CN117537865A - Test system and test method for on-board information processing embedded computer - Google Patents
Test system and test method for on-board information processing embedded computer Download PDFInfo
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- CN117537865A CN117537865A CN202311422081.XA CN202311422081A CN117537865A CN 117537865 A CN117537865 A CN 117537865A CN 202311422081 A CN202311422081 A CN 202311422081A CN 117537865 A CN117537865 A CN 117537865A
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- 238000012360 testing method Methods 0.000 title claims abstract description 310
- 230000010365 information processing Effects 0.000 title claims abstract description 29
- 238000010998 test method Methods 0.000 title claims description 8
- 238000011056 performance test Methods 0.000 claims abstract description 52
- 238000011990 functional testing Methods 0.000 claims abstract description 29
- 230000003750 conditioning effect Effects 0.000 claims description 34
- 238000004891 communication Methods 0.000 claims description 17
- 239000011159 matrix material Substances 0.000 claims description 6
- 239000000835 fiber Substances 0.000 claims 1
- 238000010586 diagram Methods 0.000 description 4
- 238000000034 method Methods 0.000 description 4
- 238000013461 design Methods 0.000 description 3
- 238000011161 development Methods 0.000 description 3
- 238000007689 inspection Methods 0.000 description 3
- 230000007547 defect Effects 0.000 description 2
- 230000007613 environmental effect Effects 0.000 description 2
- 238000009413 insulation Methods 0.000 description 2
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Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01D—MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED IN A SINGLE OTHER SUBCLASS; TARIFF METERING APPARATUS; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR
- G01D21/00—Measuring or testing not otherwise provided for
- G01D21/02—Measuring two or more variables by means not covered by a single other subclass
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R13/00—Arrangements for displaying electric variables or waveforms
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R15/00—Details of measuring arrangements of the types provided for in groups G01R17/00 - G01R29/00, G01R33/00 - G01R33/26 or G01R35/00
- G01R15/12—Circuits for multi-testers, i.e. multimeters, e.g. for measuring voltage, current, or impedance at will
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
- G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
- G06F11/2205—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing using arrangements specific to the hardware being tested
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
- G06F11/2247—Verification or detection of system hardware configuration
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
- G06F11/2273—Test methods
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- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04L—TRANSMISSION OF DIGITAL INFORMATION, e.g. TELEGRAPHIC COMMUNICATION
- H04L43/00—Arrangements for monitoring or testing data switching networks
- H04L43/08—Monitoring or testing based on specific metrics, e.g. QoS, energy consumption or environmental parameters
- H04L43/0805—Monitoring or testing based on specific metrics, e.g. QoS, energy consumption or environmental parameters by checking availability
- H04L43/0817—Monitoring or testing based on specific metrics, e.g. QoS, energy consumption or environmental parameters by checking availability by checking functioning
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- General Engineering & Computer Science (AREA)
- Theoretical Computer Science (AREA)
- Computer Hardware Design (AREA)
- Quality & Reliability (AREA)
- Environmental & Geological Engineering (AREA)
- Computer Networks & Wireless Communication (AREA)
- Signal Processing (AREA)
- Tests Of Electronic Circuits (AREA)
Abstract
The invention belongs to the field of testing of embedded computers, and particularly relates to a testing system and a testing method of an on-bullet information processing embedded computer. The invention realizes impedance test, functional test and performance test of the tested product and the test system, improves the test automation level and test efficiency, improves the self-checking and calibrating capability of the test system, shortens the fault removal and shortens the equipment calibrating test time.
Description
Technical Field
The invention belongs to the field of testing of embedded computers, and particularly relates to a testing method of an on-bullet information processing embedded computer.
Background
In future warfare, the on-board information processing embedded computer (hereinafter referred to as "tested product") is one of the most important weaponry in missile or anti-guided weapon systems, and the development, production, use, training, maintenance, repair and maintenance of the on-board information processing embedded computer all need to use a comprehensive test system to ensure the safety and reliability of the on-board information processing embedded computer. The test system is an important means for detecting the quality of products, and is an indispensable device for manufacturers and users.
