CN217133212U - Medium-small size universal test fixture - Google Patents

Medium-small size universal test fixture Download PDF

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Publication number
CN217133212U
CN217133212U CN202123258892.XU CN202123258892U CN217133212U CN 217133212 U CN217133212 U CN 217133212U CN 202123258892 U CN202123258892 U CN 202123258892U CN 217133212 U CN217133212 U CN 217133212U
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China
Prior art keywords
installation bin
pressing
pcb
piece
screw rod
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Active
Application number
CN202123258892.XU
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Chinese (zh)
Inventor
黄磊
胡权峰
周威海
陈克萍
任曙彪
彭琪
黄露露
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Jinlong Machinery & Electronics Hangzhou Co ltd
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Jinlong Machinery & Electronics Hangzhou Co ltd
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Priority to CN202123258892.XU priority Critical patent/CN217133212U/en
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Publication of CN217133212U publication Critical patent/CN217133212U/en
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Abstract

The utility model provides a medium and small size universal test fixture, which relates to the field of test fixtures and comprises an installation bin, a placement platform, a cover plate and a probe support plate, wherein the top of the installation bin is provided with an opening; the utility model discloses a thereby rotate the screw rod and adjust the single position of placing the piece, place the piece through four groups and constitute a standing groove and put into the standing groove with the probe support plate, place the inboard slope border of piece and probe support plate looks block simultaneously to can make this device can install not unidimensional probe support plate.

