CN216816834U - Capacitive touch line test system - Google Patents
Capacitive touch line test system Download PDFInfo
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- CN216816834U CN216816834U CN202123304792.6U CN202123304792U CN216816834U CN 216816834 U CN216816834 U CN 216816834U CN 202123304792 U CN202123304792 U CN 202123304792U CN 216816834 U CN216816834 U CN 216816834U
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Abstract
The utility model discloses a capacitive touch line test system, which comprises: a computer, an automatic press, an electrical property testing device and a product jig; the electrical property testing device is used for carrying out electrical property testing; the product jig is used for fixing a capacitive touch circuit, so that a circuit of the capacitive touch circuit is connected with the electrical property testing device, and is provided with a pressure probe which is abutted against a touch surface of the capacitive touch circuit; the automatic press machine is used for applying pressure to the probe, so that the probe props against the touch surface of the capacitive touch circuit with certain pressure; and the computer is in communication connection with the automatic press machine and the electrical property testing device. By adopting the system, the multifunctional tests such as the resistance conduction test, the safety test, the pressure test and the like of the capacitive touch circuit can be completed at one time, the product test time can be greatly saved, the product plugging times can be reduced, and the butt joint problem of the product test result and the material management system can be realized.
Description
Technical Field
The utility model relates to the field of electronic product testing, in particular to a capacitive touch line testing system.
Background
The capacitive touch circuit (such as capacitive touch keys, capacitive touch screens and the like) needs to be subjected to multiple tests in the production process, including: resistance conduction test, insulation impedance test (safety test), static touch function test (namely that a capacitance touch key is directly connected on a test chip to test a static capacitance value), and the like. According to the functional division, three work stations as shown in fig. 1 are adopted to complete the corresponding tests. The existing testing mode has the problems of waste of product testing time, product damage risks caused by multiple plugging and unplugging processes of products, and combination of product testing results and a material management system (MES).
SUMMERY OF THE UTILITY MODEL
In view of the above-mentioned drawbacks of the prior art, it is an object of the present invention to provide a capacitive touch line testing system.
In order to achieve the above object, the present invention provides a capacitive touch line testing system, including: a computer, an automatic press machine, an electrical property testing device and a product jig;
the electrical property testing device is used for implementing electrical property testing;
the product jig is used for fixing a capacitive touch circuit, so that a circuit of the capacitive touch circuit is connected with the electrical property testing device, and is provided with a pressure probe which is abutted against a touch surface of the capacitive touch circuit;
the automatic press machine is used for applying pressure to the probe, so that the probe props against the touch surface of the capacitive touch circuit with certain pressure;
the computer is in communication connection with the automatic press machine and the electrical property testing device.
Further, the electrical performance test items implemented by the electrical performance test device include: safety test and resistance conduction test.
Further, the capacitive touch line testing system further comprises a docking station, and the docking station is used for realizing one-to-two or one-to-many connection of the computer and the automatic pressing machine and electrical property testing device.
Further, the docking station is a serial docking station.
Further, docking station is multi-functional relay control integrated circuit board.
The utility model realizes the following technical effects:
the capacitive touch circuit testing system can complete multifunctional tests such as resistance conduction test, safety test, pressure test and the like of the capacitive touch circuit at one time, greatly save product testing time, reduce the product plugging times and realize the butt joint problem of a product testing result and a material management system (MES).
Drawings
FIG. 1 is a flow chart of a conventional capacitive touch circuit test;
FIG. 2 is a functional block diagram of a capacitive touch wire system of the present invention;
FIG. 3 is a schematic view of the product jig of the present invention;
fig. 4 is a schematic diagram of the communication connection between the computer and the electrical property testing device and the automatic press machine according to the present invention.
Detailed Description
To further illustrate the various embodiments, the utility model provides the accompanying drawings. The accompanying drawings, which are incorporated in and constitute a part of this disclosure, illustrate embodiments of the utility model and, together with the description, serve to explain the principles of the embodiments. Those skilled in the art will appreciate still other possible embodiments and advantages of the present invention with reference to these figures.
The utility model will now be further described with reference to the accompanying drawings and detailed description.
