CN215953682U - Sucking disc suitable for high reliability chip test - Google Patents
Sucking disc suitable for high reliability chip test Download PDFInfo
- Publication number
- CN215953682U CN215953682U CN202122236342.1U CN202122236342U CN215953682U CN 215953682 U CN215953682 U CN 215953682U CN 202122236342 U CN202122236342 U CN 202122236342U CN 215953682 U CN215953682 U CN 215953682U
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- negative pressure
- pipe
- fixedly connected
- pressure relief
- top surface
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Abstract
The utility model discloses a sucker suitable for high-reliability chip testing, and belongs to the technical field of chip detection. The utility model provides a sucking disc suitable for high reliability chip test, includes the testboard, and a plurality of negative pressure holes have been seted up at testboard top surface middle part, and testboard top surface middle part fixedly connected with seal ring, seal ring downside are equipped with the negative pressure box, and negative pressure box bottom surface middle part fixedly connected with negative pressure pipe is equipped with the check valve in the negative pressure pipe, and negative pressure box left wall fixedly connected with pressure release pipe is equipped with pressure release mechanism in the pressure release pipe. According to the utility model, by pressing the front end of the adjusting plate, the rear part of the adjusting plate drives the pressure release valve to be in butt joint with the limiting ring B, and air is slowly filled into the negative pressure box through the pressure release hole, so that the negative pressure suction force of the negative pressure box is gradually reduced, the chip can be conveniently taken down, the operation is simple, and the efficiency is improved.
Description
Technical Field
The utility model relates to the technical field of chip detection, in particular to a sucker suitable for high-reliability chip testing.
Background
After the chip is packaged in the packaging factory, final testing of the finished product is performed. Currently, a common testing method is to perform testing on automatic testing equipment. During the testing process, the chip on the feeding mechanism is usually automatically obtained by the transferring device, and then the chip is placed into the testing module for testing. Before testing, the chip needs to be adsorbed and fixed by the sucking disc and then is tested. The current suction cups for chip testing are generally connected with an external negative pressure machine, absorb the chip by suction, however, when the suction force is cancelled, the chip will automatically slide off and easily damage the chip surface, and the patent document with the prior art publication number of CN213381230U provides a suction cup suitable for high-reliability chip testing, the device includes the sucking disc body, two spacing grooves have been seted up to the up end symmetry of sucking disc body, equal fixed mounting has servo motor in the lateral wall of every spacing groove, servo motor's output fixed mounting has the threaded rod, threaded connection has the screw thread piece on every threaded rod, the upper end fixed mounting of screw thread piece has the fixed block, two relative one sides of fixed block respectively fixed mounting have two connecting plates, the equal fixed mounting of lower terminal surface of every connecting plate has telescopic cylinder, every telescopic cylinder all has the mounting panel through piston rod fixed mounting.
Although the device has more beneficial effects, the following problems still exist: the device prevents through the surface that the clamp plate pushed down the chip and drops, but the clamp plate can influence the test of chip, and if clamp plate dynamics control is improper, causes the damage to the chip surface easily, and the clamp plate needs the back and forth movement when pushing down the chip simultaneously, influences work efficiency, leads to the practicality relatively poor. In view of the above, we propose a chuck suitable for high reliability chip testing.
SUMMERY OF THE UTILITY MODEL
1. Technical problem to be solved
The present invention is directed to a chuck for testing a chip with high reliability, so as to solve the problems mentioned in the background art.
