CN216387106U

CN216387106U - Test probe device for diode

Info

Publication number: CN216387106U
Application number: CN202122512994.3U
Authority: CN
Inventors: 陈君; 朱少波; 秦国良; 陈健; 蔡国庆
Original assignee: Jiangsu Tiansheng Photovoltaic Technology Co ltd
Current assignee: Jiangsu Tiansheng Photovoltaic Technology Co ltd
Priority date: 2021-10-19
Filing date: 2021-10-19
Publication date: 2022-04-26
Anticipated expiration: 2031-10-19

Abstract

The utility model discloses a test probe device for a diode, which comprises a workbench, a support column, a base, a first fixing hole, a U-shaped support frame, a protective seat structure capable of being fixed in an insulating mode, a sealing and dismounting seat structure capable of being sleeved and connected, a sliding and jacking detection seat structure, a test probe, a second fixing hole, an inverted T-shaped contact rod, a first plug pipe, a collection box and an adsorption plate. The sleeve cover, the contact block, the contact column, the test probe, the connecting seat, the supporting block and the second plug pipe are arranged, so that the connecting end of the diode is connected with the outer wall of the upper end of the contact column in the using process, and the diode is conveniently fixed in the testing process; the connecting seat, the supporting shoe, the pipe is pegged graft to the second, the third fixed orifices, the setting of workstation and test probe is favorable to according to the specification of diode at the in-process that uses, pegs graft respectively the test probe inside the second grafting pipe that corresponds, conveniently adjusts work according to the specification of diode at the in-process of testing.

Description

Test probe device for diode

Technical Field

The utility model belongs to the technical field of diode detection equipment, and particularly relates to a test probe device for a diode.

Background

A diode is a very important electronic component, a device with two electronic components, which only allows current to flow in a single direction, but blocks current in the reverse direction, and the unidirectional conduction characteristic of a diode, which is used in almost all electronic circuits. After the die is packaged, before the die is soldered to a circuit board, it is necessary to perform functional test detection on electrical performance of the diode, tolerance of element values, failure, damage, and the like, and to perform functional test on light emitting parameters and the like of the light emitting diode.

However, the conventional test probe device also has the problems that the diode is inconvenient to fix in the using process, the diode is inconvenient to adjust according to the specification of the diode in the using process, and the power supply is inconvenient to adjust in the using process.

Therefore, it is necessary to provide a testing probe apparatus for a diode.

SUMMERY OF THE UTILITY MODEL

The technical problem to be solved by the utility model is as follows: the utility model provides a test probe device for diode to solve current test probe device still have the inconvenient diode fixing work of carrying on in-process that uses, inconvenient in-process that uses according to the specification of diode adjust the work and inconvenient in-process that uses carries out the problem of power adjustment.

In order to solve the technical problems, the utility model adopts the technical scheme that: a test probe device for a diode comprises a workbench, support columns, a base, a first fixing hole, a U-shaped support frame, a protective seat structure capable of being fixed in an insulating mode, a sealing and disassembling seat structure capable of being sleeved and connected, a sliding and abutting detection seat structure, a test probe, a second fixing hole, an inverted T-shaped contact rod, a first plug pipe, a collection box and an adsorption plate, wherein the support columns are respectively bolted at four corners of the lower end of the workbench, and the lower end of each support column is bolted at the middle position of the upper end of the base; the first fixing hole is transversely formed in the middle of the inner part of the front surface of the workbench; the U-shaped support frame is connected to the middle position of the lower end of the workbench through a bolt; the middle position of the upper end of the workbench is provided with a protective seat structure capable of being fixed in an insulating way; the sleeved sealing dismounting seat structure is arranged on the outer wall of the upper end of the test probe; the slidable jacking detection seat structure is arranged on the outer wall of the U-shaped support frame; the test probes are respectively arranged in the insulating fixed protective seat structure; the second fixing holes are sequentially formed in the upper end of the workbench from left to right; the inverted T-shaped contact rods respectively penetrate through the second fixing holes; the first inserting pipe is sequentially bolted to the inner bottom end of the first fixing hole from left to right; the lower end of the inverted T-shaped contact rod is connected with the first inserting pipe through a bolt; the bottom end in the collection box is connected with an adsorption plate through a bolt; the collecting box is arranged on the left side of the upper end of the workbench through an adsorption plate.

