CN207301190U - A kind of voltage adjuster universal test device - Google Patents
A kind of voltage adjuster universal test device Download PDFInfo
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- CN207301190U CN207301190U CN201720938328.7U CN201720938328U CN207301190U CN 207301190 U CN207301190 U CN 207301190U CN 201720938328 U CN201720938328 U CN 201720938328U CN 207301190 U CN207301190 U CN 207301190U
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- voltage adjuster
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- 238000012360 testing method Methods 0.000 title claims abstract description 268
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 claims description 9
- 229910052802 copper Inorganic materials 0.000 claims description 9
- 239000010949 copper Substances 0.000 claims description 9
- 238000005538 encapsulation Methods 0.000 claims description 4
- 238000010276 construction Methods 0.000 claims description 3
- 238000012795 verification Methods 0.000 claims description 3
- 238000010586 diagram Methods 0.000 description 8
- 238000012986 modification Methods 0.000 description 4
- 230000004048 modification Effects 0.000 description 4
- 238000009434 installation Methods 0.000 description 3
- 238000005259 measurement Methods 0.000 description 3
- 238000000034 method Methods 0.000 description 3
- 230000008569 process Effects 0.000 description 3
- 230000033228 biological regulation Effects 0.000 description 2
- 238000013461 design Methods 0.000 description 2
- 201000006549 dyspepsia Diseases 0.000 description 2
- 230000006870 function Effects 0.000 description 2
- 230000008901 benefit Effects 0.000 description 1
- 230000008859 change Effects 0.000 description 1
- 230000007547 defect Effects 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 230000005611 electricity Effects 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 238000011990 functional testing Methods 0.000 description 1
- 238000012812 general test Methods 0.000 description 1
- 230000006872 improvement Effects 0.000 description 1
- 230000010354 integration Effects 0.000 description 1
- 238000005457 optimization Methods 0.000 description 1
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- 230000001629 suppression Effects 0.000 description 1
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Abstract
The utility model discloses a kind of voltage adjuster universal test device, including：Test jack, test circuit plate, multi-tap and voltage adjuster test system；Test jack is tested system with voltage adjuster by test circuit plate and is connected, and voltage adjuster to be measured is connected with test jack；Multi-tap is provided with the interface with voltage adjuster test system matches, and the side of test circuit plate is tested system with voltage adjuster by multi-tap and is connected, and opposite side is provided with and the matched interface of test jack；Test jack one end is connected with test circuit plate, and the other end is provided with and the matched interface of the device pin of voltage adjuster to be tested；Voltage adjuster to be tested is connected by test jack and test circuit plate to the corresponding test interface in voltage adjuster test system, completes voltage adjuster test.The voltage adjuster universal test device on the basis of using existing test system, can improve the testing efficiency and accuracy of voltage adjuster.
Description
Technical field
Test device technical field is the utility model is related to, particularly relates to a kind of voltage adjuster universal test device.
Background technology
Currently as the reach of science, the function of various test systems are stronger and stronger, comprehensive.But also to widget
The especially modular test of test brings problem, such as a full-featured test system, based on generality with
Versatility, tests the structure setting of system into the mode that can be connected with different components, although so that different components can be realized
Different test purposes, but during each test different components, be required to pin one by one and be connected successively with test system, not only taken
When it is laborious, and easily there is human error, cause the error of test.Therefore in the process of implementing the utility model, invention
People has found the prior art, and at least there are following defect：The effect of functional test especially voltage adjuster test for related device
Rate and accuracy be not high.
Utility model content
In view of this, the purpose of this utility model is that proposing a kind of voltage adjuster universal test device, using now
On the basis of having test device, the testing efficiency and accuracy of voltage adjuster are improved.
Based on a kind of above-mentioned purpose voltage adjuster universal test device provided by the utility model, including：Test jack,
Test circuit plate, multi-tap and voltage adjuster test system；The test jack passes through test circuit plate and voltage tune
Whole device test system connection, and voltage adjuster to be tested is connected by device pin with test jack；Wherein, the switching
Socket is provided with the interface with voltage adjuster test system matches, and the side of the test circuit plate passes through the multi-tap
It is connected with voltage adjuster test system, opposite side is provided with and the matched interface of test jack；Described test jack one end with
Test circuit plate connects, and the other end is provided with and the matched interface of the device pin of voltage adjuster to be tested；
The voltage adjuster to be tested passes through in test jack and test circuit plate and voltage adjuster test system
Corresponding test interface connection, complete voltage adjuster test.
