CN216285567U - Test system suitable for laser diode polarization characteristic - Google Patents
Test system suitable for laser diode polarization characteristic Download PDFInfo
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- CN216285567U CN216285567U CN202121521889.XU CN202121521889U CN216285567U CN 216285567 U CN216285567 U CN 216285567U CN 202121521889 U CN202121521889 U CN 202121521889U CN 216285567 U CN216285567 U CN 216285567U
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Abstract
The utility model provides a test system suitable for the polarization characteristics of a laser diode, which can nondestructively and accurately test the polarization ratio of the TO-can packaged laser diode and has the advantages of simple operation, low cost and the like. The laser diode is inserted and installed in the test socket, and the test socket is connected with the current driver; a collimating lens is arranged on the front side of the laser diode and is arranged on the five-dimensional adjusting frame assembly through a hollow adapter sleeve; the front side of the collimating lens is provided with a Taylor Glan prism which is arranged on the two-dimensional adjusting frame; the front side of the Taylor Glan prism is provided with a power meter, and laser beams can penetrate through the collimating lens and the Taylor Glan prism from the laser diode and then enter the power meter.
Description
Technical Field
The utility model belongs to the field of laser diodes, and particularly relates to a test system suitable for the polarization characteristics of a laser diode.
Background
Laser diodes packaged in low power (less than several hundred mW) TO-can are widely used in the fields of industrial and medical inspection, etc. due TO their many advantages such as small size, long life, efficiency, etc. The TO-can packaging process and quality has a significant impact on the laser diode, the packaging quality is not too critical, and the laser diode performance deteriorates, such as polarization characteristics, wavelength, power, and the like. In the common application of the laser diode, part of laser beams are collected through an optical element, the collected laser beams are converted into currents, and the currents are compared with reference values in a feedback circuit, so that the automatic feedback control of the output power of the laser diode is realized. In the application, the polarization characteristic of the laser diode has an important influence on the stability of the collected power, and further influences the long-term stability of the laser module. Therefore, it is important TO test the polarization characteristics of the TO-can packaged laser diode.
However, the existing polarization characteristic testing system is often complex in structure and operation, high in cost, and can generate some errors to adversely affect the testing accuracy.
Disclosure of Invention
In order TO solve the above problems, the present invention provides a system for testing polarization characteristics of a laser diode, which can precisely test the polarization ratio of a TO-can packaged laser diode without damage, and has the advantages of simple operation, low cost, etc.
In order to achieve the purpose, the utility model is realized by the following technical scheme:
a test system suitable for laser diode polarization characteristic, it includes the test socket, characterized by: the laser diode is inserted and installed in the test socket, and the test socket is connected with the current driver; a collimating lens is arranged on the front side of the laser diode and is mounted on the five-dimensional adjusting frame assembly through a hollow adapter sleeve; the front side of the collimating lens is provided with a Taylor Glan prism which is arranged on the two-dimensional adjusting frame; the front side of the Taylor Glan prism is provided with a power meter, and laser beams can penetrate through the collimating lens and the Taylor Glan prism from the laser diode and then enter the power meter.
