CN116366173A - 5G AAU basic station height Wen Wenxun OTA produces line test system - Google Patents
5G AAU basic station height Wen Wenxun OTA produces line test system Download PDFInfo
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- CN116366173A CN116366173A CN202310247320.6A CN202310247320A CN116366173A CN 116366173 A CN116366173 A CN 116366173A CN 202310247320 A CN202310247320 A CN 202310247320A CN 116366173 A CN116366173 A CN 116366173A
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- 238000012360 testing method Methods 0.000 title claims abstract description 69
- 239000000523 sample Substances 0.000 claims abstract description 60
- 230000005540 biological transmission Effects 0.000 claims abstract description 49
- 239000011159 matrix material Substances 0.000 claims abstract description 38
- 230000005855 radiation Effects 0.000 claims description 13
- 239000004677 Nylon Substances 0.000 claims description 7
- 229920001778 nylon Polymers 0.000 claims description 7
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical group [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 claims description 6
- 238000013508 migration Methods 0.000 claims 1
- 230000005012 migration Effects 0.000 claims 1
- 238000004519 manufacturing process Methods 0.000 abstract description 4
- 238000010586 diagram Methods 0.000 description 7
- 238000013461 design Methods 0.000 description 4
- 230000008878 coupling Effects 0.000 description 2
- 238000010168 coupling process Methods 0.000 description 2
- 238000005859 coupling reaction Methods 0.000 description 2
- 238000005516 engineering process Methods 0.000 description 2
- 238000002955 isolation Methods 0.000 description 2
- 238000000034 method Methods 0.000 description 2
- 238000005192 partition Methods 0.000 description 2
- 230000009286 beneficial effect Effects 0.000 description 1
- 238000010276 construction Methods 0.000 description 1
- 230000007547 defect Effects 0.000 description 1
- 230000009977 dual effect Effects 0.000 description 1
- 238000002474 experimental method Methods 0.000 description 1
- 239000000463 material Substances 0.000 description 1
- 238000011056 performance test Methods 0.000 description 1
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- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04B—TRANSMISSION
- H04B17/00—Monitoring; Testing
- H04B17/0082—Monitoring; Testing using service channels; using auxiliary channels
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- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04W—WIRELESS COMMUNICATION NETWORKS
- H04W24/00—Supervisory, monitoring or testing arrangements
- H04W24/06—Testing, supervising or monitoring using simulated traffic
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- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02D—CLIMATE CHANGE MITIGATION TECHNOLOGIES IN INFORMATION AND COMMUNICATION TECHNOLOGIES [ICT], I.E. INFORMATION AND COMMUNICATION TECHNOLOGIES AIMING AT THE REDUCTION OF THEIR OWN ENERGY USE
- Y02D30/00—Reducing energy consumption in communication networks
- Y02D30/70—Reducing energy consumption in communication networks in wireless communication networks
Abstract
The invention discloses a 5G AAU base station high-low Wen Wenxun OTA production line testing system, which comprises a testing shielding box, a switch matrix network and a vector network analyzer, wherein at least two groups of high-low Wen Wenxun testing environment OTA darkrooms are arranged in the testing shielding box in a separated mode, a tested device positioning table is arranged at the lower end of the OTA darkroom, a radio frequency antenna probe is arranged at the top of the OTA darkroom opposite to the positioning table, the radio frequency antenna probe scans and receives multi-channel radio frequency signals of the tested device through a transmission device, the radio frequency antenna probe of the OTA darkroom is connected with the vector network analyzer through a radio frequency cable through a first switch matrix network, the tested device on the OTA darkroom positioning table is connected with the vector network analyzer through a second switch matrix network, and a controller is respectively connected with the first switch matrix network, the second switch matrix network, the transmission device and the vector network analyzer in a control mode.
Description
Technical Field
The invention relates to a 5G AAU base station high-low Wen Wenxun OTA production line test system.
