CN215678638U

CN215678638U - Probe mould test equipment with inclined probe

Info

Publication number: CN215678638U
Application number: CN202121050967.2U
Authority: CN
Inventors: 黄庆云
Original assignee: TRANTEST PRECISION (CHINA) Ltd
Current assignee: TRANTEST PRECISION (CHINA) Ltd
Priority date: 2021-05-17
Filing date: 2021-05-17
Publication date: 2022-01-28
Anticipated expiration: 2031-05-17

Abstract

The utility model belongs to the field of testing devices, and relates to a probe mold testing device with an inclined probe, which comprises: base, rotatable last gland, the pressure head of movable installation on last gland bottom of installing on the base, install the needle module subassembly on the base, install the thing dish of carrying on the needle module subassembly and be formed with the mounting groove that is used for installing the product that awaits measuring on carrying the thing dish, still fixed mounting has the article of accompanying and surveying in needle module bottom, and accompanies the one end of surveying article and probe and contact, and the needle module subassembly still includes: the probe comprises a needle die and a probe, wherein the needle die is arranged on the base, and the probe is obliquely arranged in the needle die. Its advantage lies in, is connected the connector on the direct connector with the product of the slope probe among the test equipment and accompanies the connector on surveying the article, reduces the line loss that the keysets brought and guarantees the high frequency characteristic of 5G test to make test equipment's test result more accurate.

Description

Probe mould test equipment with inclined probe

Technical Field

The utility model belongs to the field of testing devices, and relates to a probe-inclined needle mold testing device.

Background

Pcb (printed Circuit board), which is called printed Circuit board in chinese, is an important electronic component, is a support for electronic components, and is a carrier for electrical connection of electronic components. Because it adopts the electron printing technology to make, so be called "printed" circuit board, PCB will test after producing, however need to test the circuit board of accompanying the survey through the probe is connected with the circuit board that awaits measuring when testing, and compare the data of the article that awaits measuring of test and the article of accompanying the survey, thus accomplish the detection to the PCB board, because the PCB board that awaits measuring and the PCB board shape, size of accompanying the survey have some differences, current test equipment adopts perpendicular probe to test, though perpendicular probe can be directly connected with the PCB board that awaits measuring. However, when the test probe is connected with the accompanying test product, the probe and the accompanying test product need to be connected by the adapter plate, however, due to the existence of the adapter plate, part of loss can be generated when the accompanying test product is tested by adopting the mode, so that the test result is not accurate enough, and when the high-frequency characteristic of 5G of the PCB is tested, the influence on the test result is larger.

Disclosure of Invention

The utility model aims to provide a probe-inclined pin die testing device, aiming at the defects of the prior art, the inclined probe in the testing device is used for directly connecting a connector on a product with a connector on an accompanied test article, so that the line loss caused by an adapter plate is reduced to ensure the high-frequency characteristic of a 5G test, and the test result of the testing device is more accurate.

In order to achieve the purpose, the utility model adopts the following technical scheme:

a probe-tilting pin die testing apparatus comprising:

a base;

the upper gland is rotatably arranged on the base;

the pressure head is movably arranged at the bottom of the upper gland;

install in needle module on the base, needle module still includes: the needle die is arranged on the base, and the probe is obliquely arranged in the needle die;

the object carrying plate is arranged on the needle die assembly, and an installation groove for installing a product to be tested is formed in the object carrying plate;

the accompanied and tested article is fixedly arranged at the bottom of the needle die and is in contact with one end of the probe;

when the upper gland is pressed, the pressure head can extrude the loading disc to act on the needle die, so that the other end of the probe positioned in the needle die can be exposed out of the needle die and penetrates through the mounting groove to be contacted with a product to be tested.

Further, the ram includes: the base part and the extrusion part extend from the base part in the direction back to the upper gland, and the base part is fixed with the upper gland through a first elastic piece.

Specifically, the base part is further provided with a guide post facing the upper gland, correspondingly, the upper gland is further provided with a guide hole, and the guide post is located in the guide hole.

Further, the pin die includes: with connecting block and movable block that the base is fixed, probe fixed mounting in on the connecting block, the movable block passes through the second elastic component and installs on the connecting block for the movable block can remove so that the probe can pass the movable block and follow in the needle mould towards the connecting block when the pressure head is used for the movable block.