Optionally, the multigroup and matched interface group of test jack is provided with the test circuit plate.
Optionally, spanner structure and copper sheet are provided with the test jack；Wherein, the spanner structure is used for by pressing
Press copper sheet and then control the pin of voltage adjuster and the bonding strength of test jack.
Optionally, groove structure corresponding with voltage adjuster to be measured is provided with the test jack, for to be measured
Voltage adjuster is positioned and protected.
Optionally, checking circuit structure is additionally provided with the test circuit plate, for receiving same voltage adjustment to be measured
The pin signal of device is simultaneously connected in the different units of voltage adjuster test system, while realizes the survey of voltage adjuster to be measured
Examination and verification.
Optionally, the test circuit plate and/or the interface of the test jack are arranged to elastic locking structure, wherein,
The elastic locking structure is to be correspondingly provided with elastic construction in interface position, for the pin for be inserted into interface or is inserted
The fixed locking of head.
Optionally, the voltage adjuster test system tests system for STS8108.
Optionally, the voltage adjuster to be tested is the voltage adjuster LT1963AES8-2.5 of SOIC encapsulation.
From the above it can be seen that voltage adjuster universal test device provided by the utility model passes through in test electricity
The interface of voltage adjuster test system is converted into and is surveying by design with the interface that voltage adjuster test system coordinates on the plate of road
The corresponding standard interface for making a reservation for target to be measured on circuit board is tried, is adjusted the voltage to be measured of different model size by test jack
The connection of device is converted into test jack plug-in type interface corresponding with test circuit plate so that is directed to treating for different model size
Quick connection can be realized by the cooperation of test circuit plate and test jack by surveying the test of voltage adjuster, and then be improved to be measured
The testing efficiency of voltage adjuster, when especially carrying out batch testing, it is only necessary in advance by test circuit plate and voltage adjuster
Test system connects, and then voltage adjuster to be measured can be inserted into matched test jack as needed, then passed through
Test jack is plugged into test circuit plate, realizes the connection with voltage adjuster test system.Meanwhile based on the test circuit
Plate and test jack by the test connection of voltage adjuster to be measured and voltage adjuster test system be converted into standard socket or
The connection of person's pin, avoids and is manually connected pin with the line of the test system of voltage adjuster test system, reduce and survey
Human error during examination.Therefore, voltage adjuster universal test device described herein can utilize existing test
On the basis of system, the testing efficiency and accuracy of voltage adjuster are improved.
Brief description of the drawings
Fig. 1 is the structure diagram of one embodiment of voltage adjuster universal test device provided by the utility model；
Fig. 2 is the corresponding circuit block diagram of test circuit plate provided by the utility model；
Fig. 3 is the structure diagram of one embodiment of test jack provided by the utility model.
Embodiment
For the purpose of this utility model, technical solution and advantage is more clearly understood, below in conjunction with specific embodiment, and
Referring to the drawings, the utility model is further described.
It should be noted that all statements for using " first " and " second " are for area in the utility model embodiment
Be divided to two non-equal entities of same names or non-equal parameter, it is seen that " first " " second " only for statement convenience,
The restriction to the utility model embodiment is should not be construed as, following embodiment no longer illustrates this one by one.
It is the knot of one embodiment of voltage adjuster universal test device provided by the utility model with reference to shown in Fig. 1
Structure schematic diagram.Lack the survey for some devices on the basis of versatility is considered based on existing voltage adjuster test system
Circuit board or test structure are tried, the application proposes a kind of improved test device, can make full use of existing test system
On the basis of, realize the quick test of voltage adjuster.Specifically, the voltage adjuster universal test device, including：Test
Socket 1, test circuit plate 2 and voltage adjuster test system 3；Wherein, the voltage adjuster test system 3 belongs to original
Test system, the relevant interface and function of voltage adjuster test are included in system.During connection, the test jack 1 passes through institute
Test circuit plate 2 and voltage adjuster test system 3 is stated to be connected, then by voltage adjuster to be tested by device pin with
Test jack 1 connects, and then realizes voltage adjuster to be tested with testing the connection of system.Wherein, the test circuit plate 2
Side be provided with and test 3 matched interface of system with voltage adjuster, opposite side is provided with and the matched interface of test jack；
That is, 2 one side of test circuit plate tests interface position, form or structure of system 3 etc. according to existing voltage adjuster
Information is provided with matched interface accordingly so that voltage adjuster is tested in system 3 to the phase for being used for test voltage adjuster
Interface is answered to be transferred in the test circuit plate 2.One end of the test jack 1 is connected with the test circuit plate 2, the other end
It is provided with and the matched interface of the device pin of voltage adjuster to be tested；Wherein, the interface in the test jack 1 to treat
The voltage adjuster of test is capable of being inserted into test jack of fast and stable, and then test jack 1 again can be with fast and stable
It is connected in test circuit plate 2.So that voltage adjuster to be tested passes through test jack 1 and test circuit plate 2 and voltage tune
Corresponding test interface in whole device test system 3 realizes the connection of fast and stable, and then completes voltage adjuster test.
