CN217820451U

CN217820451U - Aging clamp for tantalum capacitor

Info

Publication number: CN217820451U
Application number: CN202220626748.2U
Authority: CN
Inventors: 刘博�; 朱琳; 鲁静
Original assignee: Nanjing Sushi Guangbo Environment Reliability Laboratory Co ltd
Current assignee: Nanjing Sushi Guangbo Environment Reliability Laboratory Co ltd
Priority date: 2022-03-22
Filing date: 2022-03-22
Publication date: 2022-11-15
Anticipated expiration: 2032-03-22

Abstract

The utility model provides a tantalum electric capacity anchor clamps of smelting always, including base, fixed plate, shell, setting PCB test circuit board on the base, set up the metal conducting strip at PCB test circuit board, with the tight thing of step up of installation on the centre gripping subassembly of metal current conducting plate one-to-one, top cap and the top cap. When the sample is installed, the elastic pressing plate is separated, the sample to be detected is placed according to the trend of the current-conducting plate, and the elastic pressing plate is used for clamping and fixing the samples with different sizes. By the extrusion of the resilience force of the spring and the extrusion of the clamping object on the top cover, the unstable clamping condition of the sample can not occur. The utility model discloses the tantalum electric capacity that makes the adaptable not unidimensional specification of anchor clamps is a mobile anchor clamps, can guarantee test efficiency, lets the sample more be close actual conditions in the testing process, better tests. The optimization of the sample placing angle problem can lead samples to be tested on the clamp in large batch, greatly improve the time required by the test and save a lot of test cost.

Description

Aging clamp for tantalum capacitor

Technical Field

The utility model relates to an aging anchor clamps of tantalum electric capacity.

Background

At present, most of units of electronic component test samples are generally subjected to burn-in tests, but the existing general burn-in board clamp has poor universality on the electronic component samples, the sample storage quantity is small, so that the problems of low test efficiency, high test cost and the like are caused, and the mass tests cannot be efficiently carried out.

SUMMERY OF THE UTILITY MODEL

An object of the utility model is to provide an aging anchor clamps of tantalum electric capacity of adaptable not unidimensional specification sample.

In order to achieve the above purpose, the utility model provides a following technical scheme: a tantalum capacitor aging fixture, comprising: a base; the PCB test circuit board is arranged on the base; the metal conducting plate is electrically connected with the PCB test circuit board and arranged on the base; the clamping assembly is arranged on the base;

the clamping assembly comprises two opposite pressing plates and an elastic part for connecting at least one of the pressing plates with the base, a sample placing area for placing a sample to be tested is formed between the two opposite pressing plates, and after the pressing plates are stressed, the elastic part is compressed to enable the pressing plates to move along the lengthwise direction of the elastic part;

the metal conducting plate is arranged in the sample placing area or on one side of the sample placing area so as to be electrically connected with a sample to be detected.

Furthermore, the number of the elastic pieces is two, and the elastic pieces and the pressing plate are arranged in a one-to-one manner; one end of each elastic piece is connected with the base, and the other end of each elastic piece is connected with the pressing plate.

Furthermore, the clamping assemblies are in multiple pairs, the multiple pairs of clamping assemblies are arranged in parallel, and the metal conducting strips correspond to the clamping assemblies one to one.

Further, the clamping assembly is disposed above the PCB test circuit board.

Furthermore, the metal conducting strip is formed on a plate body in an electroplating mode, and the plate body is located between the PCB testing circuit board and the clamping assembly.

Furthermore, each metal conducting strip is arranged corresponding to one elastic piece and extends along the lengthwise direction of the elastic piece.

Further, tantalum electric capacity smelts anchor clamps always still includes the top cap, the top cap is in be provided with on the sample places the district corresponding position and steps up the thing for the restriction sample that awaits measuring is stabilized in the sample places the district.

Further, the base comprises a fixing plate for fixing the PCB test circuit board and a shell for fixing the elastic piece.