It is further characterized in that:
the test socket is inserted into a first jack formed in the front side face of the first flexible seat, a first cap-mounted hexagon socket screw penetrates through a first gap formed in the side face of the first jack from the top face of the first flexible seat, and is screwed on the bottom face of the first flexible seat, so that the test socket is fixed in the first jack; the first flexible base is arranged above the bottom surface of the second flexible base, when a pin of the laser diode is inserted into a pinhole of the test jack, a tube body of the laser diode is inserted into a second jack formed in the front side surface of the second flexible base, a second cap-mounted hexagon socket head screw penetrates through a second gap formed in the side surface of the second jack from the top surface of the second flexible base, and is screwed on the bottom surface of the second flexible base, so that the test socket is fixed in the second jack; the second flexible seat is fixed on the top surface of the heat sink plate by taking the positioning step at the top of the heat sink plate as a reference;
the bottom surface of the heat sink plate is arranged on the top surface of a first workpiece seat, the first workpiece seat is arranged on a horizontal workbench, a semiconductor refrigerating piece is arranged between the heat sink plate and the first workpiece seat and is connected with a temperature control module, so that the laser diode is prevented from being damaged or damaged due to heat accumulation in the testing process, and the stable output of power is kept;
a C-shaped front convex step ring is arranged at the front end of the top of the second flexible seat, so that dust is prevented from falling onto a glass window mirror of the laser diode;
the five-dimensional adjusting frame is formed by fixing a four-dimensional adjusting frame on a one-dimensional dovetail table, and the five-dimensional adjusting frame is adjusted to drive the collimating lens to move in five directions such as up and down, left and right, front and back, pitching, deflection and the like, so that the relative position of the collimating lens and the laser diode is adjusted, and the collimation effect of the laser beam of the laser diode is controlled and ensured;
the collimating lens is a plano-convex spherical or aspheric lens packaged by a stainless steel shell;
the two-dimensional adjusting frame is arranged on a second workpiece seat, the second workpiece seat is arranged on a horizontal workbench, a 360-degree angle reticle is arranged on the end face of the two-dimensional adjusting frame, the two-dimensional adjusting frame drives the angle adjustment of the Thegglan prism around the optical axis, and the fine adjustment is carried out in the pitching and the deflection directions;
the Taylorgram prism is inclined at a certain angle relative to the light transmission direction, usually less than 8 degrees, so as to prevent the incident surface of the Taylorgram prism from reflecting the reflected light and returning to the laser diode;
the Taylor Glan prism is provided with a cylinder packaged by a metal shell, two prisms made of the same birefringent crystal material are arranged inside the Taylor Glan prism, and an air gap structure is adopted in the middle of the Taylor Glan prism, so that the problems caused by the denaturation of glue in the conventional cemented prism, such as the absorption of laser beams of P light and S light in different degrees, are avoided.
The utility model has the beneficial effects that: the relative position of the collimating lens and the laser diode is adjusted through the five-dimensional adjusting frame, the position of the Tager-lan prism is adjusted through the two-dimensional adjusting frame, the laser beam collimating effect of the laser diode is guaranteed, the laser beam can penetrate through the Tager-lan prism without being shielded and is incident on the power meter, the power testing accuracy is guaranteed, the polarization ratio of the TO-can packaged laser diode can be accurately tested without damage, and the testing device has the advantages of being simple in operation, low in cost and the like.
Drawings
FIG. 1 is a schematic diagram of a testing system for polarization characteristics of a laser diode;
FIG. 2 is a schematic view of a fixture seat assembly of a laser diode according to an embodiment of the present invention;
FIG. 3 is an exploded view of a five-dimensional adjustable mount in an embodiment of the present invention;
FIG. 4 is a schematic view of a five-dimensional adjustable mount in an embodiment of the sub-utility model;
FIG. 5 is a schematic diagram of a testing system for polarization characteristics of a laser diode;
in the figure: 1-a horizontal workbench; 2-a laser diode; 3, testing the socket; 4-a second flexible mount; 41-second cap hexagon socket head cap screw; 42-C shaped front boss step ring; 5-a first flexible mount; 51-first cap socket head cap screw; 6-heat sinking the board; 61-positioning steps; 7-a first workpiece seat; 8-semiconductor refrigerating sheet; 9-a current driver; 10-a temperature controller; 11-five-dimensional adjusting frame; 111-a collimating lens; 112-an adapter sleeve; 113-a four-dimensional adjusting frame; 114-one-dimensional dovetail stage; 15-two-dimensional adjusting frame; 16-a tegaserod prism; 17-a second workpiece holder; 18-a power meter; 19-third workpiece seat.
Detailed Description
For the purpose of enhancing the understanding of the present invention, the present invention will be described in further detail with reference to the accompanying drawings and examples, which are provided for the purpose of illustration only and are not intended to limit the scope of the present invention.