From above-described embodiment, the voltage adjuster universal test device by test circuit plate 2 design with
The interface of voltage adjuster test system is converted on test circuit plate 2 by the interface that voltage adjuster test system 3 coordinates
The corresponding standard interface for making a reservation for target to be measured, by test jack 1 by the connection of the voltage adjuster to be measured of different model size
It is converted into the plug-in type interface corresponding with test circuit plate 2 of test jack 1 so that be directed to the voltage to be measured of different model size
The test of adjuster can be realized with the cooperation of test jack 1 by test circuit plate 2 and is quickly connected, and then improve voltage to be measured
The testing efficiency of adjuster, when especially carrying out batch testing, it is only necessary in advance test test circuit plate 2 and voltage adjuster
System 3 connects, and then voltage adjuster to be measured can be inserted into matched test jack 1 as needed, then pass through survey
Examination socket 1 is plugged into test circuit plate 2, realizes voltage adjuster to be measured and the connection of voltage adjuster test system 3.Meanwhile
Voltage adjuster to be measured is connected with the test of voltage adjuster test system 3 based on the test circuit plate 2 and test jack 1
The connection of the socket or pin of standard is converted into, is avoided pin and the test system of voltage adjuster test system 3 manually
The line connection of system, reduces the human error in test process.Therefore, voltage adjuster universal test device described herein
On the basis of using existing test system, the testing efficiency and accuracy of voltage adjuster can be improved.
In the application some optional embodiments, multi-tap 4 is further included in voltage adjuster universal test device；Institute
Test circuit plate 2 is stated to be connected with voltage adjuster test system 3 by the multi-tap 4.In this way, by designing multi-tap
4, test circuit plate 2 can be arranged to the universal test plate of standard, structure, the difference of interface without considering test system
It is different, matched using multi-tap 4 with testing the interface of system, in this way, by setting transfer plug 4 so that test circuit
Plate 2 can be at the same time suitable for different test systems, or can also be tested by multi-tap 4 and voltage adjuster
System 3 is fixedly connected, and realizes the speed and efficiency of whole test device installation, test and dismounting.In particular in batch
Measure examination and the test process using different test systems.
In the application some optional embodiments, it is provided with and multigroup is matched with test jack 1 in the test circuit plate 2
Interface group.That is, test jack by voltage adjuster test system 3 in be used for test benchmark voltage interface be converted into it is multigroup
On the one hand interface group, so can at the same time realize and multigroup voltage adjuster to be measured is tested, on the other hand, can be directed to difference
Voltage adjuster to be measured and corresponding different test jack, different test jacks matchings are arranged on test circuit plate 2
Interface group so that same voltage adjuster test system 3 and test circuit plate 2 can be realized to different model, size
Voltage adjuster is tested.
In the application some optional embodiments, spanner structure and copper sheet are provided with the test jack 1；Wherein,
The spanner structure is used for by pressing copper sheet and then the pin for controlling voltage adjuster to be measured and the bonding strength of test jack.
Namely a movable copper sheet is provided with for the position being connected with voltage adjuster to be measured and for controlling in test jack 1
Copper sheet, voltage adjuster to be measured can be pressed to by rotating or moving spanner structure by the spanner structure of copper sheet, so that
Voltage adjuster to be measured and the connection of test jack 1 are more reliable and more stable.