Description

Medium-small size universal test fixture
Technical Field
The utility model relates to a test fixture technical field especially relates to a general test fixture of well small-size.
Background
The jig is a tool for carpenters, ironmen and other handicrafts, mainly used as a tool for assisting in controlling position or action (or both), and the test jig belongs to a category below the jig and is a jig specially used for testing and experimenting functions, power calibration, service life, performance and the like of products.
General test fixture structure on the market is fixed, and a test fixture can only be used for testing same kind of product usually, when needs test the product of other sizes, need change different test fixture, and traditional test fixture is inconvenient when changing the probe support plate, also is not suitable for the installation of the probe support plate of not unidimensional simultaneously, and the commonality is relatively poor, consequently the utility model provides a well general test fixture of small-size is in order to solve the problem that exists among the prior art.
SUMMERY OF THE UTILITY MODEL
To the above problem, the utility model provides a general test fixture of well small-size, thereby this general test fixture of well small-size is through rotating the screw rod and adjusting single position of placing the piece, places the piece through four groups and constitutes a standing groove and put into the standing groove with the probe support plate in, places the inboard slope border of piece and probe support plate looks block simultaneously to can make this device can install not unidimensional probe support plate.
For realizing the purpose of the utility model, the utility model discloses a following technical scheme realizes: a middle-small-size universal test fixture comprises an installation bin, a placing platform, a cover plate and a probe carrier plate, wherein an opening is formed in the top of the installation bin, the cover plate is clamped on the top of the installation bin, a test panel is arranged on the cover plate, the placing platform is arranged at the bottom of the installation bin, a universal test frame is arranged inside the installation bin, springs are symmetrically arranged at the bottom of the universal test frame, an adjusting assembly used for clamping and fixing the probe carrier plate is arranged on the universal test frame, a limiting assembly used for limiting and guiding the adjusting assembly used for clamping and fixing the probe carrier plate is arranged on the installation bin, a through hole is formed in the bottom of the installation bin, a PCB is arranged at the top of the probe carrier plate, a contact is arranged at the bottom of the PCB, and a pressing assembly is arranged at the top of the PCB;
the further improvement lies in that: the probe carrier plate is provided with a needle core, the lower end of the needle core is matched with the through hole, and the upper end of the needle core is connected with a contact at the bottom of the PCB.
The further improvement lies in that: the adjusting part comprises a screw rod and placing blocks, the placing blocks are provided with four groups, the placing blocks are arranged in the four inner sides of the universal testing frame respectively, the screw rods are installed on the four edges of the universal testing frame in a threaded mode, one end of each screw rod is connected with the placing blocks in a rotating mode, the four groups of the placing blocks are arranged in the inner sides of the placing blocks and are provided with inclined edges, the inclined edges are clamped with the edges of the probe carrier plate, and the screw rods are rotated to adjust the distances between the four placing blocks.
The further improvement lies in that: the limiting assembly comprises limiting grooves, the limiting grooves are formed in four sides of the mounting bin and are matched with the screw rods, rotating caps are arranged on the four sides of the mounting bin, and one end of each screw rod penetrates through the limiting grooves and then is fixedly connected with the inner side of each rotating cap.
The further improvement lies in that: the top of the PCB is connected with the test panel at the top of the cover plate through a flexible conductor, and the needle core penetrates through the through hole through the pressing assembly to be connected with an article to be tested and transmits a signal to the test panel.
The further improvement lies in that: the pressing assembly comprises a pressing rod and a pressing cap, the pressing rod is arranged in the middle positions of the two ends of the top of the PCB, the pressing cap is arranged above the cover plate, and the upper end of the pressing rod penetrates through the cover plate and then is connected with the bottom of the pressing cap.
The beneficial effects of the utility model are that: the utility model discloses a thereby rotate the screw rod and adjust the position of single piece of placing, place the piece through four groups and constitute a standing groove and put into the standing groove with the probe support plate, place the inboard slope border of piece and probe support plate looks block simultaneously, thereby can make this device install not unidimensional probe support plate, when testing, only need press the cap and can make the nook closing member on the probe support plate stretch out from installing the storehouse, and test the piece that awaits measuring on the place the platform, take off the apron of block when needs are changed, can change the probe support plate, the change time has been reduced, also more convenience.
Drawings
Figure 1 is the inside schematic view of the utility model discloses the installation storehouse.
Fig. 2 is a front view of the present invention.
Fig. 3 is a top view of the minimum-sized probe carrier of the present invention.
Fig. 4 is a top view of the probe carrier plate with larger size according to the present invention.
Wherein: 1. installing a bin; 2. placing a platform; 3. a cover plate; 4. testing the panel; 5. a universal test rack; 6. a probe carrier plate; 7. a through hole; 8. a PCB circuit board; 9. a screw; 10. placing the blocks; 11. a beveled edge; 12. a needle core; 13. a limiting groove; 14. rotating the cap; 15. a pressure lever; 16. pressing the cap; 17. a flexible wire; 18. a spring.
Detailed Description
In order to deepen the understanding of the present invention, the following embodiments will be combined to make the present invention do further details, and the present embodiment is only used for explaining the present invention, and does not constitute the limitation of the protection scope of the present invention.
According to fig. 1, 2, 3 and 4, the embodiment provides a medium-small-sized universal testing jig, which comprises an installation bin 1, a placing platform 2, a cover plate 3 and a probe carrier plate 6, wherein an opening is formed in the top of the installation bin 1, the cover plate 3 is clamped on the top of the installation bin 1, a testing panel 4 is arranged on the cover plate 3, the placing platform 2 is arranged at the bottom of the installation bin 1, a universal testing frame 5 is arranged inside the installation bin 1, springs 18 are symmetrically arranged at the bottom of the universal testing frame 5, an adjusting component for clamping and fixing the probe carrier plate is arranged on the universal testing frame 5, a limiting component for limiting and guiding the adjusting component is arranged on the installation bin 1, a through hole 7 is formed in the bottom of the installation bin 1, a PCB 8 is arranged at the top of the probe carrier plate 6, a contact is arranged at the bottom of the PCB 8, the top of the PCB 8 is provided with a pressing component, the clamping structure between the cover plate 3 and the mounting bin 1 is the prior art, and the principle is that the rotating clamping block is clamped into the clamping groove to realize convenient disassembly;
the adjusting component comprises a screw rod 9 and placing blocks 10, the placing blocks 10 are provided with four groups, the four groups of placing blocks 10 are respectively arranged at the inner sides of four sides of the universal test rack 5, the four sides of the universal test frame 5 are provided with screw rods 9 in a threaded manner, one end of each screw rod 9 is rotatably connected with the placing blocks 10, the inner sides of the four placing blocks 10 are provided with inclined edges 11, the inclined edges 11 are clamped with the edges of the probe carrier plate 6, the screw rods 9 are rotated to adjust the distance between the four groups of placing blocks 10, and by rotating the screw rods 9, thereby adjusting the position of each placing block 10, limiting the probe carrier plates 6 with different sizes, simultaneously jointing the inclined edges 11 with the edges of the probe carrier plates 6, thereby further spacing it, through pressing the subassembly, oppression PCB circuit board 8 moves down, further makes general test jig 5 move down and oppress spring 18 and contract.
The probe carrier plate 6 is provided with a needle core 12, the lower end of the needle core 12 is matched with the through hole 7, the upper end of the needle core 12 is connected with a contact at the bottom of the PCB 8, and the needle core 12 on the probe carrier plate 6 penetrates through the through hole 7 to detect a piece to be detected.
The limiting assembly comprises limiting grooves 13, the limiting grooves 13 are formed in four sides of the mounting bin 1, the limiting grooves 13 are matched with the screw rods 9, rotating caps 14 are arranged on four sides of the mounting bin 1, one ends of the screw rods 9 penetrate through the limiting grooves 13 and then are fixedly connected with the inner sides of the rotating caps 14, and the limiting grooves 13 are connected with the screw rods 9 in a sliding mode, so that the structure on the universal testing frame 5 is limited, and the needle cores 12 are prevented from deviating.
The pressing assembly comprises a pressing rod 15 and a pressing cap 16, the pressing rod 15 is arranged at the middle position of two ends of the top of the PCB 8, the pressing cap 16 is arranged above the cover plate 3, the upper end of the pressing rod 15 penetrates through the cover plate 3 and then is connected with the bottom of the pressing cap 16, the pressing cap 16 is pressed, so that the pressing rod 15 presses the PCB 8 to move downwards, the universal testing frame 5 is pressed to move downwards, the bottom spring 18 is pressed to contract, and the probe support plate 6 inside the universal testing frame 5 drives the needle core 12 to move downwards.
The top of the PCB circuit board 8 is connected with the test panel 4 at the top of the cover plate 3 through a flexible lead 17, and the stylet 12 penetrates through the through hole 7 through the pressing component to be connected with an object to be tested and transmits a signal to the test panel 4.
Thereby this general test fixture of well small-size is through rotating screw rod 9 and adjusting the position that singly places piece 10, place piece 10 through four groups and constitute a standing groove and put into the standing groove with probe support plate 6, place the inboard slope border 11 of piece 10 simultaneously and probe support plate 6 looks block, thereby can make this device can install not unidimensional probe support plate 6, when testing, only need press the cap 16 and can make the nook closing member 12 on the probe support plate 6 stretch out from installation storehouse 1, and test the piece that awaits measuring on the place the platform 2, take off the apron 3 of block when needs are changed, can change probe support plate 6, change time has been reduced, convenience more also.
The foregoing illustrates and describes the principles, general features, and advantages of the present invention. It will be understood by those skilled in the art that the present invention is not limited to the above embodiments, and that the foregoing embodiments and descriptions are provided only to illustrate the principles of the present invention without departing from the spirit and scope of the present invention. The scope of the invention is defined by the appended claims and equivalents thereof.