Compared with the prior art, the utility model has the beneficial effects that:

1. according to the utility model, the sleeve cover, the contact block, the contact column, the test probe, the connecting seat, the supporting block and the second plug pipe are arranged, so that the connecting end of the diode is connected with the outer wall of the upper end of the contact column in the using process, and the diode is conveniently fixed in the testing process.

2. According to the utility model, the connecting seat, the supporting block, the second inserting pipe, the third fixing hole, the workbench and the test probes are arranged, so that the test probes can be respectively inserted into the corresponding second inserting pipes according to the specification of the diodes in the use process, and the adjustment work according to the specification of the diodes in the test process is facilitated.

3. According to the utility model, the arrangement of the sliding seat, the sleeving seat, the tightening bolt, the power supply mechanism, the workbench and the U-shaped support frame is beneficial to loosening the tightening bolt in the use process and then pushing the sliding seat and the power supply mechanism to move, so that the position of the power supply mechanism can be conveniently adjusted in the test process, and the adjusting function is increased.

4. According to the utility model, the arrangement of the sleeve cover, the contact block, the conical rubber ring, the contact column and the test probe is beneficial to arranging the conical rubber ring between the sleeve cover and the test probe in the use process, the contact column is convenient to fix in the use process, and the contact column is prevented from shaking to influence the test work.

5. According to the utility model, the connecting seat, the supporting block, the second inserting pipe, the third fixing hole, the protective cover and the workbench are arranged, so that the protective cover is arranged at the upper end of the connecting seat in the using process, the dustproof work is conveniently carried out in the using process, and the dust is prevented from entering the second inserting pipe to influence the testing work.

6. According to the utility model, the arrangement of the sliding seat, the splicing barrel, the sleeve joint seat, the puller bolt, the power supply mechanism and the splicing electrified rod mechanism is beneficial to being spliced inside the splicing barrel through the splicing electrified rod mechanism in the use process, the splicing barrel can be conveniently stored in the adjusting process, and the splicing barrel is prevented from being damaged and affecting work.

7. According to the utility model, the workbench, the support column, the first fixing hole, the second fixing hole, the inverted T-shaped contact rod and the first inserting pipe are arranged, so that the inverted T-shaped contact rod and the first inserting pipe are arranged in the workbench in the using process, and the inserting and connecting power rod mechanism is convenient to install and disassemble in the using process.

Drawings

Fig. 1 is a schematic structural view of the present invention.

Fig. 2 is a schematic structural diagram of the insulation fixing protective seat structure of the utility model.

Fig. 3 is a schematic structural view of the base structure of the present invention.

Fig. 4 is a schematic structural view of the slidable tightening detection seat structure of the present invention.

In fig. 1 to 4:

1. a work table; 2. a support pillar; 3. a base; 4. a first fixing hole; 5. a U-shaped support frame; 6. the protective seat structure can be fixed in an insulating way; 61. a connecting seat; 62. a support block; 63. a second bayonet tube; 64. A third fixing hole; 65. a protective cover; 7. a sealing detachable seat structure can be sleeved; 71. a sleeve cover; 72. a contact block; 73. a conical rubber ring; 74. a contact post; 75. PVC blocks; 8. the detection seat structure can be pushed tightly in a sliding way; 81. a sliding seat; 82. a barrel is inserted; 83. a socket joint seat; 84. jacking the bolt; 85. a power supply mechanism; 86. a power-on rod mechanism is inserted; 9. testing the probe; 10. a second fixing hole; 11. an inverted T-shaped contact bar; 12. a first bayonet tube; 13. a collection box; 14. and (5) adsorbing the plate.