2. Technical scheme
A sucker suitable for high-reliability chip testing comprises a test board, wherein a plurality of negative pressure holes are formed in the middle of the top surface of the test board, a sealing washer is fixedly connected to the middle of the top surface of the test board, a negative pressure box is arranged on the lower side of the sealing washer, a negative pressure pipe is fixedly connected to the middle of the bottom surface of the negative pressure box, the right end of the negative pressure pipe penetrates through the test board and extends to the outside, a one-way valve is arranged in the negative pressure pipe and comprises a limiting ring A, a limiting ball is in butt fit with the right part of the limiting ring A, a spring A is fixedly connected to the right part of the limiting ball, a pressure relief pipe is fixedly connected to the left wall of the negative pressure box, a pressure relief mechanism is arranged in the pressure relief pipe and comprises a limiting ring B, a pressure relief plug is in butt fit with the upper part of the limiting ring B, a connecting rod is fixedly connected to the middle of the top surface of the pressure relief plug, and a spring B is sleeved outside the connecting rod, the upper end of the connecting rod penetrates through the pressure relief pipe to extend to the outer side and is connected with an adjusting plate in a sliding mode, and the adjusting plate is connected with the test board in a rotating mode through the rotating seat.
Preferably, the top surface of the negative pressure box is fixedly connected with the inner top surface of the test board.
Preferably, the limiting ring A and the spring A are both fixedly connected with the inner wall of the negative pressure pipe.
Preferably, the pressure release pipe is L style of calligraphy structure, just a plurality of pressure release holes have been seted up to the pressure release pipe top surface, the pressure release pipe upper end is connected fixedly with the testboard.
Preferably, the limiting ring B is fixedly connected with the inner wall of the pressure relief pipe, and the connecting rod is connected with the upper end of the pressure relief pipe in a sliding manner.
3. Advantageous effects
Compared with the prior art, the utility model has the advantages that:
1. according to the utility model, when the negative pressure suction chip is formed in the negative pressure box and fixed, the front end of the adjusting plate is pressed, the rear part of the adjusting plate drives the connecting rod to move upwards in the pressure release pipe, the connecting rod drives the pressure release valve to be not abutted with the limiting ring B, air is slowly filled into the negative pressure box through the pressure release hole, so that the negative pressure suction force of the negative pressure box is gradually reduced, and meanwhile, the sealing washer can effectively prevent the chip from falling off, so that the chip can be conveniently taken down, the operation is simple, and the efficiency is improved.
2. According to the utility model, when the negative pressure in the negative pressure box reaches a certain degree, the chip can be firmly adsorbed by the sealing washer, and meanwhile, the negative pressure state can be kept in the negative pressure box for a long time by the one-way valve arranged in the negative pressure pipe, so that the working output of an external negative pressure machine is reduced, the energy is saved, and the emission is reduced.
Drawings
FIG. 1 is a schematic view of the overall structure of the present invention;
FIG. 2 is a schematic diagram of an internal structure of the testing table of the present invention;
FIG. 3 is a schematic view of the anatomical structure of the pressure relief mechanism and pressure relief tube of the present invention;
FIG. 4 is an enlarged anatomical illustration of the structure at A in the present invention;
the reference numbers in the figures illustrate: 1. a test bench; 2. a negative pressure hole; 3. a sealing gasket; 4. a negative pressure box; 5. a negative pressure tube; 6. a one-way valve; 601. a limiting ring A; 602. a limiting ball; 603. a spring A; 7. a pressure relief pipe; 701. a pressure relief vent; 8. a pressure relief mechanism; 801. a limiting ring B; 802. a pressure relief plug; 803. a connecting rod; 804. a spring B; 805. an adjusting plate; 9. and (6) rotating the seat.
Detailed Description
In the description of the present invention, it is to be understood that the terms "center", "longitudinal", "lateral", "length", "width", "thickness", "upper", "lower", "front", "rear", "left", "right", "vertical", "horizontal", "top", "bottom", "inner", "outer", "clockwise", "counterclockwise", and the like, indicate orientations and positional relationships based on those shown in the drawings, and are used only for convenience of description and simplicity of description, and do not indicate or imply that the equipment or element being referred to must have a particular orientation, be constructed and operated in a particular orientation, and thus, should not be considered as limiting the present invention.
In the description of the present invention, "a plurality" means two or more unless specifically defined otherwise.
