CN215375601U

CN215375601U - Multi-probe antenna test camera bellows

Info

Publication number: CN215375601U
Application number: CN202120570027.XU
Authority: CN
Inventors: 曾卓; 鲍坤; 王帅; 毛小莲; 周建华
Original assignee: Shanghai Hollywell Electronic System Technology Co ltd
Current assignee: Shanghai Hollywell Electronic System Technology Co ltd
Priority date: 2021-03-21
Filing date: 2021-03-21
Publication date: 2021-12-31
Anticipated expiration: 2031-03-21

Abstract

The application discloses a multi-probe antenna test camera bellows, which comprises a shielding camera bellows, a multi-probe array, a three-dimensional bearing table and a connecting table, wherein the multi-probe array is arranged in the shielding camera bellows and is positioned at the top of the shielding camera bellows; and a plurality of dual-polarized antenna probes in the multi-probe array are closely aligned with the antenna array to be detected on the three-dimensional bearing table in the direction vertical to the ground, and the probe spacing in the multi-probe array can be adjusted so that the structural center of each probe corresponds to each channel of the antenna array to be detected. The testing camera bellows adopts a multi-probe testing technology, so that the testing efficiency is high; and can carry out many probe interval adjustment to the antenna that awaits measuring that different sizes of different array element distribute, application scope is wide.

Description

Multi-probe antenna test camera bellows

Technical Field

The application relates to an antenna test camera bellows especially relates to a many probes antenna test camera bellows.

Background

Antenna testing techniques include far field testing, near field testing, compact field testing, and the like. Wherein, the near field test needs to set up a microwave darkroom. The miniaturized microwave dark room is also called a microwave dark box. The near field test is that a servo system and a known probe are used in a microwave darkroom, the amplitude and phase information of the antenna is extracted in a near field area with a plurality of wavelengths away from the antenna to be tested, and information such as a far field directional diagram of the antenna to be tested is obtained through conversion. During near field testing, the test probe needs to be corrected, and a mounting frame in the servo system can also have certain influence on a test result.

The probe antenna test system is divided into a single probe test system and a multi-probe test system. The single-probe test system adopts single-probe scanning to acquire data, and has the defects of long time consumption and low efficiency compared with a multi-probe test system. The multi-probe test system adopts a plurality of probes, can acquire data of a plurality of channels to be tested simultaneously, has the advantage that the test efficiency is multiplied according to the number of the probes compared with a single-probe system, but needs to calibrate each probe, and the accuracy of the calibration data has certain influence on the test result.

Disclosure of Invention

The technical problem that this application will be solved provides a many probes antenna test camera bellows, can provide perfect test condition for the production of active array antenna (the antenna that awaits measuring promptly) and complete machine equipment, has characteristics miniaturized, that the test is rapid, can realize the batched test.

In order to solve the technical problem, the application provides a multi-probe antenna testing camera bellows, which comprises a shielding camera bellows, a multi-probe array, a three-dimensional bearing table and a connecting table, wherein the multi-probe array is arranged in the shielding camera bellows and is positioned at the top of the shielding camera bellows; and a plurality of dual-polarized antenna probes in the multi-probe array are closely aligned with the antenna array to be detected on the three-dimensional bearing table in the direction vertical to the ground, and the probe spacing in the multi-probe array can be adjusted so that the structural center of each probe corresponds to each channel of the antenna array to be detected. The testing camera bellows adopts a multi-probe testing technology, so that the testing efficiency is high; and can carry out many probe interval adjustment to the antenna that awaits measuring that different sizes of different array element distribute, application scope is wide.

Furthermore, the shielding dark box is a cuboid and is provided with six rectangular surfaces; the front surface of the shielding camera bellows is provided with a touch screen all-in-one machine and a feeding and discharging door, at least one side surface of the shielding camera bellows is provided with a waveguide window, the back surface of the shielding camera bellows is provided with a maintenance door, the top surface of the shielding camera bellows is provided with a maintenance skylight, and the inner wall of each rectangular surface of the shielding camera bellows is covered with a wave-absorbing material. This is a preferred structural example of a screen dark box.

Preferably, the wave-absorbing material is one or more of a pyramid, a wedge, a mastoid, a flat plate or a wedge wave-absorbing material in any combination. This is some preferred structural examples of absorbing materials.

