CN217360006U - Flash memory chip test jig - Google Patents
Flash memory chip test jig Download PDFInfo
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- CN217360006U CN217360006U CN202221104349.6U CN202221104349U CN217360006U CN 217360006 U CN217360006 U CN 217360006U CN 202221104349 U CN202221104349 U CN 202221104349U CN 217360006 U CN217360006 U CN 217360006U
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- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02D—CLIMATE CHANGE MITIGATION TECHNOLOGIES IN INFORMATION AND COMMUNICATION TECHNOLOGIES [ICT], I.E. INFORMATION AND COMMUNICATION TECHNOLOGIES AIMING AT THE REDUCTION OF THEIR OWN ENERGY USE
- Y02D10/00—Energy efficient computing, e.g. low power processors, power management or thermal management
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Abstract
The utility model provides a flash memory chip test jig, which relates to the technical field of chip test jigs and aims to solve the problems that the prior flash memory chip test jig needs to consume a large amount of force when a fixed sucker is separated from a contact surface, so that the separation is not convenient enough, and the prior flash memory chip test jig is still lack of an effective compression structure, so that the flash memory chip has poor stability during testing, and comprises a main test board; the bottom of the main test board is provided with an adsorption fixing piece, and the left side and the right side of the adsorption fixing piece are respectively provided with a negative pressure adjusting part and a sealing mechanism; a rotating support plate is fixedly connected to the right side of the upper end face of the main test plate, and a pressing mechanism is rotatably connected to the rotating support plate; through sealing mechanism's setting to make the sucking disc when separating with the contact surface, need not to consume great strength, thereby make the main test board more convenient when separating with the contact surface, through hold-down mechanism's setting, improved the steadiness of the flash memory chip of installation on the main test seat when the test moreover.
Description
Technical Field
The utility model belongs to the technical field of the chip testing frame, more specifically says, in particular to flash memory chip testing frame.
Background
The flash memory refers to the most commonly used semiconductor memory chip without losing information when power is off, has the advantages of small volume, low power consumption and difficult physical damage, and is an ideal storage medium of a mobile digital product, and the current flash memory chip can be generally used in a test frame when being tested.
For example, application No.: the multifunctional flash memory chip testing frame in CN202021426607.3 comprises a main testing board and an auxiliary testing board, wherein the auxiliary testing board is movably connected with one side of the main testing board; can utilize the articulated elements to roll out it from the standing groove when using the auxiliary plate body, when not using or depositing the test jig, also can utilize the articulated elements to roll over into the inner chamber of standing groove with the auxiliary plate body. A plurality of first slots are formed in the surface of a main board body, a main test seat is further inserted into an inner cavity of each first slot, a corresponding flash memory chip can be installed in an inner cavity of the upper end of each main test seat, corresponding flash memory chips can be installed in an inner cavity of the upper end of each auxiliary test seat, when the flash memory chips are tested, the flash memory chips can be placed in the main test seat and the auxiliary test seats respectively, a USB interface and a power interface are switched on respectively, the flash memory chips are tested simultaneously, and compared with a traditional single flash memory chip testing method, the testing efficiency is also higher.
Flash memory chip test frame in the above-mentioned patent is when using, though can be fixed the main testing board to the contact surface through fixed sucking disc, avoid taking place to rock or incline and influence the test accuracy, but fixed sucking disc on the above-mentioned flash memory chip test frame is when separating with the contact surface, need consume great strength, thereby it is convenient inadequately when separating with the contact surface to make the main testing board, and still lack effectual compact structure on the above-mentioned flash memory chip test frame, thereby make the flash memory chip of installation on the main test seat relatively poor when the test.
Therefore, in view of the above, research and improvement are made for the existing structure and defects, and a flash memory chip test rack is provided to achieve the purpose of higher practical value.
SUMMERY OF THE UTILITY MODEL
In order to solve the technical problem, the utility model provides a flash memory chip test jig to solve the fixed suction cup on the current flash memory chip test jig and need consume great strength when separating with the contact surface, thereby it is not convenient enough, still lack effectual compact structure on the current flash memory chip test jig moreover, make the relatively poor problem of steadiness when the test of flash memory chip.
