CN216285580U - Integrated circuit power-on test equipment - Google Patents
Integrated circuit power-on test equipment Download PDFInfo
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- CN216285580U CN216285580U CN202122370659.4U CN202122370659U CN216285580U CN 216285580 U CN216285580 U CN 216285580U CN 202122370659 U CN202122370659 U CN 202122370659U CN 216285580 U CN216285580 U CN 216285580U
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- integrated circuit
- circuit board
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- fixedly connected
- placing
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- 238000012360 testing method Methods 0.000 title claims abstract description 36
- 230000001105 regulatory effect Effects 0.000 abstract description 10
- 230000006835 compression Effects 0.000 abstract 1
- 238000007906 compression Methods 0.000 abstract 1
- 238000001514 detection method Methods 0.000 description 7
- 229910000838 Al alloy Inorganic materials 0.000 description 4
- 230000002159 abnormal effect Effects 0.000 description 4
- 239000000956 alloy Substances 0.000 description 4
- 238000004519 manufacturing process Methods 0.000 description 4
- 239000000463 material Substances 0.000 description 4
- 239000010935 stainless steel Substances 0.000 description 4
- 229910001220 stainless steel Inorganic materials 0.000 description 4
- 230000007797 corrosion Effects 0.000 description 3
- 238000005260 corrosion Methods 0.000 description 3
- 230000005489 elastic deformation Effects 0.000 description 2
- 230000009286 beneficial effect Effects 0.000 description 1
- 239000003990 capacitor Substances 0.000 description 1
- 230000007547 defect Effects 0.000 description 1
- 230000003628 erosive effect Effects 0.000 description 1
- 238000013100 final test Methods 0.000 description 1
- 238000000034 method Methods 0.000 description 1
- 238000004806 packaging method and process Methods 0.000 description 1
- 230000002035 prolonged effect Effects 0.000 description 1
- 239000004065 semiconductor Substances 0.000 description 1
- 239000000758 substrate Substances 0.000 description 1
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Abstract
The utility model provides an integrated circuit power-on test device, which relates to the technical field of integrated circuits and comprises a base, a fixed plate, a placing block, an integrated circuit board and a clamping assembly, wherein the fixed plate with an inverted U-shaped structure is fixedly connected to the top of the base, the placing block is fixedly connected to the top of the base, a placing groove is formed in the top of the placing block, the integrated circuit board is arranged in the placing groove, a conductive rod is arranged at the top of the integrated circuit board, and the clamping assembly is arranged between the integrated circuit board and the placing block and used for clamping and fixing the integrated circuit board. This kind of equipment uses through standing groove, grip block and compression spring cooperation, can the fixed integrated circuit board of centre gripping, prevents that integrated circuit board from appearing not hard up when the test, uses through the cooperation of slide bar, regulating block, fixed plate and slide opening, and the position that can adjust the conducting rod deals with not unidimensional integrated circuit board.
Description
Technical Field
The utility model relates to the technical field of integrated circuits, in particular to an integrated circuit power-on test device.
Background
An integrated circuit is a miniature electronic device or component, which is made up through such technological steps as interconnection of transistor, resistor, capacitor and inductor and wiring in a circuit on a small semiconductor wafer or medium substrate, and packaging in a package.
In the production and manufacturing process of the integrated circuit, the manufactured integrated circuit needs to be subjected to power-on test, and whether the circuit in the integrated circuit has an abnormal problem is detected, so that power-on test equipment needs to be used for auxiliary detection, the integrated circuit board is placed in the detection equipment, then the integrated circuit board is powered on, whether an indicator lamp on the detection equipment is turned on or not is observed, if the indicator lamp is turned on, the power-on is good, and if the indicator lamp is not turned on, the circuit in the integrated circuit board is abnormal.
The existing test equipment can only detect the integrated circuit board with a single size, and the integrated circuit boards with other sizes need the corresponding test equipment to detect, so that the test equipment is very troublesome, and when the existing test equipment detects, the contact point of the integrated circuit board and the equipment is easy to loose, so that poor contact is caused, and the deviation of the final test result is large.