In the development process, the testing system is required to ensure the product performance in the links of product debugging, complete machine testing, delivery, acceptance inspection, environmental test and the like. The existing test system based on the PXI platform has the characteristics of high test efficiency, high automation level, high reliability, flexible operation and the like, and the technology is widely applied to the design, production, test and inspection of electronic products.
According to the characteristics of the computer product embedded with the information on the bullet, the testing of the product can be divided into impedance testing, functional testing and performance testing according to the product specification and the debugging rule.
Impedance testing: the resistance value of the tested product to the external interface is tested, and the resistance value comprises an insulation test, a conductivity test and an impedance value test, wherein the resistance value of the insulation test is generally required to be larger than 20MΩ, the resistance value of the conductivity test is generally required to be smaller than 1 Ω, and the resistance value of the impedance value test is generally determined according to the designed resistance value and the corresponding circuit characteristics and is generally a range value of +/-10% of the design value.
Functional test: the function of the tested product is tested, and corresponding function tests are carried out according to the actual external interface form, wherein the function tests comprise, but are not limited to, an RS422 communication function test, an RS485 communication function test, a 1553B communication function test, an input switching value function test, an output switching value function test and the like.
Performance test: based on the function test, the test of amplitude voltage, waveform frequency, clock signal and data signal time sequence relation waveform and the like is added, and meanwhile, the quality information of the signals, whether the waveform has burr, interference and the like or not can be observed and recorded in real time. Including but not limited to the frequency and amplitude of the communication clock signal, the pulse width and amplitude of the communication data signal, the amplitude and pulse width of the high/low level of the switching value signal, etc. In general, performance testing is performed when functional testing is performed, so performance testing includes functional testing. In special cases, performance test can also be directly performed to test the waveform, amplitude, etc. of the default signal.
The existing test scheme can only automatically perform functional test, the impedance test and the performance test are required to be performed manually by means of an oscilloscope and a universal meter and a switching box, the manual test is low in impedance and performance efficiency, and a tester is required to have certain test capability and background knowledge.
The scheme of the existing test system is shown in fig. 1, and the test system hardware consists of a PXI controller, a PXI case, a function test board card and a test cable. The function test board card comprises an RS422 communication board card, an RS485 communication board card, a switching value board card, a 1553B communication board card, an optical fiber communication board card and the like, and the corresponding board card needs to be added or reduced appropriately according to the corresponding interface function of the tested product. The function test board card and the PXI controller are both arranged in the PXI case, the test system is connected by using a PXI bus, and the test cable is used for connecting a tested product and the test system.
The prior art scheme has the following defects in product test:
1. only can automatically perform functional tests, and the impedance test and the performance test need manual tests;
2. the test efficiency is low, and in debugging, inspection and acceptance test, impedance test and performance side test cannot be automatically tested.
Disclosure of Invention
In order to solve the defects of the prior art in product testing, the invention provides a solution of a testing system of an on-board information processing embedded computer, realizes impedance testing, functional testing and performance testing of on-board information processing equipment, is applied to testing scenes such as stress screening testing and environmental testing of tested products and debugging, inspected, acceptance testing and the like, can improve the universality, automation and intellectualization of testing, shortens testing time and reduces equipment development, labor and testing cost.
The invention provides a test system of an on-bullet information processing embedded computer, which comprises a PXI controller, a PXI case, a functional test board card and a test cable, wherein the functional test board card and the PXI controller are both arranged in the PXI case, the test system is internally connected by using a PXI bus, the test cable is used for connecting a tested product and the test system, the test system also comprises an oscilloscope board card, a universal meter board card, a matrix switch board card and a test signal switch conditioning unit, the matrix switch board card is used for switching oscilloscope signals and universal meter signals into corresponding signals of the tested product, the test signal switch conditioning unit comprises a switch, a control part and a self-checking circuit part, the number of the switch is determined by the number of signals of the tested product, and the test state switch of each signal is controlled by 2 single-pole double-throw switches, namely the required number of the switch is the number of signals of the tested product multiplied by 2.
Further, the functional test board card comprises an RS422 communication board card, an RS485 communication board card, a switching value board card, a 1553B communication board card and/or an optical fiber communication board card.
Further, the switch comprises a single pole double throw relay with a control function or an analog multi-way switch circuit with a control function.
