CN211785693U

CN211785693U - Probe row suitable for large-size silicon wafer

Info

Publication number: CN211785693U
Application number: CN202020006463.XU
Authority: CN
Inventors: 仇慧生
Original assignee: Huansheng Photovoltaic Jiangsu Co Ltd
Current assignee: Huansheng Photovoltaic Jiangsu Co Ltd
Priority date: 2020-01-02
Filing date: 2020-01-02
Publication date: 2020-10-27
Anticipated expiration: 2030-01-02

Abstract

The utility model relates to the photovoltaic technical field and discloses a probe row suitable for large-size silicon chips, the probe row comprises a probe row support, wherein clamping grooves are formed in two sides of the interior of the probe row support, the two clamping grooves are symmetrically distributed, clamping racks are fixedly arranged on one side of the opposite surfaces of the inner walls of the two clamping grooves, the two clamping racks are symmetrically distributed, baffles are fixedly arranged on both sides of the clamping rack, three probe banks are fixedly arranged in the probe bank bracket, reinforcing rods are fixedly arranged at the upper ends of the three probe banks, a double-shaft screw sleeve is movably arranged in the middle position of the upper end of the reinforcing rod, a first telescopic threaded rod and a second telescopic threaded rod are respectively movably inserted into the two ends of the inner part of the double-shaft screw sleeve, and one end of the first telescopic threaded rod and one end of the second telescopic threaded rod which are separated from each other are both positioned at the outer side of the double-shaft thread sleeve. Through the setting of the clamping rack, the whole device has a good adjusting effect.

Description

Probe row suitable for large-size silicon wafer

Technical Field

The utility model relates to a photovoltaic technology field specifically is a probe row suitable for jumbo size silicon chip.

Background

The single crystal silicon solar cell is a solar cell which takes a high-purity single crystal silicon rod as a raw material and is developed fastest at present. The construction and production process of the product are established, and the product is widely used for space and ground. The photoelectric conversion efficiency of the monocrystalline silicon solar cell is about 15%, and the laboratory achievement is more than 20%.

At present, in the process of production of the monocrystalline silicon solar cell, the monocrystalline silicon solar cell needs to be detected, thereby a large probe row is designed aiming at the position of a main grid of a positive electrode on a cell slice, the requirement of testing at ordinary times is met, reinforcing ribs are added on a probe row support, the fracture condition in the using process is avoided, and the problem that the adjustment cannot be carried out according to the requirement of a user can be solved by fixing the probe row support on the surface of the support. To this end, we have designed a probe row.

SUMMERY OF THE UTILITY MODEL

The utility model provides a not enough to prior art, the utility model provides a probe row suitable for jumbo size silicon chip to thereby positive electrode main grid position design big probe row on the battery piece satisfies test demand at ordinary times, increases the strengthening rib on probe row support, avoids using the on-the-way fracture condition, fixes moreover according to on the support surface, can't carry out the problem of adjusting according to user's needs.

In order to achieve the above purpose, the utility model adopts the technical scheme that:

a probe row suitable for a large-size silicon wafer comprises a probe row support, wherein clamping grooves are formed in two sides of the interior of the probe row support, the two clamping grooves are symmetrically distributed, clamping racks are fixedly mounted on one side of each of opposite surfaces of the inner walls of the two clamping grooves, the two clamping racks are symmetrically distributed, baffles are fixedly mounted on two sides of each clamping rack, three probe rows are fixedly mounted in the interior of the probe row support, reinforcing rods are fixedly mounted at the upper ends of the three probe rows, a double-shaft screw sleeve is movably mounted at the middle position of the upper end of each reinforcing rod, a first telescopic threaded rod and a second telescopic threaded rod are movably inserted into two ends of the inner part of each double-shaft screw sleeve respectively, the separated ends of the first telescopic threaded rod and the second telescopic threaded rod are located on the outer sides of the double-shaft screw sleeves, mounting grooves are formed in the inner parts of two ends of the reinforcing rods, the mounting structure comprises a mounting groove and a reinforcing rod, and is characterized in that a clamping block is fixedly mounted inside the mounting groove, one end of the clamping block is located on the outer side of the reinforcing rod, a clamping tooth block is fixedly mounted at the end, the clamping tooth block is clamped with a clamping rack, a reset spring is fixedly mounted at the other end of the clamping block, one end of the reset spring is fixedly connected with the inner wall of the mounting groove, two sliding grooves are formed in two sides of the upper end of the reinforcing rod, a sliding plate is movably inserted in the middle of each sliding groove, the lower end of each sliding plate is fixedly connected with the upper end of the clamping block, and one side, opposite to each sliding plate, of each sliding plate is fixedly connected with one end, away from each other, of a.

