CN216250667U - A variable interval basket of flowers for crystal silicon battery reliability test - Google Patents

A variable interval basket of flowers for crystal silicon battery reliability test Download PDF

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Publication number
CN216250667U
CN216250667U CN202122878522.XU CN202122878522U CN216250667U CN 216250667 U CN216250667 U CN 216250667U CN 202122878522 U CN202122878522 U CN 202122878522U CN 216250667 U CN216250667 U CN 216250667U
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flower basket
side plate
plate
variable
silicon wafer
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CN202122878522.XU
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卢春晖
崔会旺
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Wuxi Dike Electronic Mat Co ltd
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Wuxi Dike Electronic Mat Co ltd
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    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02PCLIMATE CHANGE MITIGATION TECHNOLOGIES IN THE PRODUCTION OR PROCESSING OF GOODS
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Abstract

The utility model provides a variable-spacing flower basket for testing the reliability of a crystalline silicon battery, which comprises a longitudinal flower basket side plate, a transverse flower basket side plate, a bottom overflow plate, a fixing bolt and an adjustable silicon wafer backup plate assembly, wherein the transverse flower basket side plate is transversely fixed at the middle positions of the front part and the rear part of the longitudinal flower basket side plate and the longitudinal flower basket side plate through the fixing bolt; the bottom overflow plate is fixed at the lower part of the longitudinal side plate of the flower basket through a fixing bolt; the left side and the right side of the upper part of the longitudinal side plate of the flower basket are provided with hook lifting holes. According to the utility model, the arrangement of the PVDF rectangular plate is adopted for the longitudinal side plate, the transverse side plate, the bottom overflow plate and the fixing bolt of the flower basket respectively, so that acid-base resistance and corrosion resistance are facilitated, the arrangement of the RFID identification card is installed, and the identification and reading are convenient; according to the difference of the width or the length of the crystal silicon wafer, the position of the support backup plate main body is changed, and the position of the separating rod is changed, so that the crystal silicon wafer is supported, and the crystal silicon wafer is prevented from falling or falling.

