CN215375631U - Open type board card test platform - Google Patents

Open type board card test platform Download PDF

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Publication number
CN215375631U
CN215375631U CN202121220799.7U CN202121220799U CN215375631U CN 215375631 U CN215375631 U CN 215375631U CN 202121220799 U CN202121220799 U CN 202121220799U CN 215375631 U CN215375631 U CN 215375631U
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test
board
board card
sliding table
area
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CN202121220799.7U
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Chinese (zh)
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杨险峰
李炜
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Tianjin Haida Electronics Co ltd
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Tianjin Haida Electronics Co ltd
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Abstract

The utility model relates to the technical field of research and development testing of electronic products, in particular to an open type board card testing platform, which comprises: the test device comprises a test base, a testing device and a control device, wherein a horizontal linear slideway is arranged at the top of the test base, and a sliding table is matched on the linear slideway; the first testing area is fixedly arranged at one end, corresponding to the linear slideway, of the top of the testing base; one end of the first switching cable is provided with an external interface board which is fixedly connected with the test base; a first test interface board is arranged at one end of the switching cable, which is far away from the external interface board, and the first test interface board is fixedly arranged at one side of the sliding table, which corresponds to the first test area; according to the utility model, the board card is alternately tested through the test interfaces arranged at the two ends of the sliding table, so that the board card is disassembled and assembled by effectively utilizing the waiting time in the board card testing process, the board card testing efficiency is improved, and the reliability of interface communication is also ensured.