Background
Because the base station itself needs to be used in high and low temperature, damp heat and other environments for a long time, different temperature and humidity conditions possibly occurring in the actual use process need to be simulated before the base station leaves the factory, OTA (over the air download) index performance corresponding to the base station is tested, and the performance index reduction possibly caused by potential defects of products in the outdoor environment is reduced. Especially, as the requirements on the transmission rate and reliability of the 5G base station are continuously improved, the online test proportion under the corresponding environment is required to be larger. At present, the connection of a 5G AAU (Active Antenna Unit ) base station to be tested with a radio frequency switch, a test instrument and the like is realized mainly in a conduction (cable connection) mode, so that the construction of a complete test link is realized. With the increasing number of 5G base station antenna ports, the conventional connection is adopted to realize radio frequency performance test in a conduction mode; meanwhile, with the continuous evolution and upgrading of the 5G technology, the continuous increase of the number of channels of the AAU base station (at most 256 channels exist), which results in extremely low manual operability and test efficiency, so that the test requirement cannot be met.
Disclosure of Invention
The invention aims to provide a 5G AAU base station high-low Wen Wenxun OTA production line test system, an OTA darkroom adopts a modularized structure, a shielding box is divided into a left independent test environment and a right independent test environment, so that the condition that two DUTs (devices to be tested) are tested at most in one-time temperature circulation state is met, and a test antenna probe adopts an antenna array technology so as to meet ultra-narrow beam width design and meet full coverage of beams in the width direction of the DUTs to be tested.
In order to achieve the above object, the technical scheme of the present invention is as follows:
the utility model provides a 5G AAU basic station height Wen Wenxun OTA produces line test system, includes test shielding case, switch matrix network and vector network analyzer, has test temperature to circulate OTA darkroom in the test shielding case, and the test shielding case realizes high low Wen Wenxun test environment through high low temperature control system, wherein: the test shielding box is internally provided with at least two groups of high and low Wen Wenxun test environment OTA darkrooms in a partition way, the lower end of each OTA darkroom is provided with a tested device positioning table, the top of each OTA darkroom and the positioning table are oppositely provided with radio frequency antenna probes, the radio frequency antenna probes are horizontally moved through a transmission device to realize scanning and receiving of multi-channel radio frequency signals of the tested devices, the radio frequency antenna probes of the OTA darkroom are connected with a vector network analyzer through a radio frequency cable through a first switch matrix network, the tested devices on the OTA darkroom tested device positioning table are connected with the vector network analyzer through a second switch matrix network, and a controller is respectively controlled and connected with the first switch matrix network, the second switch matrix network, the transmission device and the vector network analyzer.
The scheme is further as follows: the transmission device comprises a transmission sliding rail and a probe support, the transmission sliding rail is fixed on a scanning frame at the top of an OTA darkroom, a fine thread lead screw is arranged on the transmission sliding rail, the lead screw is driven to rotate by a servo motor, the probe support is in sliding connection with the transmission sliding rail through a sliding head, the sliding head is provided with a fine thread nut, the fine thread nut is sleeved on the lead screw, the rotating lead screw drives the probe support to linearly and horizontally slide back and forth along the transmission sliding rail through the fine thread nut, and the radio frequency antenna probe is adjustably positioned on the probe support and is perpendicular to the axis of a measured device on a positioning table.
The scheme is further as follows: the transmission device is provided with two groups, transmission sliding rails of the two groups of transmission devices are arranged on two sides of a scanning frame at the top of the OTA darkroom in parallel, radio frequency antenna probes of the two groups of transmission devices are positioned on the probe supports in a front-back straight line and are perpendicular to the axis of a tested device on the positioning table, servo motors of the two groups of transmission devices drive screw rods to rotate, and the rotating screw rods drive the probe supports to respectively slide in a front-back straight line and horizontally along the transmission sliding rails on the distance of half of the midpoint of the axis of the tested device.
The scheme is further as follows: the controller is connected with the tested device through the second switch matrix network, the vector network analyzer selects different channels to send test radio frequency signals to the tested device, and meanwhile, the controller controls the probe support to slide and is connected with the radio frequency antenna probe through the second switch matrix network, and the radio frequency signals emitted by different channels are received.