The utility model relates to a purpose and efficiency of flash memory chip test jig is reached by following concrete technological means:
a flash memory chip test frame comprises a main test board; the bottom of the main test board is provided with an adsorption fixing piece, and the left side and the right side of the adsorption fixing piece are respectively provided with a negative pressure adjusting part and a sealing mechanism; a rotating support plate is fixedly connected to the right side of the upper end face of the main test plate, and a pressing mechanism is rotatably connected to the rotating support plate; the adsorption fixing piece comprises four suckers and communicating pipes, the number of the suckers is four, the four suckers are respectively and fixedly connected at four corners of the bottom end face of the main test board, and the four suckers are communicated with one another through three communicating pipes.
Furthermore, the main test seat is installed to the main test board up end, and main test board up end left side fixedly connected with joint board, joint board left end face upper middle side fixedly connected with joint frame.
Furthermore, the adsorption fixing part also comprises a negative pressure pipe and an air inlet pipe, wherein the negative pressure pipe is connected to the left communicating pipe, and the air inlet pipe is connected to the right communicating pipe; the open ends of the negative pressure pipe and the air inlet pipe are distributed in a bent shape of ninety degrees upwards.
Further, the negative pressure adjusting part comprises an Contraband-shaped supporting plate, an adjusting nut, an adjusting screw rod, a sliding plate and a piston rod, wherein the Contraband-shaped supporting plate is fixedly connected to the negative pressure pipe, the inner side of the Contraband-shaped supporting plate is fixedly connected with four vertical guide rods, the outer parts of the four vertical guide rods are slidably connected with the sliding plate, and the upper end surface of the sliding plate is rotatably connected with the adjusting screw rod; the upper end of the adjusting screw penetrates through the top of the Contraband-shaped supporting plate, an adjusting nut is connected to the outside of the adjusting screw through threads, and the adjusting nut is installed at the top of the Contraband-shaped supporting plate; the bottom end face of the sliding plate is fixedly connected with a piston rod, and a piston is arranged at the lower end of the piston rod.
Furthermore, the piston at the lower end of the piston rod is positioned in the negative pressure pipe, and the outer peripheral surface of the piston at the lower end of the piston rod is in close contact with the inner peripheral surface of the negative pressure pipe.
Furthermore, the pressing mechanism comprises a pressing plate, a T-shaped sliding rod, a pressing plate, rectangular through openings and an elastic buckle, the pressing plate is rotatably connected to the upper end of the rotating support plate, the left side of the upper end face of the pressing plate is provided with two rectangular through openings, and a guide rod is arranged inside each rectangular through opening; an elastic buckle is connected to the inside of each rectangular through hole in a sliding mode through a guide rod, and a spring is sleeved on each guide rod and located inside each rectangular through hole; four pressure strips are connected to the pressure plate through T-shaped sliding rods in a sliding mode, and springs are sleeved on the bottom of each T-shaped sliding rod and located at the bottom of the pressure plate.
Furthermore, when the pressing mechanism is in a pressing state, the pressing plate is in a closing state, the two elastic buckles are clamped with the inner side of the clamping frame, and the four pressing plates are respectively located at the upper parts of the four main test seats.
Furthermore, the sealing mechanism comprises a rectangular frame, a threaded rod, a driving plate, a nut and a sealing plug, the rectangular frame is arranged outside the air inlet pipe, the driving plate is connected inside the rectangular frame in a sliding mode, and the upper end face of the driving plate is connected with the threaded rod penetrating through the top of the rectangular frame in a rotating mode; the outer part of the threaded rod is connected with a nut through threads, the nut is fixedly connected to the top end face of the rectangular frame, and the nut is in threaded connection with the threaded rod; the bottom end face of the driving plate is provided with a sealing plug, and the sealing plug is inserted into the air inlet pipe.