SUMMERY OF THE UTILITY MODEL
The utility model aims to solve the defects in the background technology and provides integrated circuit power-on test equipment, which can clamp and fix an integrated circuit board by matching a placing groove, a clamping block and a pressure spring, prevent the integrated circuit board from loosening during testing, and adjust the position of a conductive rod to correspond to integrated circuit boards of different sizes by matching a sliding rod, an adjusting block, a fixing plate and a sliding hole.
In order to achieve the above object, the present invention provides a power-on test device for an integrated circuit, which comprises a base, a fixing plate, a placing block, an integrated circuit board and a clamping assembly;
the top of the base is fixedly connected with a fixing plate with an inverted U-shaped structure, the top of the base is fixedly connected with a placing block, the top of the placing block is provided with a placing groove, an integrated circuit board is arranged in the placing groove, and the top of the integrated circuit board is provided with a conducting rod;
and a clamping component is arranged between the integrated circuit board and the placing block and used for clamping and fixing the integrated circuit board.
Further, the clamping assembly comprises pressure springs, clamping blocks and rubber pads, a plurality of pressure springs are fixedly connected to the inner wall of one side of the placing groove, the clamping blocks are fixedly connected to one side, far away from the placing groove, of the pressure springs, the rubber pads are fixedly connected to one sides, far away from the pressure springs, of the clamping blocks, and the rubber pads are tightly attached to the integrated circuit board.
Further, the electrode plates are fixedly mounted on the inner wall of one side of the placing groove, the equipment cavity is formed in the base, the storage battery is fixedly mounted in the equipment cavity, the indicating lamp is fixedly mounted at the top of the base, and the storage battery is electrically connected with the electrode plates and the indicating lamp respectively.
Furthermore, a wire is fixedly connected to one side of the indicator light, a conducting ring is arranged on the outer side of the conducting rod, a through hole is formed in one side of the fixing plate, and the wire penetrates through the through hole and is connected with the conducting ring.
Furthermore, a groove is formed in the top of the fixing plate, two sliding rods are fixedly connected inside the groove, an adjusting block is arranged inside the groove, two sliding holes matched with the sliding rods are formed in the adjusting block, the sliding rods are connected with the adjusting block in a sliding mode through the sliding holes, an electric push rod is fixedly mounted at the bottom of the adjusting block, and a moving block is fixedly connected at the bottom of the electric push rod.
Furthermore, a moving groove is formed in the bottom of the moving block, a return spring is fixedly connected inside the moving groove, a limiting block is fixedly connected to the bottom end of the return spring, and the bottom of the limiting block is connected with a conductive rod.
The utility model provides an integrated circuit power-on test device, which has the following beneficial effects:
1. the integrated circuit board clamping device has the advantages that the integrated circuit board to be detected needs to be placed in the placing groove, the clamping block clamps the integrated circuit board under the action of the elastic force of the pressure spring through the placing groove, the clamping block and the pressure spring, the integrated circuit board is enabled to be tightly attached to the electrode plate, and the situation that when the integrated circuit board is subjected to power-on test, the test result is influenced due to incomplete contact of the integrated circuit board and the electrode plate is avoided.
2. Secondly, when the position of conducting rod is adjusted according to the size of the integrated circuit board to be detected as required, through regulating block, slide bar, slide opening, fluting, electric putter and movable block for the regulating block drives the conducting rod through electric putter and movable block and moves, accomplishes the position control to the conducting rod, makes the conducting rod can carry out corresponding regulation according to the integrated circuit board of different sizes, makes it can contact with integrated circuit board, improves the suitability.
Drawings
Fig. 1 is a schematic view of the overall structure of the present invention.
Fig. 2 is a sectional view of the overall structure of the present invention.
Fig. 3 is a top sectional view of the fixing plate structure of the present invention.
Fig. 4 is a sectional view of the moving block structure of the present invention.
FIG. 5 is a schematic view of a placement block structure according to the present invention.
In FIGS. 1-5: 1. a base; 101. a storage battery; 102. an indicator light; 103. a wire; 2. a fixing plate; 201. grooving; 202. a slide bar; 203. a through hole; 3. an adjusting block; 301. an electric push rod; 4. a moving block; 401. a moving groove; 402. a return spring; 403. a limiting block; 404. a conductive rod; 405. conducting rings; 5. placing the blocks; 501. a placement groove; 502. a pressure spring; 503. a clamping block; 504. a rubber pad; 505. an electrode sheet; 6. an integrated circuit board.
