CN207020240U - A kind of reference voltage universal test device - Google Patents
A kind of reference voltage universal test device Download PDFInfo
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- CN207020240U CN207020240U CN201720938304.1U CN201720938304U CN207020240U CN 207020240 U CN207020240 U CN 207020240U CN 201720938304 U CN201720938304 U CN 201720938304U CN 207020240 U CN207020240 U CN 207020240U
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- test
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- reference voltage
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- circuit plate
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Abstract
The utility model discloses a kind of reference voltage universal test device, including：Test jack, test circuit plate and integrated circuit test system；The test jack is connected by test circuit plate with integrated circuit test system, and device to be tested is connected by device pin with test jack；Wherein, the test circuit plate side is provided with the interface matched with integrated circuit test system, and opposite side is provided with the interface matched with test jack；Described test jack one end is connected with test circuit plate, and the other end is provided with the interface matched with device pin to be tested；The device to be tested is connected by test jack and test circuit plate test interface corresponding in integrated circuit test system, completes the reference voltage test of device.The reference voltage universal test device on the basis of using existing test system, can improve the testing efficiency and accuracy of device reference voltage.
Description
Technical field
Test device technical field is the utility model is related to, particularly relates to a kind of reference voltage universal test device.
Background technology
Currently as the reach of science, the function of various test systems are stronger and stronger, comprehensive.But also to widget
The especially modular test of test brings problem, such as the comprehensive test system of One function, based on generality with
Versatility, the structure setting of test system is into the mode that can be connected with different components, although so that different components can be realized
Different test purposes, but during each test different components, be required to pin one by one and be connected successively with test system, not only taken
When it is laborious, and easily there is human error, cause the error of test.Therefore during the utility model is realized, invention
People has found that prior art at least has following defect：The efficiency and standard of functional test especially reference voltage test for device
True property is not high.
Utility model content
In view of this, the purpose of this utility model is to propose a kind of reference voltage universal test device, existing utilizing
On the basis of test device, the testing efficiency and accuracy of device reference voltage are improved.
Based on a kind of above-mentioned purpose reference voltage universal test device provided by the utility model, including：Test jack, survey
Try circuit board and integrated circuit test system：The test jack is connected by test circuit plate and integrated circuit test system
Connect, and device to be tested is connected by device pin with test jack；Wherein, the test circuit plate side is provided with and collected
Into the interface of circuit test system matching, opposite side is provided with the interface matched with test jack；Described test jack one end with
Test circuit plate connects, and the other end is provided with the interface matched with device pin to be tested；
The device to be tested passes through test jack and the survey corresponding in integrated circuit test system of test circuit plate
Mouth of trying connects, and completes the reference voltage test of device.
Optionally, it is provided with multigroup interface group matched with test jack in the test circuit plate.
Optionally, spanner structure and copper sheet are provided with the test jack；Wherein, the spanner structure is used for by pressing
Press copper sheet and then control device pin and the bonding strength of test jack.
Optionally, the earth terminal of device under test is connected by least one relay with integrated circuit test system.
Optionally, in addition to multi-tap；The test circuit plate passes through the multi-tap and integrated circuit testing system
System connection.
Optionally, groove structure corresponding with device under test is provided with the test jack, is entered for device under test
Row positioning and protection.
Optionally, checking circuit structure is additionally provided with the test circuit plate, for receiving the pipe of same device under test
Pin signal is simultaneously connected in the different units of integrated circuit test system, while realizes the test and verification of device under test.
Optionally, the test circuit plate and/or the interface of the test jack are arranged to elastic locking structure, wherein,
The elastic locking structure is to be correspondingly provided with elastic construction in interface position, for the pin for insert in interface or is inserted
The fixed locking of head.
Optionally, the integrated circuit test system is AMIDA 3KS test systems.
From the above it can be seen that reference voltage universal test device provided by the utility model passes through in test circuit
The interface of integrated circuit test system is converted into test circuit by the interface that design coordinates with integrated circuit test system on plate
The corresponding standard interface for making a reservation for target to be measured on plate, the connection of the device under test of different model size is converted by test jack
For test jack plug-in type interface corresponding with test circuit plate so that be directed to the benchmark of the device under test of different model size
The test of voltage can realize quick connection by the cooperation of test circuit plate and test jack, and then improve the survey of device under test
Efficiency is tried, when especially carrying out batch testing, it is only necessary to be in advance connected test circuit plate with integrated circuit test system, then
Can is inserted device under test in the test jack of matching as needed, is then plugged into test circuit by test jack
Plate, realize the connection with integrated circuit test system.Meanwhile based on the test circuit plate and test jack by device under test with
The test connection of integrated circuit test system is converted into the connection of the socket or pin of standard, avoids pin and collection manually
Into the line connection of the test system of circuit test system, the human error in test process is reduced.Therefore, it is described herein
Reference voltage universal test device on the basis of using existing test system, can improve the testing efficiency of device reference voltage
And accuracy.
