CN216771849U - Testing arrangement based on environmental climate - Google Patents
Testing arrangement based on environmental climate Download PDFInfo
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- CN216771849U CN216771849U CN202122343271.5U CN202122343271U CN216771849U CN 216771849 U CN216771849 U CN 216771849U CN 202122343271 U CN202122343271 U CN 202122343271U CN 216771849 U CN216771849 U CN 216771849U
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Abstract
The utility model relates to the technical field of measurement, in particular to a testing device based on environmental climate, which comprises a control unit and a control unit, wherein the control unit is formed by at least one switch and is used for forming a control signal; the processing unit is connected with the control unit, comprises a processor and a selection unit connected with the processor, and is used for forming a processing signal output according to the control signal; and the test unit is connected with the processing unit and used for forming a test environment matched with the processing signal according to the processing signal.
Description
Technical Field
The utility model relates to the technical field of measurement, in particular to a testing device based on environmental climate.
Background
In the process of research and development, all electronic equipment products are subjected to strict environmental reliability tests, including tests on climate conditions such as high temperature, low temperature, temperature cycle, high temperature and high humidity and the like. The traditional test relies on the manual regulation operation of a tester to simulate different climatic environments, and various conventional and abnormal operations are carried out on the electronic product under different simulated climatic conditions, so as to achieve the purpose of testing the working reliability of the product under the severe climatic conditions. Requiring long term occupancy of test personnel and relying on manual repetitive operations, testing is inefficient and test emphasis is limited.
Disclosure of Invention
Aiming at the defects of the prior art, the utility model provides a testing device based on environmental climate, which comprises the following components in detail:
a testing arrangement based on environmental climate which characterized in that: comprises the steps of (a) preparing a mixture of a plurality of raw materials,
the control unit is formed by at least one switch and is used for forming a control signal;
the processing unit is connected with the control unit, comprises a processor and a selection unit connected with the processor, and is used for forming a processing signal output according to the control signal;
and the test unit is connected with the processing unit and used for forming a test environment matched with the processing signal according to the processing signal.
Preferably, the above-mentioned test device based on environmental climate, wherein: the processor is formed from a first chip that includes at least four input pins and eight output pins.
Preferably, the above-mentioned test device based on environmental climate, wherein: the control unit is formed by four switches, wherein a first switch is connected between the common ground and a first input pin of the first chip, a second switch is connected between the common ground and a second input pin of the first chip, a third switch is connected between the common ground and a third input pin of the first chip, and a fourth switch is connected between the common ground and a fourth input pin of the first chip.
Preferably, the above-mentioned test device based on environmental climate, wherein: the selection unit comprises twelve transmission gates and twelve not-gate circuits, wherein the input end of a first not gate forms the first input end of the selection unit, the input end of a second not gate forms the second input end of the selection unit, the input end of a third not gate forms the third input end of the selection unit, the input end of a fourth not gate forms the fourth input end of the selection unit, the input end of a fifth not gate forms the fifth input end of the selection unit, the input end of a sixth not gate forms the sixth input end of the selection unit, the input end of a seventh not gate forms the seventh input end of the selection unit, the input end of an eighth not gate forms the eighth input end of the selection unit, the output end of the first not gate is connected with the input end of the first transmission gate, the output end of the second not gate is connected with the input end of the second transmission gate, and the output end of the third not gate is connected with the input end of the third transmission gate, the output end of the fourth not gate is connected with the input end of the fourth transmission gate, the output end of the fifth not gate is connected with the input end of the fifth transmission gate, the output end of the sixth not gate is connected with the input end of the sixth transmission gate, the output end of the seventh not gate is connected with the input end of the seventh transmission gate, and the output end of the eighth not gate is connected with the input end of the eighth transmission gate.
Preferably, the above-mentioned test device based on environmental climate, wherein: the test unit also comprises an emergency circuit which is connected between the first output end and the second output end of the selection unit and the test unit.
Preferably, the above-mentioned test device based on environmental climate, wherein: the emergency circuit comprises a thirteenth NOT gate, a fourteenth NOT gate, a first NAND gate and a second NAND gate; the first output end and the thirteenth NOT gate of the selection unit are respectively connected with the input end of the first NAND gate; and the second output end of the selection unit and the fourteenth NOT gate are respectively connected with the input end of the second NAND gate.
Preferably, the above-mentioned test device based on environmental climate, wherein: the first chip is formed by an N87C51 singlechip.
Preferably, the above-mentioned test device based on environmental climate, wherein: the first chip is formed by an N87C44 singlechip.