Further, the multi-probe array comprises a plurality of dual-polarized antenna probes arranged on the same plane, a multi-probe fixing frame for fixing the dual-polarized antenna probes, a switch matrix, a probe moving unit and a connecting cable. This is a detailed structural description of the multi-probe array.

Preferably, the multi-probe array has eight dual-polarized antenna probes, the probes are divided into two groups along the X-axis direction on the horizontal plane, and the four dual-polarized antenna probes are arranged on the left side and the right side and aligned pairwise; the connecting cable is a radio frequency cable, one end of the radio frequency cable is connected with the probe, and the other end of the radio frequency cable is connected to the switch matrix. This is a preferred structural example of a multi-probe array.

Further, the three-dimensional bearing table comprises a lifting table and an XY sliding table; the lifting platform realizes the vertical movement of the antenna to be tested; the XY sliding table realizes the movement of the antenna to be detected in the horizontal direction. This is a preferred structural example of a three-dimensional carrier table.

Further, the docking station comprises a tray and a power-on device fixed on the tray; the connection table is placed at a feeding and discharging door of the shielding camera bellows, and the tray bears the antenna to be tested to slide on the connection table and enters and exits the shielding camera bellows from the feeding and discharging door. This is a preferred structural example of a docking station.

Preferably, the tray is provided with a plurality of limiting devices to fix the active array antennas to be tested with different sizes and the whole equipment. This is to expand the applicable range of the product.

Furthermore, the active array antenna to be tested and the whole equipment are dual-polarized antennas. This is a preferred structural example.

Furthermore, each probe covers a subarray area, each subarray area comprises one or more channels of the antenna array to be tested, and the subarray areas covered by different probes are not overlapped; each probe is located directly above the center of the covered subarray area. This is a preferred structural example.

The technical effect that this application obtained is: the multi-probe testing technology is adopted, so that the testing efficiency is high; the multi-probe spacing adjustment is carried out on the antennas to be measured with different sizes and different array element distributions, and the application range is wide.

Drawings

FIG. 1 is a schematic structural diagram of a multi-probe antenna test camera chamber according to the present application.

Fig. 2 is a schematic diagram of the movement process of the antenna to be tested during the multi-probe test.

The reference numbers in the figures illustrate: 1 is a shielding dark box; 11, a touch screen integrated machine; 12 is a feeding and discharging door; 13 is a waveguide window; 14 is a maintenance door; 15, a maintenance skylight; 16 is wave-absorbing material; 2 is a multi-probe array; 3 is a three-dimensional bearing platform; 31 is a lifting platform; 32 is XY slipway; 4 is a connection table; 41 is a tray; 42 is a power-on device; and 5, an antenna to be tested.

Detailed Description

Referring to fig. 1, the multi-probe antenna testing camera bellows provided by the present application includes a shielding camera bellows 1, a multi-probe array 2 installed in the shielding camera bellows 1 and located at the top of the shielding camera bellows 1, a three-dimensional bearing table 3 fixed in the shielding camera bellows 1 and located at the bottom of the shielding camera bellows 1, and a docking table 4 located outside the shielding camera bellows 1.

The shielding camera 1 is, for example, a rectangular parallelepiped having six rectangular faces. As a preferable example, a touch screen integrated machine 11 and a feeding and discharging door 12 are arranged on the front surface of the shielding camera bellows 1, a waveguide window 13 is arranged on at least one side surface of the shielding camera bellows 1, a maintenance door 14 is arranged on the back surface of the shielding camera bellows 1, a maintenance skylight 15 is arranged on the top surface of the shielding camera bellows 1, and the inner walls of the rectangular surfaces of the shielding camera bellows 1 are covered with a wave absorbing material 16. The wave absorbing material 16 is for example any combination of one or more of pyramid, wedge, mastoid, flat or wedge wave absorbing materials.

