CN216772099U - High power measuring microscope - Google Patents
High power measuring microscope Download PDFInfo
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- CN216772099U CN216772099U CN202220222170.4U CN202220222170U CN216772099U CN 216772099 U CN216772099 U CN 216772099U CN 202220222170 U CN202220222170 U CN 202220222170U CN 216772099 U CN216772099 U CN 216772099U
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- slidably connected
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Abstract
The utility model discloses a high power measuring microscope, which belongs to the technical field of high power measuring microscopes, and particularly relates to a high power measuring microscope, which comprises a workbench, wherein the rear end of the surface of the workbench is slidably connected with a supporting device, the high power measuring microscope also comprises fixing devices which are slidably connected with the two ends of the surface of the workbench, and a microscope which is detachably arranged in the supporting device, clamping blocks are arranged around the microscope, a chute is arranged in the middle of the surface of the workbench, the supporting device is slidably connected in the chute and comprises a supporting column, the supporting column is slidably connected at the upper end of the chute, the front end of the supporting column is slidably connected with a limiting block, and the limiting block is inserted in the limiting block. The microscope can be conveniently adjusted in distance, and the effect of increasing the observation definition of the microscope is achieved.
Description
Technical Field
The utility model relates to the technical field of high power measuring microscopes, in particular to a high power measuring microscope.
Background
The measuring microscope is used for precisely measuring the length and angle of a workpiece in a transmission and reflection mode, is particularly suitable for testing instruments of video heads, large-scale integrated circuit line widths and other precise parts, is widely suitable for departments such as measuring rooms, production lines, scientific research and the like, a workbench can rotate 360 degrees besides moving X, Y coordinates, can also measure a Z coordinate in the height direction, and can be used for observing by using binocular eyepieces, an illumination system can also be used for oblique light illumination besides transmission and reflection illumination, the instrument can be further connected with a CCD television camera to amplify the outline of the workpiece, and can also be connected with a computer to perform measurement such as data processing and the like.
The existing high power measurement microscope can only push the microscope to move up and down, when an observed target deviates, the microscope cannot be moved to search for the observed target, the existing microscope is of a fixed structure, and when the microscope is damaged, the microscope cannot be replaced, so that the high power measurement microscope is provided.
SUMMERY OF THE UTILITY MODEL
The present invention has been made in view of the above and/or other problems with a high power measuring microscope of the prior art.
Therefore, the utility model aims to provide a high power measuring microscope, which can solve the existing problems by rotating a rotating block, inserting the rotating block into two ends of the inside of a supporting column, fixing and limiting the supporting column, clamping the microscope into the inside of a limiting block through a clamping block, and adjusting the distance of an observation target through sliding the supporting column forwards and backwards and sliding the limiting block upwards and downwards.
To solve the above technical problem, according to an aspect of the present invention, the present invention provides the following technical solutions:
a high power measurement microscope, comprising: the microscope comprises a workbench, a supporting device, fixing devices and a microscope, wherein the rear end of the surface of the workbench is connected with the supporting device in a sliding manner, the fixing devices are connected to two ends of the surface of the workbench in a sliding manner, and the microscope is detachably arranged in the supporting device;
clamping blocks are arranged around the microscope.
As a preferable aspect of the high power measuring microscope of the present invention, wherein: the middle of the surface of the workbench is provided with a sliding chute, and the inside of the sliding chute is connected with a supporting device in a sliding manner.
As a preferable aspect of the high power measuring microscope of the present invention, wherein: the supporting device comprises a supporting column which is connected to the upper end of the sliding groove in a sliding mode.
As a preferable aspect of the high power measurement microscope of the present invention, wherein: the front end sliding connection stopper of support column, the inside insertion fixture block of stopper.
As a preferable aspect of the high power measuring microscope of the present invention, wherein: the bottom of support column is equipped with the slider, slider sliding connection is in the inside of spout.
As a preferable aspect of the high power measuring microscope of the present invention, wherein: the fixing device comprises a fixing block, and a movable block is arranged at the bottom end of the fixing block.
As a preferable aspect of the high power measuring microscope of the present invention, wherein: the movable block is connected inside the movable groove in a sliding mode, and the movable groove is formed in two ends of the surface of the workbench.
As a preferable aspect of the high power measurement microscope of the present invention, wherein: the fixed block is connected with a rotating block in a rotating mode, and the rotating block is inserted into the supporting column.
Compared with the prior art: the supporting device can slide back and forth through the sliding groove, so that the supporting device can drive the microscope to slide back and forth, the microscope can conveniently debug and align an observed object on the surface of the workbench, and an observation target can be conveniently found for measurement;
when the microscope is installed and replaced, the microscope is inserted into the limiting block, so that the clamping blocks on the periphery of the outer wall of the microscope are clamped in the limiting block, the microscope is fixed, the effect of conveniently disassembling and installing the microscope is achieved, and the microscopes in different specifications are conveniently replaced;
the rotating blocks are inserted into two ends of the inner part of the supporting column by rotating the rotating blocks, the supporting column is fixed and limited, the supporting column is prevented from being separated from the sliding groove when moving, when an observation target is measured, the supporting column is moved back and forth to adjust the observation interval, and the fixing block slides in the movable groove, so that the effects of conveniently sliding a microscope and adjusting the observation interval of the microscope are achieved;
can make the support column slide in the spout is inside through the slider to the interval around the pulling microscope is observed, and then conveniently seeks the target object more, conveniently carries out distance adjustment to the microscope, reaches the effect that increases the definition that the microscope surveyed.