Compared with the prior art, the utility model has the advantages that:
the utility model provides a testing arrangement based on environmental climate, the different control signal of control unit input makes the test unit form different experimental environment through this control signal, for example, controls experimental environment and is environment such as high temperature, low temperature, temperature cycle, high temperature and high humidity, and the test instrument is used for showing the state of being surveyed the product in the present experimental environment. The testing device is suitable for the verification requirements of most electronic products on the environmental climate in the development process. The test system can realize the automation of tests such as routine performance, power on/off, equipment power consumption, port up/down operation, performance pressure and the like under different simulated climatic conditions, flexibly edit test items and test conditions, automatically generate test reports, greatly improve the environmental reliability, and in addition, through the cache function of the first chip, the input control signals can be stored, and the test efficiency under the unattended condition is ensured.
Drawings
Fig. 1 is a schematic structural diagram of a testing apparatus based on an environmental climate provided in the present invention.
Detailed Description
As shown in fig. 1, an environmental climate based test apparatus is characterized in that: comprises the steps of (a) preparing a mixture of a plurality of raw materials,
the control unit is formed by at least one switch and is used for forming a control signal; the control unit is formed by four switches, namely a first switch S1, a second switch S2, a third switch S3 and a fourth switch S4, wherein one ends of the first switch S1, the second switch S2, the third switch S3 and the fourth switch S4 are all connected with a common ground,
the processing unit is connected with the control unit, comprises a processor and a selection unit connected with the processor, and is used for forming a processing signal output according to the control signal; further, the processor is formed from a first chip that includes at least four input pins and eight output pins. The first chip can be formed by an N87C51 singlechip or an N87C44 singlechip. The four input pins may be formed by a fifteenth pin, a fourteenth pin, a thirteenth pin and an 11 pin of a first chip, the fifteenth pin of the first chip is connected to the other end of the first switch, the fourteenth pin of the first chip is connected to the other end of the second switch, the thirteenth pin of the first chip is connected to the other end of the third switch, and the eleventh pin of the first chip is connected to the other end of the fourth switch. The second pin, the third pin, the fourth pin, the fifth pin, the sixth pin, the seventh pin, the eighth pin and the ninth pin of the first chip form an output pin of the processor. The selection unit comprises a first input end, a second input end, a third input end, a fourth input end, a fifth input end, a sixth input end, a seventh input end and an eighth input end, wherein a first input terminal of the selection unit is connected to the second pin of the first chip, a second input terminal of the selection unit is connected to the third pin of the first chip, the third input end of the selection unit is connected with the fourth pin of the first chip, the fourth input end of the selection unit is connected with the fifth pin of the first chip, a fifth input end of the selection unit is connected with a sixth pin of the first chip, a sixth input end of the selection unit is connected with a seventh pin of the first chip, the seventh input end of the selection unit is connected with the eighth pin of the first chip, and the eighth input end of the selection unit is connected with the ninth pin of the first chip. The first chip may also have a cache function.
Further, the selection unit includes twelve transfer gates and twelve not-gate gates, an input terminal of a first not gate F1 forms a first input terminal of the selection unit, an input terminal of a second not gate F2 forms a second input terminal of the selection unit, an input terminal of a third not gate F3 forms a third input terminal of the selection unit, an input terminal of a fourth not gate F4 forms a fourth input terminal of the selection unit, an input terminal of a fifth not gate F5 forms a fifth input terminal of the selection unit, an input terminal of a sixth not gate F6 forms a sixth input terminal of the selection unit, an input terminal of a seventh not gate F7 forms a seventh input terminal of the selection unit, an input terminal of an eighth not gate F8 forms an eighth input terminal of the selection unit, an output terminal of the first not gate F1 is connected to an input terminal of a first transfer gate TG1, an output terminal of the second not gate F2 is connected to an input terminal of a second transfer gate TG2, the output end of the third not gate F3 is connected with the input end of a third transmission gate TG3, the output end of the fourth not gate F4 is connected with the input end of a fourth transmission gate TG4, the output end of the fifth not gate F5 is connected with the input end of a fifth transmission gate TG5, the output end of the sixth not gate F6 is connected with the input end of a sixth transmission gate TG6, the output end of the seventh not gate F7 is connected with the input end of a seventh transmission gate TG7, and the output end of the eighth not gate F8 is connected with the input end of an eighth transmission gate TG 8.
And the test unit is connected with the processing unit and used for connecting a tested product and forming a test environment matched with the processing signal according to the processing signal so as to test the tested product.
And the test instrument is connected with the test unit and used for displaying the state of the tested product in the current test environment.
The testing device based on the environmental climate inputs different control signals through the control unit, the testing unit forms different testing environments through the control signals, for example, the testing environments are controlled to be environments with high temperature, low temperature, temperature circulation, high temperature, high humidity and the like, and the testing instrument is used for displaying the state of a tested product in the current testing environment. The testing device is suitable for the verification requirements of most electronic products on the environmental climate in the development process. The system can realize the automation of tests such as conventional performance, power on/off, equipment power consumption, port up/down operation, performance pressure and the like under different simulated climatic conditions, flexibly edit test items and test conditions, automatically generate test reports, and greatly improve the test efficiency of environmental reliability under the unattended condition. The device is a flexible, complete, efficient and high-strength environment climate reliability testing device.