Description

Open type board card test platform
Technical Field
The utility model relates to the technical field of research and development testing of electronic products, in particular to an open type board card testing platform.
Background
In the electronic industry, a board with a specific function needs to be subjected to a rigorous operation test before leaving a factory, and a matched test program needs to be loaded on the board in the test process, and the board is continuously tested for an operation time. In the past test process, a tester needs to continuously perform repeated plugging and unplugging operations on each board card on a test interface, the operation wastes test time, and the problem that the interface connection is not firm and the test result is influenced exists.
SUMMERY OF THE UTILITY MODEL
The utility model provides an open type board card test platform, which is used for alternately testing board cards through test interfaces arranged at two ends of a sliding table, so that the board cards are effectively disassembled and assembled by using the waiting time in the board card test process, the board card test efficiency is improved, and the reliability of interface communication is also ensured.
In order to achieve the purpose, the utility model provides the following technical scheme: an open board test platform, comprising: the test device comprises a test base, a testing device and a control device, wherein a horizontal linear slideway is arranged at the top of the test base, and a sliding table is matched on the linear slideway; the first testing area is fixedly arranged at the top of the testing base and corresponds to any one end of the linear slideway; the first test area is provided with a test tool for mounting a fixed board card and enabling the insertion end of the board card to face the sliding table; one end of the first switching cable is provided with an external interface board which is fixedly connected with the test base; a first test interface board is arranged at one end of the switching cable, which is far away from the external interface board, and the first test interface board is fixedly arranged at one side of the sliding table, which corresponds to the first test area; the first test interface board and the external interface board are respectively provided with a test interface, and pins in each test interface are electrically connected in a one-to-one correspondence mode through the first transfer cables.
Preferably, the test device further comprises a second test area, wherein the second test area is fixedly arranged at the top of the test base and corresponds to one end, away from the first test area, of the linear slideway; the second test area is provided with a test tool for mounting and fixing the board card, and the insertion end of the board card faces the sliding table; the second test interface board is fixedly arranged on one side of the sliding table corresponding to the second test area; the second test interface board is provided with a test interface, and pins in the test interface are electrically connected with the test interfaces of the external interface board in a one-to-one correspondence mode through second switching cables.
Preferably, the test device further comprises a pair of control arms, wherein the two control arms are respectively vertically arranged on two sides of the test base corresponding to the linear slide way and are respectively hinged and matched with the test base through bottom ends; the two sides of the sliding table are respectively hinged and matched with push-pull rods at two ends in the opposite movement direction, the sliding table further comprises a pair of connecting rods arranged at two sides of the sliding table, the sliding table and the free ends of the two push-pull rods are respectively hinged with two ends of the corresponding connecting rods, and the middle part of each control arm is hinged and matched with the central area of the corresponding connecting rod; the top ends of the two control arms are connected with each other through a handle.
Preferably, the test tool comprises a plurality of limit support blocks which are fixedly arranged, each limit support block corresponds to the peripheral area of the board card, and the top of each limit support block comprises a support part which is flush with the bottom of the board card and a constraint groove which is matched with the outline of the board card; and the top of each limiting support block, the supporting part and the overlapping area of the constraint grooves are also provided with fixing nuts for rapidly clamping and fixing the edge of the test board.
Preferably, a plurality of long round holes penetrating up and down are formed in the bottom of the test tool, and the length direction of each long round hole is consistent with the movement direction of the sliding table; the top of the test base is provided with fixing screw holes corresponding to the round holes, and the test tool is matched with the corresponding fixing screw holes through fixing screws penetrating through the round holes.
The utility model has the beneficial effects that: by pushing the sliding table, the first test interface board is matched with the insertion end of the board card, so that a normal result of a test process is ensured, and a test failure phenomenon caused by firm connection of the data interface is avoided. The second test area is fixedly provided with another board to be tested through the test tool, the operation is completed in the board test waiting process of the first test area, and after the board in the first test area is tested, the test interface of the second test interface board is matched with the board plugging end of the second test area through the movable sliding table, so that the rapid switching of the test boards is realized, and the test efficiency of the boards is improved. The sliding table is moved by stirring the handle, so that the strength of a tester for operating the sliding table is saved, meanwhile, the power of the sliding table is improved by means of the handle and the control arm, and the condition that each test interface can be smoothly matched with the board card insertion end is ensured. The integrated circuit board passes through the supporting part and fixes on the test fixture with the restraint groove is accurate to lock the integrated circuit board in the restraint groove through fixation nut, thereby the location of the integrated circuit board of realization. The test fixture and the test base are detachably arranged, so that the test of the board cards with various specifications is realized by replacing different test fixtures, and the corresponding first test interface board, the second test interface board and the external interface board are connected with the sliding table and the test base in a replaceable manner, so that the replacement of the switching cable is realized. The test fixture is fixed on the test base through the matching of the fixed screw hole and the long round hole, and the position is adjusted through loosening and tightening the fixed screws, so that the adjustment of the operation force when the two board cards are switched is realized.
Drawings
In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the drawings used in the description of the embodiments or the prior art will be briefly described below, it is obvious that the drawings in the following description are only some embodiments of the present invention, and for those skilled in the art, other drawings can be obtained according to the drawings without creative efforts.
FIG. 1 is a test chart of the overall structure of the present invention;
FIG. 2 is a top view of a portion of the structure of the present invention.
Detailed Description
