CN112835125A - Multi-probe testing device of multi-degree-of-freedom millimeter wave MU-MIMO system - Google Patents
Multi-probe testing device of multi-degree-of-freedom millimeter wave MU-MIMO system Download PDFInfo
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- CN112835125A CN112835125A CN202110003867.2A CN202110003867A CN112835125A CN 112835125 A CN112835125 A CN 112835125A CN 202110003867 A CN202110003867 A CN 202110003867A CN 112835125 A CN112835125 A CN 112835125A
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Abstract
The invention relates to the technical field of millimeter wave testing, in particular to a multi-probe testing device of a multi-degree-of-freedom millimeter wave MU-MIMO system, which comprises a testing device, a testing instrument, a computer and a driving device, wherein the testing device and millimeter wave equipment to be tested are arranged in a wave-absorbing darkroom, the testing device comprises a testing module and a workbench, the millimeter wave equipment to be tested is arranged at the central position of the workbench, the testing module receives and transmits millimeter wave signals at various spatial positions, heights and angles through a linear guide rail and a supporting rod, the computer is used for controlling the driving device to drive the workbench, the computer is used for controlling the testing instrument, the testing module is connected with the testing instrument, and the millimeter wave equipment to be. The invention adopts a multi-probe scheme and improves the scheme, improves the accuracy of OTA test on the premise of reducing the path loss as much as possible, ensures that the spatial positions and the directivities of a plurality of probes are controllable, and restores the real channel environment.
Description
Technical Field
The invention relates to the technical field of millimeter wave testing, in particular to a multi-probe testing device of a multi-degree-of-freedom millimeter wave MU-MIMO system.
Background
In order to meet the demand of the network society, the competition of the spectrum resources is more and more intense. Under the condition that the existing spectrum resources are in shortage, the millimeter waves are gradually looked at by the eyes. In the millimeter wave frequency band, a wider and purer channel can be possessed, and a large block of continuous spectrum can be applied.
The signal resolution, transmission characteristics and transmission speed are enhanced due to the short millimeter wave wavelength and the narrow light beam characteristic, the storage capacity is larger, and the problem of internet congestion of a user is solved more easily. But simultaneously, because the wavelength of the millimeter wave is short, diffraction/scattering/material penetration loss, free multipath fading and the like are combined, the millimeter wave signal has weak penetration capability, the transmission distance is greatly shortened, and the coverage area is small. Aiming at the characteristics of millimeter waves, signal full coverage is not pursued by the millimeter waves, signal blind areas are supplemented, and the problem of capacity requirements of indoor and hot spot areas is mainly solved.
According to the characteristics of millimeter waves, path loss is particularly serious to the quality of millimeter wave signals in the test, more loss is brought to the millimeter wave signals by a connector or a radio frequency communication cable used for millimeter wave conduction test, and many millimeter wave test items are realized in an OTA mode. For millimeter wave devices, the antenna is usually integrated with the transceiver system, and there is no longer a connector or probe for conduction testing, and OTA testing will become the mainstream of millimeter wave testing. At present, a common Multi-Probe interference Chamber (MPAC) in a measuring scheme for the OTA of the MU-MIMO system is the most mainstream MU-MIMO OTA testing method at present. The traditional multi-probe scheme is that a probe is fixed on a darkroom wall or an annular column body, the far-field distance cannot be adjusted according to the size of millimeter wave dimension diameter, the motion state of user equipment cannot be simulated, and a real scene cannot be simulated.
Disclosure of Invention
The invention provides a multi-probe testing device of a multi-degree-of-freedom millimeter wave MU-MIMO system, which adopts a multi-probe scheme and improves the scheme, improves the accuracy of OTA testing on the premise of reducing path loss as much as possible, and ensures that the direction of a plurality of probes is controllable, the distance is controllable, and a real channel environment is restored.
In order to realize the purpose of the invention, the adopted technical scheme is as follows: the test device comprises a test module, a workbench, a plurality of linear guide rails and a support rod, millimeter wave equipment to be tested is installed on the workbench, the test module is installed on the support rod and slides along the linear guide rails, the test module receives and transmits millimeter wave signals at various spatial positions, heights and angles through the linear guide rails and the support rod, the computer is used for controlling the drive device to drive the workbench and controlling the test instrument, the test module is connected with the test instrument, and the millimeter wave equipment to be tested is connected with the computer.
