CN215986180U

CN215986180U - Special golden finger for simultaneously testing high voltage of multiple ICs

Info

Publication number: CN215986180U
Application number: CN202122165988.5U
Authority: CN
Inventors: 梁大明
Original assignee: Chart Automation System Co ltd
Current assignee: Chart Automation System Co ltd
Priority date: 2021-09-08
Filing date: 2021-09-08
Publication date: 2022-03-08
Anticipated expiration: 2031-09-08

Abstract

The utility model discloses a special golden finger for simultaneously testing high voltage of a plurality of ICs, which comprises: golden finger reed, golden finger location adhesive tape, golden finger spring body, golden finger plastic body, golden finger mounting groove, golden finger tail insert, a special golden finger high-pressure test of many IC high-pressure test simultaneously, n IC slide to the test position simultaneously, golden finger reed contact n IC pins simultaneously, N IC of different foot intervals also can use same pair golden finger to test in addition, because the distance between the golden finger reed is very close, even if the IC distance difference also can make golden finger reed and all IC pins fully contact between two adjacent. The utility model not only solves the problem of high-voltage test of a plurality of ICs at the same time, but also solves the problem that the ICs with different pin pitches can be tested only by matching one kind of gold finger without matching the gold finger with the corresponding pin pitch when in high-voltage test, and simultaneously improves the efficiency and the productivity.

Description

Special golden finger for simultaneously testing high voltage of multiple ICs

Technical Field

The utility model relates to finished product high-voltage testing of Integrated Circuits (ICs), in particular to a special golden finger for simultaneously testing multiple ICs at high voltage.

Background

When an Integrated Circuit (IC) is tested at high voltage, one IC is tested and then the next IC is tested, and the test mode is slow, low in hourly output and low in efficiency. In addition, the IC testing different pin pitches needs to be matched with the gold fingers with corresponding pin pitches, otherwise, the short circuit between adjacent pins cannot be tested.

SUMMERY OF THE UTILITY MODEL

Aiming at the defects of the prior art, the utility model aims to overcome the defects of the prior art and provide a special golden finger for simultaneously testing multiple ICs under high voltage, which improves the hourly yield.

The technical scheme for realizing the utility model is as follows: a special golden finger for simultaneously testing high voltage of a plurality of ICs comprises: the special golden finger of many IC high-pressure test simultaneously sets up for a pair of and symmetry, and single golden finger divide into two-layerly again, the golden finger reed be located the head of golden finger spring body, cut into n reeds by the equidistant cutting of golden finger spring body and constitute, the distance between each golden finger reed is very close, the golden finger reed keeps very strong pliability and elasticity.

Furthermore, the inner layer of the single golden finger comprises a golden finger spring, a golden finger spring body, an internal spring body of a golden finger plastic body and a metal spring inserted on the golden finger tail, and the inner layer is integrated and made of alloy materials.

Furthermore, the golden finger spring body and the internal spring body of the golden finger plastic body are integral reeds, and a round golden finger positioning adhesive tape is arranged between the golden finger reeds and the golden finger spring body.

Further, the golden finger plastic body is arranged at the lower end of the golden finger spring body and used for forming a golden finger, the two layers of golden finger spring bodies and the two layers of spring leaves are fixed, and a golden finger mounting groove is formed in the inner side of the golden finger plastic body and used for mounting and fixing the whole golden finger.

Furthermore, the tail end of the golden finger plastic body is a golden finger tail plug, the inside of the golden finger tail plug is a plastic body connected with the golden finger plastic body, the two outer sides of the golden finger tail plug are reeds which are respectively connected with the inner layer of golden finger spring body and the outer layer of golden finger spring body and cut at equal intervals, and the center distance of the two adjacent reeds is the center distance of the wild-mouth socket.

The utility model has the advantages that: the special golden finger structure for simultaneously testing the multiple ICs at high voltage solves the problem of simultaneously testing the multiple ICs at high voltage, and also solves the problem that the ICs with different pin pitches do not need to be matched with the corresponding golden fingers when testing the high voltage, the test can be carried out by only matching one golden finger, and meanwhile, the efficiency and the productivity are improved.

Drawings

FIG. 1 is a schematic view of the structure of the present invention.

The reference numbers in the figures illustrate: 1. the golden finger spring leaf 2, the golden finger positioning adhesive tape 3, the golden finger spring body 4, the golden finger plastic body 5, the golden finger mounting groove 6 and the golden finger tail plug.

Detailed Description

In the description of the present invention, it is to be understood that the terms "center", "lateral", "upper", "lower", "left", "right", "vertical", "horizontal", "top", "bottom", "inner", "outer", etc., indicate orientations or positional relationships based on those shown in the drawings, and are used only for convenience in describing the present invention and for simplicity in description, and do not indicate or imply that the referenced devices or elements must have a particular orientation, be constructed in a particular orientation, and be operated, and thus, should not be construed as limiting the present invention. Furthermore, the terms "first", "second" and "first" are used for descriptive purposes only and are not to be construed as indicating or implying relative importance or implicitly indicating the number of technical features indicated. Thus, a feature defined as "first" or "second" may explicitly or implicitly include one or more of that feature. In the description of the present invention, "a plurality" means two or more unless otherwise specified. Furthermore, the term "comprises" and any variations thereof is intended to cover non-exclusive inclusions.