The technical solutions of the present invention will be described clearly and completely with reference to the accompanying drawings, and it is to be understood that the described embodiments are only a part of the embodiments of the present invention, and not all of the embodiments. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present invention.
As shown in fig. 1 and 2, an open board card testing platform includes: the test device comprises a test base 1, wherein a horizontal linear slideway 2 is arranged at the top of the test base 1, and a sliding table 3 is matched on the linear slideway 2; the first testing area 4 is fixedly arranged at the top of the testing base 1 and corresponds to any one end of the linear slideway 2; the first test area 4 is provided with a test tool 5 for mounting a fixed board card 6 and enabling the insertion end of the board card 6 to face the sliding table 3; one end of the first switching cable is provided with an external interface board 8, and the external interface board 8 is fixedly connected with the test base 1; a first test interface board 9 is arranged at one end of the switching cable far away from the external interface board 8, and the first test interface board 9 is fixedly arranged at one side of the sliding table 3 corresponding to the first test area 4; the first test interface board 9 and the external interface board 8 are respectively provided with a test interface 10, and pins in each test interface 10 are electrically connected in a one-to-one correspondence manner through the first transfer cables.
In the above arrangement, the board card 6 is fixed on the test fixture 5, the first test interface board 9 is connected and matched with the insertion end of the board card 6 by pushing the sliding table 3, the external interface board 8 is connected with the test host through the test line in the test process, so as to load the test program on the board card 6 and complete the test, and the test interface 10 of the first test interface board 9 is accurately matched with the insertion end of the board card 6 under the matching of the test fixture 5 and the sliding table 3, so that the normal result of the test process is ensured, and the test failure phenomenon caused by the firm connection part of the data interface is avoided.
The test device further comprises a second test area 11, wherein the second test area 11 is fixedly arranged at the top of the test base 1 and corresponds to one end, far away from the first test area 4, of the linear slide way 2; the second test area 11 is provided with a test tool 5 for mounting the fixed board card 6 and enabling the insertion end of the board card 6 to face the sliding table 3; the test device further comprises a second test interface board 12, wherein the second test interface board 12 is fixedly arranged on one side of the sliding table 3 corresponding to the second test area 11; the second test interface board 12 is provided with a test interface 10, and pins in the test interface 10 are electrically connected with the test interfaces 10 of the external interface board 8 through second switching cables in a one-to-one correspondence manner.
In the setting, the second test area 11 is provided with another board card 6 to be tested through the test fixture 5, the operation is completed in the test waiting process of the board card 6 in the first test area 4, and after the board card 6 in the first test area 4 is tested, the test interface 10 of the second test interface board 12 is matched with the insertion end of the board card 6 in the second test area 11 by moving the sliding table 3, so that the test board card 6 is rapidly switched, and the test efficiency of the board card 6 is improved.
The device is characterized by further comprising a pair of control arms 14, wherein the two control arms 14 are respectively vertically arranged on two sides of the test base 1 corresponding to the linear slideway and are respectively hinged and matched with the test base 1 through bottom ends; two ends of the sliding table 3 in the relative movement direction are respectively hinged and matched with a push-pull rod 15, the sliding table further comprises a pair of connecting rods 16 arranged on two sides of the sliding table 3, the sliding table 3 and the free ends of the two push-pull rods 15 are respectively hinged with two ends of the corresponding connecting rods 16, and the middle part of each control arm 14 is hinged and matched with the central area of the corresponding connecting rod 16; the top ends of the two control arms 14 are interconnected by a handle 17.
In the above-mentioned setting, accomplish the removal of slip table 3 through stirring handle 17 to saved the strength of tester operation slip table 3, still improved the power of slip table 3 with the help of handle 17 and control arm 14 simultaneously, guaranteed that each test interface 10 can both be smooth with the cooperation of the end of pegging graft of integrated circuit board 6. In the process, the central area of the connecting rod 16 is always positioned in the middle of the slider and changes in the longitudinal position, so that the arc running track of the control arm 14 in the swinging process is adapted, the height change of the sliding table 3 caused by fluctuation is avoided, and the first test interface board and the second test interface board can accurately match the test interface 10 with the plugging ends of the test boards.
The test tool 5 comprises a plurality of limit support blocks 18 which are fixedly arranged, each limit support block 18 corresponds to the peripheral area of the board card 6, and the top of each limit support block 18 comprises a support part 19 which is flush with the bottom of the board card 6 and a constraint groove 20 which is matched with the outline of the board card 6; and a fixing nut 21 is further arranged in an overlapping area of the top of each limiting support block 18, the support part 19 and the restraining groove 20 and used for rapidly clamping and fixing the edge of the test board.
In the above arrangement, the board card 6 is accurately fixed on the test fixture 5 through the supporting portion 19 and the constraint groove 20, and the board card 6 is locked in the constraint groove 20 through the fixing nut 21, so that the board card 6 is positioned. The test fixture 5 and the test base 1 are detachably arranged, so that the test of various board cards with different specifications is realized by replacing different test fixtures 5, and the corresponding first test interface board 9, the second test interface board 12 and the external interface board are connected with the sliding table 3 and the test base 1 in a replaceable manner, so that the replacement of the switching cable is realized.
A plurality of long round holes 22 which penetrate through the bottom of the test tool 5 from top to bottom are formed in the bottom of the test tool, and the length direction of each long round hole 22 is consistent with the movement direction of the sliding table 3; the top of the test base 1 is provided with fixing screw holes 23 corresponding to the long round holes 22, and the test tool 5 is matched with the corresponding fixing screw holes 23 through fixing screws 24 penetrating through the long round holes 22.
In the above arrangement, the test fixture 5 is fixed on the test base 1 through the matching of the fixing screw hole 23 and the long circular hole 22, and the position is adjusted through the tightening and loosening of the fixing screw 24, so that the adjustment of the operation force when the two board cards 6 are switched is realized.
The above description is only for the specific embodiments of the present invention, but the scope of the present invention is not limited thereto, and any person skilled in the art can easily conceive of the changes or substitutions within the technical scope of the present invention, and all the changes or substitutions should be covered within the scope of the present invention. Therefore, the protection scope of the present invention shall be subject to the protection scope of the claims.