Brief description of the drawings
Fig. 1 is the structural representation of one embodiment of reference voltage universal test device provided by the utility model；
Fig. 2 is circuit block diagram corresponding to test circuit plate provided by the utility model；
Fig. 3 is the structural representation of one embodiment of test jack provided by the utility model.
Embodiment
For the purpose of this utility model, technical scheme and advantage is more clearly understood, below in conjunction with specific embodiment, and
Referring to the drawings, the utility model is further described.
It should be noted that all statements for using " first " and " second " are for area in the utility model embodiment
Be divided to two non-equal entities of same names or non-equal parameter, it is seen that " first " " second " only for statement convenience,
The restriction to the utility model embodiment is should not be construed as, subsequent embodiment no longer illustrates one by one to this.
It is the structure of one embodiment of reference voltage universal test device provided by the utility model shown in reference picture 1
Schematic diagram.Lack the test electricity for being directed to some devices on the basis of versatility is considered based on existing integrated circuit test system
Road plate or test structure, the application propose a kind of improved test device, can make full use of the base of existing test system
On plinth, the quick test of device reference voltage is realized.Specifically, the reference voltage universal test device, including：Test jack
1st, test circuit plate 2 and integrated circuit test system 3；Wherein, the integrated circuit test system 3 belongs to original test system
Unite, the relevant interface and function of the test of device reference voltage are included in system.During connection, the test jack 1 passes through the survey
Examination circuit board 2 is connected with integrated circuit test system 3, then connects device to be tested by device pin and test jack 1
Connect, and then realize the connection of device to be tested and test system.Wherein, the side of the test circuit plate 2 is provided with and collected
The interface matched into circuit test system 3, opposite side are provided with the interface matched with test jack；That is, the test circuit
The one side of plate 2 is provided with matching accordingly according to information such as interface position, form or the structures of existing integrated circuit test system 3
Interface so that by integrated circuit test system 3 be used for test benchmark voltage the corresponding interface be transferred to the test circuit
In plate 2.One end of the test jack 1 is connected with the test circuit plate 2, and the other end is provided with and device pin to be tested
The interface of matching；Wherein, what the interface in the test jack 1 enabled device fast and stable to be tested is inserted into test
On socket, then test jack 1 again being connected in test circuit plate 2 with fast and stable.So that device to be tested passes through
Test jack 1 and the test interface corresponding in integrated circuit test system 3 of test circuit plate 2 realize the connection of fast and stable,
And then complete the reference voltage test of device.
From above-described embodiment, the reference voltage universal test device on test circuit plate 2 by designing and collecting
The interface of integrated circuit test system is converted into the interface that circuit test system 3 coordinates and corresponded in advance on test circuit plate 2
The standard interface of fixed target to be measured, the connection of the device under test of different model size is converted into by test by test jack 1 and inserted
1 plug-in type interface corresponding with test circuit plate 2 of seat so that be directed to the reference voltage of the device under test of different model size
Test can be realized with the cooperation of test jack 1 by test circuit plate 2 and is quickly connected, and then improve the test effect of device under test
Rate, when especially carrying out batch testing, it is only necessary to be in advance connected test circuit plate 2 with integrated circuit test system 3, then
Device under test can be inserted in the test jack 1 of matching as needed, test circuit plate is then plugged into by test jack 1
2, realize the connection of device under test and integrated circuit test system 3.Meanwhile will based on the test circuit plate 2 and test jack 1
The test connection of device under test and integrated circuit test system 3 is converted into the connection of the socket or pin of standard, avoids people
Pin is connected by work with the line of the test system of integrated circuit test system 3, reduces the human error in test process.Cause
This, reference voltage universal test device described herein can improve device base on the basis of using existing test system
The testing efficiency and accuracy of quasi- voltage.
In the application some optional embodiments, it is provided with and multigroup is matched with test jack 1 in the test circuit plate 2
Interface group.That is, the interface for being used for test benchmark voltage in integrated circuit test system 3 is converted into multigroup connect by test jack
Mouth group, the reference voltage test to multigroup device under test on the one hand can be so realized simultaneously, on the other hand, can be directed to not
Same device under test and corresponding different test jack, are arranged at connecing for different test jacks matchings on test circuit plate 2
Mouthful group so that same integrated circuit test system 3 and test circuit plate 2 can be realized to different model, big gadget
Reference voltage is tested.
In the application some optional embodiments, spanner structure and copper sheet are provided with the test jack 1；Wherein,
The spanner structure is used for by pressing copper sheet and then the pin for controlling device under test and the bonding strength of test jack.Namely
Test jack 1 is provided with a movable copper sheet and spanner knot for controlling copper sheet for the position that is connected with device under test
Structure, copper sheet device under test can be pressed to by rotating or moving spanner structure, so that device under test and test jack 1
Connection it is more reliable and more stable.