As shown in fig. 2 and 3, the present invention provides an example of a capacitive touch line testing system, including: industrial computer, automatic press, product fixture, electric performance tester, etc. The product jig 10 is composed of a base 10, a probe holder 14, and an electrical property testing probe 12 and a pressure probe 13 movably disposed on the probe holder 14. The capacitive touch circuit 20 is fixed on the product jig 10, the electrical property test probe 12 is abutted against the circuit part 22 of the capacitive touch circuit 20, and the circuit of the capacitive touch circuit 20 is connected with the electrical property test device; the pressure probe 13 is pressed against the touch surface 21 of the capacitive touch wire 20, thereby testing the touch capacitance value under the pressure. The automatic press machine can apply pressure to the pressure probe 13, so that the pressure probe 13 butts against the touch surface 21 (i.e. the capacitive touch key or the panel of the capacitive touch screen) of the capacitive touch circuit 20 with a certain pressure; the pressure can be statically or dynamically adjusted through instructions sent by an industrial computer so as to implement static test and dynamic test of the touch capacitance of the capacitive touch circuit. Fig. 3 is a simplified structural diagram for illustrating the positional relationship of the pressure probes 13 and the electrical property test probes 12 and the capacitive touch lines 20 on the product fixture 10. In this embodiment, the electrical performance testing apparatus is mainly used for performing a safety test (such as an insulation resistance test) and a resistance conduction test. The capacitive touch circuit passes through the product jig, so that the circuit can be in test connection with the electrical property testing device, and test contents such as safety test, resistance conduction test and the like can be completed through the electrical property testing device. In other embodiments, the product fixture may be configured to connect the capacitive touch circuitry 20 to an electrical performance testing device in the form of a plug or socket.
In this embodiment, serial ports are provided in both the automatic press machine and the electrical property testing device, and the serial ports can be in communication connection with the industrial computer to receive the operation instruction given by the industrial computer and return the test result.
Because the computer usually has only one led-out serial port, the serial port can be expanded through a serial port docking station (which can be in an independent mode or a card insertion mode), so that the serial port of the industrial computer is connected with the serial port of an electrical property testing device and the serial port of an automatic press machine. In the example shown in fig. 4, a multi-channel relay control card is used to complete the serial port expansion function, so as to implement one-to-two connection. And the computer is in communication connection with the automatic press machine and the electrical property testing device. The industrial computer can issue instructions to the electrical property testing device and the automatic press machine, and complete the functions of resistance conduction testing, safety testing, static testing and dynamic testing of touch capacitance and the like according to the testing flow.
The industrial computer collects various test results of the capacitive touch line and stores the test results in a database or a data file which can be accessed by a material management system (MES) of the local computer or a remote server, so that the traceability of a capacitive touch line product is realized.
By adopting the system, the multifunctional tests such as the resistance conduction test, the safety test, the pressure test and the like of the capacitive touch circuit can be completed at one time, the product test time can be greatly saved, the product plugging times can be reduced, and the butt joint problem of a product test result and a material management system (MES) can be realized.
While the utility model has been particularly shown and described with reference to a preferred embodiment, it will be understood by those skilled in the art that various changes in form and detail may be made therein without departing from the spirit and scope of the utility model as defined by the appended claims.
Claims (5)
1. A capacitive touch line test system, comprising: a computer, an automatic press machine, an electrical property testing device and a product jig;
the electrical property testing device is used for implementing electrical property testing;
the product jig is used for fixing a capacitive touch circuit, so that a circuit of the capacitive touch circuit is connected with the electrical property testing device, and is provided with a pressure probe which is abutted against a touch surface of the capacitive touch circuit;
the automatic press machine is used for applying pressure to the pressure probe to enable the pressure probe to abut against the touch surface of the capacitive touch circuit with certain pressure;
the computer is in communication connection with the automatic press machine and the electrical property testing device.
2. The capacitive touch line testing system of claim 1, wherein the electrical performance testing means implements electrical performance test items comprising: safety test and resistance conduction test.
3. The capacitive touch line testing system of claim 1, further comprising a docking station for enabling one-to-two or one-to-many connection of the computer to the automated press machine, electrical performance testing apparatus.
4. The capacitive touch line testing system of claim 3, wherein the docking station is a serial docking station.
5. The capacitive touch line testing system of claim 3, wherein the docking station is a multi-function relay control board.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202123304792.6U CN216816834U (en) | 2021-12-24 | 2021-12-24 | Capacitive touch line test system |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202123304792.6U CN216816834U (en) | 2021-12-24 | 2021-12-24 | Capacitive touch line test system |
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| CN216816834U true CN216816834U (en) | 2022-06-24 |
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| CN202123304792.6U Active CN216816834U (en) | 2021-12-24 | 2021-12-24 | Capacitive touch line test system |
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Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN116859097A (en) * | 2022-07-29 | 2023-10-10 | 广州嘀嘀康科技有限公司 | Probe alignment method based on wafer test and wafer test device |
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2021
- 2021-12-24 CN CN202123304792.6U patent/CN216816834U/en active Active
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN116859097A (en) * | 2022-07-29 | 2023-10-10 | 广州嘀嘀康科技有限公司 | Probe alignment method based on wafer test and wafer test device |
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