A test system suitable for the polarization characteristic of a laser diode comprises a test socket 3, the laser diode 2 is inserted and installed in the test socket 3, and the test socket 3 is connected with a current driver 9; a collimating lens 111 is arranged on the front side of the laser diode 2, and the collimating lens 111 is mounted on the five-dimensional adjusting frame 11 assembly through a hollow adapter sleeve 112; a Taylor Glan prism 16 is arranged on the front side of the collimating lens 111, and the Taylor Glan prism 16 is arranged on the two-dimensional adjusting frame 15; a power meter 18 is provided on the front side of the taylor glan prism 16, the power meter 18 is mounted on the third workpiece stage 19, and the laser beam can be made to pass through the collimator lens 111 and the taylor glan prism 16 from the laser diode 2 and then enter the power meter 18. The utility model has the beneficial effects that: the relative position of the collimating lens 111 and the laser diode 2 is adjusted through the five-dimensional adjusting frame 11, the position of the Tager-Glan prism 16 is adjusted through the two-dimensional adjusting frame 15, the laser beam collimating effect of the laser diode 2 is guaranteed, the laser beam can be enabled TO penetrate through the Tager-Glan prism 16 without being shielded and TO be incident on the power meter 18, the power testing accuracy is guaranteed, the polarization ratio of the TO-can packaged laser diode 2 can be accurately tested without damage, and the testing device has the advantages of being simple in operation, low in cost and the like.
The test socket 3 is inserted into a first jack formed on the front side surface of the first flexible seat 5, a first capped hexagon socket screw 51 passes through a first gap formed on the side surface of the first jack from the top surface of the first flexible seat 5, is screwed on the bottom surface of the first flexible seat 5, and the test socket 3 is fixed in the first jack; the first flexible base 5 is arranged above the bottom surface of the second flexible base 4, when a pin of the laser diode 2 is inserted into a pinhole of the test jack, a tube body of the laser diode 2 is inserted into a second jack formed on the front side surface of the second flexible base 4, a second cap-mounted hexagon socket head cap screw 41 passes through a second gap formed on the side surface of the second jack from the top surface of the second flexible base 4, is screwed on the bottom surface of the second flexible base 4, and fixes the test socket 3 in the second jack; the second flexible mount 4 is fixed to the top surface of the heat sink plate 6 with reference to the positioning step 61 on the top of the heat sink plate 6.
The bottom surface of the heat sink plate 6 is arranged on the top surface of the first workpiece seat 7, the first workpiece seat 7 is arranged on the horizontal workbench 1, the semiconductor refrigerating piece 8 is arranged between the heat sink plate 6 and the first workpiece seat 7, the semiconductor refrigerating piece 8 is connected with the temperature control module 10, the laser diode 2 is prevented from being damaged or damaged due to heat accumulation in the testing process, and stable power output is kept. The front end of the top of the second flexible seat 4 is provided with a C-shaped front boss step ring 42 to prevent dust from falling onto the glass window mirror of the laser diode 2. The five-dimensional adjusting frame 11 is formed by fixing a four-dimensional adjusting frame 113 on a one-dimensional dovetail table 114, and the five-dimensional adjusting frame 11 is adjusted to drive the collimating lens 111 to move in five directions, such as up and down, left and right, front and back, pitching, yawing and the like, so that the relative position of the collimating lens 111 and the laser diode 2 is adjusted, and the collimation effect of the laser beam of the laser diode 2 is controlled and ensured. The collimating lens 111 is a plano-convex spherical or aspherical lens with a stainless steel housing package.
The two-dimensional adjusting frame 15 is arranged on the second workpiece seat 17, the second workpiece seat 17 is arranged on the horizontal workbench 1, the end face of the two-dimensional adjusting frame 15 is provided with a 360-degree angle reticle, the two-dimensional adjusting frame 15 drives the Teger prism 16 to adjust the angle around the optical axis, and the micro-adjustment is carried out in the pitching and the deflection directions. The taylorgram prism 16 is inclined at an angle, typically less than 8 °, to the direction of light transmission to prevent the incident surface of the taylorgram prism 16 from reflecting light back into the laser diode 2. The Taylor Glan prism 16 is provided with a cylinder packaged by a metal shell, two prisms 16 made of the same birefringent crystal material are arranged inside the Taylor Glan prism, and an air gap structure is adopted in the middle of the Taylor Glan prism, so that the problems caused by the denaturation of glue in the conventional cemented prism 16, such as the absorption of P light laser beams and S light laser beams in different degrees, are avoided.