Compared with the prior art, the utility model discloses following beneficial effect has:
through sealing mechanism's setting, when needs are separated sucking disc and contact surface, the manual threaded rod that rotates of accessible, make the threaded rod take driving plate and sealing plug rebound under the effect of nut internal thread, thereby make the sealing plug extract from the intake pipe is inside, thereby make the intake pipe opening lose sealed effect, thereby make outside air enter into the intake pipe, inside communicating pipe and four sucking discs, thereby make the sucking disc can be fast and the contact surface separation, thereby make the sucking disc when separating with the contact surface, need not to consume great strength, thereby it is more convenient when separating with the contact surface to make the main test panel.
Through hold-down mechanism's setting, close through compressing tightly the plate, make two elastic buckle joints to joint frame inboard to the messenger compresses tightly the plate and can obtain effectual fixed action after closing, then the pressure plate bottom end face will with flash memory chip up end in close contact with, thereby make flash memory chip can obtain effectual effect of compressing tightly on main test seat, thereby improved the flash memory chip of installation on the main test seat steadiness when the test.
Through the setting of negative pressure regulating part, when the inside negative pressure intensity of negative pressure pipe is adjusted to needs, through rotating adjusting screw, make adjusting screw drive the sliding plate rebound under the screw thread effect, thereby make the sliding plate drive piston rod and piston rebound, thereby make the inside negative pressure intensity of negative pressure pipe obtain improving, thereby make communicating pipe and four inside negative pressure intensity of sucking disc obtain improving, thereby the absorption dynamics of sucking disc has been strengthened, thereby the stability of main testing board when using on the contact surface has been improved to the step one.
Drawings
Fig. 1 is a schematic view of a first view structure of the present invention.
Fig. 2 is a schematic view of a second viewing angle structure according to the present invention.
Fig. 3 is a schematic structural view of the pressure strip of the present invention in an open state.
Fig. 4 is a schematic structural view of the adsorption fixing member and the negative pressure adjusting part after being disassembled.
Fig. 5 is a schematic structural view of the detachable compact plate and T-shaped sliding rod of the present invention.
Fig. 6 is a schematic diagram of a partially enlarged structure at a in fig. 5 according to the present invention.
Fig. 7 is a schematic structural view of the sealing mechanism of the present invention.
In the drawings, the corresponding relationship between the component names and the reference numbers is as follows:
1. a main test board; 101. a main test seat; 102. rotating the support plate; 103. a clamping and connecting plate; 104. clamping the frame; 2. adsorbing the fixing piece; 201. a suction cup; 202. a negative pressure tube; 203. an air inlet pipe; 204. a communicating pipe; 3. a negative pressure adjusting section; 301. contraband font back plane; 302. adjusting the nut; 303. adjusting the screw rod; 304. a sliding plate; 305. a piston rod; 4. a hold-down mechanism; 401. compressing the plate; 402. a T-shaped slide bar; 403. a compression plate; 404. a rectangular through opening; 405. elastic buckle; 5. a sealing mechanism; 501. a rectangular frame; 502. a threaded rod; 503. driving the plate; 504. a nut; 505. and (4) sealing the plug.
Detailed Description
The following describes embodiments of the present invention in further detail with reference to the accompanying drawings and examples. The following examples are intended to illustrate the invention, but are not intended to limit the scope of the invention.
In the description of the present invention, "a plurality" means two or more unless otherwise specified; the terms "upper", "lower", "left", "right", "inner", "outer", "front", "rear", "head", "tail", and the like indicate orientations or positional relationships based on the orientations or positional relationships shown in the drawings, and are merely for convenience of description and simplicity of description, and do not indicate or imply that the device or element being referred to must have a particular orientation, be constructed and operated in a particular orientation, and thus, should not be construed as limiting the present invention. Furthermore, the terms "first," "second," "third," and the like are used for descriptive purposes only and are not to be construed as indicating or implying relative importance.
In the description of the present invention, it is to be noted that, unless otherwise explicitly specified or limited, the terms "connected" and "connected" are to be interpreted broadly, and may be, for example, fixedly connected, detachably connected, or integrally connected; can be mechanically or electrically connected; may be directly connected or indirectly connected through an intermediate. The specific meaning of the above terms in the present invention can be understood in specific cases to those skilled in the art.