It is 2 corresponding circuit block diagram of test circuit plate provided by the utility model with reference to shown in Fig. 2.The test circuit
Plate is PCB printed circuit boards, and the test circuit of device is included on circuit board.Wherein, voltage source provides for voltage adjuster to be measured
Input voltage and electric current, electronic load are the output loading of voltage adjuster to be measured, realize the full power of voltage adjuster to be measured
Measurement.Test parameter in test program：Vo is output voltage：Sv is voltage regulation factor：Si is current regulation：Iq is Static Electro
Stream：Srip is Ripple Suppression ratio.That is, what test circuit plate 2 and test jack 1 can regard as to standard can quickly be connected connects
Line, is used for realization quick being connected of the voltage adjuster to be measured with voltage adjuster test system.Principle is voltage tune to be measured
The interface that whole device is used to detect voltage adjuster is connected in voltage adjuster test system accordingly.
Optionally, pogo-pin structure and compressing structure are provided with the test jack 2, and voltage adjuster uses Kai Er
Voltage adjuster to be measured and spring needle are compressed, ensured by literary two-wire connection, test jack by the compressing structure being arranged above
Effective connection of the pin and spring needle of voltage adjuster to be measured.Then test circuit plate is welded or is plugged in test jack
On.Spring needle directly compresses with the pad on circuit board and realizes that circuit is connected.Spring needle Kelvin's two-wire connection structure of use,
It ensure that the accuracy and precision of test.
It is the structure diagram of one embodiment of test jack provided by the utility model with reference to shown in Fig. 3.The survey
Groove structure 11 corresponding with voltage adjuster to be measured is provided with examination socket 1, for being positioned to voltage adjuster to be measured
And protection.The socket 12 of the device pin of voltage adjuster to be measured is provided with 11 structure of groove structure, it is to be measured for making
Voltage adjuster is capable of being realized with test jack 1 for fast and stable and is connected.The device of voltage adjuster to be measured can also so be avoided
The mistake that part pin is connected with test jack 1, improves the stability and reliability of test connection installation.
In the application some optional embodiments, checking circuit structure is additionally provided with the test circuit plate 2, is used for
Receive the pin signal of same voltage adjuster to be measured and be connected in the different units of voltage adjuster test system 3, at the same time
Realize the test and verification of voltage adjuster to be measured.That is, by one group in same test system or multigroup test interface
Different test circuits is converted into test circuit plate 2, partly as test circuit another part as checking circuit, so
Test result can be verified while voltage adjuster test is carried out, improve the accuracy and reliability of test.
In the application some optional embodiments, the interface of the test circuit plate 2 and/or the test jack 1 is set
Elastic locking structure is set to, wherein, the elastic locking structure is to be correspondingly provided with elastic construction in interface position, for causing
The pin or plug being inserted into interface fix locking.In this way, it is inserted into test jack 1 or tests in voltage adjuster to be measured
When socket 1 is plugged into test circuit plate 2, elastic locking structure will provide for an elastic pressure so that tap position connects
It is reliable and stable, the stability of test connection is improved, reduces test error.
Preferably, elastic locking structure may be arranged as controllable locking device, namely set a control unit in outside
Part, user can control the locking or relieving of elastic locking structure so that voltage adjuster to be measured and test jack or survey
The connection for trying socket and test circuit plate is more laborsaving, convenient.
In the application some optional embodiments, the voltage adjuster test system tests system for STS8108.Institute
State the voltage adjuster LT1963AES8-2.5 that voltage adjuster to be tested is SOIC encapsulation.
Voltage adjuster universal test device described herein breaches SOIC encapsulation voltage adjusters and is adjusted in voltage
Test can not be realized on device test system STS8108 by way of socket or connecting line are directly connected to, and opened using spring needle
The literary two-wire connection structure of that, both ensure that measurement accuracy, in turn ensure that the stability and reliability of measurement.
From above-described embodiment, voltage adjuster universal test device described herein is by the parameter of voltage adjuster
Resources integration needed for test is on one piece of general test board so that tester more easily can use and test, and ensure
The versatility and uniformity of voltage adjuster test.Therefore, the complicated device resource of the application installation optimization, directly offer
All required resources of voltage adjuster test, resource have simply directly been presented in face of program developer, to new hand
For also more easy to get started operate.It ensure that the uniformity of program development improves accuracy again.