Furthermore, the two sides of the upper end of the probe row support are both provided with sliding chutes, the two sliding chutes are positioned on one sides of the clamping rack and are symmetrical, and the lengths of the two sliding chutes are equal to the length of the clamping rack.

Furthermore, three clamping bolts are movably inserted into the two sliding grooves, and the lower ends of the clamping bolts are located in the clamping grooves and attached to the upper ends of the two sides of the reinforcing rod.

Furthermore, mounting blocks are fixedly mounted on two sides of the upper end of the reinforcing rod, and the double-shaft thread sleeves are movably inserted into the middle positions of the opposite surfaces of the two mounting blocks.

Furthermore, the first flexible threaded rod with the screw thread on second flexible threaded rod surface is reverse form, first flexible threaded rod with the length of second flexible threaded rod equals.

Furthermore, a rotating disc is fixedly installed at the middle position of the surface of the double-shaft thread sleeve, and rotating blocks are fixedly installed on the surface of the rotating disc.

The utility model has the advantages that:

1. the utility model, through the arrangement of the clamping rack, the whole device has good adjusting effect, the user uses the folk custom, the rotating block is rotated to drive the rotating disc to rotate, the rotating disc drives the double-shaft screw sleeve to rotate, so that the first telescopic threaded rod and the second telescopic threaded rod at two ends in the sliding groove are contracted, the first telescopic threaded rod and the second telescopic threaded rod drive the sliding plate to move in the sliding groove, the sliding plate moves to drive the clamping block to contract in the mounting groove, and the clamping tooth block at one end of the clamping block is separated from the clamping rack in the clamping groove, thereby facilitating the movement and fixation of the probe row at the lower end of the reinforcing rod in the probe row bracket and the adjustment of the whole device, after the position is determined, a user rotates the rotary disc reversely, so that the clamping tooth block is clamped with the clamping rack, and the reinforcing rod and the probe row are fixed conveniently.

2. The utility model discloses a, through the setting of spout, make the integrated device have fine fixed effect, the user slides the solid bolt of card in the inside of spout, the stiffener passes through the solid tooth piece of card and the solid rack joint of card after, the rotatory solid bolt of card of user, make the fixed laminating of upside at the lower extreme of the solid bolt of card and stiffener both ends, the probe row of being convenient for further fixed, under the effect of baffle, strengthened the joint between solid tooth piece of card and the solid rack of card, avoid it to break away from.

Drawings

Fig. 1 is a schematic structural view of the present invention;

FIG. 2 is an enlarged schematic view of the structure at A in FIG. 1;

FIG. 3 is a schematic side view of a probe row.

In the figure: 1. a probe row support; 2. a probe row; 3. a sliding plate; 4. a chute; 5. clamping and fixing the bolt; 6. a sliding groove; 7. A reinforcing bar; 8. a first telescopic threaded rod; 9. mounting blocks; 10. rotating the disc; 11. a double-shaft thread sleeve; 12. a second telescopic threaded rod; 13. rotating the block; 14. a clamping groove; 15. clamping and fixing the tooth block; 16. clamping and fixing the rack; 17. a baffle plate; 18. a clamping block; 19. mounting grooves; 20. a return spring.

Detailed Description

In order to make the objects, technical solutions and advantages of the embodiments of the present invention clearer, the embodiments of the present invention will be clearly and completely described below with reference to the accompanying drawings in the embodiments of the present invention, and it is obvious that the described embodiments are some, but not all, embodiments of the present invention. Based on the embodiments in the present invention, all other embodiments obtained by a person skilled in the art without creative efforts belong to the protection scope of the present invention.