The invention also provides a testing method of the on-board information processing embedded computer, which is applied to the testing system of the on-board information processing embedded computer, and is used for performing performance test on the testing system, disconnecting related circuits at a tested product end, connecting a switching function testing end signal A_x01 of the testing signal switching conditioning unit to a self-checking circuit signal D_x01 of the testing system, connecting a switching performance testing end signal B_x01 of the testing signal switching conditioning unit to the self-checking circuit signal D_x01 of the testing system, and performing function and performance test on the circuits of the testing system.
The invention also provides a test method of the on-board information processing embedded computer, which is applied to the test system of the on-board information processing embedded computer, impedance test is carried out on a tested product and function test is carried out on the test system, a functional test end circuit of the test system is disconnected, a circuit of a performance test end of the test system is connected to the tested product, a switch functional test end signal A_x01 of the test signal switching and conditioning unit is connected to a test system self-checking circuit signal D_x01, a switch performance test end signal B_x01 of the test signal switching and conditioning unit is connected to a tested product signal C_x01, and the impedance test of the tested product is realized by utilizing a universal meter board card in the performance test of the test system, and meanwhile, the functional test of the test system is realized.
The invention also provides a testing method of the on-board information processing embedded computer, which is applied to the testing system of the on-board information processing embedded computer, and is used for carrying out functional test on a tested product and carrying out impedance test on a self-checking circuit of the testing system, disconnecting a functional testing end circuit of the testing system, connecting a circuit of a performance testing end of the testing system to the tested product, connecting a switching function testing end signal A_x01 of the testing signal switching conditioning unit to a tested product signal C_x01, and connecting a switching performance testing end signal B_x01 of the testing signal switching conditioning unit to a self-checking circuit signal D_x01 of the testing system.
The invention also provides a testing method of the on-board information processing embedded computer, which is applied to the testing system of the on-board information processing embedded computer, and is used for performing performance test on a tested product, wherein a functional testing end circuit of the testing system is connected to the tested product, a circuit of the functional testing end of the testing system is connected to the tested product, a switching functional testing end signal A_x01 of the testing signal switching conditioning unit is connected to a tested product signal C_x01, a switching functional testing end signal B_x01 of the testing signal switching conditioning unit is connected to the tested product signal C_x01, and a functional testing part of the testing system are connected to the tested product to realize performance test on the tested product.
According to the invention, the oscilloscope card and the universal meter card are added on the test system framework, and signals of the oscilloscope and the universal meter can be switched into corresponding signals of a tested product by means of switching of the matrix switch. The switching circuit in the test signal switching and conditioning unit is the core of the invention, and can switch the test type into impedance test, functional test and performance test of the tested product. The self-checking circuit in the test signal switching and conditioning unit is a characteristic of the invention, and the circuit can play a great advantage in self-checking and calibration of a test system, and realize impedance test, functional test and performance test of the test system.
The test system designed by the invention not only can realize impedance test, functional test and performance test of the tested product, but also can improve the test automation level and test efficiency. And the impedance test, the function test and the performance test of the test system can be realized, the self-checking and calibrating capacity of the test system is improved, the fault removal and the equipment calibrating test time are shortened.
Drawings
FIG. 1 is a diagram of a prior art test scheme;
FIG. 2 is a diagram of a test scheme of the present invention;
fig. 3 is a schematic block diagram of a test scheme according to the present invention (a signal is an example).
Detailed Description
In order to better understand the purpose, structure and function of the present invention, a test method of an on-board information processing embedded computer according to the present invention is described in further detail below with reference to the accompanying drawings.
The test scheme of the invention is shown in fig. 2, and the test system scheme of the invention is added with an oscilloscope board card, a universal meter board card, a matrix switch board card and a test signal switching and conditioning unit on the basis of the prior scheme, so that impedance test, functional test and performance test of a tested product can be realized.
The core of the test scheme of the invention is a test signal switching and conditioning unit, the main functions of the test signal switching and conditioning unit are impedance test, function test, signal switching of performance test and self-checking circuit of a test system, the invention provides a method for realizing impedance test, function test and automatic switching of performance test of a tested product by controlling a switch or a relay, taking a certain signal (C_x01) of the tested product as an example, and the functional block diagram of the invention is shown in figure 3.