Detailed Description

The utility model is described in detail below with reference to the attached drawing figures:

as shown in fig. 1 and 2, the testing probe device for the diode according to the present invention comprises a workbench 1, a supporting column 2, a base 3, a first fixing hole 4, a U-shaped supporting frame 5, an insulation fixing protection seat structure 6, a sealing detachable seat structure 7, a sliding abutting detection seat structure 8, a testing probe 9, a second fixing hole 10, an inverted T-shaped contact rod 11, a first plug tube 12, a collecting box 13 and an adsorption plate 14, wherein the supporting column 2 is bolted to four corners of the lower end of the workbench 1, and the lower end of the supporting column 2 is bolted to the middle position of the upper end of the base 3; the first fixing hole 4 is transversely formed in the middle of the inner part of the front surface of the workbench 1; the U-shaped support frame 5 is connected to the middle position of the lower end of the workbench 1 through a bolt; the middle position of the upper end of the workbench 1 is provided with a protective seat structure 6 capable of being fixed in an insulating way; the sleeved sealing dismounting seat structure 7 is arranged on the outer wall of the upper end of the test probe 9; the slidable jacking detection seat structure 8 is arranged on the outer wall of the U-shaped support frame 5; the test probes 9 are respectively arranged inside the insulation fixed protection seat structure 6; the second fixing holes 10 are sequentially formed in the upper end of the workbench 1 from left to right; the inverted T-shaped contact rods 11 respectively penetrate through the second fixing holes 10; the first inserting pipe 12 is sequentially bolted to the bottom end inside the first fixing hole 4 from left to right; the lower end of the inverted T-shaped contact rod 11 is connected with the first plug pipe 12 through a bolt; the bottom end in the collection box 13 is connected with an adsorption plate 14 through a bolt; the collecting box 13 is arranged on the left side of the upper end of the workbench 1 through an adsorption plate 14; the protection seat structure 6 capable of being fixed in an insulating mode comprises a connecting seat 61, a supporting block 62, a second inserting pipe 63, a third fixing hole 64 and a protection cover 65, wherein the supporting block 62 is connected to the bottom end inside the connecting seat 61 through a bolt; the upper end of the supporting block 62 is sequentially connected with a second inserting pipe 63 in a threaded manner from left to right; the third fixing holes 64 are sequentially formed in the bottom end of the connecting seat 61 from left to right; the third fixing holes 64 are sequentially formed in the supporting block 62 from left to right; the protective cover 65 is connected to the upper end of the connecting seat 61 through a screw; when the test device is used, the workbench 1 is placed at a proper position, an external power supply is connected by using an external lead, then the test probe 9 is pulled out according to the specification of the diode, the test probes 9 are respectively inserted into the second insertion tubes 63 according to the specification of the diode, then the test probe 9 is in contact with the inverted T-shaped contact rod 11, and the test probe 9 is supported by the protective cover 65.

In this embodiment, referring to fig. 3, the base structure 7 includes a socket cover 71, a contact block 72, a tapered rubber ring 73, a contact column 74 and a PVC block 75, wherein the top end of the socket cover 71 is connected to the contact block 72 by a bolt; a conical rubber ring 73 is glued to the lower part of the inner wall of the sleeving cover 71; the middle position of the upper end of the sleeving cover 71 is connected with a contact column 74 through a bolt, and the upper end of the contact column 74 is connected with a PVC block 75 through a bolt; the test probe 9 is fixed, then the sleeve cover 71 is sleeved on the outer wall of the upper end of the test probe 9, the fixed end of the diode is connected with the outer wall of the upper end of the contact column 74, the diode is convenient to fix and detach in the using process, and the test probe 9 is convenient to protect in the testing process.

In this embodiment, referring to fig. 4, the slidable tightening detection seat structure 8 includes a sliding seat 81, an insertion barrel 82, a sleeve seat 83, a tightening bolt 84, a power supply mechanism 85 and an insertion power rod mechanism 86, wherein the insertion barrel 82 is respectively glued to the middle positions of the left and right sides of the upper end of the sliding seat 81; the middle positions of the left side and the right side of the lower end of the sliding seat 81 are respectively connected with a socket joint 83 through bolts; the front surface of the sleeve joint seat 83 is respectively in threaded connection with a puller bolt 84; the middle position of the upper end of the sliding seat 81 is connected with a power supply mechanism 85 through a bolt; the power supply mechanism 85 is connected with the plug-in electrified rod mechanism 86 through a wire; after the diode is fixed, the plugging electrifying rod mechanism 86 is pulled out, the plugging electrifying rod mechanisms 86 are respectively plugged into the first plugging pipe 12, then an external power switch is turned on, the power supply mechanism 85 starts to work, the diode test is carried out, and therefore the secondary test work is completed.