Referring to FIGS. 1-3: a probe row suitable for a large-size silicon wafer comprises a probe row support 1, wherein clamping grooves 14 are formed in two sides of the interior of the probe row support 1, the clamping racks 16 are convenient to install and fix and limit a reinforcing rod 7, the two clamping grooves 14 are symmetrically distributed, the clamping racks 16 are fixedly installed on one sides of opposite surfaces of the inner walls of the two clamping grooves 14, the two clamping racks 16 are symmetrically distributed, the reinforcing rod 7 is convenient to clamp and limit, displacement is avoided, baffle plates 17 are fixedly installed on two sides of each clamping rack 16, a clamping tooth block 15 is prevented from being separated from each clamping rack 16, a limiting effect is provided, three probe rows 2 are fixedly installed in the interior of the probe row support 1, the reinforcing rods 7 are fixedly installed at the upper ends of the three probe rows 2, firmness of the probe rows 2 is enhanced, a double-shaft screw sleeve 11 is movably installed at the middle positions of the upper ends of the reinforcing rods 7, the length of the first telescopic threaded rod 8 and the length of the second telescopic threaded rod 12 are conveniently adjusted, the first telescopic threaded rod 8 and the second telescopic threaded rod 12 are movably inserted into two ends of the inner part of the double-shaft threaded sleeve 11 respectively, the sliding plate 3 is conveniently driven to displace, so that the clamping and fixing of the reinforcing rod 7 are adjusted, one ends, away from each other, of the first telescopic threaded rod 8 and the second telescopic threaded rod 12 are positioned on the outer side of the double-shaft threaded sleeve 11, mounting grooves 19 are formed in two ends of the reinforcing rod 7 respectively, the mounting of the clamping and fixing blocks 18 is facilitated, the clamping and fixing blocks 18 are fixedly mounted in the mounting grooves 19, the mounting of the clamping and fixing blocks 15 is facilitated, one ends of the clamping and fixing blocks 18 are positioned on the outer side of the reinforcing rod 7, the clamping and fixing toothed blocks 15 are fixedly mounted at the ends, the clamping and fixing toothed blocks 15 are clamped with the clamping and fixing racks 16 so as to be clamped with the, reset spring 20's one end and the inner wall fixed connection of mounting groove 19, be convenient for the restoration of the solid piece 18 of card, sliding tray 6 has all been seted up to the both sides of stiffener 7 upper end, it is spacing to be convenient for the removal of sliding plate 3, sliding plate 3 has been alternate in the intermediate position department activity of two sliding tray 6, the lower extreme of sliding plate 3 and the upper end fixed connection of the solid piece 18 of card, be convenient for drive solid piece 18 of card and carry out the displacement, the one end fixed connection that two relative one sides of sliding plate 3 separated from first flexible threaded rod 8 and the flexible threaded rod 12 of second respectively, be convenient for the regulation of first flexible threaded rod 8 and the flexible threaded rod 12 of second to sliding plate.

Specifically, as shown in fig. 1 to 3, the two sides of the upper end of the probe row support 1 are both provided with sliding chutes 4, the two sliding chutes 4 are symmetrically located on one side of the clamping rack 16, and the length of the two sliding chutes 4 is equal to the length of the clamping rack 16, so that the movement range of the reinforcing rod 7 is limited.

Specifically, as shown in fig. 1 to 3, three clamping bolts 5 are movably inserted into the two sliding grooves 4, and the lower ends of the clamping bolts 5 are located inside the clamping grooves 14 and attached to the upper ends of the two sides of the reinforcing rod 7, so that the reinforcing rod 7 is further fixed.

Specifically, as shown in fig. 1-3, mounting blocks 9 are fixedly mounted on both sides of the upper end of the reinforcing rod 7, and a double-shaft threaded sleeve 11 is movably inserted in the middle of the opposite surfaces of the two mounting blocks 9, so that the double-shaft threaded sleeve 11 can be mounted and rotated conveniently.

Specifically, as shown in fig. 1 to 3, the threads on the surfaces of the first telescopic threaded rod 8 and the second telescopic threaded rod 12 are reversed, and the lengths of the first telescopic threaded rod 8 and the second telescopic threaded rod 12 are equal, so that the sliding plates 3 on both sides can be conveniently driven to move.

Specifically, as shown in fig. 1 to 3, a rotating disc 10 is fixedly installed at a middle position on the surface of the double-shaft thread insert 11, and rotating blocks 13 are fixedly installed on the surfaces of the rotating disc 10, so as to drive the double-shaft thread insert 11 to rotate, thereby adjusting the first telescopic threaded rod 8 and the second telescopic threaded rod 12.

To sum up, when the utility model is used, the rotating block 13 is rotated to drive the rotating disc 10 to rotate, the rotating disc 10 drives the double-shaft thread insert 11 to rotate, so that the first telescopic threaded rod 8 and the second telescopic threaded rod 12 at two ends inside the rotating disc shrink, the first telescopic threaded rod 8 and the second telescopic threaded rod 12 drive the sliding plate 3 to move inside the sliding groove 6, the sliding plate 3 moves to drive the clamping block 18 to shrink inside the mounting groove 19, so that the clamping tooth block 15 at one end of the clamping block 18 is separated from the clamping tooth rack 16 inside the clamping groove 14, thereby facilitating the probe bar 2 at the lower end of the reinforcing rod 7 to move and fix inside the probe bar support 1, facilitating the adjustment of the whole device, after the positioning is confirmed, the user rotates the rotating disc 10 reversely, so that the clamping tooth block 15 is clamped with the clamping tooth rack 16, facilitating the fixing of the reinforcing rod 7 and the probe bar 2, meanwhile, the clamping bolt 5 slides in the chute 4, after the reinforcing rod 7 is clamped with the clamping rack 16 through the clamping tooth block 15, the clamping bolt 5 is rotated by a user, so that the lower end of the clamping bolt 5 is fixedly attached to the upper sides of the two ends of the reinforcing rod 7, and the probe bar 2 is further fixed conveniently.

