CN216013565U

CN216013565U - Circuit for automatically measuring ESD tube voltage drop

Info

Publication number: CN216013565U
Application number: CN202121291526.1U
Authority: CN
Inventors: 王子豪; 高宪校; 余诗李; 郑泽平
Original assignee: Inmicro Xiamen Microelectronic Technology Co ltd
Current assignee: Tuoer Microelectronics Co ltd
Priority date: 2021-06-09
Filing date: 2021-06-09
Publication date: 2022-03-11
Anticipated expiration: 2031-06-09

Abstract

The utility model provides a circuit for automatically measuring an ESD tube voltage drop, which comprises: the MCU controller comprises a communication module, the output end of the MCU controller is connected with the input end of the upper computer, the input end of the communication module is connected with the output end of the upper computer, and the output end of the communication module is connected with the input end of the MCU controller; the input end of the decoder is connected with the signal output end of the MCU controller; the relay module, the relay module connect in the output of decoder, the relay module is connected between the negative pole of universal meter and the negative pole of ESD pipe, the positive pole of universal meter connect in the positive pole of ESD pipe, the relay module is used for controlling the contact state between the negative pole of universal meter and the negative pole of ESD pipe. The utility model has smart design, improves the measurement efficiency and the accuracy of measuring and recording data.

Description

Circuit for automatically measuring ESD tube voltage drop

Technical Field

The utility model relates to the field of circuits, in particular to a circuit for automatically measuring an ESD (electro-static discharge) tube voltage drop.

Background

The ESD diode of the chip pin is very important protection for the chip, and can prevent the chip from being damaged by external high-voltage electrostatic breakdown. Each sample at the initial stage of chip design needs to be tested for the function and performance of the ESD diode. Before the ESD test is performed, the conduction voltage drop of the ESD diode between the pins must be measured, after the ESD test is performed, the conduction voltage drop of the ESD diode is measured again, and then comparison and comparison are performed to serve as a determination reference data for determining the function and performance of the ESD diode.

When the chip is used for verifying the function and the performance of an ESD electrostatic breakdown experiment, more chip samples are needed, and multiple experiments are often needed. Conventionally, the tube voltage drop of the ESD is manually measured by a multimeter and a numerical value is recorded, and after a corresponding electrostatic breakdown experiment is finished, the tube voltage drop of the ESD is measured again and the numerical value is recorded, so that more labor and time are consumed.

SUMMERY OF THE UTILITY MODEL

The utility model aims to provide a circuit for automatically measuring the voltage drop of an ESD tube.

The utility model aims to solve the problems in the existing process of measuring the voltage drop of the ESD tube.

Compared with the prior art, the technical scheme and the beneficial effects of the utility model are as follows:

a circuit for automatically measuring an ESD tube drop, comprising: the MCU controller comprises a communication module, the output end of the MCU controller is connected with the input end of the upper computer, the input end of the communication module is connected with the output end of the upper computer, and the output end of the communication module is connected with the input end of the MCU controller; the input end of the decoder is connected with the signal output end of the MCU controller; the relay module is connected to the output end of the decoder, the relay module is connected between the negative electrode of a multimeter and the cathode of the ESD tube, the positive electrode of the multimeter is connected to the anode of the ESD tube, and the relay module is used for controlling the contact state between the negative electrode of the multimeter and the cathode of the ESD tube; the upper computer is in communication connection with the universal meter, the MCU controller controls the relay module through the decoder, the relay module controls the negative pole of the universal meter and the contact state between the ESD pipes, the voltage drop value of the ESD pipes is obtained through measurement of the universal meter, and the value data are sent to the upper computer.

As a further improvement, the communication module is a USB to UART communication module.

As a further improvement, the signal output end of the MCU controller is an IO signal end.

As a further refinement, the decoder is a 38 decoder.

As a further refinement, the decoder is of the type 74HC 138.

As a further improvement, the MCU controller is of the model STC/IAP15F2K 612S-35I.

As a further improvement, the USB connection is adopted between the upper computer and the universal meter.

As a further improvement, the upper computer is a computer.

The utility model has the beneficial effects that: adopt the cooperation between host computer, MCU controller, decoder, relay module and the universal meter, realized that the MCU controller passes through decoder control relay module, and relay module is through control the negative pole of universal meter with contact state between the ESD pipe, through the universal meter is measured and is obtained the pressure drop numerical value of ESD pipe to send numerical data extremely the host computer realizes the pressure drop of automatic measurement ESD pipe, has promoted measurement of efficiency, and has promoted the accuracy of measurement, record data.

Drawings

Fig. 1 is a schematic circuit diagram of a circuit for automatically measuring an ESD tube voltage drop according to an embodiment of the present invention.

Fig. 2 is a schematic circuit connection diagram of a circuit for automatically measuring an ESD tube voltage drop according to an embodiment of the present invention.

Fig. 3 is a schematic structural diagram of an MCU controller according to an embodiment of the present invention.

Fig. 4 is a schematic structural diagram of a decoder according to an embodiment of the present invention.

Fig. 5 is a schematic diagram of a first partial structure of a relay module according to an embodiment of the present invention.

Fig. 6 is a schematic diagram of a second partial structure of a relay module according to an embodiment of the present invention.

In the figure:

1. host computer 11, communication module 2 MCU controller

3. Decoder 4 relay module 5 multimeter

Detailed Description

In order to make the objects, technical solutions and advantages of the embodiments of the present invention more apparent, the technical solutions of the embodiments of the present invention will be described clearly and completely with reference to the accompanying drawings of the embodiments of the present invention, and it is obvious that the described embodiments are some, but not all embodiments of the present invention. All other embodiments, which can be obtained by a person skilled in the art without any inventive step based on the embodiments of the present invention, are within the scope of the present invention. Thus, the following detailed description of the embodiments of the present invention, presented in the figures, is not intended to limit the scope of the utility model, as claimed, but is merely representative of selected embodiments of the utility model. All other embodiments, which can be obtained by a person skilled in the art without any inventive step based on the embodiments of the present invention, are within the scope of the present invention.