Claims (5)

1. An open board card test platform, comprising:
the test device comprises a test base, a testing device and a control device, wherein a horizontal linear slideway is arranged at the top of the test base, and a sliding table is matched on the linear slideway;
the first testing area is fixedly arranged at the top of the testing base and corresponds to any one end of the linear slideway; the first test area is provided with a test tool for mounting a fixed board card and enabling the insertion end of the board card to face the sliding table;
one end of the first switching cable is provided with an external interface board which is fixedly connected with the test base; a first test interface board is arranged at one end of the switching cable, which is far away from the external interface board, and the first test interface board is fixedly arranged at one side of the sliding table, which corresponds to the first test area; the first test interface board and the external interface board are respectively provided with a test interface, and pins in each test interface are electrically connected in a one-to-one correspondence mode through the first transfer cables.
2. The open board card test platform of claim 1, wherein: the second testing area is fixedly arranged at the top of the testing base and corresponds to one end, away from the first testing area, of the linear slideway; the second test area is provided with a test tool for mounting and fixing the board card, and the insertion end of the board card faces the sliding table; the second test interface board is fixedly arranged on one side of the sliding table corresponding to the second test area; the second test interface board is provided with a test interface, and pins in the test interface are electrically connected with the test interfaces of the external interface board in a one-to-one correspondence mode through second switching cables.
3. The open board card test platform of claim 2, wherein: the two control arms are respectively vertically arranged on two sides of the test base corresponding to the linear slideway and are respectively hinged and matched with the test base through the bottom ends; the two sides of the sliding table are respectively hinged and matched with push-pull rods at two ends in the opposite movement direction, the sliding table further comprises a pair of connecting rods arranged at two sides of the sliding table, the sliding table and the free ends of the two push-pull rods are respectively hinged with two ends of the corresponding connecting rods, and the middle part of each control arm is hinged and matched with the central area of the corresponding connecting rod; the top ends of the two control arms are connected with each other through a handle.
4. The open board card test platform of claim 2, wherein: the test tool comprises a plurality of limit support blocks which are fixedly arranged, each limit support block corresponds to the peripheral area of the board card, and the top of each limit support block comprises a support part which is flush with the bottom of the board card and a constraint groove which is matched with the outline of the board card; and the top of each limiting support block, the supporting part and the overlapping area of the constraint grooves are also provided with fixing nuts for rapidly clamping and fixing the edge of the test board.
5. The open board card test platform of claim 2, wherein: a plurality of long round holes which penetrate through the test tool up and down are formed in the bottom of the test tool, and the length direction of each long round hole is consistent with the moving direction of the sliding table; the top of the test base is provided with fixing screw holes corresponding to the round holes, and the test tool is matched with the corresponding fixing screw holes through fixing screws penetrating through the round holes.
CN202121220799.7U 2021-06-02 2021-06-02 Open type board card test platform Active CN215375631U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN202121220799.7U CN215375631U (en) 2021-06-02 2021-06-02 Open type board card test platform

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN202121220799.7U CN215375631U (en) 2021-06-02 2021-06-02 Open type board card test platform

Publications (1)

Publication Number Publication Date
CN215375631U true CN215375631U (en) 2021-12-31

Family

ID=79632941

Family Applications (1)

Application Number Title Priority Date Filing Date
CN202121220799.7U Active CN215375631U (en) 2021-06-02 2021-06-02 Open type board card test platform

Country Status (1)

Country Link
CN (1) CN215375631U (en)

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