CN216670714U - Device for screening out overclocking ranges of multiple memory banks - Google Patents

Abstract

The utility model relates to the technical field of memory bank testing, and discloses a device for screening the over-frequency range of a plurality of memory banks. This device of many DRAM overclocking scope of screening, through rectangle movable slot, spacing, the connecting strip, the rectangle connecting rod, the rectangle movable rod, a spring, the intercommunicating pore, spacing hole, mutually support between the gag lever post, thereby can carry out spacing fixed to the DRAM on the DRAM socket, prevent that it from taking place to remove or the condition of droing, and make the DRAM can effectual and the internal connection of DRAM socket, avoid appearing the condition of contact failure, thereby can test the screening to a plurality of DRAM through the device.

Description

Device for screening out overclocking range of multiple memory banks

Technical Field

The utility model relates to the technical field of memory bank testing, in particular to a device for screening the over-frequency range of a plurality of memory banks.

Background

The memory bank is an internal memory which directly exchanges data with the CPU, can be read and written at any time, is high in speed, and is usually used as a temporary data storage medium of an operating system or other running programs; when the overclocking range test is carried out to the DRAM, need insert it on the test server organism, thereby can press the survey to the DRAM, according to pressing the overclocking range of survey result determination current DRAM, but current testing arrangement is when testing a plurality of DRAM, after the plug of DRAM is used many times, cause the condition that contact failure appears on testing arrangement easily in the DRAM, and then influence the test result of DRAM, consequently, need provide a device of screening many DRAM overclocking ranges and solve the above-mentioned problem that appears.

SUMMERY OF THE UTILITY MODEL

Technical problem to be solved

Aiming at the defects of the prior art, the utility model provides a device for screening the over-frequency range of a plurality of memory banks, which has the advantages that the memory banks on a testing device can be limited and fixed, the position deviation or falling-off of the memory banks can be prevented, the contact condition between the memory banks and the testing device can be improved, the memory banks can be effectively tested, and the like, and the problem that the poor contact condition of the memory banks on the testing device is easy to occur after the memory banks are plugged and pulled for a plurality of times, and the testing result of the memory banks is influenced is solved.

(II) technical scheme

In order to achieve the purpose, the utility model provides the following technical scheme: the utility model provides a device of many DRAM overclocking ranges of screening, includes the test server organism, the DRAM socket has been seted up in the front of test server organism, the front of test server organism is provided with power socket and network port, the thermovent has all been seted up to the left and right sides of test server organism, the inside activity of DRAM socket is pegged graft and is had the DRAM, the rectangle movable groove has been seted up in the front of test server organism, the front of test server organism is provided with spacing fixed establishment.

Preferably, spacing fixed establishment includes two spacing, the equal fixedly connected with connecting strip in the left and right sides of spacing, one side fixedly connected with rectangle connecting rod of spacing is kept away from to the connecting strip, the rear side rotation of rectangle connecting rod is connected with the rectangle movable rod, the back lateral wall fixedly connected with spring in rectangle movable groove, rectangle movable rod and rectangle connecting rod all peg graft with the inside activity in rectangle movable groove, the front end of spring and the rear end fixed connection of rectangle movable rod to can carry out spacing fixed to rectangle connecting rod and rectangle movable rod, prevent that it from taking place to remove in the inside in rectangle movable groove.

Preferably, the intercommunicating pore that runs through around the inside of rectangle movable rod is seted up, spacing hole has been seted up to the rear end of rectangle connecting rod, the back lateral wall fixed connection gag lever post in rectangle activity groove, spacing hole and intercommunicating pore communicate each other, the gag lever post is pegged graft with the inside activity in intercommunicating pore and spacing hole in proper order to carry on spacingly between rectangle movable rod and the rectangle connecting rod, prevent that both from taking place to rotate.

Preferably, the top fixedly connected with two U type pieces of test server organism, spacing and the mutual adaptation in inside of U type piece to can stimulate spacing fixed establishment forward, and rotate the rectangle connecting rod, make spacing be located the inside of U type piece, thereby can carry out spacing fixed to spacing, prevent that it from taking place to remove.

Preferably, the equal fixedly connected with rubber strip in rear side of spacing and connecting strip, the rear side of rubber strip and the positive overlap joint of DRAM to can carry out spacing fixed to the DRAM, prevent that it from removing from the inside of DRAM socket, and can protect the DRAM.