Detailed Description
Example (b):
referring to figures 1-5 of the drawings,
the integrated circuit power-on test equipment provided by the embodiment comprises a base 1, a fixing plate 2, a placing block 5, an integrated circuit board 6 and a clamping assembly;
the top of the base 1 is fixedly connected with a fixing plate 2 with an inverted U-shaped structure, the placing block 5 is fixedly connected to the top of the base 1, the top of the placing block 5 is provided with a placing groove 501, the integrated circuit board 6 is arranged in the placing groove 501, and the top of the integrated circuit board 6 is provided with a conducting rod 404;
and a clamping component is arranged between the integrated circuit board 6 and the placing block 5 and is used for clamping and fixing the integrated circuit board 6.
Further, the clamping assembly comprises a pressure spring 502, a clamping block 503 and a rubber pad 504, the inner wall of one side of the placing groove 501 is fixedly connected with a plurality of pressure springs 502, one side of the pressure spring 502, which is far away from the placing groove 501, is fixedly connected with the clamping block 503, one side of the clamping block 503, which is far away from the pressure spring 502, is fixedly connected with the rubber pad 504, and the rubber pad 504 is tightly attached to the integrated circuit board 6, when the integrated circuit board 6 needs to be placed, the clamping block 503 is moved to enable the clamping block 503 to extrude the pressure spring 502, so that the pressure spring 502 generates elastic force through elastic deformation, then the integrated circuit board 6 needing to be tested is placed in the placing groove 501, at the moment, the clamping block 503 is loosened, the clamping block 503 rebounds under the action of the elastic force of the pressure spring 502 to clamp the integrated circuit board 6, and the integrated circuit board 6 is pushed by the clamping block 503 to move towards the direction of the electrode plate 505 and tightly attached to the electrode plate 505, when the integrated circuit board 6 is subjected to power-on test, the test result is prevented from being influenced due to incomplete contact of the integrated circuit board 6 on the electrode plate 505, then the force applied to the integrated circuit board 6 by the clamping block 503 is relieved through the rubber pad 504, and the integrated circuit board 6 is prevented from being damaged due to overlarge force applied by the clamping block 503.
Further, fixed mounting has electrode slice 505 on the inner wall of standing groove 501 one side, the inside equipment chamber that has seted up of base 1, the inside fixed mounting of equipment chamber has battery 101, base 1 top fixed mounting has pilot lamp 102, battery 101 respectively with electrode slice 505 and pilot lamp 102 electric connection, when carrying out the circular telegram test, when pilot lamp 102 lights, integrated circuit board 6 circular telegram nature is good, if pilot lamp 102 does not light, then integrated circuit board 6 has abnormal problem, the completion is to integrated circuit board 6 circular telegram test.
Furthermore, a conducting wire 103 is fixedly connected to one side of the indicator light 102, a conducting ring 405 is disposed outside the conducting rod 404, a through hole 203 is formed in one side of the fixing plate 2, and the conducting wire 103 penetrates through the through hole 203 and is connected to the conducting ring 405.
Further, a slot 201 has been seted up at 2 tops of fixed plate, two slide bars 202 of the inside fixedly connected with of slot 201, the inside regulating block 3 that is provided with of slot 201, set up on the regulating block 3 two with slide bar 202 assorted slide opening, and slide bar 202 passes through slide opening and regulating block 3 sliding connection, 3 bottom fixed mounting of regulating block has electric putter 301, electric putter 301 bottom fixedly connected with movable block 4, when the position of conducting rod 404 needs to be adjusted, promote regulating block 3, make regulating block 3 slide on slide bar 202, make regulating block 3 drive electric putter 301 remove, and then drive conducting rod 404 through movable block 4 and remove, accomplish the position control to conducting rod 404, make conducting rod 404 can carry out corresponding regulation according to integrated circuit board 6 of equidimension not, improve the suitability.