In this embodiment, specifically, the inverted T-shaped contact rods 11 are sequentially arranged at the top end of the interior of the first fixing hole 4 from left to right; the adsorption plate 14 and the workbench 1 are arranged in an adsorption manner; the lower end of the test probe 9 is contacted with the upper end of the inverted T-shaped contact rod 11.

In this embodiment, specifically, the connecting seat 61 is a stainless steel seat with a groove formed at the upper end; the second inserting pipe 63 and the third fixing hole 64 are correspondingly arranged; the protective cover 65 is a PVC cover with a through hole at the upper end.

In this embodiment, specifically, the connecting seat 61 is bolted to the upper end of the workbench 1; the inverted T-shaped contact rods 11 respectively penetrate through the third fixing holes 64; the upper ends of the inverted T-shaped contact rods 11 are respectively arranged in the middle of the inner part of the lower end of the second inserting pipe 63; the lower end of the test probe 9 penetrates through the protective cover 65 and is inserted in the middle of the inside of the upper end of the second insertion pipe 63.

In this embodiment, specifically, the contact block 72 is disposed in contact with the middle position of the lower end of the contact column 74; the joints of the contact block 72, the contact column 74 and the socket cover 71 are provided with rubber rings.

In this embodiment, specifically, the sleeving covers 71 are respectively sleeved on the outer walls of the upper ends of the test probes 9; the conical rubber ring 73 is arranged between the sleeving cover 71 and the test probe 9; the upper end of the test probe 9 is in contact with the contact block 72.

In this embodiment, specifically, the insertion barrel 82 is a cylindrical PVC barrel; the plugging electrifying rod mechanisms 86 are respectively plugged in the plugging barrel 82.

In this embodiment, specifically, the sliding seat 81 is installed on the outer wall of the upper end of the U-shaped supporting frame 5 through the sleeving seat 83; the puller bolt 84 is arranged in contact with the U-shaped support frame 5.

Principle of operation

In the utility model, when in use, the workbench 1 is placed at a proper position, an external power supply is connected by using an external lead, then the test probe 9 is pulled out according to the specification of the diode, the test probes 9 are respectively inserted into the second insertion tube 63 according to the specification of the diode, then the test probe 9 is arranged in contact with the inverted T-shaped contact rod 11, the test probe 9 is supported by the protective cover 65, the test probe 9 is fixed, then the sleeve cover 71 is sleeved on the outer wall of the upper end of the test probe 9, the fixed end of the diode is connected with the outer wall of the upper end of the contact column 74, the diode is fixed and disassembled in the use process, the test probe 9 is conveniently protected in the test process, after the diode is fixed, the insertion electrified rod mechanism 86 is pulled out, and the insertion electrified rod mechanisms 86 are respectively inserted into the first insertion tube 12, then, the external power switch is turned on, so that the power supply mechanism 85 starts to operate to perform the diode test, thereby completing the secondary test operation.

The technical solutions of the present invention or similar technical solutions designed by those skilled in the art based on the teachings of the technical solutions of the present invention are all within the scope of the present invention.