The scheme is further as follows: the first switch matrix network is a 2 x 8 switch matrix network and the second switch matrix network is a 2 x 2 switch matrix network.
The scheme is further as follows: the radio frequency antenna probe comprises an antenna and an antenna array cavity, wherein the antenna is fixed on the antenna array cavity, a broadband power divider connected with the antenna is arranged in the antenna array cavity, the antenna is composed of antenna units distributed in a 3X3 array mode, the antenna units are FR4 hard printed circuit boards, the tops of the printed circuit boards are microstrip feed ports, the bottoms of the printed circuit boards are antenna radiation ports, the antenna radiation ports are composed of four annular copper foil ring radiation units, antenna grids are arranged in the annular copper foil ring, and the frequency coverage range of the antenna units is as follows by adjusting the coupling distance between the radiation units and the number and width of the internal antenna grids: 3360-3840 MHz; 4760-5040 MHz, the pattern is not offset and the standing wave is less than 1.2.
The scheme is further as follows: the antenna units are 35mmX35mm in size, and each antenna unit is fixed on the antenna array cavity through four nylon studs and nylon screws at corners.
The scheme is further as follows: the antenna array cavity is internally integrated with 8 broadband unequal one-to-three power dividers, which are Wilkinson two-stage broadband unequal one-to-three power dividers, and the output power ratio of three ports of the power dividers is 0.7:1:0.7.
The beneficial effects of the invention are as follows: the traditional cable connection mode adopted by the DUT (device under test) and the tester is changed into an array antenna scanning wireless connection mode to realize the full array scanning test of the multichannel 5G AAU module, and the system has the advantages that:
through rationally optimizing array antenna probe and 5G AAU module air interface test scene that awaits measuring, realize array antenna probe radiation mouth in module width direction and face the full coverage of 5G AAU module that awaits measuring, cooperate automatic scanning frame in module length direction, through the high accuracy removal of antenna probe in the test process, realize the full array scan test to 5G AAU module that awaits measuring, set up two array antenna probes simultaneously and scanned a device to be surveyed and improved test efficiency.
The antenna probe scanning frame adopts a fine thread screw rod and has vertical high-precision automatic movement at (-40- +70 ℃) under high and low temperature conditions.
The present invention will be described in detail with reference to the accompanying drawings and examples.
Drawings
FIG. 1 is a schematic diagram of a system single-radio-frequency antenna probe structure according to the present invention;
FIG. 2 is a schematic diagram of a dual RF antenna probe structure of the system of the present invention;
FIG. 3 is a schematic view of the internal longitudinal structure of the test shielded box;
FIG. 4 is a schematic view of the internal transverse structure of the test shielded box;
FIG. 5 is an isometric view of the structure of the transmission of the present invention;
FIG. 6 is a schematic top view of the transmission of the present invention;
FIG. 7 is a schematic diagram of the structure of a RF antenna probe according to the present invention;
FIG. 8 is a schematic diagram of an antenna array cavity of a radio frequency antenna probe of the present invention;
FIG. 9 is a schematic diagram of a microstrip at the top of an antenna element of a radio frequency antenna probe of the present invention;
FIG. 10 is a schematic diagram of a bottom antenna radiating element of a radio frequency antenna probe antenna element of the present invention;
fig. 11 is a schematic diagram of the structure of the input/output port of the power divider of the rf antenna probe according to the present invention.