The sliding rod 202 is made of stainless steel material, the stainless steel material has the characteristics of good corrosion resistance and high mechanical strength, so that the sliding rod 202 can resist external erosion, the service life of the fixing plate 2 is prolonged, the sliding rod 202 has certain corrosion resistance through the characteristic of high mechanical strength, the weight of the adjusting block 3 can be borne, and the phenomenon that the sliding rod 202 is bent due to too large weight and normal detection is influenced is avoided;
meanwhile, the sliding rod 202 can also be made of an aluminum alloy material, the aluminum alloy material also has the characteristics of good corrosion resistance and high mechanical strength, and can meet the manufacturing requirement of the sliding rod 202, compared with the aluminum alloy material, the mechanical strength of the stainless steel material is better than that of the aluminum alloy material, and the sliding rod 202 is subjected to the load of the adjusting block 3 for a long time, so that the stainless steel material with good mechanical strength is selected for manufacturing.
Further, a moving groove 401 is formed in the bottom of the moving block 4, a return spring 402 is fixedly connected to the inside of the moving groove 401, a limiting block 403 is fixedly connected to the bottom end of the return spring 402, the bottom of the limiting block 403 is connected with the conducting rod 404, when the power-on test is performed, the electric push rod 301 is started, the electric push rod 301 drives the moving block 4 to move downwards, the moving block 4 drives the conducting rod 404 to contact with the integrated circuit board 6, the return spring 402 is extruded by the conducting rod 404 and the limiting block 403 to generate elastic force, the generated elastic force acts on the limiting block 403 and the conducting rod 404, the conducting rod 404 can be tightly attached to the integrated circuit board 6, the situation that the conducting rod 404 is in poor contact with the integrated circuit board 6 when the test is performed is avoided, the indicator lamp 102 cannot be lightened, and the detection structure is wrong.
When the integrated circuit testing device is used, an integrated circuit board 6 to be tested needs to be placed into the placing groove 501, the clamping block 503 is moved at the moment, the clamping block 503 is enabled to extrude the pressure spring 502, the pressure spring 502 is enabled to generate elastic deformation to generate elastic force, then the integrated circuit board 6 to be tested is placed into the placing groove 501, the clamping block 503 is loosened at the moment, the clamping block 503 rebounds under the action of the elastic force of the pressure spring 502 to clamp the integrated circuit board 6, the integrated circuit board 6 moves towards the direction of the electrode plate 505 under the thrust of the clamping block 503 and clings to the electrode plate 505, the testing result is prevented from being influenced due to incomplete contact of the integrated circuit board 6 with the electrode plate 505 when the integrated circuit board 6 is subjected to power-on testing, the force applied to the integrated circuit board 6 by the clamping block 503 is relieved through the rubber pad 504, and damage to the integrated circuit board 6 caused by overlarge force applied by the clamping block 503 is avoided, then the position of the conducting rod 404 is adjusted according to the size of the integrated circuit board 6 to be detected, at the same time, the adjusting block 3 is pushed, so that the adjusting block 3 slides on the sliding rod 202, so that the adjusting block 3 drives the electric push rod 301 to move, and further the conducting rod 404 is driven to move through the moving block 4, the position adjustment of the conducting rod 404 is completed, so that the conducting rod 404 can correspondingly adjust according to the integrated circuit boards 6 with different sizes, so that the conducting rod 404 can be in contact with the integrated circuit boards 6, the applicability is improved, then after the position of the conducting rod 404 is adjusted, the power-on contact test is carried out, at the moment, the electric push rod 301 is started, so that the electric push rod 301 drives the moving block 4 to move downwards, so that the moving block 4 drives the conducting rod 404 to be in contact with the integrated circuit boards 6, at the moment, the reset spring 402 is extruded by the conducting rod 404 and the limiting block 403 to elastically deform to generate elasticity, and the generated elastic force acts on the limiting block 403 and the conducting rod 404, so that the conducting rod 404 can be tightly attached to the integrated circuit board 6, the situation that the conducting rod 404 is in poor contact with the integrated circuit board 6 when a test is performed, the indicator lamp 102 cannot be lightened, and a detection structure is wrong is caused is avoided, in the detection process, if the indicator lamp 102 is lightened, the integrated circuit board 6 is well electrified, if the indicator lamp 102 is not lightened, the integrated circuit board 6 has an abnormal problem, the electrification test on the integrated circuit board 6 is completed, and the integrated circuit board 6 can be clamped and fixed and the position of the conducting rod 404 can be adjusted through the structure.