Claims

1. A test probe device for a diode comprises a workbench (1), support columns (2), a base (3), first fixing holes (4), a U-shaped support frame (5), an insulated fixed protection seat structure (6), a sleeved and sealed dismounting seat structure (7), a slidable jacking detection seat structure (8), test probes (9), second fixing holes (10), inverted T-shaped contact rods (11), first plug pipes (12), a collection box (13) and an adsorption plate (14), wherein the support columns (2) are respectively bolted at four corners of the lower end of the workbench (1), and the lower end of each support column (2) is bolted at the middle position of the upper end of the base (3); the first fixing hole (4) is transversely formed in the middle of the inner part of the front surface of the workbench (1); the U-shaped support frame (5) is connected to the middle position of the lower end of the workbench (1) through a bolt; the test probes (9) are respectively arranged in the insulating fixed protection seat structure (6); the second fixing holes (10) are sequentially formed in the upper end of the workbench (1) from left to right; the inverted T-shaped contact rods (11) penetrate through the second fixing holes (10) respectively; the first inserting pipe (12) is sequentially connected to the bottom end of the interior of the first fixing hole (4) through bolts from left to right; the lower end of the inverted T-shaped contact rod (11) is connected with the first plug pipe (12) through a bolt; the bottom end in the collection box (13) is connected with an adsorption plate (14) through a bolt; the collecting box (13) is arranged on the left side of the upper end of the workbench (1) through an adsorption plate (14); the diode test probe device is characterized in that a protective seat structure (6) capable of being fixed in an insulating way is arranged in the middle position of the upper end of the workbench (1); the sleeved sealing dismounting seat structure (7) is arranged on the outer wall of the upper end of the test probe (9); the slidable jacking detection seat structure (8) is arranged on the outer wall of the U-shaped support frame (5); the protection seat structure (6) capable of being fixed in an insulating mode comprises a connecting seat (61), a supporting block (62), a second inserting pipe (63), a third fixing hole (64) and a protection cover (65), wherein the supporting block (62) is connected to the bottom end of the inside of the connecting seat (61) through bolts; the upper end of the supporting block (62) is sequentially in threaded connection with a second inserting pipe (63) from left to right; the third fixing holes (64) are sequentially formed in the bottom end of the inner part of the connecting seat (61) from left to right; the third fixing holes (64) are sequentially formed in the supporting block (62) from left to right; the protective cover (65) is connected to the upper end of the connecting seat (61) through screws.

2. The diode test probe device according to claim 1, wherein the socketed sealing seat structure (7) comprises a socketed cover (71), a contact block (72), a tapered rubber ring (73), a contact column (74) and a PVC block (75), and the contact block (72) is bolted to the top end of the inside of the socketed cover (71); the lower part of the inner wall of the sleeving cover (71) is glued with a conical rubber ring (73); the middle position of the upper end of the socket cover (71) is connected with a contact column (74) through a bolt, and the upper end of the contact column (74) is connected with a PVC block (75) through a bolt.

3. The testing probe device for the diode according to claim 1, wherein the slidable tightening detection base structure (8) comprises a sliding base (81), a plugging barrel (82), a socket base (83), a tightening bolt (84), a power supply mechanism (85) and a plugging energizing rod mechanism (86), wherein the plugging barrel (82) is respectively glued at the middle position of the left side and the right side of the upper end of the sliding base (81); the middle positions of the left side and the right side of the lower end of the sliding seat (81) are respectively connected with a socket joint seat (83) through bolts; the front surface of the sleeve joint seat (83) is respectively in threaded connection with a puller bolt (84); the middle position of the upper end of the sliding seat (81) is connected with a power supply mechanism (85) through a bolt; the power supply mechanism (85) is connected with the plug-in electrified rod mechanism (86) through a wire.

4. The test probe device for a diode according to claim 1, wherein the connection holder (61) is bolted to an upper end of the table (1); the inverted T-shaped contact rods (11) penetrate through the third fixing holes (64) respectively; the upper ends of the inverted T-shaped contact rods (11) are respectively arranged in the middle of the inner part of the lower end of the second inserting pipe (63); the lower end of the test probe (9) penetrates through the protective cover (65) respectively and is inserted in the middle of the inside of the upper end of the second insertion pipe (63).

5. The test probe device for a diode according to claim 2, wherein the socket covers (71) are respectively socket-connected to the outer walls of the upper ends of the test probes (9); the conical rubber ring (73) is arranged between the sleeving cover (71) and the test probe (9); the upper end of the test probe (9) is contacted with the contact block (72).

6. The test probe device for the diode according to claim 3, wherein the sliding seat (81) is installed on the outer wall of the upper end of the U-shaped support frame (5) through a socket seat (83); the puller bolt (84) is in contact with the U-shaped support frame (5).