In the description of the present invention, it should be noted that, unless otherwise explicitly specified or limited, the terms "mounted," "disposed," "sleeved/connected," "connected," and the like are to be construed broadly, e.g., "connected," which may be fixedly connected, detachably connected, or integrally connected; can be mechanically or electrically connected; they may be connected directly or indirectly through intervening media, or they may be interconnected between two elements. The specific meanings of the above terms in the present invention can be understood in specific cases to those skilled in the art.
Referring to fig. 1-4, the present invention provides a technical solution:
a sucker suitable for high-reliability chip testing comprises a testing platform 1, wherein the middle part of the top surface of the testing platform 1 is provided with a plurality of negative pressure holes 2, the middle part of the top surface of the testing platform 1 is fixedly connected with a sealing washer 3, the lower side of the sealing washer 3 is provided with a negative pressure box 4, the middle part of the bottom surface of the negative pressure box 4 is fixedly connected with a negative pressure pipe 5, the right end of the negative pressure pipe 5 passes through the testing platform 1 and extends to the outside, a one-way valve 6 is arranged in the negative pressure pipe 5, the one-way valve 6 comprises a limiting ring A601, the right part of the limiting ring A601 is in butt joint with a limiting ball 602, the right part of the limiting ball 602 is fixedly connected with a spring A603, the left wall of the negative pressure box 4 is fixedly connected with a pressure relief pipe 7, a pressure relief mechanism 8 is arranged in the pressure relief pipe 7, the pressure relief mechanism 8 comprises a limiting ring B801, the upper part of the limiting ring B801 is in butt joint with a pressure relief plug 802, the middle part of the top surface of the pressure relief plug 802 is fixedly connected with a connecting rod 803, a spring B804, the outer sleeve of the connecting rod 803, the upper end of the connecting rod 803 passes through the pressure relief pipe 7 and extends to the outer side and is connected with an adjusting plate 805 in a sliding way, the adjusting plate 805 is rotatably connected to the test table 1 via a rotating base 9. The right end of a negative pressure pipe 5 in the utility model is connected with an external negative pressure machine, when the chip negative pressure machine is used, the chip is placed on a sealing washer 3, the negative pressure machine pumps the interior of a negative pressure box 4 to be in a negative pressure state to suck the chip, at the moment, the negative pressure machine can stop outputting, a spring A603 drives a limiting ball 602 to abut against a limiting ring A601, the negative pressure state in the negative pressure box 4 can be kept, the front end of an adjusting plate 805 is pressed, the rear part of the adjusting plate 805 drives a connecting rod 803 to move upwards in a pressure relief pipe 7, the connecting rod 803 drives a pressure relief valve 802 to abut against a limiting ring B801 to be cancelled, air is slowly filled into the negative pressure box 4 through a pressure relief hole 701, the negative pressure suction force of the negative pressure box 4 is gradually reduced, and the chip is taken down.
Specifically, the top surface of the negative pressure box 4 is fixedly connected with the inner top surface of the test board 1.
Furthermore, the limiting ring A601 and the spring A603 are fixedly connected with the inner wall of the negative pressure pipe 5.
Still further, the pressure release pipe 7 is L style of calligraphy structure, and a plurality of pressure release holes 701 have been seted up to 7 top surfaces of pressure release pipe, and 7 upper ends of pressure release pipe are connected fixedly with testboard 1.
Furthermore, the limiting ring B801 is fixedly connected with the inner wall of the pressure relief pipe 7, and the connecting rod 803 is slidably connected with the upper end of the pressure relief pipe 7.
The working principle is as follows: when the chip taking-off device is used, the right end of the negative pressure pipe 5 is connected with an external negative pressure machine, when the chip taking-off device is used, a chip is placed on the sealing washer 3, the negative pressure machine pumps the interior of the negative pressure box 4 to be in a negative pressure state, negative pressure in the negative pressure box 4 is matched with the sealing washer 3 to firmly suck the chip, at the moment, the negative pressure machine can stop outputting, the spring A603 drives the limiting ball 602 to be abutted against the limiting ring A601, the negative pressure state in the negative pressure box 4 can be kept, the front end of the adjusting plate 805 is pressed downwards, the rear part of the adjusting plate 805 drives the connecting rod 803 to move upwards in the pressure-releasing pipe 7, the connecting rod 803 drives the pressure-releasing valve 802 to be canceled from abutting against the limiting ring B801, air is slowly filled into the negative pressure box 4 through the pressure-releasing hole 701, so that the negative pressure suction force of the negative pressure box 4 is gradually reduced, and the chip is taken off.