Furthermore, the front end of the upper gland is also provided with a clamping hook, the base is also correspondingly provided with a clamping plate, and the clamping hook is matched with the clamping plate to enable the base to be hooked with the upper gland.

Further, the trip includes: the setting is in the elastic connection portion, the setting of trip first end are in the hook joint portion and the setting of trip second end are in the rotation connecting portion of trip middle zone, elastic connection portion pass through the third elastic component with it is connected to go up the gland, still be formed with the mounting groove on the hook joint portion, the cardboard with the mounting groove cooperatees and makes go up the gland with the base hook joint, rotate connecting portion pass through the pivot with the base rotates to be connected, just the first end of trip is relative with the second end.

Further, the probe forms an angle with the vertical central axis of less than 5 degrees.

Furthermore, the cross section of the pressure head is T-shaped.

Further, the first elastic member and the third elastic member are both springs.

Furthermore, the upper gland is rotatably connected with the base through a rotating shaft.

The utility model has the beneficial effects that:

the connector on the product is directly connected with the connector on the accompanied test article through the inclined probe in the test equipment, so that the line loss caused by the adapter plate is reduced, and the high-frequency characteristic of the 5G test is ensured, thereby meeting the corresponding requirement of the high-frequency test and completing the corresponding high-frequency test, and ensuring that the test result of the test equipment is more accurate; by arranging the structure of the pressure head and fixing the base part of the pressure head with the upper gland through the first elastic piece, the pressure head can be pressed down softly, the connector is prevented from being damaged due to the hard pressing of the pressure head, and therefore the equipment can be ensured to test the PCB to be tested stably; by arranging the guide posts and the guide holes, the position of the pressure head can be prevented from deviating in the pressing process, so that the extrusion part of the pressure head can be more accurately acted on a product to be measured; by the arrangement of the needle die, the movable block can move towards the connecting block when the pressure head acts on the movable block, so that the probe can penetrate through the movable block and be exposed out of the needle die, and the possibility that one end of the probe is damaged due to being positioned outside the needle die when the testing equipment does not work is reduced; by arranging the clamping hook, when a product to be tested is tested, the upper gland and the base can be fixed and the upper gland is opened from the base only by pressing the elastic connecting part of the clamping hook, so that the product to be tested is more convenient to take and place, and the testing equipment is more convenient to use; the included angle formed by the probe and the vertical middle axis is set to be less than 5 degrees, so that the probe is prevented from being easily damaged due to overlarge inclined angle.

Drawings

FIG. 1 is a schematic structural view of the present invention;

FIG. 2 is a schematic view of the present invention in an open configuration;

FIG. 3 is a top view of the present invention;

FIG. 4 is a schematic cross-sectional view taken along line B-B of FIG. 3;

fig. 5 is a schematic cross-sectional view at D-D in fig. 3.

The labels in the figure are: 100-base, 110-card; 200-upper gland, 210-guide hole, 220-trip, 221-elastic connecting part, 222-trip, 2221-mounting groove, 223-rotary connecting part; 300-ram, 310-base, 311-guide post, 320-press; 400-needle module, 410-needle module, 411-connecting block, 412-movable block, 420-probe; 500-carrying tray; 600-accompany test article.

Detailed Description

Reference will now be made in detail to embodiments of the present invention, examples of which are illustrated in the accompanying drawings, wherein like or similar reference numerals refer to the same or similar elements or elements having the same or similar function throughout. The embodiments described below with reference to the drawings are illustrative and intended to be illustrative of the utility model and are not to be construed as limiting the utility model.

In the description of the present invention, it is to be understood that the terms "length", "width", "upper", "lower", "front", "rear", "left", "right", "vertical", "horizontal", "top", "bottom", "inner", "outer", and the like, indicate orientations or positional relationships based on the orientations or positional relationships illustrated in the drawings, and are used merely for convenience in describing the present invention and for simplicity in description, and do not indicate or imply that the devices or elements referred to must have a particular orientation, be constructed in a particular orientation, and be operated, and thus, are not to be construed as limiting the present invention.