As an optimized scheme of the invention, the workbench comprises a base, a turntable, a direction angle positioner and a roller of the base, the turntable is built on the base, the direction angle positioner is placed on the turntable and used for positioning millimeter wave equipment to be measured, one end of the linear guide rail is embedded into the roller of the base, and a roller is arranged below the other end of the linear guide rail.
As an optimized scheme of the invention, the multi-probe test device of the multi-degree-of-freedom millimeter wave MU-MIMO system further comprises a circular chassis, and the other end of the linear guide rail rotates along the edge of the circular chassis.
As an optimization scheme of the invention, the multi-probe test device of the multi-degree-of-freedom millimeter wave MU-MIMO system further comprises a gain attenuation and filtering module, a millimeter wave transceiving frequency conversion module and a channel selection switch, wherein the test module transmits millimeter wave signals after frequency conversion to the gain attenuation and filtering module through the corresponding channel selection switch, the gain attenuation and filtering module processes the signals and transmits the signals to the millimeter wave transceiving frequency conversion module outside the wave-absorbing dark room to be converted into millimeter wave signals, and the converted millimeter wave signals are sent to a test instrument to be processed.
As an optimized scheme of the invention, the test module comprises a transceiving frequency conversion module and a test antenna, and the transceiving frequency conversion module receives and transmits millimeter wave signals with the millimeter wave equipment to be tested through the test antenna.
As an optimized scheme of the invention, the test instrument comprises a signal generator, a signal analyzer, a network analyzer and a spectrum analyzer, wherein the signal generator is used for sending out millimeter wave signals, the signal analyzer is used for analyzing the millimeter wave signals, the network analyzer is used for calculating loss, and compensation calibration is carried out through a gain attenuation and filtering module; the spectrum analyzer is used for observing the characteristics of the signal visually from the frequency domain.
As an optimization scheme of the invention, the multi-probe test device of the multi-degree-of-freedom millimeter wave MU-MIMO system further comprises a calibration antenna, and the calibration antenna is placed on the workbench as a reference.
As an optimization scheme of the invention, the multi-probe test device of the multi-degree-of-freedom millimeter wave MU-MIMO system further comprises a monitor, wherein the monitor is arranged outside the wave-absorbing darkroom, and the condition in the wave-absorbing darkroom is observed through the monitor outside the wave-absorbing darkroom.
As an optimization scheme of the invention, a computer generates a test report for the configuration parameters of the test instrument and the reading of the measurement data of the test instrument, and the computer monitors the motion tracks of the rotary table and the linear guide rail in real time.
The invention has the positive effects that: 1) the workbench simulates multi-degree-of-freedom motion of various millimeter wave detection devices through a three-dimensional motion guide rail device, a workbench rotating mechanism and a positioner, and comprises the steps of moving back and forth, moving up and down and rotating, simulating a real space scene, supporting a channel model defined by 3GPP, creating a multi-probe environment surrounding a millimeter wave device to be tested, carrying out millimeter wave correlation performance test, arranging a test probe array capable of surrounding the simulated real environment of the device to be tested, enabling the test space to be meshed, obtaining accurate measurement data on each mesh, describing a model of an MU-MIMO communication channel more truly, approaching to the simulation of a real propagation environment, and being beneficial to debugging and detection of the millimeter wave detection devices to a great extent;
2) the invention can measure millimeter wave equipment with different specifications, different frequency bands and different calibers, and has higher compatibility;
3) the invention can flexibly move backward to test the real coverage area of the millimeter wave equipment;
4) the invention can reduce the path loss of millimeter waves and increase the accuracy of the test;
5) different channel environments can be generated, and millimeter wave tests in different scenes can be handled.
Drawings
The present invention will be described in further detail with reference to the accompanying drawings and specific embodiments.