Claims (9)
1. A test system suitable for laser diode polarization characteristic, it includes the test socket, characterized by: the laser diode is inserted and installed in the test socket, and the test socket is connected with the current driver; a collimating lens is arranged on the front side of the laser diode and is mounted on the five-dimensional adjusting frame assembly through a hollow adapter sleeve; the front side of the collimating lens is provided with a Taylor Glan prism which is arranged on the two-dimensional adjusting frame; the front side of the Taylor Glan prism is provided with a power meter, and laser beams can penetrate through the collimating lens and the Taylor Glan prism from the laser diode and then enter the power meter.
2. The system for testing polarization characteristics of a laser diode according to claim 1, wherein: the test socket is inserted into a first jack formed in the front side face of the first flexible seat, a first cap-mounted hexagon socket screw penetrates through a first gap formed in the side face of the first jack from the top face of the first flexible seat, and is screwed on the bottom face of the first flexible seat, so that the test socket is fixed in the first jack; the first flexible base is arranged above the bottom surface of the second flexible base, when a pin of the laser diode is inserted into a pin hole of the test jack, a tube body of the laser diode is inserted into a second jack formed in the front side surface of the second flexible base, a second cap-mounted hexagon socket head screw penetrates through a second gap formed in the side surface of the second jack from the top surface of the second flexible base, is screwed on the bottom surface of the second flexible base, and fixes the test socket in the second jack; the second flexible seat is fixed on the top surface of the heat sink plate by taking the positioning step on the top of the heat sink plate as a reference.
3. The system for testing polarization characteristics of a laser diode according to claim 2, wherein: the bottom surface of the heat sink plate is arranged on the top surface of a first workpiece seat, the first workpiece seat is arranged on a horizontal workbench, and a semiconductor refrigerating piece is arranged between the heat sink plate and the first workpiece seat and connected with a temperature control module.
4. The system for testing polarization characteristics of a laser diode according to claim 3, wherein: and a C-shaped front convex step ring is arranged at the front end of the top of the second flexible seat, so that dust is prevented from falling onto the glass window mirror of the laser diode.
5. The system for testing polarization characteristics of a laser diode according to claim 4, wherein: the five-dimensional adjusting frame is formed by fixing a four-dimensional adjusting frame on a one-dimensional dovetail table, and the five-dimensional adjusting frame is adjusted to drive the collimating lens to move in five directions of up-down, left-right, front-back, pitching and yawing, so that the relative position of the collimating lens and the laser diode is adjusted, and the collimation effect of the laser beam of the laser diode is controlled and ensured.
6. The system for testing polarization characteristics of a laser diode according to claim 5, wherein: the collimating lens is a plano-convex spherical or aspheric lens packaged by a stainless steel shell.
7. The system for testing polarization characteristics of a laser diode according to claim 6, wherein: the two-dimensional adjusting frame is arranged on a second workpiece seat, the second workpiece seat is arranged on a horizontal workbench, the end face of the two-dimensional adjusting frame is provided with 360-degree angle scribing lines, and the two-dimensional adjusting frame drives the Tecagran prism to adjust angles around an optical axis and finely adjust in pitching and yawing directions.
8. The system for testing polarization characteristics of a laser diode according to claim 7, wherein: the Taylor Glan prism inclines a certain angle relative to the light transmission direction, and the angle is less than 8 degrees, so that the original path of reflected light reflected by the incident surface of the Taylor Glan prism is prevented from returning into the laser diode.
9. The system for testing polarization characteristics of a laser diode according to claim 8, wherein: the Taylor Glan prism is provided with a cylinder packaged by a metal shell, two pieces of prisms made of the same birefringent crystal material are arranged inside the Taylor Glan prism, and an air gap structure is adopted in the middle of the Taylor Glan prism.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202121521889.XU CN216285567U (en) | 2021-07-06 | 2021-07-06 | Test system suitable for laser diode polarization characteristic |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202121521889.XU CN216285567U (en) | 2021-07-06 | 2021-07-06 | Test system suitable for laser diode polarization characteristic |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN216285567U true CN216285567U (en) | 2022-04-12 |
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Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202121521889.XU Active CN216285567U (en) | 2021-07-06 | 2021-07-06 | Test system suitable for laser diode polarization characteristic |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN216285567U (en) |
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2021
- 2021-07-06 CN CN202121521889.XU patent/CN216285567U/en active Active
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