Claims (6)

1. The utility model provides a general test fixture of small-size in, its characterized in that: comprises an installation bin (1), a placing platform (2), a cover plate (3) and a probe carrier plate (6), wherein the top of the installation bin (1) is provided with an opening, the cover plate (3) is clamped at the top of the installation bin (1), the cover plate (3) is provided with a test panel (4), the bottom of the installation bin (1) is provided with the placing platform (2), a universal test frame (5) is arranged inside the installation bin (1), the bottom of the universal test frame (5) is symmetrically provided with springs (18), the universal test frame (5) is provided with an adjusting component for clamping and fixing the probe carrier plate, the installation bin (1) is provided with a limiting component for limiting and guiding the adjusting component, the bottom of the installation bin (1) is provided with a through hole (7), the top of the probe carrier plate (6) is provided with a PCB (8), the bottom of the PCB (8) is provided with a contact, and the top of the PCB (8) is provided with a pressing component.
2. The universal testing fixture of claim 1, wherein: the probe carrier plate (6) is provided with a needle core (12), the lower end of the needle core (12) is matched with the through hole (7), and the upper end of the needle core (12) is connected with a contact at the bottom of the PCB (8).
3. The universal testing fixture of claim 1, wherein: the adjusting part includes screw rod (9) and places piece (10), it is equipped with four groups to place piece (10), four groups place piece (10) and set up the inboard at general test jig (5) four sides respectively, screw rod (9) are installed to the screw thread on the four sides of general test jig (5), the one end of screw rod (9) with place piece (10) and rotate the connection, four groups the inboard of placing piece (10) is equipped with slope border (11), the edge block of slope border (11) and probe support plate (6) rotates screw rod (9) are adjusted four groups and are placed the distance between piece (10).
4. The universal testing fixture of claim 3, wherein: the limiting assembly comprises a limiting groove (13), the limiting grooves (13) are formed in four sides of the installation bin (1), the limiting groove (13) is matched with the screw rod (9), the rotating caps (14) are arranged on four sides of the installation bin (1), and one end of the screw rod (9) penetrates through the limiting groove (13) and then is fixedly connected with the inner side of the rotating cap (14).
5. The universal testing fixture of claim 2, wherein: the top of PCB circuit board (8) is passed through flexible conductor (17) and is connected with test panel (4) at apron (3) top, nook closing member (12) pass through-hole (7) through pressing the subassembly and are connected and with signal transmission to test panel (4) on.
6. The universal testing fixture of claim 1 or 5, wherein: the pressing assembly comprises a pressing rod (15) and a pressing cap (16), the pressing rod (15) is arranged at the middle positions of the two ends of the top of the PCB (8), the pressing cap (16) is arranged above the cover plate (3), and the upper end of the pressing rod (15) penetrates through the cover plate (3) and then is connected with the bottom of the pressing cap (16).
CN202123258892.XU 2021-12-23 2021-12-23 Medium-small size universal test fixture Active CN217133212U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN202123258892.XU CN217133212U (en) 2021-12-23 2021-12-23 Medium-small size universal test fixture

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN202123258892.XU CN217133212U (en) 2021-12-23 2021-12-23 Medium-small size universal test fixture

Publications (1)

Publication Number Publication Date
CN217133212U true CN217133212U (en) 2022-08-05

Family

ID=82617680

Family Applications (1)

Application Number Title Priority Date Filing Date
CN202123258892.XU Active CN217133212U (en) 2021-12-23 2021-12-23 Medium-small size universal test fixture

Country Status (1)

Country Link
CN (1) CN217133212U (en)

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