FIG. 1 is an overall block diagram of the present invention;
FIG. 2 is a schematic view of the inventive work bench;
FIG. 3 is a schematic view of the use of the inventive work bench;
FIG. 4 is a schematic view of a base of the present invention;
FIG. 5 is a schematic structural diagram of the testing device of the present invention;
FIG. 6 is a schematic block diagram of a millimeter wave transceiver frequency conversion module;
FIG. 7 is a functional block diagram of a test module of the present invention;
fig. 8 is a diagram of an application scenario of the present invention.
Wherein: 1. millimeter wave equipment to be tested 2, test module 3, base 4, revolving stage 5, linear guide 6, liftable bracing piece 8, the roller bearing of base, 9, circular chassis.
Detailed Description
As shown in fig. 1, the invention discloses a multi-probe test device of a multi-degree-of-freedom millimeter wave MU-MIMO system, which comprises a test device, a test instrument, a computer and a driving device, wherein the test device and millimeter wave equipment to be tested 1 are arranged in a wave-absorbing darkroom, the test device comprises a test module 2, a workbench, a plurality of linear guide rails 5 and a support rod 6, the millimeter wave equipment to be tested 1 is arranged on the workbench, the test module 2 is arranged on the support rod 6, the support rod 6 slides along the linear guide rails 5, the test module 2 receives and transmits millimeter wave signals at various spatial positions, heights and angles through the linear guide rails 5 and the support rod 6, the computer is used for controlling the driving device to drive the workbench, the computer is used for controlling the test instrument, the test module 2 is connected with the test instrument, and the millimeter. The wave-absorbing darkroom can ensure that the test is carried out in a non-reflection and non-echo environment, and wave-absorbing materials capable of absorbing reflection signals are arranged in the wave-absorbing darkroom.
As shown in fig. 2-5, the workbench includes a base 3, a turntable 4, a direction angle positioner and a roller 8 of the base, the turntable 4 is built on the base 3, the direction angle positioner is placed on the turntable 4, the direction angle positioner is used for positioning the millimeter wave device 1 to be measured, one end of the linear guide 5 is embedded into the roller 8 of the base, a roller is arranged below the other end of the linear guide 5, and the other end of the linear guide rotates along the edge of the circular chassis 9. The linear guide 5 can rotate a certain angle under the drive of the roller 8 of the base, and when N test modules 2 exist, the rotation angle is 360/N, so that the linear guide 5 is not collided, the radio frequency coaxial cables at the rear ends of the test modules 2 are not crossed and entangled, and 360-degree coverage can be realized. On the other hand, the distance between the millimeter wave device 1 to be tested and the test module 2 can be adjusted, and diversified transmission paths and user states can be simulated. The rotation of the linear guide rail 5 can be manually rotated or electrically operated, and the liftable support rod 6 can be manually or electrically operated when sliding on the linear guide rail 5. After the selected channel model is determined, after the millimeter wave device 1 to be tested and the test module 2 are placed, each test module 2 can be selected to be electrically moved to a proper position, and the height and the angle of each test module 2 can be adjusted manually if fine adjustment is needed. Linear scales are marked on the linear guide 5. The direction angle positioner can fix a position millimeter wave device 1 that awaits measuring, can make millimeter wave device 1 that awaits measuring can 360 rotations, and tertiary height can be adjusted to revolving stage 4, because the size, height and the volume of millimeter wave device 1 that awaits measuring respectively have the difference, and the relative position of test module 2 and millimeter wave device 1 that awaits measuring is found more easily to revolving stage 4 of co-altitude not. The base 3 itself can not rotate, and is internally provided with the rolling shafts 8 of the base with the same number as the linear guide rail 5, so that the linear guide rail 5 can be driven to rotate by a certain angle.
The testing module 2 can change the distance up and down on the liftable supporting rod 6, and is provided with the angle positioner with the positioning pin, and the angle positioner can change the distance up and down on the liftable supporting rod 6 and change the angle around the liftable supporting rod 6 after the positioning pin is loosened. The liftable support rod 6 is marked with linear scales and angle scales so that the test module 2 can be accurately positioned.