Drawings
FIG. 1 is a schematic view of the overall structure provided by the present invention;
FIG. 2 is a schematic diagram of an overall top view structure provided by the present invention;
FIG. 3 is a schematic view of a front cross-sectional structure of a fixing device according to the present invention;
fig. 4 is a schematic top view cross-sectional structure of a microscope according to the present invention.
In the figure: the microscope comprises a workbench 1, a sliding chute 11, a supporting device 2, a supporting column 21, a limiting block 22, a sliding block 23, a fixing device 3, a fixed block 31, a movable block 32, a movable groove 33, a rotating block 34, a microscope 4 and a clamping block 41.
Detailed Description
In order to make the objects, technical solutions and advantages of the present invention more apparent, embodiments of the present invention will be described in detail with reference to the accompanying drawings.
The utility model provides a high power measuring microscope, which has the advantages that the microscope 4 can be driven to slide back and forth, the back and forth distance of the microscope 4 can be conveniently adjusted, an observation target can be conveniently found, and the measurement is convenient, please refer to fig. 1-4, and the high power measuring microscope comprises a workbench 1, a supporting device 2, a fixing device 3 and the microscope 4;
the rear end of the surface of the workbench 1 is slidably connected with the supporting device 2, the device can be placed through the workbench 1, and a target can be conveniently measured and observed, the workbench 1 comprises a chute 11, the chute 11 is arranged in the middle of the surface of the workbench 1, and the supporting device 2 can slide back and forth through the chute 11, so that the supporting device 2 can drive the microscope 4 to slide back and forth, the microscope 4 can conveniently debug and align an observed object on the surface of the workbench 1, the observation target can be conveniently found to be measured, the supporting device 2 is slidably connected in the chute 11 to play a role in limiting and guiding, and the supporting device 2 can conveniently slide in the chute 11;
the supporting device 2 is connected to the upper end of the sliding groove 11 in a sliding manner, the microscope 4 can be driven to slide back and forth through the supporting device 2, the distance between the microscope 4 and the front and back is convenient to adjust, an observed target is convenient to find, and measurement is convenient to carry out, the supporting device 2 comprises a supporting column 21, a limiting block 22 and a sliding block 23, the supporting column 21 is connected to the upper end of the sliding groove 11 in a sliding manner, the limiting block 22 can slide and limit through the supporting column 21, the limiting block 22 is convenient to move, the microscope 4 is convenient to adjust far and near, the effect of increasing the definition of observation of the microscope 4 is achieved, the limiting block 22 is connected to the front end of the supporting column 21 in a sliding manner, the limiting and placing effects are achieved, the limiting block 22 can slide up and down conveniently, the clamping block 41 is inserted into the limiting block 22, and the clamping block 41 is arranged on the periphery of the outer wall of the microscope 4, when the microscope 4 is installed and replaced, the microscope 4 is inserted into the limiting block 22, the clamping blocks 41 on the periphery of the outer wall of the microscope 4 are clamped inside the limiting block 22, so that the microscope 4 is fixed, the effect of conveniently disassembling and installing the microscope 4 is achieved, the microscopes 4 with different specifications are conveniently replaced, the sliding block 23 is arranged at the bottom of the supporting column 21, the supporting column 21 can slide in the sliding groove 11 through the sliding block 23, the front-back distance observed by the microscope 4 is pulled, a target object can be found more conveniently, the microscope 4 can be conveniently adjusted far and near, the effect of increasing the definition observed by the microscope 4 is achieved, and the sliding block 23 is connected inside the sliding groove 11 in a sliding manner and plays roles in limiting and guiding;
the fixing device 3 is connected to two ends of the surface of the workbench 1 in a sliding manner, the supporting column 21 can be fixed through the fixing device 3 and can slide along with the supporting column 21 to achieve fixing and limiting effects, the fixing device 3 comprises a fixed block 31, a movable block 32, a movable groove 33 and a rotating block 34, the movable block 32 is arranged at the bottom end of the fixed block 31, the fixed block 31 can slide through the movable block 32, the movable block 32 is connected to the inside of the movable groove 33 in a sliding manner to achieve limiting and guiding effects, the movable groove 33 is arranged at two ends of the surface of the workbench 1 and can slide the movable block 32 to achieve limiting and guiding effects on the movable block 32, the rotating block 34 is rotatably connected to the inside of the fixed block 31, the rotating block 34 is inserted into the inside of the supporting column 21 to fix the supporting column 21, and the supporting column 21 is prevented from being separated from the inside of the sliding groove 11 when sliding, when the microscope is fixed, the rotating block 34 is rotated, the rotating block 34 is inserted into two ends of the inside of the supporting column 21, the supporting column 21 is fixed and limited, the supporting column 21 is prevented from being separated from the sliding groove 11 when moving, when an observation target is measured, the supporting column 21 is moved back and forth to adjust an observation interval, and at the moment, the fixed block 31 slides in the movable groove 33, so that the effects of conveniently sliding the microscope 4 and adjusting the observation interval of the microscope 4 are achieved;
the microscope 4 is detachably mounted inside the limiting block 22, the microscope 4 can be disassembled, assembled and replaced, and the microscopes 4 with different specifications can be replaced conveniently, the microscope 4 comprises a clamping block 41, the clamping block 41 is arranged around the microscope 4, when the microscope 4 is installed and replaced, the microscope 4 is inserted into the inside of the limiting block 22, so that the fixture blocks 41 around the outer wall of the microscope 4 are clamped inside the limiting block 22, thereby fixing the microscope 4, thereby achieving the effect of conveniently disassembling and assembling the microscope 4 and conveniently replacing the microscopes 4 with different specifications, the supporting columns 21 can slide inside the slide grooves 11 through the slide blocks 23, so that the front and rear intervals observed by the microscope 4 are pulled, and then more conveniently seek the target object, conveniently carry out distance adjustment to microscope 4, reach the effect that increases the definition of microscope 4 observation.