Compared with the prior art, the utility model provides a device for screening the over-frequency range of a plurality of memory banks, which has the following beneficial effects:

1. this screen device of many DRAM overclocking scope, through the rectangle movable groove, spacing, the connecting strip, the rectangle connecting rod, the rectangle movable rod, a spring, the intercommunicating pore, spacing hole, mutually support between the gag lever post, thereby can carry out spacing fixed to the DRAM on the DRAM socket, prevent that it from taking place to remove or the condition that drops, and make the DRAM can effectual and the internal connection of DRAM socket, avoid appearing the condition of contact failure, thereby can test the screening to a plurality of DRAM through the device.

2. This device of many DRAM overclocking scope of screening, through the rectangle connecting rod, the rectangle movable rod, spacing, mutually support between connecting strip and the U type piece, thereby with spacing fixing device pulling back forward, make the rectangle connecting rod remove from the inside in rectangle movable groove, and make the inside separation in gag lever post and spacing hole, thereby can upwards rotate the rectangle connecting rod, and drive spacing and connecting strip and together rotate, make the spacing of top be located the rear side of U type piece, and with the inside joint of U-shaped piece, and under the effect of spring, can fix spacing, thereby be convenient for carry out the plug operation with the inside DRAM of DRAM socket.

Drawings

FIG. 1 is a schematic front view of the present invention;

FIG. 2 is a side partial structural cross-sectional view of the present invention;

FIG. 3 is an enlarged view of the structure of FIG. 2A according to the present invention.

Wherein: 1. testing the server body; 2. a memory bank socket; 3. a power outlet; 4. a network port; 5. a heat dissipation port; 6. a memory bank; 7. a rectangular movable slot; 8. a limiting strip; 9. a connecting strip; 10. a rectangular connecting rod; 11. a rectangular movable rod; 12. a spring; 13. a communicating hole; 14. a limiting hole; 15. a limiting rod; 16. a U-shaped block; 17. a rubber strip.

Detailed Description

The technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only a part of the embodiments of the present invention, and not all of the embodiments. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present invention.

Referring to fig. 1-3, a device for screening out the over-frequency range of multiple memory banks includes a test server body 1, a memory bank socket 2 is provided on the front side of the test server body 1, the number of the memory bank sockets 2 is ten, ten memory banks 6 are inserted into the ten memory bank sockets 2 respectively, the ten memory banks 6 can be tested and screened, a power socket 3 and a network port 4 are provided on the front side of the test server body 1, heat dissipation ports 5 are provided on the left and right sides of the test server body 1, the device can be subjected to heat dissipation operation through the heat dissipation ports 5, the memory banks 6 are movably inserted into the memory bank sockets 2, rectangular active slots 7 are provided on the front side of the test server body 1, the number of the rectangular active slots 7 is two, and the two rectangular active slots 7 are respectively located on the left and right sides of the ten memory bank sockets 2, the front side of the test server machine body 1 is provided with a limiting fixing mechanism, the limiting fixing mechanism comprises two limiting strips 8, the left side and the right side of each limiting strip 8 are fixedly connected with connecting strips 9, one rectangular frame body can be arranged at the rear side through the two limiting strips 8 and the two connecting strips 9, one side of each connecting strip 9 far away from the limiting strip 8 is fixedly connected with a rectangular connecting rod 10, the number of the rectangular connecting rods 10 is two, the two rectangular connecting rods 10 are bilaterally symmetrical about the central axis of the rectangular frame body, the rear side of each rectangular connecting rod 10 is rotatably connected with a rectangular movable rod 11, one end, opposite to the rectangular connecting rod 10, of each rectangular movable rod 11 is mutually overlapped, the rectangular movable rods 11 are rotatably connected with the rectangular connecting rods 10 through hinges, the hinges are positioned at the tops of the rectangular movable rods 11 and the rectangular connecting rods 10 and connected, the rear side walls of the rectangular movable grooves 7 are fixedly connected with springs 12, and the rectangular movable rods 11 and the rectangular connecting rods 10 are movably inserted in the rectangular movable grooves 7, the front end of the spring 12 is fixedly connected with the rear end of the rectangular movable rod 11, so that the rectangular movable rod 11 and the rectangular connecting rod 10 can be fixed inside the rectangular movable groove 7 to prevent the rectangular movable rod from moving inside the rectangular movable groove 7, the rectangular movable rod 11 is internally provided with communicating holes 13 which are penetrated through from front to back, the rear end of the rectangular connecting rod 10 is provided with a limiting hole 14, the rear side wall of the rectangular movable groove 7 is fixedly connected with a limiting rod 15, the limiting hole 14 is communicated with the communicating holes 13, the limiting rod 15 is movably inserted into the communicating holes 13 and the limiting holes 14 in sequence, so that the rectangular connecting rod 10 and the rectangular movable rod 11 can be limited to prevent the rectangular movable groove 7 from rotating, the top of the test server body 1 is fixedly connected with two U-shaped blocks 16, the two U-shaped blocks 16 correspond to the positions of the limiting strips 8, and the limiting strips 8 are mutually matched with the insides of the U-shaped blocks 16, the equal fixedly connected with rubber strip 17 in the rear side of spacing 8 and connecting strip 9, the rear side of rubber strip 17 and the positive overlap joint of DRAM 6 can protect DRAM 6 through setting up rubber strip 17, prevent that the wearing and tearing condition from appearing in DRAM 6's surface.