The beneficial effects of the utility model reside in that:

because the ageing anchor clamps of tantalum electric capacity of this application adopt the centre gripping subassembly, this centre gripping subassembly is equipped with two clamp plates and the elastic component of setting between clamp plate and base that form the district of placing that the sample that awaits measuring placed, so, when the sample that awaits measuring is placed the district at the sample, the clamp plate atress is forced to the volume of sample, impel the elastic component compression, and then make the sample place the district and enlarge, thereby can make the ageing anchor clamps of this tantalum electric capacity can be suitable for the sample that awaits measuring of different size models, and the universality is increased, and the test cost is reduced.

In addition, a plurality of pairs of clamping assemblies are arranged, so that the tantalum capacitor aging clamp can be used for testing in large batch, and the detection efficiency is improved. Additionally, the utility model discloses simple structure, the sample clamping is convenient, and positioning accuracy is high, and it is also more convenient to use.

The above description is only an overview of the technical solution of the present invention, and in order to make the technical means of the present invention more clear and can be implemented according to the content of the description, a preferred embodiment of the present invention will be described in detail below with reference to the accompanying drawings.

Drawings

Fig. 1 shows a design of the aging fixture for tantalum capacitors of the present invention.

Fig. 2 shows another embodiment of the tantalum capacitor aging clamp of the present invention.

Illustration of the drawings:

1. a base; 2. a clamping assembly; 3. a metal conducting strip.

Detailed Description

The following detailed description of the embodiments of the present invention is provided with reference to the accompanying drawings and examples. The following examples are intended to illustrate the invention, but are not intended to limit the scope of the invention.

Referring to fig. 1, a tantalum capacitor aging fixture according to a preferred embodiment (embodiment one) of the present invention includes: the PCB testing device comprises a base 1, a PCB testing circuit board arranged on the base, a metal conducting strip 3 arranged on the PCB testing circuit board and a clamping assembly 2 arranged on the metal conducting strip.

The base 1 includes a fixing plate for fixing the PCB test circuit board and a housing for fixing the elastic member. In this embodiment, the housing is box-shaped, but in other embodiments, the housing may also be in other shapes, specifically, according to actual situations, and is not limited herein.

The clamping assembly 2 is arranged above the PCB test circuit board to reduce the width of the clamp. The clamping assembly 2 includes two pressing plates 21 and two elastic members 22 disposed oppositely. The elastic member 22 and the pressing plate 21 are arranged in a one-to-one manner, that is: one end of each elastic member 22 is connected to the base 1, and the other end is connected to the pressing plate 21. The pressing plate 21 and the elastic member 22 form a T shape, and the pressing plate 21 is used for pressing the sample to be tested. A sample placing area for placing a sample to be tested is formed between the two oppositely arranged press plates 21, and after the sample to be tested is placed in the sample placing area, the press plates 21 are stressed to cause the elastic members 22 to compress, so that the press plates 21 move along the lengthwise direction of the elastic members 22.

In order to improve the detection efficiency, the clamping assemblies 2 are arranged symmetrically and parallelly, and the metal conducting strips 3 correspond to the clamping assemblies 2 one to one.

The metal conductive sheet 3 is disposed above the base 1. The metallic conductive sheet 3 is disposed in the sample placement area to be electrically connected to a sample to be measured. Specifically, the metal conducting strip 3 is formed on the plate body in an electroplating mode, and the plate body is located between the PCB testing circuit board and the clamping assembly 2. Each conducting metal sheet 3 is arranged corresponding to one elastic member 22 and extends along the longitudinal direction of the elastic member, and the outer edge of the conducting metal sheet 3 is larger than the outer edge of the clamping assembly 2.

The tantalum capacitor aging clamp also comprises a top cover. The top cap is provided with convex clamping object on the position central line that the district corresponds is placed to the sample, places the district when the sample and puts into the sample that awaits measuring after, clamping object from the top cooperation two clamp plates 21 clamping sample that awaits measuring, makes it fix in the sample and places the district, the unstable condition of centre gripping can not appear.