Claims (6)
1. The integrated circuit power-on test equipment is characterized by comprising a base, a fixing plate, a placing block, an integrated circuit board and a clamping assembly;
the top of the base is fixedly connected with a fixing plate with an inverted U-shaped structure, the top of the base is fixedly connected with a placing block, the top of the placing block is provided with a placing groove, an integrated circuit board is arranged in the placing groove, and the top of the integrated circuit board is provided with a conducting rod;
and a clamping component is arranged between the integrated circuit board and the placing block and used for clamping and fixing the integrated circuit board.
2. The integrated circuit power-on test equipment of claim 1, wherein the clamping assembly comprises a pressure spring, a clamping block and a rubber pad, the pressure springs are fixedly connected to the inner wall of one side of the placing groove, the clamping block is fixedly connected to one side of the pressure spring away from the placing groove, the rubber pad is fixedly connected to one side of the clamping block away from the pressure springs, and the rubber pad is tightly attached to the integrated circuit board.
3. The integrated circuit power-on test equipment as defined in claim 1, wherein an electrode plate is fixedly mounted on an inner wall of one side of the placement groove, an equipment cavity is formed in the base, a storage battery is fixedly mounted in the equipment cavity, an indicator lamp is fixedly mounted on the top of the base, and the storage battery is electrically connected with the electrode plate and the indicator lamp respectively.
4. The integrated circuit power-on test equipment as claimed in claim 3, wherein a wire is fixedly connected to one side of the indicator light, a conductive ring is disposed outside the conductive rod, a through hole is formed in one side of the fixing plate, and the wire penetrates through the through hole and is connected with the conductive ring.
5. The integrated circuit power-on test device as claimed in claim 1, wherein a slot is formed at the top of the fixing plate, two sliding rods are fixedly connected inside the slot, an adjusting block is arranged inside the slot, two sliding holes matched with the sliding rods are formed in the adjusting block, the sliding rods are slidably connected with the adjusting block through the sliding holes, an electric push rod is fixedly mounted at the bottom of the adjusting block, and a moving block is fixedly connected at the bottom of the electric push rod.
6. The integrated circuit power-on test device as claimed in claim 5, wherein a moving groove is formed at the bottom of the moving block, a return spring is fixedly connected inside the moving groove, a limit block is fixedly connected to the bottom end of the return spring, and the bottom of the limit block is connected to the conductive rod.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
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CN202122370659.4U CN216285580U (en) | 2021-09-29 | 2021-09-29 | Integrated circuit power-on test equipment |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
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CN202122370659.4U CN216285580U (en) | 2021-09-29 | 2021-09-29 | Integrated circuit power-on test equipment |
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CN216285580U true CN216285580U (en) | 2022-04-12 |
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CN202122370659.4U Expired - Fee Related CN216285580U (en) | 2021-09-29 | 2021-09-29 | Integrated circuit power-on test equipment |
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Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN115290938A (en) * | 2022-10-09 | 2022-11-04 | 深圳市华科达诚科技有限公司 | Automatic connecting device for integrated circuit |
CN115542134A (en) * | 2022-11-30 | 2022-12-30 | 镇江矽佳测试技术有限公司 | High-precision testing device for integrated circuit |
-
2021
- 2021-09-29 CN CN202122370659.4U patent/CN216285580U/en not_active Expired - Fee Related
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN115290938A (en) * | 2022-10-09 | 2022-11-04 | 深圳市华科达诚科技有限公司 | Automatic connecting device for integrated circuit |
CN115290938B (en) * | 2022-10-09 | 2022-12-30 | 深圳市华科达诚科技有限公司 | Automatic connecting device for integrated circuit |
CN115542134A (en) * | 2022-11-30 | 2022-12-30 | 镇江矽佳测试技术有限公司 | High-precision testing device for integrated circuit |
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GR01 | Patent grant | ||
GR01 | Patent grant | ||
CF01 | Termination of patent right due to non-payment of annual fee | ||
CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20220412 |