CN215542895U - Automatic test system applied to capacitance double-parameter test sorting machine - Google Patents
Automatic test system applied to capacitance double-parameter test sorting machine Download PDFInfo
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Abstract
The utility model discloses an automatic test system applied to a capacitance double-parameter test separator, which comprises a capacitance test instrument module, a multi-channel signal module and an automatic test module, wherein the capacitance test instrument module is provided with a current drive high-end port, a voltage detection high-end port, a current drive low-end port and a voltage detection high-end port, and the current drive high-end port, the voltage detection high-end port, the current drive low-end port and the voltage detection high-end port are respectively connected with at least one set of switch network module; the switch network module connects a plurality of multi-path signal modules into a tree structure through a plurality of radio frequency mechanical relay switches; each multi-channel signal module is connected with the automatic test module through a channel, the automatic test module is connected with the multi-channel test probes through two pin cards, and the automatic test module is connected with the capacitance test instrument module, the switch network module and the multi-channel test probes through the multi-channel test probes.
Description
Technical Field
The utility model relates to the technical field of capacitor double-parameter automatic testing, in particular to an automatic testing system applied to a capacitor double-parameter testing sorting machine.
Background
With the rapid development of Chinese economy, the existing capacitance test equipment in the market at present is divided into two types, the first type is a multi-channel common electrode test mode, and the second type is a single-meter or multi-meter matched up-down probe movement test mode. The high end of current drive and the high end of voltage detection of electric capacity test instrument divide into the multichannel through a switching network in first type test mode the signal after with a plurality of capacitor that await measuring through the test needle card respectively with one end electrode connection, voltage detection low side and current drive low side are through the other end electrode connection of the capacitor that the metal sheet awaits measuring and are tested, the shortcoming of first type equipment is: high frequency capacitance (1MHz) cannot be tested. The second type of test mode is a single-meter or multi-meter matched up-down probe movement test mode, the system is provided with 1 or more capacitance test meters, the current drive high end and the voltage detection high end of the capacitance test meters are respectively connected with one probe, the voltage detection low end and the current drive low end are connected with one probe, and the two probes are respectively connected with two electrodes of a capacitor for testing. The multi-channel test is realized by controlling the movement of the probe or the device carrier through the plane motion mechanism, and the second type of equipment has the following defects: the cost is high, a plurality of capacitance test instruments are needed, a transverse plane motion mechanism is added, the test efficiency is low, the channels are switched in a mechanical moving mode, and the test efficiency of the two channels can only reach 100 pcs/min). In order to overcome the above disadvantages, an automatic test system applied to a capacitance dual-parameter test handler is needed, which can realize multi-channel high-speed test and automatic sorting of capacitance values and loss parameters of a high-frequency (1MHz) capacitor by only one capacitance test instrument, and simultaneously ensure high efficiency of the test.
SUMMERY OF THE UTILITY MODEL
In order to solve the problems in the prior art, the utility model provides an automatic test system applied to a capacitance double-parameter test sorting machine, which can realize multi-channel high-speed test and automatic sorting of the capacitance value and the loss parameter of a high-frequency (1MHz) capacitor by only one capacitance test instrument and ensure the high efficiency of the test.
In order to achieve the purpose, the utility model adopts the technical scheme that: the utility model provides an automatic test system for two parameter test sorters of electric capacity, includes electric capacity test instrument module, switch network module, multichannel signal module and automatic test module, wherein:
the capacitance test instrument module is provided with a current drive high-end port, a voltage detection high-end port, a current drive low-end port and a voltage detection high-end port, and the current drive high-end port, the voltage detection high-end port, the current drive low-end port and the voltage detection high-end port are respectively connected with at least one set of switch network module; the switch network module connects a plurality of multi-path signal modules into a tree structure through a plurality of radio frequency mechanical relay switches; each multi-channel signal module is connected with the automatic test module through one channel, the automatic test module is connected with a multi-channel test probe through two pin cards, the automatic test module is connected with a capacitance test instrument module, a switch network module and the multi-channel test probe through the multi-channel test probe, and a current driving high-end port and a voltage detection high-end port of the same channel are simultaneously connected with one probe in one of the pin cards; the current-driven low-side port and the voltage-sensing high-side port of the same channel are simultaneously connected to one probe in another pincard.