The multi-probe array 2 includes a plurality of dual-polarized antenna probes arranged on the same plane (e.g., horizontal plane), a multi-probe holder for holding the dual-polarized antenna probes, a switch matrix, a probe moving unit, and a connection cable. As a preferred example, the multi-probe array 2 has eight dual-polarized antenna probes in total, which are divided into two groups along the X-axis direction, and four dual-polarized antenna probes are arranged on the left and right sides of the array and aligned two by two. The connecting cable is 16 radio frequency cables, one end of each radio frequency cable is connected with the probe, and the other end of each radio frequency cable is connected to the switch matrix. The switch matrix is, for example, a 2 × 16 switch matrix. The accuracy of the probe mounting mechanism directly affects the electrical performance of the array calibration. The probe spacing can be set arbitrarily within the stroke. For example, the probe pitch may be moved at equal intervals. The probe can be adjusted at any interval in the Y-axis direction. The automatic adjustment distance range of the probe is adjustable in the equal distance range of 110mm to 250mm in the X-axis direction and the Y-axis direction, and the test of various models of complete machines is met. In actual work, various probe distribution modes can be preset in a program according to needs, and one-key adjustment is realized.

The three-dimensional bearing table 3 comprises a lifting table 31 and an XY sliding table 32. The elevating table 31 is, for example, a scissor lift device based on a rigid chain, and can realize the vertical movement of the antenna 5 to be measured. The XY stage 32 can move the antenna 5 to be measured in the horizontal direction.

In the multi-probe array 2, a plurality of dual-polarized antenna probes are installed at the top of the whole testing camera bellows, the multi-probe array 2 is aligned to the antenna array to be tested in a short distance in the direction perpendicular to the ground, each probe in the multi-probe array 2 can be moved and positioned at will, the structural center of each dual-polarized antenna probe corresponds to each channel of the antenna array to be tested, amplitude and phase signals are received, and distance scanning calibration and air gap test data acquisition are performed on the whole array surface of the antenna to be tested. The channel of the antenna array to be tested refers to an antenna unit of the antenna array to be tested. The three-dimensional bearing table 3 bears the movement of the antenna to be tested on a horizontal plane parallel to the ground, so that the amplitude and phase information of each channel of the whole antenna to be tested can be rapidly acquired by multiple probes, and the calibration of the amplitude and phase of the air interface of the active array antenna and the whole equipment and the test of the radio frequency index and the radiation pattern are realized. The "close distance" between the multi-probe array 2 and the antenna array to be tested means that the distance between the two is between 3 wavelengths and 10 wavelengths of the wavelengths corresponding to the center frequency of the antenna array to be tested.

The docking station 4 includes a tray 41, and a power-on device 42 fixed to the tray 41. The connection table 4 is placed at the feeding and discharging door 12 of the shielding camera bellows 1, and the tray 41 can bear the antenna 5 to be tested to slide on the connection table 4 and enter and exit the shielding camera bellows 1 from the feeding and discharging door 12. The power-on device 42 can realize the preheating of the antenna 5 to be tested. Preferably, the tray 41 has a plurality of position-limiting devices, and is compatible with active array antennas to be tested and complete equipment with different sizes.

Preferably, the active array antenna to be tested and the whole equipment are required to be dual-polarized antennas, and the frequency coverage range is 1.6GHz to 6 GHz.

When the multi-probe antenna test camera bellows is used for testing the near field of the antenna, scanning and sampling are carried out on a horizontal plane parallel to the ground, each probe is aligned to a plurality of array channels, amplitude and phase acquisition of each array antenna channel are achieved through electric switching of the switch in the test process, and test efficiency is improved.

Please refer to fig. 2, which is a schematic diagram illustrating a motion flow of an antenna under test during a multi-probe test. In fig. 2, each small circle represents each antenna unit of the antenna array to be tested. During testing, each probe covers a sub-array area of 3 antenna elements, represented by an oval in fig. 2. Eight probes may cover eight subarray areas. Each dual polarized antenna probe is located directly above the center of the subarray area, indicated by the thicker cross in fig. 2. After the test is started, the XY sliding table 32 drives the antenna 5 to be tested to move to the initial position, which is the first state in the test process. After the channel amplitude and phase of the covered subarray area are collected, the XY sliding table 32 drives the antenna to be tested 5 to move a line spacing in the negative direction of the Y axis, in order to test the second state, after the channel amplitude and phase of the covered area are collected, the XY sliding table 32 drives the antenna to be tested 5 to continue to move a line spacing in the positive direction of the Y axis, and the next test state is entered. Repeating the steps, after the amplitude and phase acquisition of all channels can be completed by only moving the antenna to be tested 5 three times, the XY sliding table 32 drives the antenna to be tested 5 to return to the initial position, the test is finished, and the acquired data is calculated in the data processing equipment to obtain the required data information.

This application is through being closely just to the antenna that awaits measuring with many probe arrays, can test antenna information fast to can judge rapidly whether the antenna satisfies each performance requirement. The method has the advantages that the multi-probe testing technology is adopted, the calibration testing method of the active array antenna to be tested is innovated, the testing speed is improved, the automation degree is high, the operation steps are flexible, and the method is suitable for being used in the production line large-batch testing scene. The multi-probe spacing adjustment can be carried out on the antenna to be measured distributed by different array elements in different sizes, and the application is flexible.

The above are merely preferred embodiments of the present application and are not intended to limit the present application. Various modifications and changes may occur to those skilled in the art. Any modification, equivalent replacement, improvement and the like made within the spirit and principle of the present application shall be included in the protection scope of the present application.

Claims

1. A multi-probe antenna test camera bellows is characterized by comprising a shielding camera bellows, a multi-probe array, a three-dimensional bearing table and a connection table, wherein the multi-probe array is arranged in the shielding camera bellows and is positioned at the top of the shielding camera bellows; and a plurality of dual-polarized antenna probes in the multi-probe array are closely aligned with the antenna array to be detected on the three-dimensional bearing table in the direction vertical to the ground, and the probe spacing in the multi-probe array can be adjusted so that the structural center of each probe corresponds to each channel of the antenna array to be detected.

2. The multi-probe antenna test camera of claim 1, wherein the shielding camera is a rectangular parallelepiped having six rectangular faces; the front surface of the shielding camera bellows is provided with a touch screen all-in-one machine and a feeding and discharging door, at least one side surface of the shielding camera bellows is provided with a waveguide window, the back surface of the shielding camera bellows is provided with a maintenance door, the top surface of the shielding camera bellows is provided with a maintenance skylight, and the inner wall of each rectangular surface of the shielding camera bellows is covered with a wave-absorbing material.

3. The multi-probe antenna testing camera bellows of claim 2, wherein the wave-absorbing material is any combination of one or more of a pyramid, a split cone, a mastoid, a flat plate, or a wedge-shaped wave-absorbing material.

4. The multi-probe antenna test camera according to claim 1, wherein the multi-probe array comprises a plurality of dual polarized antenna probes arranged on the same plane, a multi-probe holder for holding the dual polarized antenna probes, a switch matrix, a probe moving unit, and a connection cable.

5. The multiple-probe antenna testing camera bellows of claim 4, wherein the multiple-probe array has eight dual-polarized antenna probes in total, the probes are divided into two groups along the X-axis direction on a horizontal plane, and four dual-polarized antenna probes are arranged on the left side and the right side of the horizontal plane and aligned in pairs; the connecting cable is a radio frequency cable, one end of the radio frequency cable is connected with the probe, and the other end of the radio frequency cable is connected to the switch matrix.

6. The multi-probe antenna test camera of claim 1, wherein the three-dimensional load-bearing table comprises a lift table and an XY slide table; the lifting platform realizes the vertical movement of the antenna to be tested; the XY sliding table realizes the movement of the antenna to be detected in the horizontal direction.

7. The multiple probe antenna testing camera of claim 1, wherein said docking station comprises a tray and a power-on device secured to the tray; the connection table is placed at a feeding and discharging door of the shielding camera bellows, and the tray bears the antenna to be tested to slide on the connection table and enters and exits the shielding camera bellows from the feeding and discharging door.

8. The multiple-probe antenna test camera of claim 7, wherein the tray is provided with a plurality of position-limiting devices to hold active array antennas of different sizes to be tested and complete equipment.

9. The multiple-probe antenna testing camera bellows of claim 1, wherein the active array antenna under test and the complete machine device are dual polarized antennas.

10. The multiple probe antenna testing camera of claim 1, wherein each probe covers a subarray area, each subarray area containing one or more channels of an antenna array to be tested, the subarray areas covered by different probes being non-overlapping; each probe is located directly above the center of the covered subarray area.