Detailed Description
A5G AAU base station high-low Wen Wenxun OTA production line test system is shown in fig. 1 to 4, the system comprises a test shielding box 1, a switch matrix network and a vector network analyzer 2, a test temperature circulation OTA darkroom is arranged in the test shielding box 1, the test shielding box 1 realizes a high-low Wen Wenxun test environment through a high-low temperature control system, wherein: the test shielding box is internally provided with at least two groups of high and low Wen Wenxun test environments, namely OTA darkroom 101 and 102, by partition, a positioning table 4 of a device under test 3 (DUT) is arranged at the lower end of the OTA darkroom, a radio frequency antenna probe 5 is arranged at the top of the OTA darkroom opposite to the positioning table, the radio frequency antenna probe 5 scans and receives multichannel radio frequency signals of the device under test through a transmission device, the radio frequency antenna probe of the OTA darkroom is connected with a vector network analyzer 2 through a radio frequency cable through a first switch matrix network 7, the device under test on the positioning table of the device under test of the OTA darkroom is connected with the vector network analyzer 2 through a second switch matrix network 8, and a controller (not shown in the figure) is respectively connected with the first switch matrix network 7, the second switch matrix network 8, the transmission device 6 and the vector network analyzer 2 in a control mode.
As shown in fig. 3, 5 and 6: the transmission device comprises a transmission slide rail 601 and a probe support 602, the transmission slide rail 601 is fixed on an OTA darkroom top scanning frame 603, a fine thread lead screw is arranged on the transmission slide rail 601 and driven by a servo motor 604 to rotate, the probe support is in sliding connection with the transmission slide rail through a sliding head, the sliding head is provided with a fine thread nut, the fine thread nut is sleeved on the lead screw, the rotating lead screw drives the probe support to horizontally slide along a front line and a back line of the transmission slide rail through the fine thread nut, and the radio frequency antenna probe is adjustably positioned on the probe support and is perpendicular to the axis of a measured device on a positioning table.
To increase the scanning speed: the transmission devices are two groups, two groups of transmission devices are shown in fig. 3, 5 and 6, transmission slide rails 601 of the two groups of transmission devices 6 are arranged on two sides of a scanning frame at the top of an OTA darkroom in parallel, radio frequency antenna probes 5 of the two groups of transmission devices 6 are positioned on the probe supports in a front-back straight line and are perpendicular to the axis of a tested device on the positioning table, servo motors 604 of the two groups of transmission devices 6 drive screw rods to rotate, and the rotating screw rods drive the probe supports to respectively linearly slide front and back along the transmission slide rails at the front half distance and the back half distance of the midpoint of the axis of the tested device through fine thread nuts, so that the radio frequency antenna probes 5 of each group of transmission devices only need to scan half of the tested device.
Wherein: the controller is connected with the tested device through the second switch matrix network, the vector network analyzer selects different channels to send test radio frequency signals to the tested device, and meanwhile, the controller controls the probe support to slide and is connected with the radio frequency antenna probe through the second switch matrix network, and the radio frequency signals emitted by different channels are received.
In the embodiment, after two sets of actuators are provided, since each device under test uses 2 rf antenna probes 5, the first switch matrix network uses a 2×8 switch matrix network, and the second switch matrix network is a 2×2 switch matrix network.
In the present embodiment, as shown in fig. 7 to 11: the radio frequency antenna probe comprises an antenna 501 and an antenna array cavity 502, wherein the antenna is fixed on the antenna array cavity, a broadband power divider connected with the antenna is arranged in the antenna array cavity, the antenna is composed of antenna units 501-1 distributed in a 3X3 array, due to limited darkroom space, the antenna array is required to be miniaturized, the antenna units adopt FR4 hard printed circuit boards, the top of the printed circuit boards are crossed to form microstrip feed ports 501-2, the bottom of the printed circuit boards are antenna radiation ports, the antenna radiation ports are composed of four annular copper foil ring radiation units 501-3, antenna grids 501-4 are arranged in the annular copper foil ring, and the frequency coverage range of the antenna units is as follows by adjusting the coupling distance between the radiation units and the number and width of the internal antenna grids: 3360-3840 MHz; 4760-5040 MHz, the pattern is not offset and the standing wave is less than 1.2. Wherein: the antenna units are 35mmX35mm in size, and each antenna unit is fixed on the antenna array cavity 502 through four nylon studs 503 and nylon screws at corners.