Description

A variable interval basket of flowers for crystal silicon battery reliability test
Technical Field
The utility model belongs to the technical field of crystalline silicon battery preparation equipment, and particularly relates to a variable-pitch flower basket for testing the reliability of crystalline silicon batteries.
Background
The solar cell includes monocrystalline silicon solar cell and polycrystalline silicon solar cell, and photovoltaic power generation is a technology for directly converting light energy into electric energy by utilizing photovoltaic effect of semiconductor interface. The key element of the technology is a solar cell, and solar power generation is divided into photo-thermal power generation and photovoltaic power generation. Solar power generation is generally referred to as solar photovoltaic power generation, referred to as "photovoltaic". Photovoltaic power generation is a technology of directly converting light energy into electric energy by using the photovoltaic effect of a semiconductor interface. A key element of this technology is the solar cell. The solar cells are connected in series and then are packaged and protected to form a large-area solar cell module, and then the photovoltaic power generation device is formed by matching with components such as a power controller and the like.
Since contamination of the silicon wafer causes texturing contamination and decreases the photoelectric conversion efficiency, the silicon wafer must be strictly cleaned in the production of solar cell devices. In the prior art, the silicon wafers are usually cleaned by inserting them into a deformation-resistant, chemical-resistant basket which is capable of uniformly separating the individual silicon wafers for cleaning. In order to improve the cost performance of the silicon solar cell, the efficiency of the cell is generally increased by increasing the area of the silicon wafer at the present stage.
In addition, the utility model is named as a silicon wafer basket convenient for checking silicon wafers by the Chinese patent publication No. CN206480607U, the basket comprises an object placing frame which is formed by an upper bottom plate, a lower bottom plate, a left side plate and a right side plate which are arranged on two sides of the upper bottom plate and the lower bottom plate in a surrounding mode, the basket further comprises an auxiliary plug-in which is convenient for ejecting the silicon wafers, the auxiliary plug-in comprises a bottom plate and a vertical plate which is vertically arranged on the bottom plate, and the top surface of the vertical plate is an inclined surface. However, the conventional basket for testing the reliability of the crystalline silicon battery also has the problems that the basket is inconvenient to adjust and adapt according to different sizes of the tested crystalline silicon battery pieces, and the application range is limited, so that the production cost is high.
Therefore, the utility model is necessary to invent a variable-pitch flower basket for testing the reliability of the crystalline silicon battery.
SUMMERY OF THE UTILITY MODEL
In order to solve the technical problems, the utility model provides a variable-pitch flower basket for testing the reliability of a crystalline silicon battery, so as to solve the problems that the existing flower basket for testing the reliability of the crystalline silicon battery is inconvenient to adjust and apply according to different sizes of tested crystalline silicon battery pieces, the application range is limited, and the production cost is high.
A variable-spacing flower basket for testing the reliability of a crystalline silicon battery comprises a flower basket longitudinal side plate, a flower basket transverse side plate, a bottom overflow plate, a fixing bolt and an adjustable silicon wafer backup plate assembly, wherein the flower basket transverse side plate is transversely fixed at the middle positions of the front part and the rear part of the flower basket longitudinal side plate and the flower basket longitudinal side plate through the fixing bolt; the bottom overflow plate is fixed at the lower part of the longitudinal side plate of the flower basket through a fixing bolt; the left side and the right side of the upper part of the longitudinal side plate of the flower basket are provided with hook lifting holes; the hook lifting hole is a circular through hole with the diameter of three to five millimeters; a silicon chip clamping groove is longitudinally formed in the longitudinal side plate of the flower basket; the width of the silicon chip clamping groove is set to be two millimeters to four millimeters; the adjustable silicon wafer backup plate assembly is clamped at the upper position between the transverse side plate of the flower basket and the transverse side plate of the flower basket.
Preferably, side overflow holes are formed in the upper side and the lower side of the front portion of the transverse side plate of the flower basket, and an RFID identification card is connected to the middle position of the front portion of the transverse side plate of the flower basket through screws.
Preferably, the bottom overflow plate is transversely provided with a bottom overflow port in the inner part, and the bottom overflow plate is longitudinally provided with an adjusting bolt groove in the inner part.
Preferably, the bottom overflow port is a rectangular through hole; the adjusting bolt groove is a strip-shaped through hole with an arc-shaped top end.
Preferably, the longitudinal side plate of the flower basket, the transverse side plate of the flower basket, the bottom overflow plate and the fixing bolts are rectangular plates made of PVDF respectively.
Preferably, the adjustable silicon wafer backup plate assembly comprises a supporting backup plate main body, lifting grooves, fixing jacks, separating rods, connecting clamping grooves and clamping screws, wherein the lifting grooves are formed in the middle of the upper portion of the supporting backup plate main body respectively; the fixed jack is arranged at the lower part of the support backup plate main body; the separating rod is inserted in the fixed insertion hole; the connecting clamping grooves are respectively and integrally formed at the left part and the right part of the main body of the supporting backup plate; the clamping screws are respectively in threaded connection with the left side and the right side of the supporting backup plate main body and penetrate through the connecting clamping grooves.
Preferably, the side overflow holes are respectively arranged in a front-back and left-right symmetrical manner.
Preferably, the lifting groove is a semi-arc groove.
Preferably, the fixed insertion holes are provided in plurality.
Compared with the prior art, the utility model has the beneficial effects that:
the arrangement of the PVDF rectangular plates is adopted for the longitudinal side plate, the transverse side plate, the bottom overflow plate and the fixing bolt of the flower basket, so that acid and alkali resistance and corrosion resistance are facilitated, the flower basket can be used at the temperature of-40-150 ℃, and the RFID identification card is arranged, so that information can be recorded and stored for a long-time experiment test, and the subsequent identification and reading are facilitated;