The working principle is as follows: when a sample to be tested is placed on the sample placing area, the pressure plate 21 is stressed to horizontally move along the stress direction due to the volume of the sample, the elastic part 22 is enabled to be compressed, the metal conducting strip 3 below the sample is contacted with an antenna of the sample to be tested, and an electric signal is transmitted to the PCB test circuit board for testing the aging performance of the sample to be tested. Because the centre gripping subassembly 2 is mobile for the sample that awaits measuring of not unidimensional model can detect simultaneously, and the commonality of anchor clamps promotes greatly, and the test cost is showing and is reducing, reaches this utility model's purpose.

Referring to fig. 2, the tantalum capacitor aging fixture according to another preferred embodiment (embodiment two) of the present invention is similar to the tantalum capacitor aging fixture of embodiment one, and the difference is: each pair of clamping assemblies 2 is provided with two pressure plates 21 and one elastic element 22, in particular: each pair of clamping components 2 comprises two opposite pressing plates 21, one of the two pressing plates 21 is fixed on the shell, the other pressing plate is connected with an elastic part 22, the elastic part 22 is fixed on the shell, and the pressing plates 21 are used for abutting against a sample to be tested. A sample placing area for placing a sample to be tested is formed between the two oppositely arranged pressing plates 21, and after the sample to be tested is placed in the sample placing area, the pressing plates 21 are stressed to cause the elastic members 22 to be compressed, so that the pressing plates 21 move along the longitudinal direction of the elastic members 22.

The technical features of the above embodiments can be arbitrarily combined, and for the sake of brevity, all possible combinations of the technical features in the above embodiments are not described, but should be considered as the scope of the present specification as long as there is no contradiction between the combinations of the technical features.

The above embodiments only represent one embodiment of the present invention, and the description thereof is more specific and detailed, but not to be construed as limiting the scope of the invention. It should be noted that, for those skilled in the art, without departing from the spirit of the present invention, several variations and modifications can be made, which are within the scope of the present invention. Therefore, the protection scope of the present invention should be subject to the appended claims.

Claims

1. A tantalum capacitor aging clamp, comprising:

a base (1);

the PCB test circuit board is arranged on the base (1);

the metal conducting plate (3) is electrically connected with the PCB test circuit board and arranged on the base (1);

the clamping assembly (2) is arranged on the base (1); wherein the content of the first and second substances,

the clamping assembly (2) comprises two opposite pressing plates (21) and an elastic part (22) connected with at least one of the pressing plates (21) and the base (1), a sample placing area for placing a sample to be tested is formed between the two opposite pressing plates (21), and after the pressing plates (21) are stressed, the elastic part (22) compresses to enable the pressing plates (21) to move along the longitudinal direction of the elastic part (22);

the metal conducting strip (3) is arranged in the sample placing area or on one side of the sample placing area so as to be electrically connected with a sample to be detected.

2. The tantalum capacitor aging jig as claimed in claim 1, wherein the number of the elastic members (22) is two, and the elastic members (22) are arranged in one-to-one correspondence with the pressure plates (21); one end of each elastic piece (22) is connected with the base (1), and the other end of each elastic piece is connected with the pressing plate (21).

3. The tantalum capacitor aging jig as claimed in claim 1, wherein the holding members (2) are provided in a plurality of pairs, the plurality of pairs of holding members (2) are arranged in parallel, and the metal conductive sheets (3) correspond to the holding members (2) one by one.

4. The tantalum capacitance burn-in clip of claim 1, wherein the clip assembly (2) is disposed over the PCB test circuit board.

5. The tantalum capacitor aging jig as claimed in claim 1 or 4, wherein the conductive metal sheet (3) is formed by electroplating on a board body located between the PCB test board and the clamping assembly (2).

6. The tantalum capacitor aging jig as claimed in claim 5, wherein each of said conductive metal sheets (3) is disposed corresponding to one of said elastic members (22) and extends in a longitudinal direction of said elastic member (22).

7. The tantalum capacitor aging fixture of claim 1, further comprising a top cover, wherein the top cover is provided with a fastener at a position corresponding to the sample placement area for fixing the sample to be tested to be stable in the sample placement area.

8. The tantalum capacitor aging jig according to claim 1, wherein the base (1) comprises a fixing plate for fixing the PCB test circuit board and a housing for fixing the elastic member.