In the examples: because the darkroom system requires that the side lobe level is less than-18 dB in the horizontal direction and the vertical direction of the antenna radiation, the space in the cavity of the antenna array is only 150mmX150mm. As shown in fig. 8: the antenna array cavity is internally integrated with 8 broadband unequal one-to-three power dividers 504, 18 ports of the 6 broadband power dividers need to be directly connected with an antenna unit, the phases of radio frequency signals of the 18 ports and the antenna which are directly connected are completely identical to meet the beam requirements, through optimized arrangement, the mode of transversely and vertically arranging the power dividers is adopted, antenna cable through holes are avoided, meanwhile, all ports are connected by adopting flexible amplitude-stabilizing phase-stabilizing cables, the cables are subjected to equal length treatment, and because the arrangement of the power dividers is too compact, the turning radius of the cables is 11mm, the output ends of the power dividers are connected with the antenna, internal wires are quite staggered, the mode of internally arranging the power divider cover plates 505 is adopted, the cables can run through the tops of the power dividers and do not influence the performance of the internally arranged power dividers, the purpose of compact structure is achieved, and meanwhile, the consistency between the antenna array sleeves can be ensured. The 8 broadband unequal one-to-three power dividers adopt Wilkinson two-stage broadband unequal one-to-three power dividers, and the output power ratio of the three ports of the power dividers is 0.7:1:0.7. As shown in fig. 11, the power divider input port 506 and the output port 507 are formed by adopting an opening mode to facilitate cable welding, and meanwhile, the power divider output port is bent according to arrangement and is provided with micro-strip wires with equal length, so that after design, the cable wiring is smoother, the overall size of the antenna is finally smaller and the arrangement is compact, and the radome 508 is made of nylon material and is more stable in a temperature cycle environment. The dual-polarized antenna array is used as a test antenna and is placed on the top of a darkroom to face an AAU to be tested, and better test precision can be achieved only by having small influence on a tested piece as much as possible.
The dual-polarized antenna array is simulated, in the frequency ranges of 3360-3840 MHz and 4760-5040 MHz, standing waves of all ports are smaller than 1.2, port isolation is larger than 30dB, antenna gain is larger than 14dBi, and polarization isolation is larger than 25dB; the side lobe level is smaller than-18 dB, through actual test and experiment of the product, test data accords with simulation results, and the correctness of theoretical design is proved, and the overall index of the antenna is superior to that of the traditional design, and the antenna has stable performance under the temperature cycle condition.
Claims (8)
1. The utility model provides a 5G AAU basic station height Wen Wenxun OTA produces line test system, includes test shielding case, switch matrix network and vector network analyzer, has test temperature to circulate the OTA camera in the test shielding case, and test shielding case passes through high low temperature control system and realizes high low Wen Wenxun test environment, its characterized in that, be provided with at least two sets of high low Wen Wenxun test environment OTA camera through separating in the test shielding case, the lower extreme of OTA camera is provided with the device location platform that is surveyed, is provided with the radio frequency antenna probe relatively with the location platform at the top of OTA camera, and the radio frequency antenna probe passes through transmission horizontal migration realization to the device that is surveyed and receives the multichannel radio frequency signal of device, and the radio frequency antenna probe of OTA camera passes through the first switch matrix network through radio frequency cable and connects vector network analyzer, and the device that is surveyed on the device location platform of OTA camera passes through the second switch matrix network analyzer, and a controller control is connected first switch matrix network, second switch matrix network, transmission and vector network analyzer respectively.
2. The test system of claim 1, wherein the transmission device comprises a transmission slide rail and a probe support, the transmission slide rail is fixed on a scanning frame at the top of the OTA darkroom, a fine thread screw rod is arranged on the transmission slide rail, the screw rod is driven to rotate by a servo motor, the probe support is in sliding connection with the transmission slide rail through a sliding head, the sliding head is provided with a fine thread nut, the fine thread nut is sleeved on the screw rod, the rotating screw rod drives the probe support to horizontally slide along a front line and a rear line of the transmission slide rail through the fine thread nut, and the radio frequency antenna probe is adjustably positioned on the probe support and is perpendicular to the axis of a tested device on the positioning table.