In the description of the present invention, the terms "first" and "second" are used for descriptive purposes only and are not to be construed as indicating or implying relative importance or implying any number of technical features indicated. Thus, a feature defined as "first" or "second" may explicitly or implicitly include one or more of that feature. In the description of the present invention, "a plurality" means two or more unless specifically defined otherwise.

Referring to fig. 1 to 6, a circuit for automatically measuring a voltage drop of an ESD tube includes: the MCU controller 2 comprises a communication module 11, the output end of the MCU controller 2 is connected with the input end of the upper computer 1, the input end of the communication module 11 is connected with the output end of the upper computer 1, and the output end of the communication module 11 is connected with the input end of the MCU controller 2; the input end of the decoder 3 is connected to the signal output end of the MCU controller 2, and the decoder 3 is used for converting signals; the relay module 4 is connected to the output end of the decoder 3, the relay module 4 is connected between the negative electrode of a universal meter 5 and the cathode of an ESD (electro-static discharge) tube, the positive electrode of the universal meter 5 is connected to the anode of the ESD tube, and the relay module 4 is used for controlling the contact state between the negative electrode of the universal meter 5 and the cathode of the ESD tube; the upper computer 1 is in communication connection with the universal meter 5, the MCU controller 2 controls the relay module 4 through the decoder 3, the relay module 4 controls the negative electrode of the universal meter 5 and the contact state between the ESD pipes, the universal meter 5 measures the voltage drop value of the ESD pipes and sends the numerical data to the upper computer 1, and the upper computer 1 receives the numerical data and updates the voltage drop database of the ESD pipes in real time.

The communication module 11 is a USB to UART communication module 11.

And the signal output end of the MCU controller 2 is an IO signal end. The model of the MCU controller 2 is STC/IAP15F2K 612S-35I.

The decoder 3 is 38 decoder 3. The decoder 3 is of the type 74HC 138.

The upper computer 1 and the universal meter 5 are connected through a USB. The upper computer 1 is a computer, and the upper computer 1 comprises software and a human-computer interaction control interface which are in communication connection with the MCU controller 2.

It should be noted that the present invention can also be used for testing a chip, where the positive electrode of the multimeter 5 is connected to a certain pin of the chip, one end of the relay module 4 is connected to another pin of the chip, and the other end of the corresponding relay module 4 is connected to the negative electrode of the multimeter 5.

With reference to fig. 5 and 6, relay U8 is used to control two SITE turn tests, and the other relays are used to control the IC pin closing test. The relay that controls the IC closing test may be set according to the number of IC pins.

Referring to fig. 2, the relay module 4 includes a MOS transistor and a relay, a gate of the MOS transistor is connected to the output terminal of the decoder 3, a drain of the MOS transistor is connected to the control terminal of the relay, and a source of the MOS transistor is grounded.

The working principle of the circuit for automatically measuring the voltage drop of the ESD tube provided by the utility model is as follows:

host computer 1 with universal meter 5 communication is connected, MCU controller 2 passes through 3 controls of decoder relay module 4, decoder 3 convert the IO signal that MCU controller 2 sent to the control signal who sends relay module 4, relay module 4 is through control universal meter 5's negative pole with contact state between the ESD pipe, through 5 measurements of universal meter obtain the pressure drop numerical value of ESD pipe to send numerical data extremely host computer 1, host computer 1 receive numerical data and update in real time to ESD pipe pressure drop database, realize automatic measurement, read the numerical value of ESD pipe pressure drop.

The above examples are only for illustrating the technical solutions of the present invention and not for limiting the same. It will be understood by those skilled in the art that any modifications and equivalents may be made thereto without departing from the spirit and scope of the present invention as set forth in the appended claims.

Claims

1. A circuit for automatically measuring an ESD tube drop, comprising:

the MCU controller comprises a communication module, the output end of the MCU controller is connected with the input end of the upper computer, the input end of the communication module is connected with the output end of the upper computer, and the output end of the communication module is connected with the input end of the MCU controller;

the input end of the decoder is connected with the signal output end of the MCU controller;

the relay module is connected to the output end of the decoder, the relay module is connected between the negative electrode of a multimeter and the cathode of the ESD tube, the positive electrode of the multimeter is connected to the anode of the ESD tube, and the relay module is used for controlling the contact state between the negative electrode of the multimeter and the cathode of the ESD tube;

the upper computer is in communication connection with the universal meter, the MCU controller controls the relay module through the decoder, the relay module controls the negative pole of the universal meter and the contact state between the ESD pipes, the voltage drop value of the ESD pipes is obtained through measurement of the universal meter, and the value data are sent to the upper computer.

2. The circuit for automatically measuring the ESD tube drop according to claim 1, wherein the communication module is a USB to UART communication module.

3. The circuit for automatically measuring the voltage drop of the ESD tube according to claim 1, wherein the signal output terminal of the MCU controller is an IO signal terminal.

4. The circuit of claim 1, wherein the decoder is a 38-decoder.

5. The circuit of claim 4, wherein the decoder is of the type 74HC 138.

6. The circuit of claim 1, wherein the MCU controller is of the type STC/IAP15F2K 612S-35I.

7. The circuit for automatically measuring the voltage drop of the ESD tube as claimed in claim 1, wherein a USB connection is adopted between the upper computer and the multimeter.

8. The circuit for automatically measuring the voltage drop of the ESD tube according to claim 1, wherein the upper computer is a computer.