When the microscope 4 is used specifically, a person skilled in the art puts an observation target at the front end of the surface of the workbench 1, rotates the rotating block 34 at the moment, inserts the rotating block 34 into two ends of the inside of the supporting column 21, fixes and limits the supporting column 21, prevents the supporting column 21 from separating from the sliding groove 11 during movement, moves the supporting column 21 to move back and forth to adjust the observation distance when measuring the observation target, slides the fixing block 31 in the movable groove 33 to further achieve the purposes of conveniently sliding the microscope 4 and adjusting the observation distance of the microscope 4, adjusts the vertical distance of the microscope 4 through the sliding limiting block 22, thereby conveniently measuring the observation target, inserts the microscope 4 into the limiting block 22 to clamp the clamping blocks 41 around the outer wall of the microscope 4 in the limiting block 22 when the microscope 4 needs to be replaced, thereby fixing the microscope 4 and further achieving the effect of conveniently disassembling and assembling the microscope 4.
While the utility model has been described with reference to an embodiment, various modifications may be made and equivalents may be substituted for elements thereof without departing from the scope of the utility model. In particular, the various features of the disclosed embodiments of this invention can be used in any combination as long as there is no structural conflict, and the combination is not exhaustively described in this specification merely for the sake of brevity and resource savings. Therefore, it is intended that the utility model not be limited to the particular embodiments disclosed, but that the utility model will include all embodiments falling within the scope of the appended claims.
Claims (8)
1. A microscope for high power measurement, comprising a table (1), wherein the surface rear end of the table (1) is slidably connected with a supporting device (2), characterized in that: the microscope device also comprises fixing devices (3) which are connected to two ends of the surface of the workbench (1) in a sliding way, and a microscope (4) which is detachably arranged in the supporting device (2);
clamping blocks (41) are arranged around the microscope (4).
2. A microscope according to claim 1 characterised in that the surface of the table (1) is provided with a sliding slot (11) in the middle, the sliding slot (11) being slidably connected with the support means (2).
3. A microscope according to claim 1 wherein the support means (2) comprises a support post (21), the support post (21) being slidably connected to the upper end of the chute (11).
4. A microscope according to claim 3 wherein the front end of the support post (21) is slidably connected to a stopper (22), and the inside of the stopper (22) is inserted into a fixture block (41).
5. A microscope according to claim 3 wherein the support column (21) is provided with a slide (23) at the bottom, the slide (23) being slidably connected inside the slide groove (11).
6. A microscope according to claim 1, characterized in that the fixing device (3) comprises a fixed block (31), and the bottom end of the fixed block (31) is provided with a movable block (32).
7. A microscope according to claim 6 wherein the movable block (32) is slidably connected inside a movable groove (33), the movable groove (33) being provided at both ends of the surface of the stage (1).
8. A microscope according to claim 6 wherein the fixed block (31) is rotatably connected to a rotating block (34) inside, the rotating block (34) being inserted inside the support column (21).
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202220222170.4U CN216772099U (en) | 2022-01-27 | 2022-01-27 | High power measuring microscope |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202220222170.4U CN216772099U (en) | 2022-01-27 | 2022-01-27 | High power measuring microscope |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN216772099U true CN216772099U (en) | 2022-06-17 |
Family
ID=81978749
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202220222170.4U Active CN216772099U (en) | 2022-01-27 | 2022-01-27 | High power measuring microscope |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN216772099U (en) |
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2022
- 2022-01-27 CN CN202220222170.4U patent/CN216772099U/en active Active
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