As a further preferred embodiment, the above-mentioned ambient climate based test device, wherein: the emergency circuit comprises thirteenth NOT gate F13, fourteenth NOT gate F14, a first NAND gate Y1 and a second NAND gate Y2; the first output end of the selection unit and the thirteenth NOT gate F13 are respectively connected with the input end of the first NAND gate Y1; the second output end of the selection unit and the fourteenth not gate F14 are respectively connected to the input end of the second nand gate Y2.
When the test instrument displays that the current test environment has a fault state, a control instruction can be sent to the test unit through an emergency circuit, under the normal condition, the input ends of the thirteenth NOT gate and the fourteenth NOT gate are respectively connected with a high level, and under the emergency condition, the thirteenth NOT gate and/or the fourteenth NOT gate can be controlled to be connected with a low level to terminate the current test.
Claims (8)
1. A testing arrangement based on environmental climate which characterized in that: comprises the steps of (a) preparing a mixture of a plurality of raw materials,
the control unit is formed by at least one switch and is used for forming a control signal;
the processing unit is connected with the control unit, comprises a processor and a selection unit connected with the processor, and is used for forming a processing signal output according to the control signal;
and the test unit is connected with the processing unit and used for forming a test environment matched with the processing signal according to the processing signal.
2. An environmental climate based testing device according to claim 1, wherein: the processor is formed from a first chip that includes at least four input pins and eight output pins.
3. An environmental climate based testing device according to claim 2, wherein: the control unit is formed by four switches, wherein a first switch is connected between the common ground and a first input pin of the first chip, a second switch is connected between the common ground and a second input pin of the first chip, a third switch is connected between the common ground and a third input pin of the first chip, and a fourth switch is connected between the common ground and a fourth input pin of the first chip.
4. An environmental climate based testing device according to claim 2, wherein: the selection unit comprises twelve transmission gates and twelve not-gate circuits, wherein the input end of a first not gate forms the first input end of the selection unit, the input end of a second not gate forms the second input end of the selection unit, the input end of a third not gate forms the third input end of the selection unit, the input end of a fourth not gate forms the fourth input end of the selection unit, the input end of a fifth not gate forms the fifth input end of the selection unit, the input end of a sixth not gate forms the sixth input end of the selection unit, the input end of a seventh not gate forms the seventh input end of the selection unit, the input end of an eighth not gate forms the eighth input end of the selection unit, the output end of the first not gate is connected with the input end of the first transmission gate, the output end of the second not gate is connected with the input end of the second transmission gate, and the output end of the third not gate is connected with the input end of the third transmission gate, the output end of the fourth not gate is connected with the input end of the fourth transmission gate, the output end of the fifth not gate is connected with the input end of the fifth transmission gate, the output end of the sixth not gate is connected with the input end of the sixth transmission gate, the output end of the seventh not gate is connected with the input end of the seventh transmission gate, and the output end of the eighth not gate is connected with the input end of the eighth transmission gate.
5. An environmental climate based testing device according to claim 2, wherein: the test unit also comprises an emergency circuit which is connected between the first output end and the second output end of the selection unit and the test unit.
6. An environmental climate based testing device according to claim 5, wherein: the emergency circuit comprises a thirteenth NOT gate, a fourteenth NOT gate, a first NAND gate and a second NAND gate; a first output end and a thirteenth NOT gate of the selection unit are respectively connected with the input end of the first NAND gate; and the second output end of the selection unit and the fourteenth NOT gate are respectively connected with the input end of the second NAND gate.
7. An environmental climate based testing device according to claim 4, wherein: the first chip is formed by an N87C51 singlechip.
8. An environmental climate based testing device according to claim 4, wherein: the first chip is formed by an N87C44 singlechip.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202122343271.5U CN216771849U (en) | 2021-09-27 | 2021-09-27 | Testing arrangement based on environmental climate |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202122343271.5U CN216771849U (en) | 2021-09-27 | 2021-09-27 | Testing arrangement based on environmental climate |
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| Publication Number | Publication Date |
|---|---|
| CN216771849U true CN216771849U (en) | 2022-06-17 |
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| Application Number | Title | Priority Date | Filing Date |
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| CN202122343271.5U Active CN216771849U (en) | 2021-09-27 | 2021-09-27 | Testing arrangement based on environmental climate |
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| CN (1) | CN216771849U (en) |
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2021
- 2021-09-27 CN CN202122343271.5U patent/CN216771849U/en active Active
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