It is circuit block diagram corresponding to test circuit plate 2 provided by the utility model shown in reference picture 2.That is, it will can survey
The wiring that standard can be quickly connected is regarded in examination circuit board 2 and test jack 1 as, for realizing device under test and integrated circuit testing system
The quick connection of system.The interface that principle is for device under test to be used for detection reference voltage is connected to integrated circuit testing accordingly
In system, as seen from the figure, in certain embodiments, the earth terminal of device under test is surveyed by least one relay and integrated circuit
Test system connects.Wherein, in figure CH represent test system various passages or interface, certainly can also basis be actually needed increase
The element such as interface channel or relay.
Shown in reference picture 1, in the application some optional embodiments, multi-tap 4 is also included in device；The test
Circuit board 2 is connected by the multi-tap 4 with integrated circuit test system 3.So, by designing multi-tap 4, can incite somebody to action
Test circuit plate 2 is arranged to the universal test plate of standard, structure, the difference of interface without considering test system, utilizes
Multi-tap 4 is matched with the interface of test system, so, by setting transfer plug 4 so that test circuit plate 2 can
Simultaneously suitable for different test systems, or can also consolidating by multi-tap 4 and integrated circuit test system 3
Fixed connection, realize the speed and efficiency of whole test device installation, test and dismounting.In particular in batch testing and
Utilize the test process of different test systems.
It is the structural representation of one embodiment of test jack provided by the utility model shown in reference picture 3.The survey
Groove structure 11 corresponding with device under test is provided with examination socket 1, is positioned and is protected for device under test.It is described recessed
The socket 12 of the device pin of device under test is provided with the structure of slot structure 11, for enable device under test fast and stable with
Connection is realized in test jack 1.The mistake that can also so avoid the device pin of device under test from being connected with test jack 1, improve
The stability and reliability of test connection installation.
In the application some optional embodiments, checking circuit structure is additionally provided with the test circuit plate 2, is used for
Receive the pin signal of same device under test and be connected in the different units of integrated circuit test system 3, while realize to be measured
The test and verification of device.That is, by one group in same test system or multigroup test interface in test circuit plate 2
Different test circuits is converted into, partly can so carry out device as checking circuit as test circuit another part
Reference voltage verifies while test to test result, improves the accuracy and reliability of test.
In the application some optional embodiments, the interface of the test circuit plate 2 and/or the test jack 1 is set
Elastic locking structure is set to, wherein, the elastic locking structure is to be correspondingly provided with elastic construction in interface position, for causing
The pin or plug inserted in interface fixes locking.So, device under test insert test jack 1 in or test jack 1
When being plugged into test circuit plate 2, elastic locking structure will provide for an elastic pressure so that tap position stable connection can
Lean on, improve the stability of test connection, reduce test error.
Preferably, elastic locking structure may be arranged as controllable locking device, namely set a control unit in outside
Part, user can control the locking or relieving of elastic locking structure so that device under test and test jack or test jack
Connection with test circuit plate is more laborsaving, convenient.
In the application some optional embodiments, the integrated circuit test system is AMIDA 3KS test systems.
From above-described embodiment, reference voltage universal test device described herein is by the parameter testing of reference voltage
Required resources integration is on one piece of general test board so that tester more easily can use and test, and ensure that base
The versatility and uniformity of quasi- voltage tester.Therefore, the complicated device resource of the application installation optimization, directly provides voltage
All required resources of benchmark class device detection, resource has simply directly been presented in face of program developer, and new hand is come
Say also more easy to get started operation.It ensure that the uniformity of program development improves accuracy again.
Those of ordinary skills in the art should understand that：The discussion of any of the above embodiment is exemplary only, not
It is intended to imply that the scope of the present disclosure (including claim) is limited to these examples；Under thinking of the present utility model, the above is real
Applying can also be combined between the technical characteristic in example or different embodiments, and exist as described above of the present utility model
Many other changes of different aspect, for simplicity, they are not provided in details.Therefore, it is all in spirit of the present utility model
Within principle, any omission for being made, modification, equivalent substitution, improvement etc., the scope of protection of the utility model should be included in
Within.
In addition, to simplify explanation and discussing, and in order to which the utility model indigestion will not be made, in the accompanying drawing provided
In can show or can not show to be connected with the known power ground of integrated circuit (IC) chip and other parts.In addition,
Device can be shown in block diagram form, to avoid making the utility model indigestion, and this have also contemplated that following facts,
Details i.e. on the embodiment of these block diagram arrangements is to depend highly on that platform of the present utility model will be implemented (i.e.,
These details should be completely in the range of the understanding of those skilled in the art).Elaborate detail (for example, circuit) with
In the case of describing exemplary embodiment of the present utility model, it will be apparent to those skilled in the art that can be
Implement the utility model without in the case of these details or in the case that these details change.Therefore, this
A little descriptions are considered as illustrative and not restrictive.