according to the difference of the width or the length of the crystal silicon wafer, the position of the support backup plate main body is changed, and the position of the separation rod can be changed, so that the crystal silicon wafer is supported, and the crystal silicon wafer is prevented from falling or tilting.
Drawings
Fig. 1 is a schematic structural view of the present invention.
Fig. 2 is a schematic view of the internal structure of the longitudinal side plate of the flower basket of the present invention.
Fig. 3 is a schematic top view of the bottom overflow plate of the present invention.
FIG. 4 is a schematic structural diagram of an adjustable silicon wafer backup plate assembly according to the present invention.
In the figure:
1. longitudinal side plates of the flower basket; 11. a hook lifting hole; 12. a silicon wafer clamping groove; 2. a transverse side plate of the flower basket; 21. a lateral overflow hole; 22. an RFID identification card; 3. a bottom overflow plate; 31. a bottom overflow; 32. adjusting the bolt slot; 4. fixing the bolt; 5. the adjustable silicon wafer backup plate component; 51. supporting the backup plate main body; 52. lifting the groove; 53. fixing the jack; 54. a separating rod; 55. a connecting clamping groove; 56. and clamping the screw.
Detailed Description
The utility model is further described below with reference to the accompanying drawings:
example (b):
as shown in the attached drawings 1 to 3, the utility model provides a variable-interval flower basket for testing the reliability of a crystalline silicon battery, which comprises a flower basket longitudinal side plate 1, a flower basket transverse side plate 2, a bottom overflow plate 3, a fixing bolt 4 and an adjustable silicon wafer backup plate assembly 5, wherein the flower basket transverse side plate 2 is transversely fixed at the middle positions of the front part and the rear part of the flower basket longitudinal side plate 1 and the flower basket longitudinal side plate 1 through the fixing bolt 4; the bottom overflow plate 3 is fixed at the lower position of the longitudinal side plate 1 of the flower basket through a fixing bolt 4; the left side and the right side of the upper part of the longitudinal side plate 1 of the flower basket are provided with hook lifting holes 11; the hook lifting hole 11 is a circular through hole with the diameter of three to five millimeters; a silicon chip clamping groove 12 is longitudinally formed in the flower basket longitudinal side plate 1; the width of the silicon wafer clamping groove 12 is set to be two millimeters to four millimeters; the adjustable silicon wafer backup plate component 5 is clamped at the upper position between the horizontal side plate 2 of the flower basket and the horizontal side plate 2 of the flower basket.
In the above embodiment, specifically, the upper and lower sides of the front portion of the horizontal side plate 2 of the flower basket are provided with side overflow holes 21, and the middle position of the front portion of the horizontal side plate 2 of the flower basket is connected with an RFID identification card 22 by a screw.
In the above embodiment, specifically, the bottom overflow plate 3 has a bottom overflow port 31 formed on its inner side, and the bottom overflow plate 3 has an adjusting bolt slot 32 formed in its inner side in the longitudinal direction.
In the above embodiment, specifically, the bottom overflow port 31 is a rectangular through hole; the adjusting bolt groove 32 is a strip-shaped through hole with an arc-shaped top end.
In the above embodiment, specifically, the longitudinal side plate 1 of the flower basket, the transverse side plate 2 of the flower basket, the bottom overflow plate 3 and the fixing bolts 4 are rectangular plates of PVDF respectively.
As shown in fig. 4, in the above embodiment, specifically, the adjustable silicon wafer backup plate assembly 5 includes a supporting backup plate main body 51, pulling grooves 52, fixing insertion holes 53, separating rods 54, connecting clamping grooves 55 and clamping screws 56, where the pulling grooves 52 are respectively opened at the middle position of the upper part of the supporting backup plate main body 51; the fixed insertion hole 53 is arranged at the lower part of the support backup plate main body 51; the separating rod 54 is inserted in the fixing insertion hole 53; the connecting clamping grooves 55 are respectively and integrally formed at the left part and the right part of the supporting backup plate main body 51; the clamping screws 56 are respectively screwed on the left and right sides of the support backup plate main body 51 and penetrate into the connecting clamping grooves 55.
In the above embodiment, specifically, the side overflow holes 21 are symmetrically arranged in front and back and left and right.
In the above embodiment, specifically, the lifting groove 52 is an arc groove and a semi-arc groove.
In the above embodiment, specifically, the fixing insertion hole 53 is provided in plurality.
Principle of operation
When the silicon wafer clamping device is used, a silicon wafer needing side view is longitudinally clamped in the silicon wafer clamping groove 12 and is positioned at the upper part of the bottom overflow plate 3, the position of the support backup plate main body 51 is adjusted in a sliding mode on the upper edge of the transverse side plate 2 of the flower basket, and the clamping screw 56 is used for screwing and fixing the support backup plate main body 51 and the separating rod 54, so that the right side of the silicon wafer is supported and fixed, and the silicon wafer is prevented from falling off during testing;
the lifting hook hooks the hook lifting hole 11, the flower basket is immersed in the test liquid, and the water liquid is discharged through the bottom overflow port 31 and the side overflow hole 21 in the lifting process.
In the description of the present invention, it is to be understood that the terms "center", "longitudinal", "lateral", "length", "width", "thickness", "upper", "lower", "front", "rear", "left", "right", "vertical", "horizontal", "top", "bottom", "inner", "outer", "clockwise", "counterclockwise", and the like, indicate orientations and positional relationships based on those shown in the drawings, and are used only for convenience of description and simplicity of description, and do not indicate or imply that the equipment or element being referred to must have a particular orientation, be constructed and operated in a particular orientation, and thus, should not be considered as limiting the present invention.
Finally, it should be noted that: although the present invention has been described in detail with reference to the foregoing embodiments, it will be apparent to those skilled in the art that changes may be made in the embodiments and/or equivalents thereof without departing from the spirit and scope of the utility model. Any modification, equivalent replacement, or improvement made within the spirit and principle of the present invention should be included in the protection scope of the present invention.