How the utility model can be realized is further explained in the following with the attached drawings:

as shown in fig. 1, a gold finger dedicated for simultaneously testing multiple ICs under high voltage includes: the special gold finger for simultaneously testing multiple ICs is used symmetrically, each edge gold finger is divided into two layers, the inner layer gold finger reed 1, the inner layer gold finger spring body 3, the inner spring body of the gold finger plastic body 4 and the metal reed on the gold finger tail plug 6 are integrated, and the materials are special alloy materials; the golden finger spring plates 1 are positioned at the head parts of the golden finger spring bodies 3 and are formed by cutting the golden finger spring bodies into n spring plates at equal intervals, the distance between every two golden finger spring plates 1 is very close, and the golden finger spring plates 1 keep very strong flexibility and elasticity; the golden finger spring bodies 3 and the spring bodies in the golden finger plastic bodies 4 are spring pieces which are not cut in a whole piece, and a golden finger positioning adhesive tape 2 formed by one-time plastic package is arranged between the golden finger spring pieces 1 and the golden finger spring bodies 3 and is round, so that the golden finger spring pieces 1 are reinforced, the deformation is reduced, and the inner and outer layers of metal spring pieces are positioned to keep the same distance from top to bottom; the golden finger plastic body 4 is plastically packaged at the lower end of the golden finger spring body 3 and is used for forming a golden finger, two layers of golden finger spring bodies and spring leaves are fixed, and a golden finger mounting groove 5 is formed in the inner side of the golden finger plastic body 4 and used for mounting and fixing the whole golden finger; the end of the golden finger plastic body 4 is provided with a golden finger tail insert 6, the inside of the golden finger tail insert 6 is provided with a plastic body connected with the golden finger plastic body 4, the two sides of the outside are provided with reeds which are respectively connected with the inner and outer layers of golden finger spring bodies 3 and are cut at equal intervals, and the center distance between two adjacent reeds is the center distance of the wild-mouth socket, so that the golden finger tail insert is convenient to use in a matching way; during high-voltage testing, n ICs slide down to the testing position simultaneously, the two golden finger reeds 1 clamp inwards simultaneously, the two golden finger reeds 1 contact pins of the n ICs simultaneously, in addition, the n ICs with different pin intervals can also be tested by using the same pair of golden fingers, and because the distance between the golden finger reeds is very close, the golden finger reeds 1 can be in full contact with all IC pins even if the distances between the two adjacent ICs are different.

Therefore, the problem of simultaneous high-voltage test of a plurality of ICs is solved, the problem that the ICs with different pin intervals are not required to be matched with the golden fingers with corresponding pin intervals during high-voltage test is solved, the test can be carried out only by matching one golden finger, and meanwhile, the efficiency and the productivity are improved.

The present invention and its embodiments have been described above, and the description is not intended to be limiting, and the drawings are only one embodiment of the present invention, and the actual structure is not limited thereto. In summary, those skilled in the art should appreciate that they can readily use the disclosed conception and specific embodiments as a basis for designing or modifying other structures for carrying out the same purposes of the present invention without departing from the spirit and scope of the utility model as defined by the appended claims.

Claims

1. A special golden finger for simultaneously testing high voltage of a plurality of ICs is characterized by comprising: the special golden fingers for the simultaneous high-voltage test of the multiple ICs are symmetrically arranged in a pair, a single golden finger is divided into two layers, and the golden finger reeds are located at the head of the golden finger spring body and are formed by cutting the golden finger spring body into n reeds at equal intervals.

2. The special gold finger for the simultaneous high-voltage test of multiple ICs according to claim 1, characterized in that: the inner layer of each golden finger comprises a golden finger spring, a golden finger spring body, an internal spring body of a golden finger plastic body and a metal spring plate inserted on the golden finger tail, and the inner layer is integrated and made of alloy materials.

3. The special gold finger for the simultaneous high-voltage test of multiple ICs according to claim 1, characterized in that: the golden finger spring body and the internal spring body of the golden finger plastic body are integral reeds, and a round golden finger positioning adhesive tape is arranged between the golden finger reeds and the golden finger spring body.

4. The special gold finger for the simultaneous high-voltage test of multiple ICs according to claim 1, characterized in that: the golden finger plastic body is arranged at the lower end of the golden finger spring body and used for forming a golden finger and fixing the two layers of golden finger spring bodies and the reed, and a golden finger mounting groove is formed in the inner side of the golden finger plastic body and used for mounting and fixing the whole golden finger.

5. The special gold finger for the simultaneous high-voltage test of multiple ICs according to claim 1, characterized in that: the tail end of the golden finger plastic body is provided with a golden finger tail insert, the inside of the golden finger tail insert is provided with a plastic body connected with the golden finger plastic body, the two outer sides of the golden finger tail insert are provided with reeds which are respectively connected with the inner layer of golden finger spring body and the outer layer of golden finger spring body and are cut at equal intervals, and the center distance between every two adjacent reeds is the center distance of the wild-mouth socket.