The test signal switching and conditioning unit comprises a switch, a control part and a self-checking circuit part, wherein the number of the switch is determined by the number of signals of a tested product, each signal needs 2 single-pole double-throw switches, and the switch comprises, but is not limited to, a single-pole double-throw relay with a control function, an analog multi-way switch circuit with a control function and the like.
According to the circuit test architecture design of the test scheme, the test system can realize impedance test, function test and performance test of the tested product and impedance test, function test and performance test of the test system. The impedance, function and performance test of the tested product are realized, the impedance, function and performance test of the tested system can be realized, the self-checking capability of the tested system is enhanced, the problems existing in the tested system can be timely found, the quality of the tested system is ensured, and the quality of the tested data of the tested product is further ensured. And when the equipment is calibrated, the automatic calibration of the test system is realized by using the tested impedance test and the tested performance test, and the working efficiency is greatly improved.
The impedance test of the tested product is used in the impedance test stage of the tested product debugging, and is generally carried out in the debugging, the detection, the acceptance and the like of the tested product;
the functional test of the tested product is carried out in stress screening test, environment test, electromagnetic compatibility and other tests of the tested product, and the functional state of the product is monitored in real time;
the performance test of the tested product is used in the performance test stage of the tested product debugging, and is generally carried out in the stages of the tested product debugging, the tested product testing, the tested product accepting and the like;
impedance test of the test system is generally carried out when test equipment is self-checked, the test system needs to be self-checked when power is on, and test equipment needs to be tested in a calibration stage;
the function test of the test system is generally carried out when the test equipment is self-checked, the test system needs to be self-checked when the test system is electrified, and the test equipment needs to be tested in the calibration stage;
the performance test of the test system is generally carried out when the test equipment is calibrated, the measured waveform and amplitude data are used as the judgment basis for calibration, and the calibration period of the test system is 1 year.
The test product implementation modes are shown in table 1, and mainly comprise impedance, function and performance tests of the tested product and impedance, function and performance tests of a test system.
Table 1 test system pattern table
In the table, a_x01 represents a test system function test corresponding signal, b_x01 represents a test system performance test corresponding signal, c_x01 represents a certain signal of a tested product, and d_x01 represents a certain signal of a self-checking circuit.
Mode one: and testing the performance of the test system. And in a default state of the test system, after the tested product is connected through the cable, all signals of the default tested product are not connected to the test system, so that the condition that the product is damaged due to improper manual operation and hot plug is avoided. And disconnecting the test system function and performance test end circuit of the tested product, namely connecting a switch function test end signal A_x01 of the test signal switching and conditioning unit to a test system self-checking circuit signal D_x01, and connecting a switch performance test end signal B_x01 of the test signal switching and conditioning unit to the test system self-checking circuit signal D_x01. The method realizes the function and performance test of the circuit of the test system, ensures the qualification of the test system, and can be applied to the self-checking and calibration of the test system.
Mode two: impedance testing of the product under test and functional testing of the test system. The two types of tests are required to be performed respectively, and the impedance test of the tested product is generally the main. The test system disconnects the circuit of the test system function test end of the tested product, the circuit of the test system performance test end is connected to the tested product, namely, the switch function test end signal A_x01 of the test signal switching and conditioning unit is connected to the test system self-checking circuit signal D_x01, and the switch performance test end signal B_x01 of the test signal switching and conditioning unit is connected to the tested product signal C_x01. The impedance test of the tested product is realized by using the universal meter board in the performance test of the test system, and meanwhile, the functional test of the test system can be realized in the mode, and the functional test of the test system can be applied to the self-checking of the test system.
Mode three: functional testing of the product under test and impedance testing of the self-checking circuit of the testing system. The tested product is connected to the functional test end circuit of the test system, the test system disconnects the functional test end circuit of the test system of the tested product, namely, the switch functional test end signal A_x01 of the test signal switching and conditioning unit is connected to the signal C_x01 of the tested product, and the switch functional test end signal B_x01 of the test signal switching and conditioning unit is connected to the self-checking circuit signal D_x01 of the test system. The test board card is connected with the tested product to realize the function test of the tested product, and meanwhile, the impedance test of the self-checking circuit of the test system can be realized in the mode, so that the test board card can be applied to the self-checking and calibration of the test system.