Furthermore, the terms "first", "second" and "first" are used for descriptive purposes only and are not to be construed as indicating or implying relative importance or implicitly indicating the number of technical features indicated. Thus, a feature defined as "first" or "second" may explicitly or implicitly include one or more of that feature. In the description of the present invention, "a plurality" means two or more unless specifically defined otherwise.

In the embodiments of the present invention, unless otherwise explicitly specified or limited, the terms "mounted," "connected," "fixed," and the like are to be construed broadly, e.g., as being fixedly connected, detachably connected, or integrated; can be mechanically or electrically connected; either directly or indirectly through intervening media, either internally or in any other relationship. The specific meanings of the above terms in the present invention can be understood by those skilled in the art according to specific situations.

Referring to fig. 1 to 5, a probe mold 410 testing apparatus with a tilted probe 420, includes: the base 100, the last gland 200 of rotatable installation on the base 100, the pressure head 300 of movable installation on last gland 200 bottom, install the needle module subassembly 400 on the base 100, install the thing dish 500 of carrying on the needle module subassembly 400 and be formed with the mounting groove 2221 that is used for installing the product that awaits measuring on carrying the thing dish 500, still fixed mounting has the product 600 of accompanying and examining in the needle module 410 bottom, and the product 600 of accompanying and examining contacts with the one end of probe 420, the needle module subassembly 400 still includes: the needle mold 410 and the probe 420, the needle mold 410 is installed on the base 100, the probe 420 is installed in the needle mold 410 in an inclined manner, wherein when the upper pressing cover 200 is pressed, the pressing head 300 can press the object pressing plate 500 to act on the needle mold 410, so that the other end of the probe 420 located in the needle mold 410 can be exposed from the needle mold 410 and pass through the installation groove 2221 to be in contact with a product to be tested, specifically, an included angle formed by the probe 420 and a vertical central axis is less than 5 degrees, and in the embodiment, an included angle formed by the probe 420 and the vertical central axis is 2.2 degrees.

In the above embodiment, the ram 300 further includes: the base 310 is fixed to the upper cover 200 through a first elastic member, specifically, the base 310 is further provided with a guide post 311 in a direction facing the upper cover 200, correspondingly, the upper cover 200 is further provided with a guide hole 210, the guide post 311 is located in the guide hole 210, specifically, the cross section of the pressing head 300 is T-shaped, and specifically, the first elastic member is a spring.

In the above embodiment, the pin die 410 further includes: the probe 420 is fixedly installed on the connecting block 411, and the movable block 412 is installed on the connecting block 411 through a second elastic member, so that when the pressing head 300 acts on the movable block 412, the movable block 412 can move towards the connecting block 411 so that the probe 420 can pass through the movable block 412 and be exposed from the needle module 410, specifically, the second elastic member is a spring.

In the above embodiment, the front end of the upper cover 200 is further provided with a hook 220, the base 100 is further correspondingly formed with a clamping plate 110, the hook 220 is matched with the clamping plate 110 to enable the base 100 to be hooked with the upper cover 200, specifically, the hook 220 further includes: the elastic connecting portion 221 is arranged at the first end of the hook 220, the hooking portion 222 is arranged at the second end of the hook 220, and the rotating connecting portion 223 is arranged in the middle area of the hook 220, the elastic connecting portion 221 is connected with the upper gland 200 through a third elastic piece, a mounting groove 2221 is further formed in the hooking portion 222, the clamping plate 110 is matched with the mounting groove 2221 to enable the upper gland 200 to be hooked with the base 100, the rotating connecting portion 223 is rotatably connected with the base 100 through a shaft pin, and the first end of the hook 220 is opposite to the second end.

In the above embodiment, the upper cover 200 is rotatably connected to the base 100 by a rotating shaft (not labeled).