When the test server is used, when the memory bank 6 needs to be inserted into the memory bank socket 2 or the memory bank 6 needs to be taken out by punching the inside of the memory bank socket 2, the limit fixing mechanism can be pulled forwards firstly, so that the rectangular connecting rod 10 and the rectangular movable rod 11 both move forwards in the rectangular movable groove 7, the spring 12 extends, after the rear end of the rectangular connecting rod 10 moves out of the inside of the rectangular movable groove 7, the front end of the limit rod 15 moves out of the inside of the limit hole 14, so that the rectangular connecting rod 10 can be rotated upwards, the limit strip 8 and the connecting strip 9 rotate upwards together, the limit strip 8 is positioned above the test server body 1, the upper limit strip 8 is positioned on the left side of the U-shaped block 16, the upper limit strip 8 can be clamped with the inside of the U-shaped block 16, then the limit fixing mechanism is released, under the action of the spring 12, make spring 12 shrink, thereby can be with spacing 8 and the inseparable joint in U type piece 16's inside, the realization is fixed spacing 8 and connecting strip 9, prevent that rectangle connecting rod 10 from rotating downwards, thereby can carry out the plug change operation to DRAM 6 to the inside of DRAM socket 2, after the operation is accomplished, then can take out spacing 8 from the inside of U type piece 16, and make rectangle connecting rod 10 and the mutual overlap joint of the one end that rectangle movable rod 11 is relative, and under spring 12's effect, make the inside grafting of rectangle connecting rod 10 and rectangle movable slot 7, make the rear side of rubber strip 17 and the positive overlap joint of DRAM 6 simultaneously, and then can carry out spacing fixed to DRAM 6, prevent that DRAM 6 from coming off from the inside removal of DRAM socket 2, the contact effect to DRAM 6 has been improved.

Although embodiments of the present invention have been shown and described, it will be appreciated by those skilled in the art that changes, modifications, substitutions and alterations can be made in these embodiments without departing from the principles and spirit of the utility model, the scope of which is defined in the appended claims and their equivalents.

Claims (5)

1. The utility model provides a device of many DRAM overclocking ranges of screening, includes test server organism (1), its characterized in that: memory bank socket (2) have been seted up in the front of test server organism (1), the front of test server organism (1) is provided with power socket (3) and network port (4), thermovent (5) have all been seted up to the left and right sides of test server organism (1), the inside activity grafting of memory bank socket (2) has memory bank (6), rectangle movable groove (7) have been seted up in the front of test server organism (1), the front of test server organism (1) is provided with spacing fixed establishment.

2. The apparatus of claim 1, wherein the apparatus further comprises: spacing fixed establishment includes two spacing (8), the equal fixedly connected with connecting strip (9) in the left and right sides of spacing (8), one side fixedly connected with rectangle connecting rod (10) of spacing (8) are kept away from in connecting strip (9), the rear side rotation of rectangle connecting rod (10) is connected with rectangle movable rod (11), the back lateral wall fixedly connected with spring (12) in rectangle movable groove (7), rectangle movable rod (11) and rectangle connecting rod (10) all peg graft with the inside activity in rectangle movable groove (7), the front end of spring (12) and the rear end fixed connection of rectangle movable rod (11).

3. The apparatus of claim 2, wherein the apparatus further comprises: intercommunicating pore (13) that run through around the inside of rectangle movable rod (11) is seted up, spacing hole (14) have been seted up to the rear end of rectangle connecting rod (10), rear side wall fixed connection gag lever post (15) of rectangle activity groove (7), spacing hole (14) and intercommunicating pore (13) communicate each other, gag lever post (15) are pegged graft with the inside activity of intercommunicating pore (13) and spacing hole (14) in proper order.

4. The apparatus of claim 2, wherein the apparatus further comprises: the top of the test server body (1) is fixedly connected with two U-shaped blocks (16), and the limiting strips (8) are matched with the inside of the U-shaped blocks (16) mutually.

5. The apparatus of claim 2, wherein the means for screening over-frequency ranges of a plurality of memory banks comprises: the equal fixedly connected with rubber strip (17) of rear side of spacing (8) and connecting strip (9), the front overlap joint of the rear side and the DRAM (6) of rubber strip (17).

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