The above embodiments are only used to illustrate the technical solution of the present invention, and not to limit it; although the present invention has been described in detail with reference to the foregoing embodiments, it should be understood by those skilled in the art that: the technical solutions described in the foregoing embodiments may still be modified, or some technical features may be equivalently replaced; such modifications and substitutions do not depart from the spirit and scope of the present invention in its corresponding aspects.

Claims

1. A probe row suitable for large-size silicon chips comprises a probe row support (1) and is characterized in that: the probe row support is characterized in that clamping grooves (14) are formed in two sides of the interior of the probe row support (1), the two clamping grooves (14) are symmetrically distributed, clamping racks (16) are fixedly mounted on one sides of opposite surfaces of the inner walls of the two clamping grooves (14), the two clamping racks (16) are symmetrically distributed, baffles (17) are fixedly mounted on two sides of each clamping rack (16), three probe rows (2) are fixedly mounted in the interior of the probe row support (1), reinforcing rods (7) are fixedly mounted at the upper ends of the three probe rows (2), double-shaft screw sleeves (11) are movably mounted at the middle positions of the upper ends of the reinforcing rods (7), first telescopic threaded rods (8) and second telescopic threaded rods (12) are movably inserted into two ends of the interior of the double-shaft screw sleeves (11), and the ends of the first telescopic threaded rods (8) and the second telescopic threaded rods (12) which are separated from each other are located on the outer sides of the double-shaft screw sleeves (11), the fixing device is characterized in that mounting grooves (19) are formed in the two ends of the reinforcing rod (7), a clamping block (18) is fixedly mounted in the mounting grooves (19), one end of the clamping block (18) is located on the outer side of the reinforcing rod (7), a clamping tooth block (15) is fixedly mounted at the end of the clamping block (18), the clamping tooth block (15) is clamped with a clamping rack (16), a reset spring (20) is fixedly mounted at the other end of the clamping block (18), one end of the reset spring (20) is fixedly connected with the inner wall of the mounting groove (19), two sliding grooves (6) are formed in the two sides of the upper end of the reinforcing rod (7), a sliding plate (3) is movably inserted in the middle of the two sliding grooves (6), the lower end of the sliding plate (3) is fixedly connected with the upper end of the clamping block (18), and one side, opposite to the two sliding plates (3), of the first telescopic threaded rod (8) and the second telescopic threaded rod (12) are separated from each other And (4) fixedly connecting.

2. The probe array suitable for large-sized silicon wafers as set forth in claim 1, wherein: the probe row support is characterized in that sliding grooves (4) are formed in two sides of the upper end of the probe row support (1), the two sliding grooves (4) are symmetrically located on one side of the clamping rack (16), and the length of the two sliding grooves (4) is equal to that of the clamping rack (16).

3. The probe array suitable for large-sized silicon wafers as set forth in claim 2, wherein: three clamping bolts (5) are movably inserted into the two sliding grooves (4), the lower ends of the clamping bolts (5) are located in the clamping grooves (14) and attached to the upper ends of the two sides of the reinforcing rod (7).

4. The probe array suitable for large-sized silicon wafers as set forth in claim 1, wherein: the two sides of the upper end of the reinforcing rod (7) are fixedly provided with mounting blocks (9), and the middle positions of the opposite surfaces of the two mounting blocks (9) are movably inserted with the double-shaft thread sleeves (11).

5. The probe array suitable for large-sized silicon wafers as set forth in claim 1, wherein: the first flexible threaded rod (8) with the screw thread on the second flexible threaded rod (12) surface is reverse form, first flexible threaded rod (8) with the length of the second flexible threaded rod (12) equals.

6. The probe array suitable for large-sized silicon wafers as set forth in claim 1, wherein: the double-shaft thread insert is characterized in that a rotating disc (10) is fixedly mounted at the middle position of the surface of the double-shaft thread insert (11), and rotating blocks (13) are fixedly mounted on the surface of the rotating disc (10).