In the technical scheme, the capacitance bridge is provided with four pairs of testing ends including a current driving high end, a current driving low end, a voltage detecting high end, a voltage detecting low end and a shielding end corresponding to each testing end, the high end of the current driving, the current driving low end, the voltage detecting high end and the voltage detecting low end are connected on a lead wire of a tested element during measurement to form complete four-end measurement, one capacitance testing instrument is connected with four sets of switch networks, the defect that a plurality of capacitance testing instruments can be used for testing in the prior art is overcome, meanwhile, the switch networks are built by radio frequency mechanical relay switches, the built switch networks conduct one channel at each time, a transverse plane motion mechanism is not required to be added, and the built switch networks divide signals of the current driving high end port, the voltage detecting high end port, the current driving low end port and the voltage detecting high end voltage detecting low end port of the capacitance testing instrument into multiple paths respectively, and each time, one channel is conducted, so that the multichannel high-speed test and automatic sorting of the capacitance value and the loss parameter of the high-frequency (1MHz) capacitor are realized, the multichannel test probes are respectively fixed on the upper pin card and the lower pin card, the capacitance test instrument, the switch network and the test probes are connected, the test probes are used for automatic test, and the high efficiency of the test is ensured.
In a further technical scheme, only one capacitance test instrument is arranged in the capacitance test instrument module; the capacitance test meter includes, but is not limited to, an LCR meter, a capacitance meter, or a digital bridge.
In a further aspect, the switching network matched with the capacitance test meter module includes, but is not limited to, four sets.
In the technical scheme, four sets of switch networks (or one set, or two sets, or three sets) are adopted.
In a further technical scheme, the relay includes a single-pole single-throw relay, a single-pole double-throw relay, a single-pole 3-throw relay, a single-pole 4-throw relay, a single-pole 5-throw relay, a single-pole 6-throw relay, a single-pole 7-throw relay, a single-pole 8-throw relay, a single-pole 9-throw relay, a single-pole 10-throw relay, a single-pole 11-throw relay, a single-pole 12-throw relay, a single-pole 13-throw relay, a single-pole 14-throw relay, a single-pole 15-throw relay, a single-pole 16-throw relay, a single-pole 17-throw relay, a single-pole 18-throw relay, a single-pole 19-throw relay, and a single-pole 20-throw relay.
In the technical scheme, the relays build the multi-channel signal modules in different connection modes, and the test probes are used for automatic testing, so that the testing efficiency is ensured.
The utility model has the beneficial effects that:
(1) the automatic test system applied to the capacitance double-parameter test sorting machine can test the high-frequency capacitance (1 MHz);
(2) the automatic test system applied to the capacitance double-parameter test sorting machine has low cost, does not need a plurality of capacitance test instruments, does not need to increase a transverse plane motion mechanism, and has high test efficiency;
(3) the automatic test system applied to the capacitance double-parameter test sorting machine realizes multi-channel high-speed test and automatic sorting of the capacitance value and the loss parameter of the high-frequency (1MHz) capacitor only by one capacitance test instrument, and simultaneously ensures the high efficiency of the test.
Drawings
Fig. 1 is a schematic structural diagram of an automatic test system applied to a capacitive two-parameter test handler according to the present invention.
Description of reference numerals:
10. a capacitance test instrument module; 11. a capacitance test instrument module; 12. a multi-channel signal module; 13. and an automatic test module.
Detailed Description
Embodiments of the present invention will be described in detail below with reference to the accompanying drawings.
Example (b):
as shown in fig. 1, the present invention provides an automatic test system applied to a capacitance dual-parameter test handler, which can realize multi-channel high-speed test and automatic sorting of capacitance values and loss parameters of a high-frequency (1MHz) capacitor by only one capacitance test instrument, and simultaneously ensure high efficiency of the test.
In order to achieve the above purpose, the embodiment adopted by the utility model is as follows: the utility model provides an automatic test system for two parameter test sorters of electric capacity, includes electric capacity test instrument module, switch network module, multichannel signal module and automatic test module, wherein:
the capacitance test instrument module is provided with a current drive high-end port, a voltage detection high-end port, a current drive low-end port and a voltage detection high-end port, and the current drive high-end port, the voltage detection high-end port, the current drive low-end port and the voltage detection high-end port are respectively connected with at least one set of switch network module; the switch network module connects a plurality of multi-path signal modules into a tree structure through a plurality of radio frequency mechanical relay switches; each multi-channel signal module is connected with the automatic test module through one channel, the automatic test module is connected with a multi-channel test probe through two pin cards, the automatic test module is connected with a capacitance test instrument module, a switch network module and the multi-channel test probe through the multi-channel test probe, and a current driving high-end port and a voltage detection high-end port of the same channel are simultaneously connected with one probe in one of the pin cards; the current-driven low-side port and the voltage-sensing high-side port of the same channel are simultaneously connected to one probe in another pincard.