Example (b):
as shown in figures 1 to 7:
the utility model provides a flash memory chip testing frame, which comprises a main testing board 1; the bottom of the main test board 1 is provided with an adsorption fixing piece 2, and the left side and the right side of the adsorption fixing piece 2 are respectively provided with a negative pressure adjusting part 3 and a sealing mechanism 5; a rotating support plate 102 is fixedly connected to the right side of the upper end face of the main test plate 1, and a pressing mechanism 4 is rotatably connected to the rotating support plate 102; the adsorption fixing part 2 comprises four suckers 201 and communicating pipes 204, the number of the suckers 201 is four, the four suckers 201 are respectively and fixedly connected to four corners of the bottom end face of the main test board 1, and the four suckers 201 are communicated through the three communicating pipes 204; the adsorption fixing part 2 also comprises a negative pressure pipe 202 and an air inlet pipe 203, wherein the negative pressure pipe 202 is connected to one communicating pipe 204 on the left side, and the air inlet pipe 203 is connected to one communicating pipe 204 on the right side; the open ends of the negative pressure pipe 202 and the air inlet pipe 203 are bent upwards by ninety degrees; main test seat 101 is installed to the main testing board 1 up end, and main testing board 1 up end left side fixedly connected with joint board 103, joint board 103 left end upper portion middle side fixedly connected with joint frame 104 for carry out the joint with elastic buckle 405.
Referring to fig. 1 and 4, the negative pressure regulating part 3 includes an Contraband-shaped support plate 301, a regulating nut 302, a regulating screw 303, a sliding plate 304 and a piston rod 305, the Contraband-shaped support plate 301 is fixedly connected to the negative pressure pipe 202, the inner side of the Contraband-shaped support plate 301 is fixedly connected with four vertical guide rods, the sliding plate 304 is slidably connected to the outer portions of the four vertical guide rods, and the regulating screw 303 is rotatably connected to the upper end surface of the sliding plate 304; the upper end of the adjusting screw rod 303 penetrates through the top of the Contraband-shaped supporting plate 301, the outside of the adjusting screw rod 303 is connected with an adjusting nut 302 through threads, and the adjusting nut 302 is installed on the top of the Contraband-shaped supporting plate 301; a piston rod 305 is fixedly connected to the bottom end face of the sliding plate 304, and a piston is arranged at the lower end of the piston rod 305; the piston at the lower end of the piston rod 305 is located inside the negative pressure pipe 202, and the outer peripheral surface of the piston at the lower end of the piston rod 305 is in close contact with the inner peripheral surface of the negative pressure pipe 202, so that the negative pressure intensity inside the four suckers 201 can be adjusted by the arrangement of the negative pressure adjusting part 3, and the suction force of the suckers 201 can be improved.
Referring to fig. 1, 5 and 6, the pressing mechanism 4 includes a pressing plate 401, a T-shaped sliding rod 402, a pressing plate 403, rectangular through openings 404 and an elastic buckle 405, the pressing plate 401 is rotatably connected to the upper end of the rotating support plate 102, two rectangular through openings 404 are formed in the left side of the upper end face of the pressing plate 401, and a guide rod is arranged inside each rectangular through opening 404; an elastic buckle 405 is connected to the inside of each rectangular through hole 404 in a sliding mode through a guide rod, and a spring is sleeved on each guide rod and located inside each rectangular through hole 404; the pressing plate 401 is connected with four pressing plates 403 through T-shaped sliding rods 402 in a sliding mode, and springs are sleeved on the bottom of the pressing plate 401 on each T-shaped sliding rod 402; when hold-down mechanism 4 is in the pressure state, compress tightly plate 401 will be in the closed condition, and two elasticity buckles 405 will with the inboard joint of joint frame 104 to four pressure strips 403 will be located four main test sockets 101 top positions respectively, through the setting of hold-down mechanism 4, have improved the steadiness of the flash memory chip of installation on main test socket 101 when the test.