Although having been incorporated with specific embodiment the utility model is described, according to description above, this
Many replacements of a little embodiments, modifications and variations will be apparent for those of ordinary skills.It is for example, other
Memory architecture (for example, dynamic ram (DRAM)) can use discussed embodiment.
Embodiment of the present utility model is intended to fall into all such within the broad range of appended claims
Replace, modifications and variations.Therefore, it is all within the spirit and principles of the utility model, it is any omission for being made, modification, equivalent
Replace, improve etc., it should be included within the scope of protection of the utility model.
Claims (6)
- A kind of 1. reference voltage universal test device, it is characterised in that including：Test jack, test circuit plate and integrated electricity Path test system；The test jack is connected by test circuit plate with integrated circuit test system, and device to be tested leads to Device pin is crossed to be connected with test jack；Wherein, the test circuit plate side is provided with matches with integrated circuit test system Interface, opposite side is provided with the interface matched with test jack；Described test jack one end is connected with test circuit plate, another End is provided with the interface matched with device pin to be tested；The device to be tested is connect by test jack and the test corresponding in integrated circuit test system of test circuit plate Mouth connection, complete the reference voltage test of device.
- 2. reference voltage universal test device according to claim 1, it is characterised in that be provided with the test jack Spanner structure and copper sheet；Wherein, the spanner structure is used to control pin and the test of device under test by pressing copper sheet The bonding strength of socket.
- 3. reference voltage universal test device according to claim 1, it is characterised in that the earth terminal of device under test passes through At least one relay is connected with integrated circuit test system.
- 4. reference voltage universal test device according to claim 1, it is characterised in that also set in the test circuit plate Checking circuit structure is equipped with, for receiving the pin signal of same device under test and being connected to the difference of integrated circuit test system In unit, while realize the test and verification of device under test.
- 5. reference voltage universal test device according to claim 1, it is characterised in that the test circuit plate and/or The interface of the test jack is arranged to elastic locking structure, wherein, the elastic locking structure is accordingly to be set in interface position Elastic construction is equipped with, the pin or plug for insert in interface fix locking.
- 6. reference voltage universal test device according to claim 1, it is characterised in that the integrated circuit test system For AMIDA 3KS test systems.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201720938304.1U CN207020240U (en) | 2017-07-28 | 2017-07-28 | A kind of reference voltage universal test device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201720938304.1U CN207020240U (en) | 2017-07-28 | 2017-07-28 | A kind of reference voltage universal test device |
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| Publication Number | Publication Date |
|---|---|
| CN207020240U true CN207020240U (en) | 2018-02-16 |
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| CN201720938304.1U Active CN207020240U (en) | 2017-07-28 | 2017-07-28 | A kind of reference voltage universal test device |
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Cited By (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN111024985A (en) * | 2019-12-17 | 2020-04-17 | 北京航天控制仪器研究所 | Misalignment angle adjusting device for tire-embracing type quartz accelerometer |
| CN111562532A (en) * | 2020-07-16 | 2020-08-21 | 宁波中车时代传感技术有限公司 | Online batch parallel testing device for current sensors |
| CN111624463A (en) * | 2020-05-12 | 2020-09-04 | 通富微电子股份有限公司 | Integrated circuit testing device |
| CN113759783A (en) * | 2021-09-09 | 2021-12-07 | 浙江中控技术股份有限公司 | Oil gas pipeline control device and system |
| WO2022021839A1 (en) * | 2020-07-29 | 2022-02-03 | 中广核核电运营有限公司 | Intelligent panel testing system having checking function |
-
2017
- 2017-07-28 CN CN201720938304.1U patent/CN207020240U/en active Active
Cited By (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN111024985A (en) * | 2019-12-17 | 2020-04-17 | 北京航天控制仪器研究所 | Misalignment angle adjusting device for tire-embracing type quartz accelerometer |
| CN111624463A (en) * | 2020-05-12 | 2020-09-04 | 通富微电子股份有限公司 | Integrated circuit testing device |
| CN111562532A (en) * | 2020-07-16 | 2020-08-21 | 宁波中车时代传感技术有限公司 | Online batch parallel testing device for current sensors |
| WO2022021839A1 (en) * | 2020-07-29 | 2022-02-03 | 中广核核电运营有限公司 | Intelligent panel testing system having checking function |
| CN113759783A (en) * | 2021-09-09 | 2021-12-07 | 浙江中控技术股份有限公司 | Oil gas pipeline control device and system |
| CN113759783B (en) * | 2021-09-09 | 2023-09-01 | 浙江中控技术股份有限公司 | Oil gas pipeline control device and system |
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