When the device is used, the upper gland 200 is rotated, the pressure head 300 fixed on the upper gland 200 integrally moves along with the rotation of the upper gland 200 until the upper gland 200 is pressed with the base 100, the pressure head 300 is in a vertical state, so that the pressure head 300 can vertically contact with the movable block 412 on the needle die 410, at the moment, the upper gland 200 is continuously pressed downwards, as the pressure head 300 is arranged at the bottom of the upper gland 200 through the first elastic piece, the elastic force of the first elastic piece reversely acts on the pressure head 300, the soft downwards pressing of the pressure head 300 is realized, the connector on a product to be tested is prevented from being pressed hard, and at the moment, the pressure head 300 extrudes the movable block 412 under the action of the elastic force, as the movable block 412 is arranged on the connecting block 411 through the second elastic piece, the movable block 412 moves towards the base 100, and after the movable block 412 is pressed to a certain position, the probe 420 can pass through the movable block 412 to be exposed from the needle die 410 and contact with the connector on the product to be tested, thereby realizing the test of the product to be tested.

The above-described embodiments are only one of the preferred embodiments of the present invention, and general changes and substitutions by those skilled in the art within the technical scope of the present invention are included in the protection scope of the present invention.

Claims

1. A probe-tipped pin die testing apparatus, comprising:

a base (100);

the upper gland (200) is rotatably arranged on the base (100);

the pressure head (300) is movably arranged at the bottom of the upper gland (200);

a pin die assembly (400) mounted on the base (100), the pin die assembly (400) further comprising: a needle mold (410) and a probe (420), wherein the needle mold (410) is installed on the base (100), and the probe (420) is installed in the needle mold (410) in an inclined mode;

the object carrying plate (500) is installed on the needle die assembly (400), and an installation groove (2221) for installing a product to be tested is formed in the object carrying plate (500);

the accompanied object (600) is fixedly arranged at the bottom of the needle die (410), and the accompanied object (600) is contacted with one end of the probe (420);

when the upper pressing cover (200) is pressed, the pressing head (300) can press the object pressing plate (500) to act on the pin die (410) so that the other end of the probe (420) positioned in the pin die (410) can be exposed out of the pin die (410) and penetrates through the mounting groove (2221) to be in contact with the product to be tested.

2. The probe-tilting pin die testing apparatus according to claim 1, wherein said indenter (300) comprises: the base part (310) and the pressing part (320) extend from the base part (310) in the direction opposite to the upper gland (200), and the base part (310) is fixed with the upper gland (200) through a first elastic piece.

3. The probe-tilting pin die testing apparatus according to claim 2, wherein the base portion (310) is further provided with a guide post (311) facing the upper cover (200), and correspondingly, the upper cover (200) is further provided with a guide hole (210), and the guide post (311) is located in the guide hole (210).

4. The probe-tilting pin die testing apparatus according to claim 1, wherein said pin die (410) comprises: the probe (420) is fixedly installed on the connecting block (411), the movable block (412) is installed on the connecting block (411) through a second elastic piece, so that when the pressure head (300) acts on the movable block (412), the movable block (412) can move towards the connecting block (411) to enable the probe (420) to pass through the movable block (412) and to be exposed out of the needle die (410).

5. The probe-tilting pin die testing device according to claim 2, wherein a hook (220) is further disposed at the front end of the upper gland (200), a clamping plate (110) is further correspondingly formed on the base (100), and the hook (220) and the clamping plate (110) are matched to enable the base (100) to be hooked with the upper gland (200).

6. The probe-tilting pin die testing apparatus according to claim 5, wherein said hook (220) comprises: set up elastic connection portion (221), the setting of trip (220) first end are in the colluding portion 222 and the setting of trip (220) second end are in trip (220) middle zone's rotation connecting portion (223), elastic connection portion (221) through the third elastic component with go up gland (200) and be connected, still be formed with mounting groove (2221) on the colluding portion 222, cardboard (110) with mounting groove (2221) cooperate and make go up gland (200) with base (100) collude, rotation connecting portion (223) through the pivot with base (100) rotate and are connected, just the first end of trip (220) is relative with the second end.

7. The apparatus of claim 1, wherein the probe (420) forms an angle with the vertical central axis of less than 5 degrees.

8. The probe-tilting pin die testing apparatus according to claim 1, wherein said indenter (300) has a T-shaped cross-section.

9. The apparatus of claim 6, wherein the first and third elastic members are springs.

10. The apparatus for testing a probe-inclined pin die according to claim 1, wherein the upper cover (200) is rotatably coupled to the base (100) by a rotating shaft.