Referring to fig. 1 and 7, the sealing mechanism 5 includes a rectangular frame 501, a threaded rod 502, a driving plate 503, a nut 504 and a sealing plug 505, the rectangular frame 501 is disposed outside the air inlet pipe 203, the driving plate 503 is slidably connected inside the rectangular frame 501, and the upper end surface of the driving plate 503 is rotatably connected with the threaded rod 502 penetrating through the top of the rectangular frame 501; the outer part of the threaded rod 502 is connected with a nut 504 through threads, the nut 504 is fixedly connected to the top end face of the rectangular frame 501, and the nut 504 is in threaded connection with the threaded rod 502; the bottom end face of the driving plate 503 is provided with a sealing plug 505, and the sealing plug 505 is inserted into the air inlet pipe 203, through the arrangement of the sealing mechanism 5, when the suction disc 201 is separated from the contact surface, the large strength is not required to be consumed, so that the main test board 1 is more convenient to separate from the contact surface.
The specific use mode and function of the embodiment are as follows:
in the utility model, during the use, at first place this flash memory chip test jig on the contact surface, then press main test board 1 downwards, make four sucking discs 201 adsorb to fix to the contact surface on, then install the flash memory chip to main test seat 101 on, then close compression plate 401, make two elasticity buckles 405 joint to the joint frame 104 inboard, thereby make compression plate 401 can obtain effectual fixed action after closing, then compression plate 403 bottom face will with flash memory chip up end in close contact with, thereby make the flash memory chip can obtain effectual compression action on main test seat 101;
then through the main test board 1 with main test seat 101 on the flash memory chip test can, after the test, when needs with sucking disc 201 and contact surface separation, accessible manual rotation threaded rod 502, make threaded rod 502 drive driving plate 503 and sealing plug 505 upward movement under the effect of nut 504 internal thread, thereby make sealing plug 505 follow the inside extraction of intake pipe 203, thereby make intake pipe 203 opening lose sealing effect, thereby make outside air enter into intake pipe 203, communicating pipe 204 and four sucking discs 201 are inside, thereby make sucking disc 201 can be fast with the contact surface separation.
The embodiments of the present invention have been presented for purposes of illustration and description, and are not intended to be exhaustive or limited to the invention in the form disclosed. Many modifications and variations will be apparent to those of ordinary skill in the art. The embodiment was chosen and described in order to best explain the principles of the invention and the practical application, and to enable others of ordinary skill in the art to understand the invention for various embodiments with various modifications as are suited to the particular use contemplated.
Claims (8)
1. A flash memory chip test jig, comprising: a main test board (1); the bottom of the main test board (1) is provided with an adsorption fixing piece (2), and the left side and the right side of the adsorption fixing piece (2) are respectively provided with a negative pressure adjusting part (3) and a sealing mechanism (5); a rotating support plate (102) is fixedly connected to the right side of the upper end face of the main test plate (1), and a pressing mechanism (4) is rotatably connected to the rotating support plate (102); adsorb mounting (2) including sucking disc (201) and communicating pipe (204), the quantity of sucking disc (201) is four, and four sucking disc (201) fixed connection respectively are in four edges of main testing board (1) bottom face, communicate through three communicating pipe (204) between four sucking disc (201).
2. The flash memory chip test rack of claim 1, wherein: main test seat (101) are installed to main test board (1) up end, and main test board (1) up end left side fixedly connected with joint board (103), and joint board (103) left end upper portion middle side fixedly connected with joint frame (104).
3. The flash memory chip test rack of claim 1, wherein: the adsorption fixing piece (2) further comprises a negative pressure pipe (202) and an air inlet pipe (203), the negative pressure pipe (202) is connected to one communicating pipe (204) on the left side, and the air inlet pipe (203) is connected to one communicating pipe (204) on the right side; the open ends of the negative pressure pipe (202) and the air inlet pipe (203) are distributed in a bent shape of ninety degrees upwards.
4. The flash memory chip test rack of claim 3, wherein: the negative pressure adjusting part (3) comprises an Contraband-shaped supporting plate (301), an adjusting nut (302), an adjusting screw rod (303), a sliding plate (304) and a piston rod (305), wherein the Contraband-shaped supporting plate (301) is fixedly connected to the negative pressure pipe (202), the inner side of the Contraband-shaped supporting plate (301) is fixedly connected with four vertical guide rods, the sliding plate (304) is connected to the outer parts of the four vertical guide rods in a sliding mode, and the adjusting screw rod (303) is rotatably connected to the upper end face of the sliding plate (304); the upper end of the adjusting screw rod (303) penetrates through the top of the Contraband-shaped support plate (301), the outside of the adjusting screw rod (303) is connected with an adjusting nut (302) through threads, and the adjusting nut (302) is installed on the top of the Contraband-shaped support plate (301); the bottom end face of the sliding plate (304) is fixedly connected with a piston rod (305), and the lower end of the piston rod (305) is provided with a piston.