Mode four: and (5) testing the performance of the tested product. The method comprises the steps of connecting a test system function test end circuit to a tested product, connecting a test system performance test end circuit to the tested product, namely connecting a switch function test end signal A_x01 of a test signal switching and conditioning unit to a tested product signal C_x01, and connecting a switch performance test end signal B_x01 of the test signal switching and conditioning unit to the tested product signal C_x01. The function test part and the performance test part of the test system are connected into the tested product to realize the performance test of the tested product.
Although embodiments of the present invention have been described in conjunction with the accompanying drawings, it will be apparent to those skilled in the art that several variations and modifications may be made without departing from the principles of the invention, which are also considered to be within the scope of the invention.
Claims (7)
1. The test system of the on-bullet information processing embedded computer comprises a PXI controller, a PXI case, a function test board card and a test cable, and is characterized in that the function test board card and the PXI controller are both arranged in the PXI case, the inside of the test system is connected by using a PXI bus, the test cable is used for connecting a tested product and the test system, the test system also comprises an oscilloscope board card, a universal meter board card, a matrix switch board card and a test signal switch conditioning unit, the matrix switch board card is used for switching oscilloscope signals and universal meter signals into corresponding signals of the tested product, the test signal switch conditioning unit comprises a switch, a control part and a self-checking circuit part, the number of the switch is determined by the number of signals of the tested product, and the test state switch of each signal is controlled by 2 single-pole double-throw switches, namely the required switch number is the number of signals of the tested product multiplied by 2.
2. The system of claim 1, wherein the functional test board comprises an RS422 communication board, an RS485 communication board, a switching board, a 1553B communication board, and/or a fiber communication board.
3. The test system of an on-board information processing embedded computer of claim 1, wherein the switch comprises a single pole double throw relay with control function or an analog multiple switch circuit with control function.
4. A test method of an on-board information processing embedded computer is applied to a test system of the on-board information processing embedded computer according to claim 1, and is characterized in that performance test is carried out on the test system, a related circuit at a tested product end is disconnected, a switch function test end signal A_x01 of a test signal switching and conditioning unit is connected to a test system self-checking circuit signal D_x01, a switch performance test end signal B_x01 of the test signal switching and conditioning unit is connected to the test system self-checking circuit signal D_x01, and function and performance test is carried out on a circuit of the test system.
5. A test method of an on-board information processing embedded computer is applied to a test system of the on-board information processing embedded computer according to claim 1, and is characterized in that impedance test is carried out on a tested product and function test is carried out on the test system, a functional test end circuit of the test system is disconnected, a circuit of a performance test end of the test system is connected to the tested product, a switch functional test end signal A_x01 of a test signal switching and conditioning unit is connected to a test system self-checking circuit signal D_x01, a switch performance test end signal B_x01 of the test signal switching and conditioning unit is connected to a tested product signal C_x01, and the universal meter board card in the performance test of the test system is utilized to realize impedance test of the tested product, and meanwhile, the functional test of the test system is realized.
6. A test method of an on-board information processing embedded computer is applied to a test system of the on-board information processing embedded computer according to claim 1, and is characterized in that a function test is carried out on a tested product and an impedance test is carried out on a self-checking circuit of the test system, a function test end circuit of the test system is disconnected, a circuit of a performance test end of the test system is connected to the tested product, a switch function test end signal A_x01 of a test signal switching and conditioning unit is connected to a signal C_x01 of the tested product, and a switch performance test end signal B_x01 of the test signal switching and conditioning unit is connected to a self-checking circuit signal D_x01 of the test system.
7. The test method of the on-board information processing embedded computer is applied to a test system of the on-board information processing embedded computer according to claim 1, and is characterized in that performance test is carried out on a tested product, a functional test end circuit of the test system is connected to the tested product, the circuit of the functional test end of the test system is connected to the tested product, a switching function test end signal A_x01 of the test signal switching conditioning unit is connected to a tested product signal C_x01, a switching performance test end signal B_x01 of the test signal switching conditioning unit is connected to the tested product signal C_x01, and a functional test part and a performance test part of the test system are connected to the tested product to realize performance test on the tested product.
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