The foregoing shows and describes the general principles, essential features, and advantages of the utility model. It will be understood by those skilled in the art that the present invention is not limited to the embodiments described above, and the preferred embodiments of the present invention are described in the above embodiments and the description, and are not intended to limit the present invention. The scope of the utility model is defined by the appended claims and equivalents thereof.
Claims (5)
1. The utility model provides a sucking disc suitable for high reliability chip test, includes testboard (1), its characterized in that: the test bench is characterized in that a plurality of negative pressure holes (2) are formed in the middle of the top surface of the test bench (1), a sealing washer (3) is fixedly connected to the middle of the top surface of the test bench (1), a negative pressure box (4) is arranged on the lower side of the sealing washer (3), a negative pressure pipe (5) is fixedly connected to the middle of the bottom surface of the negative pressure box (4), the right end of the negative pressure pipe (5) penetrates through the test bench (1) and extends to the outside, a check valve (6) is arranged in the negative pressure pipe (5), the check valve (6) comprises a limiting ring A (601), the right part of the limiting ring A (601) is in butt fit with a limiting ball (602), the right part of the limiting ball (602) is fixedly connected with a spring A (603), the left wall of the negative pressure box (4) is fixedly connected with a pressure relief pipe (7), a mechanism (8) is arranged in the pressure relief pipe (7), and the pressure relief mechanism (8) comprises a limiting ring B (801), spacing ring B (801) upper portion butt cooperation has pressure relief stopper (802), pressure relief stopper (802) top surface middle part fixedly connected with connecting rod (803), connecting rod (803) outside cover is equipped with spring B (804), connecting rod (803) upper end is passed pressure relief pipe (7) and is extended to the outside and sliding connection has regulating plate (805), regulating plate (805) are connected with testboard (1) rotation through rotating seat (9).
2. The chuck of claim 1, wherein: the top surface of the negative pressure box (4) is fixedly connected with the inner top surface of the test board (1).
3. The chuck of claim 1, wherein: the limiting ring A (601) and the spring A (603) are fixedly connected with the inner wall of the negative pressure pipe (5).
4. The chuck of claim 1, wherein: the pressure relief pipe (7) is of an L-shaped structure, a plurality of pressure relief holes (701) are formed in the top face of the pressure relief pipe (7), and the upper end of the pressure relief pipe (7) is fixedly connected with the test board (1).
5. The chuck of claim 1, wherein: the limiting ring B (801) is fixedly connected with the inner wall of the pressure relief pipe (7), and the connecting rod (803) is connected with the upper end of the pressure relief pipe (7) in a sliding mode.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN202122236342.1U CN215953682U (en) | 2021-09-15 | 2021-09-15 | Sucking disc suitable for high reliability chip test |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN202122236342.1U CN215953682U (en) | 2021-09-15 | 2021-09-15 | Sucking disc suitable for high reliability chip test |
Publications (1)
Publication Number | Publication Date |
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CN215953682U true CN215953682U (en) | 2022-03-04 |
Family
ID=80429863
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CN202122236342.1U Expired - Fee Related CN215953682U (en) | 2021-09-15 | 2021-09-15 | Sucking disc suitable for high reliability chip test |
Country Status (1)
Country | Link |
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CN (1) | CN215953682U (en) |
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2021
- 2021-09-15 CN CN202122236342.1U patent/CN215953682U/en not_active Expired - Fee Related
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Legal Events
Date | Code | Title | Description |
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GR01 | Patent grant | ||
GR01 | Patent grant | ||
CF01 | Termination of patent right due to non-payment of annual fee | ||
CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20220304 |