Those of ordinary skills in the art should understand that：The discussion of any of the above embodiment is exemplary only, not
It is intended to imply that the scope of the present disclosure (including claim) is limited to these examples；Under the thinking of the utility model, the above is real
Applying can also be combined between the technical characteristic in example or different embodiment, and there are the utility model as described above
Many other changes of different aspect, for simplicity, they are not provided in details.Therefore, all spirit in the utility model
Within principle, any omission for being made, modification, equivalent substitution, improvement etc., should be included in the scope of protection of the utility model
Within.
In addition, to simplify explanation and discussing, and in order not to which the utility model indigestion can be made, in the attached drawing provided
In can show or can not show to be connected with the known power ground of integrated circuit (IC) chip and other components.In addition,
Device can be shown in block diagram form, to avoid making the utility model indigestion, and this have also contemplated that following facts,
Details i.e. on the embodiment of these block diagram arrangements be height depend on will implement the utility model platform (i.e.,
These details should be completely in the range of the understanding of those skilled in the art).Elaborate detail (for example, circuit) with
In the case of the exemplary embodiment for describing the utility model, it will be apparent to those skilled in the art that can be
Implement the utility model without in the case of these details or in the case that these details change.Therefore, this
A little descriptions are considered as illustrative and not restrictive.
Although having been incorporated with specific embodiment the utility model is described, according to description above, this
Many replacements of a little embodiments, modifications and variations will be apparent for those of ordinary skills.It is for example, other
Memory architecture (for example, dynamic ram (DRAM)) can use discussed embodiment.
The embodiment of the utility model is intended to fall into all such within the broad range of appended claims
Replace, modifications and variations.Therefore, where within the spirit and principles of the present invention, it is any omission for being made, modification, equivalent
Replace, improve etc., it should be included within the scope of protection of this utility model.
Claims (6)
- A kind of 1. voltage adjuster universal test device, it is characterised in that including：Test jack, test circuit plate, multi-tap And voltage adjuster test system；The test jack is tested system with voltage adjuster by test circuit plate and is connected, and Voltage adjuster to be tested is connected by device pin with test jack；Wherein, the multi-tap is provided with and voltage tune The interface of whole device test system matches, the side of the test circuit plate are by the multi-tap and voltage adjuster test System connection, opposite side are provided with and the matched interface of test jack；Described test jack one end is connected with test circuit plate, another End is provided with and the matched interface of the device pin of voltage adjuster to be tested；The voltage adjuster to be tested passes through test jack and test circuit plate and the phase in voltage adjuster test system Answer test interface to connect, complete voltage adjuster test.
- 2. voltage adjuster universal test device according to claim 1, it is characterised in that set in the test jack There are spanner structure and copper sheet；Wherein, the spanner structure is used to control the pipe of voltage adjuster to be measured by pressing copper sheet Foot and the bonding strength of test jack.
- 3. voltage adjuster universal test device according to claim 1, it is characterised in that in the test circuit plate also Checking circuit structure is provided with, for receiving the pin signal of same voltage adjuster to be measured and being connected to voltage adjuster test In the different units of system, while realize the test and verification of voltage adjuster to be measured.
- 4. voltage adjuster universal test device according to claim 1, it is characterised in that the test circuit plate and/ Or the interface of the test jack is arranged to elastic locking structure, wherein, the elastic locking structure is corresponding in interface position Elastic construction is provided with, the pin or plug for be inserted into interface fix locking.
- 5. voltage adjuster universal test device according to claim 1, it is characterised in that the voltage adjuster test System tests system for STS8108.
- 6. voltage adjuster universal test device according to claim 1, it is characterised in that the voltage tune to be tested Whole device is the voltage adjuster LT1963AES8-2.5 of SOIC encapsulation.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201720938328.7U CN207301190U (en) | 2017-07-28 | 2017-07-28 | A kind of voltage adjuster universal test device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201720938328.7U CN207301190U (en) | 2017-07-28 | 2017-07-28 | A kind of voltage adjuster universal test device |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN207301190U true CN207301190U (en) | 2018-05-01 |
Family
ID=62447662
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201720938328.7U Expired - Fee Related CN207301190U (en) | 2017-07-28 | 2017-07-28 | A kind of voltage adjuster universal test device |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN207301190U (en) |
-
2017
- 2017-07-28 CN CN201720938328.7U patent/CN207301190U/en not_active Expired - Fee Related
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| CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20180501 |
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| CF01 | Termination of patent right due to non-payment of annual fee |