5. The flash memory chip test rack of claim 4, wherein: the piston at the lower end of the piston rod (305) is positioned in the negative pressure pipe (202), and the outer peripheral surface of the piston at the lower end of the piston rod (305) is in close contact with the inner peripheral surface of the negative pressure pipe (202).
6. The flash memory chip test rack of claim 2, wherein: the pressing mechanism (4) comprises a pressing plate (401), a T-shaped sliding rod (402), a pressing plate (403), rectangular through holes (404) and elastic buckles (405), the pressing plate (401) is rotatably connected to the upper end of the rotating support plate (102), the left side of the upper end face of the pressing plate (401) is provided with two rectangular through holes (404), and a guide rod is arranged inside each rectangular through hole (404); an elastic buckle (405) is connected to the inside of each rectangular through hole (404) in a sliding mode through a guide rod, and a spring is sleeved on each guide rod and located inside each rectangular through hole (404); the pressing plate (401) is connected with four pressing plates (403) through T-shaped sliding rods (402) in a sliding mode, and springs are sleeved at the bottoms of the pressing plate (401) on each T-shaped sliding rod (402).
7. The flash memory chip test rack of claim 6, wherein: when the pressing mechanism (4) is in a pressing state, the pressing plate (401) is in a closing state, the two elastic buckles (405) are clamped with the inner sides of the clamping frames (104), and the four pressing plates (403) are respectively located at the positions above the four main test seats (101).
8. The flash memory chip test rack of claim 3, wherein: the sealing mechanism (5) comprises a rectangular frame (501), a threaded rod (502), a driving plate (503), a nut (504) and a sealing plug (505), the rectangular frame (501) is arranged outside the air inlet pipe (203), the driving plate (503) is connected inside the rectangular frame (501) in a sliding mode, and the upper end face of the driving plate (503) is rotatably connected with the threaded rod (502) penetrating through the top of the rectangular frame (501); the outer part of the threaded rod (502) is connected with a nut (504) through threads, the nut (504) is fixedly connected to the top end face of the rectangular frame (501), and the nut (504) is in threaded connection with the threaded rod (502); the bottom end face of the driving plate (503) is provided with a sealing plug (505), and the sealing plug (505) is inserted into the air inlet pipe (203).
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202221104349.6U CN217360006U (en) | 2022-05-10 | 2022-05-10 | Flash memory chip test jig |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202221104349.6U CN217360006U (en) | 2022-05-10 | 2022-05-10 | Flash memory chip test jig |
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| Publication Number | Publication Date |
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| CN217360006U true CN217360006U (en) | 2022-09-02 |
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| Application Number | Title | Priority Date | Filing Date |
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| CN202221104349.6U Active CN217360006U (en) | 2022-05-10 | 2022-05-10 | Flash memory chip test jig |
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Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN116047126A (en) * | 2023-03-06 | 2023-05-02 | 长鑫存储技术有限公司 | Test seat, circuit board and burn-in test device |
| CN116399580A (en) * | 2023-06-09 | 2023-07-07 | 郯城鸿锐电子有限公司 | Portable computer connecting wire detection equipment |
-
2022
- 2022-05-10 CN CN202221104349.6U patent/CN217360006U/en active Active
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN116047126A (en) * | 2023-03-06 | 2023-05-02 | 长鑫存储技术有限公司 | Test seat, circuit board and burn-in test device |
| CN116047126B (en) * | 2023-03-06 | 2024-04-19 | 长鑫存储技术有限公司 | Test seat, circuit board and burn-in test device |
| CN116399580A (en) * | 2023-06-09 | 2023-07-07 | 郯城鸿锐电子有限公司 | Portable computer connecting wire detection equipment |
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