Claims (9)

1. The variable-spacing flower basket for the reliability test of the crystalline silicon battery is characterized by comprising a longitudinal side plate (1) of the flower basket, a transverse side plate (2) of the flower basket, a bottom overflow plate (3), a fixing bolt (4) and an adjustable silicon wafer backup plate assembly (5); the transverse side plate (2) of the flower basket is transversely fixed at the middle positions of the front part and the rear part of the longitudinal side plate (1) of the flower basket and the longitudinal side plate (1) of the flower basket through fixing bolts (4); the bottom overflow plate (3) is fixed at the lower part of the longitudinal side plate (1) of the flower basket through a fixing bolt (4); the left side and the right side of the upper part of the longitudinal side plate (1) of the flower basket are provided with hook lifting holes (11); the hook lifting hole (11) is a circular through hole with the diameter of three to five millimeters; a silicon chip clamping groove (12) is longitudinally formed in the flower basket longitudinal side plate (1); the width of the silicon wafer clamping groove (12) is set to be two millimeters to four millimeters; the adjustable silicon wafer backup plate assembly (5) is clamped at the upper position between the horizontal side plate (2) of the flower basket and the horizontal side plate (2) of the flower basket.
2. The variable-pitch flower basket for the reliability test of the crystalline silicon battery as claimed in claim 1, wherein lateral overflow holes (21) are formed in the upper and lower sides of the front part of the transverse side plate (2) of the flower basket, and an RFID identification card (22) is screwed in the middle of the front part of the transverse side plate (2) of the flower basket.
3. The variable-pitch flower basket for the reliability test of the crystalline silicon battery as claimed in claim 1, wherein the bottom overflow plate (3) is transversely provided with a bottom overflow port (31) at the inner side, and the bottom overflow plate (3) is longitudinally provided with an adjusting bolt groove (32) at the inner side.
4. The variable-pitch flower basket for the reliability test of the crystalline silicon battery as claimed in claim 3, wherein the bottom overflow port (31) is a rectangular through hole; the adjusting bolt groove (32) is a strip-shaped through hole with an arc-shaped top end.
5. The variable-spacing flower basket for the reliability test of the crystalline silicon battery as claimed in claim 1, wherein the longitudinal side plates (1) of the flower basket, the transverse side plates (2) of the flower basket, the bottom overflow plate (3) and the fixing bolts (4) are rectangular plates of PVDF respectively.
6. The variable-pitch flower basket for the reliability test of the crystalline silicon battery as claimed in claim 1, wherein the adjustable silicon wafer backup plate assembly (5) comprises a support backup plate main body (51), lifting grooves (52), fixing insertion holes (53), separating rods (54), connecting clamping grooves (55) and clamping screws (56), wherein the lifting grooves (52) are respectively arranged at the middle positions of the upper part of the support backup plate main body (51); the fixed insertion hole (53) is arranged at the lower part of the support backup plate main body (51); the separating rod (54) is inserted in the fixing insertion hole (53); the connecting clamping grooves (55) are respectively and integrally formed at the left part and the right part of the support backup plate main body (51); the clamping screws (56) are respectively in threaded connection with the left side and the right side of the support backup plate main body (51) and penetrate into the connecting clamping grooves (55).
7. The variable-pitch flower basket for the reliability test of the crystalline silicon battery as claimed in claim 2, wherein the side overflow holes (21) are symmetrically arranged in front and rear and left and right directions, respectively.
8. The variable-pitch flower basket for the reliability test of the crystalline silicon battery as claimed in claim 6, wherein the lifting groove (52) is an arc-shaped groove and is a semi-arc-shaped groove.
9. The variable pitch flower basket for reliability tests of crystalline silicon cells as claimed in claim 6, wherein the fixing insertion holes (53) are provided in plurality.
CN202122878522.XU 2021-11-23 2021-11-23 A variable interval basket of flowers for crystal silicon battery reliability test Active CN216250667U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN202122878522.XU CN216250667U (en) 2021-11-23 2021-11-23 A variable interval basket of flowers for crystal silicon battery reliability test

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN202122878522.XU CN216250667U (en) 2021-11-23 2021-11-23 A variable interval basket of flowers for crystal silicon battery reliability test

Publications (1)

Publication Number Publication Date
CN216250667U true CN216250667U (en) 2022-04-08

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Family Applications (1)

Application Number Title Priority Date Filing Date
CN202122878522.XU Active CN216250667U (en) 2021-11-23 2021-11-23 A variable interval basket of flowers for crystal silicon battery reliability test

Country Status (1)

Country Link
CN (1) CN216250667U (en)

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Address after: No. 8 Yongsheng Road, Qiting Street, Yixing City, Wuxi City, Jiangsu Province, 214203

Patentee after: WUXI DIKE ELECTRONIC MAT Co.,Ltd.

Country or region after: China

Address before: 214200 building B2, phase II, entrepreneurship Park, No. 11, Yongning Road, Qiting street, Jiangyin City, Wuxi City, Jiangsu Province

Patentee before: WUXI DIKE ELECTRONIC MAT Co.,Ltd.

Country or region before: China

CP03 Change of name, title or address