In this embodiment, the capacitive bridge has four pairs of testing terminals, namely a current driving high terminal, a current driving low terminal, a voltage detecting high terminal, a voltage detecting low terminal and a shielding terminal corresponding to each testing terminal, the high terminal current driving high terminal, the current driving low terminal, the voltage detecting high terminal and the voltage detecting low terminal are connected on the lead wires of the tested element during the measurement to form a complete four-terminal measurement, one capacitive test instrument is connected with four sets of switch networks, thereby overcoming the defect that a plurality of capacitive test instruments are required to test in the prior embodiment, meanwhile, the switch networks are built by using radio frequency mechanical relay switches, the built switch networks conduct one channel at a time without adding a transverse plane motion mechanism, and the built switch networks divide the signals of the current driving high terminal port, the voltage detecting high terminal port, the current driving low terminal port and the voltage detecting high terminal port of the capacitive test instrument into multiple channels respectively, and each time, one channel is conducted, so that the multichannel high-speed test and automatic sorting of the capacitance value and the loss parameter of the high-frequency (1MHz) capacitor are realized, the multichannel test probes are respectively fixed on the upper pin card and the lower pin card, the capacitance test instrument, the switch network and the test probes are connected, the test probes are used for automatic test, and the high efficiency of the test is ensured.
In another embodiment, only one capacitance test instrument is arranged in the capacitance test instrument module; the capacitance test meter includes, but is not limited to, an LCR meter, a capacitance meter, or a digital bridge.
In another embodiment, the switching network matched to the capacitance test meter module includes, but is not limited to, four sets.
In this embodiment, four sets of switch networks (one set, two sets, or three sets).
In another embodiment, the relay includes a single pole single throw relay, a single pole double throw relay, a single pole 3 throw relay, a single pole 4 throw relay, a single pole 5 throw relay, a single pole 6 throw relay, a single pole 7 throw relay, a single pole 8 throw relay, a single pole 9 throw relay, a single pole 10 throw relay, a single pole 11 throw relay, a single pole 12 throw relay, a single pole 13 throw relay, a single pole 14 throw relay, a single pole 15 throw relay, a single pole 16 throw relay, a single pole 17 throw relay, a single pole 18 throw relay, a single pole 19 throw relay, and a single pole 20 throw relay.
In this embodiment, a plurality of relays build multichannel signal module through the connected mode of difference, use the test probe to carry out automatic testing, have guaranteed the high efficiency of test.
The above-mentioned embodiments only express the specific embodiments of the present invention, and the description thereof is more specific and detailed, but not construed as limiting the scope of the present invention. It should be noted that, for a person skilled in the art, several variations and modifications can be made without departing from the inventive concept, which falls within the scope of the present invention.
Claims (4)
1. The utility model provides an automatic test system for two parameter testing sorter of electric capacity which characterized in that, includes electric capacity test instrument module, switch network module, multichannel signal module and automatic test module, wherein:
the capacitance test instrument module is provided with a current drive high-end port, a voltage detection high-end port, a current drive low-end port and a voltage detection high-end port, and the current drive high-end port, the voltage detection high-end port, the current drive low-end port and the voltage detection high-end port are respectively connected with at least one set of switch network module; the switch network module connects a plurality of multi-path signal modules into a tree structure through a plurality of radio frequency mechanical relay switches; each multi-channel signal module is connected with the automatic test module through one channel, the automatic test module is connected with a multi-channel test probe through two pin cards, the automatic test module is connected with a capacitance test instrument module, a switch network module and the multi-channel test probe through the multi-channel test probe, and a current driving high-end port and a voltage detection high-end port of the same channel are simultaneously connected with one probe in one of the pin cards; the current-driven low-side port and the voltage-sensing high-side port of the same channel are simultaneously connected to one probe in another pincard.
2. The automatic test system applied to the capacitive double-parameter test sorting machine according to claim 1, comprising:
only one capacitance test instrument is arranged in the capacitance test instrument module;
the capacitance test meter includes, but is not limited to, an LCR meter, a capacitance meter, or a digital bridge.
3. The automatic test system applied to the capacitive two-parameter test sorting machine according to claim 1, wherein the switch network module comprises:
the switch network matched with the capacitance test meter module comprises but is not limited to four sets.
4. The automatic test system applied to the capacitive two-parameter test handler of claim 1, wherein the relay comprises:
single pole single throw relay, single pole double throw relay, single pole 3 throw relay, single pole 4 throw relay, single pole 5 throw relay, single pole 6 throw relay, single pole 7 throw relay, single pole 8 throw relay, single pole 9 throw relay, single pole 10 throw relay, single pole 11 throw relay, single pole 12 throw relay, single pole 13 throw relay, single pole 14 throw relay, single pole 15 throw relay, single pole 16 throw relay, single pole 17 throw relay, single pole 18 throw relay, single pole 19 throw relay, and single pole 20 throw relay.
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| CN202121264359.1U CN215542895U (en) | 2021-06-07 | 2021-06-07 | Automatic test system applied to capacitance double-parameter test sorting machine |
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Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN113406431A (en) * | 2021-06-08 | 2021-09-17 | 成都云绎智创科技有限公司 | Automatic testing method applied to capacitance double-parameter testing sorting machine |
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Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN113406431A (en) * | 2021-06-08 | 2021-09-17 | 成都云绎智创科技有限公司 | Automatic testing method applied to capacitance double-parameter testing sorting machine |
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