component. The impedance matching can be conveniently carried out on the circuit board by accessing an external regulation and control assembly, and the test condition can be detected in real time.

In this embodiment, the grounding metal region 21 of the circuit board 2 is disposed around the edge of the circuit board, and the connection holes of the upper cover, the circuit board and the lower cover are located in the grounding metal region 21; the upper cover, the circuit board and the lower cover are connected by screws to form close contact. When the three components are tightly fixed through the screws, good grounding performance among the grounding metal area, the upper cover and the lower cover is realized.

The utility model has the advantages that:

1. the whole volume is reduced, and the problem of mistakenly touching the board-level electronic component to be tested is prevented;

2. the shielding performance is excellent, and the grounding performance is good.

The above disclosure is only for the specific embodiments of the present invention, but the present invention is not limited thereto, and any changes that can be made by those skilled in the art should fall within the protection scope of the present invention.

Claims

1. A miniaturized, stable structure, tunable test probe, comprising:

2. The tunable test probe with a miniaturized and stabilized structure as claimed in claim 1, wherein the package housing is a metal member and is in communication with a ground terminal of the circuit board; wherein an insulating part is arranged between the signal probe and the contraction end.

3. The miniaturized, rugged, tunable test probe of claim 2, wherein the pinch end is provided with a grounding pin, the grounding pin being electrically connected to the package housing.

4. The miniaturized, rugged, tunable test probe of claim 3, wherein when there are at least two ground pins; the grounding pin is arranged around the signal probe.

5. The tunable test probe of any one of claims 1 to 4, wherein the package housing comprises an upper cover and a lower cover, and the circuit board is clamped between the upper cover and the lower cover; the upper cover and the lower cover are both metal pieces to form a shielding structure; the contraction end of the upper cover or the lower cover is connected with the signal probe.

6. The tunable test probe with a miniaturized and stabilized structure as claimed in claim 5, wherein an end of the upper cover away from the signal probe is provided with a connection seat, and the test cable connector is connected to the connection seat.

7. The tunable test probe of claim 6, wherein the test cable connector is one of an SMA, SMPM standard connector.

8. The tunable test probe with a miniaturized and stabilized structure as claimed in claim 5, wherein the lower cover is provided with a through hole, the circuit board is provided with a pin header corresponding to the through hole, and the pin header is exposed out of the through hole for connecting with an external regulation and control component.

9. The tunable test probe of claim 5, wherein a ground metal region of the circuit board is disposed around an edge of the circuit board, and the connection holes of the upper cover, the circuit board and the lower cover are located in the ground metal region; the upper cover, the circuit board and the lower cover are connected by screws to form close contact.