3. The test system according to claim 1, wherein the transmission device comprises two groups of transmission sliding rails of the two groups of transmission devices which are arranged on two sides of the scanning frame at the top of the OTA darkroom in parallel, the radio frequency antenna probes of the two groups of transmission devices are positioned on the probe support in a front-back straight line and are perpendicular to the axis of the tested device on the positioning table, the servo motors of the two groups of transmission devices drive the lead screws to rotate, and the rotating lead screws drive the probe supports of each group to respectively linearly slide back and forth along the transmission sliding rails at the distances of half of the midpoint of the axis of the tested device in front-back straight line through the fine thread nuts.
4. The test system of claim 1, wherein the controller connects the device under test via the second switch matrix network to select different channels for transmitting test radio frequency signals to the device under test by the vector network analyzer, and wherein the controller controls the probe carriage to slide and connects the vector network analyzer to the radio frequency antenna probe via the second switch matrix network to receive radio frequency signals transmitted from the different channels.
5. A test system according to claim 3, wherein the first switch matrix network is a 2 x 8 switch matrix network and the second switch matrix network is a 2 x 2 switch matrix network.
6. The test system of claim 1, wherein the radio frequency antenna probe comprises an antenna and an antenna array cavity, the antenna is fixed on the antenna array cavity, a broadband power divider connected with the antenna is arranged in the antenna array cavity, the antenna is composed of antenna units in 3X3 array layout, the antenna units are FR4 hard printed circuit boards, the tops of the printed circuit boards are microstrip feed ports, the bottoms of the printed circuit boards are antenna radiation ports, the antenna radiation ports are composed of four annular copper foil ring radiation units, antenna grids are arranged in the annular copper foil ring, and the frequency coverage range of the antenna units is made to be: 3360-3840 MHz; 4760-5040 MHz, the pattern is not offset and the standing wave is less than 1.2.
7. The test system of claim 6, wherein the antenna elements are 35mmX35mm in size, each antenna element being secured to the antenna array cavity by four nylon studs and nylon screws at the corners.
8. The test system of claim 6, wherein the antenna array cavity is integrated with 8 wideband unequal one-to-three power dividers, which are wilkinson two-stage wideband unequal one-to-three power dividers, and the ratio of output power of three ports of the power dividers is 0.7:1:0.7.
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| CN202310247320.6A CN116366173A (en) | 2023-03-15 | 2023-03-15 | 5G AAU basic station height Wen Wenxun OTA produces line test system |
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| CN202310247320.6A CN116366173A (en) | 2023-03-15 | 2023-03-15 | 5G AAU basic station height Wen Wenxun OTA produces line test system |
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| CN113655291A (en) * | 2021-06-30 | 2021-11-16 | 深圳市蔚来射频技术有限公司 | Radio frequency switch device and multi-port line array antenna test system |
| US20220082613A1 (en) * | 2020-09-11 | 2022-03-17 | Advantest Corporation | Electronic component pressing apparatus and electronic component testing apparatus |
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2023
- 2023-03-15 CN CN202310247320.6A patent/CN116366173A/en active Pending
Patent Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
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| CN108562801A (en) * | 2018-05-07 | 2018-09-21 | 北京中微普业科技有限公司 | A kind of array antenna test system and its test method |
| US20210318369A1 (en) * | 2018-08-14 | 2021-10-14 | Bluetest Ab | An improved measurement device for antenna systems |
| CN110794222A (en) * | 2019-10-23 | 2020-02-14 | 上海霍莱沃电子系统技术股份有限公司 | Antenna test system and control method thereof |
| CN113242572A (en) * | 2020-06-23 | 2021-08-10 | 中兴通讯股份有限公司 | AAU (architecture analysis Unit) testing method and device and multi-probe wave-absorbing camera bellows |
| US20220082613A1 (en) * | 2020-09-11 | 2022-03-17 | Advantest Corporation | Electronic component pressing apparatus and electronic component testing apparatus |
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