For example, the multi-probe test device of the multi-degree-of-freedom millimeter wave MU-MIMO system further comprises a gain attenuation and filtering module, a millimeter wave transceiving frequency conversion module and a channel selection switch, the test module 2 transmits millimeter wave signals after frequency conversion to the gain attenuation and filtering module through the corresponding channel selection switch, the gain attenuation and filtering module processes the signals and transmits the signals to the millimeter wave transceiving frequency conversion module outside the wave-absorbing dark room to be converted into millimeter wave signals, and the converted millimeter wave signals are sent to a test instrument to be processed. Before testing, the testing module 2 corresponding to the corresponding channel is selected to switch the MU-MIMO channels of various modes. The gain attenuation and filtering module can attenuate larger signals and filter out-of-band carrier signals, improve the dynamic range of measurement and reduce the noise base.
As shown in fig. 6 to 7, the test module 2 includes a transceiving frequency conversion module and a test antenna, and the transceiving frequency conversion module performs transceiving of millimeter wave signals with the millimeter wave device 1 to be tested through the test antenna. When a transmitting signal is tested, the test antenna receives a millimeter wave signal sent by the millimeter wave device 1 to be tested, then the millimeter wave signal is sent to the receiving and transmitting frequency conversion module, down-converted to intermediate frequency, transmitted to the millimeter wave receiving and transmitting frequency conversion module outside the wave-absorbing darkroom through the radio frequency coaxial cable, converted into millimeter waves and sent to the signal analyzer for signal analysis; when a received signal is tested, the signal generator sends out a millimeter wave signal, the millimeter wave signal is transmitted to the test module 2 through the radio frequency coaxial cable after being subjected to down-conversion to the intermediate frequency by the transceiving frequency conversion module, and then is converted into millimeter waves which are transmitted to the millimeter wave equipment 1 to be tested in the air.
The test instrument comprises a signal generator, a signal analyzer, a network analyzer and a spectrum analyzer, wherein the signal generator is used for sending out millimeter wave signals, the signal analyzer is used for analyzing the millimeter wave signals, the network analyzer is used for calculating loss, and compensation calibration is carried out through a gain attenuation and filtering module; the spectrum analyzer is used for observing the characteristics of the signal visually from the frequency domain.
The multi-probe test device of the multi-degree-of-freedom millimeter wave MU-MIMO system further comprises calibration antennas, the calibration antennas are placed on the workbench as a reference, the calibration antennas serve as a reference, and millimeter wave signals sent by the signal generator are radiated to the test modules 2 after being calibrated.
The multi-probe testing device of the multi-degree-of-freedom millimeter wave MU-MIMO system further comprises a monitor, wherein the monitor is installed outside the wave-absorbing darkroom, and the running test conditions of all parts in the wave-absorbing darkroom are observed outside the wave-absorbing darkroom through the monitor.
The computer generates a test report for the configuration parameters of the test instrument and the reading of the measurement data of the test instrument, and the computer monitors the motion tracks of the rotary table and the linear guide rail 5 in real time.
The following describes the implementation of the present invention in further detail with reference to the accompanying drawings. The embodiments described below are only a part of the embodiments of the present invention, and not all of them.
S1 building connection: as shown in fig. 1, the multi-probe test device for the multi-degree-of-freedom millimeter wave MU-MIMO system comprises a test device, a test instrument, a computer and a driving device. The testing instrument is connected with a computer through a GPIB bus control module, each testing module 2 is connected with a millimeter wave transceiving frequency conversion module through a radio frequency coaxial cable through a channel selection switch, a gain attenuation and filtering module and the millimeter wave transceiving frequency conversion module, and the millimeter wave transceiving frequency conversion module is tightly connected with the testing instrument. Each testing instrument corresponds to different GPIB addresses on a computer to prevent repeated addresses from being repeated and normal communication cannot be established.
As shown in fig. 6, the millimeter wave transmission loss is reduced in the millimeter wave transmission, the test antenna serving as the probe is used as a test module instead, the millimeter wave signal is received and down-converted, and then the intermediate frequency signal is up-converted into the millimeter wave signal for testing, so that the signal flowing in the radio frequency coaxial cable is the intermediate frequency signal. And the transmitting-receiving frequency conversion module and the test antenna are integrated in the test module so as to reduce the loss of the connector.
As shown in fig. 5, the scales are provided on the workbench, the linear guide 5 and the liftable support rod 6, the liftable support rod 6 where the test module 2 is located can slide from the position 2 to the position 1, and similarly, the position 3 can also slide to the position 4, which indicates that the test module 2 can move in a one-dimensional space. The test module 2 can also be moved downwards from the top of the liftable support rod 6 and can also be rotated (the liftable support rod 6 is in a cylindrical shape), which indicates that the test module 2 can move in a two-dimensional space. As shown in fig. 4, the linear guide 5 on which each liftable support rod 6 is located can rotate with the roller 8 of the base, indicating that the test module 2 can move in three-dimensional space.
S2 calibration: 1. the signal generator and the calibration antenna are placed on a workbench, and each test module 2 is uniformly placed near the workbench and horizontally aligned to the workbench; 2. the signal generator sends out a signal for determining frequency and power and radiates the signal to each test module 2 in the air through the calibration antenna, and the spectrum analyzer obtains and records the power of each channel; 3. the computer indicates the driving device to move outwards for a distance which is twice the wavelength of the liftable supporting rod 6, the previous step is repeated, and a signal of the determined power with the frequency is transmitted to each test module 2 and recorded; 4. after traversing the whole linear guide rail 5, the computer indicates a roller 8 of one of the bases to move for a certain angle, and the step 2 is repeated; 5. similarly, the signal arrival angle can be changed by adjusting the height of the test module 2 on the support rod, and the step 2 is repeated, so that the test module 2 traverses each grid of the whole cylindrical space; 6. and obtaining the loss of each radio frequency cable and each connector by using a network analyzer, recording the loss, obtaining a space model of each channel through calculation, further calculating a common channel model of each channel combination, and performing compensation calibration through a gain attenuation module. Millimeter wave signals are of a TDD system, receiving and transmitting are reciprocal, and at the moment, only the path loss in one direction needs to be tested to serve as the common path loss.
Test S3: the method comprises the steps of pre-selecting a channel model, selecting a corresponding test module 2 through a channel selection switch, placing each test module 2 at a proper position by a driving device, and when the emission performance of millimeter wave equipment 1 to be tested is tested, receiving millimeter wave signals by a test antenna after the millimeter wave equipment 1 to be tested emits the millimeter wave signals, converting the millimeter wave signals into intermediate frequency signals through a receiving and transmitting frequency conversion module, transmitting the intermediate frequency signals through a radio frequency coaxial line, and then carrying out up-conversion to restore the millimeter wave signals for testing. When the receiving performance of the millimeter wave equipment 1 to be tested is tested, a millimeter wave signal is transmitted by the test instrument, is converted into an intermediate frequency signal through the millimeter wave transceiving frequency conversion module, is transmitted to the transceiving frequency conversion module through the radio frequency coaxial cable, is converted into a millimeter wave signal, is transmitted through the test antenna, and is received by the millimeter wave equipment 1 to be tested and fed back to the computer.
In the invention, the test module 2 with a wider frequency band is selected as much as possible, the intermediate frequency can be fixed in a certain frequency interval, for example, for a 28GHz millimeter wave frequency band, the transceiving frequency conversion module can process millimeter wave signals between 26GHz and 29GHz, and a 43GHz millimeter wave frequency band, the transceiving frequency conversion module can process millimeter wave signals between 42GHz and 45GHz, wherein the test antenna is a dual-polarized antenna. If the communication signal of the device to be tested is a common sub-6GHz signal, the test module 2 can be replaced by a test antenna with corresponding frequency. The following is described with reference to a specific example:
presetting millimeter wave equipment 1 to be tested as a 42.5G millimeter wave base station:
the millimeter wave device 1 to be tested is placed at the center of the workbench and is connected with the computer through a network cable or a serial port, so that the configuration of the transceiving parameters of the millimeter wave device 1 to be tested is controlled.
And determining the minimum far-field distance according to the signal frequency and the diameter of the millimeter wave device 1 to be tested, aligning each test module 2 to the millimeter wave device 1 to be tested, and placing the test module at the minimum far-field distance.
The test module 2 comprises a transmitting-receiving frequency conversion module and a test antenna, wherein the transmitting-receiving frequency conversion module consists of three main boards, namely a power panel, a single transmitting-receiving radio frequency board and a local oscillator board. The rechargeable battery can be used for supplying power to the power panel, the DCDC or LDO of the power panel can be supplied to the reliable stable power supply of the radio frequency panel, the local oscillator panel provides a local oscillator signal with adjustable frequency for the radio frequency panel to perform frequency mixing, the local oscillator frequency can be adjusted to 9.2G-9.6G, the millimeter wave signal of 42G-45GHz can be demodulated, the frequency mixing device group of the radio frequency panel adopts ADMV1013 of ADI as up-conversion and ADMV1014 as down-conversion, and the AD5301 is used as a millimeter wave radio frequency switch. In addition, the test module 2 can integrate the antenna and the radio frequency board together, and make the antenna and the radio frequency board into the form of aoc (antenna on chip), so as to reduce the use of the connector of the millimeter wave antenna.
The intermediate frequency interface of the test module 2 is connected with the gain attenuation and filtering module through a radio frequency coaxial cable and then connected with the transceiving frequency conversion module; the millimeter wave receiving and transmitting frequency conversion module is directly connected into the test instrument, so that the loss of the adapter and the radio frequency cable is reduced. Under the condition of not influencing the isolation of the corresponding channel, as shown in fig. 3, 16 linear guide rails 5 can be arranged, 1 lifting support rod 6 can be arranged on each linear guide rail 5, and each linear guide rail 5 can rotate for 22.5 degrees under the driving of the workbench. The distance between the millimeter wave device 1 to be tested and the test module 2 can be moved backwards, and the coverage range of the millimeter wave device 1 to be tested at the frequency along with the backward movement of the distance can be calculated.
The test modules 2 can be uniformly arranged or non-uniformly arranged, the number of the probes to be tested can be increased or decreased through a channel selection switch, and the coupling effect among the probes can be reduced; the test module 2 or the test modules 2 at different positions (height, distance and angle) can be used as interference modules and connected with a signal generator to send interference signals, the millimeter wave equipment 1 to be tested is in communication connection, and the receiving sensitivity of the millimeter wave equipment 1 to be tested under the millimeter wave channel is tested, so that the anti-interference performance of the millimeter wave equipment 1 to be tested is verified.
In the invention, aiming at different sizes of millimeter wave equipment 1 to be tested, a test space is divided, so that millimeter wave test is more accurate and flexible. In this scenario, 16 or more probes (i.e., the test module 2 described above) may be provided, and an OTA millimeter wave test scheme of a multi-probe method in an MU-MIMO scenario is supported. The invention adopts a multi-probe scheme and improves the scheme, improves the accuracy of OTA test on the premise of reducing the path loss as much as possible, ensures that the spatial directivity of a plurality of probes is controllable, and restores the real channel environment.
The above-mentioned embodiments are intended to illustrate the objects, technical solutions and advantages of the present invention in further detail, and it should be understood that the above-mentioned embodiments are only exemplary embodiments of the present invention, and are not intended to limit the present invention, and any modifications, equivalents, improvements and the like made within the spirit and principle of the present invention should be included in the protection scope of the present invention.
Claims (9)
1. A multi-probe test device of a multi-freedom-degree millimeter wave MU-MIMO system is characterized in that: including testing arrangement, test instrument, computer and drive arrangement, testing arrangement and millimeter wave equipment (1) that awaits measuring are all arranged in and are inhaled ripples darkroom, testing arrangement includes test module (2), the workstation, a plurality of linear guide (5) and bracing piece (6), millimeter wave equipment (1) that awaits measuring is installed on the workstation, test module (2) are installed on bracing piece (6), bracing piece (6) slide along linear guide (5), test module (2) are through linear guide (5) and bracing piece (6) receiving and dispatching millimeter wave signal under various spatial position, height and angle, the computer be used for controlling drive arrangement drive workstation, the computer be used for controlling test instrument, test module (2) are connected with test instrument, millimeter wave equipment (1) that awaits measuring links to each other with the computer.
2. The multiple-probe testing device of the multiple-degree-of-freedom millimeter wave MU-MIMO system according to claim 1, wherein: the worktable comprises a base (3), a rotary table (4), a direction angle positioner and a roller (8) of the base, wherein the rotary table (4) is built on the base (3), the direction angle positioner is placed on the rotary table (4), the direction angle positioner is used for positioning millimeter wave equipment (1) to be tested, one end of a linear guide rail (5) is embedded into the roller (8) of the base, and a roller is arranged below the other end of the linear guide rail (5).
3. The multiple-probe test device of the multiple-degree-of-freedom millimeter wave MU-MIMO system according to claim 2, wherein: the multi-probe test device of the multi-degree-of-freedom millimeter wave MU-MIMO system further comprises a circular chassis (9), and the other end of the linear guide rail (5) rotates along the edge of the circular chassis (9).
4. The multiple-probe test device of the multiple-degree-of-freedom millimeter wave MU-MIMO system according to claim 3, wherein: the multi-probe testing device of the multi-degree-of-freedom millimeter wave MU-MIMO system further comprises a gain attenuation and filtering module, a millimeter wave transceiving frequency conversion module and a channel selection switch, wherein the testing module (2) transmits millimeter wave signals after frequency conversion to the gain attenuation and filtering module through the corresponding channel selection switch, the gain attenuation and filtering module processes the signals and transmits the signals to the millimeter wave transceiving frequency conversion module outside the wave-absorbing dark room to be converted into millimeter wave signals, and the converted millimeter wave signals are sent to a testing instrument to be processed.
5. The multiple-probe test device of the multiple-degree-of-freedom millimeter wave MU-MIMO system according to claim 3, wherein: the test module (2) comprises a transceiving frequency conversion module and a test antenna, and the transceiving frequency conversion module receives and transmits millimeter wave signals with the millimeter wave equipment (1) to be tested through the test antenna.
6. The multiple-probe test device of the multiple-degree-of-freedom millimeter wave MU-MIMO system according to claim 3, wherein: the test instrument comprises a signal generator, a signal analyzer, a network analyzer and a spectrum analyzer, wherein the signal generator is used for sending out millimeter wave signals, the signal analyzer is used for analyzing the millimeter wave signals, the network analyzer is used for calculating loss, and compensation calibration is carried out through a gain attenuation and filtering module; the spectrum analyzer is used for observing the characteristics of the signal visually from the frequency domain.
7. The multiple-probe test device of the multiple-degree-of-freedom millimeter wave MU-MIMO system according to claim 3, wherein: the multi-probe test device for the multi-degree-of-freedom millimeter wave MU-MIMO system further comprises a calibration antenna, and the calibration antenna is placed on the workbench as a reference.
8. The multiple-probe testing device of the multiple-degree-of-freedom millimeter wave MU-MIMO system according to any one of claims 3-7, wherein: the multi-probe testing device of the multi-degree-of-freedom millimeter wave MU-MIMO system further comprises a monitor, wherein the monitor is installed outside the wave-absorbing darkroom, and the condition in the wave-absorbing darkroom is observed through the monitor outside the wave-absorbing darkroom.
9. The multiple-probe testing device of the multiple-degree-of-freedom millimeter wave MU-MIMO system according to claim 8, wherein: the computer generates a test report for the configuration parameters of the test instrument and the reading of the measurement data of the test instrument, and the computer monitors the motion tracks of the rotary table and the linear guide rail (5) in real time.
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Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN113267778A (en) * | 2021-06-18 | 2021-08-17 | 珠海上富电技股份有限公司 | Vehicle-mounted millimeter wave radar factory detection device and method |
| CN113890637A (en) * | 2021-08-26 | 2022-01-04 | 广东工业大学 | Millimeter wave active antenna OTA test system and method, calibration system and method |
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2021
- 2021-01-04 CN CN202110003867.2A patent/CN112835125A/en active Pending
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN113267778A (en) * | 2021-06-18 | 2021-08-17 | 珠海上富电技股份有限公司 | Vehicle-mounted millimeter wave radar factory detection device and method |
| CN113890637A (en) * | 2021-08-26 | 2022-01-04 | 广东工业大学 | Millimeter wave active antenna OTA test system and method, calibration system and method |
| CN113890637B (en) * | 2021-08-26 | 2023-07-21 | 广东工业大学 | Millimeter